CN1581096A - Adjusting and correcting device and method for infrared screen detection circuit - Google Patents
Adjusting and correcting device and method for infrared screen detection circuit Download PDFInfo
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Abstract
The present invention relates to a regulation calibration device and method for infrared screen detection circuit. Said regulation calibration device includes drive selecting, signal receiving and processing circuit; A/D converter; detection, regulation and calibration control unit for compensating drive current according to detection signal relative reference value; and numerical control circuit for correspondently driving current according to said unit control output. Said invention also provides its regulation calibration method of infrared screen detection circuit, and is mainly applicable to various correlative type or reflective type infrared input and detection devices.
Description
Technical field
The present invention relates to a kind of adjustment calibrating installation and method of infrared screen testing circuit, belong to the computer input technology field.
Background technology
Infrared components in use can wear out, and the luminescence efficiency of radiated element reduces, and the sensitivity of receiving element descends.Compare with infrared receiver component, the radiated element aging speed is faster.Therefore delaying that it is aging, remedy its aging influence that causes to prolong the serviceable life of infrared touch panel, improve the detection computations treatment effeciency of infrared touch panel, is the pursuit always of relevant technologies personnel institute.
The United States Patent (USP) " Method and apparatus for detecting the location of an object on asurface " of authorizing in 1997 (US005635724) in, the input that has begun A/D converter and digital signal processor (DSP) are used for infrared touch panel is handled.
In the Chinese patent of application in 2000 " structure and the method for raising infrared touch screen performance " (00121462.4), luminous with a certain less constant current driven radiated element, in the signal Processing amplifying circuit, comprise the numerical control gain amplifier, and proposed relatively to calculate the method that obtains its gain control data through normalization according to the diode canonical reference value of being stored.
The infrared touch panel of prior art mainly comprises infrared emission component, infrared receiver component and relevant detection circuit.As shown in Figure 1, wherein 101.1～101.N is row N infrared emission component altogether, constitute a radiated element array, infrared receiver component 101 ' .1～102 ' .N constitutes a receiving element array, and radiated element array and receiving element array are collectively referred to as the detecting element array.The Infrared that radiated element sends in the array arrives the receiving element that is arranged on its opposite, and these Infrared form a plane grating.Receiving element is experienced Infrared, exports corresponding photosignal.
Be deep into when carrying out input operation in the infrared plane grating as operating body (as an operator's finger or a pencil etc.), operating body can block the Infrared that certain (some) infrared light-emitting component wherein sends, and therefore the photosignal of corresponding receiving element output changes.Like this, detect the variation of receiving element photosignal, just can detect and have or not operating body to enter in the grating, and can calculate the coordinate position of operating body along continuous straight runs.The detecting element array of above-mentioned along continuous straight runs setting is called the horizontal detection element arrays, and the formed grating of this array is called the horizontal detection grating.Actual infrared touch panel is also wanted detecting operation body coordinate position vertically, therefore also is provided with vertical detecting element array, to form vertical detection grating.Except vertically being provided with, this detecting element array is identical others and aforementioned levels, no longer draws here.
As shown in Figure 1, the testing circuit of prior art comprises that analog switch, drive current restricting circuits, signal collect circuit, signal processing circuit, numerical control gain amplifier and A/D converter.Analog switch is in order to selecting a certain radiated element, and provides drive current so that it is luminous by the drive current restricting circuits to this element.In some prior art scheme, use decoding scheme and current-limiting resistance to replace analog switch and drive current restricting circuits.Signal is collected circuit in order to select or to extract the receiving element photosignal, and this circuit can be the simulating signal coupling transfer circuit of multiselect one analog switch or serial.Signal is collected the photosignal of a certain receiving element that circuit collects and is delivered to signal processing circuit thereupon, and the basic function of signal processing circuit is that ratio is amplified, and also can comprise functions such as anti-interference filtration.The detection signal of signal processing circuit output analog form, this analog detection signal generally are directly proportional with the photosignal of receiving element output.Analog detection signal is delivered to the numerical control gain amplifier, is once amplified according to a certain given gain multiple by the numerical control gain amplifier again, and the signal after the amplification is exported to A/D converter.Detection signal becomes digital form after the A/D conversion, i.e. digital detection signal.
By drive selecting circuit to select j radiated element, can be referred to as j road radiated element or riches all the way penetrates element.The photosignal of i receiving element obtains the corresponding digital detection signal through signal processing circuit to A/D converter, and this detection signal is called i road detection signal or one road detection signal.
As shown in Figure 1, the testing circuit of prior art also comprises the detection adjustment control module that square frame 103 is represented.This detection adjustment control module is responsible for coordinating that control analog switch, signal are collected circuit, A/D converter carries out work, accepts the digital detection signal of A/D converter output simultaneously, and to numerical control gain amplifier output gain control data.
Above-mentioned detection adjustment control module has two kinds of mode of operations, adjust calibration mode of operation following time when being operated in, this unit is finished about the measuring of numerical control gain Amplifier Gain control table data, evaluation work, and at this moment this unit can be one with the other parts equivalent combinations of aforesaid testing circuit and adjusts calibrating installation.When this detection adjustment control module is operated in testing pattern following time, finish to have or not operating body to enter the detection of grating and the evaluation work of coordinate position thereof, also be responsible for every detection computations result is exported to upper equipment.
Upper equipment often is a PC (microsystem), infrared touch panel is used as a kind of input media uses.
There are following shortcoming in aforementioned patent and patented claim and other existing technical scheme:
1, all drive current is set at fixed value on the circuit design, can form awkward situation like this: if the A drive current is bigger, though can stronger anti-ambient light interference performance be arranged at the use initial stage, radiated element is easily aging, the luminous power of majority element is died down very soon, shortened serviceable life; If the B drive current is less, though most of radiated elements also can keep good luminous state after using a period of time, but the luminous power that has indivedual radiated elements dies down, and is subjected to it to influence this infrared screen and can't continues to use, and this has also shortened the serviceable life of this screen;
2, when the luminescence efficiency of certain radiated element too hour, light signal that receives and subsequent detection signal are all more weak, though can adopt the numerical control gain amplifier than high-amplification-factor detection signal is amplified, its signal to noise ratio (S/N ratio) can be too low, the detection error increases, and anti-ambient light interference performance dies down;
3, in the above-mentioned patented claim, relatively calculate its numerical control gain Amplifier Gain control data of acquisition control according to the diode canonical reference value of being stored through normalization, only exporting at the numerical control gain amplifier makes the detection signal amplitude end in agreement on this one-level, still there is bigger otherness in the signal amplitude of its front stage circuits, can't keep consistent works fine state.
Summary of the invention
Purpose of the present invention is exactly in order to overcome the above problems, and proposes new circuit structure and control method, to prolong the mission life of infrared transmitting tube to greatest extent, makes received signal keep good signal-to-noise simultaneously.Another object of the present invention is value at zero point, full scale value calibration steps and the detection signal method for normalizing that proposes detection signal, cooperating the use of aforementioned novel circuit and control method, thereby makes things convenient for follow-up detection computations work.
The present invention realizes the technical scheme of above-mentioned purpose:
A kind of adjustment calibrating installation of infrared screen testing circuit comprises: drive to select circuit, signal to collect circuit, signal processing circuit, A/D converter, it is characterized in that also comprising: the detection adjustment control module that drive current is compensated according to the deviation of the digital detection signal relative reference value of A/D converter output; The numerical control driving circuit of the data output respective drive electric current that transmits according to described detection adjustment control module.
A kind of adjustment calibration steps of infrared screen testing circuit comprises:
A, provide drive current to infrared emission component, and the step that will compare with reference value with infrared receiver component corresponding digital detection signal;
B, adjust the numerical value of drive current, satisfy until described deviation that the deviate limit of setting requires or drive current has reached peaked step according to the deviation between above-mentioned digital detection signal and the reference value;
C, the full scale value of preserving corresponding driving current value and digital detection signal are for the step of using in the follow-up normal input testing.
Adopt technique scheme, in conjunction with the following embodiment that will narrate, the technical progress that the present invention gives prominence to is to start with from the source of problem, the aging speed that the numerical control driving circuit is adjusted drive current: A, delayed all radiated elements in early stage with less drive current is set, B, provide bigger drive current to aging radiated element faster in the later stage, the intensity that it is emitted beam unlikely too a little less than, solve " the shortage problem of bucket ".The whole service life of above circuit and control method energy significant prolongation infrared screen makes detection signal keep higher signal to noise ratio (S/N ratio) simultaneously always.The value at zero point of detection signal proposed by the invention, full scale value calibration steps and detection signal method for normalizing make circuit of the present invention and drive current control method more become suitable, make follow-up detection computations work convenient more.
Description of drawings
Fig. 1 is the synoptic diagram of the infrared touch panel circuit structure of prior art;
Fig. 2 is the synoptic diagram of infrared touch panel circuit structure of the present invention;
Fig. 3 is the front schematic view that sniffer is set on the information equipment table top of using infrared screen;
Fig. 4 is the left side synoptic diagram that sniffer is set on the information equipment table top of using infrared screen;
Fig. 5 is the front schematic view that sniffer is set in the infrared screen framework;
Fig. 6 is the left side synoptic diagram that sniffer is set in the infrared screen framework;
Fig. 7 is the schematic flow sheet to the adjustment and the calibration of horizontal detection element arrays and interlock circuit thereof;
Embodiment
The synoptic diagram of the infrared touch panel circuit structure of present embodiment as shown in Figure 2.Fig. 2 and Fig. 1 are contrasted, and technical scheme of the present invention has been carried out following change and improvement:
A, save the numerical control gain amplifier among Fig. 1, the amplification coefficient of signal processing circuit has been set at suitable fixed numbers;
In B, the prior art, not only analog switch can be used to radiated element alternatively and selects circuit with the driving that drive current is provided to it, triode array, open collector output decoding scheme etc. all can be in order to finish this function, therefore represent to comprise the above-mentioned various related circuits of analog switch with driving the selection circuit among Fig. 2, make the element of this circuit select for use scope to become wideer;
C, as shown in Figure 2, the drive current restricting circuits of prior art is replaced by the numerical control driving circuit shown in the frame of broken lines 21 here.This numerical control driving circuit comprises two parts: the one, and D/A converter, the detection adjustment control module of input termination square frame 203 representatives of this D/A converter is digital control to accept it.Another part of the output termination numerical control driving circuit 21 of D/A converter, i.e. drive current amplifying circuit.The output current of D/A converter is generally all smaller, is unsuitable for directly providing drive current, needs this drive current amplifying circuit to carry out electric current and amplifies.Drive current amplifying circuit among Fig. 2 generally is provided with outside D/A converter specially, also can be integrated within the D/A converter chip, and both are integrated, and at this moment D/A converter can be directly or provided drive current through resistance in series etc. to radiated element.D/A converter (also comprising PWM-type, i.e. PWM type D/A converter) and drive current amplifying circuit all belong to prior art.
Square frame 203 among D, Fig. 2 is represented the detection adjustment control module of technical solution of the present invention, but the detection adjustment control module 103 in the prior art scheme shown in this unit and Fig. 1 has very big difference.This detection adjustment control module 203 is operated in adjusts calibration mode of operation following time, according to the digital detection signal and the compensation rate of the deviation calculation between the following reference value that will illustrate of A/D converter output to drive current, thus with testing circuit other parts equivalent combinations be an adjustment calibrating installation that calculates the drive current of adjustment radiated element.Be described in detail among the concrete detection of the detection adjustment control module of technical solution of the present invention and the adjustment calibration operation method embodiment 2 below.
Be provided with special-purpose microprocessor in E, the infrared screen testing circuit, the detection adjustment control module 203 among Fig. 2 is to be formed by this special microprocessor and relevant procedures equivalence, also can comprise other relevant with it digital circuit.If the working method of testing circuit is that some intermediate data is sent to upper equipment, its follow-up evaluation work is partly or entirely born by the processor in the upper equipment, and then this detection adjustment control module 203 has also comprised this part work and the relevant calculation program of the processor in this upper equipment.A/D converter and D/A converter can be discrete, also can be integrated within the special microprocessor.
Will narrate among F, the next embodiment and how circuit and parameter be adjusted and calibrated, adjust and calibrate and not have operating body near (not only not entering, and to leave fully distance far away, and such as 20 millimeters) carry out under the situation of aforementioned echelette.Can be provided with on the information equipment table top 302 of infrared screen framework 301 or sniffer 201 is being set near it approaching in order to exploration operation body or operator as shown in Figure 3.This sniffer can be the passive infrared formula sniffer or the reflective infrared detection device of similar infrared anti-theft alarm device, also can be the reflecting type ultrasonic sniffer.Fig. 3 is a front schematic view, and wherein 306 is windows of infrared screen.Fig. 4 is the left side synoptic diagram, has drawn among two figure and has been provided with the situation of 4 sniffers altogether, and the dotted line of drawing from each sniffer among the figure is represented the detection angular field of view of this device.The another kind of set-up mode of sniffer as shown in Figure 5 and Figure 6, wherein Fig. 5 is its front schematic view, Fig. 6 be its left side synoptic diagram, 301 still represent the infrared screen framework among two figure, sniffer 201 is arranged in the infrared screen framework 301.
In electrical block diagram shown in Figure 2, set sniffer 201 is used ellipse representation, and its detectable signal sends to and detects adjustment control module 203.When not having operator or operating body to be near the infrared screen, the corresponding detectable signal of above-mentioned sniffer is in a kind of state, detect the adjustment control module and change the adjustment calibration mode of operation in view of the above over to, control relevant circuit and device and carry out adjustment described in the following embodiment and calibration.As operator or operating body during near infrared screen (operating body does not also enter level or vertically detects grating), at first being detected device 201 detects, its corresponding detectable signal is in another kind of state, detect the adjustment control module and change the testing pattern in view of the above over to, control relevant circuit and device and change normal input testing state over to.
Aforementioned sniffer not necessarily will be provided with 4, investigative range can with respect to situation under, be provided with 1 and get final product.The position is set also can selects arbitrarily of sniffer such as in infrared screen framework or other position of using the information equipment of this infrared screen, also can be arranged on other contiguous position or device, the facility, on neighbouring support or body of wall.
Embodiment 2
The adjustment calibration steps of present embodiment narration testing circuit might as well be directly proportional with the photosignal of receiving element output by the hypothetical simulation detection signal, because A/D converter is linear, digital detection signal also is directly proportional with it.
At first introduce the parameter characteristic of existing infrared emission component and receiving element.The luminescence efficiency parameter of infrared emission component is big more, and the infrared light that sends under identical drive current is strong more.The photoelectric sensitivity coefficient of receiving element is big more, and the photosignal of exporting when experiencing the infrared light of same intensity is strong more.Thereby under identical drive current, the increase of the increase of the luminescence efficiency parameter of infrared emission component or the photoelectric sensitivity coefficient of receiving element all can make detection signal produce extra increase thereupon.Vice versa.
The parameter of components and parts always disperses, and after the production technology burn-in screen, the luminescence efficiency parameter of infrared emission component and the photoelectric sensitivity coefficient of receiving element all can be controlled in its maximum permissible value and minimum permissible value scope separately.Certainly, this luminescence efficiency parameter and photoelectric sensitivity coefficient all can be along with the working time reduces gradually.
The basic ideas of adjusting calibration steps are:
I, initial using in testing can make infrared signal reach the drive current lower limit I of testing minimum requirements
0It is luminous to drive radiated element as initial value, delaying the aging decay of infrared emission component luminescence efficiency parameter, thereby has prolonged good attitude working hour of this radiated element.
II, along with the reduction of radiated element luminescence efficiency parameter, increase the corresponding compensation amount to drive current, constant substantially to keep the infrared light intensity that this radiated element sent, thereby the later stage that has prolonged this radiated element can use the period.On the whole, be able to remarkable increase the serviceable life of infrared emission component.
III, respectively preserve each road detection signal zero point value and full scale value to determine the range ability of each road detection signal, solve the discrete formed detection signal range discrete discrepancy of each receiving element parameter and radiated element parameter.
Zero point of detection signal, value was the detected signal value of all radiated elements when all not luminous, i.e. value secretly.The dark current coefficient of the discrete and receiving element of zero point value and photoelectric sensitivity coefficient discrete relevant.
The full scale value of certain detection signal is that the amplitude that a radiated element is luminous and do not have operating body to block this detection signal under the situation of this Infrared, promptly bright value are arranged.In fact, the Infrared that infrared components sends is dispersed propagation with taper, and as shown in Figure 2, the light that radiated element sends can be experienced by adjacent a plurality of receiving elements.If certain receiving element is just relative with luminous radiated element, then corresponding detection signals can be described as the positive axis detection signal, and its full scale value is the positive axis full scale value of this detection signal; Otherwise be off-axis detection signal, off-axis full scale value.The luminescence efficiency parameter of the discrete and radiated element of detection signal full scale value and the photoelectric sensitivity coefficient of receiving element discrete relevant.
Aspect circuit design and selection of parameter, basic skills is:
A, suitably the numerical control driving circuit in the design implementation example 1 has a related parameter, makes D/A converter be output as maximal value D
MThe time, the maximum drive current I of drive current amplifying circuit output
DMThe maximum that is equal to or slightly less than (such as little by 5%) infrared emission component allows drive current I
MAforementioned drive current lower limit I as the drive current initial value
0Can determine according to experiment, generally be chosen as I
MSome/one, such as 1/10,1/5 or 1/2.
B, a pair of infrared emission component of selection and receiving element, its luminescence efficiency parameter and photoelectric sensitivity coefficient separately all equals its maximum permissible value separately, and this a pair of infrared components is oppositely arranged according to the practical application condition.Suitably the related parameter that has of signal processing circuit and A/D converter is solidified in design, the feasible drive current I that provides to selected radiated element
DBe I
0The time, with selected receiving element relevant detection signal U
TAmplitude be slightly less than the full scale value U of (such as little 3% or 10%) A/D converter
M, the detection signal U of this moment
TAmplitude be called the high-end reference value U of detection signal
RT
C, select a pair of infrared emission component and receiving element again, its luminescence efficiency parameter and photoelectric sensitivity coefficient separately all equals its minimum permissible value separately, and this a pair of infrared components is oppositely arranged according to the practical application condition.Provide drive current I to selected radiated element this moment
0, then with selected receiving element relevant detection signal U
TAmplitude be called the low side reference value U of detection signal
RB
D, As time goes on, radiated element is aging, and its luminescence efficiency parameter reduces gradually, and the amplitude of detection signal also reduces thereupon, need carry out aforesaid compensation to drive current.Whether the measuring and calculating component parameters decay and attenuation degree thereof have taken place, and feasible method is the reference value U of a predetermined detection signal
R, and by comparison,, increase the corresponding compensation amount to drive current according to the detection signal extent of deviation of this reference value relatively with the detection signal that records.Detection signal reference value U
RCan be chosen for the full scale value U that is slightly less than (such as little 3% or 10%) A/D converter in principle
MArbitrary value, generally should be selected in aforementioned low side reference value U
RBWith high-end reference value U
RTIn the interval of defining, particularly to choose U
RTAnd U
RBMean value (U
RT+ U
RB)/2 are for well, and the corresponding detection signals value when this corresponding luminescence efficiency parameter and photoelectric sensitivity coefficient are all got the mean value of its maximum permissible value and minimum permissible value is because U
RBOften be designed to satisfy the detection signal lower limit of signal to noise ratio (S/N ratio) and anti-interference requirement.U
RValue is chosen greatlyyer, and drive current can be dressed to the higher value adjustment, and detection signal signal to noise ratio (S/N ratio) and antijamming capability are just strong more, but the radiated element aging speed is also just fast more.
Selected reference value U
RAfter, a kind of detailed process of adjusting and calibrating is:
1), all sets the drive current variable I of a correspondence to each road radiated element
D(); By drive selecting circuit to select certain radiated element, and with the drive current variable I of correspondence
D() value outputs to the D/A converter of numerical control driving circuit, has promptly exported drive current I to this road radiated element
D().With each road drive current variable I
DThe initial value of () all is set at I
0
2) not to the radiated element output driving current, all radiated elements are all not luminous, are worth U the zero point that measures each detection signal
0() also preserved;
3) select a radiated element, such as the 1st radiated element, to its output driving current I
D(1) make it luminous, the 1 road detection signal that measures corresponding the 1st receiving element is U
T(1), calculates detection signal Z-factor k=U
R/ U
T(1);
4) if k＜1.05 illustrate that detection signal relative reference value is less than normal less than 5%, can drive current not compensated, keep I
D(1) be that initial value is constant, directly with U
T(1) as the full scale value U of first via detection signal
F(1) preserves, finish adjustment and calibration first via parameter;
5) if k 〉=1.05 illustrate that detection signal relative reference value is less than normal more than 5%, if I is arranged simultaneously
D(1) less than aforementioned maximum drive current I
DM, then make I
D(1) value is former I again
D(1) multiply by k, increase the compensation rate of corresponding proportion to drive current, and return step 3);
6) if k 〉=1.05, and I
D(1) is not less than aforementioned maximum drive current I
DM, illustrating that drive current has reached maximal value, can't compensate again, then keep I
D(1) be that initial value is constant, directly with U
T(1) as the full scale value U of first via signal
F(1) preserves, finish adjustment and calibration first via parameter; (soon terminate the serviceable life that enters this step explanation infrared components)
7) to other road radiated element and corresponding detection signal thereof, finish similar step 3), 4), 5) and 6) collection, calculating and adjustment process.
Under the situation of total N radiated element and N road detection signal, the process flow diagram of above-mentioned adjustment and calibration process as shown in Figure 7.
If not adjusting and calibrate for the first time, in similar above-mentioned steps 1) in, also can be with each drive current variable I of past preservation
D() value is as corresponding initial value, not necessarily at every turn all from being set at I
0Beginning.
Above-mentioned steps 4), 5) and 6) in judge whether need to give drive current variable I
D() can be definite by experiment and experience with the detection signal deviate of compensation rate limit (being taken as 5% here), also can be taken as other value, and such as 1% or 10% etc., it is a bit value of corresponding A/D converter that this deviate is limit minimum value.Under the abundant little situation of the value of this deviate limit, the full scale value of each road detection signal all value is a reference value, just reference value is preserved as the full scale value of each road detection signal.
Above-mentioned comparison and compensation process be only at detection signal less than reference value and reach or exceed under the situation of deviate limit drive current is increased compensation, greater than situation nextly drive current is not cut down, this has solved luminescence efficiency parameter and the photoelectric sensitivity coefficient that component ageing causes and has reduced problem.If the reference value choosing is less, such as electing low side reference value U as
RB, have the multichannel detection signal in the initial use period of infrared screen and be higher than reference value, this means corresponding I
D() initial value can obtain and compare I
0Smaller again, if can add the step of turning respective drive electric current and detected signal value down, the corresponding detection signals value also can and be controlled in the permissible variation near reference value, delaying the aging effect of radiated element can be better.In the step 4) of above-mentioned adjustment calibration process, whether should judge a k more like this, not carry out any compensating operation greater than then same k＜1.05 are the same, otherwise make I greater than 0.95
D(1) value is former I again
D(1) multiply by k, make it to reduce for drive current with the negative compensation rate of corresponding proportion, and return step 3).
Aforesaid relatively computing method are division arithmetic, also can compare with subtraction, and correspondingly the computing to the drive current variable amount of affording redress promptly becomes additive operation.Also can with＜judge to change into≤, general 〉=judgement changes into＞.
After above-mentioned adjustment and calibration, obtain drive current variate-value I respectively
DAre worth U at (), zero point
0(), full scale value U
F() three groups of data.Import normally afterwards in the testing process, the drive current of exporting to i radiated element is through adjusting the resulting drive current variate-value I of calibration
D(i) value, the i road detection signal U that obtains
T(i) will be positioned at and be worth U zero point
0(i) and full scale value U
F(i) on the interval of being defined, this closed interval promptly is defined as adjusting next time the preceding detection signal U of calibration
T(i) range ability.
If also need to consider the off-axis detection signal in input in the detection computations, then above-mentioned steps 4) and step 6) in preserve the positive axis full scale value except measuring, also need to measure each off-axis full scale value of preservation.Through after adjusting and calibrating, obtain drive current variate-value I respectively like this
DAre worth U at () array, zero point
0() array and NN full scale value matrix U
F().Above-mentioned adjustment calibration process is to compare with positive axis detection signal and reference value, also can compare, but dual mode compares with the off-axis detection signal, with the former for well.
If the value at zero point of detection signal all very little (being approximately 0) can be ignored, then the operation of all above-mentioned preservation values at zero point can be save and do not done, or with each at zero point value get 0.
To the processing and utilizing aspect of detection signal, detection signal can be pressed the linear process utilization, or press secondary or its calculating of the laggard Xingqi of cubic curve match.For the convenience of subsequent calculations, can carry out normalized to detection signal earlier.I road detection signal U
T(i) the normalization numerical value to its positive axis full scale value is:
U T(i)＝[U
T(i)-U
0(i)]/[U
F(i)-U
0(i)]
U wherein
F(i)-U
0(i) represent the detection signal range,
U T(i) scope is 0～1, has just had comparability between each road detection signal like this, after the normalization, can finish with the unified calculating formula of a cover the computing of each road signal, and each parameter and standard is also general to each road signal unanimity.Certainly, also can carry out normalization, such as the precentagewise mode according to other scale-up factor.Detection signal is similar to following formula to the normalization calculating of off-axis full scale value, repeats no more.If the zero point of detection signal, value was all very little, can ignore, can be worth U each zero point in the then above-mentioned normalization calculating formula
0() gets 0, thereby should delete from this formula and need not get final product by item, and the detection signal range ability also just correspondingly all becomes U
F()～0.
Aforementioned adjustment and Calibration Method and detailed process are equally applicable to vertical detecting element array and interlock circuit thereof.
Technical scheme of the present invention and embodiment not only can be used for infrared touch panel, also can be used for other various infrared correlations or reflective pick-up unit, such as industrial infrared detection switch with exempt from touch infrared input media and equipment.
Claims (10)
1, a kind of adjustment calibrating installation of infrared screen testing circuit comprises: drive to select circuit, signal to collect circuit, signal processing circuit, A/D converter, it is characterized in that also comprising: the detection adjustment control module that drive current is compensated according to the deviation of the digital detection signal relative reference value of A/D converter output; The numerical control driving circuit of the data output respective drive electric current that transmits according to described detection adjustment control module.
2, the adjustment calibrating installation of a kind of infrared screen testing circuit as claimed in claim 1 is characterized in that also comprising to described detection adjustment control module output whether the sniffer of operating body near the detectable signal of infrared screen is arranged.
3, the adjustment calibrating installation of a kind of infrared screen testing circuit as claimed in claim 1 is characterized in that described numerical control driving circuit comprises D/A converter.
4, a kind of adjustment calibration steps of infrared screen testing circuit comprises:
A, provide drive current to infrared emission component, and the step that will compare with reference value with infrared receiver component corresponding digital detection signal;
B, adjust the numerical value of drive current, satisfy until described deviation that the deviate limit of setting requires or drive current has reached peaked step according to the deviation between above-mentioned digital detection signal and the reference value;
C, the full scale value of preserving corresponding driving current value and digital detection signal are for the step of using in the follow-up normal input testing.
5, the adjustment calibration steps of a kind of infrared screen testing circuit as claimed in claim 4 is characterized in that also comprising to multichannel infrared emission component and infrared receiver component the detection signal all adjustment carried out of repeating step A, B, C and the step of calibration.
6, the adjustment calibration steps of a kind of infrared screen testing circuit as claimed in claim 5 is characterized in that near the step of only carrying out described adjustment and calibration when operating body is not in the infrared screen.
7, the adjustment calibration steps of a kind of infrared screen testing circuit as claimed in claim 4, it is characterized in that the corresponding save value after maximum that the drive current value described in the steps A equals infrared emission component allows P/one of drive current or last time adjusted calibration, wherein P is the natural number more than or equal to 2.
8, the adjustment calibration steps of a kind of infrared screen testing circuit as claimed in claim 4 is characterized in that the reference value described in the steps A is for all equaling its amplitude of detection signal during the mean value of maximum permissible value and minimum permissible value separately when infrared radiated element luminescence efficiency parameter and receiving element photoelectric sensitivity coefficient.
9, the adjustment calibration steps of a kind of infrared screen testing circuit as claimed in claim 4, it is characterized in that also comprising preserve the corresponding digital detection signal zero point value for the step of using in the follow-up normal input testing.
10, the adjustment calibration steps of a kind of infrared screen testing circuit as claimed in claim 4 is characterized in that also comprising with detection signal its full scale value and range that zero point, value the was defined step of carrying out normalization calculating relatively.
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| CN 03140105 CN1581096A (en) | 2003-08-06 | 2003-08-06 | Adjusting and correcting device and method for infrared screen detection circuit |
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| CN (1) | CN1581096A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112083833A (en) * | 2020-09-11 | 2020-12-15 | 广州华欣电子科技有限公司 | Gain adjustment method, device, equipment and storage medium of infrared touch screen |
| CN113901967A (en) * | 2021-12-08 | 2022-01-07 | 浙江啄云智能科技有限公司 | Imaging processing method and device of intelligent security check machine and computer readable storage medium |
-
2003
- 2003-08-06 CN CN 03140105 patent/CN1581096A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112083833A (en) * | 2020-09-11 | 2020-12-15 | 广州华欣电子科技有限公司 | Gain adjustment method, device, equipment and storage medium of infrared touch screen |
| CN113901967A (en) * | 2021-12-08 | 2022-01-07 | 浙江啄云智能科技有限公司 | Imaging processing method and device of intelligent security check machine and computer readable storage medium |
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