CN202904404U - A temperature control platform used for high temperature and low temperature test - Google Patents
A temperature control platform used for high temperature and low temperature test Download PDFInfo
- Publication number
- CN202904404U CN202904404U CN 201220589953 CN201220589953U CN202904404U CN 202904404 U CN202904404 U CN 202904404U CN 201220589953 CN201220589953 CN 201220589953 CN 201220589953 U CN201220589953 U CN 201220589953U CN 202904404 U CN202904404 U CN 202904404U
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- Prior art keywords
- temperature
- thermistor
- control platform
- temperature control
- utility
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Abstract
The utility model discloses a temperature control platform used for high temperature and low temperature test. The temperature control platform comprises a semiconductor refrigerating sheet, a multimeter, and a control circuit. The semiconductor refrigerating sheet is equipped with a first thermistor and a second thermistor. The first thermistor is connected with the control circuit. The second thermistor is connected with the multimeter. The temperature control platform used for high temperature and low temperature test has characteristics of a simple structure, low cost, and easy manipulation.
Description
Technical field
The utility model relates to photoelectric device and makes field, especially a kind of high low-temperature test temperature control platform.
Background technology
Existing test temperature control platform generally uses temperature to follow equipment, and cost of equipment is large, and cost of use is large, and speed is slow, energy dissipation.
Therefore, need a kind of new technical matters to address the above problem.
The utility model content
The purpose of this utility model is the deficiency that exists for prior art, and a kind of simple in structure, high low-temperature test temperature control platform that cost is low is provided.
For achieving the above object, the high low-temperature test temperature control of the utility model platform can adopt following technical scheme:
A kind of high low-temperature test temperature control platform, comprise semiconductor chilling plate, multimeter and control circuit, described semiconductor chilling plate is provided with the first thermistor and the second thermistor, and described the first thermistor is connected with control circuit, and the second thermistor is connected with multimeter.
Compare with background technology, the high low-temperature test temperature control of the utility model platform is simple in structure, cost is low and easy operating.
Description of drawings
Fig. 1 is the structural representation of the high low-temperature test temperature control of the utility model platform.
Embodiment
Below in conjunction with the drawings and specific embodiments, further illustrate the utility model, should understand these embodiment only is used for explanation the utility model and is not used in restriction scope of the present utility model, after having read the utility model, those skilled in the art all fall within the application's claims limited range to the modification of the various equivalent form of values of the present utility model.
See also shown in Figure 1ly, the utility model discloses a kind of high low-temperature test temperature control platform, comprises semiconductor chilling plate 20, multimeter 30 and control circuit 40.Described semiconductor chilling plate 20 is provided with the first thermistor 21 and the second thermistor 22.Described semiconductor chilling plate 20 be connected thermistor 21 and be connected with control circuit 40, the second thermistor 22 is connected with multimeter 30.The high low-temperature test temperature control of the utility model platform is simple in structure, cost is low and easy operating.
Claims (1)
1. one kind high low-temperature test temperature control platform, it is characterized in that: comprise semiconductor chilling plate, multimeter and control circuit, described semiconductor chilling plate is provided with the first thermistor and the second thermistor, and described the first thermistor is connected with control circuit, and the second thermistor is connected with multimeter.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220589953 CN202904404U (en) | 2012-11-09 | 2012-11-09 | A temperature control platform used for high temperature and low temperature test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220589953 CN202904404U (en) | 2012-11-09 | 2012-11-09 | A temperature control platform used for high temperature and low temperature test |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202904404U true CN202904404U (en) | 2013-04-24 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201220589953 Expired - Lifetime CN202904404U (en) | 2012-11-09 | 2012-11-09 | A temperature control platform used for high temperature and low temperature test |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN202904404U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105548761A (en) * | 2015-12-23 | 2016-05-04 | 苏州创瑞机电科技有限公司 | High and low temperature aging test equipment based on semiconductor chilling plates |
-
2012
- 2012-11-09 CN CN 201220589953 patent/CN202904404U/en not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105548761A (en) * | 2015-12-23 | 2016-05-04 | 苏州创瑞机电科技有限公司 | High and low temperature aging test equipment based on semiconductor chilling plates |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term | ||
| CX01 | Expiry of patent term |
Granted publication date: 20130424 |