CN201297960Y - Measuring device of radiation wavelength and bandwidth of peak value of light emitting diode - Google Patents
Measuring device of radiation wavelength and bandwidth of peak value of light emitting diode Download PDFInfo
- Publication number
- CN201297960Y CN201297960Y CNU2008201539809U CN200820153980U CN201297960Y CN 201297960 Y CN201297960 Y CN 201297960Y CN U2008201539809 U CNU2008201539809 U CN U2008201539809U CN 200820153980 U CN200820153980 U CN 200820153980U CN 201297960 Y CN201297960 Y CN 201297960Y
- Authority
- CN
- China
- Prior art keywords
- emitting diode
- light emitting
- light
- measuring device
- bandwidth
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Abstract
The utility model discloses a measuring device of the radiation wavelength and bandwidth of the peak value of a light emitting diode. The measuring device comprises an integral sphere, a connecting optic fiber, a light splitting device, a CCD detector and a computer, wherein, a light emitting diode to be measured is placed in the integral sphere; the integral sphere is connected with the light splitting device through the connecting optic fiber; and the image of a light emitted from the light emitting diode is presented on a sensitive surface of the CCD, sampled inside the CCD detector, amplified by an amplification circuit, converted through A/D, and then sent to the computer for data processing. The utility model has the beneficial effects that the device has a simple structure; the measuring method of the device has the advantages of simple, convenient and quick operation, accurate and reliable measurement, and the like; the measuring device can be used in LED manufacturers, LED detection laboratories, etc.
Description
Technical field
The utility model relates to the measurement mechanism of light emitting diode peak emission wavelength and radiation bandwidth.
Background technology
Advantages such as semiconductor light-emitting-diode has that volume is little, the life-span is long, energy consumption is low, instantaneous starting, color are abundant are a kind of cold light sources of environment-friendly energy-saving.Aspects such as pilot lamp, display screen, traffic lights have been widely used at present.Characteristic will replace incandescent lamp, daylight lamp gradually and white light emitting diode is because low, the solid-state components characteristic of colour temperature is strong, vibration resistance, reaction time are fast etc., becomes the New Innovational Illumination Lamps and Lanterns of energy-conserving and environment-protective.According to the existing industry standard SJ2355.1 lumination of light emitting diode wavelength and the proving installation of spectral half width, as shown in Figure 1, it comprises constant current source, monochromator, detector.Method of testing is: tested light emitting diode is by constant current source power supply, and when the forward working current of tested light emitting diode reached setting, rotation monochromator rotary drum made indicator reach maximal value, reads wavelength numerical value, is the peak luminous wavelength of this device.After measuring luminescence peak, rotate the monochromator rotary drum again towards both direction respectively, making indicator display is maximal value one half, reads peaked two one half values, and both differences are the spectral half width value.This method of testing process is comparatively complicated, the time is long, measured value is not accurate enough.
Summary of the invention
Order of the present utility model is that the method for testing process is comparatively complicated, Measuring Time is long, the not accurate enough shortcoming of measured value for the proving installation that overcomes existing lumination of light emitting diode wavelength and spectral half width brings, the measurement mechanism of a kind of light emitting diode peak emission wavelength and radiation bandwidth is provided, meets the testing standard of relevant light emitting diode peak emission wavelength and radiation bandwidth.
The technical solution of the utility model is, the measurement mechanism of light emitting diode peak emission wavelength and radiation bandwidth, be characterized in, comprise integrating sphere, connect optical fiber, light-splitting device, ccd detector and computing machine, tested light emitting diode places in the integrating sphere, connect integrating sphere and light-splitting device with connecting optical fiber, the photoimaging that light emitting diode sends is sent into computer data after the sampling in ccd detector, amplifying circuit amplification and the A/D conversion and is handled on the light-sensitive surface of CCD.
Described light-splitting device is a diffraction grating.The diameter of described integrating sphere is 180mm.
The beneficial effects of the utility model are: apparatus structure is simple, with this device test method have easy and simple to handle, quick, measure and to wait advantage accurately and reliably, can be used in LED manufacturing enterprise, aspects such as LED test experience chamber.
Description of drawings
Fig. 1 is the test philosophy figure of industry standard SJ2355.1 lumination of light emitting diode wavelength and spectral half width;
Fig. 2 is the measurement mechanism test philosophy figure of this light emitting diode peak emission wavelength and radiation bandwidth.
Embodiment
The measurement mechanism of light emitting diode peak emission wavelength and radiation bandwidth, by shown in Figure 2, be characterized in, comprise integrating sphere 1, connect optical fiber 3, light-splitting device 4, ccd detector 5 and computing machine 6, it is in the integrating sphere 1 of 180mm that tested light emitting diode 2 places diameter, with connecting optical fiber 3 connection integrating spheres 1 and being the light-splitting device 4 of diffraction grating, the photoimaging that light emitting diode 2 sends is on the light-sensitive surface of CCD, send into computer data after sampling in ccd detector, amplifying circuit amplification and the A/D conversion and handle, obtain the curve of spectrum of tested light emitting diode.Moving cursor, the maximal value place of the click curve of spectrum goes out peak emission wavelength according to software readable.Cursor is moved on to the both sides of peak emission wavelength respectively again, read the half value of two peak emission wavelengths respectively, both subtract each other and are radiation bandwidth.
Claims (3)
1. the measurement mechanism of light emitting diode peak emission wavelength and radiation bandwidth, it is characterized in that, comprise integrating sphere, connect optical fiber, light-splitting device, ccd detector and computing machine, tested light emitting diode places in the integrating sphere, connect integrating sphere and light-splitting device with connecting optical fiber, the photoimaging that light emitting diode sends is sent into computer data after the sampling in ccd detector, amplifying circuit amplification and the A/D conversion and is handled on the light-sensitive surface of CCD.
2. the measurement mechanism of light emitting diode peak emission wavelength according to claim 1 and radiation bandwidth is characterized in that, described light-splitting device is a diffraction grating.
3. the measurement mechanism of light emitting diode peak emission wavelength according to claim 1 and radiation bandwidth is characterized in that, the diameter of described integrating sphere is 180mm.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CNU2008201539809U CN201297960Y (en) | 2008-10-14 | 2008-10-14 | Measuring device of radiation wavelength and bandwidth of peak value of light emitting diode |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CNU2008201539809U CN201297960Y (en) | 2008-10-14 | 2008-10-14 | Measuring device of radiation wavelength and bandwidth of peak value of light emitting diode |
Publications (1)
Publication Number | Publication Date |
---|---|
CN201297960Y true CN201297960Y (en) | 2009-08-26 |
Family
ID=41043941
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNU2008201539809U Expired - Fee Related CN201297960Y (en) | 2008-10-14 | 2008-10-14 | Measuring device of radiation wavelength and bandwidth of peak value of light emitting diode |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN201297960Y (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102595722A (en) * | 2012-02-09 | 2012-07-18 | 重庆邦桥科技有限公司 | Light-emitting diode (LED) color temperature adjusting and controlling device and LED color temperature continuous adjustable control method |
-
2008
- 2008-10-14 CN CNU2008201539809U patent/CN201297960Y/en not_active Expired - Fee Related
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102595722A (en) * | 2012-02-09 | 2012-07-18 | 重庆邦桥科技有限公司 | Light-emitting diode (LED) color temperature adjusting and controlling device and LED color temperature continuous adjustable control method |
CN102595722B (en) * | 2012-02-09 | 2014-03-19 | 重庆邦桥科技有限公司 | Light-emitting diode (LED) color temperature adjusting and controlling device and LED color temperature continuous adjustable control method |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN101571451B (en) | Device for continuously detecting integrative luminescence properties of light emitting diode (LED) light source | |
CN1917731B (en) | Calibrated led light module | |
TWI325953B (en) | A high-speed optical sensing device abling to sense luminous intensity and chromaticity and an optical measuring system with the high-speed optical sensing device | |
CN104459510B (en) | A kind of LED array junction temperature quick online detection device | |
CN103091073B (en) | Multi-channel photomultiplier gain value relative measurement method | |
CN103308499A (en) | Device and method for testing performance of blue light-emitting diode (LED) excitation fluorescent powder | |
CN105403548A (en) | Temperature variable spectral measurement device | |
CN104198453A (en) | Remote fluorescent powder performance test device and test method | |
CN102798515B (en) | Light fixture spatial spectral distribution rapid measurement device and method | |
CN102707212A (en) | Device for detecting service life of light emitting diode (LED) in real time | |
CN102768199A (en) | Miniature spectrograph for rapidly measuring material transmittance or reflectivity | |
JP3155989U (en) | Light emitting combination batch inspection device with solar battery | |
CN201297960Y (en) | Measuring device of radiation wavelength and bandwidth of peak value of light emitting diode | |
CN101191770B (en) | Luminous diode fluorescent powder emission spectrometry process | |
CN102032984A (en) | Method for measuring properties of light of LED | |
CN202255846U (en) | Device for detecting service life of light-emitting diodes (LED) in real time | |
CN200968935Y (en) | Exciting and receiving apparatus for luminous diode fluorescent powder test | |
CN201600237U (en) | Light source test device | |
CN111323408A (en) | External quantum efficiency detection system and detection method for light emitting element under micro-area | |
CN115291071A (en) | LED array photo-thermal integrated detection device and method based on phase-locked amplifier | |
CN203274911U (en) | Luminous flux measuring device of sharp-beam LED lamp | |
CN202735069U (en) | Device for testing optical and electrical characteristic of LED lamp | |
CN205139316U (en) | Integrated encapsulation emitting diode's of chip photochromic detecting system on board | |
KR101020489B1 (en) | Apparatus and method for testing light emitting diode lamp | |
CN204924913U (en) | Object optical characteristic measuring device |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C17 | Cessation of patent right | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20090826 Termination date: 20131014 |