CN202748011U - Three-dimensional deformation measurement system with speckle correlation and speckle interference combined - Google Patents

Three-dimensional deformation measurement system with speckle correlation and speckle interference combined Download PDF

Info

Publication number
CN202748011U
CN202748011U CN 201220372299 CN201220372299U CN202748011U CN 202748011 U CN202748011 U CN 202748011U CN 201220372299 CN201220372299 CN 201220372299 CN 201220372299 U CN201220372299 U CN 201220372299U CN 202748011 U CN202748011 U CN 202748011U
Authority
CN
China
Prior art keywords
speckle
sigma
plane
displacement
measurement system
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN 201220372299
Other languages
Chinese (zh)
Inventor
孙平
孙明勇
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shandong Normal University
Original Assignee
Shandong Normal University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shandong Normal University filed Critical Shandong Normal University
Priority to CN 201220372299 priority Critical patent/CN202748011U/en
Application granted granted Critical
Publication of CN202748011U publication Critical patent/CN202748011U/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Landscapes

  • Length Measuring Devices By Optical Means (AREA)

Abstract

The utility model relates to a three-dimensional deformation measurement system with speckle correlation and speckle interference combined. The three-dimensional deformation measurement system comprises a laser device. Laser emitted by the laser device is subjected to beam expanding and passes through a half transparent and half reflecting mirror, and then respectively shines on an object to be tested and a reference object plane. The images of the object to be tested and the reference object plane are generated on a charge coupled device (CCD) video camera through the half transparent and half reflecting mirror via an imaging lens at the same time. The half transparent and half reflecting mirror is placed obliquely relative to incident rays in an angle of 45 degrees. When a reference light path exists, object plane speckle and reference plane speckle on a target plane of the CCD video camera are in mutual interference so that an interference speckle image is formed, an off-plane displacement component is measured, the reference object light path is removed, the speckle image on the object plane is collected, two speckle images before deformation and after deformation are used, and two components of in-plane displacement are worked out by using speckle correlation operation. According to the three-dimensional deformation measurement system, a typical numerical speckle light path which is sensitive to off-plane displacement is used, in-plane displacement measurement of the object by speckle correlation and off-plane displacement measurement by speckle interference are achieved, three-dimensional displacement measurement is achieved, and the three-dimensional deformation measurement system has the advantages of being simple in light path, simple and quick in operation and data processing.

Description

The measurement system for three-dimensional deformation that speckle is relevant and speckle interference combines
Technical field
The utility model relates to a kind of measurement system for three-dimensional deformation, relates in particular to the measurement system for three-dimensional deformation that a kind of speckle is relevant and speckle interference combines.
Background technology
By the digital speckle correlation method (Digital Speckle Correlation Method, DSCM) that the people such as I Yamaguchi, W.H.Peters and W.F.Ranson propose measure in real time at the mechanics of materials, fracturing mechanics, biomechanics, scene, the measurement of microscale deformation field, Electronic Packaging and numerous applications such as dynamic displacement and deformation test have all showed its applicability and superiority.The digital speckle correlation technology by record before and after the deformation of body image and displacement and the distortion of using certain image correlation searching algorithm to draw object, have that principle is simple, light path simple, noncontact, measurement environment required the advantages such as low.In recent years, the mathematical theory that some are modern and mathematical method are introduced in the method gradually, and the raising progressively of its measuring accuracy for example uses the sub-pix searching algorithm can obtain Displacement.The sub-pix algorithm has a variety of, mainly contains related coefficient fitting process, Newton.Raphson (N-R) process of iteration, based on method of gradient etc.Compare with additive method, gradient method has that anti-noise ability is higher, calculated amount is little, precision is than advantages of higher, and is hour more stable in displacement.At present, the DSCM field of using just gradually from the test of conventional material to some new materials tests, from macroscopic field gradually to trickle sight yardstick, from conventional environment to rugged environment relatively, progressively use, develop to dynamic accurate dynamic dispatching aspect from static quasistatic to engineering site from lab investigation.
Because the limitation that method itself has, the speckle correlation technique of single beam illumination can only be measured in-plane displacement.The scientific research personnel is just by measuring three-D displacement with DSCM with other measuring techniques combinations or by the relevant method of three-dimensional speckle.DSCM is combined with stereoscopic photograph technology or binocular measuring technique, can measure 3-D displacement field.For example the stereoscopic photography of professor Yao Xuefeng of Tsing-Hua University proposition combines with Digital Speckle Correlation Method for research 3 D deformation field; Binocular 3-dimensional digital speckle measurement of correlation 3 D deformation and 3 d shape technology that Xie Hui people professor proposes.DSCM is combined with the pin hole camera technique, and professor He Xiaoyuan of Southeast China University has proposed relevant the combining with the pinhole camera imaging model of digital picture and has measured the three-dimensional body displacement method.By the relevant method of three-dimensional speckle, the 5 little flat academicians of Chinese University of Science and Technology, professor Hu Xiaofang etc. utilize simulated experiment to obtain the interior of articles 3-D displacement field.
Utilize electronic speckle pattern interferometry (ESPI) method can measure the three-D displacement of object, have noncontact, measurement of full field, the advantage that precision is high.The electronic speckle pattern interferometry technology is based on reference light and thing light is measured in CCD target surface generation speckle interference.Therefore, three-dimensional speckle is interfered often light path more complicated.Complicated light path has increased the measuring system instability, has reduced measuring accuracy.
DSCM is combined with speckle interference, also can measure 3-D displacement field.Professor Zhang Qingchuan adopts two cover light paths, to the positive speckle measurement of correlation that adopts of test specimen, the reverse side employing speckle interference of test specimen is measured, and has realized the three-D displacement field measurement.The method is that the different surfaces of test specimen is measured, and is not the 3 D deformation on same surface.Professors Zhou Canlin etc. measure distortion to relevant combining with electronic speckle pattern interferometry of speckle, what adopt is typical speckle relevant light paths, the speckle interference image that at first the speckle interference four-step phase-shifting is gathered is processed, then the image of processing is carried out the speckle correlation computations, thereby obtain the 3 D deformation field.Used principle is then very complicated, image processing process is also very complicated, not directly to obtain required speckle pattern when utilizing speckle correlation computations in-plane displacement, but obtained through processing by the phase shifted images that gathers before and after the distortion, be difficult to obtain the numerical value of 3 D deformation field in the practical operation.
The utility model content
The purpose of this utility model is exactly in order to address the above problem, the measurement system for three-dimensional deformation that a kind of speckle is relevant and speckle interference combines is provided, it utilizes typical Michelson speckle light path to the acoplanarity displacement sensitivity, by the reference light in the control light path, realize in-plane displacement and the speckle interference measurement acoplanarity displacement of speckle measurement of correlation object, realized the three-D displacement measurement, the advantage that this system has that light path is simple, operation and data are processed simple and fast.
To achieve these goals, the utility model adopts following technical scheme:
The measurement system for three-dimensional deformation that a kind of speckle is relevant and speckle interference combines, it comprises laser instrument, the laser that laser instrument sends is sent into beam expanding lens; The beam expanding lens rear is provided with the semi-transparent semi-reflecting lens of placing with incident ray overturning angle at 45 °, and the reflected light of semi-transparent semi-reflecting lens shines measured object, and transmitted light then shines with reference to object plane, connects and composes the reference phase shift light path with reference to object plane and PZT phase-shifter; The speckle image of measured object is imaged on the ccd video camera by imaging len through semi-transparent semi-reflecting lens, utilizes two width of cloth speckle patterns of measured object distortion front and back, calculates two components of in-plane displacement; The speckle image on measured object surface is interfered speckle image with the speckle image formation with reference to object plane when reference path is worked, and is imaged on the ccd video camera by imaging len, measures object acoplanarity displacement component.
A kind of measuring method that adopts the relevant and measurement system for three-dimensional deformation that speckle interference combines of speckle, it is by the control reference path, and relevant and speckle interference combines the 3 D deformation of measuring object with digital speckle; Detailed process is: at first gather the speckle pattern before the width of cloth measured object distortion without the reference laser of reference path the time; Then the reference laser that adds reference path is realized speckle interference; Loading makes the measured object distortion, measures the measured object acoplanarity displacement in conjunction with phase-shifting technique; Remove at last the speckle pattern after reference laser gathers width of cloth measured object distortion again; Speckle pattern before and after the measured object distortion is carried out the speckle related operation, obtain two-dimensional surface intrinsic displacement component, thereby realize the 3 D deformation measurement.
Concrete steps of the present utility model are:
Step 1: the reflected light with reference to object plane consists of reference light; Without reference light the time, utilize the speckle pattern before CCD gathers the measured object distortion;
Step 2: add the reference light of reference path, realize digital speckle interference;
Step 3: load and make the measured object distortion, in conjunction with four-step phase-shifting commercial measurement measured object acoplanarity displacement w field;
Step 4: remove reference light; Utilize the speckle pattern after CCD gathers the measured object distortion;
Step 5: the speckle pattern after the speckle pattern before the measured object distortion of integrating step one and the measured object distortion of step 4, speckle pattern before and after the measured object distortion is carried out the speckle related operation, obtain two-dimensional surface intrinsic displacement component u, v field.
Acoplanarity displacement is the displacement w field perpendicular to the body surface direction in the described step 3, and concrete measuring process is:
According to phase of light wave change and deformation of body between relation:
Figure DEST_PATH_GDA00002558371900031
Wherein, λ is the wavelength of used laser, and θ is the angle of illumination light and body surface normal, and w is the acoplanarity displacement of deformation of body, and u is the interior horizontal direction displacement of the face of deformation of body; Known when illumination light incident angle θ=0, have by formula (4):
Figure DEST_PATH_GDA00002558371900032
Adopt existing phase-shifting technique, calculate the deformation of body phase place And then draw acoplanarity displacement w field.
The concrete steps of described step 5 are: described two-dimensional surface intrinsic displacement component is horizontal direction displacement component u and vertical direction displacement component v, and the speckle correlation computations is utilized formula (1),
C ( u , v ) = Σ i m Σ j m [ f ( x i , y j ) - f ‾ ] [ g ( x i + u , y j + v ) - g ‾ ] Σ i m Σ j m [ f ( x i , y j ) - f ‾ ] 2 Σ i m Σ j m [ g ( x i + u , y j + v ) - g ‾ ] 2 - - - ( 1 )
Wherein, f (x, y) is the front image of distortion, (x i, y j) being any one displacement point in the image before the distortion, g (x ', y ') is the image after the distortion, u, v be the whole pixel displacement of corresponding point in the image of displacement point (x, y) after distortion in the corresponding original image (x ', y ') respectively, (x i+ u, y j+ v) be displacement point (x i, y j) in x iU and y have been moved jMoved the displacement point in the image after the distortion that v obtains,
Figure DEST_PATH_GDA00002558371900035
With
Figure DEST_PATH_GDA00002558371900036
Be the image subsection average gray; In order to improve measuring accuracy, find the solution in the calculating that the basis of formula (1) utilizes gradient algorithm further to carry out Displacement, the selected Calculation of correlation factor formula of gradient method be formula (1) square, i.e. formula (2);
C ( u , v ) = { Σ m i Σ m j [ f ( x i , y j ) - f ‾ ] [ g ( x i + u + Δu , y j + v + Δv ) - g ‾ ] } 2 Σ i m Σ j m [ f ( x i , y j ) - f ‾ ] 2 Σ i m Σ j m [ g ( x i + u + Δu , y j + v + Δv ) - g ‾ ] 2 - - - ( 2 )
Wherein, Δ u, Δ v are the Displacement corresponding to whole pixel displacement result;
Will Taylor expansion is got first approximation, and order
Figure DEST_PATH_GDA00002558371900042
Figure DEST_PATH_GDA00002558371900043
Through deriving:
Δu Δv = B C E H - 1 A D - - - ( 3 )
Wherein
A = Σ i = 1 m Σ j = 1 m FG Σ i = 1 m Σ j = 1 m GG x - Σ i = 1 m Σ j = 1 m FG x Σ i = 1 m Σ j = 1 m G 2 ,
B = Σ i = 1 m Σ j = 1 m F G x Σ i = 1 m Σ j = 1 m GG x - Σ i = 1 m Σ j = 1 m G x 2 Σ i = 1 m Σ j = 1 m FG ,
C = 2 Σ i = 1 m Σ j = 1 m F G x Σ i = 1 m Σ j = 1 m GG y - Σ i = 1 m Σ j = 1 m GG x Σ i = 1 m Σ j = 1 m FG y - Σ i = 1 m Σ j = 1 m G x G y Σ i = 1 m Σ j = 1 m FG ,
D = Σ i = 1 m Σ j = 1 m F G Σ i = 1 m Σ j = 1 m GG y - Σ i = 1 m Σ j = 1 m FG y Σ i = 1 m Σ j = 1 m G 2 ,
E = 2 Σ i = 1 m Σ j = 1 m F G y Σ i = 1 m Σ j = 1 m GG x - Σ i = 1 m Σ j = 1 m GG y Σ i = 1 m Σ j = 1 m FG x - Σ i = 1 m Σ j = 1 m G x G y Σ i = 1 m Σ j = 1 m FG ,
H = Σ i = 1 m Σ j = 1 m F G y Σ i = 1 m Σ j = 1 m GG y - Σ i = 1 m Σ j = 1 m G y 2 Σ i = 1 m Σ j = 1 m FG ,
G ( x i , y j ) = g ( x i + u , y j + v ) - g ‾ ,
G x = g x - g ‾ x , G y = g y - g ‾ y ,
F ( x i , y j ) = f ( x i , y j ) - f ‾ ,
G in the formula xG is to x in expression iAsk local derviation, G yG is to y in expression jAsk local derviation, g xExpression g (x i+ u, y j+ v) to x iAsk local derviation, g yExpression g (x i+ u, y j+ v) to y jAsk local derviation,
Figure DEST_PATH_GDA000025583719000415
Expression To x iAsk local derviation,
Figure DEST_PATH_GDA000025583719000417
Expression To y jAsk local derviation, m is iterations.
The beneficial effects of the utility model: utilize typical digital speckle interference light path to the acoplanarity displacement sensitivity, by the reference light in the control light path, realize in-plane displacement and the speckle interference measurement acoplanarity displacement of speckle measurement of correlation object, realized the three-D displacement measurement.The advantage that this system has that light path is simple, operation and data are processed simple and fast.
Description of drawings
Fig. 1 is optical measuring system figure;
The speckle image of Fig. 2 when not being out of shape;
Fig. 3 for the distortion after from the face interference fringe;
Fig. 4 is the speckle image after being out of shape;
Fig. 5 is the three-D displacement horizontal direction component behind the deformation of body, the u field pattern;
Fig. 6 is the three-D displacement vertical direction component behind the deformation of body, the v field pattern;
Fig. 7 is the three-D displacement acoplanarity displacement component behind the deformation of body, the w field pattern;
Fig. 8 is process flow diagram of the present utility model.
Wherein, 1. laser instrument, 2. beam expanding lens, 3. semi-transparent semi-reflecting lens, 4. tested object plane, 5. with reference to object plane, 6.PZT phase-shifter, 7. imaging len, 8.CCD video camera.
Embodiment
The utility model is described in further detail below in conjunction with accompanying drawing and embodiment.
Among Fig. 1, the measurement system for three-dimensional deformation that a kind of speckle is relevant and speckle interference combines, it comprises the speckle relevant light paths of measuring object plane internal strain component and the speckle interference phase shift light path of measuring the acoplanarity displacement component; Behind the laser beam expanding that laser instrument 1 sends by throw light on respectively tested object plane 4 and with reference to object plane 5 of semi-transparent semi-reflecting lens 3.Semi-transparent semi-reflecting lens 3 is placed with incident light overturning angle at 45 °.The reflected light of tested object plane 4 sees through semi-transparent semi-reflecting lens 3, with reference to the reflected light of object plane 5 in semi-transparent semi-reflecting lens 3 reflections, two bundle light through imaging lens 7 post-concentrations on ccd video camera 8.
Test light path as shown in Figure 1, test specimen is the organic glass free beam, long 150.0mm, high 19.5mm, thick 18.5mm.Be coated with water paint on the free beam surface, to strengthen its reflectivity, whole experimental provision is placed on the anti-vibration platform and carries out.As light source, light beam is radiated on the free beam surface after beam expanding lens 2 expands with He-Ne laser instrument 1.By semi-transparent semi-reflecting lens 3(BS) the in addition light beam told is as reference light.During experiment, the process flow diagram of this method as shown in Figure 8, the speckle image when at first blocking reference light and gathering a width of cloth free beam and be not out of shape, as shown in Figure 2; Then add reference light, realize electronic speckle pattern interferometry; Gather object speckle interference image and subtract each other in real time, during free beam is loaded, can observe object acoplanarity displacement striped, as shown in Figure 3; Use the phase shifts such as PZT phase-shifter 6 realizations and gather speckle interference fringe pattern; At last, block reference light, again gather the speckle image after free beam is out of shape, as shown in Figure 4.
Described two-dimensional surface intrinsic displacement component is: utilize formula (1)
C ( u , v ) = Σ m i Σ m j [ f ( x i , y j ) - f ‾ ] [ g ( x i + u , y j + v ) - g ‾ ] Σ i m Σ j m [ f ( x i , y j ) - f ‾ ] 2 Σ i m Σ j m [ g ( x i + u , y j + v ) - g ‾ ] 2 - - - ( 1 )
Wherein, f (x, y) is the front image of distortion, (x i, y j) being any one displacement point in the image before the distortion, g (x ', y ') is the image after the distortion, u, v be the whole pixel displacement of corresponding point in the image of displacement point (x, y) after distortion in the corresponding original image (x ', y ') respectively, (x i+ u, y j+ v) be displacement point (x i, y j) in x iU and y have been moved jMoved the displacement point in the image after the distortion that v obtains,
Figure DEST_PATH_GDA00002558371900061
With
Figure DEST_PATH_GDA00002558371900062
Be the image subsection average gray; In order to improve measuring accuracy, utilize existing gradient method further to carry out the calculating of Displacement on the basis of formula (1), the selected Calculation of correlation factor formula of gradient method be formula (1) square, i.e. formula (2)
C ( u , v ) = { Σ m i Σ m j [ f ( x i , y j ) - f ‾ ] [ g ( x i + u + Δu , y j + v + Δv ) - g ‾ ] } 2 Σ i m Σ j m [ f ( x i , y j ) - f ‾ ] 2 Σ i m Σ j m [ g ( x i + u + Δu , y j + v + Δv ) - g ‾ ] 2 - - - ( 2 )
Wherein, Δ u, Δ v are the Displacement corresponding to whole pixel displacement result;
Will
Figure DEST_PATH_GDA00002558371900064
Taylor expansion is got first approximation, and order
Figure DEST_PATH_GDA00002558371900066
Through deriving:
Δu Δv = B C E H - 1 A D - - - ( 3 )
Wherein
A = Σ i = 1 m Σ j = 1 m FG Σ i = 1 m Σ j = 1 m GG x - Σ i = 1 m Σ j = 1 m FG x Σ i = 1 m Σ j = 1 m G 2 ,
B = Σ i = 1 m Σ j = 1 m F G x Σ i = 1 m Σ j = 1 m GG x - Σ i = 1 m Σ j = 1 m G x 2 Σ i = 1 m Σ j = 1 m FG ,
C = 2 Σ i = 1 m Σ j = 1 m F G x Σ i = 1 m Σ j = 1 m GG y - Σ i = 1 m Σ j = 1 m GG x Σ i = 1 m Σ j = 1 m FG y - Σ i = 1 m Σ j = 1 m G x G y Σ i = 1 m Σ j = 1 m FG ,
D = Σ i = 1 m Σ j = 1 m F G Σ i = 1 m Σ j = 1 m GG y - Σ i = 1 m Σ j = 1 m FG y Σ i = 1 m Σ j = 1 m G 2 ,
E = 2 Σ i = 1 m Σ j = 1 m F G y Σ i = 1 m Σ j = 1 m GG x - Σ i = 1 m Σ j = 1 m GG y Σ i = 1 m Σ j = 1 m FG x - Σ i = 1 m Σ j = 1 m G x G y Σ i = 1 m Σ j = 1 m FG ,
H = Σ i = 1 m Σ j = 1 m F G y Σ i = 1 m Σ j = 1 m GG y - Σ i = 1 m Σ j = 1 m G y 2 Σ i = 1 m Σ j = 1 m FG .
G ( x i , y j ) = g ( x i + u , y j + v ) - g ‾ ,
G x = g x - g ‾ x , G y = g y - g ‾ y ,
F ( x i , y j ) = f ( x i , y j ) - f ‾ .
In the formula, G xG is to x in expression iAsk local derviation, G yG is to y in expression jAsk local derviation, g xExpression g (x i+ u, y j+ v) to x iAsk local derviation, g yExpression g (x i+ u, y j+ v) to y jAsk local derviation, Expression
Figure DEST_PATH_GDA00002558371900072
To x iAsk local derviation,
Figure DEST_PATH_GDA00002558371900073
Expression
Figure DEST_PATH_GDA00002558371900074
To y jAsk local derviation, m is iterations.
Described off-surface displacement measurement process is:
Phase of light wave changes and the phase relation of deformation of body is:
Figure DEST_PATH_GDA00002558371900075
Wherein, λ is the wavelength of used laser, and θ is the angle of illumination light and body surface normal, and w is the acoplanarity displacement of deformation of body, and u is the interior horizontal direction displacement of the face of deformation of body; Known that by formula (4) as illumination light incident angle θ during less than 5 °, approximate to regard change in optical path length as only relevant with acoplanarity displacement w, by formula (4):
Figure DEST_PATH_GDA00002558371900076
Adopt phase-shifting technique to calculate the deformation of body phase place
Figure DEST_PATH_GDA00002558371900077
And then draw the w field.
Speckle image (Fig. 2 and Fig. 4) is used for speckle correlation computations in-plane displacement u field and v field (unit: pixel) before and after the distortion.Adopt existing phase-shifting technique that speckle interference fringe pattern is processed, can obtain acoplanarity displacement w field (unit: micron).Variable shaped beam 3 D deformation component experimental result such as Fig. 5, Fig. 6, shown in Figure 7.
Experimental result shows, utilizes speckle method relevant and that speckle interference combines can measure fast and effectively the object dimensional distortion, has that light path is simple to operation, data are processed simple advantage.Experimental result v, w field and document [Sun Ping, Fan Xiangju, Wang Xinghai. based on the three-dimensional carrier frequency electronic speckle interference technique [J] of large-misplacement square glass prism. Acta Optica, 2011,31 (4): 0412012] in the result coincide better, the u field is substantially identical.
Although above-mentionedly by reference to the accompanying drawings embodiment of the present utility model is described; but be not the restriction to the utility model protection domain; one of ordinary skill in the art should be understood that; on the basis of the technical solution of the utility model, those skilled in the art do not need to pay various modifications that creative work can make or distortion still in protection domain of the present utility model.

Claims (1)

1. the measurement system for three-dimensional deformation that speckle is relevant and speckle interference combines is characterized in that it comprises laser instrument, and the laser that laser instrument sends is sent into beam expanding lens; The beam expanding lens rear is provided with the semi-transparent semi-reflecting lens of placing with incident ray overturning angle at 45 °, and the reflected light of semi-transparent semi-reflecting lens shines measured object, and transmitted light then shines with reference to object plane, connects and composes reference path with reference to object plane and PZT phase-shifter; The speckle image of measured object is imaged on the ccd video camera by imaging len through semi-transparent semi-reflecting lens, utilizes two width of cloth speckle patterns of measured object distortion front and back, calculates two components of in-plane displacement; The speckle image on measured object surface is interfered speckle image with the speckle image formation with reference to object plane when reference path is worked, and is imaged on the ccd video camera by imaging len, measures object acoplanarity displacement component.
CN 201220372299 2012-07-30 2012-07-30 Three-dimensional deformation measurement system with speckle correlation and speckle interference combined Expired - Fee Related CN202748011U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 201220372299 CN202748011U (en) 2012-07-30 2012-07-30 Three-dimensional deformation measurement system with speckle correlation and speckle interference combined

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 201220372299 CN202748011U (en) 2012-07-30 2012-07-30 Three-dimensional deformation measurement system with speckle correlation and speckle interference combined

Publications (1)

Publication Number Publication Date
CN202748011U true CN202748011U (en) 2013-02-20

Family

ID=47707389

Family Applications (1)

Application Number Title Priority Date Filing Date
CN 201220372299 Expired - Fee Related CN202748011U (en) 2012-07-30 2012-07-30 Three-dimensional deformation measurement system with speckle correlation and speckle interference combined

Country Status (1)

Country Link
CN (1) CN202748011U (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102788558A (en) * 2012-07-30 2012-11-21 山东师范大学 Three-dimensional deformation measuring system and three-dimensional deformation measuring method combining speckle correlation and speckle interference
CN103673912A (en) * 2013-12-07 2014-03-26 中国民航大学 Image correcting system for deformation measurement of speckle correlation methods
CN103983198A (en) * 2014-05-29 2014-08-13 山东师范大学 System and method for measuring out-of-plane displacement through vortex light
CN104215193B (en) * 2014-08-26 2017-06-23 北京信息科技大学 Object plane distortion measurement method and measuring system
CN110006935A (en) * 2019-04-19 2019-07-12 上海工程技术大学 Ultrafast laser fine difference speckle preparation method based on DIC microcell dynamic strain measuring
CN110245634A (en) * 2019-06-20 2019-09-17 招商局重庆交通科研设计院有限公司 Multiposition, multi-angle crag deformation judgement and analysis method
CN110657755A (en) * 2019-09-30 2020-01-07 上海交通大学 Speckle interference deformation measurement system calibration method and loading device

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102788558A (en) * 2012-07-30 2012-11-21 山东师范大学 Three-dimensional deformation measuring system and three-dimensional deformation measuring method combining speckle correlation and speckle interference
CN102788558B (en) * 2012-07-30 2014-12-10 山东师范大学 Three-dimensional deformation measuring system and three-dimensional deformation measuring method combining speckle correlation and speckle interference
CN103673912A (en) * 2013-12-07 2014-03-26 中国民航大学 Image correcting system for deformation measurement of speckle correlation methods
CN103983198A (en) * 2014-05-29 2014-08-13 山东师范大学 System and method for measuring out-of-plane displacement through vortex light
CN103983198B (en) * 2014-05-29 2016-09-07 山东师范大学 A kind of system and method utilizing vortex photo measure acoplanarity displacement
CN104215193B (en) * 2014-08-26 2017-06-23 北京信息科技大学 Object plane distortion measurement method and measuring system
CN110006935A (en) * 2019-04-19 2019-07-12 上海工程技术大学 Ultrafast laser fine difference speckle preparation method based on DIC microcell dynamic strain measuring
CN110245634A (en) * 2019-06-20 2019-09-17 招商局重庆交通科研设计院有限公司 Multiposition, multi-angle crag deformation judgement and analysis method
CN110657755A (en) * 2019-09-30 2020-01-07 上海交通大学 Speckle interference deformation measurement system calibration method and loading device
CN110657755B (en) * 2019-09-30 2021-06-29 上海交通大学 Speckle interference deformation measurement system calibration method and loading device

Similar Documents

Publication Publication Date Title
CN102788558B (en) Three-dimensional deformation measuring system and three-dimensional deformation measuring method combining speckle correlation and speckle interference
CN202748011U (en) Three-dimensional deformation measurement system with speckle correlation and speckle interference combined
Pan Digital image correlation for surface deformation measurement: historical developments, recent advances and future goals
Zappa et al. Static and dynamic features of Fourier transform profilometry: A review
CN102589416B (en) Wavelength scanning interferometer and method for aspheric measurement
CN102865811B (en) Orthogonal double grating based synchronous phase shifting common-path interference microscopy detection device and detection method
CN101769722B (en) Method for heterodyne temporal series speckle interferometry of object deformation
CN101915559B (en) Method and system thereof for measuring three-dimensional surface shape of object by electronic speckle phase shift technology
CN102425998B (en) Full parameter detection apparatus of polished surface quality of optical element and detection method thereof
CN103528524A (en) Device and method of perspective measurement of distribution of out-of-plane displacement field in resin matrix composite
CN101893429A (en) Super-precision surface measuring system based on polarization phase-shifting microscopy interference technology
CN105571517A (en) Modified coherence peak demodulation method for fiber end face detection
CN102353332A (en) Electronic speckle-interference digital-compensating method and system thereof
CN105371778A (en) Real-time measurement method and system for digital cutting speckle interference
CN104296678A (en) Heterodyne interferometer based on phase shift of low-frequency-difference acousto-optic frequency shifter
Miao et al. Surface profile and stress field evaluation using digital gradient sensing method
CN111412852A (en) Dual-wavelength dual-mode dynamic digital speckle interferometry device and method
Chen et al. Real-time scanner error correction in white light interferometry
Gu et al. Synchronous triple-optical-path digital speckle pattern interferometry with fast discrete curvelet transform for measuring three-dimensional displacements
CN102865810B (en) Orthogonal double-grating based detecting device for synchronous phase shift common-light path interference and detecting method therefor
US6741362B2 (en) Method, system, and computer program product for determining refractive index distribution
CN105181646A (en) Computer vision based transparent medium refractivity measurement method
CN103267485A (en) Point-diffraction three-dimensional absolute displacement measuring method
CN108413893B (en) Method and device for detecting surface shape of planar element by speckle deflection technique
CN201724658U (en) System for measuring three dimensional surface shape of an object by electronic speckle phase shift technology

Legal Events

Date Code Title Description
C14 Grant of patent or utility model
GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20130220

Termination date: 20130730