CN202433455U - Power cycling system of power device - Google Patents

Power cycling system of power device Download PDF

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Publication number
CN202433455U
CN202433455U CN2011205620500U CN201120562050U CN202433455U CN 202433455 U CN202433455 U CN 202433455U CN 2011205620500 U CN2011205620500 U CN 2011205620500U CN 201120562050 U CN201120562050 U CN 201120562050U CN 202433455 U CN202433455 U CN 202433455U
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China
Prior art keywords
power device
computer control
control system
power
current source
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Expired - Lifetime
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CN2011205620500U
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Chinese (zh)
Inventor
李冯
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STARPOWER SEMICONDUCTOR LTD.
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JIAXING STARPOWER MICROELECTRONICS CO Ltd
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Priority to CN2011205620500U priority Critical patent/CN202433455U/en
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Publication of CN202433455U publication Critical patent/CN202433455U/en
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Abstract

The utility model discloses a power cycling system of a power device, which is suitable for testing the reliability of power cycling of the power device. A test system comprises a device heating system, a device cooling system, a data collection system and a computer control system. The voltage drop of a tested power device in the small current situation is monitored, and the junction temperature is measured referring to a TSP temperature curve. According to the power cycling system, the times of test cycle can be precisely set, and the temperature can be controlled to a more reasonable range.

Description

The power cycle system of power device
Technical field
The utility model belongs to the reliability consideration field of power device, and a kind of power cycle system of power device is provided, and the utility model all has important effect to the production of power device Life Prediction, power device design and power device.
Background technology
Existing power device caused fault mode in power cycle generally is positioned at the link position of binding line; Be generally that binding line is peeled off and/or the aluminum metallization at chip top is rebuild; In some cases, can also observe the binding line heel and the crack occur, and mechanical effect and hot benefit can constantly cause binding line to be moved; Thereby the initiation crack, final fatigue of materials can cause binding line itself to break down.For this reason, adopt the simulated power cyclic test detection power device of pressing close to actual operating position to seem very necessary, this power cycle test can be made effective assessment to the power cycle ability of power device.
Summary of the invention
The purpose of the utility model provides a kind of power cycle system of power device, makes effective assessment with the power cycle ability to power device.Native system can simulation test power device power cycle number of times in actual use in testing laboratory.
What the utility model will solve is the existing problem that the power cycle ability of power device is lacked a kind of effective evaluating system.
The technical scheme of the utility model is: comprise the device heats system, and the device cooling system, data acquisition system (DAS) and computer control system, computer control system and device heats system, the device cooling system, data acquisition system (DAS) connects.
Described device heats system comprises a programmable current source and a program-controlled voltage source, and programmable current source, program-controlled voltage source and computer control system are connected; Program-controlled voltage source provides the control voltage of measured power device grid emitter-base bandgap grading, makes the measured power device open, and by programmable current source programmable big electric current is provided then, and the measured power device of flowing through makes the measured power device heats.Through the output current and the output time of control programmable current source, reach the function of control measured power device junction temperature.
Described device cooling system comprises cooling-water machine, cold water pipes, solenoid valve and heat exchanger; Cooling-water machine is connected with heat exchanger through cold water pipes, and cold water pipes is provided with solenoid valve, and solenoid valve is connected with computer control system; During test, the measured power device is installed on the heat exchanger, when needing cooling; Cooling-water machine and heat exchanger constitute a water cycle, and the cold water that flows out from cooling-water machine is through over-heat-exchanger, thereby take away the temperature of measured power device; Play the effect of cooling, when the measured power device heats need not be lowered the temperature, solenoid valve was moved; The cold water that cooling-water machine flows out directly sends back to cooling-water machine without heat exchanger through other pipelines again.
Described data acquisition system (DAS) comprises program-controlled voltage table and programmable current source, and the program-controlled voltage table is connected with computer control system with programmable current source; The programmable current source of data acquisition system (DAS) gives the measured power device a logical last little electric current, about about 10mA, through the measurement of program-controlled voltage table to the measured device pressure drop, confirms the junction temperature of measured power device according to TSP responsive to temperature curve.
Computer control system comprises computing machine and the control module of being located in calculating, and the function of computer control system is to accomplish the action of appointment through control module control controlled device heats system, device cooling system and data acquisition system (DAS).Control module comprises Control Software, and described Control Software is a Labview software.
The utility model has the advantages that: the power cycle ability to power device is effectively assessed, and comprising: Automatic Detection and Control maximum junction temperature Tjmax and minimum junction temperature Tjmin.Programming is provided with the cycle index function.Utilize TSP responsive to temperature curve to detect junction temperature, avoided thermopair difference to be installed Influence of Temperature.
Description of drawings
Fig. 1 is the block diagram that concerns of each system of the utility model.
Fig. 2 is the structured flowchart of device heats system.
Fig. 3 is the structured flowchart of device cooling system.
Embodiment:
Below in conjunction with accompanying drawing and specific embodiment the utility model is further described.
As shown in the figure, the utility model comprises device heats system 3, device cooling system 2, and data acquisition system (DAS) 4 and computer control system 1, computer control system 1 and device heats system 3, device cooling system 2, data acquisition system (DAS) 4 connects.
Described device heats system 3 comprises a programmable current source 6 and a program-controlled voltage source 7, and programmable current source 6, program-controlled voltage source 7 and computer control system 1 are connected; Program-controlled voltage source 7 provides the control voltage of measured power device grid emitter-base bandgap grading, makes measured power device 5 open, and by programmable current source 6 programmable big electric current is provided then, and the measured power device 5 of flowing through makes 5 heating of measured power device.Through the output current and the output time of control programmable current source 6, reach the function of control measured power device 5 junction temperatures.
Described device cooling system 2 comprises cooling-water machine 8, cold water pipes 11, cold water pipes 11-1, cold water pipes 11-2, solenoid valve 9, solenoid valve 12 and heat exchanger 10; Cooling-water machine 8 is connected with heat exchanger 10 through cold water pipes 11, cold water pipes 11-1, cold water pipes 11-2, and cold water pipes 11-1 is provided with solenoid valve 9, and cold water pipes 11-2 is provided with solenoid valve 12.Solenoid valve 9, solenoid valve 12 and computer control system 1 are connected.During test, measured power device 5 is installed on the heat exchanger 10, when needing cooling, cooling-water machine 8 constitutes a water cycle with heat exchanger 10, and the cold water that flows out from cooling-water machine 8 is through over-heat-exchanger 10, thereby takes away the temperature of measured power device 5; When 5 heating of measured power device need not lowered the temperature, solenoid valve 12 was opened, and solenoid valve 9 cuts out; Cold water helps the intensification of measured power device 5, when device need cool off without heat exchanger 10 at this moment; Solenoid valve 12 cuts out, and solenoid valve 9 is open-minded, this moment the cold water heat exchanger 10 of flowing through; Can make 5 coolings of measured power device rapidly, improve the efficient of test, reduce the test duration.
Described data acquisition system (DAS) 4 comprises program-controlled voltage table and programmable current source, and the program-controlled voltage table is connected with computer control system 1 with programmable current source; The programmable current source of data acquisition system (DAS) 4 gives the measured power device a logical last little electric current, about about 10mA, through the program-controlled voltage table 5 pressure drops of measured power device is measured, and according to the pressure drop that measures, confirms the junction temperature of measured power device 5.
During test; The output both positive and negative polarity of described data acquisition system (DAS) programmable current source is connected with the collector and emitter of measured power device 5 is corresponding; Data acquisition system (DAS) program-controlled voltage table connects on the measured power device collector and emitter; Detect the voltage of measured power device collector and emitter drain electrode, the voltage transitions that records is become the junction temperature of measured power device 5 by control module.Become the junction temperature of measured power device 5 to adopt TSP responsive to temperature curve the voltage transitions that records by control module.
Computer control system 1 comprises computing machine and the control module of being located in calculating, and the function of computer control system 1 is to accomplish the action of appointment through the controlled device heats system 3 of control module control, device cooling system 2 and data acquisition system (DAS) 4.。Control module comprises Control Software, and described Control Software is that said Control Software is a Labview software.Utilize Labview software programming control device heating system 3, device cooling system 2 and data acquisition system (DAS) 4.
Be connected through any one or a few the combination in GPIB, RS232 and the TTL communication modes between described device heating system 3 and the computer control system 1.
Be connected through any one or a few the combination in GPIB, RS232 and the TTL communication modes between the program-controlled voltage table of described data acquisition system (DAS) 4, programmable current source and the computer control system 1.The programmable current source of said data acquisition system (DAS) 4 is given about the about 10mA of little electric current of measured power device.

Claims (3)

1. the power cycle system of a power device is characterized in that it comprises the device heats system, the device cooling system; Data acquisition system (DAS) and computer control system; Computer control system and device heats system, the device cooling system, data acquisition system (DAS) connects;
Described device heats system comprises a programmable current source and a program-controlled voltage source, and programmable current source, program-controlled voltage source and computer control system are connected;
Described device cooling system comprises cooling-water machine, cold water pipes, solenoid valve and heat exchanger; Cooling-water machine is connected with heat exchanger through cold water pipes, and cold water pipes is provided with solenoid valve, and solenoid valve is connected with computer control system;
Described data acquisition system (DAS) comprises program-controlled voltage table and programmable current source, program-controlled voltage table and programmable current source be connected with computer control system;
Computer control system comprises computing machine and the control module of being located in calculating.
2. the power cycle system of power device according to claim 1 is characterized in that between described device heating system and the computer control system being connected through any one or a few the combination in GPIB, RS232 and the TTL communication modes.
3. the power cycle system of power device according to claim 1 is characterized in that between program-controlled voltage table, programmable current source and the computer control system of described data acquisition system (DAS) being connected through any one or a few the combination in GPIB, RS232 and the TTL communication modes.
CN2011205620500U 2011-12-29 2011-12-29 Power cycling system of power device Expired - Lifetime CN202433455U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2011205620500U CN202433455U (en) 2011-12-29 2011-12-29 Power cycling system of power device

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Application Number Priority Date Filing Date Title
CN2011205620500U CN202433455U (en) 2011-12-29 2011-12-29 Power cycling system of power device

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CN202433455U true CN202433455U (en) 2012-09-12

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CN2011205620500U Expired - Lifetime CN202433455U (en) 2011-12-29 2011-12-29 Power cycling system of power device

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104251965A (en) * 2014-09-24 2014-12-31 河北工业大学 IGBT (insulated gate bipolar transistor) dynamic performance test device and operation method of IGBT dynamic performance test device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104251965A (en) * 2014-09-24 2014-12-31 河北工业大学 IGBT (insulated gate bipolar transistor) dynamic performance test device and operation method of IGBT dynamic performance test device

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Legal Events

Date Code Title Description
C14 Grant of patent or utility model
GR01 Patent grant
TR01 Transfer of patent right

Effective date of registration: 20171227

Address after: Jiaxing City, Zhejiang province 314006 Nanhu District Branch Road No. 988

Patentee after: STARPOWER SEMICONDUCTOR LTD.

Address before: Jiaxing City, Zhejiang province 314000 Jiaxing City Ring Road No. 18 Sidalu (Jiaxing Semiconductor Co.)

Patentee before: Jiaxing Starpower Microelectronics Co., Ltd.

TR01 Transfer of patent right
CX01 Expiry of patent term

Granted publication date: 20120912

CX01 Expiry of patent term