CN201974444U - Instrument for non-destructive evaluation of nano-scale glass microprobe performance - Google Patents
Instrument for non-destructive evaluation of nano-scale glass microprobe performance Download PDFInfo
- Publication number
- CN201974444U CN201974444U CN2009202502149U CN200920250214U CN201974444U CN 201974444 U CN201974444 U CN 201974444U CN 2009202502149 U CN2009202502149 U CN 2009202502149U CN 200920250214 U CN200920250214 U CN 200920250214U CN 201974444 U CN201974444 U CN 201974444U
- Authority
- CN
- China
- Prior art keywords
- glass microprobe
- microprobe
- glass
- instrument
- performance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Landscapes
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Abstract
An instrument for non-destructive evaluation of nano-scale glass microprobe performance comprises a glass microprobe, and is characterized by also comprising a scanning electron microscope used for observing the shape of the glass microprobe and a patch clamp resistance measuring device. The instrument has the advantages that the means of combining a patch clamp resistance measuring method and a scanning electron microscope technology for a joint analysis of glass microprobe property is more simple and efficient, and a direct-viewing, reliable, and non-destructive determination of the performance and drawing quality of the nano-scale glass microprobe can be realized.
Description
(1) technical field:
The utility model patent belongs to the nano-scale structures detection and uses the scanning probe microscopy technical field, is meant a kind of instrument and equipment of assessing to non-destructive nano-dimension glass microprobe performance in electrolytic solution especially.
(2) background technology:
American I BM companies in 1981 are located at the laboratory of Zurich, Switzerland, developed first scanning tunnel microscope (scanning tunnelling microscopy in the world with atom definition, STM), subsequently, on the basis of controlling principle and structure of STM, a series of scanning probe microscopy technology (scanning probe microscopy that utilize the probe and the different interactions of sample to survey nanoscale lower surface or interfacial property have been produced in succession, SPM), bring the fast development of nanometer technology, make it become the strong instrument of human knowledge's microworld.Microprobe is detecting head and the master tool that SPM carries out the nanometer scale test, and the quality of its performance is to the image quality important influence of SPM.In addition, different subject is used, different measuring condition and processing object have proposed different requirements to characteristics such as the needle type radius of microprobe, needle point aspect ratios.Therefore, be necessary before utilizing the scanning probe microscopy measuring samples, the performance of microprobe to be estimated.
In addition, as the newcomer in the scanning probe microscopy family, the scan ion electricity is led microscope, and (scanning ion conductance microscopy SICM) becomes a kind of advanced person's who is suitable for most at present carrying out the living body biological sample study microscopy with its unique noncontact scan mode.The scan ion electricity is led microtechnic and is relied on negative-feedback circuit and piezoelectric ceramics control glass microprobe, makes that distance keeps constant between itself and sample surfaces, draws out the surface topography of sample by the track while scan of record glass microprobe.The probe that the scan ion electricity is led in the microscope is to draw the very thin glass microprobe that forms by borosilicate or quartz glass microtubule, is also referred to as glass microelectrode.In scanning process, it is identical with the order of magnitude of the most advanced and sophisticated internal diameter size of glass microprobe that the scan ion electricity is led microscopical resolution, therefore reach the resolution of nanoscale, can accurately scan, require the internal diameter size of the glass microprobe that draws out should be at same nanoscale.This shows, the same with other scanning probe microscopy technology, the nanoscale of glass microprobe and good geometric shape will directly determine to scan the success or failure from microscopical resolution of conducting probe and negative feedback scan control, and being badly in need of has a kind of suitable means to assess the performance and the morphological feature of nano-dimension glass microprobe easily.
The Neher and doctor Sakmann of the general biophysical chemistry of German horse research institute in 1976 record single pass gas current first with bipolar electrode voltage clamp method on the frog myocyte, thereby have founded patch clamp technique.But utilize the signals such as electric current of patch-clamp system by software acquisition probe resistance, film resting potential, ion channel in cell membrane, this just makes that utilizing scanning electron microscope to combine the mensuration probe resistance with patch clamp technique becomes possibility.
At present, can only adopt the scanning electron microscope technology to observe to the assessment of the glass microprobe proterties of nanoscale.In observation because glass non-conductive, need carry out metal spraying to glass microprobe for the resolution that improves Electronic Speculum handles, specimen preparation difficulty and easily cause the obstruction of glass microprobe pin hole not only, and the bombardment owing to high-pressure electronic causes the damage at the small needle point of nano-dimension glass microprobe tip behind electron microscopy observation, make it can not be scanned the ionic conductance microscope again and carry out high resolving power detection use, reduced the probe utilization factor.In addition, also there is the complicated loaded down with trivial details deficiency that waits of electron microscopic sample metal spraying treatment preparation method thereof.
(3) utility model content:
The purpose of this utility model is to make up the instrument and equipment of a kind of non-destructive ground assessment nano-dimension glass microprobe performance, it is at the deficiency of existing scanning electron microscope in the appraisal procedure of the glass microprobe proterties of nanoscale, and a kind of easy evaluation measures that utilizes the non-damage nano-dimension glass microprobe performance that scanning electron microscope combines with patch clamp technique is provided.
The technical solution of the utility model: the instrument and equipment of a kind of non-destructive ground assessment nano-dimension glass microprobe performance, comprise glass microprobe, it is characterized in that it also comprises scanning electron microscope and the patch-clamp resistance measurement equipment that is used to observe the glass microprobe shape; Said patch-clamp resistance measurement equipment is made of patch clamp amplifier and data acquisition software, and said patch clamp amplifier is connected with the glass microprobe that charges the interior liquid of electrode, and said data acquisition software is measured glass microprobe resistance.
Liquid is 0.15M KCl in the above-mentioned said electrode.
Above-mentioned said patch clamp amplifier adopts commercial U.S. Axon patch-clamp Multiclamp 700B amplifier.
The data acquisition software of above-mentioned said measurement glass microprobe resistance adopts Clampex 10.2 data acquisitions and analysis software.
Above-mentioned said glass microprobe draws borosilicate or the quartzy microelectrode glass capillary that forms for drawing instrument through microelectrode.
The course of work of the present utility model:
(1) utilize scanning electron microscope that the shape of glass microprobe is observed earlier: after the side-looking that obtains high-resolution glass microprobe needle point and overlooking stereoscan photograph, to utilize scanning electron microscope analysis software can measure the inside radius (r of glass microprobe needle point easily
i) and inwall half-angle (θ), again by glass microprobe resistance calculations formula:
Can estimate the resistance value of this glass microprobe after charging the electrode electrolyte inside; In the formula: R
ProbeRepresent glass microprobe resistance, the ξ representative charges the conductivity of glass microprobe electrolyte inside, r
iRepresent the inside radius of glass microprobe needle point, θ represents the inwall half-angle of glass microprobe needle point;
(2) utilize patch clamp technique to survey the resistance value of glass microprobe, promptly adopt with scanning electron microscope observation in microprobe adopt identical drawing parameter to prepare glass microprobe, liquid in the electrode (0.15MKCl) will be charged in it, and built-in Ag/AgCl electrode, reference Ag/AgCl electrode places the vessel that contain identical electrolytic solution, measures glass microprobe resistance by commercial patch clamp technique;
(3) the glass microprobe resistance that records by patch-clamp of comparative analysis with by the scanning electron microscope observation glass microprobe resistance of formula estimation as calculated again, two kinds of glass microprobe resistance value basically identicals that method obtains, and the microprobe of measuring after the resistance can be used for follow-up scanning (the living body biological sample being scanned as utilizing the scan ion electricity to lead microtechnic) or patch-clamp record (full cell/single channel recording).
Superiority of the present utility model: more simple and efficient with the patch-clamp resistance measurement method common means of analyzing the glass microprobe proterties that combine with the scanning electron microscope technology, and can be intuitively, reliable, performance and drawing quality thereof that nano-dimension glass microprobe is judged on non-destructive ground.
(4) description of drawings:
Fig. 1 is the structured flowchart of the instrument and equipment of the related a kind of non-destructive of the utility model ground assessment nano-dimension glass microprobe performance.
Fig. 2 is the workflow diagram of the instrument and equipment of the related a kind of non-destructive of the utility model ground assessment nano-dimension glass microprobe performance.
Fig. 3 is that (wherein, A is the probe tip vertical view for the stereoscan photograph of glass microprobe in the instrument and equipment of the related a kind of non-destructive of the utility model ground assessment nano-dimension glass microprobe performance; B is a glass microprobe tip side view).
Fig. 4 utilizes patch-clamp resistance measurement measuring apparatus electrode resistance for the instrument and equipment of the related a kind of non-destructive of the utility model ground assessment nano-dimension glass microprobe performance.
(5) embodiment:
Embodiment: the instrument and equipment (see figure 1) of a kind of non-destructive ground assessment nano-dimension glass microprobe performance, comprise glass microprobe, it is characterized in that it also comprises scanning electron microscope and the patch-clamp resistance measurement equipment that is used to observe the glass microprobe shape; Said patch-clamp resistance measurement equipment is made of patch clamp amplifier and data acquisition software, and said patch clamp amplifier is connected with the glass microprobe that charges the interior liquid of electrode, and said data acquisition software is measured glass microprobe resistance.
At first adopt the shape and the proterties such as most advanced and sophisticated inside and outside footpath and inwall half-angle of the glass microprobe that scanning electron microscopic observation draws.The glass microprobe imaging that obtains under the scanning electron microscope shows probe tip shape symmetry, and the probe tip inside radius is 27nm, and external radius is that 60nm (sees Fig. 3-A, Fig. 3-B).The inwall half-angle θ of this glass microprobe=2.7 ° adopts R
Pipette=1/ π ξ r
iTan θ computing formula estimates that to probe resistance the resistance that obtains this glass microprobe is about 130M Ω.
The draw conditions of fixing above-mentioned glass microprobe, and the glass microprobe that many of continuous drawings have a close needlepoint form is used for patch-clamp resistance measurement experiment.The glass microprobe that will charge liquid (0.15M KCl) in the electrode links to each other with commercial U.S. Axon patch-clamp Multiclamp 700B amplifier, come measuring probe resistance by the Clampex10.2 data analysis software, the probe resistance value that obtains is 137.6 ± 24.7M Ω (n=16), the short and numerical stability (see figure 4) of required Measuring Time.The resistance value of the glass microprobe that will be calculated with the glass microprobe needlepoint form data that scanning electron microscope records and the glass microprobe resistance that patch-clamp records compare analysis, two kinds of glass microprobe resistance value basically identicals that method obtains have as can be seen all reflected the performance (see figure 2) of nano-dimension glass microprobe well.
Claims (4)
1. the instrument and equipment of a non-destructive ground assessment nano-dimension glass microprobe performance comprises glass microprobe, it is characterized in that it also comprises scanning electron microscope and the patch-clamp resistance measurement equipment that is used to observe the glass microprobe shape; Said patch-clamp resistance measurement equipment is made of patch clamp amplifier, and said patch clamp amplifier is connected with the glass microprobe that charges the interior liquid of electrode.
2. according to the instrument and equipment of the said a kind of non-destructive of claim 1 ground assessment nano-dimension glass microprobe performance, it is characterized in that liquid is 0.15M KCl in the said electrode.
3. according to the instrument and equipment of the said a kind of non-destructive of claim 1 ground assessment nano-dimension glass microprobe performance, it is characterized in that said patch clamp amplifier adopts commercial U.S. Axon patch-clamp Multiclamp 700B amplifier.
4. according to the instrument and equipment of the said a kind of non-destructive of claim 1 ground assessment nano-dimension glass microprobe performance, it is characterized in that said glass microprobe draws borosilicate or the quartzy microelectrode glass capillary that forms for drawing instrument through microelectrode.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009202502149U CN201974444U (en) | 2009-11-12 | 2009-11-12 | Instrument for non-destructive evaluation of nano-scale glass microprobe performance |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009202502149U CN201974444U (en) | 2009-11-12 | 2009-11-12 | Instrument for non-destructive evaluation of nano-scale glass microprobe performance |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201974444U true CN201974444U (en) | 2011-09-14 |
Family
ID=44579544
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2009202502149U Expired - Fee Related CN201974444U (en) | 2009-11-12 | 2009-11-12 | Instrument for non-destructive evaluation of nano-scale glass microprobe performance |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN201974444U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107300629A (en) * | 2017-07-31 | 2017-10-27 | 清华大学 | Scan probe scaling method |
-
2009
- 2009-11-12 CN CN2009202502149U patent/CN201974444U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107300629A (en) * | 2017-07-31 | 2017-10-27 | 清华大学 | Scan probe scaling method |
| CN107300629B (en) * | 2017-07-31 | 2019-07-09 | 清华大学 | Scan probe scaling method |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Kai et al. | Scanning electrochemical microscopy at the nanometer level | |
| Gavara | A beginner's guide to atomic force microscopy probing for cell mechanics | |
| Zheng et al. | Single cell analysis at the nanoscale | |
| Page et al. | Fast nanoscale surface charge mapping with pulsed-potential scanning ion conductance microscopy | |
| Takahashi et al. | Nanoscale visualization of redox activity at lithium-ion battery cathodes | |
| Katemann et al. | Localised electrochemical impedance spectroscopy with high lateral resolution by means of alternating current scanning electrochemical microscopy | |
| Ballesteros Katemann et al. | Constant‐Distance Mode Scanning Electrochemical Microscopy. Part II: High‐Resolution SECM Imaging Employing Pt Nanoelectrodes as Miniaturized Scanning Probes | |
| US9316613B2 (en) | Pipets containing electrolyte and electrodes | |
| Nogala et al. | Atomic force microscopy of electrochemical nanoelectrodes | |
| CN102071135A (en) | High resolution patch clamp based on scanning probe microscopy technology and operating method thereof | |
| CN103197102B (en) | Single-cell/single-molecule imaging light/electricity comprehensive tester based on multifunctional probe | |
| CN110108905B (en) | Method and device for detecting membrane potential and nerve cell membrane repairing behaviors of nerve cells | |
| CN103585004B (en) | Nanometer sensing needle and manufacturing method thereof | |
| Dang et al. | Scanning gel electrochemical microscopy (SGECM): The potentiometric measurements | |
| CN102353818A (en) | Device and method for evaluating neuron-like differentiation degree of PC12 cell | |
| CN1683917A (en) | United measuring system and its measuring technology for scanning channel microscope and scanning micro electrode | |
| CN106501292A (en) | A kind of high-resolution crystal orientation preparation method based on scanning electron microscope | |
| Gao et al. | Precise Polishing and Electrochemical Applications of Quartz Nanopipette-Based Carbon Nanoelectrodes | |
| CN201974444U (en) | Instrument for non-destructive evaluation of nano-scale glass microprobe performance | |
| Jin et al. | Electrochemical Visualization of Membrane Proteins in Single Cells at a Nanoscale Using Scanning Electrochemical Cell Microscopy | |
| CN202256386U (en) | Device for evaluating neuron-like differentiation degree of PC12 cells | |
| CN101430322B (en) | Operation method for non-destructive estimation of nano-dimension glass microprobe performance | |
| CN108333391A (en) | A kind of surface impedance imaging test method and device based on atomic force microscope | |
| CN102455371A (en) | Device and method for evaluating malignancy degree of neuroblastoma | |
| CN201654064U (en) | High resolution patch clamp device based on scanning probe microscopy technology |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20110914 Termination date: 20141112 |
|
| EXPY | Termination of patent right or utility model |