CN202393395U - Durability test device for mileage sensor and revolution speed sensor - Google Patents

Durability test device for mileage sensor and revolution speed sensor Download PDF

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Publication number
CN202393395U
CN202393395U CN 201120480844 CN201120480844U CN202393395U CN 202393395 U CN202393395 U CN 202393395U CN 201120480844 CN201120480844 CN 201120480844 CN 201120480844 U CN201120480844 U CN 201120480844U CN 202393395 U CN202393395 U CN 202393395U
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unit
sensor
support
temperature
speed probe
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CN 201120480844
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谢少伟
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Zhejiang Hydraulic & Hydroelectric Junior School
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Zhejiang Hydraulic & Hydroelectric Junior School
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Abstract

The utility model relates to a durability test device for a mileage sensor and a revolution speed sensor. The durability test device comprises a mounting seat and a chassis, wherein a main control circuit, a temperature measurement and control circuit, a waveform measurement and display circuit and a power supply circuit are arranged in the chassis; a first heating wire, a second heating wire, a first temperature sensor and a second temperature sensor are mounted on the mounting seat; both the mileage sensor and the revolution speed sensor to be tested are mounted on the mounting seat and connected with a motor; the motor is connected with the main control circuit; the first heating wire, the second heating wire, the first temperature sensor and the second temperature sensor are respectively connected with the temperature measurement and control circuit; and both the mileage sensor and the revolution speed sensor are connected with the waveform measurement and display circuit and the main control circuit. The durability test device integrates the functions of high-temperature heating, temperature control, revolution speed control, waveform display, pulse counting and the like, is small in volume and convenient in operation, and can conveniently carry out a durability test on the sensors at high temperature and record the related parameters of the sensors in a timing manner; and the test is comprehensive, and the degrees of automation and intelligence are high.

Description

The durability test device of odometer sensor and speed probe
Technical field
The utility model relates to motive power machine equipments such as motor vehicle, vessel and makes the field, relates in particular to the durability test device of a kind of odometer sensor and speed probe.
Background technology
At present odometer sensor, speed probe are carried out endurancing and generally all rotation speed source, oscillograph, impulse meter, D.C. regulated power supply and high-temperature test chamber are carried out aggregate erection and realize, mainly have following problem:
(1) cost is high, and it is big to take up room, and line is complicated.
(2) endurancing under the high temperature is very inconvenient.Like the hot test of speed probe about 200 ℃; Owing to provide the motor operation at high temperature of rotation speed source can influence the life-span of motor; Therefore must the rotating speed that motor provides be incorporated in the high-temperature test chamber through certain mode (like flexible axle) and approach (high-temperature test chamber punching), very inconvenience.
(3) pulse number of odometer sensor and speed probe output in the time of can't the real time record endurancing also can't the time recording odometer sensor and parameters such as working current, rising and the fall time of speed probe, frequency of operation, voltage magnitude.
(4) can't the real time record odometer sensor and speed probe fault-time of data exceptions such as pulse missing and working current, rising and fall time, frequency of operation, voltage magnitude appears, so when fault occurs, can not carry out sound and light alarm.
Therefore; The durability test device Installation And Test of original odometer sensor and speed probe is all very inconvenient; Robotization, intelligent degree are low; There are a lot of limitation in test, can not reflect the various parameters of odometer sensor and speed probe comprehensively, is unfavorable for the quality of control odometer sensor and speed probe.
Summary of the invention
The durability test device Installation And Test that the utility model mainly solves original odometer sensor and speed probe is all very inconvenient; Volume is big; Robotization, intelligent degree are low; There are a lot of limitation in test, can not reflect the various parameters of odometer sensor and speed probe comprehensively, is unfavorable for the technical matters of the quality of control odometer sensor and speed probe; The durability test device of a kind of odometer sensor and speed probe is provided; Volume is little, and Installation And Test is all very convenient, ability real time record odometer sensor and the various parameters of speed probe; Correlation technique parameter when the real time record sensor breaks down and fault time of occurrence; Test comprehensively, robotization, intelligent degree are high, for the product quality of odometer sensor and speed probe detects and analysis provides great convenience.
The above-mentioned technical matters of the utility model mainly is able to solve through following technical proposals: the utility model comprises cabinet and mount pad; Be provided with main control circuit, Temperature Measure Control circuit, waveform measurement display circuit in the described cabinet and the power circuit of WV is provided for the whole test device; First heater strip, second heater strip, first temperature sensor and second temperature sensor are installed on the described mount pad; Tested odometer sensor, speed probe are installed on the mount pad and link to each other with motor; Described motor links to each other with described main control circuit; Described first heater strip, second heater strip and first temperature sensor, second temperature sensor link to each other with described Temperature Measure Control circuit respectively, and described odometer sensor, speed probe is equal links to each other with described waveform measurement display circuit and main control circuit.By the running speed and the duration of runs of master control circuit controls motor; Odometer sensor, speed probe are gathered mileage number and rotating speed number; Through the waveform display unit can Real Time Observation to the waveform of odometer sensor, output signal of speed sensor, can obtain real-time working current, sensor signal rising and fall time, frequency of operation (cycle) and the voltage magnitude of odometer sensor and speed probe thus.Can also the real time record odometer sensor and correlation technique parameter and the fault time of occurrence of speed probe when breaking down.Can set the high temperature values of endurancing, the break-make electricity of control heater strip through the Temperature Measure Control circuit, realize heating, thereby realize the high temperature durability test sensor through the heating mount pad.The utility model test comprehensively, and is easy to operate, robotization, intelligent degree height.
As preferably; Described main control circuit comprises main central processing unit, main push-button unit, main display unit, electric-motor drive unit and main RS232 interface unit; Main push-button unit, main display unit, electric-motor drive unit and main RS232 interface unit link to each other with described main central processing unit respectively; Described electric-motor drive unit links to each other with described motor again, and described main RS232 interface unit links to each other with described Temperature Measure Control circuit.Through main push-button unit be provided with durability test the high temperature values that will reach and motor speed value, the duration of runs; Watch the situation of setting from main display unit; Main central processing unit is through the processing of internal processes; Send control signal and give electric-motor drive unit, again by the work of electric-motor drive unit drive motor.Main control circuit carries out data communication through main RS232 interface unit and Temperature Measure Control circuit; Main central processing unit flows to the Temperature Measure Control circuit to the high temperature values of setting; The Temperature Measure Control circuit is given main central processing unit the real time temperature value that records, and shows through main display unit again.
As preferably; Described main control circuit comprises the pulse number measuring unit; The photoelectric sensor of tested odometer sensor, speed probe and conduct comparison standard links to each other with the pulse number measuring unit respectively, and the pulse number measuring unit links to each other with described main central processing unit again.Through the output pulse number of pulse number measuring unit measurement odometer sensor, speed probe and photoelectric sensor,, send main display unit to show again through the processing of main central processing unit.
As preferably; Described Temperature Measure Control circuit comprises first CPU, the first data amplifying unit, the second data amplifying unit, first temperature conditioning unit, second temperature conditioning unit and a RS232 interface unit; The first data amplifying unit, the second data amplifying unit, first temperature conditioning unit, second temperature conditioning unit and a RS232 interface unit link to each other with described first CPU respectively; The input end of the first data amplifying unit links to each other with the output terminal of described first temperature sensor; First temperature conditioning unit is connected in the supply line of described first heater strip; The input end of the second data amplifying unit links to each other with the output terminal of described second temperature sensor; Second temperature conditioning unit is connected in the supply line of described second heater strip, and a RS232 interface unit links to each other with described main control circuit.The temperature data that temperature sensor collects is given first CPU after the data amplifying unit is handled; Processing through the first CPU internal processes; Compare with the high temperature values of setting; Send control signal and give temperature conditioning unit, by the break-make electricity of temperature conditioning unit control heater strip, two tunnel temperature heating control systems of odometer sensor and speed probe can carry out temperature setting and control respectively again.Temperature controlling adopts pid control mode.The Temperature Measure Control circuit carries out data communication through a RS232 interface unit and main control circuit.
As preferably; Described waveform measurement display circuit comprises input signal conditioning unit, time-based unit, AD conversion unit, buffer storage unit, second CPU, second push-button unit and waveform display unit; Described odometer sensor, speed probe link to each other with the input signal conditioning unit respectively; Input signal conditioning unit, time-based unit link to each other with described AD conversion unit respectively again; AD conversion unit links to each other with described buffer storage unit again, and input signal conditioning unit, time-based unit, AD conversion unit, buffer storage unit, second push-button unit and waveform display unit link to each other with described second CPU respectively again.Odometer sensor, output signal of speed sensor are nursed one's health through the input signal conditioning unit, convert digital signal to through AD conversion unit again, through the processing of buffer storage unit, give second CPU at last again.Watch the mode and the state of waveform through the second push-button unit setting.By of the processing of second CPU, again signal is delivered to the waveform display unit and show through internal processes.Through the waveform display unit can Real Time Observation to the waveform of odometer sensor, output signal of speed sensor, can obtain real-time working current, sensor signal rising and fall time, frequency of operation (cycle) and the voltage magnitude of odometer sensor and speed probe thus.
As preferably; Described mount pad comprises the 4th support of first support, second support, the 3rd support, built-in bearing and the 5th support of built-in bearing; First support, the 4th support, the 5th support and the 3rd support form a line successively; Described odometer sensor, second heater strip and second temperature sensor are installed on first support; Described motor is installed on the 3rd support, is provided with a gear between the 4th support and the 5th support, and odometer sensor links to each other with described gear through first shaft coupling, the 4th support; Gear links to each other with motor through the 5th support, second shaft coupling again, other photoelectric coded disk and the photoelectric sensor of being equipped with of described the 5th support; Described second support is positioned at the next door of gear, and described speed probe, first heater strip and first temperature sensor are installed on second support, and the position of speed probe is corresponding with gear.The rotation of motor drives odometer sensor, gear and photoelectric coding disc spins; Can carry out endurancing to odometer sensor and speed probe simultaneously, and can measure the revolution and the rotating speed of odometer sensor, speed probe actual motion through photoelectric coded disk and photoelectric sensor.Simple in structure, easy for installation.
As preferably; Described second support is the panel that piece is inverted T shape; Panel is provided with sensor mounting hole, temperature sensor mounting hole and heater strip mounting hole; The sensor mounting hole is by the horizontal direction setting and perpendicular to the plate face of panel, and the temperature sensor mounting hole leaves in the side of panel and with the sensor mounting hole and is communicated with, and the heater strip mounting hole is opened bottom in the end face of panel and heater strip mounting hole near the sensor mounting hole; Described speed probe is installed in the sensor mounting hole; Described first heater strip is installed in the heater strip mounting hole, and described first temperature sensor is installed in the temperature sensor mounting hole, and the bottom of described panel is provided with the support mounting hole; The structure of described first support is identical with the structure of second support.First heater strip heats second support, and second heater strip heats first support, realizes the heat temperature raising to odometer sensor, speed probe, thereby realizes the high temperature durability test of odometer sensor and speed probe.First temperature sensor is gathered the temperature of speed probe in real time, and second temperature sensor is gathered the temperature of odometer sensor in real time.Do not need the used high-temperature test chamber of traditional test, simple in structure, easy to operate.
The beneficial effect of the utility model is: integrate functions such as heat, temperature control, rotating speed control, waveform demonstration and step-by-step counting; Have characteristics such as volume is little, easy to operate; Can conveniently carry out the endurancing of high temperature lower sensor, the output pulse number of ability real time record odometer sensor and speed probe, the correlation technique parameter when time when the correlation technique parameter of time recording odometer sensor and speed probe and sensor break down and fault; But various data power down are preserved; Test comprehensively, robotization, intelligent degree are high, for the product quality of odometer sensor and speed probe detects and analysis provides great convenience.
Description of drawings
Fig. 1 is a kind of circuit theory syndeton block diagram of the utility model.
Fig. 2 is a kind of circuit theory syndeton block diagram of main control circuit in the utility model.
Fig. 3 is a kind of circuit theory syndeton block diagram of Temperature Measure Control circuit in the utility model.
Fig. 4 is a kind of circuit theory syndeton block diagram of waveform measurement display circuit in the utility model.
Fig. 5 is a kind of decomposition texture synoptic diagram of overlooking of the installation relation of odometer sensor in the utility model, speed probe and motor.
Fig. 6 is a kind of main TV structure synoptic diagram of second support in the utility model.
Embodiment
Pass through embodiment below, and combine accompanying drawing, do further bright specifically the technical scheme of the utility model.
Embodiment: the odometer sensor of present embodiment and the durability test device of speed probe comprise cabinet 8 and mount pad.As shown in Figure 1, main control circuit 1, Temperature Measure Control circuit 2, waveform measurement display circuit 3 are installed in the cabinet 8 and the power circuit 4 of WV is provided for the whole test device.As shown in Figure 5; Mount pad comprises first support 41, second support 42, the 3rd support 43 and the 4th support 46 of built-in bearing and the 5th support 47 of built-in bearing; First support 41, the 4th support 46, the 5th support 47 and the 3rd support 43 form a line successively; Tested odometer sensor 9, second heater strip 25 and second temperature sensor 26 are installed on first support 41; Be equipped with on the 3rd support 43 between motor 7, the four supports 46 and the 5th support 47 gear 44 is installed, odometer sensor 9 links to each other with gear 44 through first shaft coupling 45, the 4th support 46; Gear 44 links to each other with motor 7 through the 5th support 47, second shaft coupling 48 again, by the 5th support 47 photoelectric coded disk and photoelectric sensors 17 is installed.Second support 42 is positioned at the next door of gear 44; As shown in Figure 6; Second support 42 is panels 422 that piece is inverted T shape; Two support mounting holes 426 are arranged at the bottom of panel 422, through being screwed into screw at two support mounting holes 426 second support 42 are fixed on the testing table, have speed probe mounting hole 423, temperature sensor mounting hole 424 and heater strip mounting hole 425 on the panel 422; Speed probe mounting hole 423 is by the horizontal direction setting and perpendicular to the plate face of panel 422; Temperature sensor mounting hole 424 leaves in the side of panel 422 and is communicated with sensor mounting hole 423, and heater strip mounting hole 425 is opened bottom in the end face of panel 422 and heater strip mounting hole 425 near sensor mounting hole 423, and tested speed probe 10 is installed in the speed probe mounting hole 423; First heater strip 5 is installed in the heater strip mounting hole 425, first temperature sensor 6 is installed in the temperature sensor mounting hole 424.The structure of first support 41 is identical with the structure of second support 42, this no longer stating, second heater strip 25, second temperature sensor 26 and tested odometer sensor 9 is installed on first support 41 more.As shown in Figure 1; The output signal of main control circuit 1 links to each other with motor 7 through lead; Main control circuit 1 links to each other with Temperature Measure Control circuit 2 through lead again; Realize data communication between the two, Temperature Measure Control circuit 2 links to each other with second temperature sensor 26 with first heater strip 5, second heater strip 25, first temperature sensor 6 respectively through lead, and odometer sensor 9, speed probe 10 pass through lead respectively and link to each other with waveform measurement display circuit 3 and governor circuit 1.
As shown in Figure 2, main control circuit 1 comprises main central processing unit 11, main push-button unit 12, main display unit 13, electric-motor drive unit 14, pulse number measuring unit 16 and main RS232 interface unit 15.Main push-button unit 12, main display unit 13, electric-motor drive unit 14, pulse number measuring unit 16 link to each other with main central processing unit 11 respectively with main RS232 interface unit 15; Electric-motor drive unit 14 links to each other with motor 7 through lead again; Pulse number measuring unit 16 links to each other with tested odometer sensor 9, speed probe 10 and photoelectric sensor 17 respectively through lead; Main push-button unit 12 all is inlaid on the cabinet 8 with main display unit 13, and main display unit 13 adopts LCDs.
As shown in Figure 3; Temperature Measure Control circuit 2 comprises first CPU 21, the first data amplifying unit 22, the second data amplifying unit 28, first temperature conditioning unit 23, second temperature conditioning unit 27 and a RS232 interface unit 24; The first data amplifying unit 22, the second data amplifying unit 28, first temperature conditioning unit 23, second temperature conditioning unit 27 link to each other with first CPU 21 respectively with a RS232 interface unit 24; The input end of the first data amplifying unit 22 links to each other with the signal output part of first temperature sensor 6 on being installed in second support 42 through lead; First temperature conditioning unit 23 is wired in the supply line of first heater strip 5; The input end of the second data amplifying unit 28 links to each other with the signal output part of second temperature sensor 26 on being installed in first support 41 through lead, and second temperature conditioning unit 27 is wired in the supply line of second heater strip 25.In the present embodiment; First temperature conditioning unit 23, second temperature conditioning unit 27 adopt controllable silicons; First temperature sensor 6, second temperature sensor 26 adopt platinum resistance thermometer sensor,s, and a RS232 interface unit 24 links to each other with main RS232 interface unit 15 in the main control circuit 1 through lead.
As shown in Figure 4; Waveform measurement display circuit 3 comprises input signal conditioning unit 31, time-based unit 32, AD conversion unit 33, buffer storage unit 34, second CPU 35, second push-button unit 36 and waveform display unit 37; Tested odometer sensor 9, the signal output part of speed probe 10 link to each other with input signal conditioning unit 31 respectively; Input signal conditioning unit 31, time-based unit 32 link to each other with the input end of AD conversion unit 33 respectively again, and the output terminal of AD conversion unit 33 links to each other with second CPU 35 through buffer storage unit 34.Input signal conditioning unit 31, time-based unit 32, AD conversion unit 33, second push-button unit 36, waveform display unit 37 link to each other with second CPU 35 respectively, and second push-button unit 36 all is inlaid on the cabinet 8 with waveform display unit 37.
The course of work: open the power supply on the cabinet; Through main push-button unit be provided with durability test the high temperature values that will reach and motor speed value, the duration of runs; Watch the situation of setting from main display unit, watch the state of waveform through the second push-button unit setting from the waveform display unit.Main central processing unit is through the running of electric-motor drive unit control motor, and the tested odometer sensor of driven by motor, speed probe rotate, thereby carry out the endurancing of odometer sensor and speed probe.At this moment; Through the waveform display unit on the cabinet can Real Time Observation to the waveform of odometer sensor, output signal of speed sensor; Can obtain signal rising and fall time, frequency of operation (cycle) and the voltage magnitude of odometer sensor and speed probe thus; Through the main display unit on the cabinet can Real Time Observation to the output pulse number of odometer sensor and speed probe, the while can be exported pulse number with photoelectric sensor and compared.
First temperature sensor is gathered the temperature of speed probe; Giving main display unit through the RS232 interface with the real time temperature value on the one hand shows; By first CPU real time temperature value and setting high temperature values are compared on the other hand, if the real time temperature value is lower than the setting high temperature values, then first CPU is sent signal enabling first temperature conditioning unit; Connect the supply line of first heater strip, first heater strip begins heating.When the real time temperature value that records arrived the setting high temperature values, then first CPU was sent signal and is given first temperature conditioning unit, and the supply line of turn-offing first heater strip makes first heater strip stop heating.Second temperature sensor is gathered the temperature of odometer sensor and is given first CPU; Control the break-make of second heater strip through second temperature conditioning unit; The temperature control principle is identical with speed probe, and two tunnel temperature heating control systems of odometer sensor, speed probe can carry out temperature setting and control respectively.Temperature control also can adopt the mode of PID to control to improve temperature-controlled precision.Under the condition of high temperature, can obtain the various parameters of tested odometer sensor and speed probe from main display unit, waveform display unit, realize the high temperature durability test of odometer sensor and speed probe thus.
The main central processing unit that is described in the present technique scheme, first CPU and second CPU generally adopt SCM system to realize; Be that the whole test device has adopted three SCM systems, but in fact the whole test device also can use following three kinds of modes to realize:
(1) SCM system (employing bus mastering mode);
(2) single-chip microcomputer+FPGA (PLD) system, FPGA are mainly used in and realize oscillographic data acquisition, and performance is handled more excellent than single-chip microcomputer;
(3) SOPC mode: SOPC is a programmable system on chip, and inside comprises two systems of single-chip microcomputer+FPGA, is actually " single-chip microcomputer+FPGA " system of monolithic.
When adopting above-mentioned three kinds of modes to realize, main display unit 13 can be combined into a display unit with waveform display unit 37, and the main push-button unit 12 and second push-button unit 36 can be combined into a push-button unit, and other control corresponding circuit also can be integrated.

Claims (7)

1. the durability test device of odometer sensor and speed probe; It is characterized in that comprising cabinet (8) and mount pad; Be provided with main control circuit (1), Temperature Measure Control circuit (2), waveform measurement display circuit (3) in the described cabinet (8) and the power circuit (4) of WV is provided for the whole test device; First heater strip (5), second heater strip (25) and first temperature sensor (6), second temperature sensor (26) are installed on the described mount pad; Tested odometer sensor (9), speed probe (10), be installed on the mount pad and link to each other with motor (7); Described motor (7) links to each other with described main control circuit (1); Described first heater strip (5), second heater strip (25) and first temperature sensor (6), second temperature sensor (26) link to each other with described Temperature Measure Control circuit (2) respectively, and described odometer sensor (9), speed probe (10) all link to each other with described waveform measurement display circuit (3) and main control circuit (1).
2. the durability test device of odometer sensor according to claim 1 and speed probe; It is characterized in that described main control circuit (1) comprises main central processing unit (11), main push-button unit (12), main display unit (13), electric-motor drive unit (14) and main RS232 interface unit (15); Main push-button unit (12), main display unit (13), electric-motor drive unit (14) and main RS232 interface unit (15) link to each other with described main central processing unit (11) respectively; Described electric-motor drive unit (14) links to each other with described motor (7) again, and described main RS232 interface unit (15) links to each other with described Temperature Measure Control circuit (2).
3. the durability test device of odometer sensor according to claim 2 and speed probe; It is characterized in that described main control circuit (1) comprises pulse number measuring unit (16); Tested odometer sensor (9), speed probe (10) and photoelectric sensor (17) link to each other with pulse number measuring unit (16) respectively, and pulse number is measured (16) unit and linked to each other with described main central processing unit (11).
4. according to the durability test device of claim 1 or 2 or 3 described odometer sensors and speed probe; It is characterized in that described Temperature Measure Control circuit (2) comprises first CPU (21), the first data amplifying unit (22), the second data amplifying unit (28), first temperature conditioning unit (23), second temperature conditioning unit (27) and a RS232 interface unit (24); The first data amplifying unit (22), the second data amplifying unit (28), first temperature conditioning unit (23), second temperature conditioning unit (27) and a RS232 interface unit (24) link to each other with described first CPU (21) respectively; The input end of the first data amplifying unit (22) links to each other with the output terminal of described first temperature sensor (6); First temperature conditioning unit (23) is connected in the supply line of described first heater strip (5); The input end of the second data amplifying unit (28) links to each other with the output terminal of described second temperature sensor (26); Second temperature conditioning unit (27) is connected in the supply line of described second heater strip (25), and a RS232 interface unit (24) links to each other with described main control circuit (1).
5. the durability test device of odometer sensor according to claim 1 and speed probe; It is characterized in that described waveform measurement display circuit (3) comprises input signal conditioning unit (31), time-based unit (32), AD conversion unit (33), buffer storage unit (34), second CPU (35), second push-button unit (36) and waveform display unit (37); Described odometer sensor (9), speed probe (10) link to each other with input signal conditioning unit (31) respectively; Input signal conditioning unit (31), time-based unit (32) link to each other with described AD conversion unit (33) respectively again; AD conversion unit (33) links to each other with described buffer storage unit (34) again, and input signal conditioning unit (31), time-based unit (32), AD conversion unit (33), buffer storage unit (34), second push-button unit (36) and waveform display unit (37) link to each other with described second CPU (35) respectively again.
6. according to the durability test device of claim 1 or 2 or 3 or 5 described odometer sensors and speed probe; It is characterized in that described mount pad comprises the 4th support (46) of first support (41), second support (42), the 3rd support (43), built-in bearing and the 5th support (47) of built-in bearing; First support (41), the 4th support (46), the 5th support (47) and the 3rd support (43) form a line successively; Described odometer sensor (9), second heater strip (25) and second temperature sensor (26) are installed on first support (41); Described motor (7) is installed on the 3rd support (43); Be provided with a gear (44) between the 4th support (46) and the 5th support (47); Odometer sensor (9) links to each other with described gear (44) through first shaft coupling (45), the 4th support (46); Gear (44) links to each other with motor (7) through the 5th support (47), second shaft coupling (48) again, other photoelectric coded disk and the photoelectric sensor (17) of being equipped with of described the 5th support (47); Described second support (42) is positioned at the next door of gear (44); Described speed probe (10), first heater strip (5) and first temperature sensor (6) are installed on second support (42), and the position of speed probe (10) is corresponding with gear (44).
7. the durability test device of odometer sensor according to claim 6 and speed probe; It is characterized in that described second support (42) is the panel (422) that piece is inverted T shape; Panel (422) is provided with sensor mounting hole (423), temperature sensor mounting hole (424) and heater strip mounting hole (425); Sensor mounting hole (423) is by the horizontal direction setting and perpendicular to the plate face of panel (422); Temperature sensor mounting hole (424) leaves in the side of panel (422) and with sensor mounting hole (423) and is communicated with; Heater strip mounting hole (425) is opened bottom in the end face of panel (422) and heater strip mounting hole (425) near sensor mounting hole (423); Described speed probe (10) is installed in the sensor mounting hole (423); Described first heater strip (5) is installed in the heater strip mounting hole (425), and described first temperature sensor (6) is installed in the temperature sensor mounting hole (424), and the bottom of described panel (422) is provided with support mounting hole (426); The structure of described first support (41) is identical with the structure of second support (42).
CN 201120480844 2011-11-28 2011-11-28 Durability test device for mileage sensor and revolution speed sensor Expired - Fee Related CN202393395U (en)

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CN 201120480844 CN202393395U (en) 2011-11-28 2011-11-28 Durability test device for mileage sensor and revolution speed sensor

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Application Number Priority Date Filing Date Title
CN 201120480844 CN202393395U (en) 2011-11-28 2011-11-28 Durability test device for mileage sensor and revolution speed sensor

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108508236A (en) * 2018-04-11 2018-09-07 航天科技控股集团股份有限公司 Automatic detection device for sensor endurance test

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108508236A (en) * 2018-04-11 2018-09-07 航天科技控股集团股份有限公司 Automatic detection device for sensor endurance test

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