CN1945281A - Measuring device and its measuring method for circular dichroism - Google Patents

Abstract

The present invention is measuring device and method for circular dichroism. The measuring device includes light source, sample box, analyzer and photodetector, and features mechanical elliptic modulator set between the light source and the sample box. The present invention is superior in that the elliptic polarized light the mechanical elliptic modulator generates can counteract the elliptic light caused by the absorption of measured sample in too high reference concentration to circular polarized light, so that the present invention can also measure the circular dichroism of high reference concentration sample. The present invention has fast measurement in high repeatability.

Description

A kind of measurement mechanism of circular dichroism and measuring method thereof

Technical field

The present invention relates to a kind of measurement mechanism, especially relate to a kind of measurement mechanism and measuring method thereof of circular dichroism.

Background technology

In recent years, hand is levied medium and is subjected to people's attention with its its specific structure and optical characteristics always; At present, aspect the Medium Optics characteristic test, being used to measure hand levies the method for medium and mainly contains rotatory dispersion and circular dichroism spectrum etc., because circular dichroism spectrum has to comprise and contains much information, be not subject to advantages such as background interference and result be more direct, circular dichroism spectrum has progressively replaced rotatory dispersion, becomes the powerful measure of measuring Chiral Media; At present, employed typical circular dichroism spectrometer in the actual measurement, the circular dichroism spectrometer J-810 that produces as Japanese Jasco company, it can be measured by the beam split polarization device, its optical system also can be used for the measurement of some other optical property (as optically-active and absorption) of test material through the dichroic plotter after reequiping; The characteristics of this instrument are that function ratio is more complete, cost an arm and a leg, and sensitivity and accuracy be all than higher, are good at measuring that to mix specific concentration be not very high circular dichroism.But,, will overflow because of signal data occur too by force if the sample reference concentration is too high.This often needs to reduce in advance the reference concentration of sample, and this has brought inconvenience to measurement, and those because of reference concentration high and sample not easily dilutable also can therefore can't measure.

Summary of the invention

Technical matters to be solved by this invention is measurement mechanism and the measuring method thereof that a kind of circular dichroism simple in structure is provided at above-mentioned prior art present situation, and it is little influenced by the reference concentration of sample, measures convenient and swift, good reproducibility.

The present invention solves the problems of the technologies described above the technical scheme that is adopted: a kind of measurement mechanism of circular dichroism, comprise light source, sample box, analyzer and photoelectricity testing part, and between described light source and described sample box, be provided with the oval modulator of mechanical type.

The oval modulator of described mechanical type can be by forming around the polarizer and Fresnel rib body that optical axis rotates.

The described polarizer and described analyzer can be Glan-thomson prisms.

Described light source is a semiconductor laser, and it requires emergent light to have stronger light intensity.

Use above-mentioned measurement mechanism to measure the measuring method of circular dichroism, it comprises the steps:

A, sample is put into described sample box;

B, open described light source, make its light beam, arrive described photoelectricity testing part successively by the oval modulator of described mechanical type, sample box and analyzer;

C, the oval modulator of the described mechanical type of adjusting are adjusted the ovality of the elliptically polarized light of ejaculation, regulate described analyzer then it is rotated a circle around optical axis, detect by photoelectricity testing part;

D, do not detect delustring, then repeat above-mentioned steps c again, as detect delustring, then carry out next step as photoelectricity testing part;

E, on photoelectricity testing part as delustring occurs, write down and calculate the ovality of the oval modulator of described mechanical type, calculate the circular dichroism that obtains sample then.

The oval modulator of described mechanical type specifically can be by forming around the polarizer and Fresnel rib body that optical axis rotates, and it comprises the steps:

A, sample is put into described sample box;

B, open described light source, make its light beam, arrive described photoelectricity testing part successively by the described polarizer, Fresnel rib body, sample box, analyzer;

C, the described polarizer of adjusting make it rotate the direction of shaking thoroughly of adjusting the described polarizer around optical axis, regulate described analyzer then it is rotated a circle around optical axis, detect by photoelectricity testing part;

D, do not detect delustring, then repeat above-mentioned steps c again, as detect delustring, then carry out next step as photoelectricity testing part;

E, on photoelectricity testing part as delustring occurs, write down the angle β of shake the thoroughly direction and the horizontal x axle of the described polarizer, utilize following computing formula to obtain the circular dichroism α of sample then:

(i) when β≤45, I _Max=(Acos β cos γ) ², I _Min=(Asin β cos γ) ²

Then ellipticity is: $\mathrm{tg\α}=\sqrt{\frac{I_{\min }}{I_{\max }}}=\sqrt{\frac{{\left(\sin \mathrm{\βA}\cos \mathrm{\γ}\right)}^2}{{\left(A\cos \mathrm{\β}\cos \mathrm{\γ}\right)}^2}}=\mathrm{tg\β}$

(ii) when β＞45, I _Max=(Asin β sin γ) ², I _Min=(Acos β sin γ) ²

Then ellipticity is: $\mathrm{tg\α}=\sqrt{\frac{I_{\min }}{I_{\max }}}=\sqrt{\frac{{\left(A\cos \mathrm{\β}A\sin \mathrm{\γ}\right)}^2}{{\left(A\sin \mathrm{\β}\sin \mathrm{\γ}\right)}^2}}=\mathrm{ctg\β}$

β is incident ray polarized light and x axle clamp angle in the formula, and γ is elliptically polarized light major axis and x axle clamp angle, I _MaxBe major axis light intensity, I _MinBe the minor axis light intensity.

Compared with prior art, the invention has the advantages that and between light source and sample box, be provided with the oval modulator of mechanical type, the oval modulator of mechanical type, the elliptically polarized light that it can produce, this light can be offset because of the too high elliptical light that the difference absorption of left and right sides circularly polarized light is caused of sample reference concentration, delustring just appears in elliptical light when being offset fully, make those because reference concentration is too high without the sample of dilution with because of the reference concentration height sample of easily dilutable not, also can very accurately measure its real data, thereby solved in the current measuring methods, need problem because of the sample reference concentration is too high, also can measure those because of the reference concentration high problem of the circular dichroism of the sample of easily dilutable not through dilution; It is little influenced by the reference concentration of sample, measures convenient and swift, good reproducibility.

Description of drawings

Fig. 1 is the measurement mechanism of circular dichroism.

Embodiment

Embodiment is further described the present invention below in conjunction with accompanying drawing.

Embodiment one: a kind of measurement mechanism of circular dichroism as shown in Figure 1, form by semiconductor laser 1, the polarizer 2, Fresnel rib body 3, sample box 4, analyzer 5 and photoelectricity testing part 6, they form a light-path in order, be used for the circular dichroism spectrum of Measuring Object, wherein the polarizer 2 and Fresnel rib body 3 consist of the oval modulator of mechanical type, the direction of shaking thoroughly that the polarizer 2 is adjusted light beam by energy of rotation is regulated from the ovality of the elliptically polarized light of Fresnel rib body 3 ejaculations, all is provided with Glan-thomson prism in the polarizer 2 and analyzer 5.

Embodiment two: use measurement mechanism is as shown in Figure 1 measured the measuring method of circular dichroism, it may further comprise the steps, at first handle is levied medium and is put into sample box 4, open semiconductor laser 1 then, light beam just passes through from the polarizer 2, Fresnel rib body 3, sample box 4, analyzer 5 successively, arrive photoelectricity testing part 6, rotation analyzer 5 makes it around one week of optical axis, detects by photoelectricity testing part 6; If photoelectricity testing part 6 does not detect delustring, that reference concentration that tested article are described is higher, will regulate the polarizer 2 makes it rotate the direction of shaking thoroughly of adjusting the polarizer 2 around optical axis, change from the ovality of the elliptically polarized light of Fresnel rib body 3 ejaculations, the different absorption of circle about making that the elliptically polarized light of its generation can offset just that absorption of sample causes and the elliptical light that occurs, rotate 5 one weeks of analyzer again, detect at photoelectricity testing part 6, as also not detecting delustring, then continue the adjusting of above-mentioned steps, up to detecting delustring at photoelectricity testing part 6; The angle β of shake the thoroughly direction and the horizontal x axle of the record polarizer 2, utilize following computing formula to obtain the circular dichroism α of sample then:

(i) when β≤45, I _Max=(Acos β cos γ) ², I _Min=(Asin β cos γ) ²

Then ellipticity is: $\mathrm{tg\α}=\sqrt{\frac{I_{\min }}{I_{\max }}}=\sqrt{\frac{{\left(\sin \mathrm{\βA}\cos \mathrm{\γ}\right)}^2}{{\left(A\cos \mathrm{\β}\cos \mathrm{\γ}\right)}^2}}=\mathrm{tg\β}$

(ii) when β＞45, I _Max=(Asin β sin γ) ², I _Min=(Acos β sin γ) ²

Then ellipticity is: $\mathrm{tg\α}=\sqrt{\frac{I_{\min }}{I_{\max }}}=\sqrt{\frac{{\left(A\cos \mathrm{\β}\sin \mathrm{\γ}\right)}^2}{{\left(A\sin \mathrm{\β}\sin \mathrm{\γ}\right)}^2}}=\mathrm{ctg\β}$

β is incident ray polarized light and x axle clamp angle in the formula, and γ is elliptically polarized light major axis and x axle clamp angle, I _MaxBe major axis light intensity, I _MinBe the minor axis light intensity.

Introduce a concrete experiment below: we are dissolved in heavy complex acid potassium, and the circular dichroism solution after the heating is measuring object in the organic solvent potassium tartrate, original solution to variable concentrations is measured, during measurement, the dichroism filled with solution is arrived sample hose, the direction of shaking thoroughly of adjusting the polarizer 2 is a horizontal direction, put sample hose 4 and analyzer 5 earlier, adjust analyzer 5, be recorded in by photoelectricity testing part whether signal is zero in this week,, put into Fresnel rib body 3 then up to delustring occurring, and make its incident light follow emergent light on same surface level, rotate the polarizer 2 at last,, write down the angle beta that the polarizer turns over this moment up to occurring delustring once more.According to the method, we have measured the circular dichroism value of several concentration, and measurement result sees Table 1.

Circular dichroism value under the variable concentrations of table 1 experiment measuring

Claims (6)

1, a kind of measurement mechanism of circular dichroism comprises light source, sample box, analyzer and photoelectricity testing part, it is characterized in that being provided with between described light source and described sample box the oval modulator of mechanical type.

2, the measurement mechanism of a kind of circular dichroism as claimed in claim 1 is characterized in that the oval modulator of described mechanical type is by forming around the polarizer and Fresnel rib body that optical axis rotates.

3, the measurement mechanism of a kind of circular dichroism as claimed in claim 2 is characterized in that the described polarizer and described analyzer all are provided with Glan-thomson prism.

4, the measurement mechanism of a kind of circular dichroism as claimed in claim 1 is characterized in that described light source is the bigger semiconductor laser of power.

5, use the measuring method of the measurement mechanism measurement circular dichroism of claim 1, it is characterized in that it comprises the steps:

A, sample is put into described sample box;

B, open described light source, make its light beam, arrive described photoelectricity testing part successively by the oval modulator of described mechanical type, sample box and analyzer;

C, the oval modulator of the described mechanical type of adjusting are adjusted the ovality of the elliptically polarized light of ejaculation, regulate described analyzer then it is rotated a circle around optical axis, detect by photoelectricity testing part;

D, do not detect delustring, then repeat above-mentioned steps c again, as detect delustring, then carry out next step as photoelectricity testing part;

E, on photoelectricity testing part as delustring occurs, write down and calculate the ovality of the oval modulator of described mechanical type, calculate the circular dichroism that obtains sample then.

6, the measuring method of circular dichroism as claimed in claim 5 is characterized in that the oval modulator of described mechanical type by forming around the polarizer and Fresnel rib body that optical axis rotates, and it comprises the steps:

A, sample is put into described sample box;

B, open described light source, make its light beam, arrive described photoelectricity testing part successively by the described polarizer, Fresnel rib body, sample box, analyzer;

C, the described polarizer of adjusting make it rotate the direction of shaking thoroughly of adjusting the described polarizer around optical axis, regulate described analyzer then it is rotated a circle around optical axis, detect by photoelectricity testing part;

D, do not detect delustring, then repeat above-mentioned steps c again, as detect delustring, then carry out next step as photoelectricity testing part;

E, on photoelectricity testing part as delustring occurs, write down the angle β of shake the thoroughly direction and the horizontal x axle of the described polarizer, utilize following computing formula to obtain the circular dichroism α of sample then:

(i) when β≤45, I _Max=(Acos β cos γ) ², I _Min=(Asin β cos γ) ²Then ellipticity is: $\mathrm{tg\α}=\sqrt{\frac{I_{\min }}{I_{\max }}}=\sqrt{\frac{{\left(\sin \mathrm{\β}A\cos \mathrm{\γ}\right)}^2}{{\left(A\cos \mathrm{\β}\cos \mathrm{\γ}\right)}^2}}=\mathrm{tg\β}$

(ii) when β＞45, I _Max=(Asin β sin γ) ², I _Min=(Acos β sin γ) ²Then ellipticity is: $\mathrm{tg\α}=\sqrt{\frac{I_{\min }}{I_{\max }}}=\sqrt{\frac{{\left(A\cos \mathrm{\β}\sin \mathrm{\γ}\right)}^2}{{\left(A\sin \mathrm{\β}\sin \mathrm{\γ}\right)}^2}}=\mathrm{ctg\β}$

β is incident ray polarized light and x axle clamp angle in the formula, and γ is elliptically polarized light major axis and x axle clamp angle, I _MaxBe major axis light intensity, I _MinBe the minor axis light intensity.