CN202443037U

CN202443037U - Integrated circuit testing device

Info

Publication number: CN202443037U
Application number: CN2012200569767U
Authority: CN
Inventors: 王国华
Original assignee: Individual
Current assignee: Si Nada Science And Technology Ltd Of Shenzhen
Priority date: 2012-02-22
Filing date: 2012-02-22
Publication date: 2012-09-19
Anticipated expiration: 2022-02-22

Abstract

The utility model relates to an integrated circuit testing device comprising a base (10) and an upper cover (20). The inner end of the upper cover (20) is buckled with the base (10) to realize buckling or opening; a lock catch mechanism comprises a first lock catch assembly (40) and a second lock catch assembly (50); the first lock catch assembly (40) further comprises an operation handle (41) and a buckle hook (42); the upper end of the buckle hook (42) is rotatably connected with the inner end of the upper cover (20); the lower end of the buckle hook (42) can be buckled with the second lock catch assembly (50); and the outer end of the upper cover (20) of the operation handle (41) can be rotatably connected and can be used for downwards operating to push the buckle hook (42) to be buckled with the second lock catch assembly (50), or can be used for upwards operating to accelerate the buckle hook (42) to be separated from the second lock catch assembly (50). Compared with the prior art, the integrated circuit testing device has the advantages of convenience for operation, durability in use and the like.

Description

Arrangement for testing integrated circuit

Technical field the utility model relates to the test of semiconductor devices, particularly relates to the proving installation of integrated circuit.

Background technology is along with the development of SMT (Surface Mount Technology) surface mounting technology, and the integrated level of integrated circuit (being called for short the IC chip) is increasingly high, and the IC pin is more and more closeer, spacing is more and more littler; Current under the drive of mobile terminal devices such as smart mobile phone, panel computer; The E-consumer series products gets into the developing stage of an explosion type; The demand of chips such as jumbo storage chip, camera chip, gravity sensing chip, central processing unit is unprecedented, and integrated circuit testing is a ring indispensable in the whole manufacture of semiconductor.The structure of prior art arrangement for testing integrated circuit is generally as shown in Figure 1; Comprise base 10 ' and loam cake 20 '; Loam cake 20 ' is rotatably connected in outer end and base 10 '; Loam cake 20 ' the inner forms first latch components 40 ', and base 10 ' the inner forms and the second suitable latch components 50 ' of first latch components 40 '; Because operating grip and the clasp of said first latch components 40 ' design for one, and with loam cake 20 ' between for being fixedly connected or one-body molded, make the fastening of the win latch components 40 ' and second latch components 50 ' or opening operation all comparatively inconvenient; Also promptly fasten or open comparatively inconvenience of loam cake operation at testing integrated circuits, inefficiency, and; This frame mode; Use for a long time, clasp is easy to wear, causes proving installation short serviceable life.

The technical matters that utility model content the utility model will solve is to avoid the weak point of above-mentioned prior art and proposes a kind of easy to operate, long-lived arrangement for testing integrated circuit.

The utility model solve the technical problem and can realize through adopting following technical scheme:

Design, make a kind of arrangement for testing integrated circuit, comprise base and loam cake, be placed on the outer end on said, be placed on said and innerly realize fastening with base by latching device or open with base is rotatably connected; Said latching device comprises and is arranged on the first inner latch components of said loam cake, second latch components inner with being arranged on said base, and said first latch components and second latch components are suitable and can fasten each other or throw off; Said first latch components comprises operating grip and clasp again, and said clasp upper end is rotatably connected with said loam cake the inner, and the lower end of clasp can fasten with second latch components; The upper end of the adjacent said clasp of said operating grip also is rotatably connected with said loam cake outer end, is used for operating the said clasp of promotion and second latch components downwards and fastens, perhaps upwards operates and impel said clasp and the disengagement of second latch components.

As the further improvement of the utility model arrangement for testing integrated circuit embodiment, also be provided with spring between said clasp and the said loam cake.

As further improving again of the utility model arrangement for testing integrated circuit embodiment; Said second latch components comprises solid shaft and sleeve pipe; Said sleeve pipe is enclosed within on the said solid shaft rotationally, and these solid shaft two ends are connected fixing with said base two avris.

The another step as the utility model arrangement for testing integrated circuit embodiment improves, and said base comprises base body and these two two parts that removably connect of contiguous block, and said loam cake directly is rotatably connected with said contiguous block.

As further improving again of the utility model arrangement for testing integrated circuit embodiment; Said loam cake middle part is emptied into one and is enclosed the frame type; Said enclosing is provided with a wiggling and pressing block in the frame; This wiggling and pressing block is rotatably connected in two avris and loam cake, and the area of said wiggling and pressing block is slightly less than the said area that encloses frame can only do trickle swing adjustment to guarantee wiggling and pressing block in enclosing frame.

Compare with prior art; The technique effect of the utility model arrangement for testing integrated circuit is: 1. first latch components adopts operating grip and clasp split design; And operating grip and clasp all with loam cake for being rotatably connected, thereby make fastening or the operation of disengagement between the clasp and second latch components become very well, simultaneously; The problem of also having avoided clasp to be worn easily, the serviceable life of prolongation proving installation; 2. be provided with spring between clasp and the loam cake, under the elastic force effect of spring, make the fastening between the clasp and second latch components operate quick and convenient more, improve testing efficiency; 3. second latch components adopts the design of the sheathed solid shaft of sleeve pipe, and clasp is fastened on the sleeve pipe, and when fastening or throw off operation, sleeve pipe can freely rotate, and has lowered resistance and friction, makes operation more convenient, and further reduces the wearing and tearing of clasp; 4. base designs becomes base body and these two two parts that removably connect of contiguous block; Make the technologies such as die sinking design and surface treatment of base become simple; Reduce cost of manufacture, and contiguous block can be used as a standard component; Be applicable to the base of different size size, thereby more see and be convenient to produce in batches and reduce cost; 5. the structural design of wiggling and pressing block makes the chip vertical depression when guaranteeing to fasten the loam cake test, effectively avoids integrated circuit not to be shifted, and reduces the test wrong diagnosis.

Description of drawings

Fig. 1 is the structural representation of prior art arrangement for testing integrated circuit;

Fig. 2 is the perspective view of the utility model arrangement for testing integrated circuit embodiment, Fig. 2 B when Fig. 2 A and open mode when comprising buckling state;

Fig. 3 is the perspective exploded view of the utility model arrangement for testing integrated circuit embodiment;

Fig. 4 is the sectional structure synoptic diagram of the utility model arrangement for testing integrated circuit embodiment, comprises Fig. 4 A and Fig. 4 B, and wherein, Fig. 4 A illustrates the state when wiggling and pressing block is not swung, and Fig. 4 B illustrates that wiggling and pressing block swings adjusted state.

Embodiment is done further to detail below in conjunction with the preferred embodiment shown in the accompanying drawing.

A kind of arrangement for testing integrated circuit; As shown in Figures 2 and 3; Comprise base 10 and loam cake 20; Said base 10 comprises base body 11 and contiguous block 12 these two two parts that removably connect, and said loam cake 20 directly is rotatably connected with said contiguous block 12 in the outer end, and said loam cake 20 is realized fastening or opening by latching device with base 10 in inner; Said latching device comprises and is arranged on the first inner latch components 40 of said loam cake 20, second latch components 50 inner with being arranged on said base 10, and said first latch components 40 and second latch components 50 are suitable and can fasten each other or throw off; Said first latch components 40 comprises operating grip 41 and clasp 42 again, and said clasp 42 upper ends and said loam cake 20 the inners are rotatably connected, and the lower end of clasp 42 can fasten with second latch components 50; The upper end of said operating grip 41 adjacent said clasps 42; Said operating grip 41 and clasp 42 are rotatably connected by same rotating shaft and said loam cake 20 the inners, are used for operating the said clasp 42 of promotion and second latch components 50 downwards and fasten, perhaps upwards operate and impel said

clasp

42 and 50 disengagements of second latch components.

As shown in Figure 2, in the utility model, said second latch components 50 comprises solid shaft 51 and sleeve pipe 52, and said sleeve pipe 52 is enclosed within on the said solid shaft 51 rotationally, and the 10 liang of avris in these solid shaft 51 two ends and said base are connected fixing.Adopt rotating sleeve pipe 52 to cooperate with clasp 42 like this, when fastening or throw off operation, sleeve pipe 52 can freely rotate, and sliding friction of the prior art is become rolling friction, has greatly reduced the wearing and tearing of clasp 42 and sleeve pipe 52.

As shown in Figure 4, in the utility model, also be provided with spring 43 between said clasp 42 and the said loam cake 20.Under the elastic force effect of spring, make the fastening between the clasp and second latch components operate quick and convenient more, improve testing efficiency.

As shown in Figure 4; In the utility model; Said loam cake 20 middle parts are emptied into one and are enclosed the frame type, and said enclosing is provided with a wiggling and pressing block 28 in the frame, and this wiggling and pressing block 28 is rotatably connected in two avris and loam cake 20; And the area of said wiggling and pressing block 28 is slightly less than the said area that encloses frame can only do trickle swing adjustment to guarantee wiggling and pressing block 18 in enclosing frame.Like this when fastening loam cake 20 tests; Guarantee that wiggling and pressing block 28 contacts with the upper surface of IC chip 60, make IC chip 60 vertical depression, (prior art exists loam cake fashionable at rotary buckle effectively to avoid integrated circuit not to be shifted; Promote the sidepiece of IC chip and cause displacement), reduce the test wrong diagnosis.

The physical circuit test philosophy and the test process of the utility model, identical with the arrangement for testing integrated circuit of prior art, repeat no more here.

Above content is the further explain that combines concrete optimal technical scheme that the utility model is done, and can not assert that the practical implementation of the utility model is confined to these explanations.For the those of ordinary skill of technical field under the utility model, under the prerequisite that does not break away from the utility model design, can also make some simple deduction or replace, all should be regarded as belonging to the protection domain of the utility model.

Claims

1. an arrangement for testing integrated circuit comprises base (10) and loam cake (20), and said loam cake (20) is rotatably connected in outer end and base (10), and said loam cake (20) is realized fastening or opening by latching device with base (10) in inner; It is characterized in that: said latching device comprises and is arranged on inner first latch components (40) of said loam cake (20) second latch components (50) inner with being arranged on said base (10), and said first latch components (40) and second latch components (50) are suitable and can fasten each other or throw off; Said first latch components (40) comprises operating grip (41) and clasp (42) again, and said clasp (42) upper end is rotatably connected with said loam cake (20) the inner, and the lower end of clasp (42) can fasten with second latch components (50); The upper end of the adjacent said clasp of said operating grip (41) (42); Also be rotatably connected, be used for the downward operation said clasp of promotion (42) and fasten with second latch components (50), perhaps upwards operate and impel said clasp (42) and second latch components (50) to throw off with said loam cake (20) outer end.

2. arrangement for testing integrated circuit as claimed in claim 1 is characterized in that: said operating grip (41) and clasp (42) are rotatably connected by same rotating shaft and said loam cake (20) the inner.

3. according to claim 1 or claim 2 arrangement for testing integrated circuit is characterized in that: also be provided with spring (43) between said clasp (42) and the said loam cake (20).

4. arrangement for testing integrated circuit as claimed in claim 3; It is characterized in that: said second latch components (50) comprises solid shaft (51) and sleeve pipe (52); Said sleeve pipe (52) is enclosed within on the said solid shaft (51) rotationally, and this solid shaft (51) two ends are connected fixing with said base (10) two avris.

5. arrangement for testing integrated circuit as claimed in claim 3; It is characterized in that: said base (10) comprises base body (11) and these two two parts that removably connect of contiguous block (12), and said loam cake (20) directly is rotatably connected with said contiguous block (12).

6. arrangement for testing integrated circuit as claimed in claim 3; It is characterized in that: said loam cake (20) middle part is emptied into one and is enclosed the frame type; Said enclosing is provided with a wiggling and pressing block (28) in the frame; This wiggling and pressing block (28) is rotatably connected in two avris and loam cake (20), and the area of said wiggling and pressing block (28) is slightly less than the said area that encloses frame can only do trickle swing adjustment to guarantee wiggling and pressing block (28) in enclosing frame.