CN202182769U - Omnibearing infrared temperature detecting probe support - Google Patents
Omnibearing infrared temperature detecting probe support Download PDFInfo
- Publication number
- CN202182769U CN202182769U CN2011201367274U CN201120136727U CN202182769U CN 202182769 U CN202182769 U CN 202182769U CN 2011201367274 U CN2011201367274 U CN 2011201367274U CN 201120136727 U CN201120136727 U CN 201120136727U CN 202182769 U CN202182769 U CN 202182769U
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- diameter
- probe support
- infrared temperature
- contact
- locking sleeve
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- Expired - Lifetime
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- 239000000523 sample Substances 0.000 title claims abstract description 34
- 210000004907 gland Anatomy 0.000 claims abstract description 6
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims description 13
- 238000009530 blood pressure measurement Methods 0.000 claims description 3
- 238000000034 method Methods 0.000 abstract description 7
- 238000005259 measurement Methods 0.000 abstract description 4
- 230000009931 harmful effect Effects 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 241000233855 Orchidaceae Species 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000001931 thermography Methods 0.000 description 1
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Abstract
The utility model discloses an omnibearing infrared temperature detecting probe support. A rotating ball is arranged in a locking sleeve; the rotating ball and the locking sleeve are connected with a base flange which is connected with a back measurement gland; a through hole is arranged in the rotating ball; and the locking sleeve is a hollow cylinder ring, one end of the locking sleeve is contracted, the outer diameter of the locking sleeve is 30mm, the inner diameter of the locking sleeve is 24mm, and threads are arranged at the inner side of the locking sleeve. The omnibearing infrared temperature detecting probe support solves the problem of adopting an infrared non-contact temperature measuring method to measure the contact temperature of a closed high-tension switch cabinet contact. Due to the design of the infrared temperature detecting probe support, when being installed at a part meeting the safety requirements of high-tension electric operation regulations, an infrared probe can measure the contact state temperature of the closed high-tension switch cabinet contact.
Description
Technical field
The utility model relates to the used infrared probe of a kind of closed high-tension switch cabinet infrared thermography to be fixed and mounting bracket, and the design of this infrared temperature probe support has realized employing infrared measurement of temperature under the prerequisite with operating standard is installed is surveyed the measurement that contact in the closed high-tension switch cabinet contacts temperature not influencing high-tension switch cabinet.
Background technology
Because closed high-tension switch cabinet inside contact structure and high voltage electric equipment are installed the restriction with the operating standard safety requirements; The heating temp of direct measuring contacts is possibility not, thereby any measuring contacts heating temp also can only be through allowing to carry out the contact condition of the position of thermometric with the reflection contact near the measuring contacts.Existing measuring contacts method of temperature mainly is a contact cluster thermometric, and method is that temperature probe is installed on contact arm, and these are different fully with infrared non-contact temperature measuring mode; Temperature as for adopting exposed position in the IR survey high-tension switch cabinet is not so difficult; But the contact contact temperature of measuring closed high-tension switch cabinet is easy absolutely not, and basic reason just is the restriction of high-tension switch cabinet structure of contact terminal and the restriction that the installation and operation procedural security requires.
When adopting the closed high-tension switch cabinet contact of infrared probe non-cpntact measurement contact condition; Need infrared probe be installed in the switch gear room; According to the restriction of high voltage electric equipment installation with the operating standard safety requirements, do not allow cabling in the switch gear room, so only allowing just to have passed switch gear room's metal partion (metp), infrared probe is installed in baffle surface; Probe mustn't extend arbitrarily in the switch gear room; And because the particular restriction of closed high-tension switch cabinet structure of contact terminal, if do not adopt an effective measure, probe allows to be installed in the contact temperature that any position on the metal partion (metp) all is difficult to survey contact.
Summary of the invention
The purpose of the utility model is to provide a kind of comprehensive infrared temperature probe support, thereby has solved the problem that adopts infrared non-contact temperature measuring method to measure closed high-tension switch cabinet contact contact temperature.Because the design of this infrared temperature probe support has realized infrared probe is installed in the contact condition temperature that the position of satisfying high-voltage electrical apparatus operating standard safety requirements can also measure closed high-tension switch cabinet contact.
The technical scheme of the utility model is achieved in that
Roating sphere is arranged in the locking cover, is connected the pedestal pulling method orchid with the locking cover, and the pedestal flange is connected with back of the body pressure measurement lid.
Be provided with through hole in the described roating sphere.
The locking cover is an end shrinkage type open circles band of column, external diameter 30mm, and internal diameter 24mm, there is screw thread the inboard.
The pedestal flange is one " protruding " font column structure, cylinder top height 5.5mm, and external diameter 25mm, there is outer silk in the outside, and interior is the hollow hemisphere body structure; Cylinder lower part height 4mm, external diameter 50mm is evenly distributed the through hole of three diameter of phi 4mm on the circumferential position of diameter 40mm.
The dorsal part gland is the cake of a diameter 50mm, height 5mm, on the radial direction of one side, has Φ 7mm half slot, on the circumferential position of diameter 40mm, is evenly distributed the through hole of three diameter of phi 4mm.
Probe bracket is made with polytetrafluoroethylmaterial material, has good corrosion-resistant high temperature resistant property, protects infrared temperature-sensing probe to avoid damaging or other harmful effect.
The utility model is because the design of this infrared temperature probe support; Both guaranteed that probe mounting can not cause harmful effect to switch cubicle; Can be good at again surveying the temperature that enclosed switchgear contact contact condition is reflected, adopt infrared non-contact temperature measuring method to measure closed this difficult problem of high-tension switch cabinet contact contact temperature thereby solved.
Description of drawings
The comprehensive infrared probe rack assumption diagram of Fig. 1;
The comprehensive infrared probe support of Fig. 2 (a) elevation cross-sectional view;
The right pseudosection of the comprehensive infrared probe support of Fig. 2 (b).
Embodiment
Shown in Fig. 1, Fig. 2 (a), Fig. 2 (b), comprehensive infrared probe support comprises roating sphere 1, locking cover 2, pedestal flange 3, dorsal part gland 4.Decompose as follows:
One Φ 8.3mm through hole is arranged, in being used for infrared temperature probe is embedded in the roating sphere 1.
Working method is following:
Load infrared probe in the hole of roating sphere 1, so that can make temperature probe survey best impact point through adjustment roating sphere bearing sense; Locking cover 2 is used for roating sphere 1 and pedestal flange 3 are combined together in phase on the one hand; A screw thread is realized outside internal thread through locking cover 2 and pedestal flange 3 tops; The serrated end of locking cover is pressed in roating sphere in the hollow hemisphere of pedestal flange and is unlikely to deviate from; Be used for locking the roating sphere 1 of adjusting the probe detection orientation on the other hand, cooperate through screw threads for fastening and realize; Pedestal flange 3 is used for all parts are assembled together, and top connects through the locking cover, and the lower part is connected with back of the body pressure measurement lid through three bolts, realizes through the through hole of three size and location couplings; The effect of dorsal part gland 4 is to be used for through three screws the pedestal flange being fixed on the dividing plate on the one hand, and the line of will popping one's head on the other hand is stuck in the indent so that data line is close to the separator face cabling at opposite side.
Claims (5)
1. comprehensive infrared temperature probe support comprises roating sphere (1), it is characterized in that, roating sphere (1) is arranged in the locking cover (2), is connected pedestal flange (3) with locking cover (2), and pedestal flange (3) is connected with back of the body pressure measurement lid (4).
2. comprehensive infrared temperature probe support according to claim 1 is characterized in that described roating sphere is provided with through hole in (1).
3. comprehensive infrared temperature probe support according to claim 1 is characterized in that, locking cover (2) is an end shrinkage type open circles band of column, external diameter 30mm, and internal diameter 24mm, there is screw thread the inboard.
4. comprehensive infrared temperature probe support according to claim 1 is characterized in that, pedestal flange (3) is one " protruding " font column structure, cylinder top height 5.5mm, and external diameter 25mm, there is outer silk in the outside, and interior is the hollow hemisphere body structure; Cylinder lower part height 4mm, external diameter 50mm is evenly distributed the through hole of three diameter of phi 4mm on the circumferential position of diameter 40mm.
5. comprehensive infrared temperature probe support according to claim 1; It is characterized in that; Dorsal part gland (4) is the cake of a diameter 50mm, height 5mm, on the radial direction of one side, has Φ 7mm half slot, on the circumferential position of diameter 40mm, is evenly distributed the through hole of three diameter of phi 4mm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011201367274U CN202182769U (en) | 2011-05-05 | 2011-05-05 | Omnibearing infrared temperature detecting probe support |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011201367274U CN202182769U (en) | 2011-05-05 | 2011-05-05 | Omnibearing infrared temperature detecting probe support |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202182769U true CN202182769U (en) | 2012-04-04 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2011201367274U Expired - Lifetime CN202182769U (en) | 2011-05-05 | 2011-05-05 | Omnibearing infrared temperature detecting probe support |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN202182769U (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109100024A (en) * | 2018-09-12 | 2018-12-28 | 国网陕西省电力公司榆林供电公司 | A kind of heating accident detection device of sealing rotation |
| CN109556727A (en) * | 2018-11-29 | 2019-04-02 | 莱芜万通电器有限公司 | A kind of electrical cabinet temperature measuring equipment |
| CN109923386A (en) * | 2017-10-13 | 2019-06-21 | 株式会社写真化学 | The temperature measuring apparatus and temperature-measuring method and stirring debubbling method of treated object |
| CN112945389A (en) * | 2021-01-29 | 2021-06-11 | 华中科技大学 | Non-contact type measuring system and method for temperature of last-stage moving blade of turbine |
-
2011
- 2011-05-05 CN CN2011201367274U patent/CN202182769U/en not_active Expired - Lifetime
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109923386A (en) * | 2017-10-13 | 2019-06-21 | 株式会社写真化学 | The temperature measuring apparatus and temperature-measuring method and stirring debubbling method of treated object |
| CN109100024A (en) * | 2018-09-12 | 2018-12-28 | 国网陕西省电力公司榆林供电公司 | A kind of heating accident detection device of sealing rotation |
| CN109100024B (en) * | 2018-09-12 | 2024-01-12 | 国网陕西省电力公司榆林供电公司 | Sealed rotatory fault detection device that generates heat |
| CN109556727A (en) * | 2018-11-29 | 2019-04-02 | 莱芜万通电器有限公司 | A kind of electrical cabinet temperature measuring equipment |
| CN112945389A (en) * | 2021-01-29 | 2021-06-11 | 华中科技大学 | Non-contact type measuring system and method for temperature of last-stage moving blade of turbine |
| CN112945389B (en) * | 2021-01-29 | 2023-10-31 | 华中科技大学 | Non-contact measuring system and method for temperature of turbine final-stage moving blade |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| ASS | Succession or assignment of patent right |
Owner name: XI'AN POWER SUPPLY BUREAU XI'AN CHENBO OPTICS-ELEC Free format text: FORMER OWNER: XI'AN CHENBO OPTICS-ELECTRICITY SCIENCE AND TECHNOLOGY CO., LTD. Effective date: 20140328 Owner name: STATE GRID CORPORATION OF CHINA Free format text: FORMER OWNER: XI'AN POWER SUPPLY BUREAU Effective date: 20140328 |
|
| C41 | Transfer of patent application or patent right or utility model | ||
| COR | Change of bibliographic data |
Free format text: CORRECT: ADDRESS; FROM: 710032 XI'AN, SHAANXI PROVINCE TO: 100761 XICHENG, BEIJING |
|
| TR01 | Transfer of patent right |
Effective date of registration: 20140328 Address after: 100761 West Chang'an Avenue, Beijing, No. 86, No. Patentee after: State Grid Corporation of China Patentee after: Xi'an Power Supply Bureau Patentee after: Xi'an Chenbo Photoelectric Technology Co.,Ltd. Address before: 710032 No. 159 East Ring Road, Shaanxi, Xi'an Patentee before: Xi'an Power Supply Bureau Patentee before: Xi'an Chenbo Photoelectric Technology Co.,Ltd. |
|
| CX01 | Expiry of patent term | ||
| CX01 | Expiry of patent term |
Granted publication date: 20120404 |