CN1197208A - Measuring device to reflect diffuse reflector and light distribution transmitted through three dimensional space - Google Patents

Measuring device to reflect diffuse reflector and light distribution transmitted through three dimensional space Download PDF

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Publication number
CN1197208A
CN1197208A CN 96114650 CN96114650A CN1197208A CN 1197208 A CN1197208 A CN 1197208A CN 96114650 CN96114650 CN 96114650 CN 96114650 A CN96114650 A CN 96114650A CN 1197208 A CN1197208 A CN 1197208A
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China
Prior art keywords
light source
circular arc
switch
detector
rotating disk
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Pending
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CN 96114650
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Chinese (zh)
Inventor
金锡峰
乔德林
周素香
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Changchun Institute of Optics Fine Mechanics and Physics of CAS
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Changchun Institute of Optics Fine Mechanics and Physics of CAS
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Application filed by Changchun Institute of Optics Fine Mechanics and Physics of CAS filed Critical Changchun Institute of Optics Fine Mechanics and Physics of CAS
Priority to CN 96114650 priority Critical patent/CN1197208A/en
Publication of CN1197208A publication Critical patent/CN1197208A/en
Pending legal-status Critical Current

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Abstract

A measuring device for measuring the characteristics of diffuse-reflecting object, especially for measuring the 3-D light distribution from ground leaves in telesensing technique, is composed of rotary table, detection frame, light source holder, switch, detector, light source and computer, and uses different incidence angles, detecting angles, azimuth angles and wavebands to measure the transmitted and reflected light distribution in 3-D space in semi-spherical range.

Description

To the diffuse reflector reflection with through the photodistributed measurement mechanism of three dimensions
The invention belongs to optical technical field, relate to measurement, especially for the instrument that in the remote sensing technology field atural object blade face three dimensions light is distributed and measures diffuse reflection object characteristic.
Prior art is made up of 45 ° of catoptrons, polariscope, detector, light source, rotating disks, its light source irradiation is on testee, and on object, produce diffuse reflection, detector rotates around testee on rotating disk, it only adopts a detector, makes detector have only a detection angle that testee is surveyed, and this two-dimensional space light apparatus for measuring distribution can only remote sensing obtains the two dimensions of information of testee, it is according to the spectral signature of testee individuality, and based on irreflexive supposition.In the practice of the mechanism of research plant canopy and radiation interaction, confirmed testee as the supposition of diffuse reflector and actually differ too big, then prior art can not satisfy the needs to the measurement of diffuse reflector spatial light distribution.
The present invention brings problem in order to overcome prior art, with the measurement mechanism of atural object two to sexual reflex, the spatial light distribution of Measuring Object Three Dimensions Structure.
Detailed content of the present invention: it comprises rotating disk 1, survey frame 2, light source shelf 3, switch 4, detector 5, light source 6, computing machine 7, power supply 8, resistance 9, amplifier 10, bearing support 11, locking handle 12, supporting base 13, characteristics of the present invention: be installed with switch 4 and circular arc on the rotating disk 1 and survey frame 2, survey on the frame 2 in circular arc, size according to detector 5 physical dimension, every 5 ° of-15 ° of arrangement detectors 5, on bearing support 11, be placed in supporting base 13 and locking handle 12, the rotating shaft of circular arc light source shelf 3 is placed in 13 li angles of adjusting light source 6 incident lights of supporting base, and locks with locking handle 12.On circular arc light source shelf 3, settle light source 6 from 0 ° of-70 ° of scope of circular arc, in 0 ° of-360 ° of scope of rotating disk 1 every 5 ° of-10 ° of arrangement switches 4, circular arc is surveyed the arc radius of the arc radius of frame 2 less than circular arc light source shelf 3, one termination power 8 of switch 4, the other end connecting resistance 9 of power supply 8, the other end of another termination switch 4 of resistance 9, control line at two termination computing machines 7 of resistance 9, the output termination amplifier 10 of detector 5 and feed the data acquisition end of computing machine 7, the arc radius of circular arc detector 2 is less than the arc radius of circular arc light source shelf 3.
Good effect of the present invention: the present invention measures bidirectional reflectance than function variable and incident radiation flux spatial distribution function, has improved prior art and has only utilized a detector can not change the problem of its detection angle.The present invention's light source irradiation testee of different angles, survey different reflection and the transmission angles of testee with the detector of surveying different angles on the frame, and reasonably arrange switch, can survey testee from different directional bearing angles again, thereby realized testee is carried out incident angle, search angle, the measurement of three directions in position angle, from detecting the reflectivity of measured object, terrain object space structure and high-level information are extracted in research, provide easy to use, the photodistributed measurement mechanism of the reliable three dimensions of result of detection obtains the measurement of the reflectance value of any point in the hemisphere space.When if desired testee being seen through detection, can change the incident light of light source the backs of 180 ° of irradiation testees, promptly finish the photodistributed permeametry of three dimensions.
Fig. 1 is the structural representation of an embodiment of the present invention.
Fig. 2 is the electrical block diagram of an embodiment of the present invention.
One embodiment of the present of invention: as depicted in figs. 1 and 2, other shape that did not move at the center when rotating disk 1 can be made circle or be formed in rotation with aluminium or other metal materials.Detector 2 and light source shelf 3 usefulness metal materials are made, and survey the arc radius of the arc radius of frame 2 less than light source shelf 3.Switch 4 is selected short circuiting switch for use.Detector 5 can be selected according to the needs of TM Classfication Image wave band and MSS wave band.Light source 6 is selected for use according to measuring needs, and light source 6 can be selected 30W, 25W, bromine tungsten nail that 35W is stable for use in the present embodiment.Computing machine 7 can be selected single-chip microcomputer or other for use.Power supply 8 direct current 5V, resistance 9 select for use carbon resister, amplifier 10 to select operational amplifier for use.Bearing support 11, locking handle 12, supporting base 13 select for use metal material to make.Add the interference filter of corresponding wave band in detector 5 fronts according to the requirement of different-waveband.Select two groups of detectors 5 of 5, two wave bands of detector of 600-760nm and two wave bands of 760-1100nm to be placed in respectively on orthogonal two circular arcs detection frame 2 in the present embodiment.Surveying frame 2 can change various wave bands and organize detector 5 more according to the wave band needs, measures needs to be applicable to various wave bands.Can survey on the frame 2 at 1/4 circular arc and select to place a detector 5 every 10 ° since 0 °, if place 7 detectors or select other to place detector 5 at interval, on 1/4 circular arc light source shelf 3 from 0 ° of-70 ° of scope of its circular arc, select the angle of incident light arbitrarily with locking handle 12, for example use primary source 6 instead every 10 ° what circular arc was surveyed frame 2, promptly adjust, thereby reach the purpose that changes incident angle of light with locking handle 12.Switch 4 is selected to place a switch 4 every 10 ° in 0 °~360 ° scopes of rotating disk 1, places 35 altogether.
When complete machine is switched on, motor drives rotating disk 1 through speed change gear and surveys frame 2 and detector 5 rotations, when selecting 0 ° of incident light source 6, first switch 4 closures, the reflectivity of detector 5 on the every bit of 0~10 ° range detection testee, the reflectivity data of each point of being surveyed by 7 pairs of one group of detectors of computing machine 5 is gathered, then rotating disk 1 is rotated further second switch 4 0~360 ° of scope ... the 35 switch 4,7 pairs in computing machine is in 360 ° of azimuth coverages of rotating disk 1, detector 5 is surveyed the data of the reflectivity on each point of testee and is carried out acquisition process, obtains 2 π angular region light distribution curves of an incident angle this moment.When second incident angle selecting light source 6 ... during the 7th incident angle, when selecting each incident angle, rotating disk 1 rotates 360 °, detector 5 is surveyed the reflectivity data of eight groups of each points of testees eight incident angles, and carries out the spatial light distribution curve that acquisition process obtains testee by 7 pairs of every group of data of computing machine.

Claims (2)

1, to the diffuse reflector reflection with through the photodistributed measurement mechanism of three dimensions, comprise: rotating disk 1, switch 4, light source 6, it is characterized in that: be installed with switch 4 and circular arc on the rotating disk 1 and survey frame 2, survey on the frame 2 in circular arc, size according to detector 5 physical dimension, settle one group of detector 5 every 5 °-15 °, on bearing support 11, settle supporting base 13 and locking handle 12, the rotating shaft of circular arc light source shelf 3 is placed in the hole of supporting base 13, adjust the angle of light source 6 incident lights and use locking handle 12 lockings, 0 ° of-70 ° of scope from circular arc on circular arc light source shelf 3 is settled light source 6, in 0-360 ° of scope of rotating disk 1 every 5-10 ° of arrangement switch 4, source 8 in one termination of switch 4, the other end connecting resistance 9 of power supply 8, the other end of another termination switch 4 of resistance 9, at the control line of two termination computing machines 7 of resistance 9, the output termination amplifier 10 of detector 5 and feed the data acquisition end of computing machine 7.
2, device according to claim 1 is characterized in that: circular arc is surveyed the arc radius of the arc radius of frame 2 less than circular arc light source shelf 3.
CN 96114650 1996-12-23 1996-12-23 Measuring device to reflect diffuse reflector and light distribution transmitted through three dimensional space Pending CN1197208A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 96114650 CN1197208A (en) 1996-12-23 1996-12-23 Measuring device to reflect diffuse reflector and light distribution transmitted through three dimensional space

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 96114650 CN1197208A (en) 1996-12-23 1996-12-23 Measuring device to reflect diffuse reflector and light distribution transmitted through three dimensional space

Publications (1)

Publication Number Publication Date
CN1197208A true CN1197208A (en) 1998-10-28

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CN 96114650 Pending CN1197208A (en) 1996-12-23 1996-12-23 Measuring device to reflect diffuse reflector and light distribution transmitted through three dimensional space

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Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100443881C (en) * 2004-07-08 2008-12-17 中国科学院安徽光学精密机械研究所 Field BRDF fixed point automatic measuring device
CN102088839A (en) * 2009-03-25 2011-06-08 国立大学法人长冈技术科学大学 Method for diagnosing growth of crop and system for diagnosing growth
CN102590150A (en) * 2012-03-01 2012-07-18 浙江大学 Indoor hyperspectral bidirectional reflectance distribution function (BRDF) determining system
CN103076305A (en) * 2012-12-28 2013-05-01 西北核技术研究所 Device for measuring surface diffuse reflectivity of material
CN103115876A (en) * 2013-01-25 2013-05-22 中国科学院合肥物质科学研究院 Novel field bidirectional reflectance distribution function automatic measuring device
CN104458655A (en) * 2014-11-18 2015-03-25 北京环境特性研究所 Device and method for measuring bidirectional scattering characteristics of material
CN104568847A (en) * 2014-12-21 2015-04-29 华东交通大学 Device and method for detecting activity of catalase of tomato leaves by multi-angle in-situ spectrum
CN110426374A (en) * 2019-07-31 2019-11-08 武昌理工学院 A kind of remote light sensation measurement analysis device
CN110823836A (en) * 2019-08-14 2020-02-21 长春欧明科技有限公司 Multi-angle test system for surface feature spectrum

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100443881C (en) * 2004-07-08 2008-12-17 中国科学院安徽光学精密机械研究所 Field BRDF fixed point automatic measuring device
CN102088839A (en) * 2009-03-25 2011-06-08 国立大学法人长冈技术科学大学 Method for diagnosing growth of crop and system for diagnosing growth
CN102088839B (en) * 2009-03-25 2012-08-08 国立大学法人长冈技术科学大学 Method for diagnosing growth of crop and system for diagnosing growth
CN102590150A (en) * 2012-03-01 2012-07-18 浙江大学 Indoor hyperspectral bidirectional reflectance distribution function (BRDF) determining system
CN103076305A (en) * 2012-12-28 2013-05-01 西北核技术研究所 Device for measuring surface diffuse reflectivity of material
CN103076305B (en) * 2012-12-28 2015-03-25 西北核技术研究所 Device for measuring surface diffuse reflectivity of material
CN103115876A (en) * 2013-01-25 2013-05-22 中国科学院合肥物质科学研究院 Novel field bidirectional reflectance distribution function automatic measuring device
CN104458655A (en) * 2014-11-18 2015-03-25 北京环境特性研究所 Device and method for measuring bidirectional scattering characteristics of material
CN104568847A (en) * 2014-12-21 2015-04-29 华东交通大学 Device and method for detecting activity of catalase of tomato leaves by multi-angle in-situ spectrum
CN110426374A (en) * 2019-07-31 2019-11-08 武昌理工学院 A kind of remote light sensation measurement analysis device
CN110426374B (en) * 2019-07-31 2022-02-15 武昌理工学院 Remote light sensing measurement and analysis device
CN110823836A (en) * 2019-08-14 2020-02-21 长春欧明科技有限公司 Multi-angle test system for surface feature spectrum

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