CN1900700B - Quantitative method for adjustable fault grading - Google Patents
Quantitative method for adjustable fault grading Download PDFInfo
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- CN1900700B CN1900700B CN200510085092A CN200510085092A CN1900700B CN 1900700 B CN1900700 B CN 1900700B CN 200510085092 A CN200510085092 A CN 200510085092A CN 200510085092 A CN200510085092 A CN 200510085092A CN 1900700 B CN1900700 B CN 1900700B
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Abstract
The disclosed method is in use for solving difficulties occurred in detection of graduated shade, as well as ignorance of possibility and strongpoint of raising efficiency of existed detection by human eyes. Based on basis of human factor of vision model, the quantitative method of adjustable type grade assignment of defect reaches purpose of quantizing graduated shade under assistance of adjustable type device.
Description
Technical field
The present invention is a kind of quantivative approach of fault grading, refers to a kind of quantivative approach of adjustable test panel fault grading especially.
Background technology
Made vacuum metrics at display and play the part of important role with detection, manufacturers at different levels now desire is utilized automatic checkout system to replace or is strengthened the detection method of tradition with vision.More existing manufacturers develop or are developing a kind of standard (method of testing and assessment level), are primarily aimed at the brightness inequality defective in the automatic checkout system, are referred to as " Mura defective " detection method of flat-panel monitor.The Mura defects detection is at display assembly, a subsystem and a various important issue about display technology.Display system components is such as miniscope, diffusion barrier, and Polarizer, backlight module, glass substrate and brightness enhancement film also must be determined those cause the Mura alienation in final display system defective by detecting.
Flat-panel monitor measurement standard according to video signal frequency electronic standard association (VESA) is defined as the Mura defective " when display screen shows with a constant gray-scale value, can see the imperfect of display picture element zone.The Mura defective is the domain mode appearance with low contrast, brightness disproportionation, and is generally big than single pixel." same, be according to brightness disproportionation in semiconductor equipment and materials association (SEMI) the Mura defective that defines.
In existing patent documentation, disclose a kind of automated substrate pick-up unit and method as U.S. Patent number the 5754678th " substrate detection apparatus and method (Substrate inspection apparatus and method) ", please refer to and Figure 1 shows that the method for testing substrate process flow diagram, comprise and catch a substrate orientation (S100) that is taken at an image detecting device, restriction is because the intensity change (S102) that background is adjusted, first pixel (S104) in first pixel in first pixel of forming by four pixels and second pixel forming by four pixels relatively, second pixel (S106) in second pixel in first pixel of being made up of four pixels and second pixel being made up of four pixels relatively, decision detects the sub-pixel (S108) on the substrate.
Again, disclose method and the device that a kind of robotization detects defective as U.S. Patent number the 5917935th " moire (Mura) pick-up unit and method (Muradetection apparatus and method) ", this method is that wherein this substrate comprises liquid crystal flat panel display, active matrix displays and other similar display at detection moire pattern and pick-up unit on substrate.Please refer to and Figure 2 shows that substrate moire detection method process flow diagram, be to comprise the raw video (S200) of obtaining a substrate, from raw video, produce a plurality of subsample images (S202), carry out the defective particular filter (S204) of each image, set up each point (BLOB) (S206) with the thresholding of each image, by every bit analysis decision moire (mura) defective (S208), the defective of characterization moire (S210), the selectivity aftertreatment removes to determine line cloud pattern defects (S212).
Yet the difficulty that each manufacturer is met with on moire detects: (1) is difficult to qualitative; (2) be difficult to quantitatively; What (3) the moire figure occurred is repeated low; (4) moire detection and angle, background graphics have sizable relation; (5) different customer requirement differences, even same client's different time requires the problem differ.
Summary of the invention
For addressing the above problem and prior art is ignored and promoted existing possibility and advantage with human eye detection efficient, the present invention proposes a kind of quantivative approach of adjustable fault grading with the people gene basis of framework at human vision model, and is aided with an adjustable device to reach the purpose that quantizes moire.
The valve limit of human eye detecting object changes background luminance when to some extent because of object size, object and background luminance.Vision commonly used distinguishes that just poor (Just Noticeable Difference) defines the sensing valve limit on the vision research field.
In order to reach above-mentioned quantification moire purpose, the invention provides a kind of quantivative approach of adjustable fault grading, comprise the previous operations that obtains at least one test panel; Detect at least one defect level of at least one test panel; Described defect level is adjusted switching motion to produce at least one identification (Opticaldensity) numerical value via one; Changing described identification numerical value is that at least one vision is just distinguished poor (Just NoticeableDifference); And compile described vision and distinguish that just difference is to make the quantitative value of at least one adjustable fault grading.
Description of drawings
Fig. 1 is the method for testing substrate process flow diagram of prior art;
Fig. 2 is the substrate moire detection method process flow diagram of prior art;
Fig. 3 is the quantivative approach process flow diagram of adjustable fault grading of the present invention; And
Fig. 4 is the quantitative value method flow diagram of adjustable fault grading of the present invention.
Embodiment
Reach technology, method and the effect that set purpose is taked in order to further specify the present invention, see also following about detailed description of the present invention and accompanying drawing, believe purpose of the present invention, feature and characteristics, go deep into and concrete understanding when getting one thus, yet appended graphic reference and the explanation usefulness of only providing not is to be used for the present invention is limited.
The present invention is with the people gene basis of framework at human vision model, and is aided with an adjustable device to reach the purpose that quantizes moire.
Please refer to Fig. 3, quantivative approach process flow diagram for adjustable fault grading of the present invention, comprise the previous operations (S300) that obtains at least one test panel, wherein said test panel is the test panel of liquid crystal panel, cathode-ray tube TV panel, plasma panel or other type.Detect at least one defect level (S302) of at least one test panel, described defect level is adjusted switching motion to produce at least one identification numerical value (S304) via one, wherein this adjustment switching motion is to be reached by an adjustable device, this adjustment switching motion comprises adjusts time of break-through or transmitted intensity, for example the LCD glasses have the characteristic that can change penetrance, so can be used as an embodiment of this adjustable device, this adjustable device also can be mechanical type again, space formula or time formula, seeing through this adjustable device can reduce full luminance (wavelength of human eye visible waveband), wherein said identification numerical value is light decay rate, the mathematical expression of its light decay rate is D=log1/T, D is light decay rate (Optical Density), and T is a light transmittance.
Changing described identification numerical value is that at least one vision is just distinguished poor (S306), when its described vision is just distinguished difference for the smudgy state of identification, can see a certain things and can not see the ratio that converses with things according to the beholder, define one and switch family of power and influence's value (thresholds), compile described vision and just distinguish the quantitative value (S308) of difference to make at least one adjustable fault grading.
Light decay rate and vision are just distinguished the formula that the model of difference conversion can be expressed as follows:
δ(JND)＝k*D
n
K in the above-mentioned formula, n are the modulation parameter, and D is a light decay rate, and the essential meaning of its formula is just distinguished poor (JND) change amount for utilizing the modulation light decay rate can obtain vision, to reach the target of quantify defects.
Please refer to the quantitative value method flow diagram of Fig. 4 for adjustable fault grading of the present invention, comprise the previous operations (S400) that obtains at least one test panel, wherein said test panel is the test panel of liquid crystal panel, cathode-ray tube TV panel, plasma panel or other type.Detect at least one defect level (S402) of at least one test panel, described defect level is adjusted switching motion to produce at least one identification numerical value (S404) via one, wherein this adjustment switching motion is to be reached by an adjustable device, this adjustment switching motion comprises adjusts time of break-through or transmitted intensity, for example the LCD glasses have the characteristic that can change penetrance, so can be used as an embodiment of this adjustable device, this adjustable device also can be mechanical type again, space formula or time formula, seeing through this adjustable device can reduce full luminance (wavelength of human eye visible waveband), and wherein said identification numerical value is light decay rate.Reduce a transmitted intensity (S406) of this adjustment switching motion, obtain the quantitative value (S408) of at least one adjustable fault grading by this transmitted intensity.
The present invention can solve the shortcoming of prior art, and makes comparisons the present invention and prior art as follows:
1. can utilize the present invention that identification numerical value and vision are distinguished that just difference quantizes to link;
2. can utilize the present invention that inter-stages such as identification numerical value and panel relations is carried out objective quantification, and can be not in time, client and transferring;
3. the present invention considers into different brightness backgrounds;
4. judging moire (mura) when having or not obvious border, the present invention can judge the moire of two types simultaneously;
5. for moire size and unrestricted;
6. the present invention is fast than prior art in the time of differentiating moire.
The present invention is the above-mentioned disclosed technology of energy mat really, provides a kind of far different in existing design, may be able to improve whole use value.
Above-mentioned disclosed graphic, explanation only be embodiments of the invention, allly is skillful in this skill person when can doing other all improvement according to above-mentioned explanation, and these change and still belong in the claim that invention spirit of the present invention defines below reaching.
Claims (6)
1. the quantivative approach of an adjustable fault grading comprises:
Detect at least one defect level of at least one test panel;
Described defect level is adjusted switching motion to produce at least one identification numerical value via one of an adjustable device, and wherein this adjustment switching motion comprises adjustment time of break-through or transmitted intensity, and this identification numerical value is light decay rate;
Changing described identification numerical value is that at least one vision just distinguishes poor; And
Compile described vision and distinguish that just difference is to make the quantitative value of at least one adjustable fault grading.
2. the quantivative approach of adjustable fault grading according to claim 1 before wherein this detects the step of at least one test panel, further comprises the previous operations that obtains at least one test panel.
3. the quantivative approach of adjustable fault grading according to claim 1, wherein said test panel is liquid crystal panel, cathode-ray tube TV panel or plasma panel.
4. the quantitative value method of an adjustable fault grading comprises:
Detect at least one defect level of at least one test panel;
Described defect level is adjusted switching motion to produce at least one identification numerical value via one of an adjustable device, and wherein this identification numerical value is light decay rate, and this adjustment switching motion comprises adjusts time of break-through or transmitted intensity;
Reduce a transmitted intensity of this adjustment switching motion; And
Obtain the quantitative value of at least one adjustable fault grading by this transmitted intensity.
5. the quantitative value method of adjustable fault grading according to claim 4 before wherein this detects the step of at least one test panel, further comprises the previous operations that obtains at least one test panel.
6. the quantitative value method of adjustable fault grading according to claim 4, wherein said test panel is liquid crystal panel, cathode-ray tube TV panel or plasma panel.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200510085092A CN1900700B (en) | 2005-07-20 | 2005-07-20 | Quantitative method for adjustable fault grading |
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| Application Number | Priority Date | Filing Date | Title |
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| CN200510085092A CN1900700B (en) | 2005-07-20 | 2005-07-20 | Quantitative method for adjustable fault grading |
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| CN1900700A CN1900700A (en) | 2007-01-24 |
| CN1900700B true CN1900700B (en) | 2010-05-26 |
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| CN200510085092A Expired - Fee Related CN1900700B (en) | 2005-07-20 | 2005-07-20 | Quantitative method for adjustable fault grading |
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Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101840078B (en) * | 2009-03-20 | 2016-02-10 | 北京京东方光电科技有限公司 | Water ripple grade testing method |
| CN103698912B (en) * | 2013-12-12 | 2017-02-15 | 合肥京东方光电科技有限公司 | Method for positioning defect sub pixel position |
| CN107328791B (en) * | 2017-07-31 | 2020-06-30 | 京东方科技集团股份有限公司 | Defect detection method and device |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1259216A (en) * | 1997-04-04 | 2000-07-05 | 萨尔诺夫公司 | Method and apparatus for assessing the visibility of differences between two signal sequences |
| US6154561A (en) * | 1997-04-07 | 2000-11-28 | Photon Dynamics, Inc. | Method and apparatus for detecting Mura defects |
| CN1460967A (en) * | 2002-05-18 | 2003-12-10 | Lg.菲利浦Lcd株式会社 | Image quality analysis method and system for display device |
-
2005
- 2005-07-20 CN CN200510085092A patent/CN1900700B/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1259216A (en) * | 1997-04-04 | 2000-07-05 | 萨尔诺夫公司 | Method and apparatus for assessing the visibility of differences between two signal sequences |
| US6154561A (en) * | 1997-04-07 | 2000-11-28 | Photon Dynamics, Inc. | Method and apparatus for detecting Mura defects |
| CN1460967A (en) * | 2002-05-18 | 2003-12-10 | Lg.菲利浦Lcd株式会社 | Image quality analysis method and system for display device |
Non-Patent Citations (3)
| Title |
|---|
| Jae Y. LEE.Automatic Detection of Region-Mura Defect in TFT-LCD.IEICE TRANS. INF.& * |
| Jae Y. LEE.Automatic Detection of Region-Mura Defect in TFT-LCD.IEICE TRANS. INF.&SYST.E87-D 10.2004,E87-D(10),1-8. |
| SYST.E87-D 10.2004,E87-D(10),1-8. * |
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| CN1900700A (en) | 2007-01-24 |
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