CN201489040U - Central junction box testing apparatus - Google Patents
Central junction box testing apparatus Download PDFInfo
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- CN201489040U CN201489040U CN2009201344330U CN200920134433U CN201489040U CN 201489040 U CN201489040 U CN 201489040U CN 2009201344330 U CN2009201344330 U CN 2009201344330U CN 200920134433 U CN200920134433 U CN 200920134433U CN 201489040 U CN201489040 U CN 201489040U
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Abstract
The utility model relates to a central junction box testing apparatus that comprises a master control module, a plurality of secondary control module and a plurality of electronic load circuits, wherein each secondary control module controls one or a plurality of electronic load circuits; the master control module sends a command to control each secondary MCU control module; according to the command of the master control module, each secondary control module sends an electric signal to control the current of a corresponding electronic load circuit; the total number of the electronic load circuits is at least equal to that of parts comprised by the tested central junction box; and each part of the central junction box is respectively connected with a different electronic load circuit in series. By controlling the current of the electronic load circuit to authentically simulate the current situation when the central junction box works normally, and using the control module to control the plurality of electronic load circuits and the characteristic that the current of the electronic load circuit is adjustable, the central junction box testing apparatus capable of testing different central junction boxes is realized.
Description
Technical field
The utility model relates to a kind of automobile-used central terminal box proving installation, is mainly used in the anti-overcurrent strength performance test of automobile-used central terminal box.
Background technology
Central authorities' terminal box is very important parts on the automobile.Central authorities' terminal box is as the block terminal of a lot of electrical components, integrated elements such as fuse in a large number, relay.These elements can flow through very big electric current during work, and can produce a large amount of heats, cause central terminal box temperature to raise, and can burn out these elements when serious.The quality of central authorities' terminal box directly has influence on operational stability, security and the permanance of automobile.So automobile-used central terminal box all must be through severe test before entrucking.Test comprises element pressure drop, excess current, salt affair acid test etc., and wherein excess current is even more important.
When central terminal box is carried out the test of anti-excess current, generally be that each element in the central terminal box is connected in series respectively in the corresponding circuit, making has a certain size electric current to flow through each element; In order better to simulate the working condition of central terminal box in the reality, be not to make each element that the electric current process all be arranged simultaneously in test process, but allow subelement that the electric current process is arranged, then at the element of different moment switch current processes, thereby test central terminal box workable time before damage.If this time is long more, show that then the anti-excess current performance of central terminal box is good more; On the contrary, then anti-excess current performance is poor more.
Yet, examine the anti-overcurrent strength performance not a duck soup of the used central terminal box of different automobile types.The one, the used automobile-used central terminal box difference of every money vehicle is very big, and the interface difference will realize that general test is difficult to; The 2nd, because the circuit that test carriage need provide a lot of roads and electric current to have nothing in common with each other during with central terminal box, if with actual loading supporting on the car, cost height not only, and be not suitable for the research and development product; If with the high-power resistance simulation, then be difficult to satisfy requirement to the particular electrical resistance.
The utility model content
Technical problem to be solved in the utility model is, at the versatility difference problem of the proving installation of central terminal box in the prior art, thereby provides the central terminal box proving installation that a kind of versatility is good, can test multiple central terminal box.
The technical scheme that the utility model adopted is, a kind of central terminal box proving installation, comprise total MCU control module, a plurality of secondary MCU control modules, multichannel electronic load circuit, be electrically connected and gather the current acquisition circuit and the corresponding current displaing unit of its electric current with each electronic load circuit, described total MCU control module is electrically connected with each secondary MCU control module respectively, each secondary MCU control module is electrically connected with one or more electronic load circuit, thereby described each secondary MCU control module is sent the size of electric signal control respective electronic load circuit electric current according to the order of total MCU control module, the number of the element under test that total way of described electronic load circuit is comprised with tested central terminal box at least equates, each element under test of central authorities' terminal box is serially connected with in each electronic load circuit the electric current that the output signal of described secondary MCU control module received current Acquisition Circuit and Control current display unit show each electronic load circuit respectively.
The utility model is controlled multichannel electronic load circuit simultaneously by utilizing total MCU control module and secondary MCU control module, utilized adjustable characteristics of electronic load circuital current and MCU control module can control the characteristics of multichannel electronic load circuit simultaneously fully, thereby reached the energising sight of real simulated central authorities' terminal box when operate as normal, measured its anti-overcurrent strength performance in the time that following of analog case can be carried out work by observing central terminal box; Because the electronic load circuital current can be regulated according to actual needs, thus can test different central terminal boxes, thus realized characteristics that can be general.
Description of drawings
Fig. 1 is total framework synoptic diagram of the utility model central authorities terminal box proving installation;
Fig. 2 is the preferred a kind of central terminal box proving installation electronic load circuit theory diagrams of the utility model;
Fig. 3 is the schematic diagram of the filtering circuit of current-order;
Fig. 4 is the schematic diagram of current acquisition circuit;
Fig. 5 is the schematic diagram of voltage feedback circuit;
Fig. 6 is the schematic diagram of voltage collection circuit;
Embodiment
As shown in Figure 1, total framework synoptic diagram for the utility model central authorities terminal box proving installation, be electrically connected with a plurality of secondary MCU control modules under total MCU control module, be electrically connected with a plurality of electronic load circuit under each secondary MCU control module, each road electronic load is controlled by a secondary MCU control module only, the way of electronic load circuit at least should with the element under test of being tested that central terminal box comprised (as fuse, relay) number equates, the way of the electronic load circuit that each secondary MCU control module can be controlled is determined by MCU chip self, thereby the way of electronic load circuit has also just determined the quantity of secondary MCU control module, each secondary MCU control module can be controlled the electronic load circuit of maximum quantity, also can only control one the tunnel or several roads electronic load, can be in the reality according to the quantity of the electronic load circuit of being controlled under the quantity of the secondary MCU control module of being surveyed of element under test number choose reasonable that central terminal box comprised and each the secondary MCU control module; Thereby secondary MCU control module is sent the size that electric signal is regulated respective electronic load circuit electric current to its electronic load circuit of controlling, how to regulate will be described in more detail below; Realize communication with the CAN bus between total MCU control module and each the secondary MCU control module, total MCU control module is sent the instruction of each electronic load circuital current of control to each secondary MCU control module by the CAN bus, each secondary MCU control module is analyzed, is decoded after receiving the instruction that total MCU control module sent out, send current-order to corresponding electronic load circuit then, thus the size of control respective electronic load circuit electric current; Each element of central authorities' terminal box is serially connected with respectively in the different electronic load circuit, thereby make the electric current that flows through electronic load equate, therefore control the electric current that flows through electronic load and also just controlled the electric current that flows through corresponding central connector elements with the electric current that flows through the element that is connected in series with this electronic load; With the also corresponding current acquisition circuit that is provided with of each electronic load circuit, be used for acquisition stream and cross the electric current of respective electronic load circuit (that is to say the electric current that flows through corresponding central connector elements); The current acquisition circuit sends to secondary MCU control module with the current signal that collects; Also be connected to the current displaing unit that quantity equates with the way of electronic load circuit under the secondary MCU control module, these current displaing units are used for showing the size of current of each electronic load circuit respectively.
During test, by the program of setting, total MCU control module sends instruction to each secondary MCU control module and makes corresponding electronic load circuit turn-on, and make that the rated current of element of the central terminal box that is connected in series in electric current and this circuit of corresponding electronic load circuit is identical, switching respectively in the different moment then needs the electronic load of conducting circuit turn-on, so that different elements is tested.The current acquisition circuit is ceaselessly gathered the electric current of respective electronic load circuit and is given secondary MCU control module with current feedback, secondary MCU control module Control current display unit shows corresponding current value, if the rated current of the element in the shown numerical value of current displaing unit and the respective electronic load circuit is identical, show that then central terminal box is in normal operating conditions at this moment; When the shown size of current of current displaing unit does not conform to predefined value and differs greatly or when not showing, just can judge that the element that is serially connected with this electronic load circuit damages this moment, also be that central terminal box is damaged, therefore, according to this central authorities' terminal box can operate as normal time can judge the anti-overcurrent strength performance of central terminal box.
As shown in Figure 2, schematic diagram for the preferred a kind of electronic load circuit of the utility model, the element of this electronic load circuit mainly comprises a metal-oxide-semiconductor and part resistance, the drain electrode 1 of metal-oxide-semiconductor is connected to an end of an element of central terminal box, the other end of this element is received a constant pressure source, the source class 2 of metal-oxide-semiconductor is by a stake resistance 3 ground connection, thereby the voltage of constant pressure source passes through the element under test of central terminal box and has been added in the drain electrode and source class and stake resistance 3 of metal-oxide-semiconductor, the grid 4 of metal-oxide-semiconductor receives the current-order that is sent by secondary MCU control module, this current-order can be controlled the size of the resistance of metal-oxide-semiconductor, thereby secondary module can change the size of metal-oxide-semiconductor resistance as long as change the size of current-order; This current instruction value is big more, and then the resistance of metal-oxide-semiconductor is also big more; On the contrary, then the resistance of metal-oxide-semiconductor is little.Because the voltage that is added on metal-oxide-semiconductor and the stake resistance 3 is certain,, also just changed so after the current-order change makes metal-oxide-semiconductor resistance change, flow through the electric current of metal-oxide-semiconductor according to Ohm law; Element because of central terminal box is serially connected between constant pressure source and the metal-oxide-semiconductor again, also and then changes so flow through the electric current of central connector elements.Which element that therefore can pre-determine central terminal box with which electronic load circuit is connected, difference according to the electric current that can bear of central each element of terminal box, thereby total MCU control module just can pre-determine the size that secondary MCU will send to the current-order of metal-oxide-semiconductor when sending order for respective secondary MCU control module, so just can test simultaneously the different elements of central terminal box.In order to prevent that electric current in the electronic load circuit is excessive and burn out element in the circuit, between the drain electrode of metal-oxide-semiconductor and central terminal box, also be serially connected with a fuse 5.Between the source class of metal-oxide-semiconductor and drain electrode, be connected to a diode 6, puncture between metal-oxide-semiconductor source class and the drain electrode damaged this metal-oxide-semiconductor thereby this diode 6 can prevent the induction current that produces when cutting off the electronic load circuit.Secondary MCU control control module is a voltage signal to the current-order that metal-oxide-semiconductor sends, in general in order to prevent to have in this voltage signal other undesired signal, as shown in Figure 3, schematic diagram for the filtering circuit of current-order, between secondary MCU control module and metal-oxide-semiconductor grid, be provided with a filtering circuit, the input end 33 of this filtering circuit receives the current-order that is sent by secondary MCU control module, current-order is outputed to the grid of metal-oxide-semiconductor after filtering by its output terminal 34.
As shown in Figure 4, be the schematic diagram of current acquisition circuit, described current acquisition circuit comprises voltage amplifier circuit part and filtering circuit part.The principle of current acquisition is to gather the voltage at stake resistance 3 two ends, then with this voltage amplification, filtering, filtered voltage is passed to secondary MCU module, secondary MCU module is carried out corresponding computing after receiving voltage signal, this calculating process is roughly the electric current that obtains flowing through stake resistance with this magnitude of voltage divided by the resistance of stake resistance 3, and last secondary MCU control module Control current display unit shows current value.Physical circuit is connected to, two input ends 25,26 of described current acquisition circuit are connected to positive and negative extreme (19,27) of stake resistance 3 respectively, the voltage signal of stake resistance 3 is input to the input end 31 of the filtering circuit of described current acquisition circuit from output terminal 30 after the preceding post-amplifier 28,29 of amplifying circuit amplifies, the output terminal 32 from filtering circuit feeds back to secondary MCU control module with voltage signal then.Because the element of central terminal box and metal-oxide-semiconductor, stake resistance are serially connected, equate with the electric current of the element that flows through central terminal box so flow through the electric current of stake resistance 3.When each electrical equipment unit of central terminal box all during operate as normal, the electric current that flows through each element all should equal the rated current of pre-set each element, and the shown current value of current displaing unit this moment should equate with the load current value of element.If the current value that current displaing unit is shown and the load current value of respective element differ too big, illustrate that then central terminal box no longer is in normal duty, therefore can directly can judge central terminal box according to the shown size of current of current displaing unit and whether damage, can draw the anti-overcurrent strength performance of this central authorities' terminal box then according to total test duration that central terminal box is carried out.
As preferably, in the electronic load circuit, also be provided with voltage feedback circuit, the effect of this voltage feedback circuit is to prevent the overtension of constant pressure source and burn out element in the electronic load circuit, has also prevented that too high constant voltage from causing excessive electric current simultaneously and the element of central terminal box is burnt out.As shown in Figure 5, be the schematic diagram of voltage feedback circuit, this circuit mainly comprises the comparator circuit that an amplifier 7 is formed.Drain electrode 1 at metal-oxide-semiconductor is connected to a bleeder circuit, and this bleeder circuit is composed in series by divider resistance 8,9, and divider resistance 8 other ends link to each other divider resistance 9 other end ground connection with metal-oxide-semiconductor drain electrode 1; The normal phase input end 10 of amplifier 7 links to each other with the positive terminal 11 of divider resistance 9, so the voltage of the normal phase input end 10 of amplifier 7 equates with voltage on the divider resistance 9; The inverting input 12 of amplifier 7 links to each other with a constant pressure source by a variable resistor 13, so the voltage of amplifier negative-phase input 12 is adjustable, and specifically being input to amplifier 7 negative-phase inputs 12 great voltages can specifically regulate according to the side circuit situation.The voltage of the positive and negative phase input end (10,12) of amplifier 7 from output terminal 35 output of amplifier 7, mutually converges formation input end 18 after the input end 14 of the current-order that this output terminal 35 and secondary MCU control module are sent connects a resistance separately through back relatively.The grid 4 of metal-oxide-semiconductor also is connected with an amplifier 15, and the grid 4 of metal-oxide-semiconductor links to each other with the output terminal 16 of amplifier 15, normal phase input end 17 ground connection of amplifier 15.Input end 18 is electrically connected on the negative-phase input of amplifier 15, therefore feedback voltage is with the negative-phase input input of current-order from amplifier 15, thereby control the resistance of metal-oxide-semiconductors then through output terminal 16 outputs of amplifier 15, and then the electric current of control electronic load circuit.
As preferably, the voltage on the stake resistance 3 also is incorporated into the negative-phase input of amplifier 15, promptly the positive terminal 19 of stake resistance 3 is connected to the negative-phase input of amplifier 15.So, when the electric current that flows through the electronic load circuit is excessive, then the voltage on the stake resistance 3 also can increase accordingly, therefore the voltage that is input to the negative-phase input of amplifier 15 increases, make the output voltage of output terminal 16 of amplifier 15 reduce, also promptly make the voltage of the grid 4 that is input to metal-oxide-semiconductor reduce, so the resistance of metal-oxide-semiconductor increases, the final electric current that flows through metal-oxide-semiconductor that makes reduces, and returns to the value of setting; When the electric current that flows through the electronic load circuit reduces, the voltage that feeds back to the negative-phase input of amplifier 15 from stake resistance 3 reduces, thereby make the output voltage of output terminal 16 of amplifier 15 increase, the also promptly feasible voltage that is input to the grid 4 of metal-oxide-semiconductor increases, thereby the resistance decreasing of metal-oxide-semiconductor, the final electric current that flows through metal-oxide-semiconductor that makes increases the value that returns to setting, has also just recovered the electric current of electronic load circuit.Thereby the electricity that plays automatic adjusting electronic load circuit road all the time is in the value of setting, guarantees to flow through the rated current of the electric current of central connector elements for this element.
As preferably, being connected to one between the grid 4 of metal-oxide-semiconductor and ground, to stablize the electric capacity 20 of metal-oxide-semiconductor grid voltage and two anti-phase to the voltage stabilizing diode 21,22 that is connected in series.Electric capacity 20 helps keeping the stable of the voltage that is input to metal-oxide-semiconductor grid 4, and it is excessive and metal-oxide-semiconductor is burnt out that the voltage stabilizing diode 21,22 of anti-phase serial connection helps preventing being input to the voltage of metal-oxide-semiconductor grid 4.
As preferably, drain electrode 1 at metal-oxide-semiconductor is connected to a voltage collection circuit, as shown in Figure 6, schematic diagram for voltage collection circuit, the input end 23 of described voltage collection circuit leaks level 1 with metal-oxide-semiconductor and is electrically connected, its output terminal 24 is electrically connected with secondary MCU control module, also have the correspondent voltage display unit to link to each other in addition with secondary MCU control module, described voltage collection circuit sends to secondary MCU control module with the voltage signal that is collected, and secondary then MCU control module control voltage display unit shows described voltage.So just can directly learn from the voltage display unit whether the voltage of the drain electrode that is added in metal-oxide-semiconductor is normal, so that make adjustment timely.
The foregoing description only is for the utility model is described, rather than to restriction of the present utility model.Those skilled in the art will appreciate that the utility model also can have many modification under the prerequisite that does not break away from the utility model design.
Claims (8)
1. central terminal box proving installation, it is characterized in that, comprise total MCU control module, a plurality of secondary MCU control modules, multichannel electronic load circuit, be electrically connected and gather the current acquisition circuit and the corresponding current displaing unit of its electric current with each electronic load circuit, described total MCU control module is electrically connected with each secondary MCU control module respectively, each secondary MCU control module is electrically connected with one or more electronic load circuit, thereby described each secondary MCU control module is sent the size of electric signal control respective electronic load circuit electric current according to the order of total MCU control module, the number of the element under test that total way of described electronic load circuit is comprised with tested central terminal box at least equates, each element under test of central authorities' terminal box is serially connected with in each electronic load circuit the electric current that the output signal of described secondary MCU control module received current Acquisition Circuit and Control current display unit show each electronic load circuit respectively.
2. central terminal box proving installation according to claim 1, it is characterized in that, described electronic load circuit comprises a metal-oxide-semiconductor, the grid of metal-oxide-semiconductor (4) and secondary MCU module are electrically connected and accept the current-order of its resistance value of change of being sent by secondary MCU module, element one end of central authorities' terminal box is electrically connected on constant pressure source, its other end is electrically connected on the drain electrode (1) of metal-oxide-semiconductor, and the source electrode of metal-oxide-semiconductor (2) passes through a stake resistance (3) and ground connection.
3. central terminal box proving installation according to claim 2, it is characterized in that, described current acquisition circuit comprises signal amplification circuit and filtering circuit, two input ends of described signal amplification circuit are connected to the stake resistance two ends respectively, its output terminal is electrically connected with the input end of filtering circuit, and the output terminal of filtering circuit is electrically connected with secondary MCU control module.
4. central terminal box proving installation according to claim 3, it is characterized in that, the grid of described metal-oxide-semiconductor also is connected with a grid amplifier (15), and the output terminal of this grid amplifier (15) links to each other with the grid (4) of metal-oxide-semiconductor, normal phase input end (17) ground connection of grid amplifier (15); The drain electrode of described metal-oxide-semiconductor (4) also is connected to a bleeder circuit, and described bleeder circuit is composed in series by divider resistance (8,9), and divider resistance (8) other end links to each other divider resistance (9) other end ground connection with metal-oxide-semiconductor drain electrode (1); Described electronic load circuit also comprises the voltage feedback circuit of mainly being made up of a voltage amplifier (7), the normal phase input end of described voltage amplifier (7) is connected to the positive terminal (11) of divider resistance (9), the negative-phase input (12) of voltage amplifier (7) is connected to a standard voltage source, the output terminal of described voltage comparator circuit (35) links to each other with the input end (14) of current-order, and current-order is input to the negative-phase input of grid amplifier (15) with the electric signal of voltage comparator circuit output terminal.
5. central terminal box proving installation according to claim 4 is characterized in that the positive terminal (19) of stake resistance (3) is connected to the negative-phase input of grid amplifier (15).
6. according to the described central terminal box proving installation of one of claim 2 to 5, it is characterized in that being connected to one between the grid of metal-oxide-semiconductor (4) and the ground, to stablize the electric capacity (20) of metal-oxide-semiconductor grid voltage and two anti-phase to the voltage stabilizing diode that is connected in series (21,22).
7. according to the described central terminal box proving installation of one of claim 2 to 5, also be connected to voltage collection circuit and voltage display unit in the described electronic load circuit, thereby the input end of described voltage collection circuit links to each other with the drain electrode of metal-oxide-semiconductor and gathers the voltage of metal-oxide-semiconductor drain electrode, and secondary MCU control module receives the voltage signal of voltage collection circuit and controls the voltage display unit described voltage signal is shown.
8. central terminal box proving installation according to claim 6, it is characterized in that, also be connected to voltage collection circuit and voltage display unit in the described electronic load circuit, thereby the input end of described voltage collection circuit links to each other with the drain electrode of metal-oxide-semiconductor and gathers the voltage of metal-oxide-semiconductor drain electrode, and secondary MCU control module receives the voltage signal of voltage collection circuit and controls the voltage display unit described voltage signal is shown.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009201344330U CN201489040U (en) | 2009-07-30 | 2009-07-30 | Central junction box testing apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009201344330U CN201489040U (en) | 2009-07-30 | 2009-07-30 | Central junction box testing apparatus |
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| Publication Number | Publication Date |
|---|---|
| CN201489040U true CN201489040U (en) | 2010-05-26 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2009201344330U Expired - Lifetime CN201489040U (en) | 2009-07-30 | 2009-07-30 | Central junction box testing apparatus |
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| CN (1) | CN201489040U (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102435891A (en) * | 2011-10-24 | 2012-05-02 | 同致电子科技（厦门）有限公司 | Automatic test device of vehicle central electric junction box |
| CN103364653A (en) * | 2012-04-10 | 2013-10-23 | 海洋王（东莞）照明科技有限公司 | Method for testing maximum load quantity in multi-lamp parallel circuit |
| CN103792470A (en) * | 2014-02-08 | 2014-05-14 | 上海沪工汽车电器有限公司 | Method and device for testing voltage withstanding capacity of car central cable connector |
| CN107290649A (en) * | 2017-07-13 | 2017-10-24 | 广州视源电子科技股份有限公司 | A kind of television board test device |
| CN109375021A (en) * | 2018-11-16 | 2019-02-22 | 浙江理工大学 | A kind of universal program controlled testing system and method for electric car central electrical part holder |
-
2009
- 2009-07-30 CN CN2009201344330U patent/CN201489040U/en not_active Expired - Lifetime
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102435891A (en) * | 2011-10-24 | 2012-05-02 | 同致电子科技（厦门）有限公司 | Automatic test device of vehicle central electric junction box |
| CN102435891B (en) * | 2011-10-24 | 2014-05-14 | 同致电子科技（厦门）有限公司 | Automatic test device of vehicle central electric junction box |
| CN103364653A (en) * | 2012-04-10 | 2013-10-23 | 海洋王（东莞）照明科技有限公司 | Method for testing maximum load quantity in multi-lamp parallel circuit |
| CN103364653B (en) * | 2012-04-10 | 2016-09-28 | 海洋王（东莞）照明科技有限公司 | The method of testing of the maximum load quantity of multichannel light fixture parallel circuit |
| CN103792470A (en) * | 2014-02-08 | 2014-05-14 | 上海沪工汽车电器有限公司 | Method and device for testing voltage withstanding capacity of car central cable connector |
| CN107290649A (en) * | 2017-07-13 | 2017-10-24 | 广州视源电子科技股份有限公司 | A kind of television board test device |
| CN107290649B (en) * | 2017-07-13 | 2020-04-21 | 广州视源电子科技股份有限公司 | Television board card testing device |
| CN109375021A (en) * | 2018-11-16 | 2019-02-22 | 浙江理工大学 | A kind of universal program controlled testing system and method for electric car central electrical part holder |
| CN109375021B (en) * | 2018-11-16 | 2024-02-06 | 浙江理工大学 | Universal program control testing system and method for electric automobile central electric box |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
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| CX01 | Expiry of patent term |
Granted publication date: 20100526 |