CN1687988A - Method for multi-condition testing of optical head moment apparatus dynamic pappmeter - Google Patents
Method for multi-condition testing of optical head moment apparatus dynamic pappmeter Download PDFInfo
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- CN1687988A CN1687988A CN 200510066028 CN200510066028A CN1687988A CN 1687988 A CN1687988 A CN 1687988A CN 200510066028 CN200510066028 CN 200510066028 CN 200510066028 A CN200510066028 A CN 200510066028A CN 1687988 A CN1687988 A CN 1687988A
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- 238000012360 testing method Methods 0.000 title claims abstract description 49
- 230000003287 optical effect Effects 0.000 title claims abstract description 16
- 238000000034 method Methods 0.000 title claims description 16
- 238000006073 displacement reaction Methods 0.000 claims abstract description 21
- 230000005284 excitation Effects 0.000 claims abstract description 5
- 230000035945 sensitivity Effects 0.000 claims description 18
- 230000010354 integration Effects 0.000 claims description 4
- 238000009826 distribution Methods 0.000 description 2
- 238000011056 performance test Methods 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
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- 238000005516 engineering process Methods 0.000 description 1
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Abstract
The invention relates to a multimode testing method of dynamic parameters of moment instrument of an optical head, firstly making the moment instrument in a free state; outputting sine signals at different frequencies; driving the moment instrument to dither in the focusing or tracking direction; making a laser beam irradiate the reflecting point of an objective of the moment instrument to measure the dithering speed at the reflecting point; integrating the speed signal to obtain displacement response signals of the reflecting point by the excitation of the sine signals, and drawing an amplitude-frequency curve and a phase-frequency curve for focusing or tracking coil of the moment instrument, to obtain all the dynamic parameters of the focusing or tracking coil; applying different voltage biases to the focusing coil and the tracking coil to test all the dynamic parameters of the moment instrument. The test result completely and accurately represents the actual operating performance of a moment instrument all the more.
Description
Technical field
The present invention relates to a kind of method of multi-condition testing of optical head moment apparatus dynamic pappmeter, relate in particular to the method for multi-condition testing of optical head moment apparatus dynamic pappmeter in the CD drive, belong to the light storage device technical field of performance test.
Background technology
In optical disk system, torquer is the actual execution unit of optical head servo action.Its role is to, read the error signal of obtaining in the process according to optical head at CD, promptly focus on and tracking error signal, drive the object lens motion in real time, the hot spot that the fluctuating vibration that makes focal beam spot can overcome CD brings is in the skew of disc focus direction and tracking direction, thereby accurately drop on the information track of CD, realize high-quality reading and writing data.
The dynamic property of torquer will directly determine the control accuracy that focus servo and tracking servo system can reach, and being influences the key factor that optical head reads accuracy and stability.The performance test of torquer and quality control are extremely important to the production and the quality guarantee of optical head.
Common test to the torquer dynamic property, the dynamic property when a test moment device is in free state.But torquer is under actual working state, and the position, the centre of oscillation of its focusing coil and tracking coil is generally at its free position, but has the skew in the certain limit.Because the influence of some common deficiencies, for example the Distribution of Magnetic Field that causes of the asymmetric centroid motion that causes of the mass distribution of torquer movable member, permanent magnet installation site deviation is asymmetric etc., and torquer is in the dynamic property at different offset position places and be different from dynamic property under free state.The good torquer of test performance under free state, guaranteed performance is good fully in real work, so only the method for testing of the dynamic property of test moment device free state is not comprehensive, can not well reflect the real work performance of torquer.
Summary of the invention
The objective of the invention is to propose a kind of method of multi-condition testing of optical head moment apparatus dynamic pappmeter, apply various bias voltages respectively by focusing coil and tracking coil to torquer, the dynamic property of test moment device under different bias states is to estimate the real work performance of torquer.
The method of the multi-condition testing of optical head moment apparatus dynamic pappmeter that the present invention proposes comprises following each step:
(1) make torquer be in free state;
(2) export the sinusoidal signal of fixed amplitude A under the different frequency f from low to high respectively;
(3) torquer produces shake in focus direction or tracking direction under the driving of above-mentioned sinusoidal signal;
(4) beam of laser is shone on the reflection spot of torquer object lens, record the buffeting speed of the focus direction or the tracking direction at this reflection spot place on the object lens;
(5) above-mentioned rate signal is carried out integration, obtain that the displacement response signal in focus direction or tracking direction is Y (f)=B (f) ∠ φ (f) under the sinusoidal signal excitation that this is f in said frequencies, wherein B (f) be torquer in corresponding frequencies is the amplitude of the displacement response signal of focus direction or tracking direction under the sinusoidal signal of f drives, and φ (f) is a torquer in corresponding frequencies is the phase differential between focus direction or tracking direction displacement response signal and this sinusoidal signal under the sinusoidal signal of f drives;
(6) draw the amplitude frequency and the phase-frequency curve of torquer focusing coil or tracking coil respectively, wherein the horizontal ordinate of amplitude frequency characteristic is the corresponding frequencies f of sinusoidal signal, and ordinate is and the corresponding amplitude response of this frequency f
Wherein the horizontal ordinate of phase-frequency curve is the corresponding frequencies f of sinusoidal signal, and ordinate is and the corresponding phase response φ of this frequency f (f);
(7) on above-mentioned amplitude frequency characteristic, obtain every dynamic parameter of torquer focusing coil or tracking coil respectively:
Sensitivity: be 10
(G/20), wherein G is the ordinate of amplitude frequency characteristic;
First order resonance frequency f
0: the horizontal ordinate frequency corresponding with first resonance peak of low-frequency range of amplitude frequency characteristic;
First order resonant peak value Q
0: with f
0Corresponding ordinate and the ordinate corresponding poor with 5Hz;
Second order resonant frequency f
1: the horizontal ordinate frequency corresponding with second resonance peak place of amplitude frequency characteristic high band;
Second order resonance peak Q
1: with f
1The corresponding ordinate and the ordinate of 5Hz correspondence poor;
On above-mentioned phase-frequency curve, ordinate is the phase place at corresponding frequencies place;
(8) on the torquer focusing coil, apply bias voltage U
1=Y
1/ S
1, Y wherein
1Be the torquer focusing coil biasing displacement of setting, S
1Be the focusing coil sensitivity corresponding that torquer obtains when being in free state with 5Hz, repeating step (2)~(7), test the amplitude frequency characteristic and the phase-frequency curve of torquer focusing coil and tracking coil under this state, and obtain its dynamic parameter;
(9) on the torquer focusing coil, apply bias voltage-U
1, repeating step (2)~(7) are tested the amplitude frequency characteristic and the phase-frequency curve of torquer focusing coil and tracking coil under this state, and are obtained its dynamic parameter.
(10) on torquer tracking coil, apply bias voltage U
2=Y
2/ S
2, Y wherein
2Be the torquer tracking coil biasing displacement of setting, S
2Be the tracking coil sensitivity corresponding that torquer obtains when being in free state with 5Hz, repeating step (2)~(7), test the amplitude frequency characteristic and the phase-frequency curve of torquer focusing coil and tracking coil under this state, and obtain its dynamic parameter;
(11) on torquer tracking coil, apply bias voltage-U
2, repeating step (2)~(7) are tested the amplitude frequency characteristic and the phase-frequency curve of torquer focusing coil and tracking coil under this state, and are obtained its dynamic parameter.
In the said method, can be respectively apply bias voltage U simultaneously to the focusing coil and the tracking coil of torquer successively
1And U
2, U
1With-U
2,-U
1And U
2And-U
1With-U
2, repeat above-mentioned steps (2)~(7), test the amplitude frequency characteristic and the phase-frequency curve of torquer focusing coil and tracking coil under these four kinds of states respectively, and obtain its dynamic parameter.
The method of the multi-condition testing of optical head moment apparatus dynamic pappmeter that the present invention proposes, with respect to the single state test method of torquer under free state, can more press close to the actual working state of torquer, make test result reflect the real work performance of torquer more comprehensively, exactly.
Embodiment
The method of the multi-condition testing of optical head moment apparatus dynamic pappmeter that the present invention proposes at first makes torquer be in free state; Export the sinusoidal signal of fixed amplitude A under the different frequency f from low to high respectively; Torquer produces shake in focus direction or tracking direction under the driving of above-mentioned sinusoidal signal; Beam of laser is shone on the reflection spot of torquer object lens, record the buffeting speed of the focus direction or the tracking direction at this reflection spot place on the object lens; Above-mentioned rate signal is carried out integration, obtain that the displacement response signal in focus direction or tracking direction is Y (f)=B (f) ∠ φ (f) under the sinusoidal signal excitation that this is f in said frequencies, wherein B (f) be torquer in corresponding frequencies is the amplitude of the displacement response signal of focus direction or tracking direction under the sinusoidal signal of f drives, and φ (f) is a torquer in corresponding frequencies is the phase differential between focus direction or tracking direction displacement response signal and this sinusoidal signal under the sinusoidal signal of f drives; Draw the amplitude frequency and the phase-frequency curve of torquer focusing coil or tracking coil respectively, wherein the horizontal ordinate of amplitude frequency characteristic is the corresponding frequencies f of sinusoidal signal, and ordinate is and the corresponding amplitude response of this frequency f
Wherein the horizontal ordinate of phase-frequency curve is the corresponding frequencies f of sinusoidal signal, and ordinate is and the corresponding phase response φ of this frequency f (f); On above-mentioned amplitude frequency characteristic, obtain every dynamic parameter of torquer focusing coil or tracking coil respectively:
Sensitivity: be 10
(G/20), wherein G is the ordinate of amplitude frequency characteristic;
First order resonance frequency f
0: the horizontal ordinate frequency corresponding with first resonance peak of low-frequency range of amplitude frequency characteristic;
First order resonant peak value Q
0: with f
0Corresponding ordinate and the ordinate corresponding poor with 5Hz;
Second order resonant frequency f
1: the horizontal ordinate frequency corresponding with second resonance peak place of amplitude frequency characteristic high band;
Second order resonance peak Q
1: with f
1The corresponding ordinate and the ordinate of 5Hz correspondence poor;
On above-mentioned phase-frequency curve, ordinate is the phase place at corresponding frequencies place;
On the torquer focusing coil, apply bias voltage U
1=Y
1/ S
1, Y wherein
1Be the torquer focusing coil biasing displacement of setting, S
1Be the focusing coil sensitivity corresponding that torquer obtains when being in free state with 5Hz, repeat the step of above-mentioned test dynamic property, test the amplitude frequency characteristic and the phase-frequency curve of torquer focusing coil and tracking coil under this state, and obtain its dynamic parameter;
On the torquer focusing coil, apply bias voltage-U
1, repeat the step of above-mentioned test dynamic property, test the amplitude frequency characteristic and the phase-frequency curve of torquer focusing coil and tracking coil under this state, and obtain its dynamic parameter.
On torquer tracking coil, apply bias voltage U
2=Y
2/ S
2, Y wherein
2Be the torquer tracking coil biasing displacement of setting, S
2Be the tracking coil sensitivity corresponding that torquer obtains when being in free state with 5Hz, repeat the step of above-mentioned test dynamic property, test the amplitude frequency characteristic and the phase-frequency curve of torquer focusing coil and tracking coil under this state, and obtain its dynamic parameter;
On torquer tracking coil, apply bias voltage-U
2, repeat the step of above-mentioned test dynamic property, test the amplitude frequency characteristic and the phase-frequency curve of torquer focusing coil and tracking coil under this state, and obtain its dynamic parameter.
In the said method, can be respectively apply bias voltage U simultaneously to the focusing coil and the tracking coil of torquer successively
1And U
2, U
1With-U
2,-U
1And U
2And-U
1With-U
2, repeat the step of above-mentioned test dynamic property, test the amplitude frequency characteristic and the phase-frequency curve of torquer focusing coil and tracking coil under these four kinds of states respectively, and obtain its dynamic parameter.
Below introduce content of the present invention in detail:
The method of the multi-condition testing of optical head moment apparatus dynamic pappmeter that the present invention proposes at first makes torquer be in free state; Choose N class frequency value in logarithmic coordinate axle equal intervals from low to high, export the sinusoidal signal of fixed amplitude A respectively successively under these different frequencies f, the choosing of amplitude should guarantee that torquer can normally shake.This sinusoidal signal is applied on the torquer, makes torquer under the driving of above-mentioned sinusoidal signal, produce shake in focus direction or tracking direction.Beam of laser is shone on the reflection spot of torquer object lens, require this point that enough strong reflective light intensity is arranged, the principle of utilizing laser-Doppler to interfere dynamically records the buffeting speed that this reflection spot on the object lens is in focus direction or tracking direction.This rate signal is carried out integration, displacement response signal Y (f)=B (f) the ∠ φ (f) that obtains under the sinusoidal signal excitation that this is f in said frequencies in focus direction or tracking direction, wherein B (f) be torquer frequency be under the sinusoidal signal of f drives in the amplitude of the displacement response signal of focus direction or tracking direction, φ (f) is a torquer in frequency is the phase differential between focus direction or tracking direction displacement response signal and drive signal under the sinusoidal signal of f drives.Draw the amplitude frequency and the phase-frequency curve of torquer focusing coil or tracking coil, wherein the horizontal ordinate of amplitude frequency characteristic is the frequency f of sinusoidal drive signals, unit is hertz (Hz), and horizontal ordinate uses logarithmic coordinate, and ordinate is and the corresponding amplitude response of frequency f
Unit is a decibel (dB); Wherein the horizontal ordinate of phase-frequency curve is the frequency f of sinusoidal drive signals, and unit is hertz (Hz), and horizontal ordinate uses logarithmic coordinate, and ordinate be and the corresponding phase response φ of frequency f (f), unit for spend (°).
On above-mentioned amplitude frequency characteristic, obtain following torquer dynamic parameter: (1) 5Hz sensitivity: find out the corresponding ordinate G in frequency f=5Hz place
1, then 5Hz sensitivity is 10
(G1/20), being called static sensitivity, static sensitivity will directly influence the dynamic perfromance and the control accuracy of torquer; (2) 200Hz sensitivity: find out the corresponding ordinate G in frequency f=200Hz place
2, then 200Hz sensitivity is 10
(G2/20), be called dynamic sensitivity; (3) first order resonance frequency f
0: the horizontal ordinate frequency corresponding with first resonance peak of low-frequency range of amplitude frequency characteristic, first order resonance frequency has directly determined the dynamic responding speed of torquer, depends on the rigidity of torquer and the quality of movable member; (4) first order resonant peak value Q
0: with f
0Corresponding ordinate and the ordinate corresponding poor with 5Hz, the first order resonant peak value has reflected the damping characteristic of torquer; (5) second order resonant frequency f
1: the horizontal ordinate frequency corresponding with second resonance peak place of amplitude frequency characteristic high band, the second order resonant frequency has reflected the high frequent vibration mode that is caused by many non-linear factors; (6) second order resonance peak Q
1: with f
1The corresponding ordinate and the ordinate of 5Hz correspondence poor, the second order resonance peak should be as far as possible little, to suppress the torquer effect of non-linear, improves the servocontrol precision.On above-mentioned phase-frequency curve, obtain following torquer dynamic parameter: (1) 1KHz phase place: with the corresponding ordinate of frequency f=1KHz; (2) 5KHz phase place: with the corresponding ordinate of frequency f=5KHz, phase place is represented the delay degree of the response of torquer corresponding to sinusoidal signal frequency.
On the torquer focusing coil, apply bias voltage U
1=Y
1/ S
1, Y wherein
1Be the biasing displacement that the torquer focusing coil need produce, S
1Be the torquer focusing coil sensitivity corresponding that torquer obtains when being in free state with 5Hz, repeat the step of above-mentioned test a single state dynamic property, test the amplitude frequency characteristic and the phase-frequency curve of torquer focusing coil and tracking coil under this state, and obtain its dynamic parameter.On the torquer focusing coil, apply bias voltage-U
1, repeat the step of above-mentioned test a single state dynamic property, test the amplitude frequency characteristic and the phase-frequency curve of torquer focusing coil and tracking coil under this state, and obtain its dynamic parameter.
On torquer tracking coil, apply bias voltage U
2=Y
2/ S
2, Y wherein
2Be the biasing displacement that torquer tracking coil need produce, S
2Be the torquer tracking coil sensitivity corresponding that torquer obtains when being in free state with 5Hz, repeat the step of above-mentioned test a single state dynamic property, test the amplitude frequency characteristic and the phase-frequency curve of torquer focusing coil and tracking coil under this state, and obtain its dynamic parameter.On torquer tracking coil, apply bias voltage-U
2, repeat the step of above-mentioned test a single state dynamic property, test the amplitude frequency characteristic and the phase-frequency curve of torquer focusing coil and tracking coil under this state, and obtain its dynamic parameter.
On torquer focusing coil and tracking coil, apply bias voltage ± U simultaneously
1With ± U
2, U is arranged
1And U
2, U
1With-U
2,-U
1And U
2,-U
1With-U
2, totally four kinds of states repeat the step of above-mentioned test a single state dynamic property, test the amplitude frequency characteristic and the phase-frequency curve of torquer focusing coil and tracking coil under these four kinds of states respectively, and obtain its dynamic parameter.
If the dynamic property of torquer is all good under the above-mentioned various state, illustrate that torquer will have good dynamic characteristics in real work.
Test under the above-mentioned various state can select a part to carry out or all carry out, when properties of product are stablized, can only test free state or test folk prescription partial status, when torquer exists defective, sampling observation or torquer properties of product unstable, can test whole states to biasing.
Claims (2)
1, a kind of method of multi-condition testing of optical head moment apparatus dynamic pappmeter is characterized in that this method comprises following each step:
(1) make torquer be in free state;
(2) export the sinusoidal signal of fixed amplitude A under the different frequency f from low to high respectively;
(3) torquer produces shake in focus direction or tracking direction under the driving of above-mentioned sinusoidal signal;
(4) beam of laser is shone on the reflection spot of torquer object lens, record the buffeting speed of the focus direction or the tracking direction at this reflection spot place on the object lens;
(5) above-mentioned rate signal is carried out integration, obtain that the displacement response signal in focus direction or tracking direction is Y (f)=B (f) ∠ φ (f) under the sinusoidal signal excitation that this is f in said frequencies, wherein B (f) be torquer in corresponding frequencies is the amplitude of the displacement response signal of focus direction or tracking direction under the sinusoidal signal of f drives, and φ (f) is a torquer in corresponding frequencies is the phase differential between focus direction or tracking direction displacement response signal and this sinusoidal signal under the sinusoidal signal of f drives;
(6) draw the amplitude frequency and the phase-frequency curve of torquer focusing coil or tracking coil respectively, wherein the horizontal ordinate of amplitude frequency characteristic is the corresponding frequencies f of sinusoidal signal, and ordinate is and the corresponding amplitude response of this frequency f
Wherein the horizontal ordinate of phase-frequency curve is the corresponding frequencies f of sinusoidal signal, and ordinate is and the corresponding phase response φ of this frequency f (f);
(7) on above-mentioned amplitude frequency characteristic, obtain every dynamic parameter of torquer focusing coil or tracking coil respectively:
Sensitivity: be 10
(G/20), wherein G is the ordinate of amplitude frequency characteristic;
First order resonance frequency f
0: the horizontal ordinate frequency corresponding with first resonance peak of low-frequency range of amplitude frequency characteristic;
First order resonant peak value Q
0: with f
0Corresponding ordinate and the ordinate corresponding poor with 5Hz;
Second order resonant frequency f
1: the horizontal ordinate frequency corresponding with second resonance peak place of amplitude frequency characteristic high band;
Second order resonance peak Q
1: with f
1The corresponding ordinate and the ordinate of 5Hz correspondence poor;
On above-mentioned phase-frequency curve, ordinate is the phase place at corresponding frequencies place;
(8) on the torquer focusing coil, apply bias voltage U
1=Y
1/ S
1, Y wherein
1Be the torquer focusing coil biasing displacement of setting, S
1Be the focusing coil sensitivity corresponding that torquer obtains when being in free state with 5Hz, repeating step (2)~(7), test the amplitude frequency characteristic and the phase-frequency curve of torquer focusing coil and tracking coil under this state, and obtain its dynamic parameter;
(9) on the torquer focusing coil, apply bias voltage-U
1, repeating step (2)~(7) are tested the amplitude frequency characteristic and the phase-frequency curve of torquer focusing coil and tracking coil under this state, and are obtained its dynamic parameter.
(10) on torquer tracking coil, apply bias voltage U
2=Y
2/ S
2, Y wherein
2Be the torquer tracking coil biasing displacement of setting, S
2Be the tracking coil sensitivity corresponding that torquer obtains when being in free state with 5Hz, repeating step (2)~(7), test the amplitude frequency characteristic and the phase-frequency curve of torquer focusing coil and tracking coil under this state, and obtain its dynamic parameter;
(11) on torquer tracking coil, apply bias voltage-U
2, repeating step (2)~(7) are tested the amplitude frequency characteristic and the phase-frequency curve of torquer focusing coil and tracking coil under this state, and are obtained its dynamic parameter.
2, the method for claim 1 is characterized in that respectively successively applying bias voltage U simultaneously to the focusing coil and the tracking coil of torquer
1And U
2, U
1With-U
2,-U
1And U
2And-U
1With-U
2, repeating step (2)~(7) are tested the amplitude frequency characteristic and the phase-frequency curve of torquer focusing coil and tracking coil under these four kinds of states respectively, and are obtained its dynamic parameter.
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CNB2005100660286A CN100375175C (en) | 2005-04-22 | 2005-04-22 | Method for multi-condition testing of optical head moment apparatus dynamic pappmeter |
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CN100375175C CN100375175C (en) | 2008-03-12 |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100487384C (en) * | 2007-02-02 | 2009-05-13 | 清华大学深圳研究生院 | Optical head tri-dimensional torquer inclined movement characteristic curve test method |
CN101158618B (en) * | 2007-11-01 | 2010-10-06 | 清华大学深圳研究生院 | Optical pickup device force moment machine tester and optical pickup device force moment machine characteristic testing method |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10289476A (en) * | 1997-04-11 | 1998-10-27 | Sony Corp | Inspection method and inspection device for biaxial objective lens actuator |
SG75940A1 (en) * | 1999-03-24 | 2000-10-24 | Sony Prec Engineering Ct Singa | Objective lens inspection apparatus |
-
2005
- 2005-04-22 CN CNB2005100660286A patent/CN100375175C/en not_active Expired - Fee Related
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100487384C (en) * | 2007-02-02 | 2009-05-13 | 清华大学深圳研究生院 | Optical head tri-dimensional torquer inclined movement characteristic curve test method |
CN101158618B (en) * | 2007-11-01 | 2010-10-06 | 清华大学深圳研究生院 | Optical pickup device force moment machine tester and optical pickup device force moment machine characteristic testing method |
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