CN201425573Y - Maintenance-free device for measuring dust concentration - Google Patents
Maintenance-free device for measuring dust concentration Download PDFInfo
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- CN201425573Y CN201425573Y CN2009200915861U CN200920091586U CN201425573Y CN 201425573 Y CN201425573 Y CN 201425573Y CN 2009200915861 U CN2009200915861 U CN 2009200915861U CN 200920091586 U CN200920091586 U CN 200920091586U CN 201425573 Y CN201425573 Y CN 201425573Y
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Application Number | Priority Date | Filing Date | Title |
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CN2009200915861U CN201425573Y (en) | 2009-05-27 | 2009-05-27 | Maintenance-free device for measuring dust concentration |
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CN2009200915861U CN201425573Y (en) | 2009-05-27 | 2009-05-27 | Maintenance-free device for measuring dust concentration |
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CN201425573Y true CN201425573Y (en) | 2010-03-17 |
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CN2009200915861U Expired - Lifetime CN201425573Y (en) | 2009-05-27 | 2009-05-27 | Maintenance-free device for measuring dust concentration |
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105865997A (en) * | 2016-06-07 | 2016-08-17 | 中国科学院合肥物质科学研究院 | Atmospheric raise dust concentration measuring device and method based on forward scattering principle |
CN105891074A (en) * | 2016-04-12 | 2016-08-24 | 东南大学 | Dust concentration image collecting device and collecting method |
CN108362618A (en) * | 2018-03-21 | 2018-08-03 | 杭州春来科技有限公司 | Dust instrument automated calibration system and method |
CN108844870A (en) * | 2018-08-08 | 2018-11-20 | 重庆交通大学 | PM based on optical fiber structure10And PM2.5Detection instrument device and system |
CN114739872A (en) * | 2022-03-29 | 2022-07-12 | 安徽理工大学 | Intrinsic safety explosion-proof type photoacoustic spectrum dust detection device |
-
2009
- 2009-05-27 CN CN2009200915861U patent/CN201425573Y/en not_active Expired - Lifetime
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105891074A (en) * | 2016-04-12 | 2016-08-24 | 东南大学 | Dust concentration image collecting device and collecting method |
CN105891074B (en) * | 2016-04-12 | 2018-11-23 | 东南大学 | A kind of dust concentration image collecting device and acquisition method |
CN105865997A (en) * | 2016-06-07 | 2016-08-17 | 中国科学院合肥物质科学研究院 | Atmospheric raise dust concentration measuring device and method based on forward scattering principle |
CN108362618A (en) * | 2018-03-21 | 2018-08-03 | 杭州春来科技有限公司 | Dust instrument automated calibration system and method |
CN108844870A (en) * | 2018-08-08 | 2018-11-20 | 重庆交通大学 | PM based on optical fiber structure10And PM2.5Detection instrument device and system |
CN108844870B (en) * | 2018-08-08 | 2021-09-21 | 重庆交通大学 | PM based on optical fiber structure10And PM2.5Probe instrument apparatus and system |
CN114739872A (en) * | 2022-03-29 | 2022-07-12 | 安徽理工大学 | Intrinsic safety explosion-proof type photoacoustic spectrum dust detection device |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C56 | Change in the name or address of the patentee |
Owner name: ZHEZHOU GUANGLI SCIENCE + TECHNOLOGY CO., LTD. Free format text: FORMER NAME: GUANGLI SCIENCE + TECHNOLOGY DEVELOPMENT CO., LTD., ZHENGZHOU |
|
CP01 | Change in the name or title of a patent holder |
Address after: 450001 10 Hi Road, Zhengzhou hi tech Industry Development Zone, Henan, Zhengzhou Patentee after: Zhengzhou GL Tech Company Address before: 450001 10 Hi Road, Zhengzhou hi tech Industry Development Zone, Henan, Zhengzhou Patentee before: Guangli Science & Technology Development Co., Ltd., Zhengzhou |
|
CP03 | Change of name, title or address |
Address after: 450001 Henan city of Zhengzhou province high tech Industrial Development Zone Long Chun Road No. 10 Patentee after: Power Polytron Technologies Inc Address before: 450001 10 Hi Road, Zhengzhou hi tech Industry Development Zone, Henan, Zhengzhou Patentee before: Zhengzhou GL Tech Company |
|
CP03 | Change of name, title or address | ||
CX01 | Expiry of patent term |
Granted publication date: 20100317 |
|
CX01 | Expiry of patent term |