CN202453328U - Gapless multi-probe array scanning ultrasonic inspection equipment - Google Patents

Gapless multi-probe array scanning ultrasonic inspection equipment Download PDF

Info

Publication number
CN202453328U
CN202453328U CN2012200682276U CN201220068227U CN202453328U CN 202453328 U CN202453328 U CN 202453328U CN 2012200682276 U CN2012200682276 U CN 2012200682276U CN 201220068227 U CN201220068227 U CN 201220068227U CN 202453328 U CN202453328 U CN 202453328U
Authority
CN
China
Prior art keywords
probe
scanning
probes
son
array scanning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN2012200682276U
Other languages
Chinese (zh)
Inventor
廉国选
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SHANGHAI BINRUI INSPECTION TECHNOLOGY SERVICE Co Ltd
Original Assignee
SHANGHAI BINRUI INSPECTION TECHNOLOGY SERVICE Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SHANGHAI BINRUI INSPECTION TECHNOLOGY SERVICE Co Ltd filed Critical SHANGHAI BINRUI INSPECTION TECHNOLOGY SERVICE Co Ltd
Priority to CN2012200682276U priority Critical patent/CN202453328U/en
Application granted granted Critical
Publication of CN202453328U publication Critical patent/CN202453328U/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Landscapes

  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Abstract

The utility model discloses gapless multi-probe array scanning ultrasonic inspection equipment, which comprises a plurality of probes in single-line arrangement and a main controller, wherein each probe comprises a plurality of sub probes in single-line arrangement, all of the sub probes comprised by the probes are in single-line arrangement, the main controller is respectively connected with each sub probe through a signal wire and sequentially stimulates different sub probe combinations so that a certain phase difference is realized during the scanning, and the phase control array scanning is realized. The equipment only adopts the single-line probe, the full coverage of a detection region can be completed through once scanning, the scanning detection speed can be obviously accelerated, or the technical complexity of double-line probes can be obviously reduced.

Description

The many linear transducer array scanning in a kind of no gap ultrasonic test equipment
Technical field
The utility model relates to the defect-detecting equipment of plane such as a kind of sheet material, tubing or curved surface shape material, the many linear transducer arrays scanning in particularly a kind of no gap ultrasonic test equipment.
Background technology
In the prior art, adopt the arrangement of single array probe, have the scanning blind area between the probe; Adopt in the mode of dislocation complementary scan, increased by 1 times scanning probe distance and scanned detection time; Adopt in the double probe arrangement mode, increased by 1 times probe number, and significantly increased the size of probe along the direction of scanning; Also increased the asynchronous process requirement of scan image along the direction of scanning; If but the repetition ratio of the adjacent acoustic beam that requires is high or owing to adopt the narrow acoustic beam that focuses on, then possibly need to adopt three rows even more rows' probe, not only can cause the loaded down with trivial details further and lengthy and jumbled of arrangement; Cause unnecessary waste, increase technical complexity.
The utility model content
The purpose of the utility model provides the many linear transducer array scanning in a kind of no gap ultrasonic test equipment; Only adopt single probe; The all standing of surveyed area can be single pass accomplished, speed that scanning detects or the technical sophistication degree that reduces double probe can be significantly improved.
In order to realize above purpose, the utility model is realized through following technical scheme:
The many linear transducer array scanning in a kind of no gap ultrasonic test equipment comprises:
The probe of several single-row arrangements, described each probe comprise the son probe of several single-row arrangements, the single-row arrangement of all son probes that described several probes comprise;
Master controller, described master controller link to each other through signal wire with each height probe respectively; Described master controller excites different son probe combinations successively, makes scanning have certain phase difference, realizes phased array scanning.
Described several probes adopt the mode of integrated encapsulation.
Described each probe is for being divided into some wafer, and every of being partitioned into of described wafer is a son probe.
The signal wire that described son probe links to each other with master controller is a polycore cable.
Described master controller is a multiplexer.
The utility model compared with prior art has the following advantages:
Only adopt single probe, can single pass accomplish all standing of surveyed area, can significantly improve speed that scanning detects or the technical sophistication degree that reduces double probe.
Description of drawings
Fig. 1 does not have the son probe arrangement of the many linear transducer array scanning in gap ultrasonic test equipment for the utility model is a kind of;
Fig. 2 is divided into two overlapping principle schematic of the son adjacent acoustic beam with it of probe for the probe of the utility model.
Embodiment
Below in conjunction with accompanying drawing,, the utility model is done further elaboration through specifying a preferable specific embodiment.
The many linear transducer array scanning in a kind of no gap ultrasonic test equipment comprises: the probe of master controller and several single-row arrangements.Wherein, each probe comprises the son probe of several single-row arrangements, the single-row arrangement of all son probes that several probes comprise; Master controller links to each other through signal wire with each height probe respectively.In the present embodiment, several probes adopt the mode of integrated encapsulation, and each probe is for being divided into some wafer, and each sheet that wafer is cut apart constitutes a son probe; The signal wire that the son probe links to each other with master controller is a shielded multiconductor cable, has improved the reliability of signal wire; Master controller is selected multiplexer for use, can make the passage that connects each son probe have switching function.
As depicted in figs. 1 and 2; In the present embodiment, be example to need overlapping 1/2 of the single beam angle that is covered as of acoustic beam, this defect-detecting equipment comprises two probes: probe 1, probe 2; Each is popped one's head in and is the wafer that is divided into two; Promptly comprise two son probes, be respectively: son probe 11,12 and son probe 21,22, its neutron probe 12 and the 21 adjacent arrangements of son probe.Each son probe all constitutes a passage, through multiplexer, can make scanning have certain phase difference through exciting different son probe combinations successively, realizes phased array scanning, and the consistance of array probe is well ensured.
As shown in Figure 2, when exciton probe 11 and son probe 12, form the detection acoustic beam that the dotted line that has a down dip is represented left; When exciton probe the 12 and the 3rd son probe 21, the formation detection acoustic beam that dotted line is represented that has a down dip to the right then; When exciton probe 21 and son probe 22, then form the detection acoustic beam that the dotted line that has a down dip is represented again left.Because probe 1 and pop one's head in and have the gap between 2; This gap is generally 0.1mm; And can find out significantly that from Fig. 2 adjacent two acoustic beam overlapping areas are near 1/2 of single detection beam width; Satisfy overlapping 1/2 the requirement that is covered as single beam angle of present acoustic beam fully, can be owing to the gap of detecting between the acoustic beam forms omission.For except that the son probe 11 and son probe 22 of linear transducer array both sides; Son probe 21 and son probe 12 all with adjacent son probe combination respectively; Accomplish twice emitting/reception, overlay area, the obtainable no gap of single pass is the linear transducer array width that all son probes are formed, and the surveyed area width decision that the total number of son probe need cover based on single pass; Width is big more, and the number of son probe is corresponding many more.
In sum, the many linear transducer arrays in a kind of no gap of the utility model scanning ultrasonic test equipment only adopts single probe, can single pass accomplishes all standing of surveyed area, can significantly improve speed that scanning detects or the technical sophistication degree that reduces double probe.
Although the content of the utility model has been done detailed introduction through above-mentioned preferred embodiment, will be appreciated that above-mentioned description should not be considered to the restriction to the utility model.After those skilled in the art have read foregoing, for the multiple modification of the utility model with to substitute all will be conspicuous.Therefore, the protection domain of the utility model should be limited appended claim.

Claims (5)

1. the many linear transducer array scanning in a no gap ultrasonic test equipment is characterized in that, comprises:
The probe of several single-row arrangements, described each probe comprise the son probe of several single-row arrangements, the single-row arrangement of all son probes that described several probes comprise;
Master controller, described master controller link to each other through signal wire with each height probe respectively; Described master controller excites different son probe combinations successively, makes scanning have certain phase difference, realizes phased array scanning.
2. the many linear transducer array scanning in no gap according to claim 1 ultrasonic test equipment is characterized in that described several probes adopt the mode of integrated encapsulation.
3. many linear transducer arrays scanning ultrasonic test equipment in no gap according to claim 1 and 2 is characterized in that, described each probe is for being divided into some wafer, and every of being partitioned into of described wafer is a son probe.
4. the many linear transducer array scanning in no gap according to claim 3 ultrasonic test equipment is characterized in that the signal wire that described son probe links to each other with master controller is a polycore cable.
5. the many linear transducer array scanning in no gap according to claim 4 ultrasonic test equipment is characterized in that described master controller is a multiplexer.
CN2012200682276U 2012-02-28 2012-02-28 Gapless multi-probe array scanning ultrasonic inspection equipment Expired - Fee Related CN202453328U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2012200682276U CN202453328U (en) 2012-02-28 2012-02-28 Gapless multi-probe array scanning ultrasonic inspection equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2012200682276U CN202453328U (en) 2012-02-28 2012-02-28 Gapless multi-probe array scanning ultrasonic inspection equipment

Publications (1)

Publication Number Publication Date
CN202453328U true CN202453328U (en) 2012-09-26

Family

ID=46869183

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2012200682276U Expired - Fee Related CN202453328U (en) 2012-02-28 2012-02-28 Gapless multi-probe array scanning ultrasonic inspection equipment

Country Status (1)

Country Link
CN (1) CN202453328U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102590339A (en) * 2012-02-28 2012-07-18 上海斌瑞检测技术服务有限公司 Ultrasonic flaw detection equipment with zero-clearance multi-probe array
CN109752464A (en) * 2019-01-22 2019-05-14 中国计量大学 A kind of higher hamonic wave bistatic formula ultrasonic probe

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102590339A (en) * 2012-02-28 2012-07-18 上海斌瑞检测技术服务有限公司 Ultrasonic flaw detection equipment with zero-clearance multi-probe array
CN109752464A (en) * 2019-01-22 2019-05-14 中国计量大学 A kind of higher hamonic wave bistatic formula ultrasonic probe

Similar Documents

Publication Publication Date Title
CN106415931B (en) Array antenna device
US10401328B2 (en) Synthetic data collection method for full matrix capture using an ultrasound array
US8590381B2 (en) Ultrasonic flaw detection method and ultrasonic flaw detection equipment
US8584526B2 (en) Ultrasonic flaw detection method and ultrasonic flaw detection equipment
CN101614702B (en) High resolution and flexible eddy current array probe
CN102065774B (en) Photoacoustic imaging apparatus
US20120119732A1 (en) Magnetostrictive sensor array for active or synthetic phased-array focusing of guided waves
US20070224895A1 (en) Mooring of arrays of buoy-like WECs
CN104535657A (en) Sheet workpiece phased array ultrasonic guided wave imaging detection system and detection method thereof
CN202453328U (en) Gapless multi-probe array scanning ultrasonic inspection equipment
CN203443932U (en) Longitudinal wave and transverse wave integrated ultrasonic probe
CN101551462A (en) Dual function detector device
CN106005301B (en) A kind of ship draft detection apparatus and detection method
CN109781864A (en) Signal de-noising and defect inspection method and flaw indication reconstructing method based on guided wave signals sparse decomposition method
JP2011203037A (en) Ultrasonic flaw detecting apparatus and ultrasonic flaw detecting method
CN108680641A (en) Flexible array sensor based on vortex with ULTRASONIC COMPLEX
CN105074454B (en) The device and method of lossless control for metallicity
CN203350556U (en) Array substrate motherboard and array substrate lead inspection device
CN102590339A (en) Ultrasonic flaw detection equipment with zero-clearance multi-probe array
CN202649172U (en) Steel board ultrasonic wave detection device
DE102008056416B4 (en) Eddy current sensor array for non-destructive position detection of electrically conductive objects
CN103048388A (en) Construction method of layer-by-layer C scanning peak image of ultrasonic scanning microscope
JP2010258357A (en) Meander coil, method of manufacturing the same, and electromagnetic ultrasonic transducer
CN2837838Y (en) Apparatus for microwave focusing imaging detection of radial tire defect
DE102011108730A1 (en) Method and apparatus for ultrasonic testing with a matrix phased array probe

Legal Events

Date Code Title Description
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20120926

Termination date: 20200228