CN1712971A - Realizing method device for universal converter of special tester for circuit board - Google Patents

Realizing method device for universal converter of special tester for circuit board Download PDF

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Publication number
CN1712971A
CN1712971A CN 200510035973 CN200510035973A CN1712971A CN 1712971 A CN1712971 A CN 1712971A CN 200510035973 CN200510035973 CN 200510035973 CN 200510035973 A CN200510035973 A CN 200510035973A CN 1712971 A CN1712971 A CN 1712971A
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China
Prior art keywords
probe
circuit board
connecting line
flexible member
universal adapter
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Pending
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CN 200510035973
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Chinese (zh)
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陈涛
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Individual
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Individual
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Priority to CN 200510035973 priority Critical patent/CN1712971A/en
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Abstract

A universal adapter of tester specially for testing circuit board consists of connecting wire, adapting disc and elastic elements. Its preparing method includes setting elastic elements in plug holes of adapting disc in intervals uniformly, setting elastic cloth with lead wire plate und adapting disc, setting probe on lead wire plate with its tail part connected with connecting wire and its head contacted with elastic element, connecting connection wire to pin of horn socket.

Description

A kind of universal adapter implementation method and device of special tester for circuit board
Technical field the present invention relates to the parts of surveying instrument, and particularly special tester for circuit board comprises the measuring mechanism of measuring probe part, relates in particular to and the contacted breakout box of measuring probe.
Background technology usually, circuit board must have or not open circuit or short circuit through the circuit that test can be learnt before welding electronic part, the method of testing that is adopted between industry is with a circuit board tester at present, draw the array line in test machine, every line all is transferred to a probe on measurement jig.Measurement jig is the device that tested point is equipped with probe one to one on and the wiring board, the tested point of probe contact wiring board, and signal is just received by probe and connecting line and is carried out test analysis in the test machine like this.
Existing circuit board tester mainly contains two types, and a kind of is special tester, and a kind of is the general-purpose test machine.Special tester is a kind of old-fashioned relatively test machine, and the history of more than ten years is arranged at home, is the mainstream model in the industry.The general-purpose test machine is just to enter into domestic test machine after 2000, the relative special machine advanced person of technology, but because its fetch long price, the popularity rate in market is not very high.
Special tester can carry out the wiring board test in conjunction with special test tool and combined type measurement jig.
The general-purpose test machine uses in conjunction with the general-purpose measurement jig.
The signal converting of special test tool partly is the measurement jig of testing with the chovr body of a spring probe and a sleeve pipe composition, and sleeve pipe is embedded in several holes on the insulcrete of combining, and the point on hole on the insulcrete and the board under test is corresponding one by one.Spring probe is encased in the sleeve pipe, and the syringe needle of test probe just can contact with each point to be tested when test like this.Bottom of receiving sleeve pipe of connecting line, the other end is connected in the test machine by ox horn edge connector and winding displacement.The advantage of special test tool is simple in structure, but since the inner structure complexity of probe own, the probe cost costliness of small dimension.Only be fit to the two-sided measurement jig of pulling of some lists simple in structure.
The combined type measurement jig is that grew up in nearly 2 years a kind of is equipped with the novel test tool that the drum of flexible member is formed by the dials that the combined type probe is housed and one.The combined type measurement jig is because the probe structure that uses is simple, with low cost, and probe can accomplish very tinyly, thereby the relative special test tool of power of test improves a lot, and the relative special test tool of the cost of this tool has bigger reduction simultaneously.But the structure relative complex of compound tool, Production Time is also long, and its maximum defective is that every cover tool is at every circuit board making, and dials, drum, OK line, ox horn socket can not be reused, and cause waste.
Summary of the invention the objective of the invention is to avoid the deficiencies in the prior art, and proposes a kind of implementation method and device of special tester for circuit board universal adapter.Jack on the transfer panel of the present invention is not to be drilled with at each contact for the treatment of independent circuit board under test, is drilled with but evenly embark on journey into row according to various normal pitches on transfer panel, uses which jack, just above that jack probe is set; Simultaneously, also taked between connecting line and the flexible member to guarantee reliably to contact, structural measure for convenience detach, make breakout box of the present invention can be applied to any circuit board, only need to make the dials of a correspondence when making tool, thereby provide cost savings greatly at different wiring boards.
The present invention realizes by following technical scheme:
Implement the universal adapter implementation method of special tester for circuit board, based on probe, connecting line, ox horn socket, transfer panel, lead plate and flexible member, described method comprises the steps:
A. described flexible member spacing is embarked on journey into column distribution equably among the jack of transfer panel;
B., elastical cloth is set under transfer panel, lead plate is set below the elastical cloth;
C. on the lead plate corresponding to board under test on the test point part open probe hole;
D., probe is set, and the afterbody of probe is connected with connecting line, and connecting line is connected with the ox horn socket, and probe is passed probe hole, passes elastical cloth again, and the head of probe is contacted with flexible member;
E. elastical cloth is stuck in the stria or the thin axle place of probe, and probe can not be return voluntarily, keeps contacting with the good of flexible member;
F. after the end of test (EOT), elastical cloth is taken off from lead plate, probe withdraws from from probe hole easily in order to reusing.
The jacking block that well contacts at the head setting of the described flexible member of step a and general-purpose probe.
The a kind of of following two kinds of processing modes selected at middle part at probe:
A. process stria at the middle part of probe along circumference;
B. the bottom that will pop one's head in and the connecting line part of joining forms thin axle.
The external diameter of probe is slightly less than the aperture of probe hole, and probe promptly can pass probe hole swimmingly like this, again can be well secured in lead plate.
The present invention can also further obtain implementing by following technical scheme:
Manufacture and design a kind of device of universal adapter of special tester for circuit board, comprise probe, connecting line, ox horn socket and flexible member, especially also comprise transfer panel, described flexible member is embarked on journey into column distribution in jack equably in spacing on the transfer panel.
Leaded plate below the flexible cloth under the transfer panel, elastical cloth.
Probe hole is arranged on lead plate.
Described universal adapter also comprises probe, and the afterbody of described probe is connected with connecting line, and connecting line is connected with the ox horn socket, and probe is passed probe hole on the lead plate, passes elastical cloth again, and the head of probe is contacted with flexible member.
After making probe pass elastical cloth, can not deviate from, there is stria at middle part at probe along circumference, elastical cloth is stuck on the stria, Tan Tou external diameter is slightly less than the aperture of probe hole simultaneously, probe promptly can pass probe hole swimmingly like this, again can be well secured in lead plate, the stationkeeping of final assurance probe is constant.
Can not deviate from after also having a kind of way can make probe pass elastical cloth, promptly form thin axle in the bottom and the connecting line joint of probe, elastical cloth is stuck on the thin axle, can guarantee that also the stationkeeping of popping one's head in is constant.
Compared with prior art, the present invention evenly embarks on journey into row according to the various normal pitches of wiring board test and is drilled with jack on transfer panel, use which jack, just above that jack probe is set; Simultaneously, also taked between connecting line and the flexible member to guarantee reliably to contact, structural measure for convenience detach, make breakout box of the present invention when cooperating different test dials, can repeated application in different circuit board testings, thereby saved the wiring board manufacturing cost greatly.
Description of drawings Fig. 1, Fig. 2 are the synoptic diagram of prior art special test tool medi-spring probe and sleeve pipe;
Fig. 3 is the application synoptic diagram of prior art special test tool;
Fig. 4 is a general-purpose probe synoptic diagram;
Fig. 5 is the synoptic diagram of the tool in the prior art general-purpose test machine;
Fig. 6 is that the composite test tool is used synoptic diagram;
Fig. 7 is the synoptic diagram of transfer panel in the composite test tool;
Fig. 8 is the synoptic diagram that comprises that general-purpose measurement jig of the present invention is used;
Fig. 9 is the synoptic diagram of general-purpose transfer panel in the general-purpose measurement jig of the present invention;
Figure 10 is the synoptic diagram during lead plate in the general-purpose measurement jig of the present invention, elastical cloth and probe are used;
Figure 11 is that lead plate, elastical cloth and probe are provided with synoptic diagram in the general-purpose measurement jig of the present invention;
Figure 12, Figure 13 are probe shape synoptic diagram in the general-purpose measurement jig of the present invention;
Figure 14-1~Figure 14-the 7th, the synoptic diagram in probe stria cross section.
Embodiment is further described in detail the present invention below in conjunction with accompanying drawing and most preferred embodiment.
Shown in Fig. 1~3: the signal converting of special-purpose measurement jig partly is the measurement jig of testing with the chovr body of spring probe 11 and sleeve pipe 12 compositions in the prior art, sleeve pipe 12 is embedded in several holes on the insulcrete of combining 13, and the point on hole on the insulcrete 13 and the board under test is corresponding one by one.Spring probe 11 is encased in the sleeve pipe 12, and syringe needle just can contact with each point to be tested when test like this.14 1 bottoms of receiving sleeve pipe 12 of connecting line, the other end is connected in the special tester 200 by ox horn socket 17, winding displacement 18.The advantage of special test tool is simple in structure, but because the inner structure complexity of probe own, the probe cost costliness of small dimension only is fit to the measurement jig that the two-sided circuit of some lists simple in structure is pulled.
As shown in Figure 4, general-purpose probe 16 length thickness differences, form is all roughly the same.
As shown in Figure 5, the tool in the general-purpose test machine of prior art cooperates its special switching device to use in addition.
Shown in Fig. 6,7, the combined type measurement jig be immediate development get up a kind of by the dials 30 that combined type probe 16.1,16.2 is housed and the transfer panel 50 that flexible member 40 is housed, the novel test tool of composition.The composite test tool is because the probe structure that uses is simple, with low cost, and probe can accomplish very tinyly, thereby the relative special test tool of power of test all improves a lot, and the relative special test tool of cost of composite test tool has bigger reduction simultaneously.
Probe on the composite test tool dials 30 and the test point 101 on the test plate (panel) to be measured 100 are corresponding one by one, the probe tail end again with compound transfer panel 50 on flexible member 40 corresponding one by one, the probe 16 of combined tester much tilts, can the corresponding point on the drum 30 be drawn back a little of the inclination of very close test point like this by probe.Can reduce the boring difficulty of compound transfer panel 50 like this, when software spills pin in processing, come the compound transfer panel 50 of a virtual densely covered aperture earlier according to the hole density (quad density or octuple density) of compound transfer panel 50.When software processes was spilt pin, each pin must have a unique aperture corresponding with it.The compound transfer panel 50 of existing composite test tool all is to have the aperture of probe 16 correspondences to select, and only gets out these useful holes when manufacturing compound transfer panel 50.As shown in Figure 7: each dials 30 is all than the corresponding unique compound transfer panel 50 of palpus like this, and the compound transfer panel 50 of each measurement jig all will carry out threading, routing, the work of lock ox horn, these work are to manufacture the most time consuming operation in the tool link.
Shown in Fig. 8,9, implement the universal adapter implementation method of special tester for circuit board of the present invention, preferred forms is based on connecting line 14, transfer panel 60 and flexible member 40, and described method comprises the steps:
A. described flexible member 40 spacings are embarked on journey into column distribution equably among the jack 41 of transfer panel 60;
B., elastical cloth 70 is set under transfer panel 60, lead plate 80 is set below the elastical cloth 70;
Shown in Figure 10,11,
C. at the probe hole 81 that bores test point on the corresponding board under test on the lead plate 80;
D., probe 90 is set, and probe 90 afterbody is connected with connecting line 14, and connecting line 14 is connected with ox horn socket 17, will pop one's head in 90 to pass probe hole 81, passes elastical cloth 70 again, and 90 the head of popping one's head in is contacted with flexible member 40;
E. elastical cloth 70 is stuck in the stria 94 or thin axle 95 places of probe 90, and probe 90 can not be return voluntarily, keeps contacting with the good of flexible member 40;
F. after the end of test (EOT), elastical cloth 70 is taken off from lead plate 80, probe 90 withdraws from from probe hole 81 easily in order to reusing.
The a kind of of following two kinds of processing modes selected at middle part at the described probe 90 of steps d:
Shown in Figure 12, Fig. 13:
A. process stria 94 at the middle part of probe 90 along circumference;
B. will pop one's head in 90 bottom and connecting line 14 joints form thin axle 95.
Probe 90 external diameter is slightly less than the aperture of probe hole 81, pops one's head in like this 90 promptly can pass probe hole 81 swimmingly, again can be well secured in lead plate 80.
Shown in Figure 14-1~Figure 14-7: described stria 94 has multiple cross sectional shape, comprises square, rectangle, semicircle, V font, U font, trapezoidal, inclined ladder shape.The best is square, rectangle.
The present invention can also further obtain implementing by following technical scheme:
Shown in Fig. 8,9: the device that manufactures and designs the universal adapter of special tester for circuit board, comprise probe 90, connecting line 14, ox horn socket 17 and flexible member 40, especially also comprise transfer panel 60, described flexible member 40 is embarked on journey into column distribution among jack 41 equably in spacing on the transfer panel 60.
Leaded plate 80 below the flexible cloth 70 under the transfer panel 60, elastical cloth 70.
Base 85 is used for supporting universal adapter.
Probe hole 81 is arranged on lead plate 80.
Shown in Figure 10,11, the present invention also comprises probe 90, and the afterbody of described probe 90 is connected with connecting line 14, connecting line 14 is connected with ox horn socket 17, with probe 90 probe holes 81 that pass on the lead plate 80, pass elastical cloth 70 again, the head of probe 90 is contacted with flexible member 40.
As shown in figure 13, after making probe 90 pass elastical cloth 70, can not deviate from, there is stria 94 at middle part at probe 90 along circumference, elastical cloth 70 is stuck on the stria 94,90 the external diameter of popping one's head in simultaneously is slightly less than the aperture of probe hole 81, probe 90 promptly can pass probe hole 81 swimmingly like this, again can be well secured in lead plate 80, and the final stationkeeping of probe 90 that keeps is constant.
Also have a kind of way that probe 90 can not deviate from after passing elastical cloth 70,90 the bottom of promptly popping one's head in forms thin axle 95 with connecting line 14 joints, and elastical cloth 70 is stuck on thin 95, and 90 the stationkeeping of also can keeping popping one's head in is constant.
Because slightly more greatly, probe 90 is when being pressed down than the external diameter of probe 90 for the probe hole 81 of lead plate 80, the fit structure of elastical cloth 70 and stria 94 or thin axle 95 just can not drop probe 90 from lead plate 80.Simultaneously take off lead plate 80 a dials 30 uses after, elastical cloth 70 is taken off from lead wire tray 80, elastical cloth 70 and lead wire tray 80 are separated, popping one's head in like this 90 just is easy to take off from elastical cloth 70 and lead plate 80.
Described stria 94 has multiple cross sectional shape, comprises square, rectangle, semicircle, V font, U font, trapezoidal, inclined ladder shape.The best is square, rectangle.
As shown in Figure 9, the present invention is with these the virtual hole all drilled holes on the general-purpose transfer panel 60, and the probe 16 on any dials 30 all has a unique hole corresponding with it on general-purpose transfer panel 60.The dials 30 of every like this cover tool can shared same general-purpose transfer panel 60, simultaneously, use general-purpose transfer panel 60 of the present invention and probe of the present invention 90 can save a lot of production times, resemble connecting line 14 simultaneously, ox horn socket 17 these consumables can become parts that are fixed in special tester 200 after using the present invention, each measurement jig can shared same set of connecting line 14 and ox horn socket 17.
General-purpose transfer panel 60 has upper cover plate 61 and lower cover 62 and pilot hole 63.
Leaded dish pilot hole 83 on the lead wire tray 80.
Connect bases 85 below the general-purpose transfer panel 60, a plurality of ox horn socket 17 is disposed thereon.Connect dials 30 above the general-purpose transfer panel 60, general-purpose probe 16 tail ends in the dials 30 contact with flexible member 40, and the top contacts with the test point 101 of wiring board 100 to be measured, the break-make of special tester 200 by going between on the loop detection line plate one by one.
Facts have proved that the jack on the universal adapter of the present invention is not that each pin of corresponding circuit board under test is drilled with, and is drilled with but evenly embark on journey into row according to various normal pitches on transfer panel, uses which jack, just above that jack probe is set; Simultaneously, also taked between connecting line and the flexible member to guarantee reliably to contact, structural measure for convenience detach, make universal adapter of the present invention can be applied to any circuit board, connecting line and ox horn socket can use repeatedly, thereby saved testing cost greatly and shortened Production Time of whole tool greatly.

Claims (10)

1. the universal adapter implementation method of a special tester for circuit board based on probe (90), connecting line (14), ox horn socket (17), transfer panel (60), lead plate (80) and flexible member (40), is characterized in that described method comprises the steps:
A. described flexible member (40) spacing is embarked on journey into column distribution equably among the jack (41) of transfer panel (60);
B., elastical cloth (70) is set under transfer panel (60), lead plate (80) is set below the elastical cloth (70);
C. probe hole (81) is opened in test point (101) corresponding position on lead plate (80) and on the board under test (100);
D., probe (90) is set, and the afterbody of probe (90) is connected with connecting line (14), and connecting line (14) is connected with ox horn socket (17); To pop one's head in (90) pass probe hole (81), pass elastical cloth (70) again, the head of probe (90) is contacted with flexible member (40);
E. elastical cloth (70) stria (94) or the thin axle (95) that are stuck in probe (90) located, and probe (90) can not be return voluntarily, the good contact of maintenance and flexible member (40);
F. after the end of test (EOT), elastical cloth (70) is taken off from lead plate (80), probe (90) withdraws from from probe hole (81) in order to reusing.
2. the universal adapter implementation method of a kind of special tester for circuit board according to claim 1 is characterized in that: a kind of of following two kinds of processing modes selected at the middle part at probe (90):
A. process stria (94) at the middle part of probe (90) along circumference;
B. form thin axle (95) in the bottom and connecting line (14) joint of probe (90).
3. the universal adapter implementation method of a kind of special tester for circuit board according to claim 1 is characterized in that: the external diameter of probe (90) is slightly less than the aperture of probe hole (81).
4. the device of the universal adapter of a special tester for circuit board, comprise probe (90), connecting line (14), ox horn socket (17) and flexible member (40), it is characterized in that: also comprise transfer panel (60), described flexible member (40) is gone up spacing at transfer panel (60) and is embarked on journey into column distribution equably.
5. the device of the universal adapter of a kind of special tester for circuit board according to claim 4 is characterized in that: leaded plate (80) below the flexible cloth (70) under the transfer panel (60), elastical cloth (70).
6. the device of the universal adapter of a kind of special tester for circuit board according to claim 5 is characterized in that: probe hole (81) is arranged on lead plate (80).
7. the device of the universal adapter of a kind of special tester for circuit board according to claim 4, it is characterized in that: also comprise probe (90), the afterbody of described probe (90) is connected with connecting line (14), and connecting line (14) is connected with ox horn socket (17); Probe (90) passes the probe hole (81) on the lead plate (80), passes elastical cloth (70) again, and the head of probe (90) is contacted with flexible member (40); Elastical cloth (70) is stuck in the stria (94) or the thin axle (95) of probe (90) and locates, probe (90) can not be return voluntarily, keep good the contact with flexible member (40), after the end of test (EOT), elastical cloth (70) is taken off from lead plate (80), and probe (90) withdraws from from probe hole (81) in order to reusing.
8. the device of the universal adapter of a kind of special tester for circuit board according to claim 7 is characterized in that: there is stria (94) at the middle part of probe (90) along circumference.
9. the device of the universal adapter of a kind of special tester for circuit board according to claim 7 is characterized in that: the bottom of probe (90) forms thin (95) with connecting line (14) joint.
10. the device of the universal adapter of a kind of special tester for circuit board according to claim 4 is characterized in that: the external diameter of probe (90) is slightly less than the aperture of probe hole (81).
CN 200510035973 2005-07-12 2005-07-12 Realizing method device for universal converter of special tester for circuit board Pending CN1712971A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 200510035973 CN1712971A (en) 2005-07-12 2005-07-12 Realizing method device for universal converter of special tester for circuit board

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Application Number Priority Date Filing Date Title
CN 200510035973 CN1712971A (en) 2005-07-12 2005-07-12 Realizing method device for universal converter of special tester for circuit board

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CN1712971A true CN1712971A (en) 2005-12-28

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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101408582B (en) * 2008-11-24 2011-07-20 浙江中控技术股份有限公司 Method and apparatus for testing circuit board
CN104375076A (en) * 2014-11-12 2015-02-25 中国人民解放军第五三一一工厂 Circuit module measurement switching device
CN105572569A (en) * 2016-02-29 2016-05-11 广德三生科技有限公司 Automatic PCB detection device
CN106771966A (en) * 2016-12-02 2017-05-31 上海无线电设备研究所 Circuit board flexibility device for quick testing under a kind of complex environment
CN109326905A (en) * 2017-11-28 2019-02-12 苏州欧肯葵电子有限公司 A kind of adapting system of automotive test

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101408582B (en) * 2008-11-24 2011-07-20 浙江中控技术股份有限公司 Method and apparatus for testing circuit board
CN104375076A (en) * 2014-11-12 2015-02-25 中国人民解放军第五三一一工厂 Circuit module measurement switching device
CN104375076B (en) * 2014-11-12 2018-09-04 中国人民解放军第五三一一工厂 A kind of circuit module measurement switching device
CN105572569A (en) * 2016-02-29 2016-05-11 广德三生科技有限公司 Automatic PCB detection device
CN106771966A (en) * 2016-12-02 2017-05-31 上海无线电设备研究所 Circuit board flexibility device for quick testing under a kind of complex environment
CN109326905A (en) * 2017-11-28 2019-02-12 苏州欧肯葵电子有限公司 A kind of adapting system of automotive test

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