CN201837697U - Analog test device for test carrier plate - Google Patents
Analog test device for test carrier plate Download PDFInfo
- Publication number
- CN201837697U CN201837697U CN2010205124953U CN201020512495U CN201837697U CN 201837697 U CN201837697 U CN 201837697U CN 2010205124953 U CN2010205124953 U CN 2010205124953U CN 201020512495 U CN201020512495 U CN 201020512495U CN 201837697 U CN201837697 U CN 201837697U
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- carrier plate
- signal
- simulating
- chip
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Abstract
The utility model provides an analog test device for a test carrier plate. The analog test device comprises the test carrier plate. At least one chip to be tested, an analog signal test module and an automatic test table joint are installed on the test carrier plate, wherein the analog signal test module is electrically connected with the chip to be tested through a built-in high-speed connector so as to test an analog signal; and the automatic test table joint is electrically connected with the chip to be tested, so that the chip to be tested can be connected with an automatic test table by the automatic test table joint and then break-circuit and short-circuit test can be conducted. Through modular design, related test on an element to be tested can be fulfilled; the utilization rate of the test table is enhanced, the complexity of the test carrier plate can be lowered, and the test cost can be greatly reduced; and the analog test device can be used for various test tables.
Description
Technical field
The relevant a kind of proving installation that is used for test carrier plate of the utility model particularly has modular design about a kind of, and is used for the simulating test device of test carrier plate.
Background technology
Along with the development of integrated circuits degree of integration need be more and more high, the also built-in more and more many analog signal processing computing circuits of system single chip.Though it is many that the whole output value of whole chip improves, degree of difficulty and cost when this measure has also increased test.
The proving installation framework of the simulating signal of existing test macro single-chip, see also shown in Figure 1, it mainly is provided with an element under test on a test carrier plate 10 (The built-in has an analog signal processing computing circuit 122 for Device under test, system single chip 12 DUT); On test carrier plate 10, be provided with a high-order ATE (automatic test equipment) (high end ATE) joint 14 in addition, in order to connect a high-order ATE (automatic test equipment) board 16, and utilize high-order ATE (automatic test equipment) joint 14 that system single chip 12 and 16 formation of high-order ATE (automatic test equipment) board are electrically connected, to carry out measuring signal, utilize high-order ATE (automatic test equipment) board 16 built-in 162 pairs of system single chips of simulating signal analysis module, 12 interior analog signal processing computing circuits 122 to carry out the simulating signal test.
Another kind of existing proving installation then sees also shown in Figure 2, and its system single chip 22, a relay (relay) 24, ATE (automatic test equipment) joint 26 and that mainly is provided with an element under test on a test carrier plate 20 is accompanied slowdown monitoring circuit 28.This kind mode utilizes relay 24 to make the test path switch test,, or utilize and accompany 28 pairs of system single chips of slowdown monitoring circuit 22 to carry out the test of simulating signal system single chip 22 (open)/short circuit (short) test of opening circuit with the ATE (automatic test equipment) board that utilize to connect ATE (automatic test equipment) joint 26; But accompany slowdown monitoring circuit 28 under this kind framework, only the measurement that can carry out on the function system single chip 22 can't be confirmed test to signal quality.And in actual operation, can make and relevant issues such as become test carrier plate 20 more complicated the and required test duration is longer.
Since adopting the high integrated circuit of integrating has been inevitable trend, finds out solution solution test bottleneck and be only when the affair that is bursting to of being engaged in.Above-mentioned two kinds of solutions are nothing more than being to increase functional module or directly upgrade board, but these methods all need to spend many money costs.In addition, it is to upgrade or to increase functional module that also there is tester table quite a lot in existing test manufacturer, if these boards can't drop into product test, probably is one to lose greatly for test manufacturer.
In view of this, the utility model proposes a kind of simulating test device that is used for test carrier plate, be present in these shortcomings of prior art with solution.
Summary of the invention
Fundamental purpose of the present utility model is to provide a kind of simulating test device that is used for test carrier plate, it utilizes modular design, utilize high speed connector to be integrated on the test carrier plate again, to finish the relevant analogue signal circuit interface test of element under test, not only can improve the use mobility of tester table, more can reduce the simulating signal complexity of test carrier plate, significantly to reduce its testing cost.
Another purpose of the present utility model is to provide a kind of simulating test device that is used for test carrier plate, and it can use the tester table of lower-order to come the high speed analog signal interface test of effective resolution system single-chip.
A purpose more of the present utility model is to provide a kind of simulating test device that is used for test carrier plate, and it is modular design and is independent running, so applicable to the automatic test machine platform of various labels; And utilize the module board design, more fast changeable is to different test carrier plates.
Another purpose of the present utility model is to provide a kind of simulating test device that is used for test carrier plate, and it can go out various simulating signal test modules according to client's actual demand Flexible Design.
For achieving the above object, the simulating test device that is used for test carrier plate that the utility model proposes includes: a test carrier plate, and can be on it at least one chip to be measured is installed; And have a simulating signal test module to be installed on this test carrier plate, and utilize a built-in high speed connector to be electrically connected to chip to be measured, to carry out the simulating signal test.
Moreover, on above-mentioned test carrier plate, more being provided with an automatic test machine platform joint, it is electrically connected chip to be measured, makes chip to be measured can utilize this automatic test machine platform joint to be connected to an automatic test machine platform, to open circuit or short-circuit test.
In addition, for testing switching, the utility model more is provided with one and switches switches set, described change-over switch group one end is connected to chip to be measured, the described change-over switch group other end is connected to simulating signal test module and automatic test machine platform joint respectively, be electrically connected to simulating signal test module or automatic test machine platform joint in order to switch chip selectivity to be measured, to carry out the simulating signal test respectively or to open circuit or short-circuit test.
During enforcement, this automatic test machine platform is high-order automatic test machine platform or low order automatic test machine platform.
During enforcement, this simulating signal test module more comprises:
At least one analog digital converting unit connects this high speed connector, receiving an analog test signal, and converts thereof into a digital test signal;
One digital signal processing unit, it connects this analog digital converting unit, and this digital test signal of receiving and analyzing, to detect its signal quality; And
But a modulation frequency generator, it connects this digital signal processing unit, so that its required clock signal to be provided.
During enforcement, the movable plug-in of this simulating signal test module is inserted on this test carrier plate.
Compared with prior art, the simulating test device that is used for test carrier plate described in the utility model, it utilizes modular design, utilize high speed connector to be integrated on the test carrier plate again, to finish the relevant analogue signal circuit interface test of element under test, not only can improve the use mobility of tester table, more can reduce the simulating signal complexity of test carrier plate, significantly to reduce its testing cost.
Beneath by the appended graphic explanation in detail of specific embodiment cooperation, when the effect that is easier to understand the purpose of this utility model, technology contents, characteristics and is reached.
Description of drawings
Fig. 1 is the proving installation synoptic diagram of the simulating signal of existing test macro single-chip.
Fig. 2 is another proving installation synoptic diagram of the simulating signal of existing test macro single-chip.
Fig. 3 is the block schematic diagram of basic framework of the present utility model.
Fig. 4 is the block schematic diagram that the utility model is connected to the application architecture of automatic test machine platform.
Description of reference numerals: 10-test carrier plate; The 12-system single chip; 122-analog signal processing computing circuit; 14-high-order ATE (automatic test equipment) (high end ATE) joint; 16-high-order ATE (automatic test equipment) board; 162-simulating signal analysis module; The 20-test carrier plate; The 22-system single chip; 24-relay (relay); 26-ATE (automatic test equipment) joint; 28-accompanies slowdown monitoring circuit; The 30-test carrier plate; 32-chip to be measured; 322-analog signal processing computing circuit; 34-simulating signal test module; The 341-high speed connector; The 342-analog digital converting unit; The 343-digital signal processing unit; But 344-modulation frequency generator; 36-automatic test machine platform joint; 38-change-over switch group; 40-automatic test machine platform.
Embodiment
The utility model utilizes the design of modular simulating signal test module, and the built-in high speed connector of mating die analog signal test module is integrated on the test carrier plate simultaneously, to finish the relevant analogue signal circuit interface test of element under test; So the utility model not only can improve the use mobility of tester table, more can reduce the simulating signal complexity of test carrier plate, and significantly reduce testing cost.
Fig. 3 is the block schematic diagram of basic framework of the present utility model, see also shown in the 3rd figure, this simulating test device includes a test carrier plate 30, can for example have the system single chip of analog signal processing computing circuit at least one chip to be measured 32 with analog signal processing computing circuit 322 is installed on it; And this test carrier plate 30 is provided with a simulating signal test module 34, and it is electrically connected to chip 32 to be measured, analog signal processing computing circuit 322 is carried out the simulating signal test.Wherein, have a high speed connector 341 in this simulating signal test module 34, to be electrically connected to chip 32 to be measured by this high speed connector 341; But simulating signal test module 34 includes at least one analog digital converting unit 342, a digital signal processing unit 343 and a modulation frequency generator 344 in addition, analog digital converting unit 342 is electrically connected to high speed connector 341, with the analog test signal of reception, and convert thereof into a digital test signal from chip 32 to be measured; Be electrically connected 343 receptions of digital signal processing unit of analog digital converting unit 342 and analyze this digital test signal, to detect its signal quality; And but modulation frequency generator 344 is electrically connected to digital signal processing unit 343, so that its required clock signal to be provided.
Moreover, for making simulating test device of the present utility model except carrying out the simulating signal attribute test, more can generally open circuit or short-circuit test, see also shown in Figure 4, on this test carrier plate 30, more be provided with an automatic test machine platform joint 36, it sees through a switching switches set 38 and is electrically connected to chip 32 to be measured, makes chip 32 to be measured can utilize automatic test machine platform joint 36 to be connected to an automatic test machine platform 40, to open circuit or short-circuit test; And this automatic test machine platform 40 can be high-order automatic test machine platform or low order automatic test machine platform.Certainly, the cutter end (pole) of this change-over switch group 38 is connected to this chip 32 to be measured, throw end (throw) and then be connected to simulating signal test module 34 and automatic test machine platform joint 36 respectively for two of the other end, be electrically connected to simulating signal test module 34 and carry out simulating signal signal quality test in order to switch these chip 32 selectivity to be measured, or be electrically connected to automatic test machine platform joint 36, open circuit or short-circuit test to be connected to automatic test machine platform 40 by this.
Because the movable plug-in of simulating signal test module of the present utility model is inserted on the test carrier plate, so be modular unit design.And because of modular design of the present utility model also can independently operate (machine independence), therefore applicable to the ATE (automatic test equipment) of various labels, comprise high-order or low order automatic test machine platform, make existing manufacturer can use the tester table of lower-order to come the high speed analog signal interface test of effective resolution system single-chip.What is more, the utility model is the different test carrier plate of fast changeable more, also can go out various simulating signal test modules according to client's actual demand Flexible Design, uses quite extensive.
With the main difference of simulating test device of the present utility model and prior art solutions, bar is listed as shown in the following Table I.
Table one
Above-described embodiment only is explanation technological thought of the present utility model and characteristics, its purpose makes the personage who has the knack of this skill can understand content of the present utility model and is implementing according to this, when can not with qualification claim of the present utility model, promptly the equalization of doing according to the spirit that the utility model disclosed generally changes or modifies, and must be encompassed in the claim of the present utility model.
Claims (6)
1. a simulating test device that is used for test carrier plate is characterized in that, comprising:
One test carrier plate supplies to install at least one chip to be measured on it; And
One simulating signal test module, it is located on this test carrier plate, and utilizes a built-in high speed connector to be electrically connected to this chip to be measured, to carry out the simulating signal test.
2. the simulating test device that is used for test carrier plate as claimed in claim 1, it is characterized in that, more comprise an automatic test machine platform joint, this automatic test machine platform head is located on this test carrier plate, and be electrically connected this chip to be measured, make this chip to be measured utilize this automatic test machine platform joint to be connected to an automatic test machine platform, to open circuit or short-circuit test.
3. the simulating test device that is used for test carrier plate as claimed in claim 2, it is characterized in that, comprise that more one switches switches set, described change-over switch group one end is connected to this chip to be measured, the described change-over switch group other end is connected to this simulating signal test module and this automatic test machine platform joint, is electrically connected to this simulating signal test module or automatic test machine platform joint in order to switch this chip selectivity to be measured.
4. the simulating test device that is used for test carrier plate as claimed in claim 2 is characterized in that, this automatic test machine platform is high-order automatic test machine platform or low order automatic test machine platform.
5. the simulating test device that is used for test carrier plate as claimed in claim 1 is characterized in that, this simulating signal test module more comprises:
At least one analog digital converting unit connects this high speed connector, receiving an analog test signal, and converts this analog test signal to a digital test signal;
One digital signal processing unit, it connects this analog digital converting unit, and this digital test signal of receiving and analyzing, to detect the signal quality of this digital test signal; And
But a modulation frequency generator, it connects this digital signal processing unit, to provide this digital signal processing unit required clock signal.
6. the simulating test device that is used for test carrier plate as claimed in claim 1 is characterized in that, the movable plug-in of this simulating signal test module is inserted on this test carrier plate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010205124953U CN201837697U (en) | 2010-09-01 | 2010-09-01 | Analog test device for test carrier plate |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010205124953U CN201837697U (en) | 2010-09-01 | 2010-09-01 | Analog test device for test carrier plate |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201837697U true CN201837697U (en) | 2011-05-18 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2010205124953U Expired - Fee Related CN201837697U (en) | 2010-09-01 | 2010-09-01 | Analog test device for test carrier plate |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN201837697U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103185847A (en) * | 2011-12-29 | 2013-07-03 | 英业达股份有限公司 | Auxiliary test device |
| CN109406988A (en) * | 2018-11-02 | 2019-03-01 | 成都天衡智造科技有限公司 | A kind of analog IC test is abnormal to overshoot quick positioning analysis system and method |
| CN113406463A (en) * | 2020-03-16 | 2021-09-17 | 苏州明皜传感科技有限公司 | Semiconductor finished product modularization testing arrangement |
-
2010
- 2010-09-01 CN CN2010205124953U patent/CN201837697U/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103185847A (en) * | 2011-12-29 | 2013-07-03 | 英业达股份有限公司 | Auxiliary test device |
| CN103185847B (en) * | 2011-12-29 | 2015-11-25 | 英业达股份有限公司 | Auxiliary test unit |
| CN109406988A (en) * | 2018-11-02 | 2019-03-01 | 成都天衡智造科技有限公司 | A kind of analog IC test is abnormal to overshoot quick positioning analysis system and method |
| CN113406463A (en) * | 2020-03-16 | 2021-09-17 | 苏州明皜传感科技有限公司 | Semiconductor finished product modularization testing arrangement |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20110518 Termination date: 20140901 |
|
| EXPY | Termination of patent right or utility model |