CN201142354Y - Cylindrical high Q resonant cavity for high temperature microwave test - Google Patents
Cylindrical high Q resonant cavity for high temperature microwave test Download PDFInfo
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- CN201142354Y CN201142354Y CNU2007200816617U CN200720081661U CN201142354Y CN 201142354 Y CN201142354 Y CN 201142354Y CN U2007200816617 U CNU2007200816617 U CN U2007200816617U CN 200720081661 U CN200720081661 U CN 200720081661U CN 201142354 Y CN201142354 Y CN 201142354Y
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Abstract
The utility model provides a cylindrical high Q resonant cavity used for the high-temperature microwave measurement, and belongs to the microwave measurement technology field. The cylindrical high Q resonant cavity comprises a cylindrical cavity tube, an upper end cover, a lower end cover and a waveguide connector, wherein, the cylindrical cavity tube, the upper end cover and the lower end cover are respectively divided into an inner layer and an outer layer, the inner layers are made of thin layers of high-temperature resistant precious metal materials, and the outer layers are made of thick layers of high-temperature resistant supporting materials. The utility model has the essence that the thin layers of high-temperature resistant precious metal materials are adopted to produce the cavity body of the cylindrical high Q resonant cavity, and high-temperature materials are adopted to support the thin layers of high-temperature resistant precious metal materials, so as to compose the cylindrical high Q resonant cavity. The whole cylindrical high Q resonant cavity has the advantages that the cavity is applicable to the high-temperature property measurement of microwave or millimeterwave dielectric materials, the structure is simple, the cost is low, and the service life is long.
Description
Technical field
A kind of high temperature microwave test cylindrical high Q resonant cavity belongs to the microwave testing field, particularly the complex dielectric permittivity measuring technology of microwave dielectric.
Background technology
The application of microwave dielectric material in microwave device, microwave system is very extensive, in development and use to these microwave dielectric materials, need be that complex dielectric permittivity is measured accurately to its electrical quantity.
When microwave dielectric was low-loss material, the method that adopts was a Resonant-cavity Method usually.Used resonant cavity can be stripline resonator, cylindrical cavity, rectangular cavity, quasi optical cavity, helix resonant cavity etc.For requiring the electric field polarization direction to be parallel to the test of the complex dielectric permittivity of microwave dielectric sample surfaces, often adopt cylindrical cavity, higher because of its Q value, and used tested microwave dielectric sample size is less.The cylindrical cavity method is higher because of its quality factor q, is called high-q cavity again.
When adopting the high-q cavity method to carry out the microwave dielectric complex permittivity test, two kinds of method of testings are arranged, a kind of is the fixed resonant frequency method, and another is the lock chamber regular way.In the fixed resonant frequency method, the resonance frequency of cavity is a fixed value loading microwave dielectric sample front and back, calculates complex dielectric permittivity by the variation that loads microwave dielectric sample front and back cavity length and quality factor.In the lock chamber regular way, then the length of fixed cavity is calculated complex dielectric permittivity by the variation that loads microwave dielectric sample front and back resonance frequency and quality factor.
Utilize high-q cavity to adopt fixed resonant frequency method and lock chamber regular way to carry out the test of complex dielectric permittivity respectively in the document " Eric J.Vanzura; William A.Kissick.Advances in NIST dielectric measurementcapability using a mode-filtered cylindrical cavity.IEEE MTT-S Digest; 1989, p901-904 ".The structural representation of used high-q cavity as shown in Figure 1, it is made of cylindrical cavity tube, upper end cover and position-movable bottom end cover, wherein has the waveguide-coupled hole on the upper end cover.By the position of change bottom end cover in cylinder die cavity tube, thus the length of change cavity.Utilize a plurality of TE in the literary composition
01nMode of operation adopts fixed frequency method or lock chamber regular way to measure the complex dielectric permittivity response on the broadband discrete point in frequency in X-band 8.2～12.4GHz of tested microwave dielectric sample.
Expansion along with microwave, millimeter wave dielectric substance range of application, people more and more need to understand microwave, the dielectric properties of millimeter wave dielectric substance under high temperature (being higher than 1000 ℃), and this can test microwave, millimeter wave dielectric substance dielectric property at high temperature with regard to requiring us.Introduced Russian high-temperature dielectric ability meter in the document " what little watt, the employing Resonant-cavity Method makes clear of the high-temperature dielectric performance of wave material, infrared and millimeter wave journal, 2004, Vol.23, No.2, p157～160. for Li Yi, Li Jianbao ".The cavity that is adopted is a cylindrical cavity, and mode of operation is TE
01nPattern, probe temperature are 15～1200 ℃, and operating frequency is 9～10GHz, adopt the nitrogen atmosphere protection.During test, the method for employing is promptly carried out the measurement of complex dielectric permittivity for becoming the chamber regular way by the variation of high temperature lower chamber length and Q-unloaded.This method need at high temperature change the position of resonant cavity bottom end cover in the tube of chamber and measure the testing apparatus complexity.And the certainty of measurement that cavity length changes can have a strong impact on the certainty of measurement of dielectric constant.
Document " Zhang G; Nakaoka S; Kobayashi Y; Millimeter wave measurements of temperaturedependence of complex permittivity of dielectric plates by the cavity resonancemethod; AMPC; 1997, p3913～3916 "; " Kobayashi Y, Shimizu T, Millimeter wave measurementdependence of complex permittivity of dielectric plates by a cavity resonance method, IEEE MTT-S, 1999, p1885～1888 "; " Shimizu T, Kobayashi Y, Millimeter wave measurementsof temperature dependence of complex permittivity of GaAs disks by circular waveguidemethod, IEEE MTT-S, 2001, p2195～2198 " the middle employing with long half the place's incision of cylindrical cavity cavity in the chamber; sample is placed on the temperature variation testing that the middle method of two and half cavitys is carried out complex dielectric permittivity; probe temperature only is 100 ℃, and testing apparatus is comparatively complicated.
In sum, abroad studied for many years, adopted cylindrical cavity fixed frequency point to change the chamber regular way usually or adopt sample is placed on the high temperature test that the middle method of two and half cavitys is carried out the low-loss material complex dielectric permittivity at low-loss material complex dielectric permittivity high temperature test technical elements.These testing apparatuss are complicated, certainty of measurement is low, are difficult to the test present situation requirement of the higher temperature of adaptation low-loss material complex dielectric permittivity.
Summary of the invention
The invention provides a kind of lock chamber high temperature microwave test factory, simple in structure cylindrical high Q resonant cavity, be applicable to the test of microwave, millimeter wave dielectric material high temperature performance.
The utility model detailed technology scheme is:
A kind of high temperature microwave test cylindrical high Q resonant cavity, as shown in Figure 2, comprise cylinder die cavity tube 1, upper end cover 2, bottom end cover 3 and be connected waveguide 4, bottom end cover 3 is fixedlyed connected with the lower end of cylinder die cavity tube 1, and upper end cover 2 is connected by connecting bolt 5 with the upper end of cylinder die cavity tube 1.Wherein cylinder die cavity tube 1 is made up of chamber tube outer 11 and chamber tube internal layer 12, upper end cover 2 is made up of upper end cover outer 21 and upper end cover internal layer 22, bottom end cover 3 is made up of bottom end cover outer 31 and bottom end cover internal layer 32, connects waveguide 4 and is connected in sequence by high temperature waveguide 41, heat insulation waveguide 42 and cooling waveguide 43.Described chamber tube skin 11, upper end cover outer 21 and bottom end cover skin 31 are made by the high temperature resistant backing material of thick-layer, and described chamber tube internal layer 12, upper end cover internal layer 22 and bottom end cover internal layer 32 are made by the high temperature resistant precious metal material of thin layer; Described chamber tube internal layer 12, upper end cover internal layer 22 and bottom end cover internal layer 32 are close to chamber tube skin 11, upper end cover outer 21 and bottom end cover skin 31 respectively.Have 23, two of two coupling apertures connects waveguide 4 and embeds outer 21 backing materials of upper end cover of upper end cover 2 respectively and fixedly connected with the upper end cover internal layer 22 at corresponding coupling aperture 23 places in upper end cover 2 appropriate locations.
In the such scheme, the high temperature resistant backing material of described thick-layer should be that heat conductivility is good and be easy to material processed, can adopt graphite, the high temperature resistant precious metal material of described thin layer should be that fusing point is higher than 1000 ℃ and have the material of excellent conductive performance, can adopt platinum-rhodium alloy.
High temperature microwave test of the present invention with cylindrical high Q resonant cavity in use, earlier tested sample 6 (as shown in Figure 5) is put on the bottom end cover of resonant cavity, with bolt with upper end cover and cylinder die cavity tube fixing after, the cylindrical high Q resonant cavity cavity is partly put into high temperature furnace, treat to test after the hygral equilibrium in interior temperature of high Q resonant cavity and the high temperature furnace.During test, a conduct input of two coupling apertures of high Q resonant cavity coupling aperture, one as the output coupling aperture; Two connect conduct input of waveguide and connect waveguide, a conduct output connection waveguide.Input connects waveguide and links to each other with the microwave test source, output connects waveguide and links to each other with tester (as scalar network analyzer), the microwave test source signal enters resonant cavity through input connection waveguide, input coupling aperture, and test signal connects waveguide through output coupling aperture, output and enters tester.
Essence of the present invention is to adopt thin layer high temperature precious metal material to make the cavity of cylindrical high Q resonant cavity, and adopting high-temperature material to support thin layer high temperature precious metal material formation cylindrical high Q resonant cavity, utilization cylindrical cavity lock chamber regular way realizes the high temperature test of microwave, millimeter wave dielectric substance microwave property (as complex dielectric permittivity).Whole cylindrical high Q resonant cavity is applicable to test and simple in structure, with low cost, the long service life of microwave, millimeter wave dielectric material high temperature performance.
Description of drawings
The high-q cavity schematic diagram of the existing bottom end cover position changeable of Fig. 1.
Fig. 2 high temperature microwave test cylindrical high Q resonant cavity stereogram of the present invention.
Wherein, the 1st, cylinder die cavity tube, the 2nd, upper end cover, the 3rd, bottom end cover, the 4th, connect waveguide.
Fig. 3 high temperature microwave test cylindrical high Q resonant cavity profile of the present invention.
Wherein, the 11st, chamber tube skin, the 12nd, chamber tube internal layer, the 21st, upper end cover skin, the 22nd, upper end cover internal layer, the 23rd, coupling aperture, the 31st, bottom end cover skin, the 32nd, bottom end cover internal layer, the 41st, high temperature waveguide, the 42nd, heat insulation waveguide, the 43rd, cooling waveguide, the 5th, connecting bolt.
Fig. 4 high temperature microwave test of the present invention vertical view of cylindrical high Q resonant cavity.
High temperature microwave test cylindrical high Q resonant cavity profile behind the tested sample of Fig. 5 loading of the present invention.
Wherein, the 6th, tested sample.
Embodiment
A kind of high temperature microwave test cylindrical high Q resonant cavity, as shown in Figure 2, comprise cylinder die cavity tube 1, upper end cover 2, bottom end cover 3 and be connected waveguide 4, bottom end cover 3 is fixedlyed connected with the lower end of cylinder die cavity tube 1, and upper end cover 2 is connected by connecting bolt 5 with the upper end of cylinder die cavity tube 1.Wherein cylinder die cavity tube 1 is made up of chamber tube outer 11 and chamber tube internal layer 12, upper end cover 2 is made up of upper end cover outer 21 and upper end cover internal layer 22, bottom end cover 3 is made up of bottom end cover outer 31 and bottom end cover internal layer 32, connects waveguide 4 and is connected in sequence by high temperature waveguide 41, heat insulation waveguide 42 and cooling waveguide 43.Described chamber tube skin 11, upper end cover outer 21 and bottom end cover skin 31 are made by the high temperature resistant backing material of thick-layer, and described chamber tube internal layer 12, upper end cover internal layer 22 and bottom end cover internal layer 32 are made by the high temperature resistant precious metal material of thin layer; Described chamber tube internal layer 12, upper end cover internal layer 22 and bottom end cover internal layer 32 are close to chamber tube skin 11, upper end cover outer 21 and bottom end cover skin 31 respectively.Have 23, two of two coupling apertures connects waveguide 4 and embeds outer 21 backing materials of upper end cover of upper end cover 2 respectively and fixedly connected with the upper end cover internal layer 22 at corresponding coupling aperture 23 places in upper end cover 2 appropriate locations.
In the such scheme, described thick-layer is high temperature resistant, and backing material adopts graphite, and described thin layer is high temperature resistant, and precious metal material adopts platinum-rhodium alloy.As shown in Figure 4, for increasing the connection between upper end cover 2 and the chamber tube 1,, adopt 8 connecting bolts to carry out fastening altogether to prevent microwave leakage.Bottom end cover 3 takes welding manner to fixedly connected with the lower end of cylinder die cavity tube 1, connects waveguide 4 and takes welding manner to fixedly connected with upper end cover internal layer 22; Can take welding manner fixedly connected between high temperature waveguide 41, heat insulation waveguide 42 and the cooling waveguide 43, also can take other modes to connect, but should guarantee not have microwave leakage.The cavity diameter of whole cylindrical high Q resonant cavity and cavity length can be according to test frequency scope and the selected mode of operation specific designs of high-q cavity.
Claims (2)
1, a kind of high temperature microwave test cylindrical high Q resonant cavity, comprise cylinder die cavity tube (1), upper end cover (2), bottom end cover (3) and be connected waveguide (4), it is characterized in that, bottom end cover (3) is fixedlyed connected with the lower end of cylinder die cavity tube (1), and upper end cover (2) is connected by connecting bolt (5) with the upper end of cylinder die cavity tube (1); Wherein cylinder die cavity tube (1) is made up of chamber tube skin (11) and chamber tube internal layer (12), upper end cover (2) is made up of upper end cover skin (21) and upper end cover internal layer (22), bottom end cover (3) is made up of bottom end cover skin (31) and bottom end cover internal layer (32), connects waveguide (4) and is connected in sequence by high temperature waveguide (41), heat insulation waveguide (42) and cooling waveguide (43); Described chamber tube skin (11), upper end cover skin (21) and bottom end cover skin (31) are made by the high temperature resistant backing material of thick-layer, and described chamber tube internal layer (12), upper end cover internal layer (22) and bottom end cover internal layer (32) are made by the high temperature resistant precious metal material of thin layer; Described chamber tube internal layer (12), upper end cover internal layer (22) and bottom end cover internal layer (32) are close to chamber tube skin (11), upper end cover skin (21) and bottom end cover skin (31) respectively; Have two coupling apertures (23) in upper end cover (2) appropriate location, two connection waveguides (4) embed upper end cover skin (21) backing material of upper end cover (2) respectively and fixedly connected with the upper end cover internal layer (22) that corresponding coupling aperture (23) is located.
2, high temperature microwave test cylindrical high Q resonant cavity according to claim 1 is characterized in that, the high temperature resistant backing material of described thick-layer is a graphite, and the high temperature resistant precious metal material of described thin layer is a platinum-rhodium alloy.
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| Application Number | Priority Date | Filing Date | Title |
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| CNU2007200816617U CN201142354Y (en) | 2007-10-30 | 2007-10-30 | Cylindrical high Q resonant cavity for high temperature microwave test |
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| CNU2007200816617U CN201142354Y (en) | 2007-10-30 | 2007-10-30 | Cylindrical high Q resonant cavity for high temperature microwave test |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104598677A (en) * | 2015-01-08 | 2015-05-06 | 天津工业大学 | Method for determining sedimentation platform by segmentally calculating cylindrical resonant cavity Qt value |
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2007
- 2007-10-30 CN CNU2007200816617U patent/CN201142354Y/en not_active Expired - Lifetime
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104598677A (en) * | 2015-01-08 | 2015-05-06 | 天津工业大学 | Method for determining sedimentation platform by segmentally calculating cylindrical resonant cavity Qt value |
| CN104598677B (en) * | 2015-01-08 | 2018-10-12 | 天津工业大学 | A method of deposition table is determined by separation calculation cylindrical type resonant cavity Qt values |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| AV01 | Patent right actively abandoned |
Effective date of abandoning: 20071030 |
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| C25 | Abandonment of patent right or utility model to avoid double patenting |