CN1229648C - Electric switch test detecting instrument - Google Patents
Electric switch test detecting instrument Download PDFInfo
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- CN1229648C CN1229648C CN 03140174 CN03140174A CN1229648C CN 1229648 C CN1229648 C CN 1229648C CN 03140174 CN03140174 CN 03140174 CN 03140174 A CN03140174 A CN 03140174A CN 1229648 C CN1229648 C CN 1229648C
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- little process
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Abstract
Aiming at the problem that the existing electric switch test detecting instrument can not sense test termination or continuously time and count, the present invention provides an electric switch test detecting instrument which comprises a micro-processing chip IC4, a feed circuit 1 providing a power source for the micro-processing chip IC4 and a switching on-off output circuit 7 connected with the micro-processing chip IC4. The present invention is characterized in that the electric switch test detecting instrument also comprises a test terminating testing circuit 2 and a memorizer IC5, wherein the test terminating testing circuit 2 is used for sensing termination signals during test and inputting the termination signals to the micro-processing chip IC4; the memorizer IC5 is driven by control software solidified in the micro-processing chip IC4 when the termination signals are input to the micro-processing chip IC4 to store or read testing parameters of an electric switch. When the detecting instrument is switched off, the present invention can save switching on-off testing numbers, cumulative time and other arrangements; when a tested electronic product has faults, the present invention can save testing parameters.
Description
Technical field
The present invention relates to a kind of electric switch test detector, specifically, relate to a kind of electric switch test detector of the numeration of when because of detector shutdown or other inefficacy, also clocking continuously.
Background technology
At present, some electronic product is stood the high temperature ageing experiment, and shock test etc. are but ignored frequent switching on and shutting down test, and the design of ifs circuit is unreasonable, bridge heap or commutation diode or integrated circuit near the moment of starting shooting will threaten big electric capacity.So many producers begin to electrical equipment frequent switching on and shutting down and do experiment, the switching on and shutting down number of times is counted, the similar detecting instrument that uses is that continuous switch output (is intermittently exported 220V at present
-Civil power is supplied with by the experiment electronic product) partly use mimic channel to realize, switch time counting number is realized with DLC (digital logic circuit).But there is following shortcoming in prior art: (1) realizes counting with DLC (digital logic circuit), and count value will be lost when detecting instrument is cut off the electricity supply, if test period reaches several days, can not accomplish the continuity of timing counting; (2) in the frequent switching on and shutting down process, when underproof electronic product lost efficacy, do not have warning function, the user can't preserve data, when does not know, the switch how many times just lost efficacy; (3) on time and unused time (refer to by the start and the shutdown of test product) be difficult to be adjusted, and two parameters check and balance, and these two time parameters need when longer even can't access; (4) there are not timing, timing prompting function.
Summary of the invention
Fundamental purpose of the present invention is:
1) when detector closes electricity, will preserve switching on and shutting down number of times, cumulative time and other setting;
2) when underproof electronic product lost efficacy, will preserve test parameters and warning;
Secondly the present invention also can reach following purpose:
3) by requirements set on time and unused time of user;
4) remind or Failure Alarm by user's setting timing, timing.
For achieving the above object, the electric switch test detector that the present invention proposes, comprise little process chip IC4, the feed circuit 1 and the switching on and shutting down output circuit 7 that links to each other with little process chip IC4 of power supply are provided for little process chip IC4, it is characterized in that: also comprise termination test testing circuit 2 and memory IC 5, described termination test testing circuit 2 is used for the termination signal in perception when test and termination signal is imported little process chip IC4, and described memory IC 5 is solidificated in the driving of the Control Software among little process chip IC4 the parameter of electric switch test is stored or read when termination signal is imported among little process chip IC4.
Described termination test testing circuit 2 comprises a detector closedown detection circuit 3, the off signal of detector when being used for the perception test, the input end of described detector closedown detection circuit 3 links to each other with power supply, and when detector shuts down than feed circuit 1 first power down, output terminal links to each other with the pass machine testing pin of little process chip IC4, the parameter of electric switch test is stored by the Failure Control software instruction memory IC5 that solidifies in order to trigger little process chip IC4.
Described detector closedown detection circuit 3 and feed circuit 1 connect from same power supply signal, described feed circuit 1 are through the first diode D1, the second diode D2 rectification, 1 filtering of first capacitor C, supply with the supply pin of little process chip IC4 after the first voltage stabilizer IC1 voltage stabilizing, described detector closedown detection circuit 3 is through the 3rd diode D3, the 4th diode D4 rectification, 3 filtering of the 3rd capacitor C, supply with the pass machine testing pin of little process chip IC4 after the second voltage stabilizer IC2 voltage stabilizing, the appearance value of described first capacitor C 1 is greater than the appearance value of the 3rd capacitor C 3.
Described termination test testing circuit 2 also comprises an electric elements failure detection circuit 4, tested galvanoscopic component failure signal when being used for the perception test, the input termination of described electric elements failure detection circuit 4 is from tested electroscope, detected high-low level signal is imported the electrical equipment failure detection pin of little process chip IC4, by the Failure Control software instruction memory IC5 that solidifies the parameter of electric switch test is stored in order to trigger little process chip IC4.
Described electric elements failure detection circuit 4 comprises voltage stabilizing diode D7, the plus earth of described voltage stabilizing diode D7, negative pole connects the electrical equipment failure detection pin of little process chip IC4, for the electrical equipment failure detection pin of little process chip IC4 provides high-low level as electrical equipment failure detection signal.
Described electric elements failure detection circuit 4 comprises voltage failure detection circuit 5 and optical detection circuit 6.
Described switching on and shutting down output circuit 7 comprises the first triode Q1 as emitter follower, the 4th triode Q4 as phase inverter, the relay 9 and first K switch 1, described little process chip IC4 indicates the Control of Voltage pin of little process chip IC4 to output signal to the base stage of the first triode Q1 by timing controlled software, the emitter of the first triode Q1 connects the base stage of the 4th triode Q4, the collector of the collector of the first triode Q1 and the 4th triode Q4 is connected relay 9 two ends respectively, switch on or off according to time or the tested galvanoscopic disablement signal set with pilot relay 9, thereby control 1 folding of first K switch, to reach the control apparatus switching purposes.
Described electric switch test detector also comprises warning circuit 8, and described warning circuit 8 is selected following action according to the indication of solidification software among little process chip IC4:
1) reports to the police according to the time of setting;
Reported to the police when 2) tested electroscope loses efficacy;
The invention has the beneficial effects as follows:
(1) solved the problem of shutting down or cutting off the power supply and to clock continuously and count when detector, send among little process chip IC4 by the second road power supply input circuit sensed in advance detector shutdown or outage and with signal, little process chip IC4 is saved in the parameter of time, switch number of times and other setting in the IC5 storer immediately by solidification software, and can utilize software to access on time and unused time automatically.
(2) be provided with the electric elements failure detection circuit, when electric elements lost efficacy, the failure detection pin of little process chip IC4 can detect low level signal, again by solidification software instruction memory IC5 storage data.
(3) be provided with timing function, but user's configuration switch machine time, and the control by software makes relay on-off, thereby controls the tested galvanoscopic switching on and shutting down time.
(4) timing is arranged, prompting function regularly, when timing reaches the time that the user sets, or tested electroscope reports to the police sound horn by little process chip IC4 output signal when losing efficacy.
Feature of the present invention and advantage will be elaborated in conjunction with the accompanying drawings by embodiment.
Description of drawings
Fig. 1 represents functional-block diagram of the present invention.
Fig. 2 represents the numeration process flow diagram that clocks continuously of the present invention.
Fig. 3 represents timing of the present invention and alarm flow Fig. 1.
Fig. 4 represents timing of the present invention and alarm flow Fig. 2.
Fig. 5 represents circuit structure diagram of the present invention.
Embodiment
A kind of concrete enforcement circuit of the present invention as shown in Figure 5, comprise little process chip IC4, for little process chip IC4 provides the feed circuit 1 of power supply, the timed power on/off output circuit 7 that links to each other with little process chip IC4, termination test testing circuit 2, memory IC 5 and warning circuit 8, described termination test testing circuit 2 comprises detector closedown detection circuit 3 and electric elements failure detection circuit 4.
Described detector closedown detection circuit 3 and feed circuit 1 connect from same power supply signal, but than feed circuit 1 first perception detector off signal and import the pass machine testing pin of little process chip IC4.Socket CON1 is 220V～input supply socket, be divided into two-way through two 15V transformer T1, first via power supply input circuit is that feed circuit 1 are through the first diode D1, the second diode D2 rectification, 1 filtering of first capacitor C, obtain the supply pin that 5V voltage is supplied with little process chip IC4 after the first voltage stabilizer IC1 voltage stabilizing, described the second road power supply input circuit is that detector closedown detection circuit 3 is through the 3rd diode D3, the 4th diode D4 rectification, 3 filtering of the 3rd capacitor C, obtain 5V voltage after the second voltage stabilizer IC2 voltage stabilizing and supply with the pass machine testing pin of little process chip IC4, in order to trigger the software instruction memory IC5 action of little process chip IC4 by solidifying, the appearance value of described first capacitor C 1 is greater than the appearance value of the 3rd capacitor C 3, for example the appearance value of first capacitor C 1 is made as 2200UF, and the appearance value of the 3rd capacitor C 3 is made as 100UF.When the detector power down, because the appearance value of first capacitor C 1 is greater than the appearance value of the 3rd capacitor C 3,3 discharges of the 3rd capacitor C are fast, the 5V of IC2 output at first lowers, when dropping to the required logical zero level of little process chip IC4, because 1 discharge of first capacitor C is slow, the 5V of IC1 output does not temporarily also become to little process chip IC4 power supply pin, so little process chip IC4 is saved in the memory IC 5 from data port (SDA of I2C bus, SCL) waiting to deposit parameter immediately.
Described electric elements failure detection circuit 4, comprise voltage stabilizing diode D7, the plus earth of described voltage stabilizing diode D7, negative pole connects the failure detection pin of little process chip IC4, detected high-low level signal is imported the failure detection pin of little process chip IC4, trigger little process chip IC4 and the parameter of electric switch test is stored by the software instruction memory IC5 that solidifies.
Described electric elements failure detection circuit 4 also comprises voltage failure detection circuit 5 and optical detection circuit 6, described voltage failure detection circuit 5 comprises the second connector CON2 that is used for linking to each other with electrical equipment, anodal the 5th diode D5 that links to each other with the other end of the second connector CON2, the negative pole of the 5th diode D5 is connected the negative pole of voltage stabilizing diode D7 with the 4th resistance R 4 series connection backs, other has the negative pole of the 5th resistance R 5 and the 6th capacitor C 6 back one termination the 5th diode D5 in parallel, other end ground connection.Described optical detection circuit 6 comprises photodiode D8 and the comparer IC3 that tests television screen, described photodiode D8 is connected on the 5th connector CON5, be positioned at outside the instrument body, other has the 6th connector CON6 to peg graft with the 5th connector CON5 coupling, make the positive pole of photodiode D8 connect the 12V reference voltage by first resistance R 1, minus earth, connect the 5th capacitor C 5 between the both positive and negative polarity of photodiode D8, the positive pole of described comparer IC3 connects the 12V reference voltage by an adjustable resistance R2, negative pole connects the positive pole of photodiode D8 and the tie point of first resistance R 1, output terminal is by just meeting the 6th diode D6, the 4th resistance R of connecting 4 backs connect the negative pole of voltage stabilizing diode D7, the plus earth of voltage stabilizing diode D7, the output terminal of comparer IC3 connects an end of the 3rd resistance R 3, the other end ground connection of the 3rd resistance R 3.Connect an interface during experiment arbitrarily, the second connector CON2 is the voltage detecting mouth, and input high level is normal, and low level was for losing efficacy, and the 6th connector CON6 is that photodiode D8 joins by the 5th connector CON5 and light detection probe externally.Light detection probe D8 places (experimental subjects) before the television screen, if televisor screen when start is unglazed, light detection probe D8 is not subjected to light, very little from 1 2V through the electric current that first resistance R 1 flows through photodiode D8, so negative pole input high level of comparer IC3, through comparer IC3 relatively after output 0V, so the electrical equipment failure detection pin of little process chip IC4 detects low level, promptly experimental subjects lost efficacy.Otherwise televisor screen when start has light, and the electrical equipment failure detection pin of little process chip IC4 detects high level, and promptly experimental subjects is normal.
Described switching on and shutting down output circuit 7 comprises the first triode Q1 as emitter follower, the 4th triode Q4 as phase inverter, the relay 9 and first K switch 1, described little process chip IC4 indicates the Control of Voltage pin of little process chip IC4 to output signal to the base stage of the first triode Q1 by software, the emitter of the first triode Q1 connects the base stage of the 4th triode Q4, the collector of the collector of the first triode Q1 and the 4th triode Q4 is connected relay 9 two ends respectively, switch on or off according to time or the tested galvanoscopic disablement signal set with pilot relay 9, thereby control 1 folding of first K switch, with disconnection and the connection purpose that reaches control apparatus switch CON3 and supply socket CON4.
Described warning circuit 8 comprises as complex pipe Q2, the Q3 of emitter follower and loudspeaker 10, described little process chip IC4 indicates little process chip IC4 to output signal to the base stage of complex pipe Q2, Q3 by software, the emitter of described complex pipe Q2, Q3 is connected and is connected an end of loudspeaker 10 after the 7th capacitor C 7 again, be used to drive sound horn, the other end ground connection of loudspeaker 10, the emitter of complex pipe Q2, Q3 the 9th resistance R 9 back ground connection of connecting.
Claims (9)
1. an electric switch is tested detector, comprise little process chip (IC4), the feed circuit (1) and the switching on and shutting down output circuit (7) that links to each other with little process chip (IC4) of power supply are provided for little process chip (IC4), it is characterized in that: also comprise termination test testing circuit (2) and storer (IC5), described termination test testing circuit (2) is used for the termination signal in perception when test and termination signal is imported little process chip (IC4), and described storer (IC5) is solidificated in the parameter that the driving of the Control Software in little process chip (IC4) tests electric switch and stores or read when termination signal is imported in little process chip (IC4).
2. electric switch test detector as claimed in claim 1, it is characterized in that: described termination test testing circuit (2) comprises a detector closedown detection circuit (3), the off signal of detector when being used for the perception test, the input end of described detector closedown detection circuit (3) links to each other with power supply, and when detector shuts down than the first power down of feed circuit (1), output terminal links to each other with the pass machine testing pin of little process chip (IC4), the parameter of electric switch test is stored by the Failure Control software instruction memory (IC5) that solidifies in order to trigger little process chip (IC4).
3. electric switch test detector as claimed in claim 2, it is characterized in that: described detector closedown detection circuit (3) and feed circuit (1) connect from same power supply signal, described feed circuit (1) are through first diode (D1), second diode (D2) rectification, first electric capacity (C1) filtering, supply with the supply pin of little process chip (IC4) after first voltage stabilizer (IC1) voltage stabilizing, described detector closedown detection circuit (3) is through the 3rd diode (D3), the 4th diode (D4) rectification, the 3rd electric capacity (C3) filtering, supply with the pass machine testing pin of little process chip (IC4) after second voltage stabilizer (IC2) voltage stabilizing, the appearance value of described first electric capacity (C1) is greater than the appearance value of the 3rd electric capacity (C3).
4. electric switch test detector as claimed in claim 1 or 2, it is characterized in that: described termination test testing circuit (2) also comprises an electric elements failure detection circuit (4), tested galvanoscopic component failure signal when being used for the perception test, the input termination of described electric elements failure detection circuit (4) is from tested electroscope, detected high-low level signal is imported the electrical equipment failure detection pin of little process chip (IC4), by the Failure Control software instruction memory (IC5) that solidifies the parameter of electric switch test is stored in order to trigger little process chip (IC4).
5. electric switch test detector as claimed in claim 4, it is characterized in that: described electric elements failure detection circuit (4) comprises voltage stabilizing diode (D7), the plus earth of described voltage stabilizing diode (D7), negative pole connects the electrical equipment failure detection pin of little process chip (IC4), for the electrical equipment failure detection pin of little process chip (IC4) provides high-low level as electrical equipment failure detection signal.
6. electric switch test detector as claimed in claim 5, it is characterized in that: described electric elements failure detection circuit (4) comprises voltage failure detection circuit (5), described voltage failure detection circuit (5) comprises second connector (CON2) that is used for linking to each other with electrical equipment, anodal the 5th diode (D5) that links to each other with the other end of second connector (CON2), and the negative pole of the 5th diode (D5) connects the negative pole of voltage stabilizing diode (D7).
7. electric switch test detector as claimed in claim 5, it is characterized in that: described electric elements failure detection circuit (4) comprises optical detection circuit (6), described optical detection circuit (6) comprises photodiode (D8) and the comparer (IC3) of testing television screen, the positive pole of described photodiode (D8) connects reference voltage by first resistance (R1), minus earth, the positive pole of described comparer (IC3) connects reference voltage by an adjustable resistance (R2), negative pole connects the positive pole of photodiode (D8) and the tie point of first resistance (R1), and output terminal is by just connecing the negative pole that the 6th diode (D6) back connects voltage stabilizing diode (D7).
8. electric switch test detector as claimed in claim 1, it is characterized in that: described switching on and shutting down output circuit (7) comprises first triode (Q1) as emitter follower, the 4th triode (Q4) as phase inverter, relay (9) and first switch (K1), described little process chip (IC4) indicates the Control of Voltage pin of little process chip (IC4) to output signal to the base stage of first triode (Q1) by timing controlled software, the emitter of first triode (Q1) connects the base stage of the 4th triode (Q4), the collector of the collector of first triode (Q1) and the 4th triode (Q4) is connected relay (9) two ends respectively, switch on or off according to time or the tested galvanoscopic disablement signal set with pilot relay (9), thereby control first switch (K1) folding, to reach the control apparatus switching purposes.
9. electric switch test detector as claimed in claim 1, it is characterized in that: described electric switch test detector also comprises warning circuit (8), described warning circuit (8) can be selected following action according to the indication of solidification software in little process chip (IC4):
1) reports to the police according to the time of setting;
Reported to the police when 2) tested electroscope loses efficacy; Described warning circuit (8) comprises complex pipe (Q2, Q3) and the loudspeaker (10) as emitter follower, described little process chip (IC4) indicates little process chip (IC4) to output signal to the base stage of complex pipe (Q2, Q3) by software, the emitter of described complex pipe (Q2, Q3) connects an end of loudspeaker (10), be used to drive sound horn, the other end ground connection of loudspeaker (10).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 03140174 CN1229648C (en) | 2003-08-15 | 2003-08-15 | Electric switch test detecting instrument |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 03140174 CN1229648C (en) | 2003-08-15 | 2003-08-15 | Electric switch test detecting instrument |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1487302A CN1487302A (en) | 2004-04-07 |
| CN1229648C true CN1229648C (en) | 2005-11-30 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 03140174 Expired - Fee Related CN1229648C (en) | 2003-08-15 | 2003-08-15 | Electric switch test detecting instrument |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN1229648C (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100529775C (en) | 2005-01-10 | 2009-08-19 | 鸿富锦精密工业（深圳）有限公司 | Power supply switch controller |
| CN102539969B (en) * | 2011-12-31 | 2015-12-09 | 渤海造船厂集团有限公司 | Marine electric valve electric property debugging device |
| CN107241596A (en) * | 2017-03-14 | 2017-10-10 | 深圳市帆泰检测技术有限公司 | Television set switch test device |
-
2003
- 2003-08-15 CN CN 03140174 patent/CN1229648C/en not_active Expired - Fee Related
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| Publication number | Publication date |
|---|---|
| CN1487302A (en) | 2004-04-07 |
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Granted publication date: 20051130 Termination date: 20120815 |