CN202583248U - Universal guide rail structure for aging test device - Google Patents

Abstract

The utility model relates to a general type guide rail structure for aging testing device, it contains main part, goes up fixed part and lower fixed part. The upper fixing part forms a gap at the most front end for taking and placing the aging test board and the supporting plate, and the main body, the upper fixing part and the lower fixing part are connected to form a groove for supporting and taking the aging test board and the supporting plate, so that the abrasion of the aging test board and the supporting plate and the dust generation can be effectively reduced.

Description

Universal rail structure for burn-in test setups

technical field

The utility model relates to a general-purpose guide rail structure for an aging test device, in particular to a general-purpose guide rail structure for an aging test device that can effectively reduce dust generation and wear of an aging test board.

Background technique

In the integrated circuit manufacturing process, after cutting, testing and packaging, it is often necessary to conduct an aging test in response to the type of integrated circuit component (or electronic component), the operating environment or the sales area, in order to know whether the electronic component is It can still work normally in high temperature environment.

Please refer to FIG. 1A , which is a schematic diagram of a conventional aging testing device 10 for performing aging testing. There are one or several aging test furnaces 12 in the aging test device 10, and several paired guide rails 14 are arranged in the aging test furnace 12. Due to the angle relationship shown in the figure, only one side of the guide rails 14 is shown in FIG. 1A . Please refer to FIG. 1B , which is a schematic front view of placement of electronic components inside an aging test furnace 12 . In the burn-in test furnace 12, the electronic component 18 to be tested is placed on the burn-in test board 16 to carry out the burn-in test, and the burn-in test board 16 is then placed on a support plate 20 (such as an aluminum plate) to support the burn-in test board 16 to avoid The aging test board 16 is softened due to the high temperature generated by the aging test, resulting in deformation and damage. There are paired guide rails 14 installed on the left and right sides of the aging test furnace 12, and the edges on both sides of the aging test board 16 are inserted into the guide rails 14, and can move back and forth freely in the guide rails 14 to facilitate putting into the aging test furnace 12. And take out by burn-in test furnace 12, promptly insert burn-in test furnace 12 and pull out by burn-in test furnace 12, and when carrying out burn-in test, rely on guide rail 14 to be supported in burn-in test furnace 12, and burn-in test board 12 and on it The electronic component 18 to be tested and the supporting plate 20 thereunder are fixed in the burn-in test furnace 12 .

However, due to repeated burn-in tests, it is often necessary to take and place the burn-in test board 16 constantly, and replace the electronic components 18 to be tested with new ones for burn-in tests. Due to the continuous taking and placing of the aging test board 16 , the aging test board 16 and the guide rail 14 are often rubbed against each other to cause wear and tear, and some dust will be generated. These dusts will spread throughout the aging test furnace 12 along with the circulating air flow in the aging test furnace 12, causing the surface of the electronic components (to be tested) to be subjected to the aging test to be dirty, and even cause the test to fail.

In addition, with this type of guide rail 14 , when the burn-in test board 16 is plugged in, the two side edges of the burn-in test board 16 need to be aligned with the guide rail 14 , so that the burn-in test board 16 is not easy to be plugged in. Secondly, because the weight of the aging test board 16 and the supporting board 20 is too heavy, the aging test board 16 is difficult to carry and unplug. The test board 16 or the support board 20 collides with the guide rail 14, causing damage to the burn-in test board 16, or even the electronic components on the burn-in test board 16 or the guide rail 14, thereby affecting the efficiency of the test or causing damage to the product (electronic component). The burn-in test board 16 (comprising the electronic components to be tested thereon) and the support plate 20 are held in the burn-in test furnace 12 only by contacting the two side edges of the burn-in test board 16 with the guide rails 14, but it may often be caused by the burn-in test board. The weight of 16 and support plate 20 is too heavy and the force-bearing area is small, causing the edge of aging test plate 16 to be damaged due to excessive force, or even rupture, causing aging test plate 16 and support plate 20 to fall, resulting in aging test plate 16. 16 and the electronic components 18 on it are damaged.

In addition, due to the rapid change of electronic components, their types are becoming more and more complicated, and the size differences between various types of electronic components are also increasing, so it is necessary to use aging test boards of different sizes for aging tests. However, the guide rails in these burn-in test furnaces can only be used for burn-in test boards of a certain size or sizes. Once the types of electronic components undergoing burn-in tests are different or the sizes are too different, it is often necessary to use burn-in test boards of different sizes. plate. At this time, the original guide rail in the aging test furnace is not applicable due to its size being too large or too small, so that the aging test board cannot be inserted or held in the aging test furnace, and a guide rail of another size needs to be replaced. Therefore, not only is the need to prepare materials for guide rails of different sizes, which leads to an increase in testing costs, but also reduces the test efficiency because of the need to stop the machine to replace the guide rails.

In view of the above problems, there is an urgent need for a guide rail suitable for various types or sizes of electronic components or aging test boards, which can effectively reduce the generation of dust due to friction, reduce the wear of the aging test board and guide rails, and avoid damage to the electronic components. Components, burn-in test boards, and guide rails cause damage and damage, thereby reducing test costs and increasing test efficiency.

It can be seen that the above-mentioned existing general-purpose guide rail structure for the aging test device obviously still has inconvenience and defects in structure and use, and needs to be further improved urgently. In order to solve the problems existing in the general-purpose guide rail structure used in aging test devices, relevant manufacturers have tried their best to find a solution, but no suitable design has been developed for a long time, and there is no suitable general product. The structure can solve the above-mentioned problems, which is obviously a problem that relevant industry players are eager to solve. Therefore, how to create a general-purpose guide rail structure for aging test devices that can be combined with a new structure that is small in size, low in cost, and can be used in an all-round way is one of the current important research and development topics. Targets that are currently in great need of improvement in the industry.

Contents of the invention

The purpose of this utility model is to overcome the defects existing in the existing general-purpose guide rail structure for aging test devices, and provide a new-type general-purpose guide rail structure for aging test devices. The technical problems to be solved It is to provide a general-purpose guide rail structure for aging test equipment, which has the advantages of low friction coefficient, good wear resistance, good insulation, and easy plug-in, etc., and can be applied to various types and sizes Electronic components and burn-in test boards, thereby reducing test costs and increasing test efficiency, are more suitable for practical use.

Another purpose of the present utility model is to provide a general-purpose guide rail structure for an aging test device. The technical problem to be solved is to provide a general-purpose guide rail structure for an aging test device, especially for a A general-purpose guide rail structure used in an aging test device that can effectively reduce dust generation and wear of an aging test board. The guide rail includes a main body; an upper fixing part extends from the upper end of the main body to prevent the aging test board and the support board from jumping upwards; a lower fixing part extends from the lower end of the main body to support the aging test board and the support board ; and a notch, which is arranged at the front end of the upper fixing part, for taking and placing the aging test board and the support board. The main body, the upper fixing part, and the lower fixing part are connected to form a ㄈ-shaped groove, which is used to support and pick and place the aging test board and the support board in the aging test device, so that it is more suitable for practical use.

The purpose of this utility model and the solution to its technical problems are achieved by adopting the following technical solutions. According to the utility model, it includes: a main body; an upper fixing part extending from the upper end of the main body to prevent the aging test board and the support plate from jumping upward; and a lower fixing part extending from the lower end of the main body, It is used to support the aging test board and the supporting board; wherein, a notch is formed at the front end of the upper fixing part for taking and placing the aging testing board and the supporting board, and the main body, the upper fixing part and the lower fixing part are connected to form a The ㄈ-shaped groove is used to support and pick and place the aging test board and the support board in the aging test device.

The purpose of the utility model and the solution to its technical problems can also be further realized by adopting the following technical measures.

In the aforementioned general-purpose guide rail structure for the aging test device, the inner surface of the upper fixing part is an inclined surface for reducing the contact and friction between the upper fixing part and the aging test board.

The aforementioned general-purpose guide rail structure for the aging test device, wherein the inner surface of the upper fixing part has a soft wear-resistant layer to reduce the probability of dust generated by friction between the upper fixing part and the aging test board .

In the aforementioned general-purpose guide rail structure for the aging test device, the inner surface of the lower fixing part is an inclined surface to reduce the contact and friction between the lower fixing part and the support plate.

In the aforementioned general-purpose guide rail structure for aging testing devices, there is a soft wear-resistant layer on the inner surface of the lower fixing part to reduce the probability of dust generated by friction between the lower fixing part and the support plate.

The aforementioned general-purpose guide rail structure for the aging test device, wherein the inner surface of the main body is provided with a soft wear-resistant layer to reduce the probability of dust generated by friction between the main body, the aging test board and the support board .

In the aforementioned general-purpose guide rail structure for aging test equipment, the inner surface of the soft wear-resistant layer is an inclined surface, which is used to reduce contact and friction between the main body, the support plate and the aging test plate.

The aforesaid general-purpose guide rail structure for the aging test device, wherein said it further comprises a hard oxide layer coated on the surface of the main body, the surface of the upper fixing part, and the surface of the lower fixing part, It is used to increase the wear resistance of the universal rail structure.

The aforesaid general-purpose guideway structure for aging test equipment, wherein said it further includes a soft wear-resistant layer, coated on the surface of the hard oxide layer, in order to reduce the impact of the general-purpose guideway structure and Dust is generated by friction between the aging test board and the support board.

In the aforementioned general-purpose guide rail structure for the aging test device, the edge of the notch is an inclined plane to facilitate the pick-and-place of the aging test board.

Compared with the prior art, the utility model has obvious advantages and beneficial effects. By virtue of the above-mentioned technical scheme, the general-purpose guide rail structure used in the aging test device of the present invention can achieve considerable technical advancement and practicability, and has wide industrial application value. It has at least the following advantages: The utility model provides A general-purpose guide rail structure for aging test equipment, which has the advantages of low friction coefficient, good wear resistance, good insulation, and easy plug-in, etc., and can be applied to various types and sizes of electronic components and Burn-in test boards, thereby reducing test costs and increasing test efficiency.

To sum up, compared with the prior art, the utility model has the effect of providing a general-purpose guide rail structure for aging test devices, especially a device for aging test devices that can effectively reduce dust generation and wear of aging test boards. Universal rail structure. Thereby, it is possible to effectively reduce the generation of dust due to friction, reduce the wear of the aging test board and the guide rail, and avoid damage and damage to the electronic components, the aging test board, and the guide rail, thereby reducing the test cost and increasing the test efficiency. The utility model has remarkable progress in technology, and has obvious positive effects, and is a novel, progressive and practical new design.

The above description is only an overview of the technical solution of the utility model. In order to understand the technical means of the utility model more clearly, it can be implemented according to the contents of the specification, and in order to make the above and other purposes, features and advantages of the utility model better It is obvious and easy to understand. The preferred embodiments are specifically cited below, together with the accompanying drawings, and detailed descriptions are as follows.

Description of drawings

FIG. 1A is a schematic diagram of a conventional aging test device.

FIG. 1B is a schematic front view of placement of electronic components for burn-in testing in the burn-in test device.

FIG. 2A is a three-dimensional schematic diagram of a general-purpose guide rail structure for an aging test device according to an embodiment of the utility model.

FIG. 2B and FIG. 2C are front schematic diagrams of electronic components of different sizes using the general-purpose guide rail structure of the present invention to perform burn-in tests in the burn-in test device.

FIG. 2D is a cross-sectional view along the A-A tangent line of a general-purpose guide rail structure for an aging testing device according to an embodiment of the utility model.

3A and 3B are cross-sectional views of a general-purpose guide rail structure for an aging test device according to another embodiment of the present invention.

4A and 4B are cross-sectional views of a general-purpose guide rail structure for an aging testing device according to another embodiment of the present invention.

5A to 5C are cross-sectional views of a general-purpose guide rail structure for an aging test device according to another embodiment of the present invention.

10: Aging test device 12: Aging test furnace

14: Guide rails 16: Aging test board

18: Electronic components 20: Support board

100: Universal guide rail structure 101: Guide rail surface

102: Main body 104: Upper fixed part

104a: The inner surface of the upper fixing part 106: The lower fixing part

106a: Inner surface of the lower fixing part 108: Notch

119: Groove 110: Hard oxide layer

112: Soft wear-resistant layer AA: Section tangent

114a, 114b, 114c, 114d: soft wear-resistant layer

Detailed ways

In order to further explain the technical means and effects that the utility model adopts to achieve the intended purpose of the invention, the general-purpose guide rail structure for the aging test device proposed according to the utility model is specifically described below in conjunction with the accompanying drawings and preferred embodiments. Embodiments, structures, features and effects thereof are described in detail below.

Some embodiments of the present invention are described in detail as follows. However, the invention can be broadly practiced in other embodiments than this detailed description. That is to say, the scope of the present utility model is not limited by the proposed embodiments, but is subject to the patent scope of the utility model. Secondly, when each element or step in the diagram of the embodiment of the present invention is described as a single element or step, it should not be regarded as a limited cognition, that is, when the following description does not particularly emphasize the limitation on the number, the present invention The novel spirit and scope of application can be extended to structures and methods in which multiple elements or structures coexist. Furthermore, in this specification, the different parts of each element are not completely drawn according to the size, and some dimensions are exaggerated or simplified compared with other relevant dimensions, so as to provide a clearer description and enhance the understanding of the utility model . However, the prior art used in the present utility model is only cited here in emphasis to help explain the present utility model.

Please refer to FIG. 2A, FIG. 2B and FIG. 2C. FIG. 2A is a three-dimensional schematic diagram of a general-purpose guide rail structure 100 for an aging test device according to an embodiment of the present invention, while FIG. 2B and FIG. 2C are electronic components of different sizes Front schematic view of using the general-purpose guide rail structure 100 to perform aging test in the aging test device. The universal rail structure 100 includes a main body 102 , an upper fixing portion 104 extending from the upper end of the main body 102 , a lower fixing portion 106 extending from the lower end of the main body 102 , and a notch 108 arranged at the front end of the upper fixing portion 104 . The main body 102, the upper fixing part 104, and the lower fixing part 106 are connected to form a U-shaped groove 119, so that the aging test board 16 and the support board 20 can move and slide freely back and forth in the general-purpose guide rail structure 100, and use The burn-in test board 16 can be plugged in, and when the burn-in test is performed, the burn-in test board 16 (including the electronic components 18 thereon) and the supporting board 20 are supported and held for the burn-in test.

The width of the lower fixing portion 106 is larger than that of the upper fixing portion 104, so as to effectively support and hold the support plate 20 and the aging test plate 16 on the support plate 20 from the bottom of the support plate 20, instead of only borrowing the guide rails as in the prior art. The aging test board is supported and held by the aging test board and the support board for the aging test, so the aging test board will not be damaged and broken due to excessive weight. The upper fixing part 104 is located at the upper end of the main body 100 to prevent the aging test board and the support board from bouncing upwards due to the operation of the aging test device during the aging test, and to hold it on the general-purpose guide rail structure 100 without jumping Cause damage to the aging test board or the aging test board 16 falls off from the general-purpose guide rail structure 100 , and further prevent the generation of dust due to the collision between the aging test board 16 and the support plate 20 and the guide rail. Furthermore, because the width of the upper fixing portion 104 is not large, it will not contact the circuit (not shown in the figure) and the electronic component 18 on the burn-in test board 16, so it will not be damaged or damaged.

The upper fixing part 104 and the lower fixing part 106 of the general-purpose guide rail structure 100 can provide an effective fixation and support for electronic components 18 or burn-in test boards 16 of any type and size, and hold them stably in the burn-in test Aging test in oven. In this way, the universal guide rail structure 100 is a universal guide rail structure applicable to electronic components 18 or burn-in test boards 16 of different types and sizes. For example, as shown in FIG. 2B, when the size of the aging test board 16 or the electronic component 18 is small, the edge portion of the support plate 20 is completely in contact with the universal rail structure 100 (or the lower fixing part 106), and the It is supported by the type guide rail structure 100 (or the lower fixing part 106) and provides an effective support for the aging test board 16 (including the electronic components 18 thereon) and the support board 20, so it will not only The burn-in test board is supported to cause damage to the burn-in test board, and the upper fixing part 104 fixes the burn-in test board 16 (including the electronic components 18 thereon) and the support plate 20 on the general-purpose type by contacting the edge of the burn-in test board 16 . The guide rail structure 100 (or the lower fixing part 106 ) prevents the burn-in test board and the support board from bouncing upward due to the operation of the burn-in test device during the burn-in test. As shown in FIG. 2C, when the size of the burn-in test board 16 or the electronic component 18 is large, only a part of the edge portion of the support board 20 is in contact with the universal rail structure 100 (or the lower fixing part 106), but by this Part of the contact, the general-purpose guide rail structure 100 (or the lower fixing part 106) is still enough to provide an effective support for the aging test board 16 (comprising the electronic components 18 thereon) and the support board 20, so it will not be the same as the existing one. The conventional guide rail only supports the burn-in test board and causes damage to the burn-in test board, and the upper fixing part 104 connects the burn-in test board 16 (including the electronic components 18 thereon) and the support plate 20 by contacting the edge of the burn-in test board 16 It is fixed on the general-purpose guide rail structure 100 (or the lower fixing part 106 ), so that the burn-in test board and the support board will not jump upward due to the operation of the burn-in test device.

The notch 108 at the front end of the upper fixing part 104 enables on-line personnel to insert the universal guide rail structure 100 without carefully aligning the groove 119 of the universal guide rail structure 100 when plugging and unplugging the aging test board 16 and the support board 20. The notch 108 above the front end is used to insert and pull out the aging test board 16 and the support board 20, so as to facilitate the pick-and-place and plug-in of the aging test board 16 and the support board 20, and to prevent the aging test board 16 and the support board 20 from being plugged in and out. When colliding with the universal guide rail structure 100, avoid damage to the electronic components 18, the aging test board 16, the support plate 20, and the universal guide rail structure 100 due to the collision, and reduce and avoid the dust generated by the collision. Moreover, the edges of the notch 108 are all inclined surfaces, which can effectively guide the aging test board 16 and the support board 20 to be inserted into the general-purpose guide rail structure 100, avoiding damage caused by collisions between them, and reducing and avoiding damage caused by collisions. dust.

Please refer to FIG. 2D , which is a cross-sectional view of the general-purpose guide rail structure 100 shown in FIG. 2A cut along the tangent line AA. The general-purpose rail structure 100 is usually a metal material that can withstand high temperatures and will not deform at high temperatures, such as aluminum or other metals that will not deform at high temperatures, so it has relatively high hardness, but in the long-term and frequently When plugging and unplugging the aging test board 16 and the support plate 20 , the general-purpose guide rail structure 100 will still be worn, and dust will pollute the interior of the aging test furnace and the electronic components 18 . Therefore, the present invention can coat a layer of hard oxide layer 110 on the surface 101 of the general-purpose guide rail structure 100 (including the entire surface of the main body 102, the entire surface of the upper fixing part 104, and the entire surface of the lower fixing part 106). . The hard oxide layer 110 can utilize hard anodic treatment to form an oxide film layer on the surface 101, such as an aluminum oxide film layer, because the hard oxide layer 110 has high hardness, good wear resistance, high resistance (good insulation), and Corrosion resistance and other characteristics make the general-purpose guide rail structure 100 not only difficult to generate dust due to collision with the aging test board 16 and the support plate 20, but also provide good protection for the general-purpose guide rail structure 100 and ensure the general-purpose guide rail structure 100 will not affect the test because it is a conductive material.

Furthermore, a soft wear-resistant layer 112 can be coated on the surface of the hard oxide layer 110, such as Teflon or other low-friction and high-temperature-resistant materials. This feature reduces the friction between the general-purpose guide rail structure 100 and the aging test board 16 and the support plate 20, thereby reducing the probability of dust generated by friction between the general-purpose guide rail structure 100 and the aging test board 16 and the support board 20 .

Please refer to FIG. 3A and FIG. 3B , both of which are cross-sectional views of a general-purpose guide rail structure used in aging testing devices according to another embodiment of the present utility model, which also show that the general-purpose guide rail structure is used for different sizes. The condition of the burn-in test board, but it only shows the condition of the burn-in test board in contact with the rail on one side. Please refer to Fig. 3A and Fig. 3B, in the general-purpose guide rail structure 100 of another embodiment of the present invention, the inner surface 104a of the upper fixing part 104 can be made into a slope, so that it is compatible with any size of the aging test board 16. Only contact with the edge of the burn-in test board 16, and change the general-purpose guide rail structure 100 (or the upper fixing part 104) and the burn-in test board 16 from the original surface contact to the line contact, thereby reducing the number of general-purpose guide rail structures 100. (or the upper fixing part 104 ) and the aging test plate 16 contact area and reduce the contact and friction between the two, so the dust generated by friction will be effectively reduced. Secondly, the inner side surface 106a of the lower fixing part 106 can also be made into a slope, so that when the aging test board 16 of any size is used for testing, only the edge of the support plate 20 is in contact with the lower fixing part 106. The support plate 20 and the general-purpose guide rail structure 100 (or the lower fixing part 106) are changed from the original surface contact to the line contact, thereby reducing the number of connections between the universal guide rail structure 100 (or the lower fixing part 106) and the support plate 20. The contact area and reduce the contact and friction between the two, therefore, will effectively reduce the dust generated by friction.

In addition, in order to further reduce the friction between the general-purpose guide rail structure 100 and the aging test plate 16 and the support plate 20, especially the inner surface of the main body of the general-purpose guide rail structure 100 and the aging test plate 16 and the support plate 20 In addition to making the inner side surface 104a of the upper fixing part 104 and the inner side surface 106a of the lower fixing part 106 into slopes, a soft wear-resistant layer 114a can be set or attached on the inner side surface of the main body (as shown in Figure 4A 4B), such as Teflon or other low-friction and high-temperature-resistant materials, reduce the friction between the inner surface of the main body and the aging test plate 16 and the support plate 20, thereby effectively reducing the friction caused by friction. dust.

Even, in order to further reduce the friction between the general-purpose guide rail structure 100 and the aging test plate 16 and the support plate 20, especially the friction between the inner surface 104a of the upper fixing part 104 and the aging test plate 16 and the support plate 20, And the friction between the inner side surface 106a of the lower fixing part 106 and the aging test plate 16 and the support plate 20, in another embodiment of the present utility model (as shown in Figure 5A), in addition to the inner side surface of the upper fixing part 104 104a and the inner side surface 106a of the lower fixing part 106 are made into a slope, and in addition to setting or affixing a soft wear-resistant layer 114a on the inner side surface of the main body, the inner side surface 104a of the upper fixing part 104 and the lower fixing part 106 A soft wear-resistant layer 114b and 114c are respectively arranged or attached on the inner surface 106a to reduce the friction between the inner surface 104a of the upper fixing part 104 and the aging test plate 16 and the support plate 20, and reduce the friction of the lower fixing part 106. The friction between the inner surface 106 a and the aging test plate 16 and the support plate 20 effectively reduces the dust generated by the friction.

Please refer to FIG. 5B and FIG. 5C , both of which are cross-sectional views of a general-purpose guide rail structure for aging testing devices according to another embodiment of the present invention, which also show that the general-purpose guide rail structure is used for different sizes Condition of the burn-in test board. In the embodiment shown in FIG. 5B and FIG. 5C , in order to further reduce the contact area and friction between the universal guide rail structure 100 and the aging test board 16 and the support board 20 , except for the inner surface of the upper fixing part 104 104a and the inner side surface 106a of the lower fixing part 106 are made into inclined planes, and a soft wear-resisting surface is respectively set or attached on the inner side surface 104a of the main body, the inner side surface 104a of the upper fixing part 104, and the inner side surface 106a of the lower fixing part 106. In addition to the layers 114d, 114b, and 114c, the inner surface of the soft wear-resistant layer 114d on the inner upper surface of the main body, that is, the surface in contact with the aging test plate 16 and the support plate 20, is made into a slope. Therefore, make the soft wear-resistant layer 114d so that when the aging test plate 16 of any size is used for testing, all only contact the inner surface of the main body (or the soft wear-resistant layer 114d) with the edge of the aging test plate 16, and not Then contact with other parts of the aging test plate 16, and change the aging test plate 16 and the general-purpose guide rail structure 100 (or the soft wear-resistant layer 114d inside the main body) from the original surface contact to line contact, and then Reduce the contact area between the general-purpose guide rail structure 100 (or the soft wear-resistant layer 114d inside the main body) and the support plate 20 and the aging test plate 16 and reduce the contact and friction between each other. Therefore, it will effectively reduce the friction caused by friction. Dust produced.

The above are only preferred embodiments of the present utility model, and do not limit the utility model in any form. Although the utility model has been disclosed as above with preferred embodiments, it is not intended to limit the utility model. Any Those who are familiar with this profession, without departing from the scope of the technical solution of the present utility model, can use the technical content disclosed above to make some changes or modify equivalent embodiments with equivalent changes, but all without departing from the technical solution of the utility model Any simple modifications, equivalent changes and modifications made to the above embodiments according to the technical essence of the utility model still belong to the scope of the technical solution of the utility model.

Claims (10)

1. general-using type guide rail structure that is used for ageing tester is characterized in that it comprises:

One main body;

Fixed part on one is extended by this main body upper end, upwards beats in order to prevent burn-in board and back up pad; And

Once fixed part is extended by this main body lower end, in order to support burn-in board and back up pad;

Wherein, Should go up fixed part and form a breach foremost; In order to picking and placeing burn-in board and back up pad, and this main body, fixed part and this time fixed part link the groove that forms a ㄈ font on this, in order in ageing tester, to support and to pick and place burn-in board and back up pad.

2. the general-using type guide rail structure that is used for ageing tester according to claim 1 is characterized in that fixed part inner surface is an inclined-plane on this.

3. the general-using type guide rail structure that is used for ageing tester according to claim 1 is characterized in that fixed part inner surface is provided with a soft wear resisting layer on this.

4. the general-using type guide rail structure that is used for ageing tester according to claim 1 is characterized in that this time fixed part inner surface is an inclined-plane.

5. the general-using type guide rail structure that is used for ageing tester according to claim 1 is characterized in that this time fixed part inner surface is provided with a soft wear resisting layer.

6. the general-using type guide rail structure that is used for ageing tester according to claim 1 is characterized in that the inner surface of this main body is provided with a soft wear resisting layer.

7. the general-using type guide rail structure that is used for ageing tester according to claim 6 is characterized in that this soft wear resisting layer inner surface is an inclined-plane.

8. the general-using type guide rail structure that is used for ageing tester according to claim 1, it is characterized in that its more comprise a hardening oxidation layer be coated on the surface of this main body, on this on surface of surface and this time fixed part of fixed part.

9. the general-using type guide rail structure that is used for ageing tester according to claim 8 is characterized in that it more comprises a soft wear resisting layer, is coated on the surface of this hardening oxidation layer.

10. the general-using type guide rail structure that is used for ageing tester according to claim 1, the edge that it is characterized in that this breach is an inclined-plane.

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