CN202511772U - X-ray metal material thickness measurement device - Google Patents
X-ray metal material thickness measurement device Download PDFInfo
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- CN202511772U CN202511772U CN 201220175666 CN201220175666U CN202511772U CN 202511772 U CN202511772 U CN 202511772U CN 201220175666 CN201220175666 CN 201220175666 CN 201220175666 U CN201220175666 U CN 201220175666U CN 202511772 U CN202511772 U CN 202511772U
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- material thickness
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Abstract
The utility model provides an x-ray metal material thickness measurement device. The x-ray metal material thickness measurement device is characterized in that an x-ray high-voltage power supply is connected with an x-ray source, x rays are transmitted from the x-ray source, an x-ray detector receives the x rays which penetrate through a metal plate material and sends a detected result to an analog to digital (A/D) converter through a measurement transmitter, and the A/D converter transmits the detected result to a digital signal processor. Finally, the digital signal processor analyzes data and obtains a thickness by processing an obtained measurement thickness through a computer, and accuracy of measurement is provided.
Description
Technical field
The utility model belongs to a kind of material measuring thickness device, especially a kind of X-ray measurement metal material measuring thickness device.
Background technology
In many essential industrys are used, usually run into metal material thickness measure problem.On the metal material production line, guarantee the important means of technologic material quality during to the continuous thickness measure of metal material.Last century, the fifties, thickness measurement technique was in conceptual phase, yet passed through the research and development of decades, and thickness measurement technique is promoted widely and used.Along with the constantly development and ripe of ray control technology, it in the application of industry and medical field also more and more widely.X ray successfully applies to the measurement of the thickness and the template of hot-strip, has embodied good performance, and can adapt to the scene and more badly measure, and the operation that maintains a long-term stability.Yet X-ray thickness gauge in the past has certain restriction to the thickness of metal material, possibly can't measure accurately for the metal material of different-thickness.
At present, the traditional metal materials method for measuring thickness of domestic use all has its certain defective:
1, artificial kind of calliper is meant by the workman and accomplishes thickness measure by hand with milscale, though easy to use, easy to maintenance and cheap, it influences speed of production, and production efficiency is not high.
2, the mechanical type measurement is meant and adopts the method for Mechanical Contact formula to measure; Though it is easy to use; Measuring accuracy is higher, but under tested metal high-speed motion situation, Long contact time can cause the wearing and tearing of sensor between sensor and the tested metal; Thereby influence measuring accuracy, also can scratch the metal surface when serious and reduce the quality of product.
3, the electric current and voltage accuracy requirement that also has ray tube two ends of x-ray measurement aspect is not enough to some extent, also be difficult to meet the demands in the thickness measure of the metallic sheet material of having relatively high expectations, and control method is comparatively complicated, is difficult for realizing.And existing X-ray thickness gauge has certain constraint to the thickness of metal material, for its measuring accuracy of different metal thickness of material very big difference is arranged.
The utility model content
For solving the problem that exists in the prior art; The utility model provides a kind of X-ray measurement metal material thickness device, it is characterized in that, comprises; X ray high-voltage power supply, X-ray detector, A/D converter, measuring transducer; Wherein, said X ray high-voltage power supply connects x-ray source, and said x-ray source is launched X ray; Said X-ray detector receives the said X ray that passes metallic sheet material, records metal charge thickness corresponding voltage value through said measuring transducer and imports in the computing machine through said A/D converter.
Wherein, said magnitude of voltage converts digital signal into through said A/D converter.
Wherein, more comprise digital signal processor.
Wherein, said digital signal reaches in the said digital signal processor, and said digital signal processor reaches in the said computing machine through handling again.
Wherein, said computing machine comprises output interface, is used for the data output with said Computer Analysis.
Wherein, said measuring transducer records metal charge thickness corresponding voltage value corresponding voltage signal.
Wherein, said X-ray detector detects the intensity output dc voltage that said X ray sees through metal material, and said voltage signal is directly proportional with the X ray intensity that arrives said X-ray detector.
Wherein, said computing machine is exported the metal material one-tenth-value thickness 1/10 of measuring through said output interface.
Description of drawings
Fig. 1 is system's operation block scheme of the utility model
Fig. 2 is the utility model theory diagram
Embodiment
In order to improve the measuring accuracy of X-ray thickness gauge, the utility model provides a kind of X-ray measurement metal material thickness device, uses voltage stabilization and current stabilization x-ray source and C type frame, adopts the digitized processing of metal thickness and X ray, has improved measuring accuracy.Be implemented in continuous and automatic measurement on the metal material production line.
This X-ray measurement metal material thickness device; Comprise, X ray high-voltage power supply 1, X-ray detector 3, A/D converter 5, measuring transducer 4, wherein; Said X ray high-voltage power supply 1 connects x-ray source 2; Said x-ray source 2 is launched X ray, and said X-ray detector 3 receives the said X ray that passes metallic sheet material, and said measuring transducer 4 records the corresponding voltage signal of metal charge thickness corresponding voltage value; Said X-ray detector 4 detects the intensity output dc voltage that said X ray sees through metal material, and said voltage signal is directly proportional with the X ray intensity that arrives said X-ray detector 4.Said voltage signal is through converting digital signal into through said A/D converter 5, and said digital signal reaches in the digital signal processor 6, and said digital signal processor reaches in the computing machine 7 through handling again.Said computing machine 7 comprises an output interface, is used for the data that said computing machine 7 is analyzed are exported, and the conversion of signals of said output interface output is a thickness.Obtain the thickness of metal material through tabling look-up, obtain measured value.The current signal that the X-ray detector 3 of said X-ray measurement metal material thickness device collects becomes voltage signal after the voltage current adapter conversion, more said computing machine 7 data collectors of input after amplifying.The major function of X-ray thickness gauge operating system comprises data acquisition, certificate storage, line deviation, curve compensation and calibration curve etc.
The thickness and the material of the ray voltages of the utility model through testee and testee are relevant, and the one-tenth curved line relation through curve fitting, obtains curvilinear function, makes the voltage correspondence table of metal material thickness and X ray through this function.With the voltage signal of ray through metal material thickness, be transferred to said computing machine 7 through digital signal processing, in certain mass thickness variation scope, can be used for the mass thickness of measurement of species.
Said detector detects intensity and the output dc voltage U that X ray sees through sheet material, and said voltage signal is directly proportional with the X ray intensity that arrives said X-ray detector 3.The purpose of said X-ray thickness gauge is to convert the signal U that said X-ray detector 3 is exported into thickness D.If known the corresponding relation D=f (U) of U and D, so as long as the U value of exporting according to detector just can calculate one-tenth-value thickness 1/10 D.The function of curve fitting is exactly the work relationship curve of setting up between U and the D.Curve fitting is exactly the process that rebulids whole D=f (U) curve according to the on-gauge plate in the on-gauge plate storehouse.During curve fitting, said computing machine repeatedly makes up standard jig automatically, and it is intrafascicular to insert X-ray.Said computing machine 7 said X-ray detector 3 output signal U of storage and the value of corresponding thickness D are with it calculated during for curve fitting.According to X-ray ga(u)ging ultimate principle formula, after having confirmed each coefficient in the formula, the thickness measuring formula is also promptly confirmed, has so just accomplished the match of the relation curve of corresponding one-tenth-value thickness 1/10 with it of each magnitude of voltage.Record voltage and thickness through behind the fitting of a polynomial when drawing tube voltage and being respectively 80kV and 40kV.
The X ray strength ratio is converted into the ratio of voltage; Calculate the absorption coefficient of different-thickness according to the attenuation law of X ray in material, and adopt polynomial method that the absorption coefficient of aluminium is demarcated and eliminate X ray and be hardened in the actual mechanical process influence thickness measure to X ray.The decay formula that the monoenergetic X ray passes homogeneous substance is I=I
0e
-μ d,
Be
Order
Be P
Can be found out that by following formula for the monoenergetic X ray, P is directly proportional with the length of material that ray passes through, if incident beam is the monoenergetic X ray, P/d should be a certain value, and promptly the relation curve of P and thickness d is a straight line.
(1), confirms the frequency n of polynomial fitting by the given data rough figure-scatter diagram of function that draws;
(2)
(j=0 is calculated in tabulation; 1; ... 2n) with
(j=0; 1 ... 2n);
(3) write out the normal equations group, obtain a
0, a
1... a
n
(4) write out polynomial fitting
According to the voltage that records and one group of data of plate thickness, as follows
Thickness: 0 200 315 515 635 670 790 865 1,020 1,220 1,335 1,870 2,185 26,802,995 3,545 3,700 4,010 4550
Voltage: 1,800 1,417 1,255 1,015 907 870 776 722 622 520 472 292 229,157 123 81 72 59 39
Draw function expression according to these data
U＝1.0e+003x
3-0.0015x+1.7030
The data of utilizing the polynomial method match to record, very little through data and the deviation between the experiment measuring point behind the fitting of a polynomial, the curve behind fitting of a polynomial and the curve of measurement meet better.
The utility model power supply is the voltage stabilizing duty.High-voltage power supply adopts the pulse width modulated circuit that combines with pressure regulation to form, and efficient is high, good stability.Instrument internal is provided with overvoltage, current foldback circuit, can prevent that outside sparking from causing that inner member damages, and also can prevent to cause that because of high pressure is out of control the too high external unit that causes of output voltage damages.The power-on protection circuit guarantees that each start must begin to raise from low-voltage, impacts to load to avoid start.Output voltage, electric current are all adjustable continuously, adopt the pointer gauge indication, and can be exported by the external control high pressure through digital signal processor.Output voltage 0-80KV is adjustable continuously.
In the present embodiment, the power supply that is adopted is a D.C. regulated power supply, and it is not subject to disturb; The high-voltage power supply stability that produces is good, and degree of accuracy is high, can continuous uninterrupted measure; And can carry out the adjusting of electric current and voltage according to the thickness of testee, remedy the deficiency of traditional thickness measurement technology.
The utility model solves with traditional method and is difficult to real-time measurement thickness, has overcome measured medium because factor such as beating, curl to the influence that measurement causes, reached dynamic, the measurement purpose.
Though the utility model discloses as above with preferred embodiment; Right its is not in order to limit the utility model; Any those skilled in the art; In spirit that does not break away from the utility model and scope, when can doing a little modification and perfect, so the protection domain of the utility model is when being as the criterion with what claims defined.
Claims (8)
1. an X-ray measurement metal material thickness device is characterized in that, comprises; X ray high-voltage power supply, X-ray detector, A/D converter, measuring transducer; Wherein, said X ray high-voltage power supply connects x-ray source, and said x-ray source is launched X ray; Said X-ray detector receives the said X ray that passes metallic sheet material, records metal charge thickness corresponding voltage value through said measuring transducer and imports in the computing machine through said A/D converter.
2. X-ray measurement metal material thickness device according to claim 1, wherein, said magnitude of voltage converts digital signal into through said A/D converter.
3. X-ray measurement metal material thickness device according to claim 2 wherein, more comprises digital signal processor.
4. X-ray measurement metal material thickness device according to claim 3, wherein, said digital signal reaches in the said digital signal processor, and said digital signal processor reaches in the said computing machine through handling again.
5. X-ray measurement metal material thickness device according to claim 1, wherein, said computing machine comprises output interface, is used for the data output with said Computer Analysis.
6. X-ray measurement metal material thickness device according to claim 1, wherein, said measuring transducer records metal charge thickness corresponding voltage value corresponding voltage signal.
7. X-ray measurement metal material thickness device according to claim 6; Wherein, Said X-ray detector detects the intensity output dc voltage that said X ray sees through metal material, and said voltage signal is directly proportional with the X ray intensity that arrives said X-ray detector.
8. X-ray measurement metal material thickness device according to claim 5, wherein, said computing machine is exported the metal material one-tenth-value thickness 1/10 of measuring through said output interface.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220175666 CN202511772U (en) | 2012-04-16 | 2012-04-16 | X-ray metal material thickness measurement device |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220175666 CN202511772U (en) | 2012-04-16 | 2012-04-16 | X-ray metal material thickness measurement device |
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| CN202511772U true CN202511772U (en) | 2012-10-31 |
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| CN 201220175666 Expired - Fee Related CN202511772U (en) | 2012-04-16 | 2012-04-16 | X-ray metal material thickness measurement device |
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Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104930992A (en) * | 2015-06-15 | 2015-09-23 | 安徽工程大学 | Thickness gauge |
| CN108027235A (en) * | 2015-12-10 | 2018-05-11 | 株式会社东芝 | Apparatus for measuring thickness |
| CN108168486A (en) * | 2017-11-29 | 2018-06-15 | 深圳国创名厨商用设备制造有限公司南海分公司 | A kind of panel thickness detection device |
| CN109668533A (en) * | 2019-01-30 | 2019-04-23 | 佛山市宗生科技有限公司 | A kind of automatic calibration device and its scaling method using ray |
| CN112881029A (en) * | 2021-01-11 | 2021-06-01 | 深圳市康士柏实业有限公司 | Vehicle chassis detection method and system |
| CN114485495A (en) * | 2022-01-04 | 2022-05-13 | 太原泓博科技有限公司 | Device and method for correcting instability of X-ray of thickness gauge in real time |
| CN115683937A (en) * | 2023-01-04 | 2023-02-03 | 浙江双元科技股份有限公司 | Lithium battery pole piece surface density detection system and method based on linear array photoelectric sensor |
-
2012
- 2012-04-16 CN CN 201220175666 patent/CN202511772U/en not_active Expired - Fee Related
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104930992A (en) * | 2015-06-15 | 2015-09-23 | 安徽工程大学 | Thickness gauge |
| CN104930992B (en) * | 2015-06-15 | 2016-04-06 | 安徽工程大学 | A kind of thicknessmeter |
| CN108027235A (en) * | 2015-12-10 | 2018-05-11 | 株式会社东芝 | Apparatus for measuring thickness |
| CN108027235B (en) * | 2015-12-10 | 2020-07-07 | 株式会社东芝 | Thickness measuring device |
| CN108168486A (en) * | 2017-11-29 | 2018-06-15 | 深圳国创名厨商用设备制造有限公司南海分公司 | A kind of panel thickness detection device |
| CN109668533A (en) * | 2019-01-30 | 2019-04-23 | 佛山市宗生科技有限公司 | A kind of automatic calibration device and its scaling method using ray |
| CN112881029A (en) * | 2021-01-11 | 2021-06-01 | 深圳市康士柏实业有限公司 | Vehicle chassis detection method and system |
| CN114485495A (en) * | 2022-01-04 | 2022-05-13 | 太原泓博科技有限公司 | Device and method for correcting instability of X-ray of thickness gauge in real time |
| CN115683937A (en) * | 2023-01-04 | 2023-02-03 | 浙江双元科技股份有限公司 | Lithium battery pole piece surface density detection system and method based on linear array photoelectric sensor |
| CN115683937B (en) * | 2023-01-04 | 2023-10-03 | 浙江双元科技股份有限公司 | Lithium battery pole piece surface density detection system and method based on linear array photoelectric sensor |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20121031 Termination date: 20130416 |