CN1856121A - Imaging device analysis systems and imaging device analysis methods - Google Patents

Abstract

The invention discloses an image device analyzing system 100 and imaging device analyzing method, which comprises the following parts: optical source 154 and disposing circuit to transmit control optical source 154 to image device 114 through optical pattern, wherein the optical source 154 is allocated into at least one imaging component in the analyzing device 114, which responds image from light 116; the disposing circuit accesses at least one imaging component of image data and image disposing data through image device 114.

Description

Imaging device analysis systems and imaging device analysis methods

Technical field

[01] aspect of the present disclosure relates to imaging device analysis systems and imaging device analysis methods.

Related patent data

[0002] the application from submitted on April 5th, 2004, be entitled as " Imaging Device CalibrationMethods; Imaging Device Calibration Instruments; Imaging Devices; And Articles OfManufacture (imaging device calibration steps, imaging device calibration instrument, imaging device and product) " and go out the part continuation application of inventor side by side for the U.S. Patent application No.10/818622 of Jeffrey M.DiCarlo, and require the latter's priority, by reference its full content is incorporated into this paper.

Background technology

[0003] imaging system of widely-used various designs produces image now.Exemplary imaging system comprises: the digital camera of photocopier, scanner, camera, appearance recently and other can produce the device of image.Color imaging system also obtains significant improvement and obtains popularizing rapidly.The adjustable color imaging system improves various imaging algorithms, and () accuracy for example, illumination estimation, colour correction etc. also improves the color accuracy of final duplicate simultaneously.

[0004] for example, even the imaging system of identical configuration also may differ from one another because of product tolerance or design difference.With reference to figure 1, wherein show the relative response degree of 200 digital cameras of like products and the relation curve of wavelength.Fig. 1 illustrates the difference by the indigo plant as the camera of sample of separately wavestrip 4,6 and 8 expressions, green, red transducer.Though camera has structurally comprised components identical, the width of diagram wavestrip shows the size of the difference between each camera.

[0005] monochromatic collimation technique uses reflection chart (reflective chart).The reflection chart can be used for calibrating apace camera, and they are more cheap relatively.But using the reflection chart to calibrate camera may be accurate inadequately.On the other hand, monochromator can carry out point-device calibration to the color imaging system that comprises camera.Yet, needing to finish the calibration procedure that carries out with monochromator than the long time relatively, device is also comparatively expensive, and also needs to use accurate and controlled light source usually.

[0006] other conventional apparatus that are used for analyzing imaging device all have similar shortcoming.For example, the device that is used to test imaging device (for example, Camlogix SH-T2) uses incandescent lamp and is placed on the transducer of the elapsed time calibration on the film plane of film camera, and this mode is unpractiaca for the test of digital camera.And, use incandescent lamp, then need to control the time length of illumination and light emitted color and brightness.Used white card to come the calibration scan instrument, but this method does not allow the color of coloured image is calibrated.Other devices (for example, the K series TV light scriber of being sold by Davidson electronics corporation (optoliner)) that are used for testing lens and color use the test pattern that projects on the sensor plane.The shortcoming of these systems is want extreme care during installation, and they to be that design is used for analyzing television camera.In addition, common traditional analysis system uses the different piece of equipment to carry out different tests or analysis.

[0007] at least some aspects of the present disclosure relate to improved imaging device analytical equipment, system and method.

Summary of the invention

[0008] according to aspects of the present invention, exemplary imaging device analysis systems and imaging device analysis methods have been described.

[0009] according to an embodiment, imaging device analysis systems comprises light source and treatment circuit, wherein, light source is configured as at least one image-forming block of analyzing imaging device and exports light, and imaging device is configured to respond the light generation image of reception, and treatment circuit and light source coupling and be configured to control light source and with optical mode light be sent to imaging device, and treatment circuit further is configured to visit the view data of imaging device generation and handle this view data to analyze the operation conditions of at least one image-forming block, and wherein this view data imaging device response produces from the reception of the light of light source.

[0010] according to another embodiment, imaging device analysis methods comprises that output is sent to the infrared light of imaging device, visits that the response of this imaging device is sent to the light on it and the view data that produces, handle the runnability that this view data is filtered with the infrared light of determining imaging device, and respond the runnability that above-mentioned processing indicates the infrared light filtration, wherein imaging device is configured to filtering infrared light.

[0011] obviously, other embodiment has been described in the following discussion.

Description of drawings

[0012] Fig. 1 illustrates the responsiveness of the sample of imaging system.

[0013] Fig. 2 illustrates the example calibration instrument and the imaging device of illustrative embodiment.

[0014] Fig. 3 is the functional block diagram of circuit of the calibration instrument of an embodiment.

[0015] Fig. 4 is the functional block diagram of circuit of the imaging device of an embodiment.

[0016] Fig. 5 is the illustrative diagram of optical interface of the calibration instrument of an embodiment.

[0017] Fig. 6 is the brightness of the light that sends of the optical interface from an embodiment and the graph of a relation of wavelength.

[0018] Fig. 7 is a flow chart, the exemplary imaging device calibration steps of an embodiment of its expression.

[0019] Fig. 8 a is a flow chart, the example data collection method of an embodiment of its expression.

[0020] Fig. 8 b is a flow chart, and it represents the example data collection method of another embodiment.

[0021] Fig. 9 is a flow chart, the example data processing method of an embodiment of its expression.

[0022] Figure 10 illustrates the comparison that various example calibration technology are carried out.

[0023] Figure 11 illustrates the comparison of using Macbeth chart collimation technique that the relative response degree of estimating and measure is carried out.

[0024] Figure 12 illustrates the comparison of using MacbethDC chart collimation technique that the relative response degree of estimating and measure is carried out.

[0025] Figure 13 illustrates the comparison that the transmitting calibration instrument that uses an embodiment carries out the relative response degree of estimating and measure.

[0026] Figure 14 illustrates the imaging system of an embodiment.

[0027] Figure 15 illustrates the light source of an embodiment.

[0028] Figure 16 A-16B illustrates the light that the imageing sensor by the imaging device of an embodiment receives.

[0029] Figure 17 is the flow chart of illustrative methods, and this method is used to analyze the infrared light filter operation of the imaging device of an embodiment.

[0030] Figure 18 is the illustrative diagram according to the light source of an embodiment.

[0031] Figure 19 illustrates the illiteracy cover (mask) of an embodiment.

[0032] Figure 20 is a kind of flow chart of illustrative methods, and this method is used to analyze the optical characteristics of the imaging device of an embodiment.

[0033] Figure 21 A-21B illustrates the light by the imageing sensor reception of an embodiment

[0034] Figure 22 A-22B illustrates the light by the imageing sensor reception of an embodiment.

[0035] Figure 23 illustrates the light source of an embodiment.

[0036] Figure 24 illustrates the illiteracy cover of an embodiment.

[0037] Figure 25 A-25B illustrates the light by the imageing sensor reception of an embodiment.

[0038] Figure 26 is a kind of flow chart of illustrative methods, and this method is used to analyze the optics of the imaging device of an embodiment.

[0039] Figure 27 A-27B illustrates the light by the imageing sensor reception of an embodiment, and they represent distortion of pincushion shape and barrel-shaped distortion respectively.

[0040] Figure 28 is a kind of flow chart of illustrative methods, and this method is used to analyze the optics of the imaging device of an embodiment.

[0041] Figure 29 illustrates the light source of an embodiment.

[0042] Figure 30 says the light that illustrates by the imageing sensor reception of an embodiment.

[0043] Figure 31 is a kind of flow chart of illustrative methods, and this method is used to analyze the film speed of the imaging device of an embodiment.

[0044] Figure 32 is a kind of flow chart of illustrative methods, and this method is that the imaging device of an embodiment is determined correction coefficient.

Embodiment

[0045] at least some aspects of the present disclosure provide the apparatus and method of can be fast and calibrating imaging device exactly.In one embodiment, can measure such as optical characteristics such as the responsiveness function (function) of imaging device and/or conversion (transduction) functions and determine that the imaging device of being correlated with is the input of response light signal how.Can calibrate separately imaging device with determined optical characteristics.According to the execution mode of example, use the light emitting source relative to determine optical characteristics, and these characteristics allow imaging device is carried out real-time the calibration relatively low with cost (for example, on assembly line) with reflection unit.

[0046], wherein shows the imaging system 10 of an embodiment with reference to figure 2.Shown imaging system 10 comprises exemplary imaging device calibration instrument 12 and imaging device 14.In at least one embodiment, instrument 12 can be called luminous calibration instrument, wherein one or more light sources of instrument 12 send the light that is used to realize determining calibration data and calibrating installation 14.

[0047] at least one embodiment, calibration instrument 12 is used to provide calibration data, and these data can be used for calibrating imaging device 14.Among at least some embodiment of Miao Shuing, calibration instrument 12 can be worked so that calibration data to be provided with imaging device 14 herein.Calibration data comprises optical characteristics such as the responsiveness of each imaging device 14 in the exemplary embodiment and/or transfer function.Calibration data can be used to calibrate each device 14 that is used to obtain this calibration data.For example, the image processing algorithm that can be adjusted to as device 14 improves its imaging performance, and these performances comprise that imaging device produces the ability of the image satisfactory and/or true to nature of the scene of obtaining.

[0048] shown in the system, imaging device 14 comprises color digital camera.This device also can have response receive image and other configurations (for example, scanner, color copy machine, multifunctional colour peripheral hardware, or the like) of producing view data.

[0049] reference calibrations instrument 12 again, shown exemplary embodiment comprises light source 20, light randomizer 22 and light diffuser 24.Discuss for convenient, example components 20,22,24 is shown with exploded view.In the exemplary embodiment of calibration instrument 12, element 20,22,24 is relative to each other sealed, to stop surround lighting is incorporated in the instrument 12.As following exemplary circuit with regard to Fig. 3 is discussed, can also provide the treatment circuit of calibration instrument 12 to control calibration operation.

[0050] in the different embodiment of calibration instrument 12, light source 20 can show as different configurations.And may command light source 20 simultaneously and/or in turn launch different light in different embodiment.Different light comprises different emission characteristicss, as different wavelength, intensity or spectral power distribution.

[0051] for example, configuration shown in the light source 20 comprises a plurality of regional 26, disposes each such zone and compares the light with different wave length and/or intensity with emission with other zones 26.Therefore, among the embodiment of the calibration instrument 12 in Fig. 2, the light in some zone 26 can spatially with on the spectrum be distinguished with the light in other zones 26 simultaneously at least.In certain embodiments, can send light simultaneously with different wave length and/or intensity.(wherein some are as described below) in other embodiments can launch the light with different wave length and/or intensity successively.

[0052] each zone in zone 26 can comprise one or more light-emitting device (not shown).Exemplary light-emitting device comprises narrow-band device, and (patch) compares with the broadband reflection sheet, and this device can provide higher accuracy.In illustrative examples, the light-emitting device in zone 26 comprises light-emitting diode (LED) and laser.Can use the light-emitting device zone 26 of other configurations.In one embodiment, each zone 26 comprises 3 * 3 light-emitting device square array, is configured to launch the light of identical wavelength and intensity.

[0053] shown in illustrative examples in, light randomizer 22 comprises each regional 26 corresponding hollow pipe of a plurality of and light source 20.In described configuration, light randomizer 22 is used for for each zone 26 basic light uniformly being offered light diffuser 24.The inner surface of these pipes of light randomizer can have brighter white rough surface relatively.Light randomizer 22 can also have other configuration.For example, at least one other embodiment of instrument 12, light randomizer 22 can comprise single hollow pipe, and this embodiment has single light-emitting zone as described below.

[0054] light diffuser 24 comprises optical interface 27, and this optical interface is configured to be provided to each zone in zone 26 (and each zones 28 of the following optical interface that will discuss 27) to be reached as basic light uniformly device 14, that be used for calibration operation.Can with shown in other configurations of the optical interface 27 that separates of light diffuser 24 light is exported to imaging device 14.Exemplary light diffuser 24 comprises translucent acrylic resin assembly.With shown in exemplary light overflow reflector 24 and be configured to export the corresponding light of light that sends with light source 20.For example, optical interface 27 shown in exemplary comprises each regional 26 corresponding zone 28 of a plurality of and light source 20.In other embodiments, can provide with light source 20 the corresponding more or less zone 28 of the number of areas that provides 26.In at least one embodiment, light randomizer 22 and diffuser 24 provide with zone 28 in the corresponding different light in each zone, and, for each zone in regional 28, in the whole area (area) in each zone 28, its light all is uniform substantially.In other possible execution modes, can between light source 20 and light randomizer 22 or in light randomizer 22, implement another light diffuser.

[0055] in one embodiment, light randomizer 22 comprises a plurality of aluminium matter rectangular tubes corresponding to the zone 26 of light source 20.Single such pipe can have 2.5 inches length and have 1 inch * 1 inch square size between light source 20 and interface 27.The inner surface of these pipes can scribble such as can buy from Gigahertz-Optik, Part No. is the whitewash of the OP.DI.MA material of ODMO1-FO1.Diffuser 24 can comprise a plurality of parts 1 inch * 1 inch, that form from the white translucent acrylic materials of Cyro Industries Part No. that bought, that have 020-4 that are of a size of, these parts have comprised each zone in zone 28, and each such part has 1/8 inch thickness.Also can have other configurations or embodiment.

[0056], wherein shows the exemplary circuit 30 of calibration instrument 12 with reference to figure 3.Shown in circuit 30 comprise communication interface 32, treatment circuit 34, memory circuit 36, light source 20 and optical sensor 38.In other embodiment, can provide more, still less or other circuit block.

[0057] communication interface 32 is configured to set up communicating by letter between calibration instrument 12 and the external device (ED).The exemplary configuration of communication interface 32 comprises USB port, serial or parallel interface, IR interface, wave point or other any configurations that can carry out unidirectional or two-way communication.Use communication interface 32 can transmit any suitable data.For example, as described below, can transmit one or more emission characteristicss of light sources 20 and/or one or more definite optical characteristics of each imaging device 14 that will calibrate with communication interface 32.

[0058] in one embodiment, treatment circuit 34 can comprise the circuit that is configured to implement desirable program.For example, treatment circuit 34 can be implemented as processor or other structures, and above-mentioned processor or structural arrangements become to be used for carrying out the executable instruction that comprises software and/or firmware instructions.Other exemplary embodiments of treatment circuit comprise hardware logic electric circuit, PGA, FPGA, ASIC, state machine and/or other structures.These examples with treatment circuit 34 describe, and other configurations also are possible.

[0059] can control the operation of calibration instrument 12 with treatment circuit 34.In one embodiment, treatment circuit 34 be used for the luminous timing of control instrument automatically 12 (for example, control regularly, with from instrument 12 simultaneously and/or the light of emission in turn with different wave length and/or intensity).In one embodiment, treatment circuit 34 can be controlled the emission of timing and light automatically and need not user intervention.

[0060] memory circuit 36 is configured to storage of electronic and/or such as executable instruction (for example, software and/or firmware) program, calibration data or other digital information, and can comprise the processor usable medium.Except above-described calibration data, extra example calibration data can comprise one or more emission characteristicss of the light that the optical interface 27 that uses calibration instrument 12 is launched.As discussed below, according to an embodiment, exemplary emission characteristics is included in the spectral power distribution (SPD) of the light of optical interface 27 places emission.Spectral power distribution has comprised the emission characteristics of relative photo intensity of the light of institute wavelength of light emitted and each wavelength.

[0061] the processor usable medium comprise anyly can comprise, the product of storage or save routine, data and/or digital information, and these programs, data and/or digital information can be used or be used with this executive system by instruction execution system, and above-mentioned instruction execution system comprises the treatment circuit in the exemplary embodiment.For example, exemplary processor usable medium can comprise any such as in the physical medium of electricity, magnetic, light, electromagnetism, ultrared or semiconductor medium.Some of processor usable medium example more specifically include but not limited to portable computer disk, for example floppy disk, compact disk, hard disk, random access memory, read-only memory, flash memory, buffer memory, and/or other can stored programs, the configuration of data or other digital informations.

[0062] light source 20 can be configured to aforesaid exemplary means.For example, in one embodiment, light source 20 can be configured to launch the light of different wave length and/or intensity.Different wavelength and/or intensity can define by aforesaid a plurality of regional 26.In another embodiment, light source 20 is configured to send wavelength and/or intensity is constant light substantially, simultaneously with on the downstream that is positioned at light source 20 and the regional 26 corresponding a plurality of spaces mutually the filter of separation provide and have the different expectation wavelength and/or the light of intensity arbitrarily.In another embodiment of the following stated, light source 20 can be configured to use single zone to launch different light successively.The configuration that also can have other.

[0063] optical sensor 38 can adopt the mode of optics and light source 20 to be coupled and be configured to receive the light that light source 20 sends.In one embodiment, though other configuration also can be arranged, but still realize optical sensor 38 with photodiode.In certain embodiments, (for example one or more optical sensors 38 can be placed in the light randomizer 24, in Shuo Ming the exemplary configuration, an optical sensor 38 can be placed in the light randomizer 22 that is configured to single hollow pipe herein).Have in a plurality of devices of regional 26 at other, optical sensor 38 can carry out optocoupler with zone 26 by suitable photoconductive tube (not shown) or other configurations and merge with the light with different wave length and/or intensity of emission corresponding.

[0064] in a kind of configuration, optical sensor 38 is configured as the calibration of calibration instrument 12 and monitors the light that it is launched.For example, in light source 20, light wavelength that at least some configurations are sent and/or intensity can be drifted about in time.Optical sensor 38 can be used to monitor these light, and the prompting user, and instrument 12 has lost calibration and need safeguard it.For example, if the light intensity of different wave length relative to each other changes, can think that then calibration instrument 12 loses calibration.The exemplary recalibration of calibration instrument 12 can comprise the emission characteristics (for example, spectral power distribution) of determining the light that optical interface 27 sends once more.

[0065], the imaging device 14 as digital camera has been shown in exemplary configuration with reference to figure 4.As previously mentioned, in other configurations, imaging device 14 can be implemented as from scene or the light that received and produce image.Shown in the configuration in imaging device comprise treatment circuit 40, memory circuit 42, photoflash lamp 44, imageing sensor 46, filter 48, optics 50 and communication interface 52.

[0066] in one embodiment, treatment circuit 40 can be implemented as and be similar to above-mentioned treatment circuit 34, and this treatment circuit comprises the circuit that is configured to carry out desirable program.Other exemplary embodiments of treatment circuit comprise different and/or other hardware, with the operation of control imaging device 14 (for example, the processing of control photoflash lamp 44, optics 50, data acquisition and storage, view data, communicate by letter with external device (ED) and the operation of any other hope).These examples of treatment circuit 40 are used for explanation, and other configuration also is fine.

[0067] at least one embodiment, memory circuit 42 (for example is configured to storage of electronic, view data) and/or such as executable instruction (for example, software and/or firmware) program or other digital information, and can comprise the processor usable medium that is similar to above-mentioned memory circuit 36.

[0068] photoflash lamp 44 comprises the light source that is configured to be used to provide the light that uses in the imaging operation.In described embodiment, the operation of treatment circuit 40 control photoflash lamps 44.Can stop using, use separately photoflash lamp 44, also it can be used with other external light source (not shown).

[0069] imageing sensor 46 is configured to provide the raw image data of a plurality of original images.This raw image data comprises the corresponding numerical data of a plurality of pixels of the original image that forms with imageing sensor 46.For example, original image comprises the corresponding byte of red, green and blue color with each pixel during the RGB of example uses.Other embodiment can utilize or provide other color informations.Imageing sensor 46 can comprise a plurality of photo-sensitive cell, for example photodiodes corresponding with pixel, and these photo-sensitive cells is configured to be provided for producing the initial numberical data of image.For example, in a possible configuration, imageing sensor 46 can comprise the grating of being arranged by the photo-sensitive cell (also can be referred to as pixel element) of 1600 row and 1280 row.Other grating configurations also are possible.In exemplary configuration, each photo-sensitive cell can comprise charge coupled device (CCD) or CMOS device.In a specific embodiment, imageing sensor 46 can utilize the X3 technology in the Foveon Co., Ltd sensor device on sale.

[0070] filter 48 is arranged on the upstream of imageing sensor 46, carries out the filtration of any hope with the light that before reading at imageing sensor 46 imaging device 14 is received.For example, in one embodiment, filter 48 can be removed the infrared light that imaging device 14 receives.

[0071] optics 50 comprises suitable camera lens and aperture, and above-mentioned camera lens and aperture are configured to use imageing sensor 46 to focus on and guide the light that is received for creating image.In one embodiment, come optics 50 is carried out the operation of wishing by the suitable motor (not shown) of treatment circuit 40 may command.

[0072] communication interface 52 is configured to set up the communication between imaging device 14 and the external device (ED) (for example, calibration instrument 12).The exemplary configuration of communication interface 52 comprises USB port, serial or parallel interface, IR interface, wave point or other any devices that can carry out unidirectional or two-way communication.Communication interface 52 can be configured to exchange any suitable data with communication interface 32 couplings of calibration instrument 12 or other external device (ED)s and with above-mentioned interface.For example, communication interface 52 can be used to receive one or more emission characteristicss of light source 20 and/or one or more definite optical characteristics of each imaging device 14.And, as described below, the interface 52 exportable sensing datas that produce by imageing sensor 46, and these data can be used to carry out the image processing operations that comprises the optical characteristics of determining imaging device 14.

[0073], wherein shown the exemplary configuration of optical interface 27 with reference to figure 5.Shown optical interface 27 corresponding to the embodiment of the calibration instrument shown in Fig. 2 12 and comprise have different wave length and/or intensity do not share the same light a plurality of regional 28.

[0074] shown in configuration in, optical interface 27 comprises a plurality of row 60 of colored region and the single row 62 of white portion.In other embodiment of optical interface 27, also can provide zone more, light still less with other wavelength and/or intensity.

[0075] row 60 of colored region provides a plurality of regional 28 of light with different wave length.For example, in an illustrated embodiment, row 60 comprises from ultraviolet light (375nm) wavelength and is increased to the several regions 28 of infrared light (725nm) successively with the increment of 25nm that this just provides the light of separating mutually on the spectrum and space.Shown in example in, row 62 comprises a plurality ofly having the regional W1-W5 that identical relative spectral power distributes, and its intensity increases gradually.The relative intensity of white sheet is respectively 0.01,0.03,0.10,0.30 and 1 for each zone of W1-W5.

[0076], between each zone 28, can change the quantity of light-emitting device and/or be used for the drive current of light-emitting device, so that the spectral power distribution of light emitted hope to be provided according to the exemplary embodiment of Fig. 5.Other configuration also can be provided in other embodiments.

[0077] in one embodiment, the row from the top is begun to each row of the row of bottom, the zone 28 that can be Fig. 5 from left to right is successively with 1 to 15 numbering.Exemplary light-emitting device can comprise that LED and this light-emitting device that RoitherLasertechnik company is on sale have following dash number in each zone 28: (1) 380D30, (5) HUBG-5102L, (13) ELD-670-534, (14) ELD-700-534 and (15) ELD-720-534.Remaining exemplary light-emitting device can comprise that LED and this light-emitting device that U.S. Opto company is on sale have following dash number in each zone 28: (2) L513SUV, (3) L513SBC-430NM, (4) L513NBC, (6) L513NBGC, (7) L513NPGC, (8) L513UGC, (9) L513NYC-E, (10) L513UOC, (11) L513NEC, (12) L513TURC and (W1-W5) L513NWC.

[0078] in this example, be used for the drive current of light-emitting device of All Ranges 28 of row 60 invariable (for example, 18-20mA) and can be according to the number of the light-emitting device in each zone 28 of following change: (1) 4, (2) 1, (3) 14, (4) 2, (5) 4, (6) 3, (7) 1, (8) 27, (9) 3, (10) 2, (11) 1, (12) 2, (13) 2, (14) 2 and (15) 1.The number of the light-emitting device in each zone 28 of row 62 can be identical (for example, four) and can be zone 28 W1-W5 and use following exemplary driver electric current: 0.2,0.6,2,6 and 20mA.Above example only is used for explanation, and other configuration or change also are possible.

[0079] will further specify as following, the use of the optical interface 27 in the zone that comprises different wave length and/or intensity 28 shown in Figure 5 can be determined the responsiveness and the transfer function of imaging device 14 simultaneously, for example, under the light that the optical interface 27 of imaging device 14 sends, carry out single exposure by installing 14.As described here, optical interface 27 other the configuration also be possible (for example, a kind of optical interface is provided, therein, light only changes on wavelength or intensity between zone 26, provides a kind of optical interface, therein, only have a light emitter region that is used for sending continuously the light of identical wavelength and/or intensity, or the like).

[0080] light of the different wave length that is provided by calibration instrument 12 can be used for determining the responsiveness function of imaging device 14.In the embodiment of optical interface shown in Figure 5 27 because the cause that separate on spectrum and space mutually in the zone 26 of row 60, thereby row 60 a plurality of regional 26 can simultaneously luminously determine the responsiveness function by imaging device 14 is carried out single exposure under light.

[0081], can optimize the light (that is, being received) that sends through optical interface 27 so that the determining of the responsiveness function of the imaging device 14 that is calibrated by imaging device 14 with reference to figure 6.The spectral power distribution of light source 20 light that send, that provide at 28 places, zone of optical interface 27 is provided Fig. 6, and the responsiveness analysis to imaging device 14 is convenient in this distribution.These spectral power distribution comprise the exemplary radiation brightness value in the zone 28 of optical interface shown in Figure 5 27, and the wavelength relevant with these radiance values from left to right increases progressively along X-axis.

[0082] as mentioned above, the number in the light-emitting device source 20 in each zone 26 can be different, so that different intensity to be provided.In another embodiment, the light-emitting device number in each zone 26 can be identical, and the drive current of each regional light-emitting device can be different, so that desirable intensity to be provided.Also can use other configuration that required spectral power distribution is provided.In one embodiment, in the process that instrument 12 itself is calibrated, can selection intensity with near exemplary light spectral power distributions shown in Figure 6.In case determined the suitable drive current (or other configuration parameters) of the light-emitting device in each zone 26, then can calibration instrument 12, decide electric current or driving parameter light-emitting device to use determined driving.In one embodiment, can use identical drive current to drive same regional 26 light-emitting device, simultaneously, the drive current that is used to drive the light-emitting device of zones of different 26 can be different.As mentioned above, in other embodiments, except that the number or drive current of the light-emitting device that changes each zone 26, also can use other configurations.

[0083] in addition, after calibration instrument 12, can determine the spectral power distribution of the light that sends at optical interface 27 places that use drive current.In an example, can use spectral radiometer to measure the spectral power distribution of the light that sends at optical interface 27 places.Can use memory circuit 36 or other suitable circuit to store spectral power distribution as the calibration instrument 12 emission characteristics, that record of calibration instrument 12, and after calibrate in the operating process of one or more imaging devices 14 and utilize the spectral power distribution of being stored.In the recalibration process of instrument 12, can determine new drive current and/or spectral power distribution.

[0084] also can provide also stored transmit characteristic for each zone 28 of row 62.As previously described, at least some zones that can configuring area 28 change the intensity of the light (for example, the zone of row 62) of setted wavelength.Can will store as emission characteristics about the data of the light intensity corresponding with regional 28, so as after calibrate in the process of one or more imaging devices 14 and use.Also can be always draw above-mentioned intensity data in the spectral power distribution of the light in the zone 28 in 62 voluntarily.

[0085], wherein shows a kind of illustrative methods of using 12 pairs of imaging devices 14 of calibration instrument to calibrate with reference to figure 7.Also may exist and comprise more, the still less or other additive method of step.

[0086], provides the embodiment of calibration instrument 12 and at least one emission characteristics of the light that sends from light source with light source at step S1 place.

[0087] at step S2 place, the imaging device 14 that will calibrate is aimed at calibration instrument 12.

[0088], the imageing sensor 46 of imaging device 14 is exposed under the light that light source sends at step S3 place.

[0089] at step S4 place, imageing sensor 46 sensitization also produce sensing data, and these data indicate by reading that imageing sensor 46 carries out.

[0090] at step S5 place, by using emission characteristics and sensing data, suitable treatment circuit is determined the optical characteristics of imaging device 14.This optical characteristics can be used to calibrate imaging device 14.The illustrative methods of Fig. 7 can be recycled and reused for other imaging devices 14.

[0091] with reference to figure 8a, wherein, flowchart text use the calibration instrument of describing with reference to figure 2 12 in the process of calibration dependent imaging device 14, to be used for the illustrative methods of data acquisition.

[0092] at step S10 place, the imaging device that will calibrate is aimed at calibration instrument, to receive the light that sends from the optical interface of calibration instrument 12.In case aim at, just control the light source 20 of calibration instrument 12, luminous with 28 places, zone at optical interface 27.Configuration imaging device 14 makes optical interface 27 be in the focal position, and imageing sensor 46 is exposed under the light from calibration instrument 12 (for example, taking pictures), to receive the light that sends from optical interface 27.

[0093] at step S12 place, the exposure of response of step S10, imageing sensor 46 produces sensing data.In one embodiment, each pixel of configuration image transducer 46 provides the sensing data that comprises rgb value.The location of pixels of imageing sensor 46 is corresponding to the zone 28 of optical interface 27.Therefore, a plurality of and each regional 28 corresponding pixel that can recognition image transducer 46.In one embodiment, the circuit pair that can use treatment circuit 34,40 or other hope is averaged with the rgb value of each regional 28 corresponding each pixel, so that provide single RGB mean value for each zone 28.According to an embodiment and as described below, can calibrate imaging device 14 with the sensing data that comprises RGB mean value.

[0094] following another embodiment according to calibration instrument 12 has illustrated the data acquisition operation.The calibration instrument 12 of the embodiment of another current explanation comprises the optical interface with single regional (not shown), so that be calibration imaging device 14 output light.For example, opposite with as previously discussed the light-emitting device that different wave length and/or intensity are set in 26 in the zone, the light-emitting device with light source of different wave length or intensity can be distributed among the whole region area of optical interface.

[0095] in one embodiment, the light-emitting device of wishing light source provides basic even light distribution in the whole region area of optical interface.In a kind of possible execution mode, can be with on each light-emitting device that comprises 20 kinds of different wave lengths or intensity direction that is placed on row and column successively adjacent one another are, so that launch light substantially equably on the whole zone of optical interface for each wavelength and intensity provide.Other distribution patterns that also can have light-emitting device.

[0096] in an operation embodiment, it is luminous in the given arbitrarily moment only to control the light-emitting device with common wavelength or intensity.According to this embodiment, can control the light-emitting device of light, with luminous substantially equably on whole zone with first wavelength.After this, can be successively and the light-emitting device of the wavelength of control residue one by one, send the light of each wavelength successively, this just makes issued light separate on time and spectrum.If there is the light-emitting device that has varying strength for setted wavelength, then can dispose one by one these devices come luminous successively, to allow to carry out the following conversion that further specifies (transduction) calibration operation.Therefore, in one embodiment, can dispose the light-emitting device of each wavelength or intensity successively, to send various light.Saying more specifically can be controlled the light-emitting device with common wavelength successively, begins until the light of 725nm one by one to send from 375nm, and after this, be configured to provide common wavelength and the light-emitting device light that intensity changes from W1 to W5 begins luminous.In one embodiment, readable to go out emission wavelength be that 375nm-725nm and intensity are each light in the light of W1-W5 for imaging device 14.Then, imaging device 14 provides sensing data for the light of every kind of wavelength and intensity.

[0097] with reference to figure 8b, exemplary data acquisition operation has wherein been described, this operation is carried out according to second the foregoing description, and this embodiment has optical interface 27, and different light can be in turn sent in the single zone that this optical interface has.

[0098] at step S20 place, the control calibration instrument is to send the light with single wavelength.The imageing sensor of imaging device exposes under the light of being launched.

[0099] at step S22 place, use the circuit of treatment circuit 34,40 or other hope, can from the element sensor data of imageing sensor, determine the RGB mean value of each wavelength.

[0100] after this, handle to turn back to step S20, in this step, above-mentioned instrument is controlled the sending of light of next wavelength, and this makes and uses imaging device 14 to come to become possibility for each wavelength produces sensing data.In described embodiment,, therefore can repeat the process of Fig. 8 b, so that the sensing data that comprises RGB mean value to be provided because the light of multiple different wave length or intensity uses calibration instrument.

[0101] provides the foregoing description, be used to carry out the example data collection technology of imaging device calibration operation with explanation.In some other embodiment, also can use other collecting method and/or device.

[0102], after data acquisition is finished, handles the data of gathering, to determine the calibration data of imaging device 14 with reference to figure 9.According to an embodiment, exemplary processing comprises the calibration data of the optical characteristics (for example, responsiveness and/or transfer function) of determining to comprise each imaging device 14.As mentioned above, treatment circuit 34,40 and/or other suitable treatment circuits can be carried out the data acquisition operations.Similarly, can handle the data of collection with treatment circuit 34,40 and/or other suitable treatment circuits, as shown in Figure 9.And, can carry out data acquisition and processing (DAP) with identical or different treatment circuit.

[0103] in exemplary process shown in Figure 9, determined the optical characteristics that comprises responsiveness and transfer function of imaging device 14.In other embodiments, only determine responsiveness and one of transfer function and/or other characteristics of imaging device 14.And, extra optical characteristics or other information that can be identified for calibrating imaging device 14.For example, can also be by suitable treatment circuit 34,40 or further processing response degree of other treatment circuit (not shown) and/or transfer function.For example, can from responsiveness and/or transfer function, obtain color correction matrix, illumination estimated matrix and/or other information.

[0104] step S30-S34 has illustrated the exemplary flow of the responsiveness function that is used for definite imaging device 14.

[0105] step S40-S44 has illustrated the exemplary flow of the transfer function that is used for definite imaging device 14.According to other configurations, also can adopt other flow process (not shown).

[0106] at step S30 place, the sensing data of the RGB mean value in each zone 28 of 46 that obtain from imageing sensor, as to comprise the foregoing description row 60 can define matrix r.

[0107], comprises the characteristics of luminescence definable matrix S of spectral power distribution (SPD) in the zone 28 of the foregoing description at step S32 place.

[0108], can use matrix r, S and equation R=pinv (S in the above-mentioned example at step S34 place ^T) _r ^TDefine the responsiveness function R.

[0109] in the example shown, can in definite responsiveness function, determine transfer function.

[0110] refer step S40, the sensing data of the RGB mean value in each zone 28 of 46 that obtain from imageing sensor, as to comprise the foregoing description row 60 can define matrix r _W

[0111], comprises the emission characteristics definable matrix S of spectral power distribution (SPD) in the zone 28 of the foregoing description at step S42 place _W

[0112], uses the matrix r of described embodiment at step S44 place _W, S _WCan find the solution transfer function g (x)-＞g (1 ^TS _W)=r _W

[0113] can determine one or more optical characteristics of each imaging device 14 with the said method among Fig. 9, these characteristics provide sensing data separately, and these tables of data are understood the circuit of each imaging device 14, therefore, can carry out above-mentioned flow process for each imaging device that will calibrate 14, to determine the one or more suitable optical characteristics of each device 14.The said method of Fig. 9 is exemplary, can use other flow processs or method to determine responsiveness and/or transfer function or other optical characteristics of imaging device 14 in other embodiments.

[0114] in a single day determined above-mentioned optical characteristics, then can calibrate each imaging device 14 with this optical characteristics.For example, can improve the accuracy of the image processing algorithm (for example, illumination is estimated and colour correction) of each imaging device 14, improve the color accuracy of final duplicate simultaneously with the optical characteristics that comprises responsiveness and transfer function.

[0115] as described in one embodiment, whether the parts (for example, transducer 46, filter 48, or the like) that can determine imaging device 14 with exemplary device and/or method defectiveness.For example, use calibration instrument above-mentioned and that be configured to send infrared light or other light also can monitor the ability that each imaging device 14 is removed infrared light or other light.For example, if the light (light that comprises infrared light or other hope) that is sent by the optical interface 27 of each sensor device response calibration instrument 12 and sensing data that produces shows that the light of reception comprises infrared light or other light that non-filtered device 48 filters can think that then filter image device 14, that be configured to remove specific light (as infrared light) has fault.

[0116] in one embodiment, determined above-mentioned optical characteristics if use the treatment circuit 34 (or other treatment circuits of imaging device 14 outsides) of calibration instrument 12, then the optical characteristics of determining can be sent to each imaging device 14, thereby these devices are carried out suitable calibration.Perhaps, the treatment circuit 40 of imaging device 14 can be determined the optical characteristics of each device 14.In another embodiment, can use above-mentioned definite optical characteristics to calibrate, subsequently, the image processing algorithm of calibration can be offered each imaging device 14 imaging device 14 outside execution.In another embodiment, the treatment circuit 40 of imaging device 14 can be configured to utilize determined (for example, internally or outside determine) optical characteristics to carry out calibration in that imaging device 14 is inner.In a word, any suitable treatment circuit can be configured to produce one or more optical characteristics of each imaging device 14, and identical or other treatment circuit can use one or more optical characteristics to calibrate.

[0117], wherein shows the singular value decomposition of different calibration stepss, and the characteristic of exemplary light emission described herein aspect is compared with using the reflector plate (Macbeth and Macbeth DC) and the result of monochromator gained with reference to Figure 10.

[0118] described herein and the relative higher and constant singular value decomposition result who uses exemplary luminous calibration instrument 12 gained shown in Figure 2 and the result that obtains with monochromator are similar, and well beyond the result who obtains by Macbeth and Macbeth DC reflector plate, in the latter, each bar curve is non-constant and have a comparatively faster slope that descends.The accuracy of calibration steps depends on that the spectrum of reflector plate or light-emitting device to what extent is relative to each other.Relevant more between reflector plate or the light-emitting device, then inaccuracy is got in calibration.And this is to form equation by each collimation technique converted image to come the responsiveness function of computing camera to cause.When changing sheet relevant on spectrum or light-emitting device, can produce the interference of camera responsiveness function is estimated.The singular value of the reflectance function of the spectral power distribution of light-emitting device or sheet has indicated the accuracy of given method.The singular value bigger than 0.01 (the bright noise of numerical table that is less than this value is too big) is many more, and the accuracy of method is high more (for example, referring to Figure 10) just.Basically, the number of singular value has indicated the sheet color that final calibration is contributed to some extent or the number of light-emitting device.

[119] in addition, Figure 11-13 shows respectively by allowing the digital camera D1 of Nikon use the exemplary relative response degree of curve chart that the exemplary luminous calibration instrument 12 (Figure 13) of Macbeth reflector plate (Figure 11), Macbeth DC reflector plate (Figure 12) and Fig. 2 is determined, that record with respect to the use monochromator.From the comparison of Figure 11-13, can clearly find out, with use reflector plate (as, Macbeth and Macbeth DC) compare, when the calibration instrument 12 of Fig. 2 is spent in the relative response of determining given imaging device 14, provide higher accuracy.

[0120] table 1 has compared use reflection chart, the calibration instrument 12 of Fig. 2 and the calibration steps of monochromator.For given imaging device 14, the calibration instrument 12 of Fig. 2 provides the shortest alignment time (promptly, alignment time than the reflection chart is slightly short) and do not resemble and need outside uniform source of light the reflection chart, and, its alignment time than the alignment time of monochromator lack several hrs (that is, in the configuration of Fig. 2 can with the mode in space measure color and unlike monochromator the mode with the time measure color).Because external light source does not need to be uniform (for example, exemplary instrument 12 itself is sent desirable light) that therefore in the device that is compared, calibration instrument 12 has the shortest alignment time.

Table 1

The reflection chart	Calibration instrument	Monochromator
				1. environment for use light source light chart equably.2. chart 3. operating softwares of taking pictures are calibrated	1. 2. pairs of these devices of opening device, 3. operating softwares of taking pictures are calibrated	1. according to the rules wavelength and bandwidth arranges the photo-beat that 2. pairs of monochromators leave monochromator and calibrates for each wavelength repeating step 1-3 5. operating software of visible light according to 3. power stages 4. of measuring the light that leaves monochromator

[0121] table 2 has compared the roughly cost of the device that is configured to carry out above-mentioned three kinds of calibration stepss.

Table 2

The reflection chart	Rectify an instrument	Monochromator
			$50-$350 (retail price)	$200-$400 (estimation retail price)	$5000-$20000 (retail price)

[0122] table 3 has compared three kinds of methods and has comprised the singular value number of device of the calibration instrument of Figure 12.As required, other embodiment of calibration instrument 12 also can comprise more or less wavelength and/or intensity light.For example, the embodiment of above-described instrument 12 has comprised 20 kinds of different light.In other embodiment, or, can in a plurality of zones, use the dissimilar light (wavelength and/or intensity) of any suitable number successively according to other appropriate schemes.

Table 3

The reflection chart	Rectify an instrument	Monochromator
			Be approximately 4	15-20 (number that depends on light emitting source)	＞50

Therefore [0123], only provide about measurement that can be used for calibrating for 4 times because the reflection chart has the sheet color broadband, height correlation.Usually, for the calibration of the imaging device 14 that comprises camera, this is not enough.On the other hand, owing to use narrow-band light source usually, so monochromator has produced the calibration measurement above 50.Therefore, monochromator has produced the higher calibration result of precision, but its alignment time is longer relatively, and cost is also higher relatively.The example calibration instrument 12 of Fig. 2 has 15-20 measurement of correlation, and this be common imaging device 14 (for example, digital camera) produced than the better calibration result of qualified level, simultaneously, need not pay and resemble cost big the monochromator and long like that time, need not resemble yet and use exterior lighting the reflector plate.

[0124] therefore, some aspect at least of the present disclosure allows to determine quick, accurate and relatively inexpensively and calibrate the responsiveness and the transfer function of imaging device 14, and at least a execution mode, can be used to calibrate imaging device on production line.As mentioned above, because transducer and/or the colour filter difference on producing, imaging devices 14 same model or use same type parts may have different responsivenesses and transfer function.Can determine the optical characteristics of device 14 and calibrating installation 14 before imaging device 14 transports consumer or businessman to calibration instrument described herein 12.Quick relatively and accurate calibration can improve each overall color reproduction quality through the imaging device 14 of calibration.

[0125] photographer of professional person or employing high-end cameras also can use calibration instrument discussed herein 12 or method to calibrate high-end imaging device 14.Believe that such calibration can improve the overall color reproduction quality of the image that is produced by the imaging device 14 through calibration like this.Because some aspects of above-mentioned calibration utilize the raw image data of imaging device 14, and raw image data is to be provided by the imaging device 14 for the specialized market exploitation usually, thereby at least some aspects of above-mentioned calibration can be positioned more professional market.

[0126] some aspects of the following stated disclose the exemplary analysis operation that imaging device is carried out at least.Some described embodiment allow to test and measure the optics and the characteristic electron of imaging device, with the device of the control of checking on the quality, assembling and software or firmware program and/or in-site measurement and adjustment.For example, except above-described analysis operation, in exemplary embodiment, also can carry out definite single-candidate outer analysis of optical filtering, aberration, pincushion shape and barrel-shaped distortion, film speed and the gain diagram of focusing operation about imaging device, infrared cut of light filter.In certain embodiments, the mode that can be controlled by hand by the imaging device tester (for example, in interactive mode) use analytical system described herein, also can allow it (for example with automatic mode execution analysis, self-service booth), come the operation of the imaging device that verification making or in manufacturing works with it.Can for debugging or other purposes, can in whole pipeline, follow the trail of above-mentioned color-values by the program of imaging device being exposed and the imaging pipeline of testing imaging device is operated in execution analysis under the light of known color-values.At least some embodiment are illustrated as unit form of implementation with the imaging device interface.In other embodiments, can in such as the device of printer, computer, photocopier or the like, implement above-mentioned analytical system or method.

[0127], wherein shows another embodiment of imaging system 100 with reference to Figure 14.Imaging system 100 comprises imaging device analysis systems 112 and imaging device 114.In one embodiment, imaging system 100 can be configured to be similar to above-mentioned imaging system 10.For example, in certain embodiments, can analytical system 112 configurations are identical or similar with calibration instrument 12, and imaging device 114 is configured to identical or similar with imaging device 14, for example, imaging device can be that camera, digital camera, video tape recorder, scanner, photocopier, multifunction peripheral or other can obtain and produce the configuration of image.In certain embodiments, imaging device 114 can comprise the color device, and this device can obtain the color information of image and/or the numerical data that generation shows the color of the image that obtains.

[0128] in one embodiment, shown analytical system 112 comprises analytical equipment 120 and computer 122.In certain embodiments, analytical equipment 120 is configured to launch light 116, can obtain light 116 with the form of digital information by imaging device 114, or by this imaging device light 116 is saved on the photosensitive layer of film and so on.Light 116 can be launched in shell 121, and this shell is configured to reduce not the appearance by the surround lighting of analytical equipment 120 emissions.Optical coupling can be carried out in the imaging device 114 and the inside of shell 121, to receive the light 116 that is sent.In one embodiment, analytical system 112 and imaging device 114 in the temperature control facility, are provided, to reduce the influence of temperature to analysis operation.In an example, can keep shell 121 inside and/or shell 121 surrounding environment with the HVAC system is constant temperature substantially.In some configurations, during analyzing, imaging device 114 can be placed in the shell 121.

[0129] in one embodiment, can be according at least some circuit shown in Figure 3 and individually Allocation Analysis device 120 and/or computer 122 (for example personal computer).More specifically, in one embodiment, each in analytical equipment 120 and/or the computer 122 can comprise the similar communication interface of above-mentioned parts, treatment circuit, memory circuit, light source and/or the optical sensor with Fig. 3.Herein and be entitled as " Imaging DeviceAnalysis Systems And Imaging Device Analysis Methods (imaging device analysis systems and imaging device analysis methods) ", listing the invention people is Steven W.Trovinger, Glen Eric Montgomery and Jeffrey M.DiCarlo's, attorney docket is in the common unsettled U.S. Patent application of 200500702-1, and be entitled as " Imaging Device Analysis Methods; Imaging Device AnalysisSystems; And Articles of Manufacture (imaging device analysis methods; imaging device analysis systems and product) ", list the invention people for Jeffrey M.DiCarlo and Casey Miller, when folder number is 200501321-1 in the U.S. Patent application co-pending, the additional detail of exemplary embodiment has been described, and by reference that the content of these two applications is incorporated herein herein.

[0130] for example, still with reference to Figure 14, analytical equipment 120 can additionally comprise one or more illiteracy covers 150, motor 152, luminescence component 157 and extension 158.In addition, each in analytical equipment 120 and/or the computer 122 can comprise more or less element or circuit or other configurations (for example, described herein light source 154).

[0131] in addition, in one embodiment, can be configured to the embodiment of Fig. 4 imaging device 114 similar, and this imaging device can comprise and being configured to and the similar treatment circuit of above-mentioned image-forming component, photoflash lamp, optics (for example, camera lens), filter, imageing sensor and/or communication interface.Other embodiment of imaging device 114 also are possible, and they can comprise more or less element or circuit.

[0132] analytical system 100 also can have other embodiment.For example, can omit computer 122 in some configurations, and if suitable, then the function that is provided by computer 122 under other situations is provided for analytical equipment 120 and/or imaging device 114.More specifically, if there is computer, then computer 122 can provide user interface, and this interface comprises display that is used to user's display message and the input unit that is configured to receive from user's input.Computer 122 can also be carried out and/or the operation of control analysis device 120 and/or imaging device 114, so that imaging device 114 is analyzed.For example, the image acquisition operations of the luminous and imaging device 114 that the treatment circuit of computer 122 can the control analysis device is to obtain light emitted image.For example, in one embodiment, computer 122 is configured to start the analysis operation of imaging device 114, and image acquisition operations or other operations of imaging device 114 can be carried out with the light emission operation of analytical equipment 120 synchronously.In one embodiment, suitable treatment circuit can be controlled and execution analysis operation (for example, need not user's input) automatically.

[0133] treatment circuit of computer 122 can send information to analytical equipment 120 and/or imaging device 114, and/or from analytical equipment 120 and/or imaging device 114 reception information.Treatment circuit can be handled the data and the control user interface that are received and come to show test results for the user, and the calibration data that is provided for imaging device 114, and the function of other hope of execution analysis system 100.

[0134] as mentioned above, in the configuration that computer 122 is omitted, can operational analysis device 120 and/or imaging device 114 realize the above-mentioned functions of computer 122.In the embodiment that computer 122 is omitted, each in analytical equipment 120 and/or the imaging device 114 can directly be communicated by letter with other devices and/or be controlled other devices, user interface, and carry out other hope function and the operation to carry out analysis operation.

[0135] can between light source 154 and imaging device 114, configuration illiteracy selectively cover 150, to carry out analysis to imaging device 114.In one embodiment, provide a plurality of illiteracy covers 150 to come imaging device 114 is carried out different analysis operations.Cover cover 150 and use the emission of controlling one or more light beams from the light 116 of light source 154, so that the execution analysis operation.As described below, can use and from the corresponding different illiteracy covers of emission of not sharing the same light of light source 154.Analyze among the embodiment at some, between light source 154 and imaging device 114, do not use and cover cover 150.In one embodiment, response is from the control of computer 122, and motor 152 is used in light source 154 and imaging device 114 position intermediate move one or more illiteracy covers 150 selectively.

[0136] luminescence component 157 can comprise and is configured to diffuser that light source 154 issued lights are mixed.For example, light source 154 can comprise a plurality of light-emitting devices (for example, light-emitting diode) that are configured to launch light 116.In some analysis operations, a plurality of light-emitting devices are corresponding with the light of common wavelength.Luminescence component 157 can mix the light from different light-emitting devices so that eliminate frequency change, and at a time wavelength is not changed, offer imaging device 114 for the light of single wavelength substantially.Among described herein other embodiment, the light-emitting device of light source 154 can send the light 116 of different wave length.In certain embodiments, can luminescence component 157 be removed from the optical channel of light 116 by user, motor 152 or other devices.

[0137] according to some analysis aspects, to wish to send at least some each light beams of different wavelengths from luminescence component 157, these light beams have essentially identical intensity, and send imaging device 114 to.In addition, light source 154 can send the light beam of varying strength.Corresponding with each the different analysis operation that will carry out, can send and/or send successively the light beam of different wave length or intensity simultaneously.

[0138] in the exemplary configuration of the following stated, wish to use the light-emitting device group that is positioned at different spatial to come luminous.In one embodiment, light source 154 can have the surf zone of rectangle, and can place the light-emitting device of a plurality of identical or different wavelength on this whole surf zone.As described below, the light-emitting device of different numbers or group comprises and can be used for device or group different analysis operations, that separate on the space.In another embodiment, different analysis operations is carried out in the position that light-emitting device can be moved on to hope.In another embodiment, can adjust the light source 154 of a plurality of different configurations according to each analysis operation that will carry out.Following some details of operating of having discussed according to some embodiment about exemplary analysis.

[0139] in analysis operation, the surround lighting (promptly not being the light that is sent by analytical equipment 120) that may wish to enter into imaging device 114 is minimum or stops this surround lighting to enter imaging device 114.In one embodiment, optical interface (for example, the output of luminescence component 157) can have enough sizes (for example, diameter is 2 "), and this size is bigger than the optical fiber receive module (for example optical receiving surface of camera lens) of imaging device 114.Therefore, the optical interface camera lens that can be configured to cover fully the imaging device of analyzing 114 reduces or minimizes the surround lighting that enters into imaging device 114.According to an aspect, in analysis, the optical interface of luminescence component 157 can contact the camera lens of imaging device 114, and perhaps, in other cases, they can carry out optical coupling closely.Also configurable extension 158 around the optical coupling of analytical equipment 120 and imaging device 114 enters into the surround lighting of imaging device 114 with minimizing.

[0140], can send the light beam of identical or different wavelength and/or intensity from optical interface according to exemplary analysis embodiment.Can send light beam constantly simultaneously or in difference.Corresponding to sending of light 116, may be controlled to as device 114 and obtain image, when not obtaining image, lock focus (lock focus) or carry out the operation that other are used to carry out analysis operation.According to other analysis aspects, other operating aspects of analytical system 112 or imaging device 114 also are possible.

[0141], the exemplary operation about the infrared light filter analysis of imaging device 114 has been described wherein with reference now to Figure 15-17.In one embodiment, the illustrative aspects of describing the correct installation of introducing infrared cut of light filter and this filter is tested.

[0142] Figure 15 has shown the exemplary configuration of light source 154, and according to an embodiment, this configuration allows the infrared light filtration of imaging device 114 is analyzed.A plurality of groups 153 of the light-emitting device 155 that can be provided by light source 154 are provided Figure 15.As mentioned above, in one embodiment, light-emitting device 155 can cover the whole surf zone of light source 154, and according to described embodiment, the group 153 shown in illustrating is used for carrying out analysis operation to the infrared cut of light filter just to indicating which light-emitting device 155.In another embodiment, Figure 15 represents the actual disposition of the light-emitting device 155 of light source 154.Shown in example, use a plurality of groups 153 in different locus, to allow carrying out analysis operation at the imaging device 114 of different spatial.In described exemplary infrared light is analyzed, do not use and cover cover, and other embodiment of light source 154 also can be used for execution analysis.

[0143] in an operation embodiment, each group 153 all can be luminous from each light-emitting device 155 of different wave length simultaneously, and comprise that wavelength is the following and above light of 700nm.For example, in a kind of form of implementation, from left to right, light-emitting device 155 can send the light that wavelength is 660nm, 740nm, 860nm, 890nm, 935nm and 1030nm.

[0144], wherein shows output with the location of pixels of group 153 corresponding imageing sensors with reference to figure 16A-16B.In one embodiment, show the output of a plurality of photosensitive devices (for example, charge coupled device) of the imageing sensor of imaging device 114.These examples show the result of the normally functioning infrared cut of light filter and the out of order infrared cut of light filter (Figure 16 B) of imaging device 114 (Figure 16 A).Particularly, may command imaging device 114 obtains the light that sends from the group 153 of light source 154.Shown in Figure 16 A, if the infrared cut of light filter is working properly, the pixel value of each sensing device of then corresponding with the light-emitting device 155 of leftmost side imageing sensor has indicated the reception to the light of 660nm, and indicates the almost not reflection or do not receive light of these sensing devices with remaining light-emitting device 155 and wavelength greater than the pixel value of the corresponding sensing device of the light of 700nm.If the work of infrared cut of light filter is undesired, as Figure 16 B, then the pixel value of each sensing device of the imageing sensor corresponding with each group light-emitting device of 153 155 indicates and has received all light that send that comprise infrared light.If the work of infrared cut of light filter is undesired, then can take adequate measures.

[0145], wherein shows the exemplary flow that is used to analyze the infrared light filter operation with reference to Figure 17.In one embodiment, the step shown at least some can be controlled or carry out to the suitable treatment circuit of analytical system 112 and/or imaging device 114.Comprise more, still less or in addition the additive method of step also is possible.

[0146] at step S110 place, light source is configured on corresponding with light-emitting device shown in Figure 15 at least position luminous, and this light has comprised that infrared spectrum is with light interior and in addition.

[0147] at step S112 place, the imageing sensor of control imaging device obtains the image corresponding with issued light, and therefore produces view data.

[0148], can handle the view data of imageing sensor at step S114 place.In one exemplary embodiment, imaging device 114 is with respect to the location-controlled of light source 154 or known, and each location of pixels of the imageing sensor corresponding with the position of light-emitting device 155 is known, simultaneously can be from the direct reading image data of suitable location of pixels.If above-mentioned location of pixels the unknown then can be carried out a kind of algorithm and determine locations of pixels, and these pixels have comprised the desirable view data that is used for light generation each light-emitting device 155, that response is sent.Exemplary searching algorithm has been described in U.S. Patent No. 5371690, by reference the content of the document has been incorporated among this paper.In case determined location of pixels, then can pass through treatment circuit access images data.Whether this treatment circuit can compare the intensity information and the threshold value of each location of pixels of being formed by the light from each light-emitting device 155, working properly to determine the infrared cut of light filter.In the embodiment shown, each light beam for device 155 can be used for comparison with view data mean value or the peak value from neighbor.For the light of different wave length, the sensitivity of photosensitive device may be different.In the exemplary embodiment, for the data that provided by location of pixels, treatment circuit can use different threshold values, and perhaps, treatment circuit is with the output normalization of photosensitive device, so that they and single threshold value are compared.

[0149], can export analysis result to send it to user at step S116 place.For example, computer 122 can show the curve chart that is similar to 16A-16B and/or provide the infrared light filter operation by/failure indication.

[0150], the exemplary operation of the aberration that is used to analyze imaging device 114 has been described wherein with reference now to Figure 18-22B.In one embodiment, in the visual field of imaging device 114, measured aberration.Figure 18 has shown the exemplary configuration that is used to carry out light-emitting device 155 described analysis, light source 154, and Figure 19 shows the exemplary configuration of covering cover 150, and according to an embodiment, this illiteracys is covered corresponding with the device 155 that uses among Figure 18.In the time will carrying out color difference analysis, computer 122 controllable motor 152 will be covered cover 150 appropriate locations that move on between light source 154 and the luminescence component 157.

[0151] as shown in figure 18, can provide group 153a, imaging device 114 be carried out analysis operation to use different locus in different locus.Each light-emitting device among the group 153a comprises the light-emitting device 155 of the light (for example, in one embodiment, sending the blue light of 400-450nm, the green glow of 500nm and the ruddiness of 650-700nm) that is configured to send different wave length.

[0152] Figure 19 shows two sizes (being wide and high) of covering cover 150, and these two dimension definitions an area.In one embodiment, this area is corresponding with the area of the light-emitting device of light source 154.For example, as mentioned above, light source 154 can comprise a plurality of light-emitting devices 155 (for example, though only show the device 155 of group 153a in Figure 18, above-mentioned area can be corresponding with the area shown in Figure 18-19) on the area that are distributed in.Cover cover 150 and comprise the corresponding aperture 160 of each group 153a a plurality of and light-emitting device 155.Aperture 160 can comprise aperture, and these apertures are configured to allow the light corresponding to light-emitting device 155 pass through, and these light-emitting devices aim at aperture 160, and is positioned at the rear side of aperture 160.In one embodiment, configuration group 153a makes when watching by illiteracy cover 150, mixes the light from each device 155.Other configurations can be included in the LED, the use that have a plurality of diodes in the same package and have the diffuser of illiteracy cover 150 and/or the execution mode of other mixing.

[0153], wherein shows the exemplary flow of the aberration of attempting to detect imaging device 114 with reference to Figure 20.In one embodiment, step shown at least some can be controlled or carry out to the suitable treatment circuit of analytical system 112 and/or imaging device 114.Comprise more, still less or in addition the additive method of step also is possible.

[0154] at step S120 place, the suitable light-emitting device 155 of configuration group 153a carries out luminous.In described exemplary embodiment, at step S120 place, only the light-emitting device 155 of middle wavelength (for example, green glow) is luminous.

[0155] at step S122 place, imaging device 114 receiving beams also lock focus between the light emission period of step 120.

[0156] at step S124 place, the light-emitting device 155 (for example, ruddiness and blue light) of controlling long wavelength and short wavelength simultaneously sends the light by each aperture 160 that covers cover 150.The light of selfluminous device 155 mixes in the future, is different from the light beam of the wavelength of light emitted bundle among the step S120 so that wavelength to be provided.For example, in a possible embodiment, can use the diffuser of luminescence component 157 and/or provide mixing with the diffuser (not shown) before by aperture 160 at light.

[0157] at step S126 place, control imaging device 114, the image of light beam is sent in the focus place of determining in step S122 when carrying out step S124 to obtain.In the exemplary embodiment, this image that obtains may be under-exposed, and perhaps, in other cases, may command imaging device 114 makes its exposure in hope obtain image under being provided with.In certain embodiments, the control exposure can be avoided or reduce " bluring " or other amplifications that causes owing to overexposure, to improve the accuracy of analyzing.

[0158], handles the view data of the image that obtains at step S128 place.With reference to figure 21A and 21B, wherein show exemplary pixels position 147 imageing sensor 146, that under possible scene, receive view data.Figure 21 A shows an example, and therein, aberration or its aberration minimum do not appear in imaging device.Figure 21 B shows an example, has occurred aberration therein.Compare with Figure 21 B, the location of pixels 147 of the light that the reception of Figure 21 A is sent (for example, the purple light in described example) is more concentrated.The location of pixels 147 of Figure 21 B shows the surrounding pixel 149 that receives the pixel 148 of purple light and receive blue light in the description example in the description example.Figure 22 A shows the result's of Figure 21 A another kind diagram, therein, shows the group of quite concentrating of the location of pixels that receives purple light 170.Figure 22 B shows the result's of Figure 21 B another kind diagram, therein, shows the location of pixels of relatively large at least some blue lights 172 of reception of the group of concentrating of the location of pixels that receives purple light 170 and number.Exist to receive the pixel 149 of light among Figure 21 B, and this shows in imaging device 114 and has aberration.In one embodiment, suitable treatment circuit can be searched the location of pixels of imageing sensor 146, with definite area that receives the location of pixels 147 of light.In case determined above-mentioned area, then treatment circuit can be the location of pixels 147 relatively area or the number of photosensitive devices, and these location of pixels receive with from organizing the corresponding light of each light beam that 153a sends.In one embodiment, if one or more areas are arranged, then there is aberration greater than threshold value.Can determine this threshold value based on imaging device 114 desirable accuracy.In another embodiment, can carry out the result who the definition detection algorithm of color sensitivity is distinguished Figure 21 A and 21B to above-mentioned view data, to determine whether to exist aberration.Additive method also is possible.

[0159] at step S130 place, can be with result's output of analyzing, to send it to the user.For example, computer 122 can show the diagram that is similar to Figure 21 A-21BA or 22A-22B or provide by/failure indication.

[0160], wherein described and the relevant exemplary operation of ability of analyzing imaging device 114 correct focusedimages with reference now to Figure 23-26.In some embodiments, these operations can be analyzed the focusing and/or the algorithm of imaging device 114.

[0161] Figure 23 shows the exemplary configuration of a plurality of light-emitting devices of spatially separating 155 of the light source 154 that is arranged in the lattice (pattern), in one embodiment, and the illuminated focusing operation of testing imaging device 114 of this grid general layout.In the embodiment shown, in the visual field of imaging device 114, send the light-emitting device 155 of light and spatially separate mutually along two dimensions (for example, describing the x and the y dimension of the rectangular arrangement among the embodiment).In one embodiment, can send the light of any suitable wavelength.When analyzing focusing operation, the illiteracy cover 150a among Figure 24 can be moved on to the correct position between light source 154 and the luminescence component 157.Cover cover 150a and comprise the corresponding aperture aperture 160 of light-emitting device 155 among a plurality of and Figure 23.

[0162] control imaging device 114 makes it obtain the light that is sent simultaneously by light-emitting device 155 by the aperture 160 that covers cover 150a.With reference to figure 25A-25B, wherein show and receive the output of a plurality of photosensitive device pixel position corresponding of the imageing sensor of one of light beam that the light-emitting device 155 among Figure 23 sends, this output is used for the normal focusing operation (Figure 25 A) of imaging device 114, and indicated the ability that imaging device 114 focused on and handled its light that receives, also indicated the focusing operation (Figure 25 B) that has fault, when having fault, the light of one of them light beam that sends from light source 154 will thicken after imaging device 114 receives and handles.If focusing operation is undesired, then can take adequate measures, for example, change focusing.In described embodiment, the location of pixels of imageing sensor that receives the light beam that is sent by light-emitting device 155 is corresponding with the spatial configuration of light-emitting device 155 usually, and can be used to the focusing power of analysis imaging device 114 on a plurality of locus.

[0163], wherein shows the exemplary flow of the aggregation operator that is used to analyze imaging device 114 with reference to Figure 26.In one embodiment, step shown at least some can be controlled or carry out to the suitable treatment circuit of analytical system 112 and/or imaging device 114.Comprise more, still less or in addition the additive method of step also is possible.

[0164], disposes suitable light-emitting device 155 and carry out luminous at step S140 place.

[0165] at step S142 place, indication imaging device 114 obtains the image of the light that is received.In the exemplary embodiment, the image that obtained may be under-exposed, and perhaps, in other cases, may command imaging device 114 makes its exposure in hope obtain image under being provided with.

[0166] at step S144 place, view data is handled, to analyze focusing operation.Similar with the method for Figure 20, treatment circuit can be discerned the photosensitive device of the imageing sensor that has received the light that sends and determine to have received area (or number) from the photosensitive device of the optical sensor of the light of each light-emitting device 155.In one embodiment, if each area, can assert then that the focusing of imaging device 114 is acceptable all less than threshold value.In one embodiment, if one or more areas are arranged, assert that then there is fault in focusing operation greater than threshold value.In another embodiment, can analyze result with the definition detection algorithm from imageing sensor.

[0167] at step S146 place, analysis result can be exported, to send it to the user.For example, computer 122 can show the diagram that is similar to Figure 25 A-25B and/or provide by the indication of/failure bright mirror head to focus on and handle the ability of the image that is received.

[0168] with reference to figure 27A-28, wherein to have described and the relevant illustrative aspects of optics of analyzing imaging device 114, these aspects comprise according to the distortion of an exemplary embodiment identification pincushion shape (pin cushion) or barrel-shaped (barrel).In one embodiment, executing for each imaging device 114 and focusing on the relevant aforesaid operations of test and focus on test result can accept the time, can carry out the operation relevant with analyzing optics.

[0169] in one embodiment, can utilize the pattern of light-emitting device luminous among Figure 23 155 and the illiteracy cover 150a among Figure 24.For example, light-emitting device 155 can be arranged to comprise the pattern of the straight line of many row and columns that comprise grid.Other patterns of device 155 also are possible.Figure 27 A and Figure 27 B show the light that is received by the imageing sensor response and the determined example results of obtaining of view data, wherein, result among Figure 27 A has indicated the pincushion shape distortion in the optics, result among Figure 27 B has indicated the barrel-shaped distortion in the optics (promptly, the number of location of pixels 147 is greater than the number of the light-emitting device among Figure 23 155 shown in the reception light, wherein, above-mentioned light-emitting device is luminous, so that the graphical display of distortion of pincushion shape and barrel-shaped distortion).If there is no distortion, the photosensitive device that then receives the imageing sensor of light should have the pattern that is similar to grid, and this pattern is similar to the array exemplary straight line corresponding with row and column 151 expression, that send the light-emitting device 155 of the light by each aperture 160.In case discerned the imageing sensor that receives light photosensitive device location of pixels 147 (for example, use searching algorithm), then treatment circuit attempts to determine whether location of pixels 147 appears in a certain pattern, and, this pattern is aimed at the pattern of the light-emitting device 155 that sends light beam, perhaps, in other cases, this pattern is corresponding with the pattern of light-emitting device 155.For example, treatment circuit can be determined only to be received by photosensitive device, in acceptable tolerance levels, these photosensitive devices is configured to belong to the straight line 151 of the row and column of each pattern.Treatment circuit can be discerned some location of pixels 147 corresponding with row and column.If one or more remaining location of pixels 147 depart from the distance of definite row or column and surpass a threshold value, then can discern the imaging device 114 that has fault.In another embodiment, can be to user's display pixel position 147, and determine that by the user imaging device 114 is not by still passing through test analysis.Can discern distortion and/or whether definite result can accept with other flow processs.

[0170], wherein shows and be used for analyzing the pincushion shape distortion of imaging device 114 or the exemplary flow of barrel-shaped distortion with reference to Figure 28.In one embodiment, step shown at least some can be controlled or carry out to the suitable treatment circuit of analytical system 112 and/or imaging device 114.Comprise more, still less or in addition the additive method of step also is fine.

[0171] at step S150 place, in one embodiment, be configured in suitable light-emitting device 154 in the grid (for example, Figure 23) carry out luminous.

[0172] at step S152 place, imaging device 114 obtains the image of the light that is received.In the exemplary embodiment, the image that obtained may be under-exposed, and perhaps, in other cases, may command imaging device 114 makes its exposure in hope obtain image under being provided with.

[0173] at step S154 place, image data processing determines whether to exist distortion.Treatment circuit can be discerned the location of pixels of photosensitive device of the imageing sensor of the light that reception launches, and attempts these location of pixels are mapped to the row and column of grid.If in the acceptable margin of tolerance, finished this mapping, then can indicate device by test, otherwise, indicate imaging device 114 and have fault.

[0174] at step S156 place, exportable analysis result is to send it to the user.For example, the indication that similarly illustrates and/or provide with Figure 27 A-27B by/failure can be provided computer 122.

[0175], wherein described and the exposing operation of imaging device 114 has been analyzed (for example, the film speed of shutter and/or imageing sensor) relevant illustrative aspects according to an embodiment with reference to figure 29-31.

[0176], wherein shows example according to the light-emitting device 155 of the luminous light source 154 of description embodiment with reference to Figure 29.According to an embodiment, from the known moment, in the known time period, send a plurality of light beams, with the image acquisition or the time for exposure of the imageing sensor of the shutter (if exist) of test imaging device 114 and imaging device 114.In the example of Figure 29, show first group of 153b and second group of 153c, these groups have comprised spatially separate a plurality of light-emitting devices 155.Control or object of reference (reference) that the light-emitting device 155 of first group of 153b is operated as assistant analysis, and can be luminous continuously in analytic process.The light-emitting device 155 of second group of 153c is configured to carry out the shutter speed operation that associative operation is tested imaging device 114.In the embodiment shown, the leftmost side of second group of 153c and the light-emitting device of the rightmost side 155 can be control or object of reference device, and they can be luminous continuously in analytic process.In the example of Figure 29, show light-emitting device 155 as control device as object of reference 180.In described embodiment, the light-emitting device 155 that will be between the control device 180 of second group of 153c is called analytical equipment 182.

[0177] for analyzing the film speed operation, when analytical equipment 182 was luminous successively, indication imaging device 114 obtained image with the film speed of hope.In described embodiment, the fluorescent lifetime of each analytical equipment 182 is a public duration, and should the duration than with selected film speed (for example, film speed for 1/125 second, analytical equipment 182 can adopt 1/1000 second exemplary fluorescent lifetime) time for exposure corresponding, imaging device 114 (for example, when the shutter of imaging device 114 is opened and/or the time for exposure length of imageing sensor) is short.In one embodiment, the number of analytical equipment 182 has indicated film speed, and between exposure period, obtains light from above-mentioned analytical equipment by imaging device 114.

[0178] more specifically, with reference to Figure 30, wherein show the test result of imaging device 114 when film speed is set to 1/125 second of operate as normal.As shown in figure 30, wherein show a plurality of location of pixels 147 of the imageing sensor that receives light.Show light at location of pixels 184 places, and show light from eight analytical equipments 182 at location of pixels 186 places from control device 180.Light from eight analytical equipments 182 indicates, and in described exemplary embodiment, exposing operation is receivable (that is, 8 * 1/1000=1/125).The light at more or less location of pixels 186 places has indicated film speed respectively and has crossed slow or too fast situation.In other embodiments, the luminous duration that can change each analytical equipment 182 is tested other film speeds.

[0179], wherein shows the exemplary flow of the shutter speed that is used to analyze imaging device 114 with reference to Figure 31.In one embodiment, analytical system 112 and/the suitable treatment circuit of imaging device 114 can control or carry out step shown at least some.Comprise more, still less or the additive method of other step also be possible.

[0180], controls suitable light-emitting device 154 and carry out luminous at step S160 place.In one embodiment, the above-mentioned luminous control device 180 that comprises continues to carry out luminous luminous in the duration of hope successively with analytical equipment 182.

[0181] at step S162 place, imaging device 114 has obtained the image of the light that is received according to the shutter speed setting of hope.In the exemplary embodiment, the image that obtained may be under-exposed, and perhaps, in other cases, may command imaging device 114 makes its exposure in hope obtain image under being provided with.

[0182], handles view data, to carry out analysis operation about shutter speed from the optical sensor of imaging device 114 at step S164 place.Treatment circuit can be obtained the number sum of the location of pixels 186 that receives light, and the luminous duration of this result and each analytical equipment 182 is multiplied each other, so that the information about the shutter speed operation to be provided.

[0183] at step S166 place, can export analysis result, so that send it to user.For example, computer 122 can show the diagram that is similar to Figure 30, the shutter speed that calculates is provided and/or provides by/failure indication.

[0184], the illustrative aspects of calculating the gain diagram of each imaging device 114 according to an embodiment has been described wherein with reference to Figure 32.Gain diagram can provide calibration/compensation for the uneven luminosity response of the imageing sensor of each imaging device 114.Can calculate above-mentioned these gain diagram and they are stored in each imaging device 114, and the view data that they are applied to produce subsequently, the influence (comprising camera lens) that comes off and caused with the camera lens that reduces by the imageing sensor difference of different imaging devices 114 and/or each imaging device 114 if install 114.In one embodiment, the step shown at least some can be controlled or carry out to the suitable treatment circuit of analytical system 112 and/or imaging device 114.Comprise more, still less or the additive method of other step also be possible.

[0185] at step S170 place, control light source 154 come for analysis operation luminous.In one embodiment, the light-emitting device 155 of enough numbers of control light source is so that provide basic illumination uniformly with light source 154.In one embodiment, the light that sends is neutral (white) substantially.Can use diffuser to mix above-mentioned light such as luminescence component 157.

[0186] at step S172 place, control imaging device 114, the image of the light that is sent to obtain.In response to the light that is sent, imageing sensor can be measured a plurality of color channels (as red, green and basket) independently.

[0187] at step S174 place, visited view data from the imageing sensor of imaging device 114.Can be imageing sensor and a plurality of parts of image definition data.Single such part can be little or bigger than it as single location of pixels.For example, if imageing sensor is a rectangle, then a plurality of parts can be defined as grid, in one embodiment, this grid comprises seven parts on the x direction and five parts on the y direction.In one embodiment, it is identical these parts can be configured to size, so that they comprise the location of pixels of similar number.

[0188] in one embodiment, for various piece, fall into a trap for each color channel and to have calculated average pixel value, and, obtain determined average pixel value sum for each part.Identification has the part (for example, normally being positioned at that part at imageing sensor center) of maximum above-mentioned and value.After discerning, can discern a plurality of correction coefficient for other available parts, so that make the mean value of upper part equal determined maximum.For example, for given part n, can calculate the correction coefficient that it gives routing (for example red) with following formula:

The mean value of the maximum average value/red part n of red-correction coefficient n=redness can be determined correction coefficient for other color channels of this part in a similar fashion.After this, can calculate extra correction coefficient for each passage of remainder.The correction coefficient of determining according to above exemplary equation is a ratio, and they have represented the relation between the intensity of view data of pixel of various piece.

[0189] at step S176 place, the correction coefficient of being calculated is stored as the gain diagram of each imaging device 114, and the view data of obtaining at the imageing sensor that subsequently they is applied to by imaging device.For example, the data that the various piece of the optical sensor of suitable correction coefficient and imaging device 114 is obtained can be multiplied each other.In one embodiment, use the memory circuitry stores gain diagram of imaging device 114 separately.

[0190] above-mentioned illustrative methods provides a point calibration (for example, the even white correction coefficient in described embodiment).In other embodiments, also can provide other corrections (for example, being used to improve three point calibrations of accuracy).In the embodiment of one three point calibration, sent the light of varying strength (for example, intensity, 20% the intensity that is used for 50% intensity of 50% even grey and is used for 20% even grey) fully from the light-emitting device 155 of light source 154.After this, at different intensity, can determine a plurality of correction coefficient for the single channel of single part.In one embodiment, can use the above-mentioned formula relevant to be identified for the correction coefficient of complete intensity with step S174.But working strength be 50% with 20% a plurality of do not share the same light emission with determine that with above identical formula intensity is 50% and 20% o'clock correction coefficient, but, the molecule of formula (for example need be replaced with fixed value, eight outputs for each pixel position, can be used for 50% even grey with 128, and will be worth 51 and be used for 20% even grey).

[0191] after this, according to being used for the value of channel image data separately, can select separately a coefficient in three correction coefficient of passage separately of part.For example, if eight place values that provided by location of pixels are in the strength range of 0-80, then can use the correction coefficient of 20% intensity.If this value is in the strength range of 81-191, then can use the correction coefficient of 50% intensity.If this value is in the strength range of 192-256, then can use even white correction coefficient.After separately correction coefficient of identification, can use separately correction coefficient to revise the view data of above-mentioned location of pixels.In other embodiment, can calculate and use more or less correction coefficient.

[0192] illustrative aspects of at least one embodiment allows with above-mentioned analytical system imaging device to be carried out the different analysis operation of many kinds (for example, measure, calibrate, adjust and/or the upgrading imaging device).The advantage of some embodiment comprises with lower cost provides analysis operation in the shorter time, and this is convenient to them such as the application in the occasion in enormous quantities of manufacturing environment.In one embodiment, since minimum or do not need the user to import from being input as of user, thereby realized the automation of analysis operation.Therefore, new hand also can carry out analyzing with the imaging device to them alternately with disclosed system and device.Use equipment and method described herein, can adjust, with picture quality and/or other features that is improved imaging device by analysis.Because the transducer of imaging device may change its characteristic in time, and this can cause decrease in image quality, thereby can and sell the back at imaging device and carry out described exemplary analysis method when produce imaging device.

[0193] the disclosed embodiment that the protection of looking for is not limited to only provide as an example, on the contrary, it is only limited by appended claim.

Claims (10)

1. imaging device analysis systems 100 comprises:

Light source 154 is configured to export the light 116 of at least one image-forming block that is used to analyze imaging device 114, and wherein, described imaging device 114 is configured to respond the light 116 that is received and produces image; With

Treatment circuit with described light source 154 couplings, be configured to control described light source 154 and described light 116 be sent to described imaging device 114 with optical mode, wherein, described treatment circuit also is configured to the access images data, described view data by 114 responses of described imaging device it to producing from the reception of the light 116 of described light source 154, and handle described view data to analyze the operation conditions of at least one image-forming block.

2. the system as claimed in claim 1, wherein said light source 154 is configured to export described light 116, the infrared light 116 that described light 116 uses when being included in described at least one image-forming block of test, and described at least one image-forming block comprises the infrared cut of light filter that is configured to filtering infrared light 116.

3. system as claimed in claim 1 or 2, wherein, described light source 154 is configured to send the light 116 of first wavelength, focus with the camera lens that locks described imaging device 114, and when the focus of described camera lens is locked, send the light 116 of second wavelength, wherein said treatment circuit is configured to utilize the reception of light 116 of response second wavelength and the view data that produces determines to comprise the operation conditions of the distortion of described at least one image-forming block, and described at least one image-forming block comprises camera lens.

4. as claim 1,2 or 3 described systems, wherein said light source 154 is configured to export described light 116, described light 116 comprises a plurality of light beams that are positioned at different spatial, wherein said treatment circuit is configured to handle in the view data that produces with a plurality of location of pixels 147 places of the imageing sensor of the corresponding described imaging device 114 in described different locus, determine to comprise the operation conditions of the distortion of described at least one image-forming block, described at least one image-forming block comprises the camera lens of described imaging device 114.

5. as claim 1,2,3 or 4 described systems, wherein said light source 154 is configured to export the described light 116 that comprises a plurality of light beams, wherein each described light beam was exported in the duration shorter than the time for exposure of described imaging device 114, and described treatment circuit is configured to handle described view data, determine to comprise the operation conditions of the shutter speed of described at least one image-forming block, described at least one image-forming block comprises the shutter of described imaging device 114.

6. as claim 1,2,3,4 or 5 described systems, wherein said treatment circuit is configured to determine comprise the operation conditions of described at least one image-forming block of imageing sensor, and determine that at least one correction coefficient, described at least one correction coefficient are used to revise the view data of using described imageing sensor to produce.

7. imaging device analysis methods comprises:

Export a plurality of light beams, described light beam is sent to imaging device 114, described imaging device 114 is configured to respond the light 116 that is received and produces image;

Visit responds the view data that is sent to the described light beam of this device and produces by described imaging device 114;

Handle described view data; With

Respond described processing, the information about the distortion of the optics of described imaging device 114 is provided.

8. method as claimed in claim 7, wherein, described output comprises with a kind of pattern exports a plurality of light beams, and described processing comprises that identification receives a plurality of location of pixels 147 of the described imaging device 114 of described light beam, and described location of pixels 147 is compared with described pattern.

9. method as claimed in claim 8, wherein said pattern provides the light beam of arranging with many straight lines 151, and described processing comprises that identification receives a plurality of location of pixels 147 of the described imaging device 114 of described light beam, and analyzes the alignment case of described location of pixels 147 and described straight line 151.

10. method as claimed in claim 8, wherein said pattern comprise the light beam of arranging with many straight lines 151, and described many straight lines comprise the row and column of grid.

Images