CN202735474U - Simple triode feature testing system - Google Patents
Simple triode feature testing system Download PDFInfo
- Publication number
- CN202735474U CN202735474U CN 201220320745 CN201220320745U CN202735474U CN 202735474 U CN202735474 U CN 202735474U CN 201220320745 CN201220320745 CN 201220320745 CN 201220320745 U CN201220320745 U CN 201220320745U CN 202735474 U CN202735474 U CN 202735474U
- Authority
- CN
- China
- Prior art keywords
- microcontroller
- triode
- circuit
- chip
- source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Abstract
The utility model relates to a simple triode feature testing system which comprises a first microcontroller, a second microcontroller, a voltage sampling circuit, a digital control power supply, a digital control frequency source, a frequency measuring circuit and a display output circuit, wherein the first microcontroller is connected with the digital control power supply; the digital control power supply is connected with a triode to be tested; the triode to be tested is further connected with the first microcontroller through the voltage sampling circuit; the first microcontroller is connected with the display output circuit; the second microcontroller is connected with the digital control frequency source; the digital control frequency source is connected with the triode to be tested through the frequency measuring circuit; and the frequency measuring circuit is connected with the display output circuit through the second microcontroller. The triode feature testing system provided by the utility model has the advantages of reliable performance, strong interference resistance capability, low power consumption, high cost performance and the like, and the triode feature testing system can be used for detecting the quality and the performance of liquid crystal triodes in laboratories and factories.
Description
Technical field
The utility model relates to a kind of simple and easy dynatron performance measuring system.
Background technology
Exist multiple dynatron performance to measure graphic instrument on the market, be used for observing and measuring the various input-output characteristics of transistor, its better performances, precision are higher, generally adopt mimic channel to make, and make complicated, and expensive.The small-sized dynatron performance graphic instrument of part adopts digital circuit to make, and is cheap, but measuring accuracy is lower, and the parameter kind of measuring is less, generally can only measure output characteristics.Therefore need that a kind of making is relatively simple and cost is lower, use also very convenient, and can be to the dynatron performance measuring system of the characteristic ordinary surveying that comprises frequency characteristic.
Summary of the invention
The utility model purpose is to address the above problem, and provides that a kind of measuring accuracy is higher, measurement parameter is more complete, and lower-cost dynatron performance measuring system.
The utility model is achieved through the following technical solutions:
A kind of simple and easy dynatron performance measuring system, be connected with triode to be measured, this system comprises the first microcontroller, the second microcontroller, voltage sampling circuit, DCPS digitally controlled power source, numerical control frequency source, frequency measurement circuit and display output circuit, described the first microcontroller is connected with DCPS digitally controlled power source, described DCPS digitally controlled power source is connected with triode to be measured, triode to be measured is connected with the first microcontroller by voltage sampling circuit again, and the first microcontroller is connected with described display output circuit; Described the second microcontroller is connected with the numerical control frequency source, and described numerical control frequency source is connected with triode to be measured by frequency measurement circuit, and described frequency measurement circuit is connected with display output circuit by the second microcontroller.
Described simple and easy dynatron performance measuring system, further design is, described first, second microcontroller is the 89S52 single-chip microcomputer.
Described simple and easy dynatron performance measuring system, further design is, described voltage sampling circuit comprises chip ADC080, amplifier chip OPA27 and INA120.
Described simple and easy dynatron performance measuring system, further design is, DCPS digitally controlled power source comprises Numerical Controlled Current Source and numerical control voltage source, and described Numerical Controlled Current Source is D/A conversion chip DAC0832, and described numerical control voltage source comprises D/A conversion chip DAC0832 and amplifier chip OPA27.
Described simple and easy dynatron performance measuring system, further design is, described display output circuit is oscillograph.
Described simple and easy dynatron performance measuring system, further design is, described numerical frequency source comprises 74LVT245B chip and DDS chip AD9852.
The beneficial effects of the utility model are:
The dynatron performance measuring system that the utility model provides has that dependable performance, antijamming capability are strong, low in energy consumption, the cost performance advantages of higher, can be applicable to the laboratory, factory is detected the capability and performance of transistor.
Description of drawings
Fig. 1 is system framework figure of the present utility model.
Fig. 2 is the system chart of numerical control frequency source of the present utility model.
Fig. 3 is frequency characteristic test schematic diagram of the present utility model.
Embodiment
Below in conjunction with Figure of description and specific embodiment the utility model is further specified.
As shown in Figure 1 and Figure 2, this system comprises the first microcontroller, the second microcontroller, voltage sampling circuit, DCPS digitally controlled power source, numerical control frequency source, frequency measurement circuit and display output circuit, the first microcontroller is connected with DCPS digitally controlled power source, DCPS digitally controlled power source is connected with triode to be measured, triode to be measured is connected with the first microcontroller by voltage sampling circuit again, and the first microcontroller is connected with display output circuit; The second microcontroller is connected with the numerical control frequency source, and the numerical control frequency source is connected with triode to be measured by frequency measurement circuit, and frequency measurement circuit is connected with display output circuit by the second microcontroller.First, second microcontroller is the 89S52 single-chip microcomputer.Voltage sampling circuit comprises chip ADC080, amplifier chip OPA27 and INA120.
DCPS digitally controlled power source comprises Numerical Controlled Current Source and numerical control voltage source, and Numerical Controlled Current Source is D/A conversion chip DAC0832, and the numerical control voltage source comprises D/A conversion chip DAC0832 and amplifier chip OPA27.Display output circuit is oscillograph.The numerical frequency source comprises 74LVT245B chip and DDS chip AD9852.
Simple and easy dynatron performance measuring system adopts two 89S52 single-chip microcomputers as first, second microcontroller, and frame diagram as shown in Figure 1, and is when measuring the input characteristics measurement, fixing first
Be certain value, increase gradually base current since 0, A/D converter detects by metering circuit
, output to display circuit with the data storage of A/D conversion and after processing.When measuring output characteristics, Numerical Controlled Current Source produces the grading current of certain frequency under the control of the first microcontroller, and the numerical control voltage source produces certain frequency from the scanning voltage of 0-20V under the control of microcontroller, extracts to characterize collector current
Voltage show output characteristic curve to the oscillograph Y-axis.Input and output show adopts oscillograph directly to show, parallel interface chip 8255A realizes the input of measuring-signal as interface circuit.
Voltage sampling circuit mainly is made of chip ADC080, amplifier OPA27 and INA120, INA120 is precision operational-amplifier, device itself provide standard * 1, * 10, * 100, * 1000 fourth gear yield values, utilize the two paths of data Acquisition Circuit respectively the voltage at emitter junction voltage and emitter resistance two ends to be sampled, the in the same way ratio amplifying circuit that emitter junction voltage forms through OPA27 amplifies the IN-2 passage that send ADC0809 after 4 times and samples.
During the survey frequency characteristic, the numerical control frequency source produces the AC signal that frequency increases gradually under the control of the second microcontroller.The basic R-C coupling total radio amplifier that this AC signal access is comprised of test transistor and auxiliary circuit.Output and the input signal of amplifying circuit are accessed respectively oscillographic Y1 and Y2 passage.Measure variation and the phase propetry that exchanges enlargement factor by the waveform of oscilloscope display, when enlargement factor is reduced to a certain degree, read the cascode cutoff frequency by the frequency display part.The numerical control frequency source can produce multiple waveforms, comes transistorized various frequency performances are measured by moving different waveform generation programs.
Numerical frequency source framework adopts DDS chip AD9852 to form monolithic processor controlled numerical control frequency source (DDS) circuit as shown in Figure 2.Control chip AT89S52 supply voltage is+3.3V, has the level conversion problem of TTL circuit and cmos circuit here, adopts logic level under the 74LVT245B chip realizations+5V power supply of Philips company to arrive+conversion of 3.3V logic level.
The frequency characteristic measurement circuit is received the measurement that just can realize the transistor frequency characteristic on the circuit with oscillographic two passage Y1, Y2 as shown in Figure 3.DDS numerical control frequency source produces the sinusoidal signal that frequency increases gradually under programmed control, observe transistorized interchange amplification characteristic by oscillograph, when enlargement factor is reduced to a certain degree, read transistor cascode cutoff frequency at the LCD of DDS numerical control frequency source, keyboard by DDS numerical control frequency source can be changed test frequency and waveform, and then can make comparisons to transistorized frequency characteristic and comprehensively test.
Claims (6)
1. simple and easy dynatron performance measuring system, be connected with triode to be measured, it is characterized in that, this system comprises the first microcontroller, the second microcontroller, voltage sampling circuit, DCPS digitally controlled power source, numerical control frequency source, frequency measurement circuit and display output circuit, described the first microcontroller is connected with DCPS digitally controlled power source, described DCPS digitally controlled power source is connected with triode to be measured, triode to be measured is connected with the first microcontroller by voltage sampling circuit again, and the first microcontroller is connected with described display output circuit; Described the second microcontroller is connected with the numerical control frequency source, and described numerical control frequency source is connected with triode to be measured by frequency measurement circuit, and described frequency measurement circuit is connected with display output circuit by the second microcontroller.
2. simple and easy dynatron performance measuring system according to claim 1 is characterized in that, described first, second microcontroller all adopts the 89S52 single-chip microcomputer.
3. simple and easy dynatron performance measuring system according to claim 1 is characterized in that, described voltage sampling circuit comprises chip ADC080, amplifier chip OPA27 and INA120.
4. simple and easy dynatron performance measuring system according to claim 1, it is characterized in that, DCPS digitally controlled power source comprises Numerical Controlled Current Source and numerical control voltage source, described Numerical Controlled Current Source adopts D/A conversion chip DAC0832, and described numerical control voltage source comprises D/A conversion chip DAC0832 and amplifier chip OPA27.
5. simple and easy dynatron performance measuring system according to claim 1 is characterized in that, described display output circuit is oscillograph.
6. simple and easy dynatron performance measuring system according to claim 1 is characterized in that, described numerical frequency source comprises 74LVT245B chip and DDS chip AD9852.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220320745 CN202735474U (en) | 2012-07-04 | 2012-07-04 | Simple triode feature testing system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220320745 CN202735474U (en) | 2012-07-04 | 2012-07-04 | Simple triode feature testing system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202735474U true CN202735474U (en) | 2013-02-13 |
Family
ID=47661159
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201220320745 Expired - Fee Related CN202735474U (en) | 2012-07-04 | 2012-07-04 | Simple triode feature testing system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN202735474U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110596575A (en) * | 2019-10-16 | 2019-12-20 | 岭南师范学院 | Triode amplifying circuit characteristic detection system and method |
| CN111856234A (en) * | 2020-07-23 | 2020-10-30 | 广东时科微实业有限公司 | Transistor fault detection platform and fault detection mode |
-
2012
- 2012-07-04 CN CN 201220320745 patent/CN202735474U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110596575A (en) * | 2019-10-16 | 2019-12-20 | 岭南师范学院 | Triode amplifying circuit characteristic detection system and method |
| CN111856234A (en) * | 2020-07-23 | 2020-10-30 | 广东时科微实业有限公司 | Transistor fault detection platform and fault detection mode |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN207703359U (en) | A kind of acquisition of multichannel thermistor temp and processing unit | |
| CN102435847B (en) | High-precision electrical parameter analyzer | |
| CN203117415U (en) | Parallel detection system for active power errors and reactive power errors of electric energy meter | |
| CN202735474U (en) | Simple triode feature testing system | |
| CN104316892A (en) | Transformer load box calibration device | |
| CN202975080U (en) | A portable signal reference instrument | |
| CN203849398U (en) | An electric energy meter on-site value transmission apparatus | |
| CN202421332U (en) | High precision electric parameter analyzer | |
| CN203037609U (en) | Humidity transmitter | |
| CN203178378U (en) | Electronic transformer digit quantity output calibration device | |
| CN109444588A (en) | A kind of LCR measuring system based on FPGA+DDS+PLL | |
| CN201757765U (en) | Micro galvanometer for photocurrent detection | |
| CN203587717U (en) | Simple volt-ampere characteristics tester | |
| CN203069744U (en) | Semiconductor triode parameter tester | |
| CN103438911B (en) | LC resonant transducer reading system under fixed pattern frequently and method | |
| CN106226727A (en) | User's electric energy metering error on-line checking analyzes system and method | |
| Ren et al. | Multi-channel temperature measurement system based on LabVIEW | |
| CN206563546U (en) | Simple capacitive displacement transducer | |
| CN206378535U (en) | A kind of detection platform of small resistor resistance | |
| CN204649672U (en) | A kind of high-accuracy survey nitrogen instrument based on thermal conductivity sensor | |
| CN204666720U (en) | A kind of power meter complete machine | |
| CN203117253U (en) | Portable multipurpose tester based on ARM | |
| CN209102801U (en) | A kind of simple digital control multi-functional instrument meter apparatus | |
| CN213842187U (en) | Test system of dynamic tuning gyro rebalance loop | |
| CN104316890B (en) | Voltage, electric current precision metering device and delicate metering method based on satellite navigation system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20130213 Termination date: 20140704 |
|
| EXPY | Termination of patent right or utility model |