CN201293822Y - Detection circuit - Google Patents
Detection circuit Download PDFInfo
- Publication number
- CN201293822Y CN201293822Y CNU2008201609801U CN200820160980U CN201293822Y CN 201293822 Y CN201293822 Y CN 201293822Y CN U2008201609801 U CNU2008201609801 U CN U2008201609801U CN 200820160980 U CN200820160980 U CN 200820160980U CN 201293822 Y CN201293822 Y CN 201293822Y
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- China
- Prior art keywords
- supply voltage
- slot
- pin
- light emitting
- emitting diode
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- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
Disclosed is a detecting circuit, which comprises a power supply voltage, a first light emitting diode, a second light emitting diode, a first slot and a second slot, wherein the power supply voltage comprises a first power supply voltage and a second power supply voltage, one end of the first light emitting diode is connected with one end of the first power supply voltage, one end of the second light emitting diode is connected with one end of the first power supply voltage, a first pin of the first slot is connected with the other end of the second light emitting diode, a second pin of the first slot is connected with the other end of the first light emitting diode, a third pin of the first slot is connected with one end of the first power supply voltage, a fourth pin of the first slot is connected with one end of a switch, the other end of the switch is connected with the other end of the second power supply voltage, both a fifth pin and a sixth pin of the first slot are simultaneously connected with the other end of the first power supply voltage, a first pin of the second slot is connected with the other end of the second light emitting diode, both a second pin and a fourth pin of the second slot are simultaneously connected with the other end of the first power supply voltage, and a third pin of the second slot is connected with one end of the switch.
Description
[technical field]
The utility model relates to a kind of testing circuit, particularly a kind of testing circuit that is used for the checkout equipment reed switch relay.
[background technology]
In some on-line testing equipment, big multiple computer desk internal strength can the plate switch driven all be adopted the reed switch relay design, in the process of test, when feature board breaks down, also all be mostly because problem has appearred in the reed switch relay on the feature board, but a lot of reed switch relays are arranged on the feature board, which detects very difficulty of problem occurred, problem has appearred in a certain zone that some experienced testers can judge on the feature board by rule of thumb, but only be also to have a lot of reed switch relays above the little zone, and normally the testing staff removes to detect reed switch relay on this zonule one by one with multimeter, but multimeter can only detect the fault of a certain reed switch relay internal short-circuit in the process that detects, if this reed switch relay inside is to break down because of the fault that opens circuit, only with multimeter be detection less than.So can allow the tester be difficult to detect on the feature board like this is that problem has appearred in which reed switch relay.
In view of this, be necessary to propose a kind of testing circuit in fact, utilizing this testing circuit can detect a feature board at an easy rate is which reed switch relay breaks down when breaking down.
[summary of the invention]
Therefore, the utility model provides a kind of testing circuit, to realize that detecting a feature board at an easy rate is the purpose which reed switch relay breaks down when breaking down.
For achieving the above object, the utility model provides a kind of testing circuit, and this testing circuit comprises:
One supply voltage, it comprises one first supply voltage, one second supply voltage, and this first supply voltage and this second supply voltage are connected in series;
One first light emitting diode, one end electrically connect an end of first supply voltage;
One second light emitting diode, one end electrically connect an end of first supply voltage;
One first slot, the other end of above-mentioned second light emitting diode of the electric connection of first pin on it; The other end of above-mentioned first light emitting diode of electric connection of second pin on this first slot; An end of above-mentioned first supply voltage of electric connection of the 3rd pin on this first slot; An end of electric connection one switch of the 4th pin on this first slot, the other end of this switch electrically connects the other end of above-mentioned second supply voltage; The 5th pin and the 6th pin together are connected the other end of first supply voltage on this first slot;
One second slot, the other end of above-mentioned second light emitting diode of the electric connection of first pin on it; The other end of second pin and the 4th pin electric connection first supply voltage together on this second slot; An end of the above-mentioned switch of electric connection of the 3rd pin on this second slot.
Say that especially above-mentioned first supply voltage and one second supply voltage are a 3V battery; Above-mentioned first slot is one 6 hole slots; Above-mentioned second slot is one 4 hole slots.
Compared to prior art, it is which reed switch relay breaks down when breaking down that testing circuit of the present utility model can detect a feature board at an easy rate.
For the purpose of this utility model, structural attitude and function thereof are had further understanding, conjunction with figs. is described in detail as follows now:
[description of drawings]
Fig. 1 illustrates the circuit diagram of testing circuit of the present utility model.
[embodiment]
With reference to shown in Figure 1, it is the circuit diagram of testing circuit of the present utility model.
Testing circuit of the present utility model comprises:
One supply voltage 20, it comprises one first supply voltage 201, one second supply voltage 202, and this first supply voltage 201 is connected in series with this second supply voltage 202, this first supply voltage 201 and second supply voltage 202 are a 3V battery;
One first light emitting diode 30, the one end electrically connects the positive pole of first supply voltage 201;
One second light emitting diode 40, the one end electrically connects the positive pole of first supply voltage 201;
One first slot 50, it is one 6 hole slots, the other end of above-mentioned second light emitting diode 40 of electric connection of first pin 1 on this first slot 50; The other end of above-mentioned first light emitting diode 30 of electric connection of second pin 2 on this first slot 50; The positive pole of above-mentioned first supply voltage 201 of electric connection of the 3rd pin 3 on this first slot 50; An end of electric connection one switch 70 of the 4th pin 4 on this first slot 50, the other end of this switch 70 electrically connects the negative pole of above-mentioned second supply voltage 202; The 5th pin 5 and the 6th pin 6 together are connected the negative pole of first supply voltage 201 on this first slot 50;
One second slot 60, it is one 4 hole slots, the other end of above-mentioned second light emitting diode 40 of electric connection of first pin 7 on this second slot 60; The negative pole of second pin 8 and the 4th pin 10 electric connection first supply voltage 201 together on this second slot 60; An end of the above-mentioned switch 70 of electric connection of the 3rd pin 9 on this second slot 60.
In present embodiment, when reed switch relay to be measured is 6 stitch, reed switch relay to be measured is inserted in first slot 50 (6 hole slot), insert good back:
(11) first light emitting diodes 30 Ying Liang, this reed switch relay to be measured breaks down if first light emitting diode 30 does not work then;
(12) connect switch 70,, then represent this reed switch relay to be measured for good, otherwise this reed switch relay to be measured is what break down if second light emitting diode 40 is bright and cut-off switch 70 backs second light emitting diode 40 does not work.
When reed switch relay to be measured is 4 stitch, reed switch relay to be measured is inserted in second slot 60 (4 hole slot), insert good back:
(21) connect switch 70,, then represent this reed switch relay to be measured for good, otherwise this reed switch relay to be measured is what break down if second light emitting diode 40 is bright and cut-off switch 70 backs second light emitting diode 40 does not work.
Claims (4)
1, a kind of testing circuit is characterized in that, this testing circuit comprises:
One supply voltage, it comprises one first supply voltage, one second supply voltage, and this first supply voltage and this second supply voltage are connected in series;
One first light emitting diode, one end electrically connect an end of first supply voltage;
One second light emitting diode, one end electrically connect an end of first supply voltage;
One first slot, the other end of above-mentioned second light emitting diode of the electric connection of first pin on it; The other end of above-mentioned first light emitting diode of electric connection of second pin on this first slot; An end of above-mentioned first supply voltage of electric connection of the 3rd pin on this first slot; An end of electric connection one switch of the 4th pin on this first slot, the other end of this switch electrically connects the other end of above-mentioned second supply voltage; The 5th pin and the 6th pin together are connected the other end of first supply voltage on this first slot;
One second slot, the other end of above-mentioned second light emitting diode of the electric connection of first pin on it; The other end of second pin and the 4th pin electric connection first supply voltage together on this second slot; An end of the above-mentioned switch of electric connection of the 3rd pin on this second slot.
2, testing circuit as claimed in claim 1 is characterized in that, above-mentioned first supply voltage and one second supply voltage are a 3V battery.
3, testing circuit as claimed in claim 1 is characterized in that, above-mentioned first slot is one 6 hole slots.
4, testing circuit as claimed in claim 1 is characterized in that, above-mentioned second slot is one 4 hole slots.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU2008201609801U CN201293822Y (en) | 2008-11-04 | 2008-11-04 | Detection circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU2008201609801U CN201293822Y (en) | 2008-11-04 | 2008-11-04 | Detection circuit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201293822Y true CN201293822Y (en) | 2009-08-19 |
Family
ID=41007305
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNU2008201609801U Expired - Fee Related CN201293822Y (en) | 2008-11-04 | 2008-11-04 | Detection circuit |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN201293822Y (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106291211A (en) * | 2015-06-01 | 2017-01-04 | 神讯电脑(昆山)有限公司 | Power-supply adapter test circuit |
-
2008
- 2008-11-04 CN CNU2008201609801U patent/CN201293822Y/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106291211A (en) * | 2015-06-01 | 2017-01-04 | 神讯电脑(昆山)有限公司 | Power-supply adapter test circuit |
| CN106291211B (en) * | 2015-06-01 | 2018-06-22 | 神讯电脑(昆山)有限公司 | Power-supply adapter test circuit |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20090819 Termination date: 20131104 |