CN1636168A - 用于数据压缩的群集 - Google Patents
用于数据压缩的群集 Download PDFInfo
- Publication number
- CN1636168A CN1636168A CNA018041760A CN01804176A CN1636168A CN 1636168 A CN1636168 A CN 1636168A CN A018041760 A CNA018041760 A CN A018041760A CN 01804176 A CN01804176 A CN 01804176A CN 1636168 A CN1636168 A CN 1636168A
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- CN
- China
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- trooping
- real
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F9/00—Arrangements for program control, e.g. control units
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
- G06Q50/00—Systems or methods specially adapted for specific business sectors, e.g. utilities or tourism
- G06Q50/04—Manufacturing
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/30—Computing systems specially adapted for manufacturing
Abstract
Description
Claims (4)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/727,531 | 2000-11-28 | ||
US09/727,531 US6591405B1 (en) | 2000-11-28 | 2000-11-28 | Clustering for data compression |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1636168A true CN1636168A (zh) | 2005-07-06 |
CN100405241C CN100405241C (zh) | 2008-07-23 |
Family
ID=24923033
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB018041760A Expired - Fee Related CN100405241C (zh) | 2000-11-28 | 2001-11-28 | 用于数据压缩的群集 |
Country Status (9)
Country | Link |
---|---|
US (2) | US6591405B1 (zh) |
EP (1) | EP1323006A2 (zh) |
JP (1) | JP2004528618A (zh) |
KR (1) | KR100906174B1 (zh) |
CN (1) | CN100405241C (zh) |
AU (1) | AU2002236505A1 (zh) |
IL (1) | IL150922A0 (zh) |
TW (1) | TW552525B (zh) |
WO (1) | WO2002044820A2 (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114930153A (zh) * | 2020-01-06 | 2022-08-19 | 诺威有限公司 | 用于ocd数据解释的自我监督表征学习 |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10300465A1 (de) * | 2003-01-09 | 2004-07-29 | Rational Ag | Garen unter Ausnutzung einer Cluster-Analyse und Gargeräte hierfür |
US7394554B2 (en) * | 2003-09-15 | 2008-07-01 | Timbre Technologies, Inc. | Selecting a hypothetical profile to use in optical metrology |
US7623978B2 (en) * | 2006-03-30 | 2009-11-24 | Tokyo Electron Limited | Damage assessment of a wafer using optical metrology |
US7324193B2 (en) * | 2006-03-30 | 2008-01-29 | Tokyo Electron Limited | Measuring a damaged structure formed on a wafer using optical metrology |
US7576851B2 (en) * | 2006-03-30 | 2009-08-18 | Tokyo Electron Limited | Creating a library for measuring a damaged structure formed on a wafer using optical metrology |
US7619731B2 (en) * | 2006-03-30 | 2009-11-17 | Tokyo Electron Limited | Measuring a damaged structure formed on a wafer using optical metrology |
US8201128B2 (en) * | 2006-06-16 | 2012-06-12 | Cadence Design Systems, Inc. | Method and apparatus for approximating diagonal lines in placement |
US7752208B2 (en) * | 2007-04-11 | 2010-07-06 | International Business Machines Corporation | Method and system for detection of authors |
KR100933705B1 (ko) * | 2007-08-17 | 2009-12-24 | 삼성중공업 주식회사 | 계측 시스템의 데이터 필터링 방법 |
US20090112533A1 (en) * | 2007-10-31 | 2009-04-30 | Caterpillar Inc. | Method for simplifying a mathematical model by clustering data |
JP5173898B2 (ja) * | 2009-03-11 | 2013-04-03 | キヤノン株式会社 | 画像処理方法、画像処理装置、及びプログラム |
JP5400599B2 (ja) * | 2009-12-18 | 2014-01-29 | 株式会社日立製作所 | Guiカスタマイズ方法、システム及びプログラム |
CN102375753B (zh) * | 2011-10-08 | 2014-06-18 | 宇龙计算机通信科技(深圳)有限公司 | 移动终端预置应用的方法及移动终端 |
US9146987B2 (en) | 2013-06-04 | 2015-09-29 | International Business Machines Corporation | Clustering based question set generation for training and testing of a question and answer system |
US9230009B2 (en) * | 2013-06-04 | 2016-01-05 | International Business Machines Corporation | Routing of questions to appropriately trained question and answer system pipelines using clustering |
US9638857B2 (en) * | 2013-10-28 | 2017-05-02 | Futurewei Technologies, Inc. | Mode size adjusting for edge coupling devices using multiple inverse tapers |
US9348900B2 (en) | 2013-12-11 | 2016-05-24 | International Business Machines Corporation | Generating an answer from multiple pipelines using clustering |
US20160170067A1 (en) * | 2014-12-11 | 2016-06-16 | Schlumberger Technology Corporation | Logging Tool Providing Measured Response Database Comparison |
WO2016177548A1 (en) | 2015-05-07 | 2016-11-10 | Asml Netherlands B.V. | Metrology method and apparatus, computer program and lithographic system |
CN105784937B (zh) * | 2016-03-11 | 2017-09-22 | 郑州航空工业管理学院 | 气体苯系物探测的数据可视化方法及系统 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5386558A (en) * | 1992-02-24 | 1995-01-31 | Adapsys, Inc. | Method and apparatus for executing control system functions in a computer system |
US5486998A (en) * | 1993-06-14 | 1996-01-23 | Amax Coal West, Inc. | Process stabilizing process controller |
US5991699A (en) | 1995-05-04 | 1999-11-23 | Kla Instruments Corporation | Detecting groups of defects in semiconductor feature space |
KR0161093B1 (ko) * | 1995-10-27 | 1999-03-30 | 미요시 순키치 | 표면결함의 검출방법 및 그 장치 |
US5995644A (en) * | 1997-06-30 | 1999-11-30 | Siemens Corporate Research, Inc. | Robust and automatic adjustment of display window width and center for MR images |
JP4194697B2 (ja) * | 1998-10-22 | 2008-12-10 | 株式会社野村総合研究所 | 分類ルール探求式クラスター分析装置 |
US6337654B1 (en) * | 1999-11-05 | 2002-01-08 | Lockheed Martin Corporation | A-scan ISAR classification system and method therefor |
-
2000
- 2000-11-28 US US09/727,531 patent/US6591405B1/en not_active Expired - Lifetime
-
2001
- 2001-11-28 WO PCT/US2001/044616 patent/WO2002044820A2/en not_active Application Discontinuation
- 2001-11-28 IL IL15092201A patent/IL150922A0/xx unknown
- 2001-11-28 EP EP01986037A patent/EP1323006A2/en not_active Withdrawn
- 2001-11-28 TW TW090129476A patent/TW552525B/zh not_active IP Right Cessation
- 2001-11-28 JP JP2002546923A patent/JP2004528618A/ja active Pending
- 2001-11-28 KR KR1020027009634A patent/KR100906174B1/ko active IP Right Grant
- 2001-11-28 CN CNB018041760A patent/CN100405241C/zh not_active Expired - Fee Related
- 2001-11-28 AU AU2002236505A patent/AU2002236505A1/en not_active Abandoned
-
2003
- 2003-03-25 US US10/397,085 patent/US6857114B2/en not_active Expired - Lifetime
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114930153A (zh) * | 2020-01-06 | 2022-08-19 | 诺威有限公司 | 用于ocd数据解释的自我监督表征学习 |
CN114930153B (zh) * | 2020-01-06 | 2023-01-06 | 诺威有限公司 | 用于ocd数据解释的自我监督表征学习 |
Also Published As
Publication number | Publication date |
---|---|
WO2002044820A2 (en) | 2002-06-06 |
KR100906174B1 (ko) | 2009-07-03 |
EP1323006A2 (en) | 2003-07-02 |
IL150922A0 (en) | 2003-02-12 |
US6857114B2 (en) | 2005-02-15 |
US20030188279A1 (en) | 2003-10-02 |
TW552525B (en) | 2003-09-11 |
WO2002044820A3 (en) | 2003-01-30 |
US6591405B1 (en) | 2003-07-08 |
KR20030007404A (ko) | 2003-01-23 |
CN100405241C (zh) | 2008-07-23 |
AU2002236505A1 (en) | 2002-06-11 |
JP2004528618A (ja) | 2004-09-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: TOKYO YILI KECHUANG USA INC. Free format text: FORMER OWNER: TEL TIMBRE TECHNOLOGY INC. Effective date: 20140423 |
|
C41 | Transfer of patent application or patent right or utility model | ||
C56 | Change in the name or address of the patentee |
Owner name: TEL TIMBRE TECHNOLOGY INC. Free format text: FORMER NAME: TIMBRE TECHNOLOGIES, INC. |
|
CP01 | Change in the name or title of a patent holder |
Address after: California, USA Patentee after: TEL sound quality technology Address before: California, USA Patentee before: Timbre Technologies, Inc. |
|
TR01 | Transfer of patent right |
Effective date of registration: 20140423 Address after: Texas, USA Patentee after: Tokyo Yili Kechuang company in the United States Address before: California, USA Patentee before: TEL sound quality technology |
|
C17 | Cessation of patent right | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20080723 Termination date: 20131128 |