CN202182716U - Testing measuring tool of warping degree of solar silicon wafer - Google Patents
Testing measuring tool of warping degree of solar silicon wafer Download PDFInfo
- Publication number
- CN202182716U CN202182716U CN201120288945XU CN201120288945U CN202182716U CN 202182716 U CN202182716 U CN 202182716U CN 201120288945X U CN201120288945X U CN 201120288945XU CN 201120288945 U CN201120288945 U CN 201120288945U CN 202182716 U CN202182716 U CN 202182716U
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- China
- Prior art keywords
- solar silicon
- pedestal
- angularity
- test platform
- measurer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Abstract
He utility model discloses a testing measuring tool of a warping degree of a solar silicon wafer. The measuring tool comprises a pedestal and a testing platform that is capable of making sliding movements horizontally on the pedestal. Besides, a door-shaped stop device is arranged across above the testing platform; there is a height clearance between the door-shaped stop device and the testing platform, wherein the height clearance is consistent with a preset limit value of the warping degree. According to the utility model, it can be accurately measured whether a warping degree of a band-shaped lifting solar silicon wafer reaches the standard.
Description
Technical field
The utility model relates to measuring technology, relates in particular to a kind of solar silicon wafers angularity test measurer.
Background technology
The solar silicon wafers of " banded pull-type " solar silicon wafers and traditional ingot casting method is owing to the difference of process aspect, and product performance also has difference." banded pull-type " solar silicon wafers has warpage, and whether the characterization processes of prior art can't accurately detect the angularity of silicon chip up to standard.At present, whether the angularity of " banded pull-type " solar silicon wafers is judged by Quality Inspector's sense organ fully within customer requirement, is caused flase drop easily.
The utility model content
The utility model technical matters to be solved is: a kind of solar silicon wafers angularity test measurer is provided, and whether this measurer can be measured the angularity of banded pull-type solar silicon wafers exactly up to standard.
For solving the problems of the technologies described above, the utility model adopts following technical scheme:
A kind of solar silicon wafers angularity test measurer; This measurer includes a pedestal and test platform that can horizontal slip on this pedestal; Above said test platform, stride and be provided with a type stop means, leave and the consistent height gap of the pre-set limit of said angularity between said door type stop means and the test platform.
Wherein, the centre position on said pedestal is provided with a guide rail along its length, and below said test platform, is provided with the slide block that cooperates with said guide rail, and during work, said test platform is through the horizontal slip on said guide rail of said slide block.
Wherein, said door type stop means includes two and uprightly is located at the height-adjustable door pillar of said pedestal both sides and laterally is crossed on the block on said two door pillars.
Preferably, said two door pillars are arranged on the center line of said base width direction, and said guide rail is arranged on the center line of said pedestal length direction.
The beneficial effect of the utility model is:
The embodiment of the utility model is through being provided with a slidably test platform; And a door type stop means is set above said test platform; Said door type stop means is just consistent with the limit value of solar silicon wafers angularity with height gap between the said test platform; Thereby realized not relying on artificial sense organ and judged whether the angularity of measuring banded pull-type solar silicon wafers exactly is up to standard.
Below in conjunction with accompanying drawing the utility model is done further to describe in detail.
Description of drawings
Fig. 1 is the stereographic map of an embodiment of solar silicon wafers angularity test measurer of the utility model.
Fig. 2 is the upward view of an embodiment of solar silicon wafers angularity test measurer of the utility model.
Fig. 3 is the cross sectional representation (not cutting door type stop means) of an embodiment of solar silicon wafers angularity test measurer of the utility model.
Embodiment
A following embodiment who describes the solar silicon wafers angularity test measurer of the utility model with reference to figure 1-Fig. 3 in detail; As shown in Figure 1; Present embodiment mainly includes a pedestal 1 and test platform 2 that can horizontal slip on this pedestal 1; Above said test platform 2, stride and be provided with a type stop means 3, leave and the consistent height gap of the pre-set limit of said angularity between said door type stop means 3 and the test platform 1.
During concrete the realization; As shown in Figures 2 and 3; Centre position on said pedestal 1 is provided with a guide rail 4 along its length; And below said test platform 1, be provided with the slide block 5 that cooperates with said guide rail 4, during work, said test platform 1 is through the horizontal slip on said guide rail 4 of said slide block 5.
During concrete the realization; Said door type stop means 3 can specifically include two and uprightly be located at the height-adjustable door pillar of said pedestal 1 both sides and laterally be crossed on the block on said two door pillars; The height gap that forms between said block and the test platform 2; Can regulate through the height that changes said door pillar, thereby can satisfy the angularity limit value of various criterion neatly.
In the present embodiment, said two door pillars are arranged on the center line of said pedestal 1 Width, and said guide rail 4 is arranged on the center line of said pedestal 1 length direction.
During measurement, silicon slice placed is placed on the test platform 2, test platform 2 is promoted before and after guide rail 4 directions.Exceed specification like the silicon warp degree, then can't be through the gap between stop means and the test platform, thereby measured come out.
Judge to be very easy to erroneous judgement with the existing manual sense organ and to compare, whether the utility model can be measured the angularity of banded pull-type solar silicon wafers exactly up to standard.
The above is the preferred implementation of the utility model; Should be pointed out that for those skilled in the art, under the prerequisite that does not break away from the utility model principle; Can also make some improvement and retouching, these improvement and retouching also are regarded as the protection domain of the utility model.
Claims (4)
1. a solar silicon wafers angularity is tested measurer; It is characterized in that; This measurer includes a pedestal and test platform that can horizontal slip on this pedestal; Above said test platform, stride and be provided with a type stop means, leave and the consistent height gap of the pre-set limit of said angularity between said door type stop means and the test platform.
2. solar silicon wafers angularity test measurer as claimed in claim 1; It is characterized in that; Centre position on said pedestal is provided with a guide rail along its length; And below said test platform, be provided with the slide block that cooperates with said guide rail, during work, said test platform is through the horizontal slip on said guide rail of said slide block.
3. solar silicon wafers angularity as claimed in claim 2 test measurer is characterized in that, said door type stop means includes two and uprightly is located at the height-adjustable door pillar of said pedestal both sides and laterally is crossed on the block on said two door pillars.
4. solar silicon wafers angularity test measurer as claimed in claim 3 is characterized in that said two door pillars are arranged on the center line of said base width direction, and said guide rail is arranged on the center line of said pedestal length direction.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201120288945XU CN202182716U (en) | 2011-08-10 | 2011-08-10 | Testing measuring tool of warping degree of solar silicon wafer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201120288945XU CN202182716U (en) | 2011-08-10 | 2011-08-10 | Testing measuring tool of warping degree of solar silicon wafer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202182716U true CN202182716U (en) | 2012-04-04 |
Family
ID=46175749
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201120288945XU Expired - Fee Related CN202182716U (en) | 2011-08-10 | 2011-08-10 | Testing measuring tool of warping degree of solar silicon wafer |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN202182716U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110487159A (en) * | 2019-08-09 | 2019-11-22 | 广东利扬芯片测试股份有限公司 | For loading the warpage detection device and its detection method of the Tray disk of IC |
-
2011
- 2011-08-10 CN CN201120288945XU patent/CN202182716U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110487159A (en) * | 2019-08-09 | 2019-11-22 | 广东利扬芯片测试股份有限公司 | For loading the warpage detection device and its detection method of the Tray disk of IC |
| CN110487159B (en) * | 2019-08-09 | 2024-03-22 | 广东利扬芯片测试股份有限公司 | Warp detection device and method for Tray disk for loading IC |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20120404 Termination date: 20140810 |
|
| EXPY | Termination of patent right or utility model |