CN1273486A - Colour kinescope without shadow mask and its digitally addressed scan circuit - Google Patents
Colour kinescope without shadow mask and its digitally addressed scan circuit Download PDFInfo
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- CN1273486A CN1273486A CN 00106081 CN00106081A CN1273486A CN 1273486 A CN1273486 A CN 1273486A CN 00106081 CN00106081 CN 00106081 CN 00106081 A CN00106081 A CN 00106081A CN 1273486 A CN1273486 A CN 1273486A
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Abstract
The present invention discloses a digitally adressing scan circuit, a digital point-by-point focussing circuit, an electronic bean scan deflection measuring and scan deflection correcting system, a colour kinescope without shadow mask and ultra-large-screen colour kinescope. Its advantages include high scan precision of electronic beam, small diameter of electronic beam on screen, high integrity, simple structure, easy manufacture, low distortion, high definition, light weight and thin thickness.
Description
The present invention relates to a kind of scanning circuit and chromoscope that is used for picture tube, particularly a kind of digitally addressed formula scanning circuit, electron beam scanning offset measurement and corrective system and a kind of chromoscope that does not have shadow mask that does not have the flyback scan mode.
It is shadow mask colour that chromoscope is at present used the most ripe process structure, the basic structure of traditional shadow mask colour as shown in Figure 1, mainly by electron gun 1, deflecting coil 2, shadow mask 3, fluorescent film 4, glass bulb 5 and assemble assembly 6 and form.Electron gun can be three rifle three beams or single rifle three beams according to the type difference of shadow mask, and shadow mask generally is to be divided into pass shadow mask or aperture plate type shadow mask.The main effect of shadow mask is electron beam to be carried out space (how much) select look, and electron beam is got on the fluorescent material point of appointment after focusing on by the aperture on the shadow mask, makes light-emitting phosphor.
The structure of existing shadow mask colour and technology to it to the difficulty that the high definition direction develops are: the definition that improve picture tube, will increase the hole number on the shadow mask and make the meticulousr shadow mask of hole, thereby make that the processing of shadow mask is difficult more; Shadow mask had both increased the complexity of picture tube structure on the other hand, had also stopped most of electron beam, had limited the raising of picture tube brightness.
The difficulty that the structure of existing chromoscope is run into when making the picture tube (above 34 inches) of jumbotron is: 1. the volume and weight of the big more picture tube of screen is just big more; 2. after the screen of picture tube increases, generally be to adopt the way that improves electron accelerating voltage to improve screen intensity, but electron accelerating voltage is high more, the X ray that picture tube produces is also strong more; 3. the shortcoming that is combined into the large-sized solor picture tube that is similar to video wall with a plurality of little chromoscopes is, exist gap (secret note) to destroy the associative perception of picture between each picture tube, and the display surface of each picture tube is a curved surface, so whole large-screen does not produce associative perception yet.
The basic square principle figure of the scanning circuit that existing color television set or colour picture monitor are adopted is as shown in Figure 2: the line scanning pulse is to be produced by oscillating circuit 7, deliver to row energization, line output circuit 8, the line output pulse produces the sawtooch sweep electric current in deflecting coil 10, and by the required various high direct voltages of flyback transformer 11 generation picture tubes, the effect of row circuit for rectifying 9 is in order to compensate the nonlinear distortion of line deflector coil itself.The field scan signal is produced by field oscillating circuit 12, and through the amplification promotion field deflection coil 15 of vertical output circuit 13, a circuit for rectifying 14 is used for the nonlinear distortion of compensating field deflecting coil itself.At present the scanning circuit of digitlization color television set be increased single-chip microcomputer 16 control row, a vibration and row, rectification.So the basic design of the row of existing television set and monitor, field-scanning circuit is to produce sawtooth waveforms to compensate again.
Row, field scan waveform that existing chromoscope scanning circuit is produced are the sawtooth waveforms through overcorrection.The deflection of electron beam is continuous under the effect of the magnetic field force that this waveform electric current is produced, electron beam scanning pattern is electron beam continuous inswept mask surface under the effect of deflection electromagnetic field, when electron beam was swept to shadow mask hole, electron beam passed the fluorescent material point of shadow mask hole fluorescence excitation screen surfaces.The scan mode of this electron beam has limited the raising of screen intensity, so at present traditional picture tube in order to improve brightness, mainly is to try every possible means aspect the luminous efficiency that improves fluorescent material, raising anode voltage and the increase cathode emission ability.
Existing television set or monitor all take electron beam from left to right, sequential scanning from top to bottom, no matter be interlacing scan or to line by line scan all be to take this mode.During the line flyback and field retrace of electron beam, electron gun is emitting electrons not, and this is actually the emission effciency that has reduced electron beam.
Existing chromoscope all be the way that adopts shielding, but under the environment of highfield and high-intensity magnetic field, shielding can't really be dealt with problems in order to reduce the influence to deflection beam of external electrical field and magnetic field, and the phenomenon of colour cast is very serious.
People are always at the chromoscope of trying every possible means to realize not having shade mask structure, because the restriction of existing scanning circuit and scan mode, no shade mask structure is difficult to realize, has both made to have proposed some as transmission-type and bundle guide formula chromoscope, but has not also all entered practicality.As if because the restriction of the shade mask structure of existing chromoscope (CRT), color CRT has not had development prospect in the direction of jumbotron, slimming.In fact, if existing picture tube scanning circuit is carried out slap-up improvement and adopt a kind of scan mode of new high efficiency rate by digital technology, ancient CRT technology is still big rising.
The objective of the invention is: 1. a kind of high electron beam deflecting scanning circuit of positioning accuracy that scans is provided; 2. provide a kind of scan efficiency high electron beam deflecting scanning circuit; 3. provide a kind of electron beam that guarantees to reach the focus circuit of optimum focusing effect in the screen surface arbitrfary point; 4. provide a kind of electron beam screen-contacting point to measure scanning shift inductor and scanning positioning control system and circuit; 5. a kind of colour kinescope without shadow mask is provided; 6. the chromoscope of a kind of high definition, jumbotron and thinner thickness is provided.In order to realize above-mentioned goal of the invention, the present invention takes following technical measures:
Chromoscope is that three primary colors fluorescent powder is arranged by dot matrix, be coated in the surface of screen inboard regularly, the distribution of fluorescent material is fully digitalization, be that each fluorescent material point all has a definite coordinate points, as long as in deflection system, introduce digitized amount of deflection, just can guarantee that electron beam gets on each fluorescent material point of determining exactly, promptly realize the digital address scan of electron beam.
Can get to exactly on each fluorescent material point of determining in order to guarantee electron beam, except requiring deflection system to have the high accuracy, be exactly to require the diameter of the screen-contacting point of electron beam under the prerequisite that guarantees screen intensity as far as possible little on the other hand, be that electron beam is when reaching screen surface, should get to the center of fluorescent material point, and the diameter of electron beam is less than the diameter of fluorescent material point.The present invention takes electron beam fixed point (discontinuous) to scan and do not have the scan mode of flyback, can reduce electron beam current greatly under the condition that does not reduce screen intensity, has just reduced the diameter of electron beam screen-contacting point.In order to guarantee that electron beam has minimum screen-contacting point when screen, the present invention has taked the mode of digitally addressed point-by-point focusing, be electron beam scanning to screen when arbitrarily a bit, the focus voltage that is added on the picture tube focus mask can guarantee that electron beam is the focus state of the best on fluorescent material point.
Adopt digitally addressed formula scanning to improve electron beam and the precision of shielding, the scan mode and the digitally addressed point-by-point focusing that adopt the scanning of electron beam fixed point and do not have a flyback can reduce electron beam current greatly under the prerequisite that does not reduce the screen luminosity, this makes chromoscope cancellation shadow mask become possibility.
Adopt the picture tube of digitally addressed scan deflection system, can improve greatly electron beam the screen precision, but because the variation of temperature and time and the interference of external magnetic field or electric field, the screen-contacting point of electron beam also can be offset, so must introduce the measurement and the feedback adjusting system of electron beam screen-contacting point, when skew takes place the screen-contacting point of electron beam, adjust.The present invention adopts the skew that the way Measurement of Electron Beam screen-contacting point of several electron beam scanning skew inductors is set in screen surface, with feeding back the input that is added to addressed scan circuit after the side-play amount process digital processing that measures, reach the purpose of stablizing the electron beam screen-contacting point.
The present invention proposes the digitally addressed formula scanning circuit of a kind of picture tube, comprises memory and numerical control power signal generator; The numerical control power signal generator comprises numerical control horizontal deflection power signal generator and numerical control field deflection power signal generator; The input of numerical control horizontal deflection power signal generator and numerical control field deflection power signal generator connects memory respectively; The output of numerical control horizontal deflection power signal generator and numerical control field deflection power signal generator connects row, the field deflection parts of picture tube respectively; There are electron beam scanning data of required defection signal during any one fluorescent material point to picture tube fluorescent film surface in the memory.
The present invention proposes a kind of chromoscope that is applicable to digitally addressed scan circuit, comprises at least one picture display unit, and each picture display unit comprises electron gun, deflection component, fluorescent film, glass bulb and electron beam scanning skew inductor; All picture display units are in same vacuum environment; The fluorescent film of each picture display unit fuses; The fluorescent film on kinescope screen surface and glass bulb rear portion do not have support and connection.
Description of drawings:
Fig. 1. shade mask structure chromoscope schematic diagram
Fig. 2. existing color television set or colour picture monitor are capable, the field-scanning circuit frame principle figure
Fig. 3. digital addressed row, field-scanning circuit frame principle figure
Fig. 4. digital point-by-point focusing circuit frame principle figure
Fig. 5. the row of digitally addressed fixed point scan mode, the oscillogram of field-scanning circuit
The digitally addressed fixed point scan line of Fig. 5 A. sweep waveform figure
The digitally addressed fixed point scanning field of Fig. 5 B. sweep waveform figure
Fig. 6. the row of central start, anhydrous gentle vertical flyback, field scan waveform and sweep trace of electron beam schematic diagram
Fig. 6 A. sweep trace of electron beam schematic diagram
Fig. 6 B. line scanning waveform schematic diagram
Fig. 6 C. field scan waveform schematic diagram
Fig. 7. digital address scan and digital point-by-point focusing circuit frame principle figure
Fig. 8. be applicable to the digital address scan and the digital point-by-point focusing of electrostatic deflection chromoscope
Circuit block diagram
Fig. 9. be applicable to the digital addressed scan circuit schematic diagram of electromagnetic deflection chromoscope
Figure 10. digital address scan and digital point-by-point focusing data production process schematic diagram
Figure 11. no shade mask structure chromoscope schematic diagram
Figure 12. the large screen color display structural representation of a plurality of colored visualization unit combination
Figure 13. the large-sized solor picture tube structural representation of nine colored visualization unit combination
With accompanying drawing the fixed point scanner uni of digitally addressed formula scan deflection circuit of the present invention, digitally addressed formula point-by-point focusing circuit, electron beam not being had flyback mode, electron beam scanning skew inductor and scanning shift corrective system, no shade mask structure chromoscope and a plurality of chromoscope in conjunction with the embodiments makes up the jumbotron chromoscope and is described in detail as follows:
Fig. 3 is the basic frame principle figure of digitally addressed formula scan deflection circuit, there is electron beam scanning in the memory 17 and to the fluorescent film surface, drives horizontal deflection and the required deflection data of field deflection during any one fluorescent material point, under the control of clock signal 18, output to the input of numerical control horizontal deflection power signal generator 19 and numerical control field deflection power signal generator 21 respectively, numerical control row, field deflection power signal generator drive the horizontal deflection parts 20 and the field deflection parts 22 of picture tube respectively, just can realize the digitally addressed deflection scanning of electron beam.Memory 17 and clock signal 18 can be regarded a control command as and send system, and it can be single-chip microcomputer or computer.The horizontal deflection parts 20 of picture tube and field deflection parts 22 can be electromagnetic deflection coils, also can be electrostatic deflection plates.When deflection component was deflecting coil, corresponding numerical control deflection power signal source was a Numerical Controlled Current Source; When deflection component was electrostatic deflection plates, corresponding numerical control deflection power signal source was the numerical control voltage source.Under the control of clock signal 18, before the next scan deflection data of memory 17 outputs, the output of numerical control horizontal deflection power signal generator 19 and numerical control field deflection power signal generator 21 is constant; When the new scan deflection data of one of memory 17 output, the output of numerical control horizontal deflection power signal generator 19 and numerical control field deflection power signal generator 21 changes thereupon.What drive deflection component like this is staircase waveform, rather than the sawtooth waveforms of prior art.
This is actually distortion and the error that has solved deflection with the way of digital processing, adopt the characteristics of the deflection system of this digital processing to be: the designer and manufacturer can calculate and consider the distribution of deflection field especially, the movement locus of electron beam in deflection field how, as long as know the electron beam deflecting is determined to fluorescent film how many electric currents (or voltage) that is input in the deflection component when some is, it is noted, and when scanning, deflection current (or voltage) is reproduced exactly just passable.
The used digital address scan deflection system of picture tube that the present invention proposes is that the deflection component of scanning circuit and picture tube is done as a whole consideration, and promptly deflection circuit and deflection component design as a complete deflection system and the use of supporting picture tube.
Fig. 4 is digitally addressed formula point-by-point focusing circuit frame principle figure.The 23rd, memory, there is electron beam scanning required optimum focusing voltage data during each fluorescence pixel to screen, during scanning circuit work, when electron beam scanning arrives any one fluorescence pixel of phosphor screen, memory 23 output electron beams are in the focus voltage data of this point under clock signal 24 controls, deliver to the input of numerical control voltage generator 25, numerical control voltage generator 25 output voltages are added to the focus mask 26 of picture tube.So just can guarantee that electron beam electron beam when arriving the every bit on fluorescent film surface all is in best focus state, promptly guarantees minimum screen-contacting point.Clock signal 24 is that the digitally addressed formula scanning circuit with Fig. 3 uses same clock signal.Memory 23 and clock signal 24 can be regarded a control command as and send system, and it can be single-chip microcomputer or computer.This digital point-by-point focusing circuit is used for common shade mask structure chromoscope, also is very beneficial for the brightness and the definition that improve screen.Picture tube for bipolar focusing or multipole focusing, should use a plurality of digitally addressed formula point-by-point focusing circuit, the corresponding focusing electrode of each digitally addressed formula point-by-point focusing circuit can guarantee that like this electron beam all reaches the focus state of the best when some arbitrarily scanning screen surface.
Row, field scan waveform that digitally addressed formula scanning circuit as shown in Figure 3 of the present invention produces are a staircase waveform, and its waveform as shown in Figure 5.The deflection of electron beam is discontinuous under the effect of the deflection field force that this waveform produced, be expert at, the horizontal segment of field deflection signal staircase waveform (be equivalent to numerical control horizontal deflection power signal generator 19 and numerical control field deflection power signal generator 21 receive that next scanning element is capable, in time before the field deflection data) electron beam is subjected to the effect of constant deflection field, deflection angle does not change, and at this moment electron beam is got to a fluorescence pixel and stopped of short duration a moment; " jump to " on the one other pixel point in be subjected to the suddenling change effect of deflection field of the ascent stage (be equivalent to numerical control horizontal deflection power signal generator 19 and numerical control field deflection power signal generator 21 and receiving a new row, the moment of field deflection number of scan points certificate) of staircase waveform electron beam then.All do brief stay when electron beam is whenever swept to a phosphor pixel point like this, promptly move on to another phosphor pixel point then, electron beam is to jump to move between each phosphor pixel point, and this has just improved the scan efficiency of electron beam greatly.In the ladder number of line scanning ripple and the scan period on the horizontal direction phosphor pixel count and equate; The ladder number of field scan ripple equates that with the sum of interior phosphor pixel point of a scan period (the field scan ripple is in the scan period of delegation, and with the variation of scanning element, output amplitude also has small variation.
The present invention proposes the kinescope electron beam scan mode of a kind of no flyback (no concealment process), and field scan waveform that it is complete and sweep trace of electron beam are as shown in Figure 6.This scan mode is to adopt the scan mode of central start, anhydrous gentle vertical flyback: work as T=T
0The time electron beam at center Screen, at T
0To T
1The stage electron beam is mind-set the right horizontal sweep first row therefrom, when arriving T=T
1The time electron beam sweep to the field scan simultaneously of screen low order end and be output as V
1, electron beam jumps to the low order end of second row, at T
2To T
3The stage electron beam from the right to centre scan (line flyback not occurring), when to T=T
3The time electron beam sweep to center Screen, field scan simultaneously is output as V
3, electron beam jumps to the high order end of the third line, follows therefrom mind-set the right horizontal sweep the third line of electron beam ... work as T=T
4The time, electron beam from the right on the intact screen of centre scan lastrow and arrive screen center; At T
4To T
5In the stage, electron beam continues therefrom mind-set screen left side scanning, works as T=T
5The time electron beam sweep to the field scan simultaneously of screen high order end and be output as V
5, electron beam jumps to the high order end of next line, at T
6To T
7The stage electron beam from the left side to centre scan (line flyback not occurring) ... work as T=T
8The time field deflection voltage be 0 o'clock, electron beam has been swept the delegation of screen center from left to right; When deflecting voltage was negative then and there, electron beam carried out the scanning of screen the latter half ... at last at T=T
10The time, row, field deflection voltage are at 0 o'clock, and electron beam is got back to screen center's (field retrace not occurring), and carries out the scanning of next frame.
This shows, in the scanning process of a whole frame, do not go out existing, field retrace, all at scanning fluorescence pixel, scan efficiency has reached 100% to electron beam in the cycle of a frame.Traditional scan mode, flyback time accounts for the 20-25% of whole sweep time, adopt no flyback scan mode can improve scan efficiency 20-25% in other words, promptly under the condition of same electron beam current, use the scan mode of no flyback can increase screen intensity than the scan mode that flyback is arranged, or under the condition of same screen intensity, can reduce electron beam current, this for improve electron beam the screen precision, realize that the picture tube of no shade mask structure has positive effect.
The electron beam scanning pattern of no flyback can be finished by as shown in Figure 3 digital addressed row field-scanning circuit or digitally addressed formula scanning circuit and point-by-point focusing circuit shown in Figure 7, can produce the track while scan of the electron beam of various ways by the programming of the single-chip microcomputer in Fig. 7 circuit 27, comprise various no flyback track while scans and the flyback track while scan is arranged.
Fig. 7 is digitally addressed formula scanning circuit of the present invention and point-by-point focusing circuit frame principle figure.Read only memory ROM 28~30 is exported row, field deflection signal data and focus voltage data respectively under the control of single-chip microcomputer 27, export row, field deflection analog signal and focus voltage signal respectively through D/A converter 31~33, amplify through linear power amplifier 34~36 again, drive horizontal deflection parts 37, field deflection parts 38 and picture tube focus mask 39 respectively.
Fig. 8 is digital address scan and the digital point-by-point focusing circuit block diagram that is applicable to the electrostatic deflection chromoscope.Single-chip microcomputer 42 control clocks 41 drive memory 40 circulation output address scan and the required data of point-by-point focusing, the scanning of four group addressings exported successively by memory 40 and the required data of point-by-point focusing arrive buffer 43, under the control of single-chip microcomputer 42 data of buffer 43 is delivered to register 44.Single-chip microcomputer 42 control registers 44 are delivered to four D/A converters 45~48 respectively with four groups of data simultaneously then, and single-chip microcomputer 42 control buffers 43 receive four groups of data of next scanning element from memory 40 simultaneously.The data transaction that four D/A change-over circuits 45~48 are sent register 44 here becomes voltage signal and delivers to horizontal deflection linear power amplifier 49 respectively, promotes the horizontal deflection pole plate; Deliver to field deflection linear power amplifier 50, promote the field deflection pole plate; Deliver to focus voltage 1 linear power amplifier 51 and focus voltage 2 linear power amplifiers 52, promote focus mask.Before the next point of electron beam scanning, buffer 43 is received the number of scan points certificate, can carry out the conversion of next number of scan points certificate again under the control of single-chip microcomputer 42.Focus voltage that picture tube is required and anode voltage can be produced by high voltage direct current-DC converter 53.What this example adopted is bipolar focusing, if use multipole focusing picture tube, then will adopt a plurality of digital point-by-point focusing voltage treatment circuits to guarantee the optimum focusing effect of electron beam accordingly.
In scanning process, because the variation of extraneous factors such as electric field, magnetic field or temperature can cause electron beam screen-contacting point skew fluorescent material point, consequently the luminous intensity of fluorescent material point reduces.At this moment be installed in the signal of telecommunication that the electron beam scanning skew inductor of screen inner surface receives and will change that (this electron beam scanning skew inductor can be mounted in the photoelectric receiving diode of phosphor screen inner surface, the photoelectricity of electronics collecting electrode or other kind receives, electron beam miniature inductive element etc.), become digital signal by screen-contacting point measurement feedback regulating circuit 55 and give single-chip microcomputer 42, after single-chip microcomputer 42 obtains the information of electron beam screen-contacting point skew, by changing scan-data, be the direction of displacement and the size of decidable screen-contacting point, revise data for memory 40 inputs and can make the scanning of electron beam get back to the optimum position.The combination that electron beam scanning skew inductor can be made a plurality of induction electrodes, when skew takes place in the position that electron beam projects induction electrode, from the output of each electrode, can reflect size and the orientation that electron beam scanning is offset immediately, the data of revising scanning shift are provided for single-chip microcomputer.
After each start, can use the program that is similar to the above-mentioned measurement of electron beam screen-contacting point, feedback and adjustment to make the scanning of electron beam be in optimum state.This circuit is suitable for the electrostatic deflection picture tube, because electrostatic deflection current sinking hardly is very little so adopt the consumed power of Voltag driving circuit.
Fig. 9 is the digital addressed scan circuit schematic diagram that is applicable to the electromagnetic deflection chromoscope, if will guarantee to adopt the kinescope electron beam sweep stabilization of electromagnetic deflection coil, must guarantee that the electric current that flows through deflecting coil will stablize.The data of single-chip microcomputer 56 output scanning electric currents, deliver to linear comparison amplifier 58 through D/A converter 57 output analog deflection voltage signals, electric current by deflecting coil L becomes voltage signal through sample resistance R and delivers to linear comparison amplifier 58 and relatively amplify pusher moving-wire power amplifier 59, the linear power amplifier 59 last deflecting coil L that drive.What linear comparison amplifier 58, linear power amplifier 59, sample resistance R and D/A converter 57 were formed is variable current source, and it can guarantee that electron beam is expert in the scanned one-tenth, and reasonable frequency response is arranged when " jump " of point and point.
Figure 10 is digitally addressed formula scanning and digital point-by-point focusing data production process schematic diagram.The data that are used for the memory of control figure formula addressed scan circuit and digital point-by-point focusing circuit of the present invention can be used as shown in figure 10, and method produces.The digitized processing of scanning and focus signal is an automated procedure: after picture tube 65 energisings of producing, digitally addressed line-scan circuit 61, digitally addressed field-scanning circuit 62 and digital point-by-point focusing circuit 63,64 are under the control of computer 60, output row, field scan and focus voltage signal, whole screen produces white raster, a stylus 66 is set before phosphor screen, the white raster of screen is projected in the photosensitive region of determining in the stylus by the magnification ratio of adjusting stylus position and camera lens.The output of stylus first frame deposits in the RAM1 random asccess memory 69 through A/D converter 67, and this has just noted the luminous intensity of each pixel on the phosphor screen first frame grating; When sweeping the second frame grating, microprocessor is all adjusted the deflection data of each scanning element, each scanning element all produces skew on the screen, the output of stylus second frame deposits in the RAM2 random asccess memory 70 through A/D converter 67 and electronic switch 68, noted the luminous intensity of each pixel on the phosphor screen second frame grating, data among the RAM1 and the data among the RAM2 are delivered in the computer 60 and are compared, correction direction with decision deflection data of each scanning element when next frame scans, after repeatedly adjusting, luminous the strongest when making electron beam scanning arrive each fluorescence pixel, after adjustment process finishes, content in the memory RAM is exported and write in the read-only memory (ROM) 71, and the data of the digital address scan of picture tube have just obtained.If when the precision of deflection component manufacturing, fluorescent material coating, electron gun and other parts and consistency reached certain high level, above-mentioned adjustment recording process can omit, scanning circuit gets final product with the driven by program of finishing.
The data of digital point-by-point focusing also are to produce in same process: after picture tube is adjusted, make the electron beam of scanning on each fluorescence pixel of fluorescent film, all be in the most accurate the position and the best focus state of screen, then electron beam scanning is noted one by one to the required optimum focusing voltage of each fluorescence pixel of fluorescent film, carried out writing in the read-only memory (ROM) 71 after the digitized processing.Equally, if when the precision of deflecting coil (or deflection pole plate) manufacturing, fluorescent material coating, electron gun and other parts and consistency reach certain high level, above-mentioned adjustment recording process can omit, and focus circuit gets final product with the driven by program of finishing.
The basic structure of the colour kinescope without shadow mask that the present invention proposes mainly is made up of electron gun 72, deflection component 73, fluorescent film 74, glass bulb 75 and electron beam scanning skew inductor 76 as shown in figure 11.Electron gun 72 can adopt the single-guns single-beam formula, thereby can cancel convergence system.Deflection component 73 can be electromagnetic deflection coil or electrostatic deflection plates.Owing to cancelled shadow mask, solved and made the high difficulty of shadow mask difficulty of processing that the high definition picture tube is run into, also eliminated simultaneously because the electron beam scanning efficient that shadow mask brings is low, the magnetization of shadow mask and the problems such as heating of shadow mask.Adopt electron gun, the cancellation convergence yoke of single-guns single-beam and cancelled shadow mask and can simplify the structure of chromoscope greatly, and reduce production costs.Colour kinescope without shadow mask of the present invention need adopt digitally addressed formula scanning circuit of the present invention and digitally addressed formula point-by-point focusing circuit and the scanning of electron beam fixed point and not have the scan mode of flyback, can guarantee under the prerequisite that does not reduce screen intensity, to reduce greatly electron beam current, and the positioning accuracy that guarantees electron beam scanning improves greatly, is inevitable so realize the chromoscope of no shade mask structure.With digitally addressed formula scanning circuit of the present invention and point-by-point focusing circuit is that scanning circuit, focus circuit and picture tube are done as a wholely to consider, thereby the error that various piece produces can be reduced to minimum, electron beam the screen precision can reach the highest.Digitally addressed as if not adopting, existing scanning circuit is inaccessible.
Because the electromagnetic deflection system has the advantages that deflection aberration is applicable to wide-angle deflection (can reduce the thickness of picture tube) and deflection sensitivity height (it is smaller that deflection angle increases minimizing with anode voltage) for a short time, so at present most picture tubes all adopt the electromagnetic deflection system, but electromagnetic deflection also has and needs the big and slow shortcoming of response speed of input power.The deflection aberration that digitally addressed formula scanning that the present invention proposes and point-by-point focusing circuit can remedy electrostatic deflection is the shortcoming of (deflection angle can not greatly) greatly, because digital address scan deflection circuit is more suitable in voltage output and adopts electron beam fixed point scan mode to require the fast characteristics of deflection component response speed, and electrostatic deflection system has the advantages that power consumption is little, in light weight and frequency response is high, more can demonstrate both superiority so digital address scan deflection circuit is used for the electrostatic deflection chromoscope.
Because having adopted the digitlization deflection distortion corrects and digitlization point-by-point focusing circuit, the bigger distortion that can corrected deflection yoke produces, so the screen of no shade mask structure chromoscope of the present invention can adopt complete planar structure, thereby really realized flat phosphor screen.
The present invention proposes the method that a plurality of digital address scan colored visualization unit combination of the present invention of a kind of usefulness are made the large-sized solor picture tube.Because the screen of digital address scan chromoscope of the present invention can be made complete planar structure, so become a big color display screen just can become possibility with a plurality of such colored visualization unit combination, be a complete flat-faced screen to the eye, each junction, colored visualization unit level connection, seamless, undistorted.The structure of the color display screen of this a plurality of colored visualization unit combination such as Figure 12 and shown in Figure 13: the fluorescent film 78 on the screen 77 is that disposable being coated with is covered with, and being does not have at interval continuously.Each picture display unit has independently electron gun, digital address scan deflection system, digitlization point-by-point focusing system and electron beam scanning offset feedback corrective system, the scope of each electron gun scanning can be several~hundreds of square centimeter, all developing scanning elements are under same anode high voltage and the vacuum environment, and the sweep limits of each electron gun is interconnected.Fluorescent film 78 on two picture display unit glass bulb sidewall coupling parts 79 and kinescope screen 77 is that certain distance, discontiguous is arranged, the glass bulb sidewall 80 and screen support and connection that have only picture display unit not link to each other with other picture display unit.Each developing scanning element all adopts digitlization address scan, digital point-by-point focusing, the nonlinear distortion at edge can be reduced to minimum degree, the scanning of each electron gun and the distribution of vision signal are by the unified control of single-chip microcomputer, so do not see having a plurality of picture display units to constitute, but screen of a continuous whole from whole screen.
Figure 13 is a structural representation of making a jumbotron chromoscope with 9 chromoscope combinations.The prior art of the chromoscope that present manufacturing pitch is 0.26mm is very ripe, manufacturing cost is also lower, the glass bulb of 9 15 inches chromoscopes is coupled together by 3 * 3 array, be connected with the screen that has applied fluorescent film again, the diagonal that just can make an effective display surface is 1 meter a jumbotron chromoscope, in order to guarantee the intensity of junction, can adopt steel band to be connected between each glass bulb and between glass bulb and the screen.The thickness of the jumbotron chromoscope of making so also only is the thickness of 15 inches picture tubes, generally be no more than 35cm, cost is very low, and has high definition, can reach 3000 * 2000 resolution, the view picture picture has 600 ten thousand pixels and fine and smooth soft, is that the color monitor of present any structure is all inaccessiable.
Owing to adopted a plurality of digital scannings unit, the scanning area of each unit electron gun has reduced, and reaches the required anode current of same brightness and has also reduced, and this helps the digital scanning deflection system screen-contacting point of controlling electron beam more accurately; Electron gun is short to the distance of screen in addition, because the electron beam landing screen error that time of scanning system and temperature drift produce is also than the chromoscope of large-screen one (electron) gun structure reducing at double, thereby make the structure of chromoscope of no shadow mask structure be more prone to realization.
Owing to adopt a plurality of developing scanning elements, each independently electron gun also can reduce to fluoroscopic distance, whole like this phosphor screen just can be to thin type design and development, and the scanning element of promptly forming picture tube is many more, whole just can do thin more of picture tube.And owing to the sweep limits of electron gun has been dwindled, reaching the anode high voltage that same brightness uses can reduce relatively, and anode high voltage even can accomplish below several kilovolts produces the X ray amount like this and also reduces, thereby can reduce safeguard procedures to X ray, near and can alleviate the weight of picture tube; Anode high voltage reduces on the other hand, also can reduce accordingly the safety precautions of high pressure.
If make the jumbotron chromoscope with electrostatic deflection chromoscope of the present invention as picture display unit combination, the little power consumption of this jumbotron chromoscope and advantage such as in light weight are that the electromagnetic deflection picture tube is incomparable.
Owing to adopted the electron beam scanning pattern of digitally addressed scanning and point-by-point focusing, can solve the deflection angle of electrostatic deflection electron beam depolymerization important disadvantages when big, so that the deflection angle of electrostatic deflection picture tube can be done is bigger, the kinescope screen of electrostatic deflection was both big and length is shorter like this, and the old-fashioned oscilloscope made from this structure oscilloscope tube of oscillographic volume ratio can dwindle greatly.
The large-sized solor picture tube that the combination of a plurality of picture display units of usefulness of the present invention is made and have on essential and the effect different completely with the method that video walls are made in a plurality of common color picture tubes combinations.The video wall that a plurality of common color picture tube combinations are made has the scanning gap between picture tube, and the edge distortion of each picture tube is very big, and the associative perception of the image that is combined into is bad so effect is also undesirable.
Compared with prior art, the present invention has following effect:
1. utilize prior art can easily make the jumbotron picture tube, general chromoscope factory warp Cross simple technological transformation, can produce diagonal more than 1 meter, that thickness is no more than 35cm is super The slim chromoscope of giant-screen. Owing to use prior art and equipment, thus produce big Screen chromoscope cost is low, quality good, reliability is high.
2. owing to adopted digital address scan and digital point-by-point focusing system, it is clear to produce Degree height and the minimum display of view picture screen distortion. Solved that traditional chromoscope makes Monitor definition height but distortion are big and the distortion of television set is little but shortcoming that definition is low.
3. take full advantage of the advantage of the in light weight and little power consumption of electrostatic deflection, make distortion small deflection angle in light weight Spend big large-sized solor picture tube.
4. owing to adopted digital address scan, each scanning element is just as a two-dimensional digital seat Mark can carry out easily digital interface like this and image is carried out various digitized processing and energy Show accurately.
5. owing to adopted the digital scanning system, improved widely the stability of scanning, therefore used The color monitor of manufacturing of the present invention can be used as large-screen monitor. Thereby solved giant-screen Monitor is made difficulty and the high difficult problem of cost.
6. owing to adopted digitally addressed scan circuit and electron beam scanning offset measurement and corrective system, institute Colour cast, this can not take place can guarantee chromoscope to use under more abominable condition For chromoscope provides more widely range of application.
7. the oscilloscope tube that utilizes the present invention to make has the advantage that display screen is big, volume is little.
8. utilize digital point by point scanning of the present invention and digital point-by-point focusing system to improve, thereby produce the flat chromoscope of large-screen the flat picture tube of Sinclair formula.
Claims (5)
1. a picture tube digitally addressed scan circuit is characterized in that: comprise memory and numerical control power signal generator; The numerical control power signal generator comprises numerical control horizontal deflection power signal generator and numerical control field deflection power signal generator; The input of numerical control horizontal deflection power signal generator and numerical control field deflection power signal generator connects memory respectively; The output of numerical control horizontal deflection power signal generator and numerical control field deflection power signal generator connects row, the field deflection parts of picture tube respectively; There are electron beam scanning data of required defection signal during any one fluorescent material point to picture tube fluorescent film surface in the memory.
2. digitally addressed scan circuit according to claim 1 is characterized in that, described horizontal deflection numerical control power signal generator and field deflection numerical control power signal generator comprise D/A converter and linear power amplifier respectively; Described row, field deflection parts are respectively row, field deflection pole plate.
3. digitally addressed scan circuit according to claim 2 is characterized in that, described horizontal deflection power signal generator also comprises linear comparison amplifier; Described horizontal deflection parts are line deflector coil.
4. a chromoscope that is applicable to claim 1-3 scanning circuit is characterized in that, comprises at least one picture display unit, and each picture display unit comprises electron gun, deflection component, fluorescent film, electron beam scanning skew inductor and glass bulb; All picture display units are in same vacuum environment; The fluorescent film of each picture display unit fuses; The fluorescent film on kinescope screen surface and glass bulb rear portion do not have support and connection.
5. chromoscope according to claim 4 is characterized in that, comprises the chromoscope of a jumbotron of 9 picture display units compositions.
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CN 00106081 CN1273486A (en) | 1999-04-21 | 2000-04-20 | Colour kinescope without shadow mask and its digitally addressed scan circuit |
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CN99105846.1 | 1999-04-21 | ||
CN99105846 | 1999-04-21 | ||
CN 00106081 CN1273486A (en) | 1999-04-21 | 2000-04-20 | Colour kinescope without shadow mask and its digitally addressed scan circuit |
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Cited By (1)
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TWI480809B (en) * | 2009-08-31 | 2015-04-11 | Alibaba Group Holding Ltd | Image feature extraction method and device |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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TWI480809B (en) * | 2009-08-31 | 2015-04-11 | Alibaba Group Holding Ltd | Image feature extraction method and device |
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