CN202256410U - Adjustable probe base of test grading machine for silicon solar cells - Google Patents
Adjustable probe base of test grading machine for silicon solar cells Download PDFInfo
- Publication number
- CN202256410U CN202256410U CN2011203617626U CN201120361762U CN202256410U CN 202256410 U CN202256410 U CN 202256410U CN 2011203617626 U CN2011203617626 U CN 2011203617626U CN 201120361762 U CN201120361762 U CN 201120361762U CN 202256410 U CN202256410 U CN 202256410U
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- main body
- base main
- probe base
- probe
- sliding block
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Abstract
The utility model discloses an adjustable probe base of a test grading machine for silicon solar cells. The adjustable probe base comprises an upper probe base main body, an upper probe carriage pressure block, a lower probe base main body and a lower probe carriage pressure block, wherein an upper blocking groove and a lower blocking groove are respectively arranged on the upper probe base main body and the lower probe base main body; the upper blocking groove and the lower blocking groove are respectively located at an upper slide block of the upper probe base main body and a lower slide block of the lower probe base main body; the upper slide block is independent of the upper probe base main body, and the lower slide block is independent of the lower probe base main body; the upper probe base main body and the lower probe base main body are respectively provided with a mounting position for mounting the upper slide block and a mounting position for mounting the lower slide block; sliding connection structures are arranged between the upper slide block and the mounting position of the upper slide block and between the lower slide block and the mounting position of the lower slide block respectively; and adjustment positioning mechanisms are arranged between the upper probe base main body and the upper slide block and between the lower probe base main body and the lower slide block respectively. In the adjustable probe base, the positions of the upper blocking groove and the lower blocking groove can be adjusted, so that an upper probe and a lower probe can be accurately matched with each other, and the accuracy of test data on silicon conversion efficiency is improved.
Description
Technical field
The utility model relates to a kind of silicon solar cell and makes the anchor clamps that workshop section's test stepping machine stationary probe is used, and is specifically related to the probe base of silicon solar cell test stepping machine, is used for fixing silicon solar cell to test its conversion efficiency.
Background technology
As shown in Figure 1; The probe base that existing test stepping machine stationary probe is used mainly by last probe carriage briquetting 1, go up probe base main body 2, down probe carriage briquetting 3 and down probe base main body 4 form; Last probe carriage briquetting 1 is the bar shaped block structure with following probe carriage briquetting 3; Last probe base main body 2 is provided with the last draw-in groove 21 that is used to engage probe carriage, and following probe base main body 4 is provided with the lower bayonet slot 41 that is used to engage time probe carriage, during the conversion efficiency of test silicon solar cell; The upper and lower probe carriage that upper and lower probe is installed is fastened on respectively in the upper and lower draw-in groove of upper and lower probe base; Make upper and lower probe coincide together, and will go up probe carriage briquetting 1 and be pressed in respectively on the upper and lower probe base main body 2,4 with following probe carriage briquetting 3 and fix, can test.
More than existing probe base has following defective: upward the lower bayonet slot of the last draw-in groove of probe base main body and following probe base main body is directly and processes; Draw-in groove is provided with stationkeeping, still, and when error appears in draw-in groove processing; When perhaps fixed screw holes processing produces error on the probe base main body at draw-in groove and its place; Will cause upper and lower probe carriage to install and error occur, it is in upper and lower probe carriage is installed in the upper and lower draw-in groove on the upper and lower probe base main body time that this error mainly shows, and upper and lower probe can not match exactly; Thereby cause the test fluctuation of silicon chip, so that influence the accuracy of silicon chip conversion efficiency test data.
The utility model content
The purpose of the utility model be to provide a kind of simple in structure, can guarantee that upper and lower probe fits like a glove, improves the adjustable probe seat of the silicon solar cell test stepping machine of test result accuracy.
The above-mentioned purpose of the utility model realizes through following technical scheme: a kind of adjustable probe seat of silicon solar cell test stepping machine; Comprise the probe base main body, be used to be pressed in last probe carriage briquetting, the following probe base main body on the probe base main body and be used to be pressed in down the following probe carriage briquetting on the probe base main body; Said going up on the probe base main body has the last draw-in groove that is used to install probe carriage; Then have the lower bayonet slot that is used to install down probe carriage on the probe base main body under said; It is characterized in that the said draw-in groove of going up is positioned on the top shoe that is independent of said upward probe base main body; And said lower bayonet slot is positioned on the sliding block that is independent of said probe base main body down; Saidly go up the probe base main body, the probe base main body has and is respectively applied for the installation position of installing slide block, sliding block down; Said top shoe, sliding block and the sliding connection structure for upper and lower slide block is slided on the installation position between the installation position separately, on said probe base main body and said top shoe, have respectively between probe base main body and the said sliding block and be used to regulate the adjusting detent mechanism that top shoe, sliding block position are also located down.
The upper and lower draw-in groove of the utility model is separately positioned on the upper and lower slide block; Through the position of adjusting slider, can realize the adjustable positions of upper and lower draw-in groove, compare with existing fixed draw-in groove; Scalable is installed in the position of the upper and lower probe carriage in the upper and lower draw-in groove; Make upper and lower probe to match exactly, reduce the test fluctuation of silicon chip, improve the accuracy of silicon chip conversion efficiency test data.
The described installation position of the utility model is the recess of being located on probe base main body, the following probe base main body, and the end face of said top shoe, sliding block is respectively with said upward probe base main body, the end face of probe base main body is equal down.
A kind of embodiment as the utility model; Said sliding connection structure comprises the last sliding connection structure that is arranged on the probe base main body and is arranged on down the lower slider syndeton on the probe base main body; The said sliding connection structure of going up comprises the guide rail that is arranged on the recess bottom surface, strip hole and the fixed part of being located at the top shoe two bottom sides; The bottom surface of said top shoe has groove; Said groove and said guide rail adapt, and said groove is stuck on the said guide rail, and said fixed part passes on the side that is fixed on said guide rail behind the said strip hole and makes the strip hole to move along fixed part.
Said fixed part adopts pin, and said pin adopts four and respectively be provided with a pair ofly respectively in said guide rail both sides, realizes that top shoe prevents it when sliding and deviates from.
As the embodiment of the utility model, said lower slider syndeton comprises the fixture block of being located at the sliding block bottom surface and is located at the chute on the said recess, and said fixture block and chute are suitable, and said fixture block is arranged in said chute.
Install for ease; The said lower slider syndeton of the utility model also comprises locating piece; Said chute is arranged on the end face of said locating piece; The bottom surface of said locating piece and down on the probe base main body with it correspondence position have threaded hole, pass threaded hole through screw locating piece be fixed on down on the probe base main body.
The utlity model has following embodiment; Said adjusting detent mechanism comprises the adjusted detent mechanism of being located on the probe base main body and comprises the following adjusting detent mechanism of being located at down on the probe base main body; Said adjusted detent mechanism comprises to be regulated parts and is separately positioned on top shoe, goes up the adjustment hole on the probe base main body, and said adjusting parts are installed in the adjustment hole and in adjustment hole, move the position of regulating top shoe through regulating parts.
The said adjusting detent mechanism down of the utility model comprises to be regulated parts and is located at the adjustment hole on said sliding block, the following probe base main body respectively, and said adjusting parts are installed in the adjustment hole and in adjustment hole, move the position of regulating sliding block through regulating parts.
Embodiment as the utility model; Said upward probe base main body is the bar shaped block, and said both ends of going up the probe base main body have limited block respectively, the adjacent setting with said top shoe of said limited block; Said adjusting parts adopt screw; Said adjustment hole is a threaded hole, and said threaded hole is horizontally installed on respectively on said limited block and the said top shoe, and adaptive being installed in the said threaded hole of said screw implements to regulate the location to top shoe.
The said probe base main body down of the utility model is " U " shape; Its both ends have limited block; The adjacent setting of said limited block with said sliding block, said adjusting parts adopt screw, and said adjustment hole is a threaded hole; Said threaded hole is horizontally installed on respectively on said limited block and the said sliding block; Thereby said screw is adaptive to be installed in and to connect sliding block in the said threaded hole and with limited block sliding block is implemented to regulate and locate, and the connecting portion of said sliding block and said limited block is positioned on the side block of said sliding block, and this block protrudes from the top edge of said locating piece.
Preferred implementation as the utility model; Last draw-in groove and the lower bayonet slot on the sliding block on the said top shoe have two respectively; Gap between the sidewall of the sidewall of the both sides of said top shoe and said upward probe base main body recess, the both sides of sliding block and said probe base main body recess down constitutes two broad-adjustable draw-in grooves of cell body, can carry out the conversion of 125 models and 156 models when making the utility model test stepping silicon solar cell.
Compared with prior art, the utlity model has following significant technique effect:
(1) the upper and lower draw-in groove of the utility model is arranged on the slidably upper and lower slide block; Position through adjusting slider; Can realize the adjustable positions of upper and lower draw-in groove; Make upper and lower probe to match exactly, reduce the test fluctuation of silicon chip, improve the accuracy of silicon chip conversion efficiency test data.
(2) the utility model is simple in structure, and on the basis of realizing the draw-in groove adjustable positions, cost of manufacture is lower.
(3) the utility model is formed by each component-assembled, and easy accessibility uses simple to operate, practical.
(4) draw-in groove on the upper and lower probe base main body of the utility model has four respectively, when test stepping silicon solar cell, can carry out the conversion of 125 models and 156 models, and is easy to use.
Description of drawings
Below in conjunction with accompanying drawing and specific embodiment the utility model is done further to specify.
Fig. 1 is the perspective view of existing probe base;
Fig. 2 is the perspective view of the utility model;
Fig. 3 is the cross-sectional schematic of probe base main body under the utility model;
Fig. 4 is that the master of sliding block looks synoptic diagram;
Fig. 5 is the schematic side view of sliding block;
Fig. 6 is that the master of locating piece looks diagrammatic cross-section;
Fig. 7 is the side-looking diagrammatic cross-section of locating piece.
Embodiment
Shown in Fig. 2～7; It is the adjustable probe seat of a kind of silicon solar cell test of the utility model stepping machine; Comprise probe base main body 2, be used to be pressed in last probe carriage briquetting 1, the following probe base main body 4 on the probe base main body 2 and be used to be pressed in down the following probe carriage briquetting 3 on the probe base main body 4; Last probe base main body 2, probe carriage briquetting 3 and probe base main body 4 down down; Have the last draw-in groove 21 that is used to install probe carriage on the last probe base main body 2; Then have the lower bayonet slot 41 that is used to install down probe carriage on the following probe base main body 4; Last draw-in groove 21 is positioned on the top shoe 22 that is independent of probe base main body 2, and lower bayonet slot 41 is positioned on the sliding block 42 that is independent of following probe base main body 4, and last probe base main body 2, time probe base main body 4 have and be respectively applied for the installation position of installing slide block 22, sliding block 42; Top shoe 22, sliding block 42 and the sliding connection structure for top shoe 22, sliding block 42 are slided on the installation position between the installation position separately are at last probe base main body 2 and top shoe 22, have respectively between probe base main body 4 and the sliding block 42 and be used to regulate the adjusting detent mechanism that top shoe 22, sliding block 42 positions are also located down.
The installation position is to be located at probe base main body 2, the following recess on the probe base main body 4, and the end face of top shoe 22, sliding block 42 is respectively with last probe base main body 2, the end face of probe base main body 4 is equal down.Sliding connection structure comprises the last sliding connection structure that is arranged on the probe base main body 2 and is arranged on down the lower slider syndeton on the probe base main body 4; In the present embodiment; Last sliding connection structure comprises the guide rail 23 that is arranged on the recess bottom surface, strip hole 24 and the fixed part of being located at top shoe 22 two bottom sides; Firmware component adopts pin 25, and pin 25 adopts four and respectively be provided with a pair ofly respectively in guide rail 23 both sides, realizes that top shoe prevents it when sliding and deviates from; The bottom surface of top shoe 22 has groove; Groove and guide rail 23 adapt, and groove is stuck on the guide rail 23, and pin 25 passes and makes strip hole 24 to move along pin 25 on the side that is fixed on guide rail 23 behind the strip hole 24.
In the present embodiment, the lower slider syndeton comprises the fixture block 50 of being located at sliding block 42 bottom surfaces and is located at the chute 43 on the recess, and fixture block 50 is suitable with chute 43, and fixture block 50 is arranged in chute 43.The lower slider syndeton also comprises locating piece 44; Chute 43 is arranged on the end face of locating piece 44; The bottom surface of locating piece 44 and down on the probe base main body 4 with it correspondence position have threaded hole 45, pass threaded hole 45 through screw 46 locating piece 44 be fixed on down on the probe base main body 4.
Regulating detent mechanism comprises the adjusted detent mechanism of being located on the probe base main body 2 and comprises the following adjusting detent mechanism of being located at down on the probe base main body 4; The adjusted detent mechanism comprises to be regulated parts and is separately positioned on top shoe 22, goes up the adjustment hole on the probe base main body 2, and last probe base main body 2 is bar shaped blocks, and the both ends of last probe base main body 2 have limited block 26 respectively; Limited block 26 and top shoe 22 adjacent settings; Regulate parts and adopt screw 27, adjustment hole is a threaded hole, and threaded hole is horizontally installed on respectively on limited block 26 and the top shoe 22; Screw 27 adaptive being installed in the threaded hole implement regulate location to top shoe 22 through screw in threaded hole.
Following adjusting detent mechanism comprises to be regulated parts and is located at the adjustment hole on sliding block 42, the following probe base main body 4 respectively, and following probe base main body 4 is " U " shape, and its both ends have limited block 48; Limited block 48 and sliding block 42 adjacent settings; Regulate parts and adopt screw 49, adjustment hole is a threaded hole, and threaded hole is horizontally installed on respectively on limited block 48 and the sliding block 42; Screw 49 adaptive being installed in connect sliding block 42 and limited block 48 in the threaded hole; In threaded hole, move sliding block 42 enforcement adjusting location through screw 49, sliding block 42 is positioned on the side block 51 of sliding block 42 with the connecting portion of limited block 48, and this block 51 protrudes from the top edge of locating piece 44.
In the present embodiment; Draw-in groove on top shoe 22 and the sliding block 42 has two respectively; Gap between the sidewall of the sidewall of the both sides of top shoe 22 and last probe base main body 2 recess, the both sides of sliding block 42 and following probe base main body 4 recess constitutes two broad-adjustable draw-in grooves 52,54 of cell body respectively, makes when test stepping silicon solar cell, can carry out the conversion of 125 models and 156 models.
The utility model is installed, the process of probe carriage is down: when upper and lower probe carriage is installed in the upper and lower draw-in groove on the upper and lower probe base main body; If upper and lower probe matches; Need not implement to regulate this moment to the position of upper and lower draw-in groove; If upper and lower probe does not match, can implement to regulate to the position of lower bayonet slot through the screw that the screw of regulate going up on the probe base main body is implemented to regulate and regulate on the probe base main body down to the position of last draw-in groove; Thereby upper and lower probe is adjusted to the state of matching; And with the adjusting of the perpendicular direction of slide block glide direction, then be to install, directly aiming at up and down during probe carriage down and get final product, use at last, the probe briquetting presses respectively on upper and lower probe base main body and just can carry out the test of silicon chip conversion efficiency to fix upper and lower probe carriage down.
The embodiment of the utility model is not limited thereto; Ordinary skill knowledge and customary means according to this area; Do not breaking away under the above-mentioned basic fundamental thought of the utility model prerequisite; The sliding connection structure of the utility model, regulate detent mechanism, regulate parts etc. and also have other embodiment, so the utility model can also make modification, replacement or the change of other various ways, all drop within the utility model rights protection scope.
Claims (10)
1. the adjustable probe seat of silicon solar cell test stepping machine; Comprise probe base main body (2), be used to be pressed in last probe carriage briquetting (1), the following probe base main body (4) on the probe base main body (2) and be used to be pressed in down the following probe carriage briquetting (3) on the probe base main body (4); Said going up on the probe base main body (2) has the last draw-in groove (21) that is used to install probe carriage; Then have the lower bayonet slot (41) that is used to install down probe carriage on the probe base main body (4) under said; It is characterized in that: the said draw-in groove (21) of going up is positioned on the top shoe (22) that is independent of said upward probe base main body (2); And said lower bayonet slot (41) is positioned on the sliding block (42) that is independent of said probe base main body (4) down; Saidly go up probe base main body (2), probe base main body (4) has and is respectively applied for the installation position of installing slide block (22), sliding block (42) down; Said top shoe (22), sliding block (42) and the sliding connection structure for top shoe (22), sliding block (42) are slided on the installation position between the installation position separately, on said probe base main body (2) and said top shoe (22), have respectively between probe base main body (4) and the said sliding block (42) and be used to regulate the adjusting detent mechanism that top shoe (22), sliding block (42) position are also located down.
2. the adjustable probe seat of silicon solar cell test stepping machine according to claim 1; It is characterized in that: described installation position is the recess of being located on probe base main body (2), the following probe base main body (4), and the end face of said top shoe (22), sliding block (42) is respectively with said upward probe base main body (2), the end face of probe base main body (4) is equal down.
3. the adjustable probe seat of silicon solar cell test stepping machine according to claim 2; It is characterized in that: said sliding connection structure comprises the last sliding connection structure that is arranged on the probe base main body (2) and is arranged on down the lower slider syndeton on the probe base main body (4); The said sliding connection structure of going up comprises the guide rail (23) that is arranged on the recess bottom surface, strip hole (24) and the fixed part of being located at top shoe (22) two bottom sides; The bottom surface of said top shoe (22) has groove; Said groove and said guide rail (22) adapt; Said groove is stuck on the said guide rail (23), and said fixed part passes on the side that is fixed on said guide rail (23) behind the said strip hole (24) and makes strip hole (24) to move along fixed part.
4. the adjustable probe seat of silicon solar cell according to claim 3 test stepping machine, it is characterized in that: said fixed part adopts pin (25), and said pin (25) adopts four and respectively be provided with a pair of in said guide rail (23) both sides respectively.
5. the adjustable probe seat of silicon solar cell test stepping machine according to claim 4; It is characterized in that: said lower slider syndeton comprises the fixture block (50) of being located at sliding block (42) bottom surface and is located at the chute (43) on the said recess; Said fixture block (50) is suitable with chute (43), and said fixture block (50) is arranged in said chute (43).
6. the adjustable probe seat of silicon solar cell test stepping machine according to claim 5; It is characterized in that: said lower slider syndeton also comprises locating piece (44); Said chute (43) is arranged on the end face of said locating piece (44); The bottom surface of said locating piece (44) and down on the probe base main body (4) with it correspondence position have threaded hole (45), pass threaded hole (45) through screw (46) locating piece (44) be fixed on down on the probe base main body (4).
7. the adjustable probe seat of silicon solar cell test stepping machine according to claim 6; It is characterized in that: said adjusting detent mechanism comprises the adjusted detent mechanism of being located on the probe base main body (2) and comprises the following adjusting detent mechanism of being located at down on the probe base main body (4); Said adjusted detent mechanism comprises to be regulated parts and is separately positioned on top shoe (22), goes up the adjustment hole on the probe base main body (2), and said adjusting parts are installed in the adjustment hole and in adjustment hole, move the position of regulating top shoe (22) through regulating parts.
8. the adjustable probe seat of silicon solar cell test stepping machine according to claim 7; It is characterized in that: said upward probe base main body (2) is the bar shaped block; Said both ends of going up probe base main body (2) have limited block (26) respectively; Said limited block (26) and the adjacent setting of said top shoe (22), said adjusting parts adopt screw (27), and said adjustment hole is a threaded hole; Said threaded hole is horizontally installed on respectively on said limited block (26) and the said top shoe (22), and adaptive being installed in the said threaded hole of said screw (27) implements to regulate the location to top shoe (22).
9. the adjustable probe seat of silicon solar cell test stepping machine according to claim 8; It is characterized in that: said probe base main body (4) down is " U " shape; Its both ends have limited block (48); Said limited block (48) and the adjacent setting of said sliding block (42), said adjusting parts adopt screw (49), and said adjustment hole is a threaded hole; Said threaded hole is horizontally installed on respectively on said limited block (48) and the said sliding block (42); Said screw (49) is adaptive be installed in connect in the said threaded hole sliding block (42) with limited block (48) thus sliding block (42) is implemented to regulate the location, said sliding block (42) is positioned on the side block (51) of said sliding block (42) with the connecting portion of said limited block (48), this block (51) protrudes from the top edge of said locating piece (44).
10. the adjustable probe seat of silicon solar cell test stepping machine according to claim 9; It is characterized in that: the last draw-in groove (21) of said top shoe (22) and the lower bayonet slot (41) on the sliding block (42) have two respectively, and the gap between the sidewall of the sidewall of the both sides of said top shoe (22) and said upward probe base main body (2) recess, the both sides of sliding block (42) and said probe base main body (4) recess down constitutes two broad-adjustable draw-in grooves of cell body (52), (54) respectively.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011203617626U CN202256410U (en) | 2011-09-26 | 2011-09-26 | Adjustable probe base of test grading machine for silicon solar cells |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011203617626U CN202256410U (en) | 2011-09-26 | 2011-09-26 | Adjustable probe base of test grading machine for silicon solar cells |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202256410U true CN202256410U (en) | 2012-05-30 |
Family
ID=46117629
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2011203617626U Expired - Lifetime CN202256410U (en) | 2011-09-26 | 2011-09-26 | Adjustable probe base of test grading machine for silicon solar cells |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN202256410U (en) |
-
2011
- 2011-09-26 CN CN2011203617626U patent/CN202256410U/en not_active Expired - Lifetime
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term | ||
| CX01 | Expiry of patent term |
Granted publication date: 20120530 |