CN1811360A - Adaptive non-uniform correcting method for stare infrared focal plane detector - Google Patents
Adaptive non-uniform correcting method for stare infrared focal plane detector Download PDFInfo
- Publication number
- CN1811360A CN1811360A CN 200610010706 CN200610010706A CN1811360A CN 1811360 A CN1811360 A CN 1811360A CN 200610010706 CN200610010706 CN 200610010706 CN 200610010706 A CN200610010706 A CN 200610010706A CN 1811360 A CN1811360 A CN 1811360A
- Authority
- CN
- China
- Prior art keywords
- temperature
- detector
- working temperature
- blackbody
- correction parameter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Abstract
The present invention relates to a staring infrared focal plane detector adaptive non-uniformity correction method. It is characterized by that it uses the parameters of three fields of environmental temperature, prestored several parameter matrixes and image matrix obtained by detector as calculation basis of compensation algorithm, makes the preset correction parameters under the different working conditions and image matrix actually collected by detector undergo the process of algorithm iteration and utilizes the calculated result to adaptively correct current correction parameter matrix of detector.
Description
One, technical field
The present invention relates to be used to stare the Nonuniformity Correction of infrared focus plane thermal imaging system and the method and the relevant apparatus of performance optimization, is a kind of technology of staring the infrared focus plane thermal imaging system that is mainly used in.
Two, background technology
The infrared focus planardetector of staring is owing to the reason on the manufacturing process, all has fixing heterogeneity noise, this heterogeneity noise shows as and has fixing irregular light and shade shading on the image, this shading that image exists has strong interference to human eye, handle if do not carry out the later stage Nonuniformity Correction, even can cause the infrared system can't operate as normal.Simultaneously, the infrared focus planardetector of staring also has the characteristics that characterisitic parameter sharply drifts about and changes with working temperature, in order to solve the image deterioration that infrared parameter drift problem of staring focus planardetector causes, the method that generally addresses this problem be to use in the machine movably reference blackbody with the light path temporarily shielding as correction reference, to the collection of the corresponding signal of detector and calculate and to obtain corresponding corrected parameter, adopt this parameter to address this problem substantially by circuit.But because the use occasion that has requires the volume of very miniaturization, can't install this reference blackbody and light path guard mechanism additional, cause the infrared focus planardetector of staring after parameter drift, can't carry out parameter and calibrate action again, deterioration in image quality, even can normally not use under the serious situation, this has just limited stares the focal plane thermal imaging system and can't use in some specific occasions.
China Patent No. 01139289.4 described method belongs to light path and blocks a kind of in the scheme, need provide reference blackbody to demarcate to solve infrared problem of staring the focus planardetector parameter drift during on-the-spot the use; In addition detector is had specific (special) requirements, promptly detector needs to adjust integral time, and the detector of a lot of non-refrigeration types adjusting function when not possessing detector integrates can't satisfy the pacing items that this patent is used.
Three, summary of the invention
In order effectively to improve the performance of thermal infrared imager, solve the application difficult problem of gazing type thermal imaging system in miniaturization subminiaturization system, the present invention proposes a kind of adaptive non-uniform correcting method for stare infrared focal plane detector, it is based on environment temperature, the parameter of image array three aspects that obtain of Cun Chu a plurality of parameter matrixs and the detector basis of algorithm by way of compensation in advance, to under the different operating state preset correction parameter and detector actual acquisition to image array carry out algorithm iteration, according to result of calculation the current correction parameter matrix of detector is carried out the self-adaptation correction.
The present invention is directed to correction work parameter that prior art exists and under the different operating environment, need the defective of periodically calibrating, proposed the brand-new technology scheme and implemented theoretical, need not to provide reference blackbody in on-the-spot the use, solved this contradiction and effectively strengthened picture quality by self-adaptation adjustment parameter, do not have special requirement to surveying utensil, application conditions is more extensive.
For achieving the above object, the inventive method comprises following steps:
A kind of adaptive non-uniform correcting method for stare infrared focal plane detector is characterized in that may further comprise the steps:
(1) provide a series of blackbody equivalent temperatures different even blackbody radiation sources, temperature range covers whole temperature range,
(2) change detector working temperature and measure current detector working temperature,
(3) gather the response of detector, and will store in all data that collect input data storage devices the high low temperature blackbody radiation source under a series of different temperature points,
(4) do the calculating of correction parameter according to the explorer response data under working temperature and a series of different temperature points and obtain correction parameter matrix under a plurality of corresponding different operating temperature, and each correction parameter matrix is stored,
(5) during on-the-spot the use,, corresponding correction parameter matrix read carries out the correction parameter that the self-adaptation correction obtains corresponding current goal according to target average background temperature and detector working temperature,
(6) data processing equipment carries out data behind Nonuniformity Correction and the output calibration.
Above-mentioned a series of different even blackbody radiation source is:
(1) determine minimum operating temperature as the initial working temperature point that presets,
(2) increase working temperature according to a fixed step size and determine that up to maximum operating temperature other preset the working temperature point,
(3) working temperature of determining according to above two steps that respectively presets increases and reduces by a fixed temperature value and preset the high temperature blackbody equivalent temperature and the low temperature blackbody equivalent temperature of working temperature point as this.
Above-mentioned collection detector is meant the response and the storage of the high low temperature blackbody radiation source under a series of different temperature points:
(1) determine the initial working temperature of detector,
(2) determine low temperature blackbody equivalent temperature value and set blackbody radiation source according to working temperature,
(3) gather the response of detector, store in the data that the collect input data storage device the radiation of this blackbody radiation source that configures,
(4) determine high temperature blackbody equivalent temperature value and set blackbody radiation source according to working temperature,
(5) repeated for (3) step,
(6) determine next detector working temperature value,
(7) repeat the explorer response data of (2)-(6) step up to the high low temperature blackbody radiation source correspondence that obtains all working temperature spot.
A kind of device that is used for adaptive non-uniform correcting method for stare infrared focal plane detector comprises blackbody radiation source, infrared optical system, detector working temperature deriving means, signal pickup assembly, data storage device and data processing equipment.It is characterized in that:
Described blackbody radiation source only presets to demarcate as detector and uses.
Described data processing equipment, carry out interative computation by correction parameter matrix and obtain correction parameter, and adopt this correction parameter to carry out the Nonuniformity Correction of real image based on current goal and detector working temperature to target background temperature, detector working temperature and corresponding detector working temperature.
Concrete enforcement algorithm is as follows:
At first obtain a plurality of parameter matrixs of corresponding a plurality of temperature spots, (this matrix must be pre-stored in thermal imaging system inside before thermal imaging system dispatches from the factory):
(1) when blackbody temperature T1, the response that records each unit of detector.Gather the view data of M frame, the response of m frame ij unit is X
T1 Ijm,
X wherein
T1 Ij=∑ X
T1 Ijm/ M is the response of unit in the T1 temperature.
(2) when blackbody temperature T2, record the response X of each unit of detector
T2 Ij
(3) calculate the correction coefficient of each unit.
Under the situation of considering dynamic range, be T1 and two normal response value Y of T2 appointment
T1, Y
T2These two values can be specified arbitrarily in theory, but because the fixed point numerical representation is limited in scope, will consider the responding range of detector simultaneously, and the value of appointment will satisfy this two restrictions simultaneously.Then, calculate the correction coefficient of each unit.
Y
T1＝G
ijX
T1 ij+O
ij
Y
T2＝G
ijX
T2 ij+O
ij
Can calculate coefficient according to equation:
G
ij＝Y
T2-Y
T1/X
T2 ij-X
T1 ij
O
ij＝Y
T1-G
ijX
T1 ij
As the correction parameter matrix of corresponding T1 temperature to the T2 temperature.
Actual dispatching from the factory when calibrating got a plurality of point of fixity to a plurality of environment temperatures and carried out repetitive operation, can obtain the correction parameter array of corresponding a plurality of temperature ranges.
During thermal imaging system work, at first the detector working point is adjusted,, chosen the immediate detector running parameter table that presets the workspace correspondence basic configuration is carried out in the detector working point according to environment temperature.
Because the homogeneity parameter of detector changes along with the variation of working temperature, so the parameter that is used to proofread and correct, i.e. G thereupon
IjAnd O
IjAlso need to change thereupon.That summarizes says,
Under the T1 situation, correction parameter G is arranged
Ij T1And O
Ij T1
Under the T2 situation, correction parameter G is arranged
Ij T2And O
Ij T2
Target image is sampled and used standard Nonuniformity Correction algorithm to carry out computing, the image array I after can obtaining proofreading and correct.If Imax=MAX[I], Imin=MIN[I], Iavg=AVG[I], Imax wherein, Imin, Iavg are respectively the maximal value of image array pixel, minimum value and mean value.
The conclusion (of pressure testing) of substantially linear among a small circle under the temperature between temperature T 1 and the T2, is carried out linear interpolation to correction parameter according to homogeneity parameter and temperature change in net
Correction parameter G
Ij T=[G
Ij T1+ (G
Ij T2-G
Ij T1) (T-T1)/(T2-T1)] * [(Imax-Imin)/γ]
Correction parameter O
Ij T=[O
Ij T1+ (O
Ij T2-O
Ij T1) (T-T1)/(T2-T1)]+[δ-Iavg]
The correction parameter of inscribing during as temperature T.γ, δ are empirical constant in the formula, with system design different spans are arranged for every kind of different detector.
Consider the correlativity of sequential frame image, the parameter that can use the previous frame image to obtain is carried out the Nonuniformity Correction processing to the next frame image, and every frame all carries out the calculating of this algorithm, approaches optimization Nonuniformity Correction parameter matrix one by one.
Prove by practical application: image comparison did not adopt the image of this method that qualitative leap has been arranged originally, stable image quality has improved (5 minutes more than-＞1 hour) more than 10 times than originally, solved the problem of thermal imaging system periodic calibration, effect is especially obvious under rugged surroundings.Effectively expanded the range of application of thermal infrared imager.
Four, description of drawings
Fig. 1 is the theory diagram of the prefabricated process of correction parameter of the present invention.
Thermal imaging system Nonuniformity Correction flow process theory diagram when Fig. 2 is on-the-spot the use.
Five, embodiment
Further specify in conjunction with the accompanying drawings, as shown in Figure 1: at first, whole system is inserted in the casing of temperature control, and the blackbody equivalent temperature of blackbody radiation source can change.The infrared radiation that sends of blackbody radiation source arrives the infrared focus planardetector of staring by infrared optical system, use detector working temperature deriving means to measure the detector working temperature, use signal pickup assembly gather infrared stare focus planardetector under even blackbody radiation of the low temperature of different operating temperature spot and the even blackbody radiation of high temperature response and deposit data in data storage device, working temperature that data processing equipment obtains according to deriving means and the infrared focus planardetector response data of staring under the different temperature points, do the calculating of correction parameter and obtain correction parameter matrix under a plurality of corresponding different operating temperature, and each correction parameter matrix is deposited in the data storage device.When using at the scene, this parameter need from nonvolatile memory, access.
During on-the-spot the use, as shown in Figure 2, the infrared radiation of object scene arrives the infrared focus planardetector of staring by infrared optical system, the collection of use signal pickup assembly is infrared stares the corresponding signal of focus planardetector and gives data processing equipment with data, data processing equipment combining target average background temperature (by the detector actual acquisition to data obtain) and the working temperature that obtains of deriving means, read and carry out the correction parameter matrix that the self-adaptation correction obtains corresponding current goal being stored in correction parameter matrix in the data storage device in advance, and carry out view data behind Nonuniformity Correction and the output calibration with the original probe output data that this correction parameter matrix collects in real time to signal pickup assembly.
This method practical engineering application is in thermal infrared imager, owing to will satisfy the requirement of real-time calculating, and calculated amount and calculating strength are very big, adopt FPGA to cooperate the scheme of DSP or RISC controller to implement and finish than being easier to, in the corresponding hardware design FPGA mainly finish intensive computing and high speed input and output etc. in real time, the task of intensive; The auxiliary flow process control of finishing complex state machine of DSP or RISC, Based Intelligent Control tasks such as data flow con-trol.Whole system can be applied in most application platforms and civil equipment based on the gazing type thermal imaging system.
One embodiment of the present of invention are as follows:
Adopt the infrared thermal imagery system of 320 * 240 yuan of non-refrigeration long wave of ASi focus planardetectors, infrared optical system focal length 50mm, the relative clear aperture F of optics number=1.Data storage device comprises non-volatile memory subsystem and fast processing storage subsystem, adopts the 29GL512N of AMD and the IDT71V65603 of IDT company to realize respectively.Detector working temperature deriving means adopts the LM71 type digital temperature sensor of National Semiconductor to cooperate associated components to realize.The kernal hardware of data processing equipment is realized by inside programming by 1,000,000 FPGA XC2V10004FG456 of XILINX company, because the heterogeneity parameter adaptive adjustment during on-the-spot use the and the Nonuniformity Correction of view data have more intense real-time requirement, use this FPGA realization of programming accordingly.This device is mainly realized real-time Nonuniformity Correction algorithm and signal controlling, in order to realize the complicated algorithm of control of complete machine treatment scheme and heterogeneity preset parameter, because initialization process does not need very strong real-time, adopt the TMS5009 DSP of TI company to realize this function.
During preset parameter, whole system is inserted the environmental test high-low temperature chamber, and high-low temperature chamber inserted simultaneously in the black matrix of variable temperature, over against the system optics entrance pupil.Get-40 ℃ ,-20 ℃, 0 ℃, 20 ℃, 40 ℃, 60 ℃ six temperature spots, high-low temperature chamber is set respectively is stabilized on this temperature.With blackbody temperature each temperature spot corresponding be adjusted into temperature spot ± 8 ℃, promptly be adjusted into-48 ℃ ,-32 ℃ ,-28 ℃ ,-12 ℃ ,-8 ℃, 8 ℃, 12 ℃, 28 ℃, 32 ℃, 48 ℃, 52 ℃, 68 ℃ respectively.Control thermal imagery system is with corresponding parameter acquisition, calculation correction parameter matrix and store the non-volatile memory subsystem of corresponding temperature point into.
During real work, system works is at first measured the detector working temperature, and call suitable correction parameter matrix according to this temperature, and gather destination image data, go out suitable correction parameter matrix and carry out the Nonuniformity Correction of detector output data according to this matrix according to algorithm computation.
Test result shows, adopt this bearing calibration after, the heterogeneity of imaging system never adopts 70% of this method to be reduced to 0.5%, further calculates emulation and shows, if preset temperature o'clock can be increased to 24 by 6, heterogeneity will be reduced to 0.2%.Utilize actual acquired data to carry out analog simulation and show,, can optimize the machine system performance greatly if, the heterogeneity 0.2% of only using the reference blackbody scheme to reach can be reduced to 0.03% having this method of application on the scheme of reference blackbody.
Claims (4)
1, a kind of adaptive non-uniform correcting method for stare infrared focal plane detector is characterized in that may further comprise the steps:
(1) provide a series of blackbody equivalent temperatures different even blackbody radiation sources, temperature range covers whole temperature range,
(2) change detector working temperature and measure current detector working temperature,
(3) gather the response of detector, and will store in all data that collect input data storage devices the high low temperature blackbody radiation source under a series of different temperature points,
(4) do the calculating of correction parameter according to the explorer response data under working temperature and a series of different temperature points and obtain correction parameter matrix under a plurality of corresponding different operating temperature, and each correction parameter matrix is stored,
(5) during on-the-spot the use,, corresponding correction parameter matrix read carries out the correction parameter that the self-adaptation correction obtains corresponding current goal according to target average background temperature and detector working temperature,
(6) data processing equipment carries out data behind Nonuniformity Correction and the output calibration.
2, adaptive non-uniform correcting method for stare infrared focal plane detector according to claim 1 is characterized in that, described a series of different even blackbody radiation sources are:
(1) determine minimum operating temperature as the initial working temperature point that presets,
(2) increase working temperature according to a fixed step size and determine that up to maximum operating temperature other preset the working temperature point,
(3) working temperature of determining according to above two steps that respectively presets increases and reduces by a fixed temperature value and preset the high temperature blackbody equivalent temperature and the low temperature blackbody equivalent temperature of working temperature point as this.
3, adaptive non-uniform correcting method for stare infrared focal plane detector according to claim 1 and 2 is characterized in that, the collection detector is meant the response and the storage of the high low temperature blackbody radiation source under a series of different temperature points:
(1) determine the initial working temperature of detector,
(2) determine low temperature blackbody equivalent temperature value and set blackbody radiation source according to working temperature,
(3) gather the response of detector, store in the data that the collect input data storage device the radiation of this blackbody radiation source that configures,
(4) determine high temperature blackbody equivalent temperature value and set blackbody radiation source according to working temperature,
(5) repeated for (3) step,
(6) determine next detector working temperature value,
(7) repeat the explorer response data of (2)-(6) step up to the high low temperature blackbody radiation source correspondence that obtains all working temperature spot.
4, a kind of device that is used for adaptive non-uniform correcting method for stare infrared focal plane detector comprises blackbody radiation source, infrared optical system, detector working temperature deriving means, signal pickup assembly, data storage device and data processing equipment,
It is characterized in that:
Described blackbody radiation source only presets demarcation usefulness as detector,
Described data processing equipment, carry out interative computation by correction parameter matrix and obtain correction parameter, and adopt this correction parameter to carry out the Nonuniformity Correction of real image based on current goal and detector working temperature to target background temperature, detector working temperature and corresponding detector working temperature.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200610010706 CN1811360A (en) | 2006-02-24 | 2006-02-24 | Adaptive non-uniform correcting method for stare infrared focal plane detector |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200610010706 CN1811360A (en) | 2006-02-24 | 2006-02-24 | Adaptive non-uniform correcting method for stare infrared focal plane detector |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN1811360A true CN1811360A (en) | 2006-08-02 |
Family
ID=36844410
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200610010706 Pending CN1811360A (en) | 2006-02-24 | 2006-02-24 | Adaptive non-uniform correcting method for stare infrared focal plane detector |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN1811360A (en) |
Cited By (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100433793C (en) * | 2007-04-19 | 2008-11-12 | 华中科技大学 | Infrared focal plane asymmetric correction method based on the motion detection guidance |
| CN101825516A (en) * | 2010-05-04 | 2010-09-08 | 电子科技大学 | Device and method for testing infrared focal plane array device |
| CN102230823A (en) * | 2011-06-20 | 2011-11-02 | 北京理工大学 | Infrared two-point non-uniform calibrating method based on frame black body field diaphragm |
| CN102305663A (en) * | 2011-08-15 | 2012-01-04 | 西北核技术研究所 | Calibration apparatus measuring mid-infrared detector responsivity with temperature change |
| CN102661799A (en) * | 2012-05-16 | 2012-09-12 | 广东电网公司珠海供电局 | Fault positioning method and system |
| CN102818636A (en) * | 2012-09-03 | 2012-12-12 | 北京理工大学 | Radiometric calibration method for low-temperature measurement of thermal infrared imager |
| CN103308178A (en) * | 2013-06-04 | 2013-09-18 | 电子科技大学 | Non-uniformity correction method for non-refrigeration infrared focal plane array |
| CN103852169A (en) * | 2014-01-17 | 2014-06-11 | 中国科学院上海技术物理研究所 | Infrared real-time test equipment based on iOS wireless receiving and sending |
| CN103940519A (en) * | 2014-04-28 | 2014-07-23 | 北京振兴计量测试研究所 | Oversized surface source black body calibration system used under vacuum and low-temperature condition |
| CN101778200B (en) * | 2010-02-08 | 2014-08-13 | 王晓年 | Nonuniform sampling-based image correction system and method |
| CN104181613A (en) * | 2014-08-13 | 2014-12-03 | 中国人民解放军理工大学 | Foundation infrared ceilometer on-site calibration method and device |
| CN104406699A (en) * | 2014-11-26 | 2015-03-11 | 浙江红相科技股份有限公司 | Infrared thermal imager based on adaptive infrared image correction algorithm |
| CN105928627A (en) * | 2016-04-08 | 2016-09-07 | 北京航天计量测试技术研究所 | Method for eliminating image reproduction non-uniformity of refrigeration type thermal imager |
| CN106197673A (en) * | 2016-06-27 | 2016-12-07 | 湖北久之洋红外系统股份有限公司 | A kind of self adaptation wide temperature range non-uniform correction method and system |
| CN107203150A (en) * | 2017-05-22 | 2017-09-26 | 西安电子科技大学 | Asymmetric correction method based on infrared semi-matter simulating system |
| CN108051797A (en) * | 2017-11-20 | 2018-05-18 | 中国航空工业集团公司洛阳电光设备研究所 | A kind of environmental suitability test system of airborne photoelectric detecting devices |
| CN108871832A (en) * | 2018-08-01 | 2018-11-23 | 北京交通大学 | A kind of infrared seeker on-line proving system free of demolition |
| CN110852976A (en) * | 2019-11-22 | 2020-02-28 | 昆明物理研究所 | Infrared image brightness unevenness correction method and computer program product |
| CN111339951A (en) * | 2020-02-26 | 2020-06-26 | 北京迈格威科技有限公司 | Body temperature measuring method, device and system |
| CN112304436A (en) * | 2020-10-23 | 2021-02-02 | 北京百度网讯科技有限公司 | Method, apparatus, electronic device, and medium for creating temperature correction model |
| CN113489907A (en) * | 2021-07-16 | 2021-10-08 | 北京富吉瑞光电科技股份有限公司 | Imaging control method and device of thermal infrared imager and infrared imaging equipment |
| CN113532664A (en) * | 2021-07-22 | 2021-10-22 | 合肥英睿系统技术有限公司 | Method, device and medium for acquiring infrared image non-uniformity correction K coefficient |
-
2006
- 2006-02-24 CN CN 200610010706 patent/CN1811360A/en active Pending
Cited By (31)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100433793C (en) * | 2007-04-19 | 2008-11-12 | 华中科技大学 | Infrared focal plane asymmetric correction method based on the motion detection guidance |
| CN101778200B (en) * | 2010-02-08 | 2014-08-13 | 王晓年 | Nonuniform sampling-based image correction system and method |
| CN101825516A (en) * | 2010-05-04 | 2010-09-08 | 电子科技大学 | Device and method for testing infrared focal plane array device |
| CN102230823A (en) * | 2011-06-20 | 2011-11-02 | 北京理工大学 | Infrared two-point non-uniform calibrating method based on frame black body field diaphragm |
| CN102230823B (en) * | 2011-06-20 | 2012-12-26 | 北京理工大学 | Infrared two-point non-uniform calibrating method based on frame black body field diaphragm |
| CN102305663A (en) * | 2011-08-15 | 2012-01-04 | 西北核技术研究所 | Calibration apparatus measuring mid-infrared detector responsivity with temperature change |
| CN102305663B (en) * | 2011-08-15 | 2013-10-30 | 西北核技术研究所 | Calibration apparatus measuring mid-infrared detector responsivity with temperature change |
| CN102661799A (en) * | 2012-05-16 | 2012-09-12 | 广东电网公司珠海供电局 | Fault positioning method and system |
| CN102818636A (en) * | 2012-09-03 | 2012-12-12 | 北京理工大学 | Radiometric calibration method for low-temperature measurement of thermal infrared imager |
| CN102818636B (en) * | 2012-09-03 | 2017-11-28 | 北京理工大学 | A kind of Calibration Method of thermal infrared imager low temperature thermometric |
| CN103308178B (en) * | 2013-06-04 | 2016-02-03 | 电子科技大学 | A kind of asymmetric correction method of un-cooled infrared focal plane array |
| CN103308178A (en) * | 2013-06-04 | 2013-09-18 | 电子科技大学 | Non-uniformity correction method for non-refrigeration infrared focal plane array |
| CN103852169A (en) * | 2014-01-17 | 2014-06-11 | 中国科学院上海技术物理研究所 | Infrared real-time test equipment based on iOS wireless receiving and sending |
| CN103940519A (en) * | 2014-04-28 | 2014-07-23 | 北京振兴计量测试研究所 | Oversized surface source black body calibration system used under vacuum and low-temperature condition |
| CN104181613A (en) * | 2014-08-13 | 2014-12-03 | 中国人民解放军理工大学 | Foundation infrared ceilometer on-site calibration method and device |
| CN104181613B (en) * | 2014-08-13 | 2017-02-15 | 中国人民解放军理工大学 | Foundation infrared ceilometer on-site calibration method |
| CN104406699A (en) * | 2014-11-26 | 2015-03-11 | 浙江红相科技股份有限公司 | Infrared thermal imager based on adaptive infrared image correction algorithm |
| CN105928627A (en) * | 2016-04-08 | 2016-09-07 | 北京航天计量测试技术研究所 | Method for eliminating image reproduction non-uniformity of refrigeration type thermal imager |
| CN105928627B (en) * | 2016-04-08 | 2019-01-08 | 北京航天计量测试技术研究所 | A kind of heteropical method of elimination refrigeration mode thermal imaging system picture reproduction |
| CN106197673B (en) * | 2016-06-27 | 2019-07-23 | 湖北久之洋红外系统股份有限公司 | A kind of adaptive wide temperature range non-uniform correction method and system |
| CN106197673A (en) * | 2016-06-27 | 2016-12-07 | 湖北久之洋红外系统股份有限公司 | A kind of self adaptation wide temperature range non-uniform correction method and system |
| CN107203150A (en) * | 2017-05-22 | 2017-09-26 | 西安电子科技大学 | Asymmetric correction method based on infrared semi-matter simulating system |
| CN108051797A (en) * | 2017-11-20 | 2018-05-18 | 中国航空工业集团公司洛阳电光设备研究所 | A kind of environmental suitability test system of airborne photoelectric detecting devices |
| CN108871832A (en) * | 2018-08-01 | 2018-11-23 | 北京交通大学 | A kind of infrared seeker on-line proving system free of demolition |
| CN108871832B (en) * | 2018-08-01 | 2019-10-18 | 北京交通大学 | A kind of infrared seeker on-line proving system free of demolition |
| CN110852976A (en) * | 2019-11-22 | 2020-02-28 | 昆明物理研究所 | Infrared image brightness unevenness correction method and computer program product |
| CN110852976B (en) * | 2019-11-22 | 2023-04-18 | 昆明物理研究所 | Infrared image brightness unevenness correction method and computer program product |
| CN111339951A (en) * | 2020-02-26 | 2020-06-26 | 北京迈格威科技有限公司 | Body temperature measuring method, device and system |
| CN112304436A (en) * | 2020-10-23 | 2021-02-02 | 北京百度网讯科技有限公司 | Method, apparatus, electronic device, and medium for creating temperature correction model |
| CN113489907A (en) * | 2021-07-16 | 2021-10-08 | 北京富吉瑞光电科技股份有限公司 | Imaging control method and device of thermal infrared imager and infrared imaging equipment |
| CN113532664A (en) * | 2021-07-22 | 2021-10-22 | 合肥英睿系统技术有限公司 | Method, device and medium for acquiring infrared image non-uniformity correction K coefficient |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN1811360A (en) | Adaptive non-uniform correcting method for stare infrared focal plane detector | |
| US7016550B2 (en) | Scene-based non-uniformity offset correction for staring arrays | |
| DE60202549T2 (en) | Scene-dependent correction of the unevenness of detector arrangements | |
| CN101292519B (en) | Dark corner eliminating method and system in digital image | |
| US20110187859A1 (en) | Monitoring and camera system and method | |
| US20080088719A1 (en) | Digital camera with non-uniform image resolution | |
| CN1917590A (en) | Method for fixed pattern noise reduction in infrared imaging cameras | |
| CN1402551A (en) | Apparatus and method for automatically tracking mobile object | |
| JP2010503279A (en) | System and method for non-uniformity compensation of focal plane array | |
| CN102625059A (en) | Dynamic range extension for CMOS image sensors for mobile applications | |
| CN1604619A (en) | Black level correction circuit and method for imaging apparatus using solid imaging element | |
| CN102740008A (en) | Method for correcting nonuniformity of space camera on-orbit radiation response | |
| CN1527590A (en) | Shading correcting method and apparatus, and digital camera | |
| EP1303978A2 (en) | Dynamic range compression method | |
| CN114584757A (en) | Simple CCD full-well testing method | |
| WO2020042189A1 (en) | Pixel unit, image sensor and operation method therefor, and camera device | |
| CN1187589C (en) | Method and device used for correcting heterogeneity of detector | |
| CN1889626A (en) | Analog-to-digital converter and controlling method thereof | |
| US20190007634A1 (en) | Image sensor | |
| US20080111898A1 (en) | Driver and driving method for solid-state imaging device | |
| CN109889694B (en) | SoC parallel optimization system and method based on scene infrared image nonlinear correction | |
| CN111983710B (en) | Non-uniformity correction method for scanning type infrared search system | |
| Jones et al. | Simplified method for the hardware implementation of nonuniformity correction on a resistor-array infrared scene projector | |
| RU2817046C1 (en) | Method of compensating for geometric noise of photodetector array, which is invariant to exposure time | |
| Zhou et al. | Realized multipoint method for real-time correction of nonuniformity of uncooled IRFPA |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |