CN201119044Y - Inductance heating device for microwave measurement - Google Patents
Inductance heating device for microwave measurement Download PDFInfo
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- CN201119044Y CN201119044Y CNU2007200816602U CN200720081660U CN201119044Y CN 201119044 Y CN201119044 Y CN 201119044Y CN U2007200816602 U CNU2007200816602 U CN U2007200816602U CN 200720081660 U CN200720081660 U CN 200720081660U CN 201119044 Y CN201119044 Y CN 201119044Y
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- induction heating
- vacuum furnace
- heating equipment
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Abstract
The utility model relates to an induction heating device in the microwave measurement, which belongs to the technical fields of the microwave and the millimeter wave, and especially belongs to the technical field of the microwave and millimeter wave test. The induction heating device comprises an induction heating equipment, an induction coil and a vacuum furnace, wherein, two connecting holes are arranged on the vacuum furnace; the induction coil is made of copper pipe, the middle part thereof is encircled into a spiral shape and is positioned in the vacuum furnace, and both ends penetrate through the connecting holes of the vacuum furnace and are connected with the induction heating equipment. A cooling system can also be added, the induction heating equipment can be provided with a power control device, and a temperature measuring hole, an observation hole, an air charging hole, a vacuum measuring hole, and a vacuum bleeder hole can be arranged on the vacuum furnace. The induction heating device has the advantages of simple structure, convenient operation and high heating efficiency, and can perform heating to the measured object under different temperature conditions, and thereby the microwave measurement can be performed.
Description
Affiliated technical field
The invention belongs to microwave, millimeter-wave technology field, particularly microwave, millimeter wave technical field of measurement and test.
Background technology
Along with the development of microwave, millimeter-wave technology, the application of microwave, millimeter wave dielectric material and device also more and more widely.When the operating ambient temperature of these materials and device changed, their microwave property also can change thereupon, when serious even cisco unity malfunction.Therefore, when developing and use, need under different temperature conditions, test the microwave property of these devices and material.
When the working temperature of the microwave device of required test or dielectric material is low,, adopt insulating box to get final product usually for example less than 100 ℃.But when temperature is elevated to Baidu even thousands of spending, then adopts high temperature furnace usually or in vacuum furnace, testee is heated.
Document " Vasundara V.Varadan; Richard D.Hollinger; Deepak K.Ghodgaonkar; VijayK.Varadan; Free-space broadband measurement of high-temperature complex dielectricproperties at microwave frequencies; IEEE Transactions on Instrumentation andMeasurement, 1991, Vol.40, No.5, p842～846. " in adopt the method for resistance heating that sample is heated, temperature is elevated to 850 ℃.But when temperature need rise to higher temperature, adopt the method for resistance heating need adopt noble metal, the cost costliness.
Document " Paul Friederich; Rich L.Moore; James W.Larsen; 1000 ℃ of Elevated temperaturemeasurements of permittivity and permeability at temperatures above; Antennasand Propagation Society International Symposium; 1991, Vol.3, p1672～1675. " in utilize and in vacuum furnace, to adopt the method for graphite electrode heating that sample is heated, temperature can be up to 2000 ℃.But graphite electrode is easily crisp, and uses inconvenience.
Document " M.Garven; J.P.Calame, B.Myers, D.Lobas; Variable temperaturemeasurements of the dielectric properties of lossy materials in W-band, Infrared andMillimeter Waves and 13
ThInternational Conference on Terahertz Electronics, 2005, Vol.1, p174～175. " in adopt and in vacuum furnace, sample heated, and the nitrogen that fills certain malleation is to avoid testing apparatus oxidized.
Introduced Muscovite high-temperature dielectric ability meter in the document " what little watt, the employing Resonant-cavity Method makes clear of the high-temperature dielectric performance of wave material, infrared and millimeter wave journal, 2004, Vol.23, No.2, p157～160 for Li Yi, Li Jianbao ".This instrument adopts the high temperature furnace of inflated with nitrogen atmosphere that sample is heated, and temperature can be raised to 1200 ℃.
In sum, abroad studied for many years at the high temperature test technical elements to dielectric material and microwave device, the firing equipment that utilizes is the high temperature furnace or the vacuum furnace of inflated with nitrogen atmosphere protection usually, adopts the heating of resistance heating or graphite electrode.These heaters are complicated, and difficulty of processing is higher, firing rate is slow, cooling time is long, are difficult to adapt to measured device or material are carried out the microwave parameters test present situation requirement of higher temperature.
Summary of the invention
Task of the present invention provides a kind of high-temperature heating equipment, to realize the microwave measurement under the hot environment.
Technical scheme of the present invention is:
Induction heating equipment in the microwave measurement comprises induction heating equipment 1, induction coil 2, vacuum furnace 3; It is characterized in that having two connecting holes on the vacuum furnace 3; Induction coil 2 adopts copper tube to make, and its middle part coiled also is positioned at vacuum furnace 3, and the connecting hole that vacuum furnace 3 is passed at two ends links to each other with induction heating equipment.
The course of work of the induction heating equipment in the above-mentioned microwave measurement can simply be described as: microwave-medium sample to be measured is positioned over certain position in the vacuum furnace 3 internal induction circles 2, open induction heating equipment 1, heat is treated micrometer ripple dielectric sample by induction coil 2 and is heated, when be heated to temperature required after, stop heating, and treat micrometer ripple dielectric sample by the microwave-medium measurement mechanism and test.
Cooling system can be common water-cooling system.
Described induction heating equipment 1 can have output control device, with the size of control power output.
Carry out microwave-medium for convenience and measure, open on the described vacuum furnace 3 and can have temperature survey hole, inspection hole, air-filled pore, vacuum measurement hole, vacuum pumping hole etc.
Need to prove that the present invention is fit to the high temperature microwave parameters test of different various microwave devices and dielectric material, i.e. the present invention can provide high-temperature heating equipment for different frequency range carries out the microwave parameters high temperature test to various microwave devices and dielectric material.Have advantages such as simple in structure, easy to make, that firing rate is fast.
Description of drawings
Fig. 1 is the induction heating equipment schematic diagram in the microwave measurement of the present invention
Wherein, the 1st, induction heating equipment, the 2nd, induction coil, the 3rd, vacuum furnace.
Fig. 2 has the induction heating equipment schematic diagram in the microwave measurement of cooling system for the present invention
Wherein, the 4th, cooling system.
Embodiment
When test finish or test process in, heating-up temperature is too high, when needing cooling rapidly, induction heating equipment in the microwave measurement of the present invention also can increase a cooling system 4, as shown in Figure 2, cooling system 4 links to each other respectively with induction coil 2 with vacuum furnace 3, for vacuum furnace 3 and induction coil 2 provide circularly cooling liquid respectively.
Claims (5)
1, the induction heating equipment in the microwave measurement comprises induction heating equipment (1), induction coil (2), vacuum furnace (3); It is characterized in that having two connecting holes on the vacuum furnace (3); Induction coil (2) adopts copper tube to make, and its middle part coiled also is positioned at vacuum furnace (3), and the connecting hole that vacuum furnace (3) is passed at two ends links to each other with induction heating equipment.
2, the induction heating equipment in the microwave measurement according to claim 1, it is characterized in that, described induction heating equipment (1) also comprises a cooling system (4), cooling system (4) links to each other respectively with induction coil (2) with vacuum furnace (3), for vacuum furnace (3) and induction coil (2) provide circularly cooling liquid respectively.
3, the induction heating equipment in the microwave measurement according to claim 2 is characterized in that, described cooling system (4) is a water-cooling system.
4, the induction heating equipment in the microwave measurement according to claim 1 is characterized in that, described induction heating equipment (1) has output control device, with the size of control power output.
5, the induction heating equipment in the microwave measurement according to claim 1 is characterized in that, has temperature survey hole, inspection hole, air-filled pore, vacuum measurement hole, vacuum pumping hole on the described vacuum furnace (3).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU2007200816602U CN201119044Y (en) | 2007-10-30 | 2007-10-30 | Inductance heating device for microwave measurement |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU2007200816602U CN201119044Y (en) | 2007-10-30 | 2007-10-30 | Inductance heating device for microwave measurement |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201119044Y true CN201119044Y (en) | 2008-09-17 |
Family
ID=39993647
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNU2007200816602U Expired - Lifetime CN201119044Y (en) | 2007-10-30 | 2007-10-30 | Inductance heating device for microwave measurement |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN201119044Y (en) |
-
2007
- 2007-10-30 CN CNU2007200816602U patent/CN201119044Y/en not_active Expired - Lifetime
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| AV01 | Patent right actively abandoned |
Effective date of abandoning: 20071030 |
|
| C25 | Abandonment of patent right or utility model to avoid double patenting |