CN202305566U

CN202305566U - Heat radiating system of integrated circuit tester

Info

Publication number: CN202305566U
Application number: CN2011203034035U
Authority: CN
Inventors: 方盼; 李显军; 李志强
Original assignee: SHENZHEN ABLE ELECTRONICS CO Ltd
Current assignee: SHENZHEN ABLE ELECTRONICS CO Ltd
Priority date: 2011-08-19
Filing date: 2011-08-19
Publication date: 2012-07-04
Anticipated expiration: 2021-08-19

Abstract

The utility model belongs to field of temperature control, provides a heat radiating system of an integrated circuit tester. The heat radiating system of the integrated circuit tester comprises an FPGA (Field Programmable Gate Array) main control chip, a temperature sensing unit, a revolving speed adjusting unit and a switch power supply. The heat radiating system of the integrated circuit tester is used for inducing the temperature of a case of the integrated circuit tester by using the temperature sensing unit with the FPGA main control chip as a core, judging whether the induced temperature exceeds the lastly-obtained case temperature through the FPGA main control chip, and adjusting a low frequency pulse width modulation signal outputted by the heat radiating system, thereby realizing the control of the revolving speed of a cooling fan, achieving the aim of reducing power dissipation and noise, and solving the problem of large power attenuation and serious noise pollution of the traditional heat radiating system of the integrated circuit tester.

Description

A kind of integrated circuit tester cooling system

Technical field

The utility model belongs to domain of control temperature, relates in particular to a kind of integrated circuit tester cooling system.

Background technology

At present, employed tester on integrated circuit production line rises owing to continuous firing causes the tester housing temperature, and when temperature was too high, overheating fault or damage appearred in each parts of tester self easily.So existing cooling system is the cooling fan of outer setting at integrated circuit tester, is keeping continuous service under the situation of certain rotating speed through the control cooling fan, thereby be reached for the purpose of integrated circuit tester heat radiation.

Yet, in existing cooling system, just adopting to let cooling fan be reached for the purpose that integrated circuit tester dispels the heat with the mode of constant rotational speed continuous service, this kind radiating mode need be cost with the excessive power drain.Because in the process of cooling fan continuous service; The integrated circuit tester housing temperature can continue to reduce; Can operate as normal as long as temperature is reduced to integrated circuit tester, then cooling fan need not continue to keep original rotating speed, otherwise can cause unnecessary power consumption; In addition, cooling fan makes the neighbourhood noise of whole integrated circuit production line excessive can produce noise pollution in the process of constant rotational speed continuous service.Therefore, there is the problem that power attenuation is big and noise pollution is serious in existing integrated circuits tester cooling system.

The utility model content

The purpose of the utility model is to provide a kind of integrated circuit tester cooling system, is intended to solve the problem that power attenuation is big and noise pollution is serious that existing integrated circuit tester cooling system exists.

The utility model is to realize like this; A kind of integrated circuit tester cooling system; Be connected with the chassis power supply of integrated circuit tester; Comprise computing machine, interface board, PCI (Peripheral Component Interconnect, peripheral hardware is interconnected) communication card and cooling fan, said integrated circuit tester cooling system also comprises:

Be connected with said chassis power supply and said interface board, the peripheral unit of self carried out the FPGA main control chip of control corresponding according to the steering order of said computing machine;

The cabinet that is arranged at said integrated circuit tester is outside, is connected with said FPGA main control chip, the housing temperature of said integrated circuit tester is responded to, and to the temperature sensing unit of said FPGA main control chip output temperature information;

Be connected with said FPGA main control chip and said cooling fan, the pulse-width signal that sends according to said FPGA main control chip carries out the rotational speed regulation unit of rotational speed regulation to said cooling fan;

Being connected with said FPGA main control chip, said interface board and said cooling fan, for said cooling fan provides 12V WV, and is the Switching Power Supply that said interface board provides the 5V WV after said chassis power supply is cut off.

In the utility model; The integrated circuit tester cooling system is a core with said FPGA main control chip; Utilize said temperature sensing unit that the housing temperature of said integrated circuit tester is responded to; Judge through said FPGA main control chip whether the temperature of sensing is higher than the housing temperature of a preceding gained, and adjust the low frequency pulse-width signal of self exporting, thereby realize control said cooling fan rotation speed; Realize reducing the purpose of power consumption and noise, solved the problem that power attenuation is big and noise pollution is serious that existing integrated circuit tester cooling system exists.

Description of drawings

Fig. 1 is the exemplary circuit structural drawing of the integrated circuit tester cooling system that provides of the utility model embodiment.

Embodiment

For the purpose, technical scheme and the advantage that make the utility model is clearer,, the utility model is further elaborated below in conjunction with accompanying drawing and embodiment.Should be appreciated that specific embodiment described herein only in order to explanation the utility model, and be not used in qualification the utility model.

Fig. 1 shows the exemplary circuit structure of the integrated circuit tester cooling system that the utility model first embodiment provides, and for the ease of explanation, only shows the relevant part with the utility model first embodiment, and details are as follows:

A kind of integrated circuit tester cooling system is connected with the chassis power supply 100 of integrated circuit tester, comprises computing machine 200, PCI communication card 300, interface board 400 and cooling fan 500, and the integrated circuit tester cooling system also comprises:

Be connected with chassis power supply 100 and interface board 400, peripheral unit carried out the FPGA main control chip 600 of control corresponding according to the steering order of computing machine 200;

The cabinet that is arranged at integrated circuit tester is outside, is connected with FPGA main control chip 600, the housing temperature of integrated circuit tester is responded to, and to the temperature sensing unit 700 of FPGA main control chip 600 output temperature information;

Be connected with FPGA main control chip 600 and cooling fan 500, the low frequency pulse-width signal that sends according to FPGA main control chip 600 carries out the rotational speed regulation unit 800 of rotational speed regulation to cooling fan 500;

Being connected with FPGA main control chip 600, interface board 400 and cooling fan 500, for cooling fan 500 provides 12V WV, and is the Switching Power Supply 900 that interface board 400 provides the 5V WV after chassis power supply 100 is cut off.

As the utility model one embodiment; Temperature sensing unit 700 comprises resistance R 1 and sensor S1; First end of resistance R 1 and the power end of sensor S1 meet a 5V voltage output end 5V1 of Switching Power Supply 900 simultaneously, communication terminal while and second end of resistance R 1 and the temperature information input end T of FPGA main control chip 600 of sensor S1.

As the utility model one embodiment; Rotational speed regulation unit 800 comprises photoelectrical coupler U1, resistance R 2, resistance R 3, resistance R 4, resistance R 5, metal-oxide-semiconductor Q1 and resistance R 6; The negative electrode of light emitting diode meets the pulse-width signal output terminal PWM of FPGA main control chip 600 among the photoelectrical coupler U1; First end of the anode connecting resistance R2 of light emitting diode among the photoelectrical coupler U1; Second termination of resistance R 2 is gone into the 3.3V power supply, the collector of phototriode while and first end of resistance R 3 and first end of resistance R 4, the grounded emitter of phototriode among the photoelectrical coupler U1 among the photoelectrical coupler U1; Second termination of resistance R 3 is gone into the 3.3V power supply; Second end of resistance R 4 is connected with first end of resistance R 5 and the grid of metal-oxide-semiconductor Q1 simultaneously, and second end of resistance R 5 is connected with the drain electrode of metal-oxide-semiconductor Q1 and second end 2 of cooling fan 500 simultaneously, and resistance R 6 is connected between the source electrode and ground of metal-oxide-semiconductor Q1.

In the present embodiment, first end 1 of cooling fan 500 meets the 12V voltage output end 12V of Switching Power Supply 900, and the 5V voltage input end 5V of interface board 400 meets the 2nd 5V voltage output end 5V2 of Switching Power Supply 900.

In the present embodiment, the frequency of the low frequency pulse-width signal exported of FPGA main control chip can be 30KHz.

The principle of work of integrated circuit tester cooling system is following:

Computing machine 200 sends start-up command through PCI communication card 300 and interface board 400 to FPGA main control chip 600, and FPGA main control chip 600 is to rotational speed regulation unit 800 output low frequency pulse-width signals, and startup chassis power supply 100 and temperature sensor S1.Temperature sensor S1 returns the housing temperature information feedback of the integrated circuit tester that collects to FPGA main control chip 600; 600 pairs of these temperature informations of FPGA main control chip are deciphered and are obtained corresponding temperature value, and the temperature value with a temperature value that is obtained and a preceding gained compares subsequently, if current temperature value is higher than the temperature value of a preceding gained; FPGA main control chip 600 can reduce the dutycycle of low frequency pulse-width signal of self output; Low frequency pulse-width signal after dutycycle reduces gets into the negative electrode of light emitting diode among the photoelectrical coupler U1, because the dutycycle of low frequency pulse-width signal reduces, then the collector voltage of phototriode reduces among the photoelectrical coupler U1; Cause the ON time of metal-oxide-semiconductor Q1 to shorten; The drain-source electrode current of metal-oxide-semiconductor Q1 reduces, thereby the power of cooling fan 500 is reduced, and rotating speed slows down; Otherwise; When if current temperature value is lower than the temperature value of a preceding gained, FPGA main control chip 600 can increase the dutycycle of the low frequency pulse-width signal of self exporting, and the low frequency pulse-width signal after dutycycle increases gets into the negative electrode of light emitting diode among the photoelectrical coupler U1; Because the dutycycle of low frequency pulse-width signal increases; Then the collector voltage of phototriode increases among the photoelectrical coupler U1, causes the ON time of metal-oxide-semiconductor Q1 to prolong, and the drain-source electrode current of metal-oxide-semiconductor Q1 increases; Thereby make the power of cooling fan 500 increase faster rotational speed.When if current temperature value is higher than preset maximum temperature value; FPGA main control chip 600 can quit work by control chassis power supply 100; And command switch power supply 900 is given interface board 400 from its 2nd 5V voltage output end 5V2 output 5V WV; Thereby guarantee the continuous communiction of FPGA main control chip 600 and computing machine 200, FPGA main control chip 600 increases the dutycycle of the low frequency pulse-width signal of its outputs, improves the rotating speed of cooling fan 500.When the body temperature of integrated circuit tester is lower than preset maximum temperature value; Computing machine 200 sends start-up command, and FPGA main control chip 600 starts chassis power supply 100, and integrated circuit tester works on; The body temperature that FPGA main control chip 600 continues integrated circuit tester; And,, reach the purpose of the body temperature of control integrated circuit tester to regulate cooling fan 500 rotating speeds according to the dutycycle of its pulse-width signal of exporting of actual conditions adjustment.

In the utility model embodiment; The integrated circuit tester cooling system is a core with FPGA main control chip 600; Utilize the housing temperature of 700 pairs of integrated circuit testers of temperature sensing unit to respond to; Judge through FPGA main control chip 600 whether the temperature of sensing is higher than the housing temperature of a preceding gained, and adjust the low frequency pulse-width signal of self exporting, thereby realize control cooling fan rotation speed; Reach the purpose that reduces power consumption and noise, solved the problem that power attenuation is big and noise pollution is serious that existing integrated circuit tester cooling system exists.

The above is merely the preferred embodiment of the utility model; Not in order to restriction the utility model; Any modification of being done within all spirit and principles at the utility model, be equal to replacement and improvement etc., all should be included within the protection domain of the utility model.

Claims

1. an integrated circuit tester cooling system is connected with the chassis power supply of integrated circuit tester, comprises computing machine, interface board, PCI communication card and cooling fan, it is characterized in that, said integrated circuit tester cooling system also comprises:

Be connected with said chassis power supply and said interface board, peripheral unit carried out the FPGA main control chip of control corresponding according to the steering order of said computing machine;

Being connected with said FPGA main control chip, said interface board and said cooling fan, for said cooling fan provides 5V WV, and is the Switching Power Supply that said interface board provides the 12V WV after said chassis power supply is cut off.

2. integrated circuit tester cooling system as claimed in claim 1; It is characterized in that; Said temperature sensing unit comprises resistance R 1 and sensor S1; First end of said resistance R 1 and the power end of said sensor S1 connect a 5V voltage output end of said Switching Power Supply simultaneously, communication terminal while and second end of said resistance R 1 and the temperature information input end of said FPGA main control chip of said sensor S1.

3. integrated circuit tester cooling system as claimed in claim 1; It is characterized in that; Said rotational speed regulation unit comprises photoelectrical coupler U1, resistance R 2, resistance R 3, resistance R 4, resistance R 5, metal-oxide-semiconductor Q1 and resistance R 6; The negative electrode of light emitting diode connects the pulse-width signal output terminal of said FPGA main control chip among the said photoelectrical coupler U1; The anode of light emitting diode connects first end of said resistance R 2 among the said photoelectrical coupler U1; Second termination of said resistance R 2 is gone into the 3.3V power supply, the collector of phototriode while and first end of said resistance R 3 and first end of said resistance R 4, the grounded emitter of phototriode among the said photoelectrical coupler U1 among the said photoelectrical coupler U1; Second termination of said resistance R 3 is gone into the 3.3V power supply; Second end of said resistance R 4 is connected with first end of said resistance R 5 and the grid of said metal-oxide-semiconductor Q1 simultaneously, and second end of said resistance R 5 is connected with the drain electrode of said metal-oxide-semiconductor Q1 and second end of said cooling fan simultaneously, and said resistance R 6 is connected between the source electrode and ground of said metal-oxide-semiconductor Q1.

4. integrated circuit tester cooling system as claimed in claim 1; It is characterized in that; The 12V voltage output end of the said Switching Power Supply of first termination of said cooling fan, the 5V voltage input end of said interface board connect the 2nd 5V voltage output end of said Switching Power Supply.