CN200986593Y - Detection rack for alpha,beta surface contamination instrument - Google Patents

Detection rack for alpha,beta surface contamination instrument Download PDF

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Publication number
CN200986593Y
CN200986593Y CN 200620035543 CN200620035543U CN200986593Y CN 200986593 Y CN200986593 Y CN 200986593Y CN 200620035543 CN200620035543 CN 200620035543 CN 200620035543 U CN200620035543 U CN 200620035543U CN 200986593 Y CN200986593 Y CN 200986593Y
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CN
China
Prior art keywords
probe
props
frame
panel
supporter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
CN 200620035543
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Chinese (zh)
Inventor
郑慧
成晶
文德智
卓仁鸿
胡俊
陈志赟
薛秀章
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Institute of Nuclear Physics and Chemistry China Academy of Engineering Physics
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Institute of Nuclear Physics and Chemistry China Academy of Engineering Physics
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Application filed by Institute of Nuclear Physics and Chemistry China Academy of Engineering Physics filed Critical Institute of Nuclear Physics and Chemistry China Academy of Engineering Physics
Priority to CN 200620035543 priority Critical patent/CN200986593Y/en
Application granted granted Critical
Publication of CN200986593Y publication Critical patent/CN200986593Y/en
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Expired - Lifetime legal-status Critical Current

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Abstract

The utility model provides a detecting frame applied to detect Alpha and Beta surface contamination apparatus including a frame, a probe, a support frame, a standard source support panel, a displacement probe support panel provided with a support slot and a scissor lifting platform. The surrounding frame column of the frame is connected with a fixing end angle and the frame column is also provide with a graduated scale. A probe support device is connected with the fixing end angle and the standard source support panel is fixed arranged on the scissor lifting platform. The displacement probe support pane is arranged on the frame. The detecting frame applied to detect Alpha and Beta surface contamination apparatus of the utility model can effectively avoid the standard resource from damage when operating. The utility model has the advantages of simple structure, and rapid operation which can be flexibly used according to the differences of detecting and calibrating places so as to improve the working efficiency of detecting and calibrating.

Description

A kind of calibrating frame that is used for α, β surface contamination instrument
Technical field
The utility model belongs to ionising radiation metering calibrating field, is specifically related to the calibrating frame of a kind of α of being used for, β surface contamination instrument.
Background technology
In the actinometry or radiation protection process of China, need to use a large amount of α, β surface contamination analyzer at present, the regulation of pressing measurement verification regulations JJG478-96 need be carried out compulsory verification to these α, β surface pollution measuring instrument and monitor in accordance with the law.Because shape, the size of α, β surface contamination instrument probe there are differences, when making calibrating, calibration, there are certain uncertainty in the height of source and detector, centre distance, cause examining and determine, the uncertainty of calibration result increases, have influence on actual measurement result the most at last, and in operation, also cause easily examining and determine with radioactivity plane source surface and be subjected to a certain degree damage.
Summary of the invention
In order to overcome calibrating or calibration α in the prior art; the uncertainty that causes during β surface contamination instrument increases; calibrating is subjected to a certain degree damage with the source; the unshielded deficiency of tested instrument probe; the utility model provides a kind of α of being used for; the calibrating frame of β surface contamination instrument; this calibrating frame is in calibrating or imitate accurate α; can reduce during β surface contamination instrument because of adjusting the error that distance is brought; improve the accuracy of verification result; avoid operation because of distance between the adjustment criteria source surface lies probe protection aperture plate; calibrating is caused damage with the source; the oblique back skating that also can prevent to pop one's head in falls, and has effectively protected by test examination instrument.
A kind of calibrating frame that is used for α, β surface contamination instrument of the present utility model contains that framework, probe supporter, standard source prop up panel, the displaced type probe props up panel and the lifting table of cultrating; Described framework is square two frame bodies that base is arranged, the probe supporter is made up of supporter support, supporter pole and swinging arms, its annexation is, be connected with the stiff end angle on the upright frame post around the framework, the supporter pole of probe supporter is connected with the stiff end angle, and supporter pole is connected with the supporter support by swinging arms; Also be set with rule on the upright frame post of the right-hand member of framework; The lifting table of cultrating is fixedly installed on the base center of framework, and the upper end of the lifting table of cultrating is provided with the lifting handwheel, also disposes the locking handwheel on the lifting handwheel.Standard source props up the upper surface that panel is fixedly installed on the lifting table of cultrating; The displaced type probe props up panel and is arranged on the upper frame of framework, be equipped with the displacement breach on four angles, the displaced type probe props up panel and flexibly connects by the stiff end angle on displacement breach and the framework, and the center that the displaced type probe props up panel is provided with the groove of placing by the calibrating probe that props up.
The groove that props up that the displaced type probe props up the center setting of panel is that square probe props up groove, also can be set to circular probe and prop up groove or other groove that props up corresponding to calibrating probe shape.
Described displaced type probe props up displacement breach and cun coupling of the stiff end angle square on the framework that is provided with on the panel.
Framework of the present utility model and stiff end welded corner joint form, and are mainly used in support, fix each parts, can be placed on ground or the desktop with the difference in calibrating, calibration place.Lifting table is set is fixed on the frame base center, lifting table adopts the lifting of cultrating to support, and the lappingout leading screw drives, and five on two guide rails are crossed detent mechanism, and are furnished with the locking handwheel.Lifting table is fixed on the frame base, can determine concrete distance by rule according to the requirement adjustment height of distance between difference probe protection aperture plate and the standard source surface, is fixed with the locking handwheel simultaneously.The source props up panel and is fixed on the lifting table, is used to deposit and asks calibrating to use the source.Displaced type probe props up panel and is arranged on the framework and is fixed by the stiff end angle, is used to prop up the probe by test examination instrument.Face plate center is provided with and props up groove, can be according to being designed by the difformity size of calibrating probe.The probe supporter is connected with the right front angle of calibrating frame stiff end, and during for the calibrating probe, the probe handle is by being placed on the probe supporter pole, and the oblique back skating that prevents to pop one's head in falls.Rule is fixed on the right back pillar of calibrating frame, specifically requires the distance of adjusting between read out protection aperture plate and the standard source surface.
In calibrating; when imitating accurate work; elder generation is according to the shape of the tested probe of instrument; selected good used displaced type probe props up panel; place the displaced type probe to prop up on the panel tested probe; measure calibrating then and set off the thickness of material with plane source; twist the lifting handwheel counterclockwise; lifting table is dropped to enough low; to examine and determine with the source and insert on the lifting table panel; continue clockwise shearing lifting handwheel; determine to adjust the height of lifting table according to rule, be elevated to the distance of standard source surface lies probe protection aperture plate requirement after, twisting locking handwheel will be apart from locking; adjust the direction of probe supporter then; the probe handle can be relied on, tested instrument probe is placed on the replaceable probe of calibrating frame props up on the panel slotted eye, handle relies on the oblique back skating that prevents to pop one's head on the probe supporter and falls.
A kind of calibrating frame that is used for α, β surface contamination instrument of the present utility model; in calibrating, the accurate instrument process of effect; avoid protecting the operation of distance between the aperture plate to give and examine and determine the damage that causes with the plane source surface because of adjustment criteria source surface lies probe; can reduce because of adjusting the error that distance is brought, improve the accuracy of verification result.The probe supporter is set, makes probe have the protection of support to prevent that oblique back skating from falling, and effectively protected by test examination instrument.Simple in structure, swift to operate, can be placed on the enterprising line operate of ground or desktop with the difference in calibrating, calibration place, improved the work efficiency of calibrating, calibration.
Description of drawings
The utility model is described in further detail below in conjunction with accompanying drawing
Fig. 1 is a kind of structure front elevation that is used for the calibrating frame embodiment of α, β surface contamination instrument of the present utility model
Fig. 2 is a kind of structure vertical view that is used for the calibrating frame embodiment of α, β surface contamination instrument of the present utility model
Fig. 3 is that the displaced type probe of the calibrating frame embodiment of a kind of α of being used for of the present utility model, β surface contamination instrument props up the panel construction synoptic diagram
Fig. 4 is a kind of probe supporter structural representation that is used for the calibrating frame embodiment of α, β surface contamination instrument of the present utility model.
Among the figure, 1. probe supporter 2. displaced types probe props up panel 3. standard sources and props up the panel 4. lifting handwheels 5. locking handwheels 6. rules 7. probe supporter supports 8. stiff end angles 9. lifting table 10. frameworks 11. square probes of cultrating and prop up groove 12. displacement breach 14. supporter pole swinging arms 15. supporter poles 16. supporter support swinging arms 17. stiff end angles
Embodiment
Embodiment 1
In Fig. 1~Fig. 4, the utility model is a kind of calibrating frame that is used to examine and determine α, β surface contamination instrument, contains that framework, probe supporter 1, standard source prop up panel 3, the displaced type probe props up panel 2 and the lifting table 9 of cultrating; The present embodiment middle frame is the framework 10 that square two frame stainless steels that base arranged are made, probe supporter 1 is made up of supporter support 7, supporter pole 15 and swinging arms (14,16), be welded with stiff end angle 8 on the upright frame post of framework 10, be provided with four stiff end angles all around altogether, the supporter pole 15 of probe supporter 1 is connected with the stiff end angle 17 at right front angle, and supporter pole 15 is connected with supporter support 7 by swinging arms (14,16); Also be set with rule 6 on the upright frame post of the right-hand member of framework 10; The lifting table 9 of cultrating is fixedly installed on the base center of framework 10, and the upper end of the lifting table 9 of cultrating is provided with lifting handwheel 4, also disposes locking handwheel 5 on the lifting handwheel 4.Standard source props up the upper surface that panel 3 is fixedly installed on the lifting table 9 of cultrating; The displaced type probe props up panel 2 and is arranged on the upper frame of framework 10, be equipped with displacement breach 12 on four angles, displaced type probe props up panel 2 and flexibly connects by displacement breach 12 and stiff end angle 8 on the framework 10, and the center that the displaced type probe props up panel 2 is provided with the groove of placing by the calibrating probe that props up.
The groove that props up that the displaced type probe props up the center setting of panel is that square probe props up groove 11.
The displaced type probe props up the displacement breach 12 of setting on the panel 2 and the size match at the stiff end angle on the framework 10.
A kind of α that is used for of the present utility model; the calibrating frame operation steps of β surface contamination instrument is: in calibrating; when imitating accurate work; elder generation is according to the shape of instrument probe; selected good used displaced type probe props up panel 2; measure calibrating and set off the thickness of material with plane source; twist lifting handwheel 4 counterclockwise; lifting table 9 is dropped to enough low; to examine and determine and insert the lifting table source with the source and prop up on the panel 3; continue clockwise shearing lifting handwheel 4 then; determine to adjust the height of lifting table 9 according to rule 6; after being elevated to the distance of standard source surface lies probe protection aperture plate requirement; twisting locking handwheel 5 will be apart from locking; adjust the height of probe supporter 1 then; direction; the probe handle can be relied on; tested instrument probe is placed on the replaceable probe of calibrating frame props up on panel 2 slotted eyes, handle relies on the oblique back skating that prevents to pop one's head on the probe supporter 1 and falls, and begins operation then.
Embodiment 2
The basic structure of embodiment 2 of the present utility model is identical with embodiment 1, and difference is that center that displaced type probe props up panel is provided with circular probe and props up groove, and framework is square two frame metal support bodys that base is arranged.
A kind of framework that is used for the calibrating frame of α, β surface contamination instrument of the present utility model also can be made of wooden, plastic or other material.

Claims (4)

1. calibrating frame that is used for α, β surface contamination instrument is characterized in that: contain that framework (10), probe supporter (1), standard source prop up panel (3), the displaced type probe props up panel (2) and the lifting table of cultrating (9); Described framework (10) is square two frame bodies that base is arranged, probe supporter (1) is made up of supporter support (7), supporter pole (15) and swinging arms (14,16), and supporter pole (15) and supporter support (7) junction are provided with swinging arms (14,16); Its annexation is, be connected with stiff end angle (8) on the upright frame post of framework (10), the supporter pole (15) of probe supporter (1) is connected with the stiff end angle (17) at right front angle, and supporter pole (15) is connected with supporter support (7) by swinging arms (14,16); Also be set with rule (6) on the upright frame post of the right-hand member of framework (10); The lifting table (9) of cultrating is fixedly installed on the base center of framework (10), and the upper end of the lifting table of cultrating (9) is provided with lifting handwheel (4), and standard source props up the upper surface that panel (3) is fixedly installed on the lifting table of cultrating (9); The displaced type probe props up panel (2) and is arranged on the upper frame of framework (10), be equipped with displacement breach (12) on four angles, displaced type probe props up panel (2) and flexibly connects by displacement breach (12) and stiff end angle (8) on the framework (10), and the center that the displaced type probe props up panel (2) is provided with the groove of placing by the calibrating probe that props up.
2. a kind of calibrating frame that is used for α, β surface contamination instrument according to claim 1 is characterized in that: the groove that props up that the center that described displaced type probe props up panel is provided with is that square probe props up groove (11).
3. a kind of calibrating frame that is used for α, β surface contamination instrument according to claim 1 is characterized in that: the groove that props up that the center that described displaced type probe props up panel is provided with is that circular probe props up groove.
4. a kind of calibrating frame that is used for α, β surface contamination instrument according to claim 1 is characterized in that: described displaced type probe props up panel (2) and goes up displacement breach and cun coupling of the stiff end angle square on the framework (10) that is provided with.
CN 200620035543 2006-09-08 2006-09-08 Detection rack for alpha,beta surface contamination instrument Expired - Lifetime CN200986593Y (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 200620035543 CN200986593Y (en) 2006-09-08 2006-09-08 Detection rack for alpha,beta surface contamination instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 200620035543 CN200986593Y (en) 2006-09-08 2006-09-08 Detection rack for alpha,beta surface contamination instrument

Publications (1)

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Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102147476A (en) * 2010-12-23 2011-08-10 中国原子能科学研究院 Positioning and measuring support for high-purity germanium detector
CN105021763A (en) * 2014-04-22 2015-11-04 天津天锐哥马克阻燃测试技术有限公司 Inflaming retarding tester combustor adjusting device
CN105883694A (en) * 2016-06-03 2016-08-24 中国工程物理研究院核物理与化学研究所 Lifting system for radioactive building surface contamination measurement
CN107390254A (en) * 2016-05-16 2017-11-24 中国辐射防护研究院 A kind of high-precision positioner and method of distance adjustable calibrating installation
CN109061709A (en) * 2018-06-14 2018-12-21 海南核电有限公司 A kind of α, beta probe examine and determine radioactive stand
CN110941008A (en) * 2019-12-17 2020-03-31 中国原子能科学研究院 Portable detection device for α and β surface pollution meters
CN110988972A (en) * 2019-10-12 2020-04-10 中国辐射防护研究院 High-precision three-dimensional portable surface pollution instrument calibrating device

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102147476A (en) * 2010-12-23 2011-08-10 中国原子能科学研究院 Positioning and measuring support for high-purity germanium detector
CN102147476B (en) * 2010-12-23 2012-10-17 中国原子能科学研究院 Positioning and measuring support for high-purity germanium detector
CN105021763A (en) * 2014-04-22 2015-11-04 天津天锐哥马克阻燃测试技术有限公司 Inflaming retarding tester combustor adjusting device
CN107390254A (en) * 2016-05-16 2017-11-24 中国辐射防护研究院 A kind of high-precision positioner and method of distance adjustable calibrating installation
CN107390254B (en) * 2016-05-16 2021-12-17 中国辐射防护研究院 High-precision positioning device and method of distance-adjustable calibration device
CN105883694A (en) * 2016-06-03 2016-08-24 中国工程物理研究院核物理与化学研究所 Lifting system for radioactive building surface contamination measurement
CN109061709A (en) * 2018-06-14 2018-12-21 海南核电有限公司 A kind of α, beta probe examine and determine radioactive stand
CN109061709B (en) * 2018-06-14 2022-10-11 海南核电有限公司 Radioactive source bracket for detecting alpha and beta probes
CN110988972A (en) * 2019-10-12 2020-04-10 中国辐射防护研究院 High-precision three-dimensional portable surface pollution instrument calibrating device
CN110988972B (en) * 2019-10-12 2022-10-21 中国辐射防护研究院 High-precision three-dimensional portable surface pollution instrument calibrating device
CN110941008A (en) * 2019-12-17 2020-03-31 中国原子能科学研究院 Portable detection device for α and β surface pollution meters

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C14 Grant of patent or utility model
GR01 Patent grant
CX01 Expiry of patent term

Granted publication date: 20071205

EXPY Termination of patent right or utility model