CN202471623U - Test rack and thin film test platform with external electric field - Google Patents
Test rack and thin film test platform with external electric field Download PDFInfo
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- CN202471623U CN202471623U CN201120559975XU CN201120559975U CN202471623U CN 202471623 U CN202471623 U CN 202471623U CN 201120559975X U CN201120559975X U CN 201120559975XU CN 201120559975 U CN201120559975 U CN 201120559975U CN 202471623 U CN202471623 U CN 202471623U
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Abstract
The utility model discloses a test rack and a thin film test platform with an external electric field. The rack comprises a base, a pair of T-shaped brackets, a pair of probe tables, a pair of probe clamps and a pair of metal probes, wherein the base is arranged above a rotating shaft; a sample table is arranged in the middle above the base; the T-shaped brackets are arranged on the two end faces of the base; the probe tables can adjust the position in multiple dimensions and are respectively arranged on the T-shaped brackets; the probe clamps comprise probe insertion ports and are respectively arranged on the probe tables; and the metal probes are insulated from the probe clamps and fixedly arranged on the probe clamps through the probe insertion ports. The test rack is rational in structure and convenient to operate and can adjust a sample in a rotatable manner during diffraction research; and the experiment efficiency of researching the basic physical property of a thin film material is greatly improved.
Description
Technical field
The utility model relates to a kind of proving installation, particularly a kind of membraneous material electric field in-situ testing device based on synchrotron radiation.
Background technology
Outfield control is a kind of important means of research material rerum natura; Through changing external electrical field; Can be used for the behavior such as phase transformation and electrology characteristic of research material; In conjunction with real-time X-ray diffraction,, thereby instruct the growth characteristics and the rerum natura research of membraneous material in order to of the variation of viewing film material at the different electric screw-down structure.The structure and the rerum natura of material can provide the platform on a basis for understanding the material electrology characteristic under the research electric field.Therefore the scientific research personnel of different field (ferroelectric, piezoelectricity, dielectric) has a large amount of demands to the X ray original position diffraction experiment with electric field controls.
X-ray diffraction is widely used in the structure of research material, fields such as phase transformation and interface.But commercial diffractometer generally only possesses high low temperature annex, lacks electric field original position equipment, therefore can not be used for doing outer structural research after the match.Being employed in increases former potential electrical field on the diffractometer, the research platform that carries out membrane structure under the electric field has good application prospects, and it is most important therefore to develop the convenient and practical former potential electrical field experiment porch based on XRD.Those skilled in the art is devoted to study a kind of testing of materials device that can on diffractometer, increase former potential electrical field.
The utility model content
The technical matters that the utility model will solve is in order to overcome in the prior art, and membraneous material electric field environment in position carries out the deficiency of material phase transformation diffraction experiment, and a kind of novel extra electric field testboard bay and films test platform are provided.
The utility model solves above-mentioned technical matters through following technical proposals:
A kind of extra electric field testboard bay, its characteristics are: said stand comprises:
One base, said base are arranged on turning axle top, and the base top center is provided with a sample stage;
A pair of " T " shape support is arranged on the end face at said base two ends;
A pair of can being separately positioned on said " T " shape support at the probe station of the enterprising line position adjusting of a plurality of dimensions;
A pair of probe anchor clamps comprise the probe socket, are separately positioned on the said probe station; And,
The metal probe of a pair of and said probe anchor clamps insulation is fixedly installed on the said probe anchor clamps through said probe socket.
Preferably, said base is a rectangle, and said sample stage is a cube, and is integrally formed with base.
Preferably, said base two ends are provided with bayonet slot, and said " T " shape support is fixed on the base through said bayonet slot.
Preferably, said probe station comprises three turn-screws, and said probe station is the probe station that can adjust the position of probe anchor clamps three dimensions.
Preferably, said probe anchor clamps are provided with the binding post that inserts extra electric field.
A kind of extra electric field films test platform; Its characteristics are; Comprise a described extra electric field testboard bay of claim 1 to 5 and a camera; Said camera is fixedly installed on said sample stage top through a camera support, and said camera support is connected with the bottom rotating shaft of electrical field test stand.
Preferably, said camera support comprises one " U " shape switching support, and said " U " shape switching support top is provided with wedge shape switching support, and said camera is fixed on the side of said wedge shape switching support.
Preferably, said camera support is fixedly connected with the bottom rotating shaft of electrical field test stand.
In the utility model, but above-mentioned optimum condition combination in any on the basis that meets this area general knowledge promptly gets each preferred embodiment of the utility model.
The positive progressive effect of the utility model is: rational in infrastructure, easy to operate, can when carrying out diffraction investigation, rotate adjustment to sample, and improved the basic substance attributes research conventional efficient of membraneous material greatly.
Description of drawings
Fig. 1 is the stereographic map of the extra electric field testboard bay under specific embodiment of the utility model.
Fig. 2 is the stereographic map of the camera head under specific embodiment of the utility model.
Fig. 3 is the stereographic map of the extra electric field films test platform under specific embodiment of the utility model.
Embodiment
The embodiment of the utility model will describe with reference to accompanying drawing.In Figure of description, the element with similar structures or function will be used the components identical symbolic representation.Accompanying drawing for the ease of each embodiment of explanation the utility model, is not to carry out the explanation of exhaustive to the utility model just, neither the scope of the utility model be limited.
Referring to shown in Figure 1, base 100 is arranged on a turning axle 110 tops, and the base top center is provided with sample stage 109, and sample stage 109 can be a square, also can be other shape that is fit to place testing sample.In one embodiment, sample stage 109 is integrally formed with base 100.
Two " T " shape supports 101 are fixedly installed on respectively on the end face at base 100 two ends, consider that stably the placement location of " T " shape support 101 should guarantee that turning axle 110 is in the centroid position of base 100 during from the rotation of assurance sample.Upper surface 1011 places of " T " shape support 101 are provided with counterbore groove 107, can be fixedly installed on upper surface 1011 places of " T " shape support 101 at the probe station 102 that the enterprising line position of a plurality of dimensions is regulated through counterbore groove 107.Probe station 102 sides are provided with anchor clamps mouth 1021, and probe anchor clamps 103 are fixedly installed on the probe station 102 by anchor clamps mouth 1021.The user can regulate the distance of probe anchor clamps 103 and sample stage 109 through anchor clamps mouth 1021 is carried out the degree of tightness setting.Lower end, 103 1 ends of probe anchor clamps is provided with the probe socket, is used for fixing probe 104 is set, and probe anchor clamps 103 the other end are provided with binding post 1031.
The binding post 1031 of probe anchor clamps 103 can be connected adjustable high voltage power supply (scheming not shown), and in one embodiment, the DC voltage scope that adjustable high voltage power supply can be exported is 0～2000 volt, and the alternating voltage scope is 0～5 volt.Purpose from the protection power supply can add protective resistance in the circuit, to avoid producing big electric current damage high-voltage power supply behind the electric field breakdown sample.
Fig. 2 is the stereographic map that the camera head of the utility model is shown.This camera head comprises camera support 210, and shooting hole 212 is set on it.Camera support 210 ends fixedly install " U " shape switching support 220." U " shape switching support 220 is provided with counterbore groove 222, and camera support 210 is provided with screw (scheming not shown) in the relevant position, and " U " shape switching support 220 is fixed on the camera support 210 by screw." U " shape switching support 220 upper fixed are provided with wedge shape switching support 230, fix through the mode of counterbore groove, screw and screw equally.Wedge shape switching support 230 sides fixedly install camera 240, and the camera lens of camera 240 stretches out downwards, through shooting hole 212 over against sample stage 109.Implement different electric field environments as required; Camera 240 can amplify focal length with the 50-100 multiplying power, is convenient to monitor the measurement state of detected materials.
Fig. 3 is the overall schematic of extra electric field films test platform.The rotating shaft below of extra electric field testboard bay is provided with bearing 112, and camera support 210 is connected with this bearing, is suspended in the sample stage top through an arched arm.When carrying out diffraction experiment; X-ray diffractometer carries out diffraction to sample stage 109; Turning axle 110 can be rotated by motor-driven, and the researchist controls the accurate rotation of turning axle through controlling motor, thereby adjusts the direction of extra electric field testboard bay according to the research needs; Simultaneously extra electric field is regulated, thereby film sample is carried out diffraction analysis.In one embodiment, arched arm and camera are fixed, and extra electric field testboard bay and sample rotate.In another embodiment; Arched arm rotates with the extra electric field testboard bay, and in this case, the camera support is fixedly connected with the bottom rotating shaft of electrical field test stand; Camera guarantees that also along with sample rotates together the image of taking does not out deflect like this.
Those skilled in the art will appreciate that the utility model can be not limited to be applied to membraneous material diffraction investigation, other need carry out the diffraction spectrum analysis and need simultaneously can be suitable for the research work that electric field or other parameters are controlled sample.
More than though the embodiment of the utility model has been described, it will be understood by those of skill in the art that these only illustrate, the protection domain of the utility model is limited appended claims.Those skilled in the art can make numerous variations or modification to these embodiments under the prerequisite of principle that does not deviate from the utility model and essence, but these changes and modification all fall into the protection domain of the utility model.
Claims (8)
1. extra electric field testboard bay, it is characterized in that: said stand comprises:
One base, said base are arranged on turning axle top, and the base top center is provided with a sample stage;
A pair of " T " shape support is arranged on the end face at said base two ends;
A pair of can being separately positioned on said " T " shape support at the probe station of the enterprising line position adjusting of a plurality of dimensions;
A pair of probe anchor clamps comprise the probe socket, are separately positioned on the said probe station; And
The metal probe of a pair of and said probe anchor clamps insulation is fixedly installed on the said probe anchor clamps through said probe socket.
2. testboard bay as claimed in claim 1 is characterized in that: said base is a rectangle, and said sample stage is a cube, and is integrally formed with base.
3. testboard bay as claimed in claim 1 is characterized in that: said base two ends are provided with bayonet slot, and said " T " shape support is fixed on the base through said bayonet slot.
4. testboard bay as claimed in claim 1 is characterized in that: said probe station comprises three turn-screws, and said probe station is the probe station that can adjust the position of probe anchor clamps three dimensions.
5. like each described testboard bay of claim 1 to 4, it is characterized in that: said probe anchor clamps are provided with the binding post that inserts extra electric field.
6. extra electric field films test platform; It is characterized in that; Comprise a described extra electric field testboard bay of claim 1 to 5 and a camera; Said camera is fixedly installed on said sample stage top through a camera support, and said camera support is connected with the bottom rotating shaft of electrical field test stand.
7. test platform as claimed in claim 6 is characterized in that: said camera support comprises one " U " shape switching support, and said " U " shape switching support top is provided with wedge shape switching support, and said camera is fixed on the side of said wedge shape switching support.
8. like claim 6 or 7 described test platforms, it is characterized in that: said camera support is fixedly connected with the bottom rotating shaft of electrical field test stand.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201120559975XU CN202471623U (en) | 2011-12-28 | 2011-12-28 | Test rack and thin film test platform with external electric field |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201120559975XU CN202471623U (en) | 2011-12-28 | 2011-12-28 | Test rack and thin film test platform with external electric field |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202471623U true CN202471623U (en) | 2012-10-03 |
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ID=46919775
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201120559975XU Expired - Fee Related CN202471623U (en) | 2011-12-28 | 2011-12-28 | Test rack and thin film test platform with external electric field |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN202471623U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104655886A (en) * | 2015-03-20 | 2015-05-27 | 合肥京东方光电科技有限公司 | Manual probe structure |
| CN109540944A (en) * | 2019-01-04 | 2019-03-29 | 中南大学 | A kind of high-precision probe clamping device for Sample location in neutron diffraction measurement |
-
2011
- 2011-12-28 CN CN201120559975XU patent/CN202471623U/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104655886A (en) * | 2015-03-20 | 2015-05-27 | 合肥京东方光电科技有限公司 | Manual probe structure |
| CN109540944A (en) * | 2019-01-04 | 2019-03-29 | 中南大学 | A kind of high-precision probe clamping device for Sample location in neutron diffraction measurement |
| CN109540944B (en) * | 2019-01-04 | 2023-10-31 | 中南大学 | High-precision probe clamping device for sample positioning in neutron diffraction measurement |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20121003 Termination date: 20121228 |