The application requires to submit in the korean patent application 10-2004-0081114 on October 11st, 2004 and submit in the interests of the korean patent application 10-2005-0071502 on August 4th, 2005 in Korea S Department of Intellectual Property, is incorporated herein by reference in full at this.
Fig. 1-5 is the sectional view according to the organic El device of embodiment of the present invention.
With reference to Fig. 1, first electrode 10 is deposited in the substrate 20, and hole injection layer 11 is deposited on first electrode 10, and emission layer 12 and second electrode 13 are deposited on the hole injection layer 11 successively.Be inserted between first electrode 10 and the hole injection layer 11 by the resilient coating 14 that forms based on carbon compound.Described hole injection layer 11 can be used based on carbon compound and mix.
With reference to Fig. 2, this organic El device comprises: be deposited on first electrode 10 in the substrate 20; Be deposited on hole injection layer 11 and hole transmission layer 16 on first electrode 10 successively; Be deposited on successively on the hole transmission layer 16 and the emission layer 12 and second electrode 13; And be inserted between hole injection layer 11 and the hole transmission layer 16 by the resilient coating 14 that forms based on carbon compound.
Organic El device shown in Figure 3 has and the identical structure of the described organic El device of Fig. 1, except hole transmission layer 16 is inserted between hole injection layer 11 and the emission layer 12.
Organic El device shown in Figure 4 comprises first electrode 10 that is deposited in the substrate 20, be deposited on successively on first electrode 10 by resilient coating 12 that forms based on carbon compound and hole transmission layer 14, and be deposited on the emission layer 12 and second electrode 13 on the hole transmission layer 14 successively.
Organic El device shown in Figure 5 has and the identical structure of the described organic El device of Fig. 3, and different is that electron transfer layer 17 and electron injecting layer 18 are formed between the emission layer 12 and second electrode 13 successively.Hole injection layer 11 and/or hole transmission layer 16 or electron transfer layer 17 can be used based on carbon compound and mix.
Organic El device according to embodiment of the present invention can also comprise hole blocking layer or the intermediate layer that is used for improving the interface layer performance, and they do not show in the drawings.
Preparation will be described below according to the method for the organic El device of embodiment of the present invention shown in Figure 5.
First electrode 10 of patterning is deposited in the substrate 20.This substrate is substrate, substrate of glass or the transparent plastic-substrates that is used for conventional organic El device, and substrate is transparent and waterproof, has smooth surface and is easy to processing.Described substrate has the thickness of 0.3-1.1mm.
Described first electrode 10 can be formed by conducting metal or its oxide, and it makes the hole be easy to be injected on first electrode 10.Described conducting metal or its oxide can for indium tin oxide (Lindium TinOxide) (ITO), indium-zinc oxide (Lindium Zinc Oxide) (IZO), nickel, platinum, gold or iridium or the like.
The substrate of gained uses the organic solvent such as isopropyl alcohol (IPA) and acetone to clean, and uses the UV/ ozone treatment then.
Resilient coating 14 is formed on first electrode 10 of the substrate after the cleaning, uses any this area method commonly used, for example, and sedimentation.What be used to form resilient coating 12 can comprise at least a following compound that is selected from based on carbon compound: fullerene, contain fullerene basigamy compound, carbon nano-tube, carbon fiber, carbon black, graphite, Cabbeen carbon, MgC60, CaC60 and the SrC60 of metal.What for example, be used to form resilient coating 12 can be fullerene based on carbon compound.
In addition, resilient coating 12 can form the thickness of 1nm-10nm with the deposition rate of 0.01-0.2nm/s under vacuum condition.Particularly, when resilient coating 12 formed the thickness of 1-5nm, deposition rate can be 0.01-0.05nm/s.When resilient coating 12 formed the thickness of 5-10nm, deposition rate can be 0.05-0.2nm/s.Resilient coating with above-mentioned deposition rate forms efficient and the life-span that has influenced organic El device, and this should be because morphologic slight change is caused.This situation can be confirmed in following embodiment and Comparative Examples.
Subsequently, hole-injecting material is by vacuum heat deposition or be spin-coated on the resilient coating 14 and form hole injection layer 11.Described hole injection layer 11 has reduced the contact resistance between first electrode 10 and the emission layer and has increased from the cavity transmission ability of first electrode, 10 past emission layers.Thereby the driving voltage of this organic El device reduces, and the life-span of this organic El device increases.
Hole injection layer 11 can have the thickness of 30-150nm.When the thickness of hole injection layer 11 was lower than 30nm, the life-span of this organic El device and reliability can reduce, and in passive matrix (passivematrix type) organic El device lack of resolution can take place, and this is undesirable.When the thickness of hole injection layer 11 during greater than 150nm, the driving voltage of device increases, and this also is undesirable.
Hole injection layer 11 can be by copper phthalocyanine (CuPc); Formation such as star burst (starburst) type amine such as TCTA, m-MTDATA, IDE406 (deriving from Idemitz.Co).Certainly, hole injection layer 11 also can be formed by other material.
[formula 3]
Hole mobile material is by vacuum heat deposition or be spin-coated on according to the method described above on the hole injection layer 11 that forms, and has formed hole transmission layer 16.Described hole mobile material can be N, N '-two (3-aminomethyl phenyl)-N, N '-diphenyl-[1, the 1-xenyl]-4,4 '-diamines (TPD), N, N '-two (naphthalene 1-yl)-N, N '-diphenylbenzidine (α-NPD), IDE320 (deriving from Idmitz Co.) or the like, but be not limited to this.The thickness of hole transmission layer 11 can be 10-40nm.When the thickness of hole transmission layer 11 is lower than 10nm, cavity transmission ability is reduced, this is undesirable.When the thickness of hole transmission layer 11 during greater than 40nm, the driving voltage of device increases, and this also is undesirable.
[formula 4]
Then, by vacuum heat deposition or spin coating, on hole transmission layer 16, form emission layer 12.
Emission layer 12 can be formed by following substances: aluminum complex, as Alq3 (three (oxine)-aluminium), BAlq, Salq and Almq3; The complex of Ga is as Gaq '
2OPiv, Gaq '
2OAc and 2 (Gaq '
2); Fluorenes; The poly (phenylenevinylene) or derivatives thereof; Biphenyl derivatives; Based on spiropolymer that gathers fluorenes or the like.
Described emission layer 12 can have the thickness of 15-60nm, is preferably 30-50nm.When emission layer 12 thickenings, the driving voltage of device increases.Thereby thickness can not be used in the organic El device greater than the emission layer 12 of 60nm.
Randomly, hole blocking layer (not showing among Fig. 5) can also be formed on the emission layer 12.This hole blocking layer forms by vacuum moulding machine hole barrier materials on emission layer 12, perhaps by forming with hole barrier materials spin coating emission layer 12.Described hole barrier materials can have electron transport ability, and its ionization potential is greater than the ionization potential of emissive material.Described hole barrier materials can for two (2-methyl-oxines)-(right-phenyl phenol)-aluminium (Balq), bathocuproine (BCP), three (N-aryl benzimidazole) (TPBI) etc., but be not limited to this.The thickness of hole blocking layer can be 3-7nm.When the thickness of hole blocking layer was lower than 3nm, the hole barrier ability can die down, and this is undesirable.When hole barrier layer thickness during greater than 7nm, the driving voltage of device increases, and this also is undesirable.
Electron transfer layer 17 forms by vacuum moulding machine electron transport material on hole blocking layer, perhaps by forming with electron transport material spin coating hole blocking layer.Described electron transport material can be Alq3, but is not limited to this.
According to embodiment of the present invention, can be inserted between anode 10 and the hole injection layer 11 by the resilient coating 14 that forms based on carbon compound.In addition, hole injection layer 11 and/or hole transmission layer 16 or electron transfer layer 17 can be used based on carbon compound and mix.
That is to say, be deposited on based on carbon compound and form resilient coating 14 between anode 10 and the hole injection layer 11; And hole injection layer 11 and/or hole transmission layer 16 or electron transfer layer 17 form by hole-injecting material, hole mobile material or electron transport material and based on the hot codeposition of the vacuum of carbon compound.Based on hole injection layer, hole transmission layer or the electron transfer layer of 100 weight portions, be the 0.005-99.95 weight portion based on the content of carbon compound.
The thickness of electron transfer layer 17 can be 15-60nm.When the thickness of electron transfer layer 17 was lower than 15nm, electron transport ability descended, and this is undesirable.When the thickness of electron transfer layer 17 during greater than 60nm, driving voltage increases, and this also is undesirable.
In addition, electron injecting layer 18 can randomly be formed on the electron transfer layer 17.Described electron injecting layer 18 can be by LiF, NaCl, CsF, Li
2Formation such as O, BaO, Liq.The thickness of electron injecting layer 18 is 0.5-2nm.When the thickness of electron injecting layer 18 was lower than 0.5nm, the electronics injectability descended, and this is undesirable.When the thickness of electron injecting layer 18 during greater than 2nm, driving voltage increases, and this also is undesirable.
Then, the cathodic metal vacuum heat deposition forms negative electrode on electron injecting layer 18, Here it is second electrode 13.As a result, organic El device is completed into.
Described cathodic metal can be Li, Mg, Al, Al-Li, Ca, Mg-In, Mg-Ag etc.
Organic El device comprises anode, hole injection layer, hole transmission layer, emission layer, electron transfer layer, electron injecting layer, negative electrode according to embodiments of the present invention, and if desired, can also comprise one or two intermediate layer.In addition, described organic El device can also comprise electronic barrier layer.
The present invention describes more specifically with reference to following embodiment.Following embodiment is used for the present invention is illustrated, but is not used in the scope of the present invention that limits.
Embodiment 1
15 Ω/cm of Corning Co will be derived from
2Substrate of glass (120nm) is cut into the size of 50mm * 50mm * 0.7mm, with ultrasonic waves for cleaning 5 minutes, with ultrasonic waves for cleaning 5 minutes, and uses UV and ozone clean 30 minutes in pure water in isopropyl alcohol.Gains are as anode.In the preparation method of organic El device, the ito glass substrate of cleaning plasma treatment 9 minutes under the pressure of 0.1 millitorr.
Buckminster fullerene (C60) is 10
-6Be deposited on the deposition rate of 0.01nm/s under the pressure of holder that to form thickness in the substrate be the resilient coating of 3nm.Then, IDE406 (deriving from Idemitz Co.) vacuum heat deposition forms the hole injection layer that thickness is 70nm on resilient coating.Then, the NPD vacuum heat deposition forms the hole transmission layer that thickness is 15nm on hole injection layer.
Subsequently, the Alq3 vacuum heat deposition that is doped with C545T forms the green emitted layer of the about 35nm of thickness on hole transmission layer.Then, be deposited on as the Alg3 of electron transport material that to form thickness on the emission layer be the electron transfer layer of 25nm.
The LiF vacuum moulding machine is deposited at the electron injecting layer that forms 1nm thickness on the electron transfer layer and Al that to form thickness on the electron injecting layer be the negative electrode of 80nm, thereby has formed the LiF/Al electrode.As a result, prepare organic El device.
Embodiment 2
15 Ω/cm of Corning Co will be derived from
2Substrate of glass (120nm) is cut into the size of 50mm * 50mm * 0.7mm, with ultrasonic waves for cleaning 5 minutes, with ultrasonic waves for cleaning 5 minutes, and uses UV and ozone clean 30 minutes in pure water in isopropyl alcohol.Gains are as anode.In the preparation method of organic El device, the ito glass substrate of cleaning plasma treatment 9 minutes under the pressure of 0.1 millitorr.
Buckminster fullerene (C60) is 10
-6Be deposited on the deposition rate of 0.05nm/s under the pressure of holder that to form thickness in the substrate be the resilient coating of 3nm.Then, NPD vacuum heat deposition thickness on resilient coating is that 15nm forms hole transmission layer.
Subsequently, the Alq3 vacuum heat deposition that is doped with C545T forms the green emitted layer of the about 35nm of thickness on hole transmission layer.Then, be deposited on as the Alg3 of electron transport material that to form thickness on the emission layer be the electron transfer layer of 25nm.
The LiF vacuum moulding machine forms the electron injecting layer of 1nm thickness on electron transfer layer, and Al is deposited on the electron injecting layer that to form thickness be the negative electrode of 80nm, thereby has formed the LiF/Al electrode.As a result, prepare organic El device.
Embodiment 3
Prepare organic El device with the method identical, except the deposition rate with 0.1nm/s is the thickness of 3nm with buffer layer deposition with embodiment 1.
Embodiment 4
Prepare organic El device with the method identical, except the deposition rate with 0.2nm/s is the thickness of 3nm with buffer layer deposition with embodiment 2.
Embodiment 5
Prepare organic El device with the method identical, except the deposition rate with 0.01nm/s is the thickness of 7nm with buffer layer deposition with embodiment 1.
Embodiment 6
Prepare organic El device with the method identical, except the deposition rate with 0.05nm/s is the thickness of 7nm with buffer layer deposition with embodiment 2.
Embodiment 7
Prepare organic El device with the method identical, except the deposition rate with 0.1nm/s is the thickness of 7nm with buffer layer deposition with embodiment 1.
Embodiment 8
Prepare organic El device with the method identical, except the deposition rate with 0.2nm/s is the thickness of 7nm with buffer layer deposition with embodiment 2.
The comparative example 1
Prepare organic El device with the method identical, except the deposition rate with 0.05nm/s is the thickness of 15nm with buffer layer deposition with embodiment 1.
The comparative example 2
Prepare organic El device with the method identical, except the deposition rate with 0.05nm/s is the thickness of 15nm with buffer layer deposition with embodiment 2.
The comparative example 3
Prepare organic El device with the method identical, except the deposition rate with 0.05nm/s is the thickness of 30nm with buffer layer deposition with embodiment 1.
The comparative example 4
Prepare organic El device with the method identical, except the deposition rate with 0.3nm/s is the thickness of 30nm with buffer layer deposition with embodiment 2.
Test embodiment 1
According to following method, driving voltage, efficient (current density) and the half-life of the organic El device of test implementation example 1-8 and comparative example 1-4 preparation, test result sees Table 1.
Brightness: use BM5A (Topcon Co.) test
Driving voltage: use the 238HIGH CURRENT SOURCEMEASURE UNIT test that derives from Keithley Co..
Current density: at 10-100mA/cm
2In the scope, when direct current (DC) with 10mA/cm
2During increase, test 9 or more point of each device.
Half-life: at DC is 50mA/cm
2Down, when the initial brightness of each organic El device be reduced to it 50% the time, measure the time that needs.Use at least three identical device to test reproducibilitys.
Table 1
| Deposition rate (nm/s) | Buffer layer thickness (nm) | Driving voltage (V) | Efficient (cd/v) | Half-life (h) |
Embodiment 1 | 0.01 | 3 | 6.3 | 14 | 1500 |
Embodiment 2 | 0.05 | 3 | 6.2 | 13 | 1500 |
Embodiment 3 | 0.1 | 3 | 6.1 | 13 | 1000 |
Embodiment 4 | 0.2 | 3 | 6.0 | 12 | 1000 |
Embodiment 5 | 0.01 | 7 | 9.2 | 17 | 1100 |
Embodiment 6 | 0.05 | 7 | 8.4 | 16 | 1000 |
Embodiment 7 | 0.1 | 7 | 6.1 | 14 | 1500 |
Embodiment 8 | 0.2 | 7 | 6.0 | 14 | 1500 |
The comparative example 1 | 0.05 | 15 | 9.4 | 14 | 900 |
The comparative example 2 | 0.05 | 25 | 10.2 | 16 | 900 |
The comparative example 3 | 0.05 | 30 | 11.0 | 15 | 900 |
The comparative example 4 | 0.3 | 30 | 10.9 | 15 | 900 |
With reference to table 1, the comparison of the organic El device of embodiment 1-8 has lower driving voltage, better luminous efficiency and longer life-span than the organic El device of embodiment 1-4 as can be seen.
Embodiment 9
The substrate of glass that will have the ITO electrode (derives from Corning Co, sheet resistance 15 Ω/cm
2, thickness is 120nm) and be cut into the size of 50mm * 50mm * 0.7mm, in isopropyl alcohol,, in pure water,, and used UV and ozone clean 30 minutes with ultrasonic waves for cleaning 5 minutes with ultrasonic waves for cleaning 5 minutes, gains are as anode.The substrate of glass that has the ITO electrode that obtains plasma treatment 9 minutes under 0.1 millitorr or lower pressure.
Buckminster fullerene vacuum heat deposition forms thickness in the substrate that plasma treatment is crossed be the resilient coating of 1nm.Subsequently, IDE406 (deriving from Idemitz Co.) vacuum heat deposition forms the hole injection layer that thickness is 70nm on resilient coating.Then, the NPD vacuum heat deposition forms the hole transmission layer that thickness is 15nm on hole injection layer.
IDE 140 (Idemitz Co.) vacuum heat deposition forms the blue emission layer that thickness is about 30nm on hole transmission layer.Then, be deposited on as the Alg3 of electron transport material that to form thickness on the emission layer be the electron transfer layer of 25nm.
The LiF vacuum moulding machine forms the electron injecting layer of 1nm thickness on electron transfer layer, and Al is deposited on the electron injecting layer that to form thickness be the negative electrode of 80nm, thereby has formed the LiF/Al electrode.As a result, prepare organic El device.
Embodiment 10-14
Prepare organic El device with the method identical, except resilient coating has 2,3.5,5,6.5 or the thickness of 8nm respectively with embodiment 9.
Embodiment 15
The substrate of glass that will have the ITO electrode (derives from Corning Co, sheet resistance 15 Ω/cm
2, thickness is 120nm) and be cut into the size of 50mm * 50mm * 0.7mm, in isopropyl alcohol,, in pure water,, and used UV and ozone clean 30 minutes with ultrasonic waves for cleaning 5 minutes with ultrasonic waves for cleaning 5 minutes, gains are as anode.The ito glass substrate that obtains plasma treatment 9 minutes under 0.1 millitorr and lower pressure.
Buckminster fullerene vacuum heat deposition forms thickness in the substrate that plasma treatment is crossed be the resilient coating of 5nm.Subsequently, IDE406 (deriving from Idemitz Co.) vacuum heat deposition forms the hole injection layer that thickness is 70nm on resilient coating.Then, the NPD vacuum heat deposition forms the hole transmission layer that thickness is 15nm on hole injection layer.
C545T and Alq3 codeposition form the green emitted layer of the about 35nm of thickness on hole transmission layer, then, be deposited on as the Alq3 of electron transport material that to form thickness on the green emitted layer be the electron transfer layer of 25nm.
The LiF vacuum moulding machine forms the electron injecting layer of 1nm thickness on electron transfer layer, and Al is deposited on the electron injecting layer that to form thickness be the negative electrode of 100nm, thereby has formed the LiF/Al electrode.As a result, prepare organic El device.
Embodiment 16 and 17
Prepare organic El device according to embodiment 15 identical methods, except resilient coating has 6.5 and the thickness of 8nm respectively.
Embodiment 18
The substrate of glass that will have the ITO electrode (derives from Corning Co, sheet resistance 15 Ω/cm
2, thickness is 120nm) and be cut into the size of 50mm * 50mm * 0.7mm, in isopropyl alcohol,, in pure water,, and used UV and ozone clean 30 minutes with ultrasonic waves for cleaning 5 minutes with ultrasonic waves for cleaning 5 minutes.Gains are as anode.The ito glass substrate that obtains plasma treatment 9 minutes under 0.1 millitorr and lower pressure.
Buckminster fullerene vacuum heat deposition forms thickness in the substrate that plasma treatment is crossed be the resilient coating of 5nm.Subsequently, IDE406 (deriving from Idemitz Co.) vacuum heat deposition forms the hole injection layer that thickness is 70nm on resilient coating.Then, the NPD vacuum heat deposition forms the hole transmission layer that thickness is 15nm on hole injection layer.
DCJTB and Alq3 codeposition form the red emission layer of the about 35nm of thickness on hole transmission layer.Then, be deposited on as the Alq3 of electron transport material that to form thickness on the red emission layer be the electron transfer layer of 25nm.
LiF vacuum moulding machine 1nm thickness on electron transfer layer forms electron injecting layer, and Al is deposited on that thickness is that 100nm forms negative electrode on the electron injecting layer, thereby has formed the LiF/Al electrode.As a result, prepare organic El device.
Embodiment 19 and 20
Prepare organic El device with the method identical, except resilient coating has 6.5 and the thickness of 8nm respectively with embodiment 15.
The comparative example 5
Prepare organic El device with the method identical, except not forming resilient coating with embodiment 9.
The comparative example 6
Prepare organic El device with the method identical, except not forming resilient coating with embodiment 15.
The comparative example 7
Prepare organic El device with the method identical, except not forming resilient coating with embodiment 18.
Mensuration is according to driving voltage, efficient and the half-life of the organic El device of embodiment 9-14 and comparative example's 5 preparations.The results are shown in shown in the following table 2.
1) initial characteristic
Use BM5A (deriving from Topcon Co.) test brightness, and use 238HIGH CURRENTSOURCE MEASURE UNIT (deriving from Keithley) test driving voltage.Be applied to direct current on the equipment (DC) density at 10-100mA/cm
2Scope in, and with 10mA/cm
2Increase.Each equipment is tested 9 points at least.The reproducibility test is more than 9 times, and the deviation of initial characteristic is 5% or littler.
2) half-life
At DC is 50mA/cm
2Obtain the half-life by the time of measuring initial luminance loss to 50% down.Measure the reproducibility in the life-span of at least three devices with same structure.
Table 2
| The comparative example 5 | Embodiment 9 | Embodiment 10 | Embodiment 11 | Embodiment 12 | Embodiment 13 | Embodiment 14 |
Buffer layer thickness (nm) | 0 | 10 | 20 | 35 | 50 | 65 | 80 |
Driving voltage (V) | 9.06 | 7.76 | 7.39 | 7.22 | 7.13 | 6.99 | 6.9 |
Efficient (cd/A) | 10.48 | 9.64 | 9.48 | 9.56 | 9.93 | 9.56 | 9.61 |
Half-life (h) | 600 | 800 | 750 | 750 | 850 | 940 | 800 |
With reference to table 2, although as can be seen according to the efficient of the organic El device of embodiment 9-14 with according to comparative example 5 organic El device much at one, but according to the driving voltage of the organic El device of embodiment 9-14 is about 80% according to the driving voltage of comparative example 5 organic El device, and according to the life-span beguine of the organic El device of the embodiment 9-14 life-span long 50% according to comparative example 6 organic El device.
Measurement is according to driving voltage, efficient and the half-life of embodiment 15-17 and comparative example's 6 organic El device.The results are shown in Table 3.
Table 3
| The comparative example 6 | Embodiment 15 | Embodiment 16 | Embodiment 17 |
Buffer layer thickness (nm) | 0 | 50 | 65 | 80 |
Driving voltage (V) | 9.6 | 7.6 | 7.52 | 7.61 |
Efficient (cd/A) | 23.66 | 21.59 | 21.95 | 22.06 |
Half-life (h) | 650 | 750 | 820 | 720 |
With reference to table 3, although according to the organic El device of embodiment 15-17 with according to the efficient of comparative example 6 organic El device much at one, but according to the driving voltage of the organic El device of embodiment 15-17 is about 80% according to the driving voltage of comparative example 6 organic El device, and according to life-span of the organic El device of embodiment 15-17 be according to 25% of life-span of comparative example 6 organic El device.
Measurement is according to driving voltage, efficient and the half-life of embodiment 18-20 and comparative example's 7 organic El device.The results are shown in Table 4.
Table 4
| The comparative example 7 | Embodiment 18 | Embodiment 19 | Embodiment 20 |
Buffer layer thickness (nm) | 0 | 50 | 65 | 80 |
Driving voltage (V) | 7.61 | 5.78 | 5.72 | 5.77 |
Efficient (cd/A) | 5.62 | 5.16 | 5.65 | 4.98 |
Half-life (h) | 1500 | 1800 | 1800 | 1500 |
With reference to table 4, although according to the organic El device of embodiment 18-20 with according to the efficient of comparative example 7 organic El device much at one, but according to the driving voltage of the organic El device of embodiment 18-20 is about 80% according to the driving voltage of comparative example 7 organic El device, and according to the life-span beguine of the organic El device of the embodiment 18-20 life-span long 20% according to comparative example 7 organic El device.
In order to obtain bigger driving voltage and longer life-span, comprise by based on carbon compound according to the organic El device of embodiment of the present invention, form as fullerene, be inserted in the resilient coating between first electrode and the emission layer.In addition, the thickness of the deposition rate control resilient coating by using resilient coating, efficient and the life-span that can further improve described organic El device.
Especially, in order to increase driving voltage and to increase the life-span and do not change blueness, green and red color coordinates, organic El device according to embodiment of the present invention comprises: i) by based on carbon compound, as the resilient coating that fullerene etc. forms, it is inserted between first electrode and the hole injection layer, between hole injection layer and the hole transmission layer and/or between first electrode layer and hole transmission layer; Ii) be inserted between first electrode and the hole injection layer, between first electrode and the hole transmission layer and/or the resilient coating between hole injection layer and hole transmission layer, wherein hole injection layer and/or hole transmission layer are used based on carbon compound and are mixed; Iii) be doped with electron transfer layer based on carbon compound; Perhaps iv) be inserted between first electrode and the hole injection layer, between first electrode and the hole transmission layer and/or the resilient coating between hole injection layer and hole transmission layer, wherein electron transfer layer is used based on carbon compound and is mixed.
Although the present invention has carried out special demonstration and description with reference to specific embodiment, but those skilled in the art can understand in not deviating from the scope that the present invention spirit and following claim stipulate, can make change on various forms and the details to the present invention.