CN1307277A - Graphic interface card testing system and method - Google Patents

Graphic interface card testing system and method Download PDF

Info

Publication number
CN1307277A
CN1307277A CN 00101969 CN00101969A CN1307277A CN 1307277 A CN1307277 A CN 1307277A CN 00101969 CN00101969 CN 00101969 CN 00101969 A CN00101969 A CN 00101969A CN 1307277 A CN1307277 A CN 1307277A
Authority
CN
China
Prior art keywords
interface card
graphic interface
resolution chart
signal
frequency
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN 00101969
Other languages
Chinese (zh)
Other versions
CN1130635C (en
Inventor
许世法
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitac International Corp
Original Assignee
Mitac International Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitac International Corp filed Critical Mitac International Corp
Priority to CN 00101969 priority Critical patent/CN1130635C/en
Publication of CN1307277A publication Critical patent/CN1307277A/en
Application granted granted Critical
Publication of CN1130635C publication Critical patent/CN1130635C/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Liquid Crystal Display Device Control (AREA)

Abstract

In the testing system, test graph produced in PC is transmitted first to graphic interface and then to external test circuit board having several test points coupled to various color signals and control signals of interface card. The probes in the external frequency counter are used to contact the probe connection points on the test curcuit board so as to receive corresponding color signals and control signals with the measured frequency being displayed. Based on the frequency relation between different signals, the graphic interface card is judged to be normal or not. The test may be performed without using LCD module and this can reduce cost.

Description

Graphic interface card testing system and method
The present invention is relevant for a kind of test macro and method, particularly at being stuck in the system and method for testing on the production line in order to the graphic interface of controlling general LCD (LCD) module.
LCD is to belong to a kind of plane display technique (flat panel display), applies to various portable computers, notebook computer widely, replaces the employed cathode ray tube (CRT) display of general desktop computer even.The sharpest edges of LCD are declining to a great extent of its volume and weight, but relatively its cost is then relatively more expensive.
On the production line of general notebook computer, whether (videosubsystem) be working properly for the subsystem of video in the test computer system, mostly is the host computer part to be connected on the LCD of testing usefulness with winding displacement test.Send specific resolution chart by notebook host to be measured, observe by the LCD that connects whether resolution chart can operate normally again.Make a mistake in order to guarantee to test can not be subjected to testing with the influence of LCD self character, this test mostly needs certain quality with LCD, and this also makes the testing cost on the production line increase.In order to reduce the testing cost of production line, be necessary to propose a kind of less expensive and can test out the test macro and the method for possible errors on the subsystem of video as far as possible.
In view of this, fundamental purpose of the present invention is to provide a kind of graphic interface card testing system and method, can need at the test of notebook computer on production line, carries out cheap and effectively test.
According to above-mentioned purpose, the present invention proposes a kind of graphic interface card testing system and method, in order to test for graphic interface card.In this test macro, produce needed resolution chart by the resolution chart generation device earlier, and this resolution chart is delivered to the input end of graphic interface card.Wherein the resolution chart generation device also can be the test pattern generator that produces the particular video frequency resolution chart except being the notebook computer to be measured.Graphic interface card then connects winding displacement by one and connects outside testing circuit board.On testing circuit board, have a plurality of probe contacts, by connecting the output terminal that winding displacement is coupled to graphic interface card, be used for receiving chrominance signal and the control signal that graphic interface card is exported respectively.Chrominance signal comprises the tricolor signal corresponding to each pixel, and control signal then comprises horizontal/vertical synchronization signals, data enable signal and clock pulse signal.Utilize the probe on the foreign frequency counter, the probe contact on the engaged test circuit board is so that receive corresponding chrominance signal and control signal, and shows measured frequency.According to frequency relation between unlike signal, for example when resolution chart is a monochromatic primary colors figure, corresponding primary signal frequency should be able to be consistent with the frequency of data enable signal, it is zero that other primary signal frequencies are then measured, whether working properly, reach the purpose of test if just can judge graphic interface card by this.
The advantage of test macro of the present invention and method mainly is the reduction of testing cost on the production line.Utilize spendable equipment and equipment on the simple production line, just can be under the situation of not using real LCD module, detect for the basic function of subsystem of video in the computer, therefore be very suitable for the demand of low production cost and testing cost on the industry.
For described purpose of the present invention, characteristic and advantage can be become apparent, a preferred embodiment cited below particularly, and conjunction with figs. elaborate.
Fig. 1 is the system layout of graphic interface card testing system in the embodiment of the invention.
Fig. 2 is the circuit layout synoptic diagram of testing circuit board in the embodiment of the invention.
Fig. 3 is when sending monochromatic resolution chart, the signal timing diagram of the primary signal of data enable signal and correspondence.
Fig. 4 is the process flow diagram of graphic interface card test method in the embodiment of the invention.
Wherein:
1: computer to be measured; 10~CPU; 11~system control chip; 12~memory module; 13~sound subsystem; 14~Storage Media; 15~input-output unit; 20~graphic interface card; 20a, 30a~bus bar connector; 25~connection winding displacement; 30~testing circuit board; 35~probe contact; 40~frequency counter; 45~display panel; 49~p-wire; 50~probe.
Embodiment:
Fig. 1 is the system layout of graphic interface card testing system among the embodiment.This test macro mainly is made up of computer l to be measured, testing circuit board 30 and frequency counter 40, and 20 of the graphic interface cards that need test are inserted in the expansion slot (not shown).The notebook host that computer 1 representative to be measured is assembled on production line, comprise most element and subsystem in the computer system, as as CPU10, the various programs of storage and the memory of data module 12 of data processing and control center, the sound subsystem 13 of control sound playing, the medium 14 that stores long term data and the input-output unit 15 of reception and output data, still wherein do not comprise the LCD that shows usefulness.In general computer, graphic interface card 20 can be connected with system control chip 11 by specific bus configuration (for example PCI or AGP), and transmission chrominance signal and control signal show to liquid crystal display device module (LCD module).In the present embodiment, notebook host is testing under the state of not loading onto the LCD module, that is tests under half-finished state on the production line.
In the present embodiment, the LCD module is replaced with testing circuit board 30, so that reduce testing cost on the production line.Connect 25 of winding displacements and connect the bus bar connector 20a of graphic interface card 20 and the bus bar connector 30a of testing circuit board 30, graphic interface card 20 will be sent to the chrominance signal and the control signal of LCD module originally, be transferred to testing circuit board 30.Then stay a plurality of probe contacts 35 on testing circuit board 30, each probe contact 35 receives the respective signal of graphic interface card 20.The setting of probe contact 35 is to utilize probe (probe) to measure for convenience.40 of frequency counters utilize the probe 50 on the p-wire 49, and the probe contact 35 on the engaged test circuit board 30 is so that measure needed signal.Frequency counter 40 can be measured the frequency of probe 50 received signals, and shows display screen 45 thereon.Whether the frequency measured according to unlike signal, it is working properly to judge graphic interface card 20.
Fig. 2 represents the circuit layout synoptic diagram of testing circuit board 30 in the present embodiment.As previously mentioned, testing circuit board 30 receives various chrominance signals and the control signal that graphic interface card 20 is sent by connecting winding displacement 25.The general needed chrominance signal of LCD module mainly is the tricolor signal that constitutes pixel (pixels), comprises redness (representing with R), green (representing with G) and blue (representing with B).The primary signal of each pixel generally can utilize 6 (6bits) or 8 (8bits) to be represented, then adopts 6 form at present embodiment.In addition, transmit color data is to carry out with the speed of two pixels of each transmission at every turn.Therefore, need 6*3*2=36 bar chrominance signal line altogether, wherein danger signal is represented with RA0~RA5 and RB0~RB5, and green represents that with GA0~GA5 and GB0~GB5 blue signal is represented with BA0~BA5 and BB0~BB5.The needed control signal of LCD module then comprises vertical synchronizing signal (Vsync), horizontal-drive signal (Hsync), data actuating signal (DE) and clock pulse signal (CLK).Vertical synchronizing signal Vsync and horizontal-drive signal Hsync are the signals that carries out vertical scanning (figure interframe) and horizontal scanning (between sweep trace) action in order to control LCD, and data enable signal DE then is in order to represent on the chrominance signal line whether being valid data.35 configurations of the pairing probe contact of each chrominance signal and control signal as shown in Figure 2, probe contact 35 be along testing circuit board 30 around the configuration, to make things convenient for probe 50 contact measurements.
In the present embodiment, resolution chart is to adopt monochromatic resolution chart, for example complete red figure, complete green figure, full blueprint shape or complete white figure.When using complete red figure, have only to have signal on danger signal line RA0~RA5 and the RB0~RB5 and occur, other chrominance signal lines then do not have; When using complete green figure, have only to have signal on green line GA0~GA5 and the GB0~GB5 and occur, other chrominance signal lines then do not have; When using full blueprint shape, have only to have signal on blue signal line BA0~BA5 and the BB0~BB5 and occur, other chrominance signal lines then do not have; When using complete white figure, on the tricolor signal line, all can there be signal to occur.Fig. 3 then is expression when sending monochromatic resolution chart, the signal timing diagram of data enable signal DE and corresponding primary signal.Be meant in the example of Fig. 3 and send the complete red figure or the situation of complete white figure, data enable signal DE is in order to indicate whether the data on each chrominance signal are valid data.Therefore, if this moment, probe 50 was measured danger signal line RA0~RA5 or data enable signal DE respectively, can obtain identical frequency values.In addition, the gauger can also utilize probe 50 to read the frequency of vertical synchronizing signal Vref and horizontal-drive signal Href, and whether it is working properly to use checking.
According to the relativeness of above-mentioned test system configurations and each signal frequency value, can set up the graphic interface card testing process that is applicable on the production line.Fig. 4 represents the process flow diagram of graphic interface card test method in the present embodiment.Finish test environment Hou on the foundation production line as shown in Figure 1, at first producing needed resolution chart (step S1) by PC or test pattern generator (pattern generator).The test pattern generator is in order to producing the instrument of required resolution chart, and this is the configuration of being adopted when resolution chart interface card separately.Whether as previously mentioned, the resolution chart that is produced is based on monochrome, so can find out its output frequency and coincide with data enable signal DE from the video data of stable output.Then, resolution chart is sent into graphic interface card 20 (step S2).The output of graphic interface card 20 then is sent on the testing circuit board 30 by connecting winding displacement 25, and each chrominance signal and control signal then are switched on the corresponding probe contact 35.Then utilize the frequency (step S3) of probe 50 measurement data enable signal DE and corresponding primary signal,, represent that then the signal sequence relation of this part is correct, note the successful test result (step S5) of test if both meet (step S4); If both do not meet, represent that then sequential relationship goes wrong, similarly note the test result of this test crash.To test other resolution charts (step S6) if still need, then get back to step S1, heavily cover and carry out described action, otherwise just finish test.If in test process, find to have the problem on any sequential, then can on production line, replace the abnormal graphic interface card of function.In addition, in step S3, the tester can test as synchronous signal for other in the lump, and whether its work for confirmation is normal.
Though the present invention has done announcement as mentioned above with a preferred embodiment; but this embodiment is not in order to limit the present invention; any those skilled in the art; do not break away from the spirit and scope of the present invention; can make many changes and modification, so protection scope of the present invention should be as the criterion with accompanying claims institute restricted portion.

Claims (10)

1. a graphic interface card testing system in order to test for a graphic interface card, is characterized in that, this system comprises:
The resolution chart generation device is connected in the input end of described graphic interface card, in order to produce a resolution chart and to deliver to described graphic interface card;
Connect winding displacement, the one end connects the output terminal of described graphic interface card;
Testing circuit board, the other end that connects described connection winding displacement, have a plurality of probe contacts on the described testing circuit board, be coupled to the output terminal of described graphic interface card respectively by described connection winding displacement, in order to receive chrominance signal and the control signal that described graphic interface card is exported; And
Frequency counter has at least one probe, and described probe receives corresponding chrominance signal and control signal, and shows measured frequency in order to contact the control pin contact on the described testing circuit board.
2. graphic interface card testing system as claimed in claim 1 is characterized in that, described resolution chart generation device is a notebook computer, and described graphic interface card shows in order to the LCD of controlling described notebook computer.
3. as the described graphic interface card testing system of claim l, it is characterized in that described resolution chart generation device is the test pattern generator.
4. graphic interface card testing system as claimed in claim 1 is characterized in that, comprises a data enable signal in the described control signal that described probe contact is connected, in order to represent the enabled state of described chrominance signal.
5. graphic interface card testing system as claimed in claim 4 is characterized in that, described resolution chart is a monochromatic resolution chart, equals the frequency of described data enable signal corresponding to the frequency of the chrominance signal of described monochromatic resolution chart.
6. a LCD graphic interface card test method, is characterized in that this method comprises the following steps: in order to test for a graphic interface card
Produce a resolution chart and deliver to described graphic interface card;
With chrominance signal and the control signal that the output terminal of described graphic interface card is exported, be sent on a plurality of probe contacts of a testing circuit board;
Utilize the probe of frequency counter to contact probe contact on the described testing circuit board, receive corresponding chrominance signal and control signal and record corresponding frequency; And
According to the measured described chrominance signal and the frequency of control signal, judge whether described graphic interface card is working properly.
7. LCD graphic interface card test method as claimed in claim 6 is characterized in that described resolution chart is produced by a notebook computer, and described graphic interface card shows in order to the LCD of controlling described notebook computer.
8. LCD graphic interface card test method as claimed in claim 6 is characterized in that described resolution chart is produced by a test pattern generator.
9. LCD graphic interface card test method as claimed in claim 6 is characterized in that, comprises a data enable signal in the described control signal, in order to represent the enabled state of described chrominance signal.
10. LCD graphic interface card test method as claimed in claim 9 is characterized in that, described resolution chart is a monochromatic resolution chart, equals the frequency of described data enable signal corresponding to the frequency of the chrominance signal of described monochromatic resolution chart.
CN 00101969 2000-02-02 2000-02-02 Graphic interface card testing system and method Expired - Fee Related CN1130635C (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 00101969 CN1130635C (en) 2000-02-02 2000-02-02 Graphic interface card testing system and method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 00101969 CN1130635C (en) 2000-02-02 2000-02-02 Graphic interface card testing system and method

Publications (2)

Publication Number Publication Date
CN1307277A true CN1307277A (en) 2001-08-08
CN1130635C CN1130635C (en) 2003-12-10

Family

ID=4576189

Family Applications (1)

Application Number Title Priority Date Filing Date
CN 00101969 Expired - Fee Related CN1130635C (en) 2000-02-02 2000-02-02 Graphic interface card testing system and method

Country Status (1)

Country Link
CN (1) CN1130635C (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100401084C (en) * 2004-06-22 2008-07-09 大唐移动通信设备有限公司 Inserted card tester
CN100543692C (en) * 2005-11-11 2009-09-23 鸿富锦精密工业(深圳)有限公司 Apparatus for testing interface of video figure of computer
TWI569020B (en) * 2015-12-16 2017-02-01 友達光電(蘇州)有限公司 Displaying device and testing method thereof

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100401084C (en) * 2004-06-22 2008-07-09 大唐移动通信设备有限公司 Inserted card tester
CN100543692C (en) * 2005-11-11 2009-09-23 鸿富锦精密工业(深圳)有限公司 Apparatus for testing interface of video figure of computer
TWI569020B (en) * 2015-12-16 2017-02-01 友達光電(蘇州)有限公司 Displaying device and testing method thereof

Also Published As

Publication number Publication date
CN1130635C (en) 2003-12-10

Similar Documents

Publication Publication Date Title
CN101882099B (en) Network card test system and method
US6323828B1 (en) Computer video output testing
CN101661200B (en) Liquid crystal display array substrate and wire break detection method thereof
US7923991B2 (en) Signal testing apparatus
CN102256158A (en) Automatic television circuit board function testing method and system
KR101943416B1 (en) Displayport interface module of display test equipment
US7696956B2 (en) Apparatus for video graphics array testing
CN103837758A (en) Image signal multi-detection system and multi-detection method thereof
CN1130635C (en) Graphic interface card testing system and method
CN112492304B (en) TCON board and TCONLESS mainboard function test system
CN213818026U (en) TCON board and TCONLESS mainboard functional test system
CN113655368A (en) Batch detection device for bus interface boards
CN116721614B (en) EDID information acquisition device, liquid crystal display screen detection device and method
CN111402771A (en) Detection equipment for display driving chip and display module
CN110033723B (en) Display input delay detection system and method
CN1291745A (en) Device for testing digital monitor
CN105975299A (en) Channel switching device, burning data detection method and system, and data burning method and system
CN101996613B (en) Output testing method, system and platform of electronic device
CN112992023A (en) Self-checking method and self-checking circuit of input signal
CN205581446U (en) Liquid crystal display optical detection system
TW534995B (en) Testing system and method for graphic interface card
CN105427773A (en) Aging testing system for liquid crystal display modules
CN214845526U (en) Protection circuit for power consumption test of inspection machine on display module to be tested
CN103453994B (en) Chromatism test tool, chromatism test interface arrangement and chromatism test method
CN114373410B (en) Abnormality detection method, abnormality detection device and display device

Legal Events

Date Code Title Description
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C06 Publication
PB01 Publication
C14 Grant of patent or utility model
GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20031210

Termination date: 20110202