CN201122138Y - Example holder for pressing X-ray fluorescence analysis test sample wafer - Google Patents
Example holder for pressing X-ray fluorescence analysis test sample wafer Download PDFInfo
- Publication number
- CN201122138Y CN201122138Y CNU2007201908550U CN200720190855U CN201122138Y CN 201122138 Y CN201122138 Y CN 201122138Y CN U2007201908550 U CNU2007201908550 U CN U2007201908550U CN 200720190855 U CN200720190855 U CN 200720190855U CN 201122138 Y CN201122138 Y CN 201122138Y
- Authority
- CN
- China
- Prior art keywords
- sample
- ray fluorescence
- sample wafer
- fluorescence analysis
- reduces
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000004458 analytical method Methods 0.000 title claims abstract description 22
- 238000004876 x-ray fluorescence Methods 0.000 title claims abstract description 13
- 238000003825 pressing Methods 0.000 title abstract description 3
- 230000006835 compression Effects 0.000 claims description 6
- 238000007906 compression Methods 0.000 claims description 6
- 239000000463 material Substances 0.000 abstract description 5
- 238000005516 engineering process Methods 0.000 abstract description 4
- 239000011343 solid material Substances 0.000 abstract description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 abstract description 2
- 229910052782 aluminium Inorganic materials 0.000 abstract description 2
- 239000013043 chemical agent Substances 0.000 abstract 1
- 239000002699 waste material Substances 0.000 abstract 1
- 238000000034 method Methods 0.000 description 9
- 239000003153 chemical reaction reagent Substances 0.000 description 7
- 238000005259 measurement Methods 0.000 description 6
- KGBXLFKZBHKPEV-UHFFFAOYSA-N boric acid Chemical compound OB(O)O KGBXLFKZBHKPEV-UHFFFAOYSA-N 0.000 description 5
- 239000004327 boric acid Substances 0.000 description 5
- 239000008187 granular material Substances 0.000 description 3
- 239000010410 layer Substances 0.000 description 3
- 238000004846 x-ray emission Methods 0.000 description 3
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 2
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 229910052799 carbon Inorganic materials 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 229910000831 Steel Inorganic materials 0.000 description 1
- 239000004411 aluminium Substances 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 238000000748 compression moulding Methods 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 239000003814 drug Substances 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000011229 interlayer Substances 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 238000005272 metallurgy Methods 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000012764 semi-quantitative analysis Methods 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 238000004441 surface measurement Methods 0.000 description 1
Images
Abstract
A sample tray for pressing x-ray fluorescence analysis testing sample wafer relates to the sample tray used for preparing a solid material sample wafer which is hard to be pressed and formed in an x-ray fluorescence analysis technology. The sample tray is characterized in that the structure of the sample tray is a box-shaped sample tray of which the outer wall is matched with the inner cavity wall of a tablet forming die and the upper end is opened. The box-shaped sample tray of the utility model can be pressed and formed by waste aluminum sheet, such as pop can with low cost, etc., substitutes chemical agent with higher cost, reduces the possibility that the pressed sample wafer is polluted, reduces the measuring error, reduces the mosaic surface, the surface escaping material and the uneven surface of the sample wafer, improves the smoothness of the surface of the sample wafer, solves the problems that the height of the sample wafer is not high and the inner part is uneven, reduces the operating difficulty, lowers the analysis cost and improves the analysis speed.
Description
Technical field:
A kind of sample holder of suppressing x-ray fluorescence analysis test sample relates to and is used for the sample holder that x-ray fluorescence analysis technology is difficult to the solid material print preparation of compression moulding.
Background technology
At present, x-ray fluorescence analysis technology has become the main method of inspection in the field solid materials analyses such as carbon element, metallurgy, geology, food, medicine, iron and steel, and particularly semi-quantitative analysis check, the judgement to the assorted sample of difficulty has special advantages.In pulverized specimen analytical control process, sample need be pressed into sheet after, measure again.When measuring the uneven solid sample of component distributing, also need usually the sample solid sample is broken into powdery, be pressed into the product sheet that is evenly distributed again, could on x-ray fluorescence spectrometry instrument instrument, test.
Traditional method for making sample is that the specimen granular material is put into compression mold, adds boric acid or the like chemical reagent again, suppresses; The specimen granular material is suppressed in flakes, and formed the chemical reagent layers such as box-like boric acid of ring-type or back-off at test sample in blocks; The sample strip of utilizing this method to make chemical reagent interlayer off-centre such as specimen print and boric acid occur, runs material through regular meeting, the flower face phenomenon, or makes the insufficient height of sample, or chemical reagent layer corrupted phenomenon such as boric acid, causes the analysis to measure data inaccurate; Because print surface, outward appearance are defective, the actual (real) thickness of sample does not reach the requirement of instrumental analysis, can have a strong impact on the judgement of analyzing quality and analysis result.
Summary of the invention
The purpose of this utility model is exactly the deficiency that exists at above-mentioned prior art, provide a kind of and can effectively overcome print off-centre, race material, flower face phenomenon, or make the insufficient height of sample, or chemical reagent layer corrupted phenomenon such as boric acid, the sample holder that effectively improves the compacting x-ray fluorescence analysis test sample of analysis to measure data accuracy.
The purpose of this utility model is achieved through the following technical solutions.
A kind of sample holder of suppressing x-ray fluorescence analysis test sample, the structure that it is characterized in that its sample holder are the box-like sample holder that outer wall matches with the compression mold internal chamber wall, the upper end is uncovered.
A kind of sample holder of suppressing x-ray fluorescence analysis test sample of the present utility model, the wall thickness that it is characterized in that described sample holder is 0.2.-0.5mm.
Box-like sample holder of the present utility model can be formed by cheap aluminium scrap sheets such as pop can compacting, replaced the higher chemical reagent of cost, because the ring thickness that chemical reagent is done is generally 1-1.5mm, and the sample strip anchor ring thickness that compacting of the present utility model forms has only 0.2.-0.5mm, has effectively increased measurement face and has increased; Its sample holder sample holder is the same with the inner core size of sheeter, and the material phenomenon can not take place to run; And, become measurement compacting sample strip upper surface by measuring compacting sample strip lower surface because the improvement of method for making sample has also changed measurement face.The variation of surface measurements, make operating personnel to suppressing the mould of measurement face, be more prone to cleaning, reduced the contaminated possibility of compacting sample strip, reduced the error of measuring, colored face, the surface of having reduced the print surface runs that material, surface are inhomogeneous, the smoothness that improves the print surface, solve the print insufficient height and inner inhomogeneous, reduce operation easier, reduction analysis cost, improved analysis speed.
Description of drawings
Fig. 1 is a structural representation of the present utility model.
Fig. 2 is the vertical view of Fig. 1.
Embodiment
A kind of sample holder of suppressing x-ray fluorescence analysis test sample, the structure of its sample holder are the box-like sample holder 1 that outer wall matches with the compression mold internal chamber wall, the upper end is uncovered, and the wall thickness of sample holder is 0.2.-0.5mm.
Test carbon element sample is put into the box-like sample holder that matches with the compression mold inner cavity size earlier in compression mold, the granular material of putting into sample to be tested again carries out the mold pressing film-making; The sample strip that sample strip of being made by new method for making sample and commonsense method are made, through relatively, the specimen thickness that new method for making sample is made can guarantee the measurement requirement (4 millimeters) of x-ray fluorescence spectrometry instrument between 4-5 millimeter; The sample strip that commonsense method is made is in uneven thickness, and thickness can not guarantee measurement requirement on the x-ray fluorescence spectrometry instrument between 3-4.
Claims (2)
1. sample holder of suppressing x-ray fluorescence analysis test sample, the structure that it is characterized in that its sample holder are the box-like sample holder that outer wall matches with the compression mold internal chamber wall, the upper end is uncovered.
2. a kind of sample holder of suppressing x-ray fluorescence analysis test sample according to claim 1, the wall thickness that it is characterized in that described sample holder is 0.2.-0.5mm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU2007201908550U CN201122138Y (en) | 2007-12-17 | 2007-12-17 | Example holder for pressing X-ray fluorescence analysis test sample wafer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU2007201908550U CN201122138Y (en) | 2007-12-17 | 2007-12-17 | Example holder for pressing X-ray fluorescence analysis test sample wafer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201122138Y true CN201122138Y (en) | 2008-09-24 |
Family
ID=40009371
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNU2007201908550U Expired - Lifetime CN201122138Y (en) | 2007-12-17 | 2007-12-17 | Example holder for pressing X-ray fluorescence analysis test sample wafer |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN201122138Y (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105067652A (en) * | 2015-08-26 | 2015-11-18 | 上海化工研究院 | Movable type combination device fast measuring specific components in fertilizer |
| CN106769309A (en) * | 2016-12-20 | 2017-05-31 | 武汉科技大学 | The preparation method of the xrf analysis print combined based on foamed plastics |
-
2007
- 2007-12-17 CN CNU2007201908550U patent/CN201122138Y/en not_active Expired - Lifetime
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105067652A (en) * | 2015-08-26 | 2015-11-18 | 上海化工研究院 | Movable type combination device fast measuring specific components in fertilizer |
| CN105067652B (en) * | 2015-08-26 | 2018-01-05 | 上海化工研究院有限公司 | The portable combination unit of specific components in a kind of quick measure chemical fertilizer |
| CN106769309A (en) * | 2016-12-20 | 2017-05-31 | 武汉科技大学 | The preparation method of the xrf analysis print combined based on foamed plastics |
| CN106769309B (en) * | 2016-12-20 | 2019-05-10 | 武汉科技大学 | Preparation method based on the xrf analysis print that foamed plastics combines |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term | ||
| CX01 | Expiry of patent term |
Granted publication date: 20080924 |