CN201716005U - Grating ruler - Google Patents
Grating ruler Download PDFInfo
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- CN201716005U CN201716005U CN2010201165390U CN201020116539U CN201716005U CN 201716005 U CN201716005 U CN 201716005U CN 2010201165390 U CN2010201165390 U CN 2010201165390U CN 201020116539 U CN201020116539 U CN 201020116539U CN 201716005 U CN201716005 U CN 201716005U
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- detector
- main scale
- ruler
- reference point
- main ruler
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Abstract
The utility model relates to a grating ruler which comprises a main ruler and a detector, wherein the main ruler is evenly provided with a plurality of pattern symbols; and the detector is previously provided with a reference point, is arranged above the main ruler, and has a sliding structure relative to the main ruler. The detector is used for acquiring images of the pattern symbols on the main ruler and computing the corresponding measurement position by being combined with the preset reference point. As the detector and the main ruler can be made from universal fittings, compared with the conventional incremental and absolute grating ruler which needs to be matched with the special electron device, the grating ruler is low in cost, is good for the manufacture, can be designed in a miniaturizing way, and is good for the market promotion.
Description
Technical field
The utility model relates to a kind of grating chi, refers in particular to the grating chi that a kind of cost is low and manufacture craft is simplified.
Background technology
Along with advancing by leaps and bounds of optical technology, the grating chi that is used for accurately measuring arises at the historic moment, it combines optics, electronic technology, is widely used in the precision measurement to displacement and speed, to replace vernier caliper or the milscale that tradition needs the binding time measuring tool to measure.Current, the grating chi is divided into two types of increment type and absolute types, and as Fig. 1, increment type grating chi is to adopt AB to export mutually to produce the electric signal that near sinusoidal changes, to reach the purpose of position detecting; As Fig. 2, absolute type grating chi includes code area (ABS) 1 ' and increment district (INC) 2 ', and code area 1 ' is to adopt the photosensitive device reading, as photodiode etc., increment district 2 ' adopts aforementioned AB phase output mode, finally the two produces the sinusoidal variations electric signal by the digital way of output, realizes the purpose of position detecting.The traditional relatively precision measurement means of above-mentioned grating chi, has the measuring accuracy height, and measured value can be represented by digital signal, make things convenient for reading and transmit of this measured value, yet, during above-mentioned optical grating ruler measurement, owing to all need to have the electron device of high speed processor and use specific software and calculate the measuring position, though its reaction time is very fast, precision is also high, but its cost height has high input, and auxiliary facility is various during making, and be unfavorable for miniaturization Design, and when relatively cooperating, on software or hardware, also can be subjected to certain limitation with computer, be unfavorable for marketing.
The utility model content
The utility model is at the existing disappearance of above-mentioned prior art, fundamental purpose be to provide a kind of cost low, make and simplify and the high grating chi of degree of accuracy.
For realizing above-mentioned purpose, the utility model is taked following technical scheme:
A kind of grating chi comprises a main scale, is evenly distributed with pattern symbol on this main scale; And a detector that is preset with reference point, it is located at the main scale top, and main scale is slide construction relatively, is used to gather the image of pattern symbol on the main scale and calculates the measuring position in conjunction with default reference point locations.
Described detector is a kind of device that the pattern symbol frame of being gathered is calculated the main scale measuring position to the product of spacing between pixel number between the reference point and the pixel.
Described detector is CCD, CIS or cmos image sensor devices.
The advantage of the utility model is that the image and the default reference point of combination that utilize detector to gather pattern symbol on the main scale calculate corresponding measuring position, because this detector and main scale system can adopt universal accessories to make, its relative conventional delta formula and absolute type grating chi need cooperate particular electronic, cost is low, help manufacturing, and more can carry out miniaturization Design, help marketing.
Description of drawings
Fig. 1 is an increment type grating chi principle schematic in the prior art;
Fig. 2 is an absolute type grating chi principle schematic in the prior art;
Fig. 3 is an overall schematic of the present utility model.
The drawing reference numeral explanation:
1 ', code area 2 ', increment district
10, main scale 11, pattern symbol
12, framing mask
20, detector 21, reference point
Embodiment
Below in conjunction with accompanying drawing and embodiment the utility model is further described.
As shown in Figure 3, a kind of grating chi comprises that a main scale 10 and is preset with the detector 20 of reference point 21, wherein:
Be distributed with the pattern symbol 11 of measurement effect on the described main scale 10, described detector 20 can be CCD, CIS or cmos image sensor devices; This detector 20 is attached to main scale 10 tops, and main scale 10 slides relatively, system be used to gather main scale 10 pattern symbol 11 image and calculate the measuring position in conjunction with reference point locations, particularly, this detector 20 is the measuring position that the framing mask 12 of pattern symbol on the collection main scale 10 is calculated main scale 10 to the product of spacing between pixel number between the reference point 21 and the pixel.
The utility model design focal point is that the image and the default reference point of combination that utilize detector to gather pattern symbol on the main scale calculate corresponding measuring position, because this detector and main scale system can adopt universal accessories to make, its relative conventional delta formula and absolute type grating chi need cooperate particular electronic, cost is low, help manufacturing, and more can carry out miniaturization Design, help marketing.
The above, it only is the utility model preferred embodiment, be not that technical scope of the present utility model is imposed any restrictions, so every foundation technical spirit of the present utility model all still belongs in the scope of technical solutions of the utility model any trickle modification, equivalent variations and modification that above embodiment did.
Claims (2)
1. a grating chi is characterized in that: comprise
One main scale is evenly distributed with pattern symbol on this main scale; And
One is preset with the detector of reference point, and it is located at the main scale top, and main scale is slide construction relatively, is used to gather the image of pattern symbol on the main scale and calculates the measuring position in conjunction with default reference point locations.
2. according to the described a kind of grating chi of claim 1, it is characterized in that: described detector is CCD, CIS or cmos image sensor devices.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2010201165390U CN201716005U (en) | 2010-02-09 | 2010-02-09 | Grating ruler |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2010201165390U CN201716005U (en) | 2010-02-09 | 2010-02-09 | Grating ruler |
Publications (1)
Publication Number | Publication Date |
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CN201716005U true CN201716005U (en) | 2011-01-19 |
Family
ID=43462009
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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CN2010201165390U Expired - Lifetime CN201716005U (en) | 2010-02-09 | 2010-02-09 | Grating ruler |
Country Status (1)
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CN (1) | CN201716005U (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102706373A (en) * | 2012-05-24 | 2012-10-03 | 广东工业大学 | Single-track absolute grating scale and image coding method thereof |
CN103063239A (en) * | 2012-12-28 | 2013-04-24 | 广东工业大学 | Test platform and test method for absolute grating ruler |
CN108627097A (en) * | 2018-05-09 | 2018-10-09 | 广东工业大学 | A kind of absolute grating scale |
CN111336928A (en) * | 2020-03-13 | 2020-06-26 | 中国科学院长春光学精密机械与物理研究所 | Metal reflective absolute grating ruler based on image detector |
-
2010
- 2010-02-09 CN CN2010201165390U patent/CN201716005U/en not_active Expired - Lifetime
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102706373A (en) * | 2012-05-24 | 2012-10-03 | 广东工业大学 | Single-track absolute grating scale and image coding method thereof |
CN102706373B (en) * | 2012-05-24 | 2015-01-21 | 广东工业大学 | Single-track absolute grating scale and image coding method thereof |
CN103063239A (en) * | 2012-12-28 | 2013-04-24 | 广东工业大学 | Test platform and test method for absolute grating ruler |
CN103063239B (en) * | 2012-12-28 | 2016-03-23 | 广东工业大学 | A kind of absolute grating ruler test platform and method of testing thereof |
CN108627097A (en) * | 2018-05-09 | 2018-10-09 | 广东工业大学 | A kind of absolute grating scale |
CN108627097B (en) * | 2018-05-09 | 2020-05-08 | 广东工业大学 | Absolute grating ruler |
CN111336928A (en) * | 2020-03-13 | 2020-06-26 | 中国科学院长春光学精密机械与物理研究所 | Metal reflective absolute grating ruler based on image detector |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
CX01 | Expiry of patent term |
Granted publication date: 20110119 |
|
CX01 | Expiry of patent term |