CN202631587U

CN202631587U - Probe testing apparatus

Info

Publication number: CN202631587U
Application number: CN 201220021880
Authority: CN
Inventors: 孙丰
Original assignee: Suzhou Secote Precision Electronic Co Ltd
Priority date: 2012-01-18
Filing date: 2012-01-18
Publication date: 2012-12-26
Anticipated expiration: 2022-01-18

Abstract

Disclosed is a probe testing apparatus, comprising a pedestal, a product carrier fixedly arranged at one end of the pedestal, and a horizontal cylinder fixedly arranged at the other end of the pedestal, wherein the cylinder body of the horizontal cylinder is connected with a first probe set; the first probe set is connected with a slant cylinder via a slant seat pad; the cylinder body of the slant cylinder is connected with a second probe set; the first probe set comprises a horizontal probe; and the second probe set comprises a slant probe. The probe testing apparatus of the utility model realizes the power-on test of the testing point locations upon the vertical surface and slant surface of the product in a step-by-step manner by employing the horizontal cylinder to drive the horizontal probe and employing the slant cylinder to drive the slant probe. The probe testing apparatus of the utility model features rapid testing speed and high efficiency and is capable of raising productivity.

Description

A kind of probe tester

Technical field

The utility model relates to a kind of proving installation, particularly a kind of probe tester of electronic product energising test usefulness.

Background technology

Along with the microminiaturized degree of electronic product improves constantly, the physical dimension of electronic product is more and more littler, and surface configuration is irregular, and give and produce, assembling, test brings great difficulty and inconvenience.

An existing electronic product requires at short notice the test of switching on of 16 some positions to this electronic product, and does not meet electronic product test point position; Wherein 14 some positions are on the vertical plane, and 2 some positions are on the inclined-plane, and test adopts the mode of test probe grafting test point position to realize being connected between electronic product test point position and the controller; Because the volume of electronic product own is little, test point position many and not plane, coplane not, other electronic devices and components are intensive around the test point position; For preventing that test probe and other electronic devices and components from interfering, test probe need vertically be plugged in the test point position, simultaneously; Need guarantee in the short time that each test point position all has electric current to pass through, not have to be difficult under the situation of utility appliance accomplish this test jobs; Therefore, the probe tester that is widely used in the prior art connects product test point realizing quick test, yet probe tester of the prior art can only be realized the quick grafting of the test point position of folk prescription on face; Grafting can't be accomplished in 2 test point positions on and the inclined-plane that form an angle adjacent with this direction face; During test operation, can be pegged graft by probe tester in 14 test point positions on the vertical plane, and 2 test point positions on the inclined-plane need manually to be pegged graft by operating personnel; Be communicated with power supply again and accomplish test; Thus, cause inevitably that product test speed is slow, efficient is low, finally cause production capacity low.

The utility model content

For solving the problems of the technologies described above, the utility model provides a kind of probe tester, to reach the quickening test speed, improves testing efficiency, thereby improves the purpose of production capacity.

For achieving the above object, the technical scheme of the utility model is following:

A kind of probe tester; Comprise pedestal, be fixedly arranged on the product carrier of said pedestal one end, and be fixedly arranged on the horizontal air cylinder of the said pedestal other end, be connected with first probe groups on the cylinder body of said horizontal air cylinder; Said first probe groups is connected with a tilt cylinders through an inclination cushion block; Be connected with second probe groups on the cylinder body of said tilt cylinders, said first probe groups comprises horizontal probe, and said second probe groups comprises the inclination probe.

Preferably, said inclination cushion block comprises plane and the inclined-plane that is mutually angle, and said plane is connected with first probe groups, and said inclined-plane is connected with said tilt cylinders.

Preferably, said first probe group is equipped with first substrate and first back up pad, said first back up pad be located at said first substrate top and with said vertical connection of first substrate, said horizontal probe is in the preset probe aperture of said first back up pad; The lower surface of said first substrate is connected with the cylinder body of said horizontal air cylinder.

Preferably, said second probe group is equipped with second substrate and second back up pad, said second back up pad be located at said second substrate top and with said vertical connection of second substrate, said inclination probe is in the preset probe aperture of said second back up pad; The lower surface of said second substrate is connected with the cylinder body of said tilt cylinders.

Preferably, the quantity of said first back up pad and said second back up pad is 2.

Pass through technique scheme; A kind of probe tester that the utility model provides to realize step by step the energising test to product of horizontal probe and inclination probe through horizontal air cylinder and tilt cylinders; Thereby effectively avoided the interference of other electronic components on the product, guaranteed all accurately tests of each test point position, it is fast to have a test speed; Efficient is high, improves the advantage of production capacity.

Description of drawings

In order to be illustrated more clearly in the technical scheme of the utility model embodiment, the accompanying drawing of required use is done to introduce simply in will describing embodiment below.

Fig. 1 is the disclosed a kind of probe tester synoptic diagram of the utility model embodiment.

Embodiment

To combine the accompanying drawing among the utility model embodiment below, the technical scheme among the utility model embodiment will be carried out clear, intactly description.

The utility model provides a kind of probe tester, and is as shown in Figure 1, and said probe tester comprises pedestal 1, product carrier 2; Horizontal air cylinder 3, the first substrates 41, the first back up pads 42; Horizontal probe 43, inclination cushion block 5, tilt cylinders 6; Second substrate, 71, the second back up pads 72, inclination probe 73.

Said product carrier 2 is fixedly arranged on an end of said pedestal 1; Said horizontal air cylinder 3 is fixedly arranged on the other end of said pedestal 1; Be connected with first probe groups on the cylinder body of said horizontal air cylinder 3, said first probe groups upper end is connected with a tilt cylinders 6 through an inclination cushion block 5, is connected with second probe groups on the cylinder body of said tilt cylinders 6; Said first probe groups comprises horizontal probe 43, and said second probe groups comprises inclination probe 73.

In present embodiment; Said first probe group is equipped with first substrate 41 and first back up pad 42; Said first back up pad 42 is arranged with 2 in parallel; And all be located at said first substrate 41 tops and said 41 vertical connections of first substrate, said horizontal probe 43 is in the preset probe aperture of said first back up pad 42; The lower surface of said first substrate 41 is connected with the cylinder body of said horizontal air cylinder 3.

In present embodiment; Said second probe group is equipped with second substrate 71 and second back up pad 72; State second back up pad 72 and be arranged with 2 in parallel; And all be located at said second substrate 71 tops and said 71 vertical connections of second substrate, said inclination probe 73 is in the preset probe aperture of said second back up pad 72; The lower surface of said second substrate 71 is connected with the cylinder body of said tilt cylinders 6.

In present embodiment, said inclination cushion block 5 comprises lower plane and the ramp that is mutually angle, and said lower plane is connected with the upper surface of first back up pad 42 of first probe groups, and said ramp is fixedly connected with the plunger rod of said tilt cylinders 6.

In sum, with horizontal probe 43, inclination probe 73, horizontal air cylinder 3 and tilt cylinders 6 all with after controller is connected, after electronic product is positioned on the product carrier 2; By controller control, the horizontal probe 43 that horizontal air cylinder 3 drives first probe groups is plugged in the test point position on the electronic product vertical plane, then; The inclination probe 73 that tilt cylinders 6 drives second probe groups is plugged in the test point position on the electronic product inclined-plane, by the test procedure in the controller this electronic product is carried out test analysis, after test is good; Horizontal air cylinder 3, tilt cylinders 6 is returned successively, accomplishes test operation one time with this; Therefore, the utility model drives the grafting that inclination probe 73 is accomplished test point position on the product inclined-plane with tilt cylinders 6 again through driving the grafting that horizontal probe 43 is accomplished test point position on the product vertical plane with horizontal air cylinder 3 earlier; Carry out test jobs with this mode of moving step by step; Avoid on the product other electronic components that the correctness of each test point bit test has been guaranteed in the interference of test probe effectively, accelerated test speed; Improve testing efficiency, thereby improved production capacity.

To the above-mentioned explanation of the disclosed embodiments, make this area professional and technical personnel can realize or use the utility model.Multiple modification to these embodiment will be conspicuous concerning those skilled in the art, and defined General Principle can realize under the situation of spirit that does not break away from the utility model or scope in other embodiments among this paper.Therefore, the utility model will can not be restricted to these embodiment shown in this paper, but will meet and principle disclosed herein and features of novelty the wideest corresponding to scope.

Claims

1. a probe tester is characterized in that, comprises pedestal, is fixedly arranged on the product carrier of said pedestal one end; And be fixedly arranged on the horizontal air cylinder of the said pedestal other end; Be connected with first probe groups on the cylinder body of said horizontal air cylinder, said first probe groups is connected with a tilt cylinders through an inclination cushion block, is connected with second probe groups on the cylinder body of said tilt cylinders; Said first probe groups comprises horizontal probe, and said second probe groups comprises the inclination probe.

2. a kind of probe tester according to claim 1 is characterized in that, said inclination cushion block comprises plane and the inclined-plane that is mutually angle, and said plane is connected with first probe groups, and said inclined-plane is connected with said tilt cylinders.

3. a kind of probe tester according to claim 1; It is characterized in that; Said first probe group is equipped with first substrate and first back up pad; Said first back up pad be located at said first substrate top and with said vertical connection of first substrate, said horizontal probe is in the preset probe aperture of said first back up pad; The lower surface of said first substrate is connected with the cylinder body of said horizontal air cylinder.

4. a kind of probe tester according to claim 1; It is characterized in that; Said second probe group is equipped with second substrate and second back up pad; Said second back up pad be located at said second substrate top and with said vertical connection of second substrate, said inclination probe is in the preset probe aperture of said second back up pad; The lower surface of said second substrate is connected with the cylinder body of said tilt cylinders.

5. according to claim 3 or 4 described a kind of probe testers, it is characterized in that the quantity of said first back up pad and said second back up pad is 2.