CN201141878Y - Probe construction - Google Patents

Probe construction Download PDF

Info

Publication number
CN201141878Y
CN201141878Y CNU2007201518066U CN200720151806U CN201141878Y CN 201141878 Y CN201141878 Y CN 201141878Y CN U2007201518066 U CNU2007201518066 U CN U2007201518066U CN 200720151806 U CN200720151806 U CN 200720151806U CN 201141878 Y CN201141878 Y CN 201141878Y
Authority
CN
China
Prior art keywords
conducting
probe
spring
probe structure
opening
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CNU2007201518066U
Other languages
Chinese (zh)
Inventor
王邓盛
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to CNU2007201518066U priority Critical patent/CN201141878Y/en
Application granted granted Critical
Publication of CN201141878Y publication Critical patent/CN201141878Y/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Landscapes

  • Measuring Leads Or Probes (AREA)

Abstract

The utility model relates to a probe structure which is formed by an eccentric conducting probe and a spring with different winding. The probe structure increases the contact area between the conducting probe and the conducting sleeve, reduces the resistance and increases the telecommunication transmission efficiency. The probe structure of the utility model can reach the purpose of accuracy measurement because of the effective transmission of the electric signal during the conducting probe testing the conduction of wire in the manufacture of BGA chip.

Description

Probe structure
Technical field
The utility model relates to a kind of probe structure, refers to utilize the conducting probe of off-centre and the different spring that twines situation to form a probe structure especially, and the contact area of conducting probe and conducting sleeve is increased, and reduces resistance and improves the telecommunication transfer efficiency.
Background technology
First figure is known probe structure cut-open view, shown in first figure, the existing probe structure that is used for the measurement of chip BGA processing procedure circuit, because conducting probe 1 is adopted the symmetrical structure design and spring 3 is equal diameter, make conducting probe 1 few with the touch opportunity of conducting sleeve 2, add the contacting of conducting probe 1 and 2 of conducting sleeves when measuring, cause the electric signal transmission of measurement to interrupt and form the testing result of mistake because the to-and-fro movement of conducting probe 1 often has of short duration slight disengaging situation.In addition, the spring 3 of known probe structure is an equal diameter, waits to twine the density design, in use, also causes easily between spring fatigue and the spring coil and is entangled with mutually, causes the damage of probe structure.
Therefore, how creating a kind of probe structure, the contact area of conducting probe and conducting sleeve is increased, will be that the utility model desires actively to inquire into part.
The utility model content
Because above-mentioned known shortcoming, the creator does not reach perfection thoughts on it, then exhausting the concentrated research of its intelligence overcomes, being engaged in this industry with it accumulates experience for many years, and then develop a kind of probe structure, it utilizes the conducting probe of off-centre and the different spring that twines situation to form a probe structure, the contact area of conducting probe and conducting sleeve is increased, reduce resistance and improve the telecommunication transfer efficiency, and make conducting probe in chip BGA processing procedure, measure circuit when whether conducting electricity, because of effective transmission of electric signal, and then reach the purpose of accurate measurement.
The fundamental purpose of the utility model is to provide a kind of probe structure, and it uses the conducting probe of off-centre and the different spring that twines situation to form a probe structure, and the contact area of conducting probe and conducting sleeve is increased, and reduces resistance and improves the telecommunication transfer efficiency.
The 1 sample attitude system of the utility model provides a kind of probe structure, comprising: a conducting sleeve, and the one end has an opening, and this opening has a retaining edge; One conducting probe, its part is located in this conducting sleeve, one end of this conducting probe is a circular cone or an inclined-plane, non-center at this conducting probe, the summit of this circular cone is online, the center line of this inclined-plane and this conducting probe is nonopiate and non-parallel, has a resistance portion between the two ends of this conducting probe; One spring, it is located in this conducting sleeve, one end of this spring is resisted against wall within this conducting sleeve, this circular cone of other end contact of this spring or this inclined-plane and this this resistance portion of retaining edge retaining system, this conducting probe of part is contacted with wall within this conducting sleeve, and make the other end of this conducting probe protrude in this opening.
Another sample attitude system of the utility model provides a kind of probe structure, comprising: a conducting sleeve, and its two ends have an opening respectively, and this two opening has the retaining edge respectively; Two conducting probes, it partly is located in this conducting sleeve respectively, the one end system of this two conducting probe is respectively a circular cone and a circular cone, an inclined-plane and an inclined-plane or a circular cone and an inclined-plane, non-center at this conducting probe, the summit of this circular cone is online, the center line of this inclined-plane and this conducting probe is nonopiate and non-parallel, has a resistance portion between the two ends of this two conducting probe respectively; One spring, it is located in this conducting sleeve, the two ends of this spring are this circular cone of contact and this circular cone, this inclined-plane and this inclined-plane or this circular cone and this inclined-plane respectively, and this two retainings edge keeps off this two resistances portion of system respectively, this two conducting probe is partly contacted with wall within this conducting sleeve respectively, and make the other end of this two conducting probe protrude in this two opening respectively.
The same again attitude of the utility model is that a kind of probe structure is provided, and comprising: a conducting sleeve, and the one end has opening, and this opening has a retaining edge; One conducting probe, its part are located in this conducting sleeve, and an end of this conducting probe has a V-arrangement depressed part, and the non-center at this conducting probe of the other end of this V-arrangement depressed part opening is online, have a resistance portion between the two ends of this conducting probe; One spring, it is located in this conducting sleeve, one end of this spring is resisted against wall within this conducting sleeve, this V-arrangement depressed part of the other end contact of this spring and this this resistance portion of retaining edge retaining system, this conducting probe of part is contacted with wall within this conducting sleeve, and make the other end of this conducting probe protrude in this opening.
The another sample attitude of the utility model is that a kind of probe structure is provided, and comprising: a conducting sleeve, and its two ends have an opening respectively, and this two opening has the retaining edge respectively; Two conducting probes, it partly is located in this conducting sleeve respectively, the one end system of this two conducting probe all has a V-arrangement depressed part or has a V-arrangement depressed part and an inclined-plane respectively, the non-center at this conducting probe of the other end of this V-arrangement depressed part opening is online, the center line of this inclined-plane and this conducting probe is nonopiate and non-parallel, has a resistance portion between the two ends of this two conducting probe respectively; One spring, it is located in this conducting sleeve, the two ends of this spring are this V-arrangement depressed part of contact or difference this V-arrangement depressed part of contact and this inclined-plane respectively, and this two retainings edge keeps off this two resistances portion of system respectively, this two conducting probe is partly contacted with wall within this conducting sleeve respectively, and make the other end of this two conducting probe protrude in this two opening respectively.
By this, utilize the conducting probe of the sheet heart and the different spring that twines situation to form a probe structure, the contact area of conducting probe and conducting sleeve is increased, reduce resistance and improve the telecommunication transfer efficiency.
Description of drawings
Fig. 1 is known probe structure cut-open view.
Fig. 2 is the probe structure exploded view of the utility model first preferred embodiment.
Fig. 3 is the probe structure cut-open view of first preferred embodiment of the utility model.
Fig. 4 is the probe structure exploded view of second preferred embodiment of the utility model.
Fig. 5 is the probe structure cut-open view of second preferred embodiment of the utility model.
Fig. 6 is the probe structure exploded view of the 3rd preferred embodiment of the utility model.
Fig. 7 is the probe structure cut-open view of the 3rd preferred embodiment of the utility model.
Fig. 8 is the probe structure exploded view of the 4th preferred embodiment of the utility model.
Fig. 9 is the probe structure cut-open view of the 4th preferred embodiment of the utility model.
Figure 10 is the probe structure exploded view of the 5th preferred embodiment of the utility model.
Figure 11 is the probe structure cut-open view of the 5th preferred embodiment of the utility model.
Figure 12 is the probe structure exploded view of the 6th preferred embodiment of the utility model.
Figure 13 is the probe structure cut-open view of the 6th preferred embodiment of the utility model.
Figure 14 is the probe structure exploded view of the 7th preferred embodiment of the utility model.
Figure 15 is the probe structure cut-open view of the 7th preferred embodiment of the utility model.
Figure 16 is the probe structure cut-open view of the 8th preferred embodiment of the utility model.
Figure 17 is the probe structure cut-open view of the 9th preferred embodiment of the utility model.
Figure 18 is the probe structure cut-open view of the tenth preferred embodiment of the utility model.
Figure 19 is the probe structure cut-open view of the 11 preferred embodiment of the utility model.
Figure 20 is the probe structure cut-open view of the 12 preferred embodiment of the utility model.
Figure 21 is the probe structure cut-open view of the 13 preferred embodiment of the utility model.
Figure 22 is the probe structure cut-open view of the 14 preferred embodiment of the utility model.
Figure 23 is the probe structure cut-open view of the 15 preferred embodiment of the utility model.
Figure 24 is the probe structure cut-open view of the 16 preferred embodiment of the utility model.
Figure 25 is the probe structure cut-open view of the 17 preferred embodiment of the utility model.
Figure 26 is the probe structure cut-open view of the 18 preferred embodiment of the utility model.
Figure 27 is the probe structure exploded view of the 19 preferred embodiment of the utility model.
Figure 28 is the probe structure cut-open view of the 19 preferred embodiment of the utility model.
Figure 29 is the probe structure exploded view of the 20 preferred embodiment of the utility model.
Figure 30 is the probe structure cut-open view of the 20 preferred embodiment of the utility model.
Figure 31 is the probe structure exploded view of the 21 preferred embodiment of the utility model.
Figure 32 is the probe structure cut-open view of the 21 preferred embodiment of the utility model.
Figure 33 is the probe structure exploded view of the 22 preferred embodiment of the utility model.
Figure 34 is the probe structure cut-open view of the 22 preferred embodiment of the utility model.
Figure 35 is the probe structure cut-open view of the 23 preferred embodiment of the utility model.
Figure 36 is the probe structure cut-open view of the 24 preferred embodiment of the utility model.
Figure 37 is the probe structure cut-open view of the 25 preferred embodiment of the utility model.
Figure 38 is the probe structure exploded view of the 26 preferred embodiment of the utility model.
Figure 39 is the probe structure cut-open view of the 27 preferred embodiment of the utility model.
1-conducting probe among the figure, the 2-conducting sleeve, the 3-spring, the 4-opening, 5-keeps off edge, 6-resistance portion, the 11-conducting probe, the 12-conducting sleeve, the 13-spring, the 14-opening, 15-keeps off edge, 16-resistance portion.
Embodiment
For making your auditor fully understand purpose, feature and the effect of the utility model, now by following specific embodiment, and conjunction with figs., the utility model is described in detail, illustrate as the back:
Fig. 2 and Fig. 3 are respectively the probe structure exploded view and the cut-open view of first preferred embodiment of the utility model, please also refer to Fig. 2 and Fig. 3, and this probe structure comprises: a conducting sleeve 2, one end have an opening 4, and opening 4 has a retaining edge 5; One conducting probe 1, its part is located in this conducting sleeve 2, one end of conducting probe 1 is a circular cone (but also can be an inclined-plane), non-center at this conducting probe, the summit of circular cone is online, (inclined-plane is then nonopiate and non-parallel with the center line of conducting probe 1 in this way) has a resistance portion 6, wherein between the two ends of conducting probe 1, conducting probe 1 protrudes in the diameter of the part of opening 4, is located at the diameter of the part in the conducting sleeve 2 less than conducting probe 1; One spring 3, it is located in this conducting sleeve 2, the profile of spring 3 is a cylinder, one end of spring 3 is resisted against wall within the conducting sleeve 2, the other end contact circular cone (or inclined-plane) of spring 3 and retaining edge 5 retaining system resistance portions 6, partially conductive probe 1 is contacted with wall within the conducting sleeve 2, and make the other end of conducting probe 1 protrude in opening 4.Thus, increase the contact area of conducting probe 1 and conducting sleeve 2, reach the effect that reduces resistance and increase the electric signal transmission.
Fig. 4 and Fig. 5 are respectively the probe structure exploded view and the cut-open view of second preferred embodiment of the utility model, and Fig. 6 and Fig. 7 are respectively the probe structure exploded view and the cut-open view of the 3rd preferred embodiment of the utility model, please also refer to Fig. 4 to Fig. 7, first preferred embodiment of itself and the utility model do not exist together be the winding density of spring 3 center sections of second preferred embodiment greater than other parts, and the winding density at spring 3 center sections of the 3rd preferred embodiment and two ends is greater than other parts.Thus, except that the described effect of aforementioned first preferred embodiment, can prevent that more spring is entangled with and elastic fatigue.
Fig. 8 and Fig. 9 are respectively the probe structure exploded view and the cut-open view of the 4th preferred embodiment of the utility model, please also refer to Fig. 8 and Fig. 9, it is that the diameter of spring 3 of the 4th preferred embodiment is gradually little to two ends by the centre of spring 3 that first preferred embodiment of itself and the utility model does not exist together.Thus, except that the described effect of aforementioned each embodiment, more increase the touch opportunity of conducting probe 1 and conducting sleeve 2, reach the effect that reduces resistance and increase the electric signal transmission.
Figure 10 and Figure 11 are respectively the probe structure exploded view and the cut-open view of the 5th preferred embodiment of the utility model, and Figure 12 and Figure 13 are respectively the probe structure exploded view and the cut-open view of the 6th preferred embodiment of the utility model, please also refer to Figure 10 to Figure 13, the 4th preferred embodiment of itself and the utility model do not exist together be the winding density of spring 3 center sections of the 5th preferred embodiment greater than other parts, and the winding density at spring 3 center sections of the 6th preferred embodiment and two ends is greater than other parts.Thus, except that the described effect of aforementioned the 4th preferred embodiment, can prevent that more spring is entangled with and elastic fatigue.
Figure 14 and Figure 15 are respectively the probe structure exploded view and the cut-open view of the 7th preferred embodiment of the utility model, please also refer to Figure 14 and Figure 15, this probe structure comprises: a conducting sleeve 12, its two ends have an opening 14 respectively, and this two opening 14 has a retaining edge 15 respectively; Two conducting probes 11, it partly is located in the conducting sleeve 12 respectively, the one end system of two conducting probes 11 is all a circular cone, also can be all an inclined-plane or be respectively a circular cone and an inclined-plane, non-center, the summit of circular cone online (inclined-plane is then nonopiate and non-parallel with the center line of conducting probe 11 in this way) at conducting probe 11, has a resistance portion 16 between the two ends of two conducting probes 11 respectively, wherein, two conducting probes 11 protrude in the diameter of the part of two openings 14, are located at the diameter of the part in the conducting sleeve 12 respectively less than two conducting probes 11; One spring 13, it is located in the conducting sleeve 12, the profile of spring 13 is a cylinder, the two ends of spring 13 are contact one circular cone respectively, also can distinguish contact one inclined-plane or difference contact one circular cone and an inclined-plane, and two retaining edge 15 keep off system two resistance portions 16 respectively, two conducting probes 11 are partly contacted with wall within the conducting sleeve 12 respectively, and make the other end of two conducting probes 11 protrude in two openings 14 respectively.Thus, increase the contact area of conducting probe 11 and conducting sleeve 12, reach the effect that reduces resistance and increase the electric signal transmission.
Figure 16 and Figure 17 are respectively the probe structure cut-open view of the 8th preferred embodiment and the 9th preferred embodiment of the utility model, please also refer to Figure 16 and Figure 17, the 7th preferred embodiment of itself and the utility model do not exist together be the winding density of spring 13 center sections of the 8th preferred embodiment greater than other parts, and the winding density at spring 13 center sections of the 9th preferred embodiment and two ends is greater than other parts.Thus, except that the effect of aforementioned the 7th preferred embodiment, can prevent that more spring is entangled with and elastic fatigue.
The probe structure cut-open view of the tenth preferred embodiment of Figure 18 position the utility model please refer to 18 figure, and the diameter of the spring 13 of itself and the utility model the 7th preferred embodiment is gradually little to two ends by the centre of spring 13.Thus, except that the described effect of aforementioned the 7th to the 9th preferred embodiment, more increase the touch opportunity of conducting probe 11 and conducting sleeve 12, reach the effect that reduces resistance and increase the electric signal transmission.
Figure 19 and Figure 20 are respectively the 11 preferred embodiment of the utility model and the probe structure cut-open view of the 12 preferred embodiment, please also refer to Figure 19 and Figure 20, the tenth preferred embodiment of itself and the utility model do not exist together be the winding density of spring 13 center sections of the 11 preferred embodiment greater than other parts, and the winding density at spring 13 center sections of the 12 preferred embodiment and two ends is greater than other parts.Thus, except that the described effect of aforementioned the tenth preferred embodiment, can prevent that more spring is entangled with and elastic fatigue.
Figure 21 is the probe structure cut-open view of the 13 preferred embodiment of the utility model, please refer to Figure 21, it is that the end system of two conducting probes 11 is respectively a cone and vamp that the 7th preferred embodiment of itself and the utility model does not exist together, non-center at conducting probe 11, the summit of circular cone is online, and the inclined-plane then takes quadrature and non-parallel with the center line of conducting probe 11.Thus, increase the contact area of conducting probe 11 and conducting sleeve 12, reach the effect that reduces resistance and increase the electric signal transmission.
Figure 22 and Figure 23 are respectively the probe structure cut-open view of the tenth these preferred embodiment base 15 preferred embodiment of the utility model, please also refer to the 22 figure and 23 figure, the good specific embodiment of the tenth triangle of itself and the utility model do not exist together be the winding density of spring 13 center sections of the 14 preferred embodiment greater than other parts, and the winding density at spring 13 center sections of the 15 preferred embodiment and two ends is greater than other parts.Thus, except that the effect of aforementioned the 13 preferred embodiment, can prevent that more spring is entangled with and elastic fatigue.
Figure 24 is the probe structure cut-open view of the 16 preferred embodiment of the utility model, please refer to Figure 24, it is that the diameter of spring 13 of the 16 preferred embodiment is faded to two ends by the centre of spring 13 that the 13 preferred embodiment of itself and the utility model does not exist together.Thus, except that the described effect of aforementioned the 13 to the 15 preferred embodiment, more increase the touch opportunity of conducting probe 11 and conducting sleeve 12, reach the effect that reduces resistance and increase the electric signal transmission.
Figure 25 and Figure 26 are respectively the 17 preferred embodiment of the utility model and the probe structure cut-open view of the 18 preferred embodiment, please also refer to Figure 25 and Figure 26, the 16 preferred embodiment of itself and the utility model do not exist together be the winding density of spring 13 center sections of the 17 preferred embodiment greater than other parts, and the winding density at spring 13 center sections of the 18 preferred embodiment and two ends is greater than other parts.Thus, except that the described effect of aforementioned the 16 preferred embodiment, can prevent that more spring is entangled with and elastic fatigue.
Figure 27 and Figure 28 are respectively the probe structure exploded view and the cut-open view of the 19 preferred embodiment of the utility model, please also refer to Figure 27 and Figure 28, and this probe structure comprises: a conducting sleeve 2, and the one end has opening 4, and opening 4 has a retaining edge 5; One conducting probe 1, its part is located in the conducting sleeve 2, one end of conducting probe 1 has a V-arrangement depressed part, the non-center at conducting probe 1 of the other end of V-arrangement depressed part opening is online, has a resistance portion 6 between the two ends of conducting probe 1, wherein, conducting probe 1 protrudes in the diameter of the part of opening 4, is located at the diameter of the part in the conducting sleeve 2 less than conducting probe 1; One spring 3, it is located in the conducting sleeve 2, the diameter of spring 3 is gradually little to two ends by the centre of spring 3, one end of spring 3 is resisted against wall within the conducting sleeve 2, the other end contact V-arrangement depressed part of spring 3 and retaining edge 5 retaining system resistance portions 6, partially conductive probe 1 is contacted with wall within the conducting sleeve 2, and make the other end of conducting probe 1 protrude in opening 4.Thus, increase the contact area of conducting probe 1 and conducting sleeve 2, reach the effect that reduces resistance and increase the electric signal transmission.
Figure 29 and Figure 30 are respectively the probe structure exploded view and the cut-open view of the 20 preferred embodiment of the utility model, and Figure 31 and Figure 32 are respectively the probe structure exploded view and the cut-open view of the 21 preferred embodiment of the utility model, please also refer to Figure 29 to Figure 32, the 19 preferred embodiment of itself and the utility model do not exist together be the winding density of spring 3 center sections of the 20 preferred embodiment greater than other parts, and the winding density at spring 3 center sections of the 21 preferred embodiment and two ends is greater than other parts.Thus, except that the described effect of aforementioned the 19 preferred embodiment, can prevent that more spring is entangled with and elastic fatigue.
Figure 33 and Figure 34 are respectively the probe structure exploded view and the cut-open view of the 22 preferred embodiment of the utility model, please also refer to Figure 33 and Figure 34, this probe structure comprises: a conducting sleeve 12, its two ends have an opening 14 respectively, and this two opening 14 has a retaining edge 15 respectively; Two conducting probes 11, it partly is located in the conducting sleeve 12 respectively, the one end system of two conducting probes 11 all has a V-arrangement depressed part, the non-center at conducting probe 11 of the other end of V-arrangement depressed part opening is online, has a resistance portion 16 between the two ends of two conducting probes 11 respectively, wherein, two conducting probes 11 protrude in the diameter of the part of two openings 14, are located at the diameter of the part in the conducting sleeve 12 respectively less than two conducting probes 11; One spring 13, it is located in the conducting sleeve 12, the diameter of spring 13 is gradually little to two ends by the centre of this spring, the two ends of spring 13 are contact V-arrangement depressed part respectively, and two retaining edge 15 keep off system two resistance portions 16 respectively, two conducting probes 11 are partly contacted with wall within the conducting sleeve 12 respectively, and make the other end of two conducting probes 11 protrude in two openings 14 respectively.Thus, increase the contact area of conducting probe 11 and conducting sleeve 12, reach the effect that reduces resistance and increase the electric signal transmission.
Figure 35 and Figure 36 are respectively the 23 preferred embodiment of the utility model and the probe structure cut-open view of the 24 preferred embodiment, please also refer to Figure 35 and Figure 36, the 22 preferred embodiment of itself and the utility model do not exist together be the winding density of spring 13 center sections of the 23 preferred embodiment greater than other parts, and the winding density at spring 13 center sections of the 24 preferred embodiment and two ends is greater than other parts.Thus, except that the described effect of aforementioned the 22 preferred embodiment, can prevent that more spring is entangled with and elastic fatigue.
Figure 37 is the probe structure cut-open view of the 25 preferred embodiment of the utility model, please refer to Figure 37, it is that the end system of two conducting probes of the 25 preferred embodiment has a V-arrangement depressed part and an inclined-plane respectively that the 22 jiao of good specific embodiment of itself and the utility model do not exist together, the non-center at conducting probe 11 of the other end of V-arrangement depressed part opening is online, the center line of inclined-plane and conducting probe 11 is nonopiate and non-parallel, the two ends of spring 13 are contact V-arrangement depressed part and inclined-plane respectively, thus, increase conducting probe 11 in the contact area of conducting sleeve 12, reach the effect that reduces resistance and increase the electric signal transmission.
Figure 38 and Figure 39 are respectively the 26 preferred embodiment of the utility model and the probe structure cut-open view of the 27 preferred embodiment, please also refer to Figure 38 and Figure 39, the 25 preferred embodiment of itself and the utility model do not exist together be the winding density of spring 13 center sections of the 26 preferred embodiment greater than other parts, and the winding density at spring 13 center sections of the 27 preferred embodiment and two ends is greater than other parts.Thus, except that the described effect of aforementioned the 25 preferred embodiment, can prevent that more spring is entangled with and elastic fatigue.
And the measuring end profile of the conducting probe 11 of the above all embodiment there is no particular restriction, the user can adopt the conducting probe 11 of different measuring end profiles according to actual operating position.
As mentioned above, the utility model system utilizes the conducting probe of off-centre and the different spring that twines the type of asking to form a probe structure, the contact area of conducting probe and conducting sleeve is increased, reduce resistance and improve the telecommunication transfer efficiency, and make conducting probe in chip BGA processing procedure, measure line conduction whether the time, because of effective transmission of electric signal, and then reach the purpose of accurate measurement; With regard to the utilizability on the industry, the product that utilizes the utility model to derive is when the demand that can fully satisfy existing market.
The utility model discloses with preferred embodiment hereinbefore, so has the knack of this operator and it should be understood that this embodiment only is used to describe the utility model, and should not be read as the scope that limits the utility model.It should be noted,, all should be made as in the category of containing with the utility model such as with the variation and the displacement of this embodiment equivalence.Therefore, the protection domain of the utility model is as the criterion when the scope that define with claims.

Claims (26)

1, a kind of probe structure is characterized in that this probe structure comprises:
One conducting sleeve, the one end has an opening, and this opening has a retaining edge;
One conducting probe, it partly is located in this conducting sleeve, one end of this conducting probe is a circular cone or an inclined-plane, non-center at this conducting probe, the summit of this circular cone is online, the center line of this inclined-plane and this conducting probe is nonopiate and non-parallel, has a resistance portion between the two ends of this conducting probe;
One spring, it is located in this conducting sleeve, one end of this spring is resisted against wall within this conducting sleeve, this circular cone of other end contact of this spring or this inclined-plane and this this resistance portion of retaining edge retaining system, this conducting probe of part is contacted with wall within this conducting sleeve, and make the other end of this conducting probe protrude in this opening.
2, probe structure according to claim 1 is characterized in that: this conducting probe protrudes in the diameter of the part of this opening, is located at the diameter of the part in this conducting sleeve less than this conducting probe.
3, probe structure according to claim 1 is characterized in that: this spring configuration is a cylinder.
4, as the probe structure as described in the claim 3, it is characterized in that: the winding density of this spring center section is greater than other parts.
5, as the probe structure as described in the claim 3, it is characterized in that: the winding density at this spring center section and two ends is greater than other parts.
6, probe structure according to claim 1 is characterized in that: the diameter of this spring is gradually little to two ends by the centre of this spring.
7, as the probe structure as described in the claim 6, it is characterized in that: the winding density of this spring center section is greater than other parts.
8, as the probe structure as described in the claim 6, it is characterized in that: the winding density at this spring center section and two ends is greater than other parts.
9, a kind of probe structure is characterized in that this probe structure comprises:
One conducting sleeve, its two ends have an opening respectively, and this two opening has a retaining edge respectively;
Two conducting probes, it partly is located in this conducting sleeve respectively, the one end system of this two conducting probe is all a circular cone, is all an inclined-plane or is respectively a circular cone and an inclined-plane, non-center at this conducting probe, the summit of this circular cone is online, the center line of this inclined-plane and this conducting probe is nonopiate and non-parallel, has a resistance portion between the two ends of this two conducting probe respectively;
One spring, it is located in this conducting sleeve, the two ends of this spring are this circular cone of contact, difference this inclined-plane of contact or difference this circular cone of contact and this inclined-plane respectively, and this two retainings edge keeps off this two resistances portion of system respectively, this two conducting probe is partly contacted with wall within this conducting sleeve respectively, and make the other end of this two conducting probe protrude in this two opening respectively.
10, as the probe structure as described in the claim 9, it is characterized in that: this two conducting probe protrudes in the diameter of the part of this two opening, is located at the diameter of the part in this conducting sleeve respectively less than this two conducting probe.
11, as the probe structure as described in the claim 9, it is characterized in that: this spring configuration is a cylinder.
12, as the probe structure as described in the claim 11, it is characterized in that: the winding density of this spring center section is greater than other parts.
13, as the probe structure as described in the claim 11, it is characterized in that: the winding density at this spring center section and two ends is greater than other parts.
14, as the probe structure as described in the claim 9, it is characterized in that: the diameter of this spring is gradually little to two ends by the centre of this spring.
15, as the probe structure as described in the claim 14, it is characterized in that: the winding density of this spring center section is greater than other parts.
16, as the probe structure as described in the claim 14, it is characterized in that: the winding density at this spring center section and two ends is greater than other parts.
17, a kind of probe structure is characterized in that this probe structure comprises:
One conducting sleeve, the one end has opening, and this opening has a retaining edge;
One conducting probe, its part are located in this conducting sleeve, and an end of this conducting probe has a V-arrangement depressed part, and the non-center at this conducting probe of the other end of this V-arrangement depressed part opening is online, have a resistance portion between the two ends of this conducting probe;
One spring, it is located in this conducting sleeve, one end of this spring is resisted against wall within this conducting sleeve, this V-arrangement depressed part of the other end contact of this spring and this this resistance portion of retaining edge retaining system, this conducting probe of part is contacted with wall within this conducting sleeve, and make the other end of this conducting probe protrude in this opening.
18, as the probe structure as described in the claim 17, it is characterized in that: this conducting probe protrudes in the diameter of the part of this opening, is located at the diameter of the part in this conducting sleeve respectively less than this conducting probe.
19, as the probe structure as described in the claim 17, it is characterized in that: the diameter of this spring is gradually little to two ends by the centre of this spring.
20, as the probe structure as described in the claim 19, it is characterized in that: the winding density of this spring center section is greater than other parts.
21, as the probe structure as described in the claim 19, it is characterized in that: the winding density at this spring center section and two ends is greater than other parts.
22, a kind of probe structure is characterized in that this probe structure comprises:
One conducting sleeve, its two ends have an opening respectively, and this two opening has a retaining edge respectively;
Two conducting probes, it partly is located in this conducting sleeve respectively, the one end system of this two conducting probe all has a V-arrangement depressed part or has a V-arrangement depressed part and an inclined-plane respectively, the non-center at this conducting probe of the other end of this V-arrangement depressed part opening is online, the center line of this inclined-plane and this conducting probe is nonopiate and non-parallel, has a resistance portion between the two ends of this two conducting probe respectively;
One spring, it is located in this conducting sleeve, the two ends of this spring are this V-arrangement depressed part of contact or difference this V-arrangement depressed part of contact and this inclined-plane respectively, and this two retainings edge keeps off this two resistances portion of system respectively, this two conducting probe is partly contacted with wall within this conducting sleeve respectively, and make the other end of this two conducting probe protrude in this two opening respectively.
23, as the probe structure as described in the claim 22, it is characterized in that: this two conducting probe protrudes in the diameter of the part of this two opening, is located at the diameter of the part in this conducting sleeve respectively less than this two conducting probe.
24, as the probe structure as described in the claim 22, it is characterized in that: the diameter of this spring is gradually little to two ends by the centre of this spring.
25, as the probe structure as described in the claim 24, it is characterized in that: the winding density of this spring center section is greater than other parts.
26, as the probe structure as described in the claim 24, it is characterized in that: the winding density at this spring center section and two ends is greater than other parts.
CNU2007201518066U 2007-06-12 2007-06-12 Probe construction Expired - Fee Related CN201141878Y (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CNU2007201518066U CN201141878Y (en) 2007-06-12 2007-06-12 Probe construction

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CNU2007201518066U CN201141878Y (en) 2007-06-12 2007-06-12 Probe construction

Publications (1)

Publication Number Publication Date
CN201141878Y true CN201141878Y (en) 2008-10-29

Family

ID=40069589

Family Applications (1)

Application Number Title Priority Date Filing Date
CNU2007201518066U Expired - Fee Related CN201141878Y (en) 2007-06-12 2007-06-12 Probe construction

Country Status (1)

Country Link
CN (1) CN201141878Y (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102713643A (en) * 2010-04-15 2012-10-03 东京毅力科创株式会社 Contact structure and method for manufacturing contact structure
CN103308733A (en) * 2012-03-13 2013-09-18 日本电产理德株式会社 Probe and connecting jig
CN103487616A (en) * 2013-09-27 2014-01-01 昆山迈致治具科技有限公司 Probe for detecting mobile terminal antenna

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102713643A (en) * 2010-04-15 2012-10-03 东京毅力科创株式会社 Contact structure and method for manufacturing contact structure
CN103308733A (en) * 2012-03-13 2013-09-18 日本电产理德株式会社 Probe and connecting jig
CN103487616A (en) * 2013-09-27 2014-01-01 昆山迈致治具科技有限公司 Probe for detecting mobile terminal antenna

Similar Documents

Publication Publication Date Title
CN201141878Y (en) Probe construction
CN202102131U (en) Testing and marking device for probe of electric imaging apparatus
CN202980268U (en) Protective gloves with voltage detection function
CN103519805B (en) Handheld electrocardio detecting device
CN202738876U (en) Multipurpose electrician gloves
JP5389698B2 (en) Probe for measurement
CN109103711A (en) A kind of radio frequency testing socket and test method
CN208350862U (en) Scalable conducting probe
CN112083205A (en) Kelvin test probe with ultra-high current
CN207301157U (en) A kind of current pincerlike meter for being easy to calibration
CN207148164U (en) A kind of quick loopback instrument of four-wire channel for voice frequency distributing unit
CN206183267U (en) Assay appearance is with detecting handle
CN210426833U (en) Resistance type pressure sensor and active pen
US10801905B2 (en) Grip-strength device with detection function
CN210954150U (en) Intelligent electric power test pen
CN214174368U (en) Soil moisture tachymeter for soil detection
CN211505632U (en) Improved tweezers type test fixture
US11307224B2 (en) Measuring rod for electric meter and electric meter assembly using the same
CN201945410U (en) Large-power electric appliance main-circuit socket connector contact terminal pressure measuring instrument
CN203037311U (en) Liquid level sensor
CN207866866U (en) A kind of circuit board detecting needle pen
CN208737961U (en) A kind of linear potentiometer for measurement
CN209401420U (en) A kind of removable open resistor
CN218445686U (en) Induction module and pincerlike universal meter
CN201697972U (en) Test pencil

Legal Events

Date Code Title Description
C14 Grant of patent or utility model
GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20081029

Termination date: 20130612