CN202309648U - Automatic testing circuit for low power elements - Google Patents
Automatic testing circuit for low power elements Download PDFInfo
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- CN202309648U CN202309648U CN2011203817355U CN201120381735U CN202309648U CN 202309648 U CN202309648 U CN 202309648U CN 2011203817355 U CN2011203817355 U CN 2011203817355U CN 201120381735 U CN201120381735 U CN 201120381735U CN 202309648 U CN202309648 U CN 202309648U
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- low power
- automatic testing
- power element
- testing circuit
- reference voltage
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Abstract
The utility model discloses an automatic testing circuit for low power elements. The automatic testing circuit comprises a hex inverting Schmitt trigger, a transistor, a feedback resistor and a resistor-capacitor (RC) oscillating circuit, wherein the hex inverting Schmitt trigger is provided with a reference voltage pin, a first input pin, second input pins and an output pin; the reference voltage pin is connected with a reference voltage; the output pin outputs square waves; the transistor is provided with a source electrode, a grid electrode and a drain electrode; the source electrode is connected with the reference voltage; the drain electrode outputs a control current; a first terminal of the feedback resistor is connected with the output pin of the hex inverting Schmitt trigger, and a second terminal of the feedback resistor is connected with the grid electrode of the transistor; the RC oscillating circuit comprises an oscillating resistor and an oscillating capacitor; one terminal of the oscillating resistor is connected with the first input pin of the hex inverting Schmitt trigger, and the other terminal of the oscillating resistor is connected with the second terminal of the feedback resistor; and one terminal of the oscillating capacitor is connected with the second input pins of the hex inverting Schmitt trigger, and the other terminal of the oscillating capacitor is connected with the second terminal of the feedback resistor. Therefore, the low power elements can be tested by utilizing elements on a waste computer main board.
Description
[technical field]
The utility model relates to a kind of automatic testing circuit, particularly relates to a kind of low power element automatic testing circuit.
[background technology]
Along with the development of science and technology progress, electronic product more and more widely be applied to family and office occasion, especially personal desktop computer and notebook computer, become necessary tool in the people life especially.
For the computer main board of scrapping, element provided thereon can not be utilized sometimes preferably.For example be 74AHC14 (hex inverting schmitt trigger; Hexagonal anti-phase Schmidt trigger), after scrapping, it can not be used appropriately.
On the other hand, for the test of low power element, the for example test of LED (light-emitting diode) and buzzer sometimes can be controlled its switching time.At present more for adopting integrated circuits such as relay or 555IC to reach.Yet, buy these electronic components and need spend cost again.
In view of this, be necessary to develop a kind of low power element automatic testing circuit in fact, to address the above problem.
[summary of the invention]
Therefore, the purpose of the utility model provides a kind of low power element automatic testing circuit, can reach scrapping the utilization of mainboard element on the one hand, can reach test request on the other hand.
In order to achieve the above object, the low power element automatic testing circuit that the utility model provides, said automatic testing circuit comprises:
Hexagonal anti-phase Schmidt trigger, it has reference voltage pin, first input pin, second input pin, output pin, and said reference voltage pin connects reference voltage, said output pin output rectangular wave;
Transistor, it has source electrode, grid and drain electrode, and said source electrode connects reference voltage, said drain electrode output Control current;
Feedback resistance, the output pin of the said hexagonal anti-phase of its first termination Schmidt trigger, the said transistorized grid of second termination;
The RC oscillating circuit; It comprises oscillation resistance and oscillating capacitance; First input pin of the said hexagonal anti-phase of said oscillation resistance one termination Schmidt trigger, second end of the said feedback resistance of another termination, second input pin of the said hexagonal anti-phase of said oscillating capacitance one termination Schmidt trigger, second end of the said feedback resistance of another termination.
Optional, said automatic testing circuit also comprises power supply adaptor and dropping resistor, the voltage that said power supply adaptor produces through said dropping resistor step-down after the said reference voltage of generation.
Optional, said automatic testing circuit also comprises DC power supply, in order to reference voltage to be provided.
Optional, said dropping resistor is a cement resistor.
Optional, said dropping resistor is an adjustable resistance.
Optional, said oscillation resistance is an adjustable resistance.
Optional, said hexagonal anti-phase Schmidt trigger comprises 2 second input pins, this 2 second input pin is interconnected mutually.
Optional, said automatic testing circuit also comprises low power element, said low power element one end connects said transistor drain, other end ground connection.
Optional, said low power element is light-emitting diode or buzzer.
Optional, said low power element is several, parallel connection between each low power element.
Compared to prior art; The low power element automatic testing circuit of the utility model; Can utilize the hexagonal anti-phase Schmidt trigger on the discarded computer main board; Produce the wave of oscillation through said first input pin and said second input pin, the said reference voltage of the said wave of oscillation and the reception of said reference voltage pin is done comparison, produce a rectangular wave; Said rectangular wave as said transistorized grid voltage, and then is produced the Control current with driving force, the switch of control low power element, and then low power element tested.
[description of drawings]
Fig. 1 illustrates the electrical block diagram into low power element automatic testing circuit one preferred embodiment of the utility model.
Fig. 2 illustrates the voltage oscillation ripple oscillogram into the RC oscillating circuit generation of low power element automatic testing circuit one preferred embodiment of the utility model.
Fig. 3 illustrates the output voltage rectangular wave oscillogram into the hexagonal anti-phase Schmidt trigger of low power element automatic testing circuit one preferred embodiment of the utility model.
[embodiment]
See also Fig. 1, Fig. 1 illustrates the electrical block diagram into low power element automatic testing circuit one preferred embodiment of the utility model.
In order to achieve the above object, the low power element automatic testing circuit that the utility model provides, said automatic testing circuit comprises:
Hexagonal anti-phase Schmidt trigger 1 (74AHC14); It has reference voltage pin 10, first input pin 11, second input pin 12 (in present embodiment; Said hexagonal anti-phase Schmidt trigger 1 comprises 2 second input pins 12; This 2 second input pin 12 is interconnected mutually), output pin 13, said reference voltage pin 10 connects reference voltage, said output pin 13 output rectangular waves;
Transistor 2, it has source electrode 20, grid 21 and drains 22, and said source electrode 20 connects reference voltage, said drain electrode 22 output Control current;
RC oscillating circuit 3; It comprises oscillation resistance 30 and oscillating capacitance 31; First input pin 11 of the said hexagonal anti-phase of said oscillation resistance 30 1 terminations Schmidt trigger 1, second end of the said feedback resistance 14 of another termination, second input pin 12 of the said hexagonal anti-phase of said oscillating capacitance 31 1 terminations Schmidt trigger 1, second end of the said feedback resistance 14 of another termination.
Please consult Fig. 2, Fig. 3 more jointly, Fig. 2 illustrates voltage oscillation ripple oscillogram, Fig. 3 of producing for the RC oscillating circuit of low power element automatic testing circuit one preferred embodiment of the utility model and illustrates the output voltage rectangular wave oscillogram into the hexagonal anti-phase Schmidt trigger of low power element automatic testing circuit one preferred embodiment of the utility model.
It is thus clear that; Utilize the low power element automatic testing circuit of the utility model; Can utilize the hexagonal anti-phase Schmidt trigger 1 on the discarded computer main board; Produce the wave of oscillation (as shown in Figure 2) through said first input pin 11 and said second input pin 12, the said reference voltage of the said wave of oscillation and 10 receptions of said reference voltage pin is done comparison, produce a rectangular wave; With the grid voltage of said rectangular wave, and then produce Control current, control the switch of low power element 4, and then low power element 4 is tested, and can reach control switching time with driving force as said transistor 2.
In present embodiment, said automatic testing circuit also comprises power supply adaptor 5 and dropping resistor 6, the voltage that said power supply adaptor 5 produces through said dropping resistor 6 step-downs after the said reference voltage of generation.Certainly, said automatic testing circuit also can provide reference voltage for comprising DC power supply, but the common volume of DC power supply is too big, uses inconvenient.
In present embodiment, said dropping resistor 6 is a cement resistor, because cement resistor has higher rated power, thereby can satisfy higher power requirement.
Wherein, Said dropping resistor 6 can be adjustable resistance, and then can reach the adjusting to the reference voltage of hexagonal anti-phase Schmidt trigger 1 (74AHC14) input through to its adjusting; And then the rectangular wave high-low level of control output accounts for wide ratio, reaches the control of switching time.
Wherein, said oscillation resistance 30 also can be adjustable resistance, and reaching the adjusting to the amplitude of said vibration wave, and then the rectangular wave high-low level of control output accounts for wide ratio, reaches the control of switching time.
Wherein, said automatic testing circuit also comprises low power element 4, and said low power element one end connects the drain electrode 22 of said transistor 2, other end ground connection.
Wherein, said low power element 4 can be light-emitting diode or buzzer, and said low power element 4 can be several, 4 parallel connections of each low power element.Here, the output current of said transistor 2 is 0.2 peace, and it is that 20 milliamperes light-emitting diode is tested that said automatic testing circuit should be the operating current that comprises 10 parallel connections mutually; Certainly, said automatic testing circuit also can be for being that 50 milliamperes buzzer is tested to the operating current that comprises 4 parallel connections.
Claims (10)
1. a low power element automatic testing circuit is characterized in that, said automatic testing circuit comprises:
Hexagonal anti-phase Schmidt trigger, it has reference voltage pin, first input pin, second input pin, output pin, and said reference voltage pin connects reference voltage, said output pin output rectangular wave;
Transistor, it has source electrode, grid and drain electrode, and said source electrode connects reference voltage, said drain electrode output Control current;
Feedback resistance, the output pin of the said hexagonal anti-phase of its first termination Schmidt trigger, the said transistorized grid of second termination;
The RC oscillating circuit; It comprises oscillation resistance and oscillating capacitance; First input pin of the said hexagonal anti-phase of said oscillation resistance one termination Schmidt trigger, second end of the said feedback resistance of another termination, second input pin of the said hexagonal anti-phase of said oscillating capacitance one termination Schmidt trigger, second end of the said feedback resistance of another termination.
2. low power element automatic testing circuit as claimed in claim 1; It is characterized in that; Said automatic testing circuit also comprises power supply adaptor and dropping resistor, the voltage that said power supply adaptor produces through said dropping resistor step-down after the said reference voltage of generation.
3. low power element automatic testing circuit as claimed in claim 1 is characterized in that said automatic testing circuit also comprises DC power supply, in order to reference voltage to be provided.
4. like claim 1 or 2 or 3 described low power element automatic testing circuits, it is characterized in that said dropping resistor is a cement resistor.
5. like claim 1 or 2 or 3 described low power element automatic testing circuits, it is characterized in that said dropping resistor is an adjustable resistance.
6. like claim 1 or 2 or 3 described low power element automatic testing circuits, it is characterized in that said oscillation resistance is an adjustable resistance.
7. like claim 1 or 2 or 3 described low power element automatic testing circuits, it is characterized in that said hexagonal anti-phase Schmidt trigger comprises 2 second input pins, this 2 second input pin is interconnected mutually.
8. like claim 1 or 2 or 3 described low power element automatic testing circuits, it is characterized in that said low power element automatic testing circuit also comprises low power element, said low power element one end connects said transistor drain, other end ground connection.
9. low power element automatic testing circuit as claimed in claim 8 is characterized in that, said low power element is light-emitting diode or buzzer.
10. low power element automatic testing circuit as claimed in claim 8 is characterized in that, said low power element is several, parallel connection between each low power element.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011203817355U CN202309648U (en) | 2011-10-10 | 2011-10-10 | Automatic testing circuit for low power elements |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011203817355U CN202309648U (en) | 2011-10-10 | 2011-10-10 | Automatic testing circuit for low power elements |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202309648U true CN202309648U (en) | 2012-07-04 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2011203817355U Expired - Fee Related CN202309648U (en) | 2011-10-10 | 2011-10-10 | Automatic testing circuit for low power elements |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN202309648U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103036532A (en) * | 2011-10-10 | 2013-04-10 | 神讯电脑(昆山)有限公司 | Underpower component automatic test circuit |
-
2011
- 2011-10-10 CN CN2011203817355U patent/CN202309648U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103036532A (en) * | 2011-10-10 | 2013-04-10 | 神讯电脑(昆山)有限公司 | Underpower component automatic test circuit |
| CN103036532B (en) * | 2011-10-10 | 2016-10-12 | 神讯电脑(昆山)有限公司 | Automatic testing circuit for low power elements |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20120704 Termination date: 20161010 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |