CN202452949U - Electrode width measuring system of chip capacitor on basis of Labview - Google Patents

Electrode width measuring system of chip capacitor on basis of Labview Download PDF

Info

Publication number
CN202452949U
CN202452949U CN2012200632135U CN201220063213U CN202452949U CN 202452949 U CN202452949 U CN 202452949U CN 2012200632135 U CN2012200632135 U CN 2012200632135U CN 201220063213 U CN201220063213 U CN 201220063213U CN 202452949 U CN202452949 U CN 202452949U
Authority
CN
China
Prior art keywords
camera
platform
measuring system
electrode width
width measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN2012200632135U
Other languages
Chinese (zh)
Inventor
黄琛
李江宁
崔明虎
李永峰
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tianjin Samsung Electro Mechanics Co Ltd
Original Assignee
Tianjin Samsung Electro Mechanics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tianjin Samsung Electro Mechanics Co Ltd filed Critical Tianjin Samsung Electro Mechanics Co Ltd
Priority to CN2012200632135U priority Critical patent/CN202452949U/en
Application granted granted Critical
Publication of CN202452949U publication Critical patent/CN202452949U/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Landscapes

  • Length Measuring Devices By Optical Means (AREA)

Abstract

The utility model discloses an electrode width measuring system of a chip capacitor on the basis of Labview. The electrode width measuring system comprises a computer, a platform, a liftable camera bracket, a camera, a ring-shaped lamp and a hemispherical light-emitting cover, wherein the liftable camera bracket is fixedly arranged on the platform; the camera is fixedly arranged on the camera bracket, enables a lens to face to the surface of the lifting platform vertically and maintains communication connection with the computer; the ring-shaped lamp is fixedly arranged on the periphery of the camera; the hemispherical light-emitting cover comprises a round light-emitting body, a hemispherical shell and a round through hole, wherein the bottom part of the round light-emitting body is arranged at the bottom part of the cover body; the round through hole is arranged at the top part of the light-emitting cover and corresponds to the lens of the camera. The electrode width measuring system disclosed by the utility model has the advantages that by use of image measuring software based on the Labview, adjustment can be carried out on image definition and red-light light source brightness according to different types, the automatic measurement of the image is used for replacing eye measurement, more accurate boundary can be found according to the gray contrast, a more accurate measured value can be obtained, and the measurement errors caused by human estimated reading are avoided.

Description

A kind of patch capacitor electrode width measuring system based on Labview
Technical field
The utility model relates to a kind of measuring system, relates in particular to a kind of patch capacitor electrode width measuring system based on Labview.
Background technology
Patch capacitor has another name called the ceramic multilayer chip capacitor, is the bigger common component of present amount ratio, and it adopts the ceramic powder production technology, and inside is the noble metal porpezite, with high-temperature sintering process silver is plated in pottery and upward processes as electrode.At present, in the electrode sintering engineering, the scene needs to measure the electrode width of electric capacity two ends coating, guarantees the processing of follow-up engineering and the weldability of electric capacity.
And now during the potential electrode width, the operator need use low-power microscope.Because the low-power microscope precision is 50um, the needs that are lower than 50um are estimated and are read.There is very big-difference in different personnel's gained measured values during the potential electrode width, and also there is very big-difference in same personnel in each measurement, i.e. no return property and repeatability, and testing efficiency is low, and the measurement result out of true.
Therefore, provide a kind of simple to operate, obvious results electrode width measurement mechanism to become one of these those skilled in the art problem anxious to be addressed.
Summary of the invention
The technical matters that the utility model will solve provides a kind of simple to operate, testing efficiency is high and stable high duplication is strong electrode width measuring system.
For solving the problems of the technologies described above, the technical scheme that the utility model adopted is:
A kind of patch capacitor electrode width measuring system based on Labview; Comprise computing machine, platform; Be fixedly installed on the liftable camera support on the platform; Be fixedly installed on the camera support and make camera lens vertically towards hoistable platform surface and with the camera that computing machine is kept in communication and is connected, be fixedly installed on the annular lamp on the described camera periphery, and the semisphere diffuser; Wherein, described semisphere diffuser comprises that the bottom is arranged on the circular luminophor and the hemispherical shell of cover body bottom and is arranged on the just manhole corresponding with cam lens at place, top of diffuser.
Preferably, but described camera support is fixedly connected on the L shaped connecting link on the montant with comprising the montant that vertically is fixedly connected on the platform and up-down adjustment, and described camera is fixedly connected on the L shaped connecting link.
Preferably, the platform in the captured zone of described camera is provided with black coating, and the thickness of coating is placed patch capacitor on it generally at 1-5mm, improves measuring accuracy when being convenient to confirm to put the position.
Preferably, on described platform, also be set with two fixed legs with auxiliary light emission cover location, certainly, the position of fixed leg can be adjustable all around to adapt to different situations.
Preferably, described diffuser can be hinged on the platform of shooting area one side with spinning upside down, and diffuser is fixedly installed; Position Design with camera is adjustable simultaneously; Make that operation is more directly simple in a collection of same patch capacitor measuring process, raise the efficiency, and camera fixed position mode can adopt the elongated slot bolt perhaps to adjust structures such as platform in length and breadth; This embodies in the prior art to some extent, does not give unnecessary details at this.
The electrode width measuring system of the utility model; Use is based on the image measurement software of Labview; Can carry out respective image sharpness and red-light source brightness adjustment according to different machines, measure the replacement human eye automatically with image and measure, can find out border more accurately according to intensity contrast; Obtain more accurate measured value, avoided the people to estimate the error at measurment of reading.
Description of drawings
Fig. 1 is the patch capacitor electrode width measuring system structural representation of the utility model.
Embodiment
In order to make those skilled in the art person understand the utility model scheme better, the utility model is done further to specify below in conjunction with accompanying drawing and embodiment.
Shown in Figure 1 is the patch capacitor width measure system of the utility model; It comprises computing machine 10, platform 1; Be fixedly installed on the liftable camera support 2 on the platform; Be fixedly installed on the camera support and make camera lens, be fixedly installed on the annular lamp 4 on the described camera periphery vertically towards the camera 3 on hoistable platform surface, and semisphere diffuser 5.
Described computing machine is the core of whole measuring system, has friendly human-computer interaction interface, and it is the carrier of width measure software simultaneously.Communications protocol transition cards such as GPIB are assigned on the computing machine; Add that the application software based on the Labview exploitation constitutes the virtual instrument monitoring platform; Realized collecting test analysis, had that software and hardware resources is abundant, extendability strong, a measuring process robotization, measuring accuracy height, good reproducibility, easy to operate, cost performance advantages of higher with the total digitalization of computing machine.And the display of computing machine can show directly that the image that camera is taken, operator can directly be seen through camera and takes the picture after amplifying, and is convenient to investigate situation such as overlapping mutual extrusion, further accurate test result.
Wherein, but described camera support 2 is fixedly connected on the L shaped connecting link on the montant with comprising the montant that vertically is fixedly connected on the platform 1 and up-down adjustment.Described camera is fixedly installed on the L shaped connecting link vertically, through regulating the distance that L shaped web joint can be regulated camera and platform with respect to the upper-lower position of montant, so that focus on test.
Be set with the annular lamp 4 that can emit white light in described camera end loops, the even from top to bottom throw light of described annular lamp can effectively be removed the influence of shade to measurement result, improves and distinguishes speed and accuracy allly.Simultaneously, described camera and computing machine carry out the setting of acquisition parameters such as focal length through the order of gpib bus receiving computer.
Preferably; The platform in the captured zone of described camera is provided with black coating 11, and patch capacitor to be measured is placed on the black coating district under the camera, utilizes the strong contrast of black and electrode color; Make and effectively to improve measuring accuracy by sharpness of border.
Described semisphere diffuser 5 comprises that the bottom is arranged on the circular luminophor 51 and the reflective shell 52 of semisphere of cover body bottom and is arranged on the just manhole 53 at place, top of diffuser.Wherein, described reflective outer casing inner wall is coarse so that with the ruddiness diffuse reflection, improves the red light distribution homogeneity.Described through hole 53 is complementary with cam lens, is advisable not influence in the lens shooting cover element.Described circular luminophor is the luminophor of point type or wire Boulez, but like the burn red LED lamp bar or the even LED lamp of Boulez.The luminophor of bottom sends ruddiness when energy supply, in cover body, forms even red light district through the diffuse reflection of cover body light emitting shell, and ruddiness can improve dark patch capacitor ceramic body partly and the difference degree of electrode, can effectively improve measuring accuracy.
Further, for improving accurately locating fast of diffuser, on described platform, also be set with two fixed legs, two fixed legs can be convenient with the diffuser location, makes its through hole corresponding up and down with camera.
Certainly diffuser is hinged on the platform turningly, and camera is designed to adjustable positions all around, can realize the purpose of the utility model equally.
Below will be through the measuring method of native system being described the further aim of explaination the utility model.
At first, the upper-lower position of adjustment camera is located at correct position, puts brilliant white annular lamp 4 simultaneously; With a collection of patch capacitor goods,, be placed in the black region of camera below as 10; The camera shot picture is presented on the display, and the surveillance map picture on the observation display is if there is contact between the electric capacity; With tweezers it is separated, guarantee that each testing capacitance and other electric capacity are contactless;
Then, close the white light source, red-light source is covered on the testing capacitance, and the edge of light source cover opens red-light source near the edge of two reference columns, regulate ruddiness brightness according to actual conditions;
Then, the size of adjustment focal length makes the monitoring clear picture, and the measurement button of clicking on the Labview software measurement picture begins to measure, and software is searched electrode edge and obtained the electrode width value according to intensity contrast; Simultaneously measurement result is imported in the excel form automatically;
The electric capacity that to survey is at last taken away, is changed to the next group testing capacitance and measures.
The electrode width measuring system of the utility model; Use is based on the image measurement software of Labview; Can carry out respective image sharpness and red-light source brightness adjustment according to different machines, measure the replacement human eye automatically with image and measure, can find out border more accurately according to intensity contrast; Obtain more accurate measured value, avoided the people to estimate the error at measurment of reading.
By the above only is the preferred implementation of the utility model; Should be understood that; For those skilled in the art; Under the prerequisite that does not break away from the utility model principle, can also make some improvement and retouching, these improvement and retouching also should be regarded as the protection domain of the utility model.

Claims (5)

1. patch capacitor electrode width measuring system based on Labview; It is characterized in that: comprise computing machine, platform; Be fixedly installed on the liftable camera support on the platform; Be fixedly installed on the camera support and make camera lens vertically towards hoistable platform surface and with the camera that computing machine is kept in communication and is connected, be fixedly installed on the annular lamp on the described camera periphery, and the semisphere diffuser; Wherein, described semisphere diffuser comprises that the bottom is arranged on the circular luminophor and the hemispherical shell of cover body bottom and is arranged on the just manhole corresponding with cam lens at place, top of diffuser.
2. patch capacitor electrode width measuring system as claimed in claim 1; It is characterized in that: but described camera support is fixedly connected on the L shaped connecting link on the montant with comprising the montant that vertically is fixedly connected on the platform and up-down adjustment, and described camera is fixedly connected on the L shaped connecting link.
3. patch capacitor electrode width measuring system as claimed in claim 1 is characterized in that: the platform in the captured zone of described camera is provided with black coating.
4. like each described patch capacitor electrode width measuring system of claim 1-3, it is characterized in that: on described platform, also be set with two fixed legs and locate with the auxiliary light emission cover.
5. like each described patch capacitor electrode width measuring system of claim 1-3, it is characterized in that: described diffuser can be hinged on the platform of shooting area one side with spinning upside down.
CN2012200632135U 2012-02-24 2012-02-24 Electrode width measuring system of chip capacitor on basis of Labview Expired - Fee Related CN202452949U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2012200632135U CN202452949U (en) 2012-02-24 2012-02-24 Electrode width measuring system of chip capacitor on basis of Labview

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2012200632135U CN202452949U (en) 2012-02-24 2012-02-24 Electrode width measuring system of chip capacitor on basis of Labview

Publications (1)

Publication Number Publication Date
CN202452949U true CN202452949U (en) 2012-09-26

Family

ID=46868808

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2012200632135U Expired - Fee Related CN202452949U (en) 2012-02-24 2012-02-24 Electrode width measuring system of chip capacitor on basis of Labview

Country Status (1)

Country Link
CN (1) CN202452949U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103322918A (en) * 2013-05-24 2013-09-25 陕西科技大学 Equipment for measuring height of vehicle and measuring method thereof
CN105666485A (en) * 2016-03-28 2016-06-15 桂林电子科技大学 Automatic identifying and positioning chess placing robot based on image processing

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103322918A (en) * 2013-05-24 2013-09-25 陕西科技大学 Equipment for measuring height of vehicle and measuring method thereof
CN103322918B (en) * 2013-05-24 2016-01-20 陕西科技大学 The equipment of measuring vehicle height and measuring method thereof
CN105666485A (en) * 2016-03-28 2016-06-15 桂林电子科技大学 Automatic identifying and positioning chess placing robot based on image processing

Similar Documents

Publication Publication Date Title
CN109191520B (en) Plant leaf area measuring method and system based on color calibration
CN104567680B (en) A kind of measuring system of electric wire structure
CN205844396U (en) The device for quick testing of photoelectric detector chip
CN205217402U (en) Device of high defect in metalwork groove / hole is examined to quick sieve
CN202452949U (en) Electrode width measuring system of chip capacitor on basis of Labview
CN206944945U (en) A kind of device of two-dimensional measurement high temperature and high speed cutting deformation
CN103020586A (en) Method, device and system for identifying PCB (printed circuit board)
CN108414914A (en) A kind of flip LED chips receipts flash ranging test-run a machine
CN104954783B (en) The optical system of camera module detection device
CN202420820U (en) Test device for measuring pulse flash brightness of flashlight
CN103292703A (en) Chip capacitor electrode width measuring method based on Labview
CN204346368U (en) A kind of measuring system of electric wire structure
CN203101288U (en) Full-automatic optical detecting system of ITO (Indium Tin Oxide) conductive glass
CN104332433A (en) Probe card cleaning piece and probe card cleaning method
CN209027474U (en) A kind of entrucking mate gap intelligent detection device
CN204142186U (en) A kind of measuring system of electric wire structure
CN208313829U (en) A kind of adjustable multiband transmitted light information collecting device of the intensity of light source
CN202661042U (en) Auxiliary examination device for solder mask exposure alignment precision
CN203376277U (en) Internal stripe detection system for glass
CN203425993U (en) Novel dispenser with fluorescent powder thickness vision detector
CN204962463U (en) Visual inspection device's light structures
CN110108710A (en) One kind being used for button cell anode concave point detection device and method
CN202562857U (en) End surface defect detection system for transparent capsules
CN205482788U (en) A fine and closely woven pin mark optical detection system for detecting PCB board
CN109060314A (en) A kind of lamp plate illumination uniformity detection method

Legal Events

Date Code Title Description
C14 Grant of patent or utility model
GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20120926

Termination date: 20140224