CN1581920A - Scanning line position and width measuring method and pattern thereof - Google Patents
Scanning line position and width measuring method and pattern thereof Download PDFInfo
- Publication number
- CN1581920A CN1581920A CN 03149651 CN03149651A CN1581920A CN 1581920 A CN1581920 A CN 1581920A CN 03149651 CN03149651 CN 03149651 CN 03149651 A CN03149651 A CN 03149651A CN 1581920 A CN1581920 A CN 1581920A
- Authority
- CN
- China
- Prior art keywords
- contrast
- line
- contrast district
- those
- scan line
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Image Analysis (AREA)
Abstract
The method includes steps: first, providing a pattern possessing a contrast area and projecting a scanning line to the intersectant contrast area; multiple contrast signals are displayed on image picking up component; then, picking up these contrast signals, from contrast signal on horizontal position of the image picking up component determines vertical position of scanning line on the contrast area; calculating starting position and ending position of the contrast signals on the image picking up component to determine actual width of upper border and lower border of scanning line in time of passing through contrast area. The invention determines relative position and relative offset of scanning line on the measuring area, and calculates width of scanning line.
Description
Technical field
The present invention relates to the method for measurement of the scanner in a kind of instrument field optical instrument, particularly relate to the position of a kind of scan line (scan line) and the method for measurement and the pattern thereof of width.
Background technology
In recent years, image processing arrangement is under light, thin, short, little trend, and relevant device of image scanning also moves towards miniaturization and precise treatment gradually.With the optical scanner is example, because the constantly enhancing of product on processing speed and data storing such as improvement and computer of image acquisition chip makes the usefulness of graphics process significantly increase.Generally on the market, existing modal optical scanner is to be platform-type optical scanner, and it mainly disposes one scan module (module) and one scan platform.Wherein, scanning module has a lamp source, a plurality of reflecting optics, a camera lens and an image acquisition chip, and the lamp source is projected to the light of scanning platform, on the file irradiation area, form the one scan line, and by the light path design of optics so that the image of a file in regular turn via the reflection of a plurality of reflecting optics and the focusing of camera lens, (charge-coupled device is CCD) on and so on the image acquisition chip to image in charge coupled cell afterwards.In order to make image that imaging more clearly be arranged on charge coupled cell, must adjust the appropriate location that the lamp source is projected to scanning platform, and, make that certain position of last image can be in the imaging scope of charge coupled cell via proofreading and correct and the test program of contrast.Because its precision requirement height is so needed adjustment tool also must have the accurate localization truing tool.
Seeing also shown in Figure 1ly, is the schematic diagram of the adjustment mode of existing known a kind of scanning module (module).Should have known scanning module 100 now, before being assembled to the one scan instrument, for guaranteeing that its lamp source 102 is projeced into the light of file irradiation area 10, can pass through the light opening 104 of scanning module 100 exactly, therefore must design the light opening 104 of suitable A/F, and be projected to the light luminance and light opening 104 positions of file irradiation area 10 by lamp source 102, adjust the imaging definition on the charge coupled cell 106.In addition, enter scanning module by light opening 104 for fear of remaining veiling glare among, the position of light opening and the definition of imaging also must be carried out the work of adjustment at the position of the light actual projected in lamp source 102.
It should be noted that, have the mode of known light adjustment now, since scanning module 100 only can rough adjustment light opening 104 on making the position and width on an appropriate location, yet during actual adjustment, and can't accurately learn the position and the width of the scan line on file irradiation area 10, making has a little error to exist between the actual light path of scanning module 100 inside and the intrinsic light path.In addition, in case when running into the design alteration of scanning module 100, usually need to redeterminate the position of light.Yet, resolution raising along with image, this kind adjustment mode can't reach desired accurate value, so the present invention proposes the method for measurement of a kind of scan line position and width, learn the physical location of scan line at file irradiation area place, with the imaging definition on assistance and the correction charge coupled cell, and do more accurate check and adjust, thereby have more practicality with auxiliary.Through constantly research, design, and after studying sample and improvement repeatedly, create the present invention who has practical value finally.
Summary of the invention
Main purpose of the present invention is, overcome the defective that above-mentioned existing light adjustment mode exists, and provide a kind of the judge position of scan line and the pattern of width, make on its test zone that is disposed at the one scan line, and can judge relative position and the relative displacement of scan line on test zone, and calculate the width of scan line.
Another object of the present invention is to, a kind of method for measurement of lamp source launching position of scanning module is provided, make it be applicable to the one scan instrument,, judge that the lamp source throws the relative position and the relative displacement of formed scan line by the contrast of relative position and width.
Still a further object of the present invention is, a kind of position of scan line and the method for measurement of width are provided, and makes it in the mode of scan line by a pattern, judges the relative position and the relative displacement of scan line, and calculates the width of scan line.
Purpose of the present invention and to solve its technical problem underlying be to adopt following technical scheme to realize.According to a kind of scan line position of the present invention's proposition and the method for measurement of width, it may further comprise the steps at least: one first contrast district is provided, be disposed on the test zone, the upper limb of this first contrast district is to consult line along one first to extend, and the lower edge of this first contrast district is to consult line along one second to extend, wherein this first is consulted line and this second and consults line and be parallel to each other, and with respect to the horizontal direction angle that tilts; Projection one scan line is on this test zone, and intersect this scan line and this first contrast district, and shows that a plurality of first contrast signals are on an image capture element; Capture those first the contrast signal, and by those first the contrast signals in the horizontal level at this image capture element place, judge the upright position at this scan line place on this first contrast district; And calculate those first contrast signals at the original position and the final position of this image capture element, judge the upper limb of this scan line and down because of width by this first contrast district.
The object of the invention to solve the technical problems can also be further achieved by the following technical measures.
The method for measurement of aforesaid scan line position and width more comprises one second contrast district is provided, and is disposed on this test zone, and this second contrast district and this first contrast district are symmetrical.
The method for measurement of aforesaid scan line position and width, wherein said scan line also intersects at this second contrast district, and show that those first contrast signals and a plurality of second contrast signals corresponding with those first contrast signals on this image capture element, use and judge the relative displacement of this scan line in this first contrast district and this second contrast district.
Purpose of the present invention and solve its technical problem underlying and also realize by the following technical solutions.The method for measurement of the width of a kind of scan line that proposes according to the present invention, it may further comprise the steps at least: a contrast zone is provided, be disposed on the test zone, the upper limb of this contrast district is to consult line along one first to extend, and the lower edge of this first contrast district is to consult line along one second to extend, wherein this first is consulted line and this second and consults line and be parallel to each other, and with respect to the horizontal direction angle that tilts; Projection one scan line is on this test zone, and intersect this scan line and this contrast district, and show that a plurality of contrast signals are on an image capture element; And capture those contrast signals, and and calculate those contrast signals at the original position and the final position of this image capture element, judge that the upper limb of this scan line and lower edge are at the width by this contrast district.
Purpose of the present invention and solve its technical problem underlying and also realize by the following technical solutions.The method for measurement of the lamp source launching position of a kind of scanning module that proposes according to the present invention, it may further comprise the steps at least: one first contrast district is provided, be disposed on the test zone, the upper limb of this first contrast district is to consult line along one first to extend, and the lower edge of this first contrast district is to consult line along one second to extend, wherein this first is consulted line and this second and consults line and be parallel to each other, and with respect to the horizontal direction angle that tilts; The one scan module is provided, this scanning module has a lamp source, a plurality of reflecting optics, a camera lens and a charge coupled cell, this lamp source is suitable for throwing a light on a test zone, to form the one scan line, intersect this scan line and this first contrast district, and this light is incident upon on those reflecting optics, this camera lens and this charge coupled cell in regular turn, and shows that a plurality of first contrast signals are on this charge coupled cell; And capture those first contrast signals, and, judge the upright position at this scan line place on this first contrast district by the horizontal level of those first contrast signals at this image capture element place.
The object of the invention to solve the technical problems can also be further achieved by the following technical measures.
The method for measurement of the lamp source launching position of aforesaid scanning module, it more comprises provides one second contrast district, is disposed on this test zone, and this second contrast district and this first contrast district are symmetrical.
The method for measurement of the lamp source launching position of aforesaid scanning module, wherein said scan line also intersects at this second contrast district, and show that those first contrast signals and a plurality of second contrast signals corresponding with those first contrast signals on this charge coupled cell, use and judge the relative displacement of this scan line in this first contrast district and this second contrast district.
Purpose of the present invention and solve its technical problem underlying and also realize by the following technical solutions.A kind ofly judge the position of scan line and the pattern of width according to what the present invention proposed, it comprises at least: one first contrast district, the upper limb of this first contrast district is to consult line along one first to extend, and the lower edge of this first contrast district is to consult line along one second to extend, wherein this first is consulted line and this second and consults line and be parallel to each other, and with respect to the horizontal direction angle that tilts; A plurality of first line segments, a side and wantonly two those adjacent first line segments of being vertically arranged in this first contrast district have one at interval, and an end-grain cutting of each those first line segment also differs a spacing in regular turn in the upper limb of this first contrast district together; And a plurality of second line segments, opposite side and wantonly two those adjacent second line segments of being vertically arranged in this first contrast district have this interval, those second line segments those first line segments that align, and an end-grain cutting of those second line segments is together in the lower edge of this first contrast district and differ this spacing in regular turn.
The object of the invention to solve the technical problems also can be further achieved by the following technical measures.The position of aforesaid judgement scan line and the pattern of width, it more comprises one second contrast district, a plurality of the 3rd line segments and a plurality of the 4th line segments, this second contrast district is symmetrical in this first contrast district, and those the 3rd line segments and those the 4th line segments are symmetrical in those first line segments and those second line segments respectively.
Purpose of the present invention and solve its technical problem underlying and also realize by the following technical solutions.A kind ofly judge the position of scan line and the pattern of width according to what the present invention proposed, it comprises at least: one first contrast district, the upper limb of this first contrast district is to consult line along one first to extend, and the lower edge of this first contrast district is to consult line along one second to extend, wherein this first is consulted line and this second and consults line and be parallel to each other, and with respect to the horizontal direction angle that tilts; And a plurality of first line segments, be vertically arranged in this first contrast district and wantonly two those adjacent first line segments and have one at interval, one end-grain cutting of each those first line segment is together in the upper limb of this first contrast district, and the other end trims in the lower edge of this first contrast district and differs a spacing in regular turn.
The object of the invention to solve the technical problems can also be further achieved by the following technical measures.The position of aforesaid judgement scan line and the pattern of width, it more comprises one second contrast district and a plurality of second line segments, this second contrast district is symmetrical in this first contrast district, and those second line segments are symmetrical in those first line segments.
The present invention compared with prior art has tangible advantage and beneficial effect.By above technical scheme as can be known, in order to reach aforementioned goal of the invention, major technique of the present invention thes contents are as follows:
The present invention proposes the method for measurement of a kind of scan line position and width, one first contrast district at first is provided, be disposed on the test zone, the upper limb of first contrast district is to consult line along one first to extend, and the lower edge of first contrast district is to consult line along one second to extend, wherein first consult line and second and consult line and be parallel to each other, and with respect to the horizontal direction angle that tilts; Then throw the one scan line on test zone, intersect the scan line and first contrast district, and show that a plurality of first contrast signals are on an image capture element; Then capture these first the contrast signal, and by first the contrast signal in the horizontal level at image capture element place, judge the upright position at scan line place on first contrast district; And calculate these first contrast signals in the original position and the final position of image capture element, judge the upper limb of scan line and down because of width by first contrast district.
The present invention also proposes a kind of pattern of judging scan line position and width, comprise one first contrast district, the upper limb of this first contrast district is to consult line along one first to extend, and the lower edge of first contrast district is to consult line along one second to extend, wherein first consult line and second and consult line and be parallel to each other, and with respect to the horizontal direction angle that tilts.In addition, a side and the wantonly two first adjacent line segments that many first line segments are vertically arranged in first contrast district have one at interval, and an end-grain cutting of each first line segment is together in the upper limb of first contrast district and differ a spacing in regular turn.In addition, opposite side and the wantonly two second adjacent line segments that many second line segments are vertically arranged in first contrast district have one at interval, these second line segments these first line segments that align, and an end-grain cutting of these second line segments is together in the lower edge of first contrast district and differ a spacing in regular turn.
The method for measurement of scan line position of the present invention and width is that a pattern at first is provided, and this pattern has a contrast zone, and projection one scan line is crossing with the contrast district, and shows that a plurality of contrast signals are on an image capture element; Then capture these contrast signals, and, judge the upright position at scan line place on the contrast district by the horizontal level of contrast signal at image capture element place; And calculate these contrast signals in the original position and the final position of image capture element, judge the upper limb of scan line and down because of developed width by the contrast district.
By said structure, the position of scan line of the present invention and the method for measurement of width and pattern thereof have following advantage at least:
(1), the present invention is by the position of judging scan line and the pattern of width, is disposed on the test zone of one scan line, so can judge relative position and the relative displacement of scan line on test zone easily, and calculate the width of scan line.
(2), the invention provides a kind of method for measurement of lamp source launching position of scanning module, be applicable to the scanner of any machine, and, judge that the lamp source throws the relative position and the relative displacement of formed scan line by the position of the contrast district of pattern and the comparison of width.
(3), the present invention is by the comparison mode of scan line by the contrast district of a pattern, judge ruddiness, green glow and blue light three looks certain position frequently of scan line, and calculate the width of scan line, and can accurately provide the research staff to verify and revise the auxiliary adjustment of design.
In sum, the invention provides a kind of the judge position of scan line and the pattern of width, it is disposed on the test zone of one scan line, and can judge relative position and the relative displacement of scan line on test zone, and calculates the width of scan line; The present invention provides a kind of method for measurement of lamp source launching position of scanning module in addition, is applicable to the one scan instrument, by the contrast of relative position and width, and can judge that the lamp source throws the relative position and the relative displacement of formed scan line; The present invention also provides a kind of position of scan line and the method for measurement of width, in the mode of scan line by a pattern, can judge the relative position and the relative displacement of scan line, and calculates the width of scan line.It has above-mentioned many advantages and practical value, it really belongs to innovation on method for measurement and product, bigger improvement is all arranged on method for measurement, product structure or function, more existing light adjustment mode has the multinomial effect of enhancement, and have large improvement technically, and produced handy and practical effect, have the extensive value of industry, thereby being suitable for practicality more, really is a new and innovative, progressive, practical new design.
Above-mentioned explanation only is the general introduction of technical solution of the present invention, for can clearer understanding technological means of the present invention, and can be implemented according to the content of specification, below with preferred embodiment of the present invention and conjunction with figs. describe in detail as after.
Description of drawings
Fig. 1 is the schematic diagram that has the adjustment mode of known a kind of scanning module now.
Fig. 2 is the schematic diagram of a preferred embodiment of the present invention a kind of pattern of judging scan line position and width and the graph of a relation of contrast signal thereof.
Fig. 3 is the method for measurement of the lamp source launching position of a kind of scanning module of the present invention.
Fig. 4 is the schematic diagram of a preferred embodiment of the present invention a kind of pattern of judging the position of scan line and width and the graph of a relation of contrast signal thereof.
Fig. 5 is the schematic diagram of a preferred embodiment of the present invention a kind of pattern of judging scan line position and width and the graph of a relation of contrast signal thereof.
Fig. 6 is a kind of schematic diagram of judging the pattern of scan line position and width of another preferred embodiment of the present invention.
Fig. 7 is the schematic diagram of a preferred embodiment of the present invention a kind of pattern of judging scan line position and width and the graph of a relation of contrast signal thereof.
10: file irradiation area 100,200: scanning module (module)
102,202: lamp source 104: the light opening
106,208: charge coupled cell 204: reflecting optics
206: lens 210,230,510,610,710: pattern
212,222: scan line 512,612,712: scan line
214,224,514: contrast district 524,624,714: contrast district
216,218,226,228: line segment 516,526,616,626: line segment
220,222,520: contrast signal 522,720: the contrast signal
714a, 714b: block A: at interval
B: spacing Z: width
Embodiment
Below in conjunction with accompanying drawing and preferred embodiment, the scan line position that foundation the present invention is proposed and method for measurement and its concrete method for measurement of pattern, step, structure, feature and the effect thereof of width, describe in detail as after.
First embodiment
See also shown in Figure 2, be the schematic diagram of a preferred embodiment of the present invention a kind of pattern of judging scan line position and width and the graph of a relation of contrast signal thereof, be suitable for being configured on the test zone (being the file irradiation area 10 of Fig. 3) of one scan line, this pattern 220 wherein, have a contrast zone 214 (being blank hatched example areas), the upper limb 214a of this contrast district 214 consults line L1 along one first to extend (extending to the lower right corner by the upper left corner), and the lower edge 214b of contrast district 214 consults line L2 along one second to extend, and first consults line L1 and second consults line L2 and is parallel to each other non-intersectly, and presss from both sides an angle with horizontal direction.In addition, many first line segments 216 are vertically arranged in the A at interval of being separated by between the side (upside) of contrast district 214 and wantonly two adjacent first line segments 216, and an end-grain cutting of first line segment 216 214 the upper limb 214a and differ a spacing B in regular turn in the contrast district together.In addition, many second line segments 218 are vertically arranged in the opposite side (downside) of contrast district 214, and the A at interval of being separated by equally between wantonly two adjacent second line segments 218, and an end of second line segment 218 then trims in the contrast district 214 lower edge 214b, and differ a spacing B equally in regular turn, and first line segment 216 also aligns mutually with second line segment 218.
See also shown in Figure 3, it is the method for measurement of the lamp source launching position of a kind of scanning module of the present invention, this method for measurement at first provides one scan module 200, and this scanning module 200 has a lamp source 202, a plurality of reflecting optics 204, a camera lens 206 and a charge coupled cell 208.Wherein, this lamp source 202 for example is a fluorescent tube, it is disposed on the housing of scanning module 200, and lamp source 202 is projeced into the light on the file irradiation area 10, can form the scan line 212 of a high brightness on file irradiation area 10, for the usefulness of scanning document or image, and light is via after pattern 210 reflections, be incident upon in regular turn on reflecting optics 204, camera lens 206 and the charge coupled cell 208, and be imaged on the charge coupled cell 208.In order to measure the position of scan line 212 on file irradiation area 10, present embodiment then utilizes the pattern of Fig. 2 to judge the position of scan line 212.As shown in Figure 2, scan line 212 intersects with contrast district 214, and show that a plurality of contrast signals 220 are on the charge coupled cell 208 or on other image capture element, then acquisition contrasts signal 220, and the contrast signal 220 after the acquisition for example is the signal of different voltage/current numerical value, graph of a relation as Fig. 2 below, highly to represent the signal power, when the horizontal level of contrast signal 220 is taken back, the upright position of promptly knowing scan line 212 on the upper side, or take over when the horizontal level of contrast signal 220, the upright position of promptly knowing scan line 212 is on the lower side.Therefore by the horizontal level of contrast signal 220 on charge coupled cell 208, can judge the upright position of scan line 212 on test zone, and accuracy is very high.
Seeing also shown in Figure 4ly, is the schematic diagram of a preferred embodiment of the present invention a kind of pattern of judging the position of scan line and width and the graph of a relation of contrast signal thereof.Under preferable situation, the relative position of scan line 212 and relative displacement, can utilize the geometrical pattern 230 of a symmetry to compare, this pattern 230 comprises one second contrast district 224 of one first contrast district 214 and symmetry, this first contrast district 214, as shown in Figure 2, a plurality of second line segments 218 of its both sides difference a plurality of first line segments 216 of vertical arrangement and alignment, and a plurality of the 4th line segments 228 of a plurality of the 3rd line segments 226 and alignment are vertically arranged in the both sides of second contrast district 224 respectively, and the 3rd line segment 226 is symmetrical in first line segment, 216, the four line segments 228 and then is symmetrical in second line segment 218.When scan line 212 intersects with first contrast district 214, second contrast district 224, shown in the graph of a relation of Fig. 4 below, can show one group of contrast signal 220,222 on the charge coupled cell 208, it represents the position of scan line 212 left and right sides respectively.Therefore, when this group contrast signal 220,222 is not on the horizontal level in symmetry (can judge), can judge the asymmetric phenomenon of scan line 212 deflections or the left and right sides by the center line of pattern.
In addition, the width of scan line 212 can calculate by a side of above-mentioned pattern 230, its computing formula is as follows: see also shown in Figure 4, for example intersect at an end of the X1 bar line segment of second line segment 218 when the upper limb of scan line 212, and when the lower edge of scan line 212 for example intersects at the end of Y1 bar line segment of second line segment 218, can calculate width Z=| (X1-Y1) B| of scan line 212 by the variation of contrast signal 220.Or, for example intersect at an end of the X2 bar line segment of first line segment 216 when the upper limb of scan line 212, and when the lower edge of scan line 212 for example intersects at the end of Y2 bar line segment of first line segment 216, by contrast original position (for example signal the maximum) of signal 220 and width Z=| (X2-Y2) B| that final position (for example signal reckling) can calculate scan line 212, wherein | (X1-Y1) B| with | (X2-Y2) B| is the absolute value of line segment pitch difference.
Seeing also shown in Figure 6ly, is a kind of schematic diagram of judging the pattern of scan line position and width of another preferred embodiment of the present invention.Pattern in the present embodiment is with formed how much symmetrical patterns 610 of white with black line segment, wherein a plurality of second line segments 626 of the upside of contrast district 624 (being the hatched example areas of black), downside difference a plurality of first line segments 616 of vertical arrangement and alignment.Therefore, same principle.When scan line 612 intersects at contrast district 624, can be by above-mentioned contrast signal shown on charge coupled cell 208, when carrying out the ratio of scan line 612 relative positions and relative displacement.In addition, utilize the branch chromatic effect of filter and above-mentioned comparison method, can be with certain position of ruddiness (R), green glow (G) and blue light (B) three looks scan line 612 frequently and the width of scan line 612 (being R, G, B three looks overall width frequently), after the focusing via the reflection of above-mentioned a plurality of reflecting optics 204 and camera lens 206, video picture is on three induction born of the same parents (not shown) of charge coupled cell 208 respectively.So,, can assist and revise the imaging definition on the charge coupled cell 208, and do more accurate check and adjust with auxiliary by the relative width and the relative position that calculate scan line 612.
Second embodiment
Seeing also shown in Figure 5ly, is the schematic diagram of a preferred embodiment of the present invention a kind of pattern of judging scan line position and width and the graph of a relation of contrast signal thereof.In the present embodiment, this pattern 510 has one first contrast district 514, the upper limb of this first contrast district 514 is to consult line L3 along one first to extend (extending to the lower right corner by the upper left corner), and the lower edge of first contrast district 514 is to consult line L4 along one second to extend, and first consults line L3 and second consults line L4 and is parallel to each other non-intersectly, and presss from both sides an angle with horizontal direction.In addition, many first line segments 516 are vertically arranged in first contrast district 514 and the wantonly two first adjacent line segments 516 and have an A at interval.Wherein, an end-grain cutting of first line segment is together in the upper limb of this first contrast district 514, and the other end trims in the lower edge of this first contrast district 514 and differs a spacing B in regular turn.Therefore, when intersect scan line 512 and first contrast district 514, a plurality of first contrast signals 520 can be shown on the image capture element, and, the upright position of scan line 512 on test zone can be judged by capturing and compare the horizontal level of the first contrast signal 520 at the image capture element.In addition, present embodiment can also be the geometrical pattern 510 of a symmetry, and it has second contrast district 524 of another symmetry, and this second contrast district 5 24 has many second line segments 526 of vertical arrangement, and is symmetrical with first line segment 516.Therefore, when the left and right sides of scan line 512 intersects at first contrast district 514 and second contrast district 524 respectively, can show one group of contrast signal 520,522, by the relative position that captures and compare this group contrast signal 520,522 (can judge), can judge the relative displacement of scan line 512 equally by the center line of pattern.
In addition, the width of scan line 512 can calculate by a side of above-mentioned pattern 510, its computing formula is as follows: see also shown in Figure 5, when the upper limb of scan line 512 for example intersects at the lower end of X3 bar line segment and/or the upper end of Y3 bar line segment, and the lower edge of scan line 512 is when for example intersecting at the upper end of the lower end of X4 bar line segment and/or Y4 bar line segment, by the original position (for example signal reckling) of contrast signal 520 and width Z=| (X3-X4) B| that final position (for example signal the maximum) can calculate scan line 512 or | (Y3-Y4) B|, wherein | (X3-X4) B| with | (Y3-Y4) B| is the absolute value of line segment pitch difference.
In addition, present embodiment also can utilize the branch chromatic effect of filter and above-mentioned comparison method, the certain position of ruddiness (R), green glow (G) and blue light (B) three looks scan line 512 frequently and the overall width of scan line 512 are measured, use and assist and revise imaging definition on the charge coupled cell of scanning module, and do more accurate check and adjust with auxiliary.
The 3rd embodiment
Seeing also shown in Figure 7ly, is the schematic diagram of a preferred embodiment of the present invention a kind of pattern of judging scan line position and width and the graph of a relation of contrast signal thereof.In the present embodiment, pattern 710 has a contrast zone 714, and-the upper limb of this contrast district 714, lower edge is parallel to each other and press from both sides an angle with horizontal direction.Different with the foregoing description is, the upside of contrast district 714, downside be non-to be vertical line segment and to distribute, and distributes this upper and lower block 714a, 714b and contrast district 714 formation striking contrasts (for example black and white) but be two blocks.Therefore, when scan line 712 intersects with contrast district 714, can show that a contrast signal 720 on the charge coupled cell or on other image capture element, then capture contrast signal 720, and the contrast signal 720 after the acquisition for example is the signal of different voltage/current numerical value.Therefore, can compare and judge the upright position of scan line 712 by this horizontal level that contrasts signal 720.Certainly, present embodiment also can provide the geometrical pattern of a symmetry, and utilizes the principle of symmetry, can judge the relative displacement of the scan line left and right sides.In addition, graph of a relation shown in Fig. 7 below, utilize the branch chromatic effect of filter, can obtain certain position of ruddiness (R), green glow (G) and blue light (B) three looks scan line 712 frequently respectively, to assist and to revise the frequency domain imaging definition on the image capture element of three looks.
The above, it only is preferred embodiment of the present invention, be not that the present invention is done any pro forma restriction, though the present invention discloses as above with preferred embodiment, yet be not in order to limit the present invention, any those skilled in the art, in not breaking away from the technical solution of the present invention scope, when the method that can utilize above-mentioned announcement and technology contents are made a little change or be modified to the equivalent embodiment of equivalent variations, but every content that does not break away from technical solution of the present invention, according to technical spirit of the present invention to any simple modification that above embodiment did, equivalent variations and modification all still belong in the scope of technical solution of the present invention.
Claims (11)
1, the method for measurement of a kind of scan line position and width is characterized in that it may further comprise the steps at least:
One first contrast district is provided, be disposed on the test zone, the upper limb of this first contrast district is to consult line along one first to extend, and the lower edge of this first contrast district is to consult line along one second to extend, wherein this first is consulted line and this second and consults line and be parallel to each other, and with respect to the horizontal direction angle that tilts;
Projection one scan line is on this test zone, and intersect this scan line and this first contrast district, and shows that a plurality of first contrast signals are on an image capture element;
Capture those first the contrast signal, and by those first the contrast signals in the horizontal level at this image capture element place, judge the upright position at this scan line place on this first contrast district; And
Calculate those first contrast signals at the original position and the final position of this image capture element, judge the upper limb of this scan line and down because of width by this first contrast district.
2, the method for measurement of scan line position according to claim 1 and width, it is characterized in that it more comprises provides one second contrast district, is disposed on this test zone, and this second contrast district and this first contrast district are symmetrical.
3, the method for measurement of scan line position according to claim 2 and width, it is characterized in that wherein said scan line also intersects at this second contrast district, and show that those first contrast signals and a plurality of second contrast signals corresponding with those first contrast signals on this image capture element, use and judge the relative displacement of this scan line in this first contrast district and this second contrast district.
4, the method for measurement of the width of two kinds of scan lines is characterized in that it may further comprise the steps at least:
One contrast zone is provided, be disposed on the test zone, the upper limb of this contrast district is to consult line along one first to extend, and the lower edge of this first contrast district is to consult line along one second to extend, wherein this first is consulted line and this second and consults line and be parallel to each other, and with respect to the horizontal direction angle that tilts;
Projection one scan line is on this test zone, and intersect this scan line and this contrast district, and show that a plurality of contrast signals are on an image capture element; And
Capture those contrast signals, and calculate those contrast signals, judge that the upper limb of this scan line and lower edge are at the width by this contrast district at the original position and the final position of this image capture element.
5, a kind of method for measurement of lamp source launching position of scanning module is characterized in that it may further comprise the steps at least:
One first contrast district is provided, be disposed on the test zone, this first contrast district upper limb is to consult line along one first to extend, and this first contrast district lower edge is to consult line along one second to extend, wherein this first is consulted line and second and consults line and be parallel to each other, and with respect to the horizontal direction angle that tilts;
The one scan module is provided, this scanning module has a lamp source, a plurality of reflecting optics, a camera lens and a charge coupled cell, this lamp source is suitable for throwing a light on a test zone, to form the one scan line, intersect this scan line and this first contrast district, and this light is incident upon on those reflecting optics, this camera lens and this charge coupled cell in regular turn, and shows that a plurality of first contrast signals are on this charge coupled cell; And
Capture those first contrast signals, and, judge the upright position at this scan line place on this first contrast district by the horizontal level of those first contrast signals at this image capture element place.
6, the method for measurement of the lamp source launching position of scanning module according to claim 5, it is characterized in that it more comprises provides one second contrast district, is disposed on this test zone, and this second contrast district and this first contrast district are symmetrical.
7, the method for measurement of the lamp source launching position of scanning module according to claim 6, it is characterized in that wherein said scan line also intersects at this second contrast district, and show that those first contrast signals and a plurality of second contrast signals corresponding with those first contrast signals on this charge coupled cell, use and judge the relative displacement of this scan line in this first contrast district and this second contrast district.
8, a kind ofly judge the position of scan line and the pattern of width, it is characterized in that it comprises at least:
One first contrast district, the upper limb of this first contrast district is to consult line along one first to extend, and the lower edge of this first contrast district is to consult line along one second to extend, and wherein this first is consulted line and this second and consult line and be parallel to each other, and with respect to the horizontal direction angle that tilts;
A plurality of first line segments, a side and wantonly two those adjacent first line segments of being vertically arranged in this first contrast district have one at interval, and an end-grain cutting of each those first line segment also differs a spacing in regular turn in the upper limb of this first contrast district together; And
A plurality of second line segments, opposite side and wantonly two those adjacent second line segments of being vertically arranged in this first contrast district have this interval, those second line segments those first line segments that align, and an end-grain cutting of those second line segments is together in the lower edge of this first contrast district and differ this spacing in regular turn.
9, the pattern of the position of judgement scan line according to claim 8 and width, it is characterized in that it more comprises one second contrast district, a plurality of the 3rd line segments and a plurality of the 4th line segments, this second contrast district is symmetrical in this first contrast district, and those the 3rd line segments and those the 4th line segments are symmetrical in those first line segments and those second line segments respectively.
10, a kind ofly judge the position of scan line and the pattern of width, it is characterized in that it comprises at least:
One first contrast district, the upper limb of this first contrast district is to consult line along one first to extend, and the lower edge of this first contrast district is to consult line along one second to extend, and wherein this first is consulted line and this second and consult line and be parallel to each other, and with respect to the horizontal direction angle that tilts; And
A plurality of first line segments, be vertically arranged in this first contrast district and wantonly two those adjacent first line segments and have one at interval, an end-grain cutting of each those first line segment is together in the upper limb of this first contrast district and the other end trims in the lower edge of this first contrast district and differs a spacing in regular turn.
11, the pattern of the position of judgement scan line according to claim 10 and width, it is characterized in that it more comprises one second contrast district and a plurality of second line segments, this second contrast district is symmetrical in this first contrast district, and those second line segments are symmetrical in those first line segments.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 03149651 CN1581920A (en) | 2003-08-04 | 2003-08-04 | Scanning line position and width measuring method and pattern thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 03149651 CN1581920A (en) | 2003-08-04 | 2003-08-04 | Scanning line position and width measuring method and pattern thereof |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN1581920A true CN1581920A (en) | 2005-02-16 |
Family
ID=34579621
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 03149651 Pending CN1581920A (en) | 2003-08-04 | 2003-08-04 | Scanning line position and width measuring method and pattern thereof |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN1581920A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104567724A (en) * | 2013-10-25 | 2015-04-29 | 格哈德舒伯特股份有限公司 | Method and scanner for the non-contact determination of the position and three-dimensional shape of products on a moving surface |
-
2003
- 2003-08-04 CN CN 03149651 patent/CN1581920A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104567724A (en) * | 2013-10-25 | 2015-04-29 | 格哈德舒伯特股份有限公司 | Method and scanner for the non-contact determination of the position and three-dimensional shape of products on a moving surface |
| CN104567724B (en) * | 2013-10-25 | 2019-03-08 | 格哈德舒伯特股份有限公司 | Measure the position of product and the method for 3D shape and scanner in a non-contact manner on face in operation |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN1230873C (en) | Regulating device and method of position deviation optical detecting device | |
| CN1207601C (en) | Confocal point microscope and height measuring method using this | |
| JP3821860B2 (en) | Image reading device | |
| JP3610569B2 (en) | Active confocal imaging device and three-dimensional measurement method using the same | |
| CN1564930A (en) | Three-dimensional measuring apparatus | |
| CN1302280C (en) | Inspection method for foreign matters inside through hole | |
| CN1517702A (en) | Appearance detector and appearance detection method | |
| JP4706356B2 (en) | Screw shape measuring device | |
| JP6368766B2 (en) | Automatic alignment method of object and automatic alignment detection apparatus thereof | |
| CN109813223A (en) | The device and method of optical detection is carried out to the two neighboring surface of object simultaneously | |
| CN106248684A (en) | For detecting Optical devices and the method for the internal flaw of transparent substrates | |
| CN1808527A (en) | Aligning machine | |
| CN1189767C (en) | Imaging device | |
| CN1677093A (en) | Sensor unit and print state inspection apparatus using the same | |
| CN1581920A (en) | Scanning line position and width measuring method and pattern thereof | |
| CN1502220A (en) | Method and an apparatus for measuring positions of contact elements of an electronic component | |
| CN1825095A (en) | Projection test device and method | |
| CN1736135A (en) | Machine suitable for placing a component on a substrate, as well as a method therefor | |
| CN110006921A (en) | A kind of larger radius of curvature spherical optics element automation pose method of adjustment and device | |
| CN101055343A (en) | Resolution-adjustable imaging device | |
| CN1384345A (en) | Automatic measurement system and method for optical characteristics of optical unit | |
| CN1770882A (en) | Digital image analysis test pattern and its making method | |
| CN1761410A (en) | Improvements in or relating to machine vision equipment | |
| KR101809768B1 (en) | Detection method and detection device | |
| CN1620112A (en) | Multifunction target mark |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |