CN202903893U - 电容检测电路 - Google Patents
电容检测电路 Download PDFInfo
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- CN202903893U CN202903893U CN 201220261080 CN201220261080U CN202903893U CN 202903893 U CN202903893 U CN 202903893U CN 201220261080 CN201220261080 CN 201220261080 CN 201220261080 U CN201220261080 U CN 201220261080U CN 202903893 U CN202903893 U CN 202903893U
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CN 201220261080 CN202903893U (zh) | 2012-06-05 | 2012-06-05 | 电容检测电路 |
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CN 201220261080 CN202903893U (zh) | 2012-06-05 | 2012-06-05 | 电容检测电路 |
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CN202903893U true CN202903893U (zh) | 2013-04-24 |
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CN 201220261080 Expired - Lifetime CN202903893U (zh) | 2012-06-05 | 2012-06-05 | 电容检测电路 |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102749525A (zh) * | 2012-06-05 | 2012-10-24 | 泰凌微电子(上海)有限公司 | 电容检测方法及电容检测电路 |
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2012
- 2012-06-05 CN CN 201220261080 patent/CN202903893U/zh not_active Expired - Lifetime
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102749525A (zh) * | 2012-06-05 | 2012-10-24 | 泰凌微电子(上海)有限公司 | 电容检测方法及电容检测电路 |
CN102749525B (zh) * | 2012-06-05 | 2015-05-20 | 泰凌微电子(上海)有限公司 | 电容检测方法及电容检测电路 |
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Legal Events
Date | Code | Title | Description |
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C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C53 | Correction of patent of invention or patent application | ||
CB03 | Change of inventor or designer information |
Inventor after: Sheng Wenjun Inventor after: Xie Xun Inventor after: Zhang Yaoguo Inventor after: Fang Fei Inventor after: Wang Guang Inventor before: Xie Xun Inventor before: Zhang Yaoguo Inventor before: Fang Fei Inventor before: Wang Guang |
|
COR | Change of bibliographic data |
Free format text: CORRECT: INVENTOR; FROM: XIE XUN ZHANG YAOGUO FANG FEI WANG GUANG TO: SHENG WENJUN XIE XUN ZHANG YAOGUO FANG FEI WANG GUANG |
|
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20180125 Address after: 315499 Zhejiang province Yuyao Economic Development Zone Chengdong new district smelter mountain road Patentee after: Co semiconductor (Ningbo) Co., Ltd. Address before: No. 3, building No. 21, No. 88, Darwin Road, Zhangjiang High Tech Park, Pudong New Area, Shanghai Patentee before: Micro electronics (Shanghai) Co., Ltd. |
|
CX01 | Expiry of patent term | ||
CX01 | Expiry of patent term |
Granted publication date: 20130424 |