CN1560643A - Semi-wave impulse current automatic testing device of pressure-sensitive resistor disc - Google Patents
Semi-wave impulse current automatic testing device of pressure-sensitive resistor disc Download PDFInfo
- Publication number
- CN1560643A CN1560643A CNA2004100258876A CN200410025887A CN1560643A CN 1560643 A CN1560643 A CN 1560643A CN A2004100258876 A CNA2004100258876 A CN A2004100258876A CN 200410025887 A CN200410025887 A CN 200410025887A CN 1560643 A CN1560643 A CN 1560643A
- Authority
- CN
- China
- Prior art keywords
- piezoresistive wafer
- test
- wave
- current automatic
- impulse current
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
The invention is an impacting current automatic testing device based on voltage dependent resistor, which includes booster and a transformer connected to the booster. One end of the transformer is connected to the input ends of the controllable switch to the positive and negative electrodes, the control input end of the controllable switch is connected to the pulse transformer, the output end of the controllable switch is connected to the high voltage testing electrode, the low voltage testing electrode is also connected to the half-wave testing and controlling units, there arranges a punch tape transmitting mechanism and detecting mechanism connected to the half-wave testing and controlling unit on the control desk. The invention sends the punch tape carrying voltage dependent resistor into the detecting mechanism through the half-wave testing and controlling unit, when the photoelectric detector on of the detecting mechanism detects the leading line of the voltage dependent resistor, the half-wave testing and controlling unit send out testing signal, and push the electric magnet to drive the rotary block to rotate, the high voltage electrode and the low voltage electrode are connected with the voltage dependent resistor leading wires, and starts the automatic test.
Description
Technical field
The invention belongs to piezoresistive wafer electric performance test device, particularly a kind of half sine-wave impulse current automatic testing equipment based on piezoresistive wafer.
Background technology
IEC and GB regulation: each zinc oxide valve plate that dispatches from the factory should be the discharge capacity resistance test through the screening of 2ms square wave all.The discharge capacity resistance test of piezoresistive wafer normally adopts the 2ms dash current generating means of zinc oxide resistance sheet to take a sample test, and defective piezoresistive wafer can not screen fully.Up to the present, also there is not efficiently, can be specifically designed to the discharge capacity resistance test proving installation of voltage dependent resistor (VDR).The 2ms dash current generating means of piezoresistive wafer employing ZnO resistors is tested and had following shortcoming: (1) structure is huge, complicated, and the artificial transmission line who needs many electric capacity and inductance to form forms the 2ms square wave; (2) testing efficiency is low, and the speed of this test mostly is tens of/minutes most; (3) working strength is big, because the 2ms square wave is a unipolar single pulse ripple, carry out the energy test of positive and negative two polarity to voltage dependent resistor (VDR), and the process complexity wastes time and energy; (4) cost height, this test mode need adopt PLC and a plurality of pneumatic element to finish control procedure, so the cost of equipment is higher.
Summary of the invention
The object of the present invention is to provide a kind of high efficiency, high reliability and half sine-wave impulse current automatic testing equipment based on piezoresistive wafer that can in big production, use.
For achieving the above object, technical scheme of the present invention is: comprise pressure regulator and be arranged in the control desk support and the joining transformer of pressure regulator, an end that is characterized in transformer links with the input end of the gate-controlled switch of gate-controlled switch that is arranged on the antiparallel positive polarity in the control desk support and negative polarity, the control input end of the gate-controlled switch of positive polarity and the gate-controlled switch of negative polarity links with the pulse transformer that is arranged in the control desk support, the output terminal of positive polarity gate-controlled switch and negative polarity gate-controlled switch links to each other with the Hi-pot test electrode that is connected in the piezoresistive wafer lead-in wire, another lead-in wire of piezoresistive wafer is connected with the low voltage experiment electrode, the low voltage experiment electrode also links with control module with the half-wave test, on the control desk support, also be provided with the paper tape transport sector that transmits piezoresistive wafer and with half-wave test and the joining testing agency of control module, the Photoelectric Detection head of testing agency is arranged on the both sides of piezoresistive wafer.
Another characteristics of the present invention are: testing agency comprises sliding electromagnet and rotating switch block that is connected with sliding electromagnet and the Photoelectric Detection head that is installed on preceding photometer head support and the back photometer head support, and the Hi-pot test electrode and the low voltage experiment electrode of piezoresistive wafer are installed on the switch block respectively; The paper tape transport sector comprises drive motor that is arranged on piezoresistive wafer one side and the transmission gear that is connected with the output shaft of drive motor, transmission gear is by transmission shaft and walk belt wheel and drive the conduction band body motion be arranged on the conduction band body support frame, the conduction band body is provided with the piezoresistive wafer band that piezoresistive wafer is installed, and the piezoresistive wafer band is arranged in the conduction band body groove on the control desk support; The paper tape transport sector also comprises the pinch roller that is used to compress the piezoresistive wafer band that is arranged on the piezoresistive wafer opposite side, and pinch roller is fixed on the control desk support by the pinch roller support; The half-wave test comprises by the joining test model and parameter and online demonstration test of being provided with of communication interface with control module carries out MPT display terminal able to programme, computer control unit, the overcurrent comparing unit of process and the PLC control able to programme of sending test signal to computer control unit, and low voltage experiment electrode and computer control unit and overcurrent comparing unit link and the dash current that passes through in the piezoresistive wafer in the test process is sent into microcomputer measurement and control module and overcurrent comparing unit; Testing agency also comprises and joining bad sheet marking device of PLC control able to programme and pulling attachment; Also be provided with on the voltage dependent resistor (VDR) band of paper tape transport sector and prevent that the voltage dependent resistor (VDR) band from deviating from the pressing plate of conduction band body groove; Also be provided with insulcrete on the conduction band body of paper tape transport sector; On the control desk support of paper tape transport sector both sides, also be provided with the feeding platen and the platen that connects material.
Because spattering examination by half-wave, the present invention sends into testing agency with the paper tape that control module control step motor-driven three cover paper tape connecting gears will be loaded with piezoresistive wafer, when the Photoelectric Detection head of testing agency detects the piezoresistive wafer lead-in wire, the half-wave test is just sent test signal with control module, sliding electromagnet drives switch block and rotates, high-field electrode and low-field electrode are connected with the voltage dependent resistor (VDR) lead-in wire respectively, and beginning is test automatically.Have multinomial functions such as photoelectricity is located automatically, discharge automatically, the automatic rejecting of bad sheet, can satisfy the demand of the big production of non-linear metal oxide piezoresistive wafer.It is simple in structure, easy to operate, good reliability, efficient height, and the robotization that can be quickly and accurately carry out dash current discharge capacity tolerance performance to non-linear metal oxide piezoresistive wafer detects.
Description of drawings
Fig. 1 is an one-piece construction synoptic diagram of the present invention;
Fig. 2 is a vertical view of the present invention;
Fig. 3 is the structural representation of testing agency 6 of the present invention, and wherein Fig. 3 (a) is the front view of testing agency 6, and Fig. 3 (b) is the side view of testing agency 6;
Fig. 4 is the structural representation of paper tape transport sector 15 of the present invention;
Fig. 5 is the structured flowchart of half-wave test of the present invention and control module 7;
Fig. 6 is the process flow diagram of half-wave test of the present invention and control module 7.
Specific embodiments
Below in conjunction with accompanying drawing structural principle of the present invention and principle of work are described in further detail.
Referring to Fig. 1, the present invention includes pressure regulator 10 and with pressure regulator 10 joining transformers 11, one end of transformer 11 links with the input end of the gate-controlled switch 4 of gate-controlled switch 3 that is arranged on the antiparallel positive polarity in the control desk support 1 and negative polarity, the other end ground connection of transformer 11, the control input end of the gate-controlled switch 3 of positive polarity and the gate-controlled switch 4 of negative polarity links with the pulse transformer 2 that is arranged in the control desk support 1, the output terminal of positive polarity gate-controlled switch 3 and negative polarity gate-controlled switch 4 links to each other with the Hi-pot test electrode 19 that is connected in piezoresistive wafer 9 lead-in wires, another lead-in wire of piezoresistive wafer 9 is connected with low voltage experiment electrode 20, low pressure is spattered examination electrode 20 and is also linked with half-wave test and control module 7, on control desk support 1, also be provided with the three cover relay paper tape transport sectors 15 that transmit piezoresistive wafer 9 and with half-wave test and control module 7 joining testing agencies 6.
Referring to Fig. 5, half-wave test of the present invention comprises by the joining test model and parameter and online demonstration test of being provided with of communication interface with control module 7 carries out MPT display terminal 34 able to programme, computer control unit 36, the overcurrent comparing unit 37 of process and the PLC control 35 able to programme of sending test signal to computer control unit 36, and low voltage experiment electrode 20 is with computer control unit 36 and overcurrent comparing unit 37 links and the dash current that passes through in the piezoresistive wafer in the test process 9 is sent into microcomputer measurement and control module 36 and overcurrent comparing unit 37.
Referring to Fig. 2,3,4, testing agency 6 of the present invention comprise sliding electromagnet 22 and the rotating switch block that is connected with sliding electromagnet 22 23 and be installed in before Photoelectric Detection 24 on photometer head support 17 and the back photometer head support 5, Photoelectric Detection 24 is arranged on the both sides of piezoresistive wafer 9, the Hi-pot test electrode 19 of piezoresistive wafer 9 and low voltage experiment electrode 20 are installed in respectively on the switch block 23, and testing agency 6 also comprises control 35 joining bad sheet marking device 13 and the pulling attachments 14 able to programme with PLC.Paper tape transport sector 15 comprises drive motor 29 that is arranged on piezoresistive wafer 9 one sides and the transmission gear 28 that is connected with the output shaft of drive motor 29, transmission gear 28 is by transmission shaft 30 and walk belt wheel 27 and drive conduction band body 21 motions that are arranged on the conduction band body support frame 26, also be provided with insulcrete 25 on the conduction band body 21, front end at insulcrete 25 also is provided with the piezoresistive wafer band 31 that piezoresistive wafer 9 is installed, piezoresistive wafer band 31 is arranged in the conduction band body groove 8 on the control desk support 1, at the pinch roller 32 that is used to compress piezoresistive wafer band 31 of piezoresistive wafer 9 opposite sides, pinch roller 32 is fixed on the control desk support 1 by pinch roller support 33.Also be provided with on the voltage dependent resistor (VDR) band 31 and prevent that voltage dependent resistor (VDR) band 31 from deviating from the pressing plate 18 of conduction band body groove 8.On the control desk support 1 of paper tape transport sector 15 both sides, also be provided with the feeding platen 16 and the platen 12 that connects material.
During test, the pattern of test and the setting of parameter realize by MPT display terminal 34 able to programme, in the test run process, MPT display terminal 34 able to programme links by communication interface and PLC Programmable Logic Controller 35, on the one hand procedure parameter is passed to PLC Programmable Logic Controller 35, on the other hand the process that online demonstration test is carried out on the display screen of MPT display terminal 34 able to programme.
After the pattern of test and parameter setting are finished, piezoresistive wafer band 31 on the feeding platen 16 is packed in the conduction band body groove 8, the effect of conduction band body 21 is to transmit piezoresistive wafer band 31, pinch roller 32 compresses piezoresistive wafer band 31,15 work of three cover relay paper tape transport sectors, 28 motions of drive motor 29 district's nutating gears, transmission gear 28 drives belt wheel 27 motions by transmission shaft 30, drives piezoresistive wafer band 31 then and travels forward.The effect of pressing plate 18 is to prevent that piezoresistive wafer band 31 from deviating from conduction band body groove 8.The effect of pinch roller support 33 is fixing pinch rollers 32, and the effect of conduction band body support frame 26 is fixing conduction band bodies 21.When the piezoresistive wafer on the piezoresistive wafer band 31 9 moves to Photoelectric Detection 24 positions, Photoelectric Detection 24 job, Photoelectric Detection 24 is supported by preceding photometer head support 17 and back photometer head support 5, when Photoelectric Detection 24 detects piezoresistive wafer 9 lead-in wires, sliding electromagnet 22 adhesives, drive switch block 23 and rotate, Hi-pot test electrode 19 and low voltage experiment electrode 20 are connected with two lead-in wires of piezoresistive wafer 9 respectively.After Programmable Logic Controller 35 detects Photoelectric Detection 24 test signal of sending here simultaneously, send the test commencing signal to computer control unit 36, after computer control unit 36 is finished impulse detection to a piezoresistive wafer 9, send piezoresistive wafer band 31 transportable information to PLC Programmable Logic Controller 35, the delivery mechanism of piezoresistive wafer band 31 is just started working.If in the process of shock-testing, dash current by piezoresistive wafer 9 surpasses the current value of setting, 37 work of overcurrent comparing unit, send bad sheet information to PLC Programmable Logic Controller 35, PLC Programmable Logic Controller 35 is just handled by bad sheet marking device 13 or bad sheet of 14 pairs of tests of pulling attachment.
Referring to Fig. 6, the present invention's branch positive polarity half-wave impulse test, negative polarity half-wave impulse test and negative down alternately three kinds of test models of half-wave impulse test illustrate the control procedure in the half-wave shock-testing:
(1) positive polarity half-wave impulse test: after PLC Programmable Logic Controller 35 receives Photoelectric Detection 24 test signal of sending here, computer control unit 36 begins to detect sinusoidal wave positive half cycle zero point, when detecting positive half cycle during zero point, the half-wave test is sent trigger pip by pulse transformer 2 to forward gate-controlled switch 3 with control module 7, the positive half cycle of connecting sine power supply carries out the positive polarity test to piezoresistive wafer 9, if computer control unit 36 detects piezoresistive wafer 9 qualified (not overcurrent), just send piezoresistive wafer band 31 transportable information to PLC Programmable Logic Controller 35, then PLC Programmable Logic Controller 35 sends steering order and drives the motion of test product delivery mechanism; If computer control unit 36 detects piezoresistive wafer defective (overcurrent), 37 work of overcurrent comparing unit, send bad sheet information to PLC Programmable Logic Controller 35, PLC Programmable Logic Controller 35 sends instruction, bad sheet marking device 13 or pulling attachment 14 work on the one hand, bad sheet is handled, on the other hand, sent the information that transports of piezoresistive wafer band 31.
(2) negative polarity half-wave impulse test: after PLC Programmable Logic Controller 35 receives Photoelectric Detection 24 test signal of sending here, computer control unit 36 begins to detect sinusoidal wave negative half period zero point, when detecting negative half period during zero point, the half-wave test is sent trigger pip by pulse transformer 2 to negative sense gate-controlled switch 4 with control module 7, the negative half period of connecting sine power supply carries out the negative polarity test to piezoresistive wafer 9, if computer control unit 36 detects piezoresistive wafer qualified (not overcurrent), just send piezoresistive wafer band 31 transportable information to PLC Programmable Logic Controller 35, then PLC Programmable Logic Controller 35 sends steering order and drives the motion of test product delivery mechanism; If computer control unit 36 detects piezoresistive wafer defective (overcurrent), 37 work of overcurrent comparing unit send bad sheet information to PLC control 35 able to programme, and instruction is sent in PLC control 35 able to programme, bad sheet marking device 13 or pulling attachment 14 work are handled bad sheet on the one hand; On the other hand, send the information that transports of piezoresistive wafer band 31.
(3) positive-negative polarity half-wave impulse test: after PLC Programmable Logic Controller 35 receives Photoelectric Detection 24 test signal of sending here, computer control unit 36 begins to detect sinusoidal wave positive half cycle zero point, when detecting positive half cycle during zero point, the half-wave test is sent trigger pip by pulse transformer 2 to forward gate-controlled switch 3 with control module 7, and the positive half cycle of connecting sine power supply carries out the positive polarity test to piezoresistive wafer 9.If computer control unit 36 detects piezoresistive wafer defective (overcurrent), 37 work of overcurrent comparing unit send bad sheet information to PLC Programmable Logic Controller 35, and PLC Programmable Logic Controller 35 sends instruction, bad sheet marking device 13 or pulling attachment 14 work are handled bad sheet on the one hand; On the other hand, send the information that transports of piezoresistive wafer band 31.If computer control unit 36 detects piezoresistive wafer qualified (not overcurrent), computer control unit 36 then detects the negative half period zero point of sine power supply, the half-wave test is sent trigger pip by pulse transformer 2 to negative polarity gate-controlled switch 4 with control module 7, connect the negative half period of sine power supply, piezoresistive wafer 9 is carried out the negative polarity test.
The present invention saves the energy-storage capacitor of conventional energy test loop, utilize the positive and negative half-wave duration of power frequency supply to grow the characteristic of (10ms), by pressure regulator, transformer and forward and reverse two gate-controlled switches major loop, thereby produce the dash current of duration near 10ms as the half sine-wave impulse current generating means.
Claims (9)
1, a kind of half sine-wave impulse current automatic testing equipment based on piezoresistive wafer, comprise pressure regulator [10] and be arranged in the control desk support [1] and the joining transformer of pressure regulator [10] [11], it is characterized in that: an end of transformer [11] links with the input end of the gate-controlled switch [4] of gate-controlled switch [3] that is arranged on the antiparallel positive polarity in the control desk support [1] and negative polarity, the control input end of the gate-controlled switch [4] of gate-controlled switch of positive polarity [3] and negative polarity links with the pulse transformer [2] that is arranged in the control desk support [1], the output terminal of positive polarity gate-controlled switch [3] and negative polarity gate-controlled switch [4] links to each other with the Hi-pot test electrode [19] that is connected in piezoresistive wafer [9] lead-in wire, another lead-in wire of piezoresistive wafer [9] is connected with low voltage experiment electrode [20], low voltage experiment electrode [20] also links with control module [7] with the half-wave test, on control desk support [1], also be provided with the paper tape transport sector [15] that transmits piezoresistive wafer [9] and with half-wave test and the joining testing agency of control module [7] [6], the Photoelectric Detection head [24] of testing agency [6] is arranged on the both sides of piezoresistive wafer [9].
2, the half sine-wave impulse current automatic testing equipment based on piezoresistive wafer according to claim 1, it is characterized in that: said testing agency [6] comprise sliding electromagnet [22] and the rotating switch block [23] that is connected with sliding electromagnet [22] and be installed in before Photoelectric Detection head [24] on photometer head support [17] and back photometer head support [5], the Hi-pot test electrode [19] and the low voltage experiment electrode [20] of piezoresistive wafer [9] are installed in respectively on the switch block [23].
3, half sine-wave impulse current automatic testing equipment based on piezoresistive wafer according to claim 1, it is characterized in that: said paper tape transport sector [15] comprises drive motor [29] that is arranged on piezoresistive wafer [9] one sides and the transmission gear [28] that is connected with the output shaft of drive motor [29], transmission gear [28] is by transmission shaft [30] and walk belt wheel [27] and drive conduction band body [21] motion be arranged on the conduction band body support frame [26], conduction band body [21] is provided with the piezoresistive wafer band [31] that piezoresistive wafer [9] is installed, and piezoresistive wafer band [31] is arranged in the conduction band body groove [8] on the control desk support [1].
4, the half sine-wave impulse current automatic testing equipment based on piezoresistive wafer according to claim 1, it is characterized in that: said paper tape transport sector [15] also comprises the pinch roller that is used to compress piezoresistive wafer band [31] [32] that is arranged on piezoresistive wafer [9] opposite side, and pinch roller [32] is fixed on the control desk support [1] by pinch roller support [33].
5, half sine-wave impulse current automatic testing equipment based on piezoresistive wafer according to claim 1, it is characterized in that: the test of said half-wave and control module [7] comprise by communication interface is joining the MPT display terminal able to programme [34] that test model and parameter and online demonstration test are carried out process are set, computer control unit [36], overcurrent comparing unit [37] and the PLC control able to programme [35] of sending test signal to computer control unit [36], low voltage experiment electrode [20] is with computer control unit [36] and overcurrent comparing unit [37] links and the dash current that passes through in the piezoresistive wafer in the test process [9] is sent into microcomputer measurement and control module [36] and overcurrent comparing unit [37].
6, the half sine-wave impulse current automatic testing equipment based on piezoresistive wafer according to claim 1 is characterized in that: said testing agency [6] also comprises and joining bad sheet marking device of PLC control able to programme [35] [13] and pulling attachment [14].
7, the half sine-wave impulse current automatic testing equipment based on piezoresistive wafer according to claim 1 is characterized in that: also be provided with on the voltage dependent resistor (VDR) band [31] of said paper tape transport sector [15] and prevent that voltage dependent resistor (VDR) band [31] from deviating from the pressing plate [18] of conduction band body groove [8].
8, the half sine-wave impulse current automatic testing equipment based on piezoresistive wafer according to claim 1 is characterized in that: also be provided with insulcrete [25] on the conduction band body [21] of said paper tape transport sector [15].
9, the half sine-wave impulse current automatic testing equipment based on piezoresistive wafer according to claim 1 is characterized in that: said feeding platen [16] and the platen that connects material [12] of also being provided with on the control desk support [1] of paper tape transport sector [15] both sides.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2004100258876A CN1328589C (en) | 2004-02-23 | 2004-02-23 | Semi-wave impulse current automatic testing device of pressure-sensitive resistor disc |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2004100258876A CN1328589C (en) | 2004-02-23 | 2004-02-23 | Semi-wave impulse current automatic testing device of pressure-sensitive resistor disc |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1560643A true CN1560643A (en) | 2005-01-05 |
| CN1328589C CN1328589C (en) | 2007-07-25 |
Family
ID=34441164
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB2004100258876A Expired - Fee Related CN1328589C (en) | 2004-02-23 | 2004-02-23 | Semi-wave impulse current automatic testing device of pressure-sensitive resistor disc |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN1328589C (en) |
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101900783A (en) * | 2010-07-21 | 2010-12-01 | 宁波英格塑料制品有限公司 | High-voltage testing equipment |
| CN101382576B (en) * | 2008-10-10 | 2011-03-30 | 深圳景光电子有限公司 | Self-recognising checking out method for detecting quality of reversal photoelectric and optical fiber |
| CN102543334A (en) * | 2011-12-30 | 2012-07-04 | 南阳金牛电气有限公司 | Device for automatically testing voltage-sensitive voltage of resistor disc and resistor disc inkjet printing process |
| CN102590687A (en) * | 2012-03-09 | 2012-07-18 | 江苏新澳电力技术有限公司 | Automatic DC (direct current) parameter testing system for metallic oxide resistor plate |
| CN103048501A (en) * | 2012-12-19 | 2013-04-17 | 苏州泰思特电子科技有限公司 | Impact current generating device |
| CN104777363A (en) * | 2015-03-31 | 2015-07-15 | 苏州华徕光电仪器有限公司 | Continuous resistor testing device capable of realizing automatic counting |
| CN104777362A (en) * | 2015-03-31 | 2015-07-15 | 苏州华徕光电仪器有限公司 | Continuous resistor value testing device |
| CN106546864A (en) * | 2016-09-23 | 2017-03-29 | 清华大学 | A kind of variable temperature measurement device of simple ZnO resistors valve block electric parameter |
| CN109974763A (en) * | 2017-12-27 | 2019-07-05 | 泰科电子(上海)有限公司 | Calibration system and calibration method |
| CN114226267A (en) * | 2021-12-17 | 2022-03-25 | 南阳金牛电气有限公司 | Automatic test and sorting equipment and process for piezoresistor discs |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3433769A1 (en) * | 1984-09-14 | 1986-03-27 | Grundig E.M.V. Elektro-Mechanische Versuchsanstalt Max Grundig holländ. Stiftung & Co KG, 8510 Fürth | METHOD AND ARRANGEMENT FOR MEASURING THE CATHODE RAY CURRENTS IN TELEVISION RECEIVERS |
| CN87207140U (en) * | 1987-06-04 | 1988-03-09 | 王存志 | Nondestructive testing device for nonlinear resistance |
| AT406025B (en) * | 1997-07-22 | 2000-01-25 | M & R Automatisierung Von Indu | MEASURING AND SORTING SYSTEMS FOR MEASURING AND SORTING RESISTANCE BODIES AND A METHOD |
| JPH11133082A (en) * | 1997-10-29 | 1999-05-21 | Matsushita Electric Ind Co Ltd | Inspection device of variable resistor and inspection method |
| CN2525653Y (en) * | 2001-02-27 | 2002-12-11 | 广东南方宏明电子科技股份有限公司 | Compression capacitor automatic measurer |
-
2004
- 2004-02-23 CN CNB2004100258876A patent/CN1328589C/en not_active Expired - Fee Related
Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101382576B (en) * | 2008-10-10 | 2011-03-30 | 深圳景光电子有限公司 | Self-recognising checking out method for detecting quality of reversal photoelectric and optical fiber |
| CN101900783A (en) * | 2010-07-21 | 2010-12-01 | 宁波英格塑料制品有限公司 | High-voltage testing equipment |
| CN102543334A (en) * | 2011-12-30 | 2012-07-04 | 南阳金牛电气有限公司 | Device for automatically testing voltage-sensitive voltage of resistor disc and resistor disc inkjet printing process |
| CN102590687A (en) * | 2012-03-09 | 2012-07-18 | 江苏新澳电力技术有限公司 | Automatic DC (direct current) parameter testing system for metallic oxide resistor plate |
| CN103048501A (en) * | 2012-12-19 | 2013-04-17 | 苏州泰思特电子科技有限公司 | Impact current generating device |
| CN104777363A (en) * | 2015-03-31 | 2015-07-15 | 苏州华徕光电仪器有限公司 | Continuous resistor testing device capable of realizing automatic counting |
| CN104777362A (en) * | 2015-03-31 | 2015-07-15 | 苏州华徕光电仪器有限公司 | Continuous resistor value testing device |
| CN104777363B (en) * | 2015-03-31 | 2017-08-25 | 苏州华徕光电仪器有限公司 | It is automatic to count resistance continuous test device |
| CN104777362B (en) * | 2015-03-31 | 2017-10-10 | 苏州华徕光电仪器有限公司 | Resistance continuous test device |
| CN106546864A (en) * | 2016-09-23 | 2017-03-29 | 清华大学 | A kind of variable temperature measurement device of simple ZnO resistors valve block electric parameter |
| CN109974763A (en) * | 2017-12-27 | 2019-07-05 | 泰科电子(上海)有限公司 | Calibration system and calibration method |
| CN114226267A (en) * | 2021-12-17 | 2022-03-25 | 南阳金牛电气有限公司 | Automatic test and sorting equipment and process for piezoresistor discs |
Also Published As
| Publication number | Publication date |
|---|---|
| CN1328589C (en) | 2007-07-25 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN1328589C (en) | Semi-wave impulse current automatic testing device of pressure-sensitive resistor disc | |
| CN103293070B (en) | Wire jacket tearing detection device | |
| CN107271896A (en) | Safety relay test device and its method of testing | |
| CN101576605A (en) | Feedback type keystroke life test method and device | |
| CN102419347A (en) | Brake pad quality detection control device, its usage method and application | |
| CN105136576A (en) | Spring load test system | |
| CN108508355A (en) | A kind of relay life test device | |
| CN112444746B (en) | Motor integrated test system | |
| CN209148845U (en) | A kind of driving control system for electric machine efficiency Detecting data frame based on power control | |
| CN207380206U (en) | It is a kind of to take the control external System for Circuit Breaker device for detecting performance of electric energy meter | |
| CN103177847A (en) | Transformer demagnetization device | |
| CN106125030A (en) | The multifunctional check of Portable arrester on-Line Monitor Device | |
| CN102798835A (en) | Single-meter-position automatic connection device used in verification device for electric energy meter and connection method | |
| CN205787079U (en) | The multifunctional check of Portable arrester on-Line Monitor Device | |
| CN211653059U (en) | Automatic test equipment for bare board of controller circuit board | |
| CN108242757A (en) | A kind of wire jumper quick connector automatic assembling | |
| CN207997059U (en) | Aluminium alloy robot variable polarity plasma arc welding arc smart punching welding system | |
| CN202491062U (en) | Buzzer automatic assembly machine | |
| CN102879669B (en) | Failure current simulation device and working method thereof | |
| CN209579564U (en) | A kind of motor servo driver and robot | |
| CN102981434B (en) | Testing method of analog loading device to process analog loading to operating mechanism | |
| CN104596026B (en) | A kind of air conditioner operation parameters monitoring device | |
| CN209446739U (en) | A kind of New-type electric machine test device | |
| CN201397376Y (en) | Switch contact fusion welding and electric service life test control device | |
| CN206248741U (en) | A kind of AC servo driver overload automatic test device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20070725 Termination date: 20100223 |