CN201311454Y - Resistance test instrument - Google Patents
Resistance test instrument Download PDFInfo
- Publication number
- CN201311454Y CN201311454Y CNU2008202211030U CN200820221103U CN201311454Y CN 201311454 Y CN201311454 Y CN 201311454Y CN U2008202211030 U CNU2008202211030 U CN U2008202211030U CN 200820221103 U CN200820221103 U CN 200820221103U CN 201311454 Y CN201311454 Y CN 201311454Y
- Authority
- CN
- China
- Prior art keywords
- test
- contact
- resistance test
- semiconductor devices
- ohmmeter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model relates to an instrument, in particular to a resistance test instrument of semiconductor devices. The resistance test instrument comprises a test board, an ohmmeter, a test contact and a line conductor. The resistance test instrument is characterized in that one end of the test contact is fixed on the test board, the other end is tilted, and the line conductor of the test contact is connected with the ohmmeter on a point. The test board is also provided with a slideway for fixing the semiconductor devices. Since the structure is adopted, the resistance test instrument has the advantages of convenient operation, low labor intensity and error reduction.
Description
Technical field
The utility model relates to a kind of instrument, specifically relates to a kind of semiconductor devices resistance meter.
Background technology
In semiconductor production process, need test to the performance of the semiconductor devices produced, measuring its resistance is a main indexes, employed in existing check is multimeter, the operator needs both hands to take test pencil to measure, because semiconductor devices is relatively thin little, both hands are arrested test pencil and are measured very inconveniently again, also are easy to generate the error resistance meter.
Summary of the invention
The purpose of this utility model is exactly the problem at above-mentioned existence, provide a kind of easy to operate, measure accurately, be difficult for producing error.
The resistance meter that is achieved in that of the present utility model comprises test board, ohmmeter, test contact and lead, it is characterized in that: test contact one end is fixed on the test board, other end perk, and the test contact tracerse point connects ohmmeter; The slideway that also has stationary semiconductor devices on the test board.
The beneficial effects of the utility model are: owing to taked above structure, make with such resistance meter have easy to operate, labour intensity is low, the advantage of minimizing error.
Description of drawings
Fig. 1 is the structural representation of the utility model resistance meter
Wherein, 1, test board 2, ohmmeter 3, test contact 4, lead 5, slideway
Embodiment
The utility model will be further described below in conjunction with accompanying drawing.
As shown in Figure 1: resistance meter, comprise test board 1, ohmmeter 2, test contact 3 and lead 4, it is characterized in that: test contact 3 one ends are fixed on the test board 1, other end perk, test contact 3 leads 4 connect ohmmeter 2; The slideway 5 that also has stationary semiconductor devices on the test board 1.
During measurement, the perk end in contact semiconductor devices of test contact want the contact site, semiconductor devices can slide on test board.
For big BT(batch testing), slideway 5 can be set, make the semiconductor devices stationkeeping, more accurate, convenient, fast.
Claims (2)
1, resistance meter, comprise test board (1), ohmmeter (2), test contact (3) and lead (4), it is characterized in that: test contact (3) one ends are fixed on the test board (1), other end perk, and test contact (3) lead (4) point connects ohmmeter (2).
2, resistance meter according to claim 1 is characterized in that: the slideway (5) that also has stationary semiconductor devices on the test board (1).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU2008202211030U CN201311454Y (en) | 2008-11-19 | 2008-11-19 | Resistance test instrument |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU2008202211030U CN201311454Y (en) | 2008-11-19 | 2008-11-19 | Resistance test instrument |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201311454Y true CN201311454Y (en) | 2009-09-16 |
Family
ID=41108712
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNU2008202211030U Expired - Fee Related CN201311454Y (en) | 2008-11-19 | 2008-11-19 | Resistance test instrument |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN201311454Y (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102998533A (en) * | 2012-10-12 | 2013-03-27 | 安徽蓝德仪表有限公司 | Sensor resistance value testing device |
-
2008
- 2008-11-19 CN CNU2008202211030U patent/CN201311454Y/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102998533A (en) * | 2012-10-12 | 2013-03-27 | 安徽蓝德仪表有限公司 | Sensor resistance value testing device |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20090916 Termination date: 20091221 |