CN202305597U - Contact resistivity measuring device for crystalline silicon solar cell - Google Patents
Contact resistivity measuring device for crystalline silicon solar cell Download PDFInfo
- Publication number
- CN202305597U CN202305597U CN201120039144XU CN201120039144U CN202305597U CN 202305597 U CN202305597 U CN 202305597U CN 201120039144X U CN201120039144X U CN 201120039144XU CN 201120039144 U CN201120039144 U CN 201120039144U CN 202305597 U CN202305597 U CN 202305597U
- Authority
- CN
- China
- Prior art keywords
- probe
- solar cell
- silicon solar
- sample stage
- contact resistivity
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Landscapes
- Measurement Of Resistance Or Impedance (AREA)
Abstract
The utility model discloses a contact resistivity measuring device for a crystalline silicon solar cell. The device comprises a sample bench, a transverse adjusting system, a vertical adjusting plate, a probe mounting plate and a locking system. The device is characterized in that the probe mounting plate is provided with probe holes that are arranged in a longitudinal manner; probes are arranged in the probe holes; and the probe mounting plate is fixed by the locking system and is connected with the sample bench via the transverse adjusting system and the vertical adjusting plate. The device has unique functions, and a cell sheet needs not to be moved during measuring. The probe mounting plate can be moved to any position of the sample bench through adjustment of a transverse adjusting rod and the vertical adjusting plate, and then the probe mounting plate is locked by the locking system. Therefore, any position of a sample can be measured, and stability and accuracy of the measurement are guaranteed.
Description
Technical field
The utility model relates to the solar cell technical field of measurement and test, is specifically related to a kind of crystal-silicon solar cell contact resistivity measurement mechanism.
Background technology
Over past ten years, global solar cell output is to surpass 40% speed increment every year on average, and wherein crystal-silicon solar cell accounts for 80% of solar cell total amount.When reducing cost, the photoelectric transformation efficiency that how to improve solar cell is the focus that people study always.The quality of crystalline silicon solar battery electrode is very big to the electric property influence of battery, and wherein contact resistivity is an electrode quality whether important indicator.The size of contact resistivity is not only relevant with the diffusion technique and the surface metal metallization processes of battery production, and also relevant with the figure of electrode contact, the Ohmic contact quality of different grid line figures can characterize through contact resistivity.
At present, the device of measurement contact resistivity mainly contains transmission line (TLM) device and Corescan device.The battery sheet surface that the requirement of transmission line proving installation is tested has the grid line of unequal-interval, and the printing screen plate of common production usefulness all is unified equidistance.Therefore, need when adopting this measurement device to make half tone separately, produce battery again, this has not only increased the complicacy of test, and concerning commercial production, the inconsistent meeting of half tone figure causes measuring error to increase.And use Corescan device measuring contact resistivity, and need to adopt exclusive testing tool, can use the battery built-in testing of common process, but the probe of instrument need scratch the SiNx layer of battery surface, sample is produced the damage that can not restore; In addition, the price of this equipment is too high, and probe because of with the scraped finish of battery sheet, be easy to damage, make that the measurement cost of contact resistivity is higher.
Summary of the invention
The purpose of the utility model is; Problem to the prior art existence; Design a kind of crystal-silicon solar cell contact resistivity measurement mechanism simple in structure, multiple functional and easy and simple to handle; This device can directly adopt the crystal-silicon solar cell of ordinary student production. art completion as sample, need not to make sample with special process, has reduced the measurement cost.
The utility model provides following solution: a kind of crystal-silicon solar cell contact resistivity measurement mechanism; Comprise sample stage, lateral adjustments system, vertical adjustable plate, probe installing plate and fastening system; It is characterized in that: the probe installing plate is provided with probe aperture, and probe aperture is vertical arrangement, and probe is installed on probe aperture; The probe installing plate is fixed through fastening system, and is connected with sample stage with vertical adjustable plate through the lateral adjustments system.
Described sample stage is provided with pore, and pore is vertical arrangement, and every vent port is communicated with the interior independent tracheae of sample, and is connected with the air pipe interface that is provided with in the sample stage side.
Described lateral adjustments system is made up of adjuster bar, slide rail and three parts of travelling carriage, and adjuster bar is fixed on opposite side, travelling carriage two that sample stage one side, slide rail be fixed on sample stage and is connected with slide rail with adjuster bar respectively.
Described adjuster bar can be surperficial threaded round bar, can make its rotation through one turn knob, reaches the purpose that laterally moves; Adjuster bar also can be the bar of level and smooth arbitrary shape, and travelling carriage two connects adjuster bar and slide rail respectively, and can laterally move, and moves to desired area and fixes with knob.
Described vertical adjustable plate is positioned over travelling carriage top, and can vertically move along flight, move to desired area after, vertically lock itself and travelling carriage through screw at two of adjustable plate.
Described probe installing plate is connected and is positioned over vertical adjustable plate top with vertical adjustable plate, and the reservation certain space moves up and down, during measurement the probe installing plate moved to desired height after, the knob through fastening system can be fixed.
The good effect of the utility model is: the utility model contact resistivity measurement mechanism is simple in structure, cost is low and easy and simple to handle.This device can directly adopt the crystal-silicon solar cell of ordinary student production. art completion as sample, need not to make sample with special process.Sample is positioned in the middle of the sample stage, can be fixed by the tracheae vacuum suction, and measuring probe can add or remove as required.During measurement, need not the mobile battery sample, through regulating adjuster bar and vertical adjustable plate, can the probe installing plate be moved to the arbitrary position of sample stage.When probe alignment behind the grid line position that will measure, can the locking of probe installing plate have been effectively reduced the contact resistance between probe and tested battery electrode with fastening system.The utility model device can be realized the measurement to the sample optional position, can guarantee measuring stability and accuracy again.
Description of drawings
To combine accompanying drawing and specific embodiment that the utility model is described further below.Accompanying drawing described herein is used to provide the further understanding to the utility model, constitutes the application's a part, does not constitute the qualification to the utility model.
Fig. 1 is the structural representation of the utility model;
Fig. 2 is the texture edge skeleton view of the utility model;
Fig. 3 is the structural representation of Fig. 1 middle probe installing plate.
Embodiment
Specify the structure of the utility model below in conjunction with accompanying drawing.In Fig. 1～3: sample stage 1; Sample stage pore 2; Adjuster bar 3; Travelling carriage 4; Probe installing plate 5; Vertical adjustable plate 6; Fastening system 7; Slide rail 8; Exhaust tube interface 9; Connect lead 10; Probe aperture 11.
Sample stage 1 is the base station of whole device, and exhaust tube interface 9 is connected every vent port 2, but is independently between the tracheae, can external as required extract system during use.Adjuster bar 3, travelling carriage 4 and slide rail 8 constitute the lateral adjustments system jointly, and wherein adjuster bar 3 places the both sides of sample stage 1 respectively with slide rail 8 and fixes.Travelling carriage 4 one ends connect slide rail 8, and the side of slide rail 8 is fluted, travelling carriage 4 can be slided but can not break away from, and the other end is then nested with threaded adjuster bar 3, and when the rotation adjusting bar, travelling carriage 4 is laterally mobile thereupon.Vertically adjustable plate 6 is positioned over travelling carriage 4 tops, can be with travelling carriage 4 transverse translations, and vertically adjustable plate 6 has kept at nut location and has vertically moved the space simultaneously, makes connected probe installing plate 5 realize longitudinal translations.Probe installing plate 5 links to each other with vertical adjustable plate 6, utilizes the fastening system 7 of its top to fix, and when fastening system 7 unclamped, probe installing plate 5 can move at above-below direction, is convenient to realize the accurate contraposition and locking measuring position of probe.During measurement, on probe aperture 11, probe is installed, is connected lead 10 through probe probe is connected with measuring junction,, just can calculate the numerical value of the contact resistance of measurement point according to the magnitude of voltage of measurement point.
The utility model novel structure, practicality; And operate simple and easy; The installing plate of stationary probe can be realized two-dimension translational through the function of adjuster bar and vertical adjustable plate, and after the solar cell sample was fixed in sample stage, the probe installing plate can make measuring probe move to any measurement point of sample; And the contraposition that can realize probe through fastening system has like a cork guaranteed measuring stability and accuracy effectively with fixing.
Claims (6)
1. crystal-silicon solar cell contact resistivity measurement mechanism; Comprise sample stage, lateral adjustments system, vertical adjustable plate, probe installing plate and fastening system; It is characterized in that: probe installing plate (5) is provided with probe aperture (11), and probe aperture is vertical arrangement, and probe is installed on probe aperture; The probe installing plate is fixing through fastening system (7), and is connected with sample stage with vertical adjustable plate through the lateral adjustments system.
2. crystal-silicon solar cell contact resistivity measurement mechanism according to claim 1; It is characterized in that: described sample stage (1) has been provided with pore (2); Pore is vertical arrangement; Every vent port is communicated with the interior independent tracheae of sample stage, and is connected with the exhaust tube interface (9) that is provided with in the sample stage side.
3. crystal-silicon solar cell contact resistivity measurement mechanism according to claim 1; It is characterized in that: described lateral adjustments system is made up of adjuster bar (3), slide rail (8) and travelling carriage (4) three parts; Adjuster bar is fixed on sample stage one side; Slide rail is fixed on the opposite side of sample stage, and travelling carriage two is connected with slide rail with adjuster bar respectively.
4. crystal-silicon solar cell contact resistivity measurement mechanism according to claim 3 is characterized in that: adjuster bar (3) is surperficial threaded round bar, can make its rotation through one turn knob, and can laterally move.
5. crystal-silicon solar cell contact resistivity measurement mechanism according to claim 1; It is characterized in that: described vertical adjustable plate (6) is positioned over the travelling carriage top; And can vertically move along flight, vertically lock itself and travelling carriage through screw at two of adjustable plate.
6. crystal-silicon solar cell contact resistivity measurement mechanism according to claim 1; It is characterized in that: described probe installing plate (5) is connected with vertical adjustable plate (6) and places above vertical adjustable plate; And keeping certain space moves up and down; After moving to desired height, the knob through fastening system is fixed on the probe installing plate on vertical adjustable plate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201120039144XU CN202305597U (en) | 2011-02-15 | 2011-02-15 | Contact resistivity measuring device for crystalline silicon solar cell |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201120039144XU CN202305597U (en) | 2011-02-15 | 2011-02-15 | Contact resistivity measuring device for crystalline silicon solar cell |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202305597U true CN202305597U (en) | 2012-07-04 |
Family
ID=46374469
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201120039144XU Expired - Lifetime CN202305597U (en) | 2011-02-15 | 2011-02-15 | Contact resistivity measuring device for crystalline silicon solar cell |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN202305597U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103235163A (en) * | 2013-03-28 | 2013-08-07 | 顺德中山大学太阳能研究院 | Test probe with adjustable probe-needle gaps for testing contact resistances of solar batteries |
| CN103278691A (en) * | 2013-05-24 | 2013-09-04 | 中利腾晖光伏科技有限公司 | Resistance measuring device of solar cell |
| CN106371011A (en) * | 2016-10-21 | 2017-02-01 | 宁波华仑电子有限公司 | Pin location testing mechanism |
-
2011
- 2011-02-15 CN CN201120039144XU patent/CN202305597U/en not_active Expired - Lifetime
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103235163A (en) * | 2013-03-28 | 2013-08-07 | 顺德中山大学太阳能研究院 | Test probe with adjustable probe-needle gaps for testing contact resistances of solar batteries |
| CN103235163B (en) * | 2013-03-28 | 2015-06-03 | 顺德中山大学太阳能研究院 | Test probe with adjustable probe-needle gaps for testing contact resistances of solar batteries |
| CN103278691A (en) * | 2013-05-24 | 2013-09-04 | 中利腾晖光伏科技有限公司 | Resistance measuring device of solar cell |
| CN106371011A (en) * | 2016-10-21 | 2017-02-01 | 宁波华仑电子有限公司 | Pin location testing mechanism |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN103235163B (en) | Test probe with adjustable probe-needle gaps for testing contact resistances of solar batteries | |
| CN204064286U (en) | For measuring the proving installation of leaf spring chord length and camber | |
| CN204086398U (en) | Crystal-silicon solar cell front electrode measuring contact resistance device | |
| CN202305597U (en) | Contact resistivity measuring device for crystalline silicon solar cell | |
| CN204792708U (en) | Solar wafer performance check out test set | |
| CN215218418U (en) | Toughened glass bending resistance testing arrangement | |
| CN201561991U (en) | Adjustable probe bracket for solar battery detection | |
| CN203069874U (en) | Microscope stage | |
| CN202994737U (en) | Testing device used for measuring acoustic impedance performance of plate-shaped acoustic liner structure | |
| CN211730847U (en) | Higher mathematics teaching auxiliary device that draws | |
| CN103499259A (en) | 360-degree conductive pole mounting plate positioning ruler and positioning method | |
| CN103064130A (en) | Simple and easy wind force test device | |
| CN204854728U (en) | Gradient rulers | |
| CN116794047A (en) | Device and method for detecting quality of solar cell printing screen | |
| CN207074038U (en) | A kind of transformer size measures tool | |
| CN202853980U (en) | Detector for welding quality of solar welding strips | |
| CN201535661U (en) | Special gauge for gauging engine cylinder hole perpendicularity | |
| CN201615857U (en) | Fatigue tester with reading microscope | |
| CN106206858A (en) | The chalker of many sub-batteries is made before a kind of thin-film solar cells I V test | |
| CN204963721U (en) | Utensil is examined to wind window opening before car | |
| CN204240880U (en) | Be exclusively used in the modular construction cubing detecting automobile instrument crossbeam assembly | |
| CN220380429U (en) | Auxiliary tool for measuring automobile maintenance | |
| CN203657691U (en) | Workpiece thickness detection device | |
| CN202048880U (en) | Simple verticality detector | |
| CN203148345U (en) | Combination type thickness tester for rubber sample |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term | ||
| CX01 | Expiry of patent term |
Granted publication date: 20120704 |