CN201016990Y - Semi-catching type high-speed particle velocity measuring apparatus - Google Patents

Semi-catching type high-speed particle velocity measuring apparatus Download PDF

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Publication number
CN201016990Y
CN201016990Y CNU2006201340853U CN200620134085U CN201016990Y CN 201016990 Y CN201016990 Y CN 201016990Y CN U2006201340853 U CNU2006201340853 U CN U2006201340853U CN 200620134085 U CN200620134085 U CN 200620134085U CN 201016990 Y CN201016990 Y CN 201016990Y
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China
Prior art keywords
dielectric film
battery lead
lead plate
circuit loop
particle
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Expired - Fee Related
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CNU2006201340853U
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Chinese (zh)
Inventor
韩建伟
李小银
李宏伟
张振龙
黄建国
全荣辉
蔡明辉
封国强
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National Space Science Center of CAS
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National Space Science Center of CAS
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Abstract

The utility model discloses a semi-interception high-speed particle speed measuring device comprises a first circuit loop, a second circuit loop, and a voltage detecting device measuring at least two circuits of input. A first power, a first counter electrode plate, in the middle of which an insulated membrane is clamped, and a first resistor are connected in series to form a first circuit loop. A second power, a second counter electrode plate, in the middle of which an insulated membrane is clamped, and a second resistor are connected in series to form a second circuit loop. For the two circuits of input, one circuit is connected with the first resistor in parallel, while the other is connected with the second resistor in parallel. The first counter electrode plate and the second counter electrode plate are aligned and arranged on a particle moving path. The advantage of the utility model is that the utility model can realize the on-line measuring and is provided with the high measuring precision, the high signal-noise ratio, the strong electromagnetic interference resistance, the low installation cost and the high detecting efficiency.

Description

A kind of velocity measuring device of half intercept type high speed particle
Technical field
The utility model relates to a kind of velocity measuring device of half intercept type high speed particle.
Background technology
In the application that relates to high speed particle, often need accurately to measure the speed of high speed particle, said herein high speed is meant that speed is thousand meter per seconds (km/s) magnitude and this is more than magnitude.
In the prior art, be used to measure the technology of high rate particle speed, it such as publication number disclosed technology in the patent " a kind of forward scattering laser velocimeter device " of CN2812008, fly over the laser illuminator generation scattering laser that is positioned at specified distance at a high speed by the collection particulate in this technology and measure the time that reaches of particulate, thereby extrapolate the speed of particulate.But the deficiency that the disclosed technology of the document exists is: the weak output signal of scattering laser to the requirement height of signal Processing, makes instrument form relative complex, thereby makes cost height, the reliability of instrument relatively poor.It is the method for another normal measurement high rate particle speed that uses that piezoelectricity tests the speed, the shockwave signals that this method produces when clashing into the rigidity object that is positioned at specified distance by the collection high speed particle obtains the time of arrival of particulate, extrapolate the speed of particulate then, and particle collision to flexible article or liquid the time just can't collect shockwave signals, also just can't measure the time of arrival of particulate and calculate the speed of particulate.Simultaneously, the signal that the particle collision piezoelectric produces has long oscillation period, is difficult to differentiate time of arrival from very near bump signal thereby make piezoelectricity test the speed, and resolution is lower.
The utility model content
The technical problems to be solved in the utility model is to overcome instrument complexity in the resolution that exists in the piezoelectricity velocity measuring technique lower and particle speed can't measure high speed particle and strike flexibility or liquid substance time the and the scattering laser speed measuring device, reliability is low, cost is high deficiency, provide a kind of simple, the measuring accuracy height, the signal to noise ratio (S/N ratio) height, anti-electromagnetic interference capability is strong, the velocity measuring device of the half intercept type high speed particle that is used for ground experiment chamber and the measurement of space device that reliability is high.
In order to achieve the above object, the utility model is taked following technical scheme:
A kind of velocity measuring device of half intercept type high speed particle comprises first circuit loop and second circuit loop, it is characterized in that, comprises that also first power supply, first centre accompany dielectric film battery lead plate, first resistance are connected and form first circuit loop; What accompany dielectric film in the middle of the second source, second forms the second circuit loop to battery lead plate, the series connection of second resistance; One has the voltage check device of measuring the input of two-way at least, and one the tunnel is in parallel with first resistance, and another road is in parallel with second resistance; The alignment to battery lead plate to accompanying dielectric film in the middle of battery lead plate and second that accompanies dielectric film in the middle of described first is arranged on the particle movement path.
In technique scheme, further, can also comprise that first divider resistance and second divider resistance are connected on respectively in described first circuit loop and the second circuit loop.
In technique scheme, further, described voltage check device is an oscillograph.
In technique scheme, described accompany in the middle of first dielectric film to accompanying the identical of dielectric film in the middle of battery lead plate and second to electrode plate structure, all by two-layer be that metal film and the dielectric film that is clipped in the middle of the metal film are formed.
In technique scheme, further, also comprise first support and second support, described two supports comprise that respectively circular clip and base are fixed together, described accompany in the middle of first dielectric film to accompanying dielectric film battery lead plate is clamped in respectively on the circular clip of described first support and second support in the middle of battery lead plate and described second.
In technique scheme, further, described first power supply and second source can be to combine the power supply with duplex feeding.
Compared with prior art, the beneficial effects of the utility model are:
1. middle accompany the very thin to battery lead plate of dielectric film, the time of plasma conducting is short especially, generally can be less than microsecond (us), thus the precision height of the time signal that obtains, thus the precision height of the velocity survey that obtains;
2. can realize on-line measurement, in the process of using, on the adopting process thin as far as possible centre accompany dielectric film to battery lead plate, particle collision and pass in the middle of accompany the insulation touch battery lead plate is only lost very little energy, the measurement that is particle speed is very little to the influence of particle speed, perhaps further by other method can qualitative assessment go out the particulate high-speed impact and pass in the middle of accompany dielectric film to the influence of the process of battery lead plate to particle speed, can be good at satisfying the requirement of high speed particle collision experiment;
3. big (mA magnitude even higher) current/voltage pulse signal that the instantaneous closure of the utility model extraction DC circuit/disconnection produces carries out velocity survey, the signal to noise ratio (S/N ratio) height, and anti-electromagnetic interference capability is strong, and it is big as far as possible that useful detection area can be done, the detection efficiency height;
4. the utility model is implemented easily, and technology is simple, the reliability height, and cost is low.
5. the utility model is fit to the ground experimental applications, because its structure and output signal type are simple, the reliability height especially is fit to use with the space device.
Description of drawings
Fig. 1 is that the utility model carries out the principle schematic that high rate particle speed is measured;
Fig. 2 is the circuit diagram of a circuit loop of the measurement mechanism among the utility model embodiment;
Fig. 3 is the structural representation to battery lead plate that the centre among the utility model one embodiment accompanies dielectric film;
Fig. 4 be the centre among the utility model one embodiment accompany dielectric film to battery lead plate and support synoptic diagram thereof;
Fig. 5 is the circuit diagram of the utility model one embodiment;
The drawing explanation:
1---centre accompanies---first power supply 3 '---second source to battery lead plate 3 of dielectric film
5---the first middle position S that accompanies dielectric film to the battery lead plate place 1The point
6---the second middle position S that accompanies dielectric film to the battery lead plate place 2The point
7---metal film 8---dielectric film 9---supports
10---accompany in the middle of first dielectric film to battery lead plate
10 '---accompany in the middle of second dielectric film to battery lead plate
11---screw 12---first base 12 '---second bases
13---screw 14---first divider resistance 14 '---second divider resistances
15---first resistance 15 '---second resistance 16---oscillographs
17---the route of particle movement.
Embodiment
Below in conjunction with the drawings and specific embodiments the utility model is described in further detail:
The utility model is to utilize the instantaneous conducting of plasma to the battery lead plate generation that accompanies dielectric film in the middle of (speed is more than the km/s magnitude) particulate at a high speed (diameter tens to the hundreds of micron dimension) bump to be in the circuit of off state originally, plasma was collected in very short time, circuit becomes off state again afterwards, forms momentary current/potential pulse in this process; By voltage or current impulse, obtain the time signal at two diverse location places of the arrival fixed distance of particulate, obtained the time, and the distance between two positions can be measured, utilize time-of-flight method to obtain the speed measurement techniques of the high speed particle of particle speed.
As shown in Figure 1, high speed particle constantly clashes into and passes film from S1 point at t1, can produce plasma at the S1 place during high speed particle bump film, in the utility model, the film that is adopted is the film of sandwich structure as shown in Figure 2, adopt circuit shown in Figure 4 that film is coupled together, on two metal levels, add suitable voltage, just can between two metal levels, form suitable electric field, in the time of plasma generation, the circuit that was in short-circuit condition originally is with regard to conducting, and plasma was collected in very short time, circuit becomes off state again afterwards, forms momentary current/potential pulse in this process; In Fig. 5, just have a voltage pulse signal on the oscillograph and occur, this voltage pulse signal has just reflected the time signal t1 that high speed particle arrives film surface and passes from the S1 point.After particulate passed from S1, its speed loss was very little, continued motion, arrived second film (just the same on second film and first membrane structure, circuit connection diagram too), and passed this sheet film.The time signal of second film of particulate arrival also can be measured like this.Distance between two films is that a fixed value also is easy to determine, the speed of particulate just can be obtained like this.
As shown in Figure 5, the velocity measuring device of half intercept type high speed particle is made up of first circuit loop and second circuit loop, comprises that also first power supply 3, first centre accompany dielectric film battery lead plate 10, first resistance 15 are connected and formed first circuit loop; What accompany dielectric film in the middle of the second source 3 ', second forms the second circuit loop to battery lead plate 10 ', the 15 ' series connection of second resistance; It is in parallel with first resistance 15 having the voltage check device 16, a tunnel of measuring the two-way input, and another road is in parallel with second resistance 15 '; 10 ' the alignment to battery lead plate to accompanying dielectric film in the middle of battery lead plate 10 and second that accompanies dielectric film in the middle of described first is arranged on the particle movement path.Comprise that also first divider resistance 14 and second divider resistance 14 ' are connected on respectively in described first circuit loop and the second circuit loop.Described voltage check device 16 is oscillographs.Described accompany in the middle of first dielectric film to accompanying the identical of dielectric film in the middle of battery lead plate and second to electrode plate structure, all by two-layer be that metal film and the dielectric film that is clipped in the middle of the metal film are formed.
First support and second support, described two supports comprise that respectively circular clip and base are fixed together, described accompany in the middle of first dielectric film to accompanying dielectric film battery lead plate is clamped in respectively on the circular clip of described first support and second support in the middle of battery lead plate and described second.
Centre in the present embodiment accompany dielectric film to battery lead plate, its primary structure is a sandwich structure as shown in Figure 3, both sides are metal films 7, in the middle of two metal films 7 is one deck dielectric film 8, so just constituted a centre accompany dielectric film to battery lead plate, wherein the material of the metal film 7 on both sides is the aluminium film, and thickness is several microns to tens microns, and the diameter of metal film 7 is 5cm; The material of dielectric film 8 is an organic membrane, and thickness is several microns to tens microns um, and dielectric film 8 fully evenly is full of between two metal films 7.When on metal film 7 alive the time, between two metal films 7, just formed an electric field, when striking on the metal film 7, high speed particle will produce plasma, originally the circuit that was in off state will conducting, plasma was collected in very short time, and circuit becomes off state again afterwards.
Centre shown in Figure 4 accompanies dielectric film the battery lead plate support is comprised: circular clip 9, base 12, with what accompany dielectric film in the middle of the parallel-plate shown in Figure 3 battery lead plate is just formed the target in the measurement mechanism after fixing by circular clip 9, be equivalent to the target spot 6 among Fig. 1.From two metal films 7 extraction electrode, the film 10 of sandwich structure with regard to constituted the time obtain centre in the circuit system accompany dielectric film to battery lead plate.Wherein, littler in order to make in the speed loss of the measuring process high speed particulate of speed, the centre accompany dielectric film to battery lead plate can do thinner.
As shown in Figure 2, the voltage of direct supply be tens volts to several hectovolts, when not having the film of particle collision sandwich structure, there is not signal on the oscillograph, when high speed particle clashes into the film of sandwich structure, plasma generation will be arranged, plasma is the circuit turn-on that was in off state originally, and plasma has been collected in a short period of time, circuit becomes short-circuit condition again afterwards, in this process, on oscillograph, will have one voltage pulse signal, just can obtain the time signal that particulate arrives the film of sandwich structure by this potential pulse.
Wherein, power source voltage is selected must be suitable, should satisfy when the film of particulate by sandwich structure circuit can conducting, the film that guarantees sandwich structure again can be not breakdown, wherein the selection of first resistance and second resistance must be suitable, thereby do not want the excessive components from being damaged that causes with the electric current in the assurance circuit, and these are provided with and can adjust according to concrete application conditions, those skilled in the art are adequate, and wherein first resistance is a divider resistance.
By theoretical analysis and experimental study, find the ON time very short (in microsecond) of the plasma that when high speed particle clashes into the film of the sandwich structure that this example adopts, produces, so, when the present invention is applied to the high rate particle speed measurement, the measuring accuracy height of particulate time of arrival, thus the measuring accuracy height of speed made.
The plasma that the present invention produces when utilizing high speed particle rammer surface, come conducting to be in the circuit of off state originally, and plasma was collected in very short time, circuit disconnects again afterwards, in circuit loop, will form a current/voltage pulse signal that pulsewidth is very little like this, obtain the time signal that particulate arrives body surface by this pulse signal, obtained time signal, and the particulate distance of during this period of time moving, utilize time-of-flight method just to be easy to derive the speed of particulate.It is 10um-1000um that present embodiment is measured the mean particle dia scope, and the particle speed scope is 5km/s-20km/s.
In fact, in Fig. 1, if moment t 1With position S 1Point is regarded the moment t that particulate sends as 1With initial position S 1Point, the moment t that common particulate sends 1With initial position S 1Therefore point is known, needs accurately to determine the position behind particle movement one segment distance and just can measure the speed of particulate constantly.In this case, just can take wherein some circuit loops among the embodiment 1 just can determine accurately that particulate arrives this position constantly from position and the particulate that is issued to behind motion one segment distance, and then record its speed, such some circuit costs of obvious saving.
And, those skilled in the art also will be appreciated that, if do not adopt voltage check device, also can adopt conducting that the method for series current pick-up unit in circuit loop comes testing circuit whether, and then judge the moment that accompanies dielectric film in the middle of the particle collision battery lead plate.
It should be noted last that above embodiment is only unrestricted in order to the explanation the technical solution of the utility model.Although the utility model is had been described in detail with reference to embodiment, those of ordinary skill in the art is to be understood that, the technical solution of the utility model is made amendment or is equal to replacement, the spirit and scope that do not break away from technical solutions of the utility model, it all should be encompassed in the middle of the claim scope of the present utility model.

Claims (5)

1. the velocity measuring device of one and half intercept type high speed particles comprises first circuit loop and second circuit loop; It is characterized in that what accompany dielectric film in the middle of first power supply, first forms first circuit loop to battery lead plate, the series connection of first resistance; What accompany dielectric film in the middle of the second source, second forms the second circuit loop to battery lead plate, the series connection of second resistance; One has the voltage check device of measuring the input of two-way at least, and one the tunnel is in parallel with first resistance, and another road is in parallel with second resistance; The alignment to battery lead plate to accompanying dielectric film in the middle of battery lead plate and second that accompanies dielectric film in the middle of described first is arranged on the particle movement path.
2. according to the velocity measuring device of the described half intercept type high speed particle of claim 1, it is characterized in that, comprise that also first divider resistance and second divider resistance are connected on respectively in described first circuit loop and the second circuit loop.
3. according to the velocity measuring device of the described half intercept type high speed particle of claim 1, it is characterized in that described voltage check device is an oscillograph.
4. according to the velocity measuring device of the described half intercept type high speed particle of claim 1, it is characterized in that, described accompany in the middle of first dielectric film to accompanying the identical of dielectric film in the middle of battery lead plate and second to electrode plate structure, all by two-layer be that metal film and the dielectric film that is clipped in the middle of the metal film are formed.
5. according to the velocity measuring device of the described half intercept type high speed particle of claim 1, it is characterized in that, also comprise first support and second support, described two supports comprise that respectively circular clip and base are fixed together, described accompany in the middle of first dielectric film to accompanying dielectric film battery lead plate is clamped in respectively on the circular clip of described first support and second support in the middle of battery lead plate and described second.
CNU2006201340853U 2006-10-17 2006-10-17 Semi-catching type high-speed particle velocity measuring apparatus Expired - Fee Related CN201016990Y (en)

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Application Number Priority Date Filing Date Title
CNU2006201340853U CN201016990Y (en) 2006-10-17 2006-10-17 Semi-catching type high-speed particle velocity measuring apparatus

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101568223B (en) * 2008-04-23 2011-05-18 中国科学院空间科学与应用研究中心 High speed particle velocity selector
CN102128950A (en) * 2010-12-20 2011-07-20 中北大学 Parallel network target speed test device
CN105203797A (en) * 2015-11-12 2015-12-30 哈尔滨工业大学 Micro-nano particle swarm speed-measuring system
CN112904043A (en) * 2021-03-24 2021-06-04 中北大学 Impedance transformation target fragment speed measurement system and test method thereof

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101568223B (en) * 2008-04-23 2011-05-18 中国科学院空间科学与应用研究中心 High speed particle velocity selector
CN102128950A (en) * 2010-12-20 2011-07-20 中北大学 Parallel network target speed test device
CN105203797A (en) * 2015-11-12 2015-12-30 哈尔滨工业大学 Micro-nano particle swarm speed-measuring system
CN105203797B (en) * 2015-11-12 2018-11-02 哈尔滨工业大学 A kind of micro-and nano-particles group velocity-measuring system
CN112904043A (en) * 2021-03-24 2021-06-04 中北大学 Impedance transformation target fragment speed measurement system and test method thereof

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Granted publication date: 20080206

Termination date: 20121017