CN1187624C - Device and method for measuring luminous intensity using a photomultiplier comprising a calibration source - Google Patents
Device and method for measuring luminous intensity using a photomultiplier comprising a calibration source Download PDFInfo
- Publication number
- CN1187624C CN1187624C CNB00813393XA CN00813393A CN1187624C CN 1187624 C CN1187624 C CN 1187624C CN B00813393X A CNB00813393X A CN B00813393XA CN 00813393 A CN00813393 A CN 00813393A CN 1187624 C CN1187624 C CN 1187624C
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- radiation
- source
- measurement
- measured
- calibration source
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/208—Circuits specially adapted for scintillation detectors, e.g. for the photo-multiplier section
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/36—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
- G01T1/40—Stabilisation of spectrometers
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- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Measurement Of Radiation (AREA)
Abstract
The invention relates to a device (2) for measuring the luminous intensity of radiation, comprising a photomultiplier (4) which has a photoelectric input cathode and a calibration source (5). Said calibration source is adapted to emit radiation of a constant intensity towards said photoelectric cathode. According to the inventive method, the measurement for the radiation to be measured is related to that of the radiation of the calibration source. The advantages of the invention include the elimination of fluctuations and/or deviations of the photomultiplier gain. The invention can be advantageously used with pulsed X-rays.
Description
Technical field
The present invention relates to use the luminous intensity measurement of photomultiplier cell.
Background technology
The gain of photomultiplier cell subjects to the fluctuation of short-term, for example results from the short-term fluctuation of temperature variation of this photomultiplier cell, with long-term fluctuation or skew, for example results from the wearing and tearing and aging long-term fluctuation or skew of this photomultiplier cell.
The measurement that is directly provided by photomultiplier cell is introduced error in these fluctuations of gain or skew.In document EP 0,066, the video camera of describing in 763 is especially true, and it comprises a chopping calibration source, and measures permanent radiation.
Summary of the invention
The objective of the invention is for fear of this shortcoming.
For this purpose, theme of the present invention is a kind of measuring radiation and interactional equipment of material of being used for, comprise the primary radiation source that produces described radiation, the assembly of the light intensity of measurement and the interactional described radiation of described material, described assembly comprises that has a photomultiplier cell that is used to make the main window that described radiation enters, be placed on the input photocathode in the described main window zone, and one be suitable for the calibration source of the Radiation Emission of constant intensity to the described photocathode, and described assembly also comprises: the device that is used to extinguish the described radiation in primary radiation source or is used to block described radiation to be measured; Only be used for extinguish or block described radiation during in start the device of described calibration source.
According to the said equipment of the present invention, it is characterized in that it also comprises: the device that is used to set up the relation between the measurement that the measurement made by the photomultiplier cell that is exposed under the described radiation to be measured and photomultiplier cell under the same conditions make in the cycle that described radiation is not only extinguished but also do not blocked in calibration source starts the cycle.
According to the said equipment of the present invention, it is characterized in that described calibration source is a light emitting diode.
According to the said equipment of the present invention, the wavelength that it is characterized in that the maximum emission intensity of described diode drops within the wavelength coverage of peak response of described photomultiplier cell.
According to the said equipment of the present invention, it is characterized in that it comprises a flicker element, its is crossed over primary input window and is suitable for radiation to be measured is transformed to the radiation of the wavelength that is fit to described photomultiplier cell sensitivity, and this calibration source is transmitted directly on the described photocathode and does not pass through this flicker element.
According to the said equipment of the present invention, it is characterized in that it comprises described material is placed on device in the radiation path between described primary radiation source and the described measurement assembly.
According to the said equipment of the present invention, it is characterized in that described primary radiation source is an x-ray source.
According to the said equipment of the present invention, it is characterized in that described x-ray source be chopping so that described primary radiation source periodically extinguished.
According to the said equipment of the present invention, it is characterized in that the x-ray source of described chopping comprises an X-ray tube, it has a filament, an anode and a negative electrode, and comprises the device that is used for applying a high AC voltage between described anode and described negative electrode.
The present invention can also have one or more following characteristics:
-described standard source is a light emitting diode;
The wavelength of the emission maximum light intensity of-described diode is in the wavelength coverage of the peak response of described photomultiplier cell;
-this device comprises a flicker element of radiation that is suitable for radiation to be measured is transformed to the sensitivity of the suitable described photomultiplier cell of wavelength of crossing over that the primary input window places, and calibration source is transmitted directly on the described photocathode and does not pass through scintillater.
Because flicker element is usually without undergoing any fluctuation or drift, thereby calibration radiation can be applied directly on the photomultiplier cell and needn't pass through scintillater.
Theme of the present invention is again a kind of method of measuring radiation light intensity, the equipment that uses comprises the primary radiation source that produces described radiation, the assembly of the light intensity of measurement and the interactional described radiation of described material, described assembly comprises that has a photomultiplier cell that is used to make the main window that described radiation enters, be placed on the input photocathode in the described main window zone, and one be suitable for the calibration source of the Radiation Emission of constant intensity to the described photocathode, and described assembly also comprises: the device that is used to extinguish the described radiation in primary radiation source or is used to block described radiation to be measured; Only be used for extinguish or block described radiation during in start the device of described calibration source, described method comprises: measure radiation to be measured, measure the radiation of calibration source, and the measurement of radiation to be measured is associated with measurement from the radiation of calibration source, described method comprises following continuous step: calibration source extinguish or situation about blocking under, use photomultiplier cell to measure the intensity of radiation to be measured; Then radiation to be measured extinguish or situation about blocking under, use to remain on the identical photomultiplier cell that is provided with under the condition and measure intensity from the radiation of calibration source; And the measurement by setting up radiation to be measured and from the relation between the measurement of the radiation of calibration source, calculate the last intensity level of radiation.
According to said method of the present invention, be used for the thickness of measuring with the material of described radiation interaction to be measured by absorbing.
Such x-ray source is durable and cheapness.
Theme of the present invention is again the method for a kind of use according to measurement device radiation light intensity of the present invention, and wherein the measurement of radiation to be measured is relevant with the measurement that comes self-alignment radiation; In more detail, the method comprises following continuous step:
-calibration source extinguish or situation about blocking under, use photomultiplier cell to measure the light intensity of radiation to be measured;
-then radiation to be measured extinguish or situation about blocking under, use to remain on the identical photomultiplier cell that is provided with under the condition and measure light intensity from the radiation of calibration source; With
-by setting up radiation to be measured measurement and from the relation between the measurement of the radiation of calibration source, derive the last intensity level of radiation.
At last, theme of the present invention is to use according to device of the present invention or method and measures by absorbing the thickness with the material of described radiation interaction to be measured.
Description of drawings
According to reading below by nonrestrictive example and the description that provides with reference to each accompanying drawing, will more be expressly understood the present invention, in these accompanying drawings:
Fig. 1 is a reduced graph that is used to measure the device of material thickness, comprises according to measuring device of light intensity of the present invention;
Fig. 2 is the synoptic diagram of the continuous coverage program an of the method according to this invention; With
Fig. 3 A and 3B are respectively the simplified electrical circuit diagram of the x-ray source and a continuous x-ray source of a chopping.
Embodiment
According to this nonrestrictive description, the present invention is summarised in the device (equipment) that is used to measure material 3 thickness; Thickness measure is routinely by measuring the radiation of absorbed thus.
This measurer for thickness (equipment) comprises a primary radiation source 1, a device (assembly) 2 that is used to measure by absorption with the light intensity of material 3 interactional radiation, and be used for material 3 is placed on the device (not shown) of the radiation path between main source 1 and the measurement mechanism 2.
Measurement mechanism (assembly) 2 comprises a photomultiplier cell 4.
Photomultiplier cell 4 has the main window and the input photocathode (not shown) that is placed in the described window area that are used to import radiation to be measured routinely.
According to the present invention, measurement mechanism 2 comprises that one is suitable for the radiation of constant intensity is transmitted directly to calibration source 5 on the photocathode.
Routinely, this device 2 also comprises and is used for the pre-device 6 that the signal that is provided by photomultiplier cell 4 with coding is provided, with the code translator 7 that is connected with calibration source 5 with pre-multiplying arrangement 6.
As main source 1, if 3 pairs of visible radiation opaques of material use emission wavelength ranges to be suitable for measuring the x-ray source of this material thickness; Because photomultiplier cell is very insensitive to detecting X ray usually, thereby photomultiplier cell 4 has the flicker element 8 of radiation that the sensitivity of the suitable photomultiplier cell of wavelength was placed and be suitable for radiation to be measured is transformed to a primary input window of crossing over it.
Should be understood that the such placement of calibration source so that it is transmitted directly on the photocathode of photomultiplier cell 4, and by scintillater 8.
With reference to Fig. 3 A, preferably use the chopping x-ray source as main source 1, this source comprises an X ray power valve 1 or an X-ray tube that a filament, an anode and a negative electrode are arranged, and is used for applying between described anode and described negative electrode the device of a high AC voltage; The circuit diagram of the such impulse source of Fig. 3 A table method is compared with the circuit diagram of the continuous source of representing among Fig. 3 B that comprises a rectifier in high-tension circuit, does not have rectifier in high-tension circuit.
The pulse radiation pattern in this source advantageously provides the device that periodically extinguishes primary radiation source 1.
As calibration source 5, preferably use light emitting diode.
At last, measurement mechanism 2 only comprises the device that activates calibration source 5 in the cycle that radiation source 5 extinguishes, and code translator 7 is suitable for setting up by the relational expression of photomultiplier cell 4 between measurement that an impulse duration of main source 1 emission is made and the measurement made in the one-period that calibration source 5 is launched by photomultiplier cell 4 under the same conditions that is exposed to radiation to be measured under.
The method of the present invention that realizes will be described now.
Referring to Fig. 2, carry out following two luminous intensity measurement programs in order:
-in supplying with the positive half period (+) of X-ray tube, corresponding to the emission (the B phase among Fig. 2) in source 1, calibration source 5 do not launch-it extinguishes-thereby use the photomultiplier cell measurement to come since then source 1 by the intensity of the radiation of material 3;
-then, in the negative half-cycle (-) of supplying with X-ray tube, corresponding to the semiperiod of anti-anode-cathode bias voltage, source 1 is not launched thereby is extinguished (the C phase among Fig. 2) during this period, and calibration source 5 emissions (" opening " mode) thereby use remain on the identical photomultiplier cell that is provided with under the condition and measure intensity from the radiation of calibration source 5.
Code translator 7 is suitable for the signal that is provided by photomultiplier cell during the signal that is provided by photomultiplier cell during the B phase (actual measurement) coexists C phase (calibration) separately.
Calculate the final strength value of radiation by the relation that is based upon between the actinometry that actinometry that B makes during mutually makes during mutually with C.
Therefore, the value that obtains is advantageously irrelevant with skew with the fluctuation of photoelectricity multiplier.
Best, the temperature stabilization of light emitting diode is in a temperature range, and its emissivity is the most stable and the most irrelevant with temperature in this temperature range.
Then, calculate the thickness of material 3 from the radiation intensity value that obtains with known method.
Radiation measurement assembly according to the present invention can be used for well beyond the very different application in material thickness fields of measurement or X ray wavelength field.
When connecting a roentgenometer or during, can use the influence of radiation measuring device of light intensity according to the present invention with definite spur signal (spurioussignal) about the measurement that provides by photomultiplier cell when a fault.
By as above-mentioned stop the X ray emissive source with by opening calibration source, thereby be easy to prove the existence of these spur signals and make adjustment so that suitable words reduce the sensitivity (for example by adjusting quality (mass), shielding and zero setting) of this instrument.
Therefore can make " reception " cross section of irrespectively checking instrument with its " emission " cross section according to apparatus and method of the present invention.
And many equipment use the photomultiplier cell formula detecting device that has scintillater, especially in the roentgenometer of routine; With reference to Fig. 3 A and 3B, the present invention makes especially can not interrupted luminous intensity measurement and use the meter of the emission of pulse the most reliably so far, and this is because they are only by the filament heating transformer, directly supply with the simple structure (seeing Fig. 3 A) of the high-tension transformer of the pipe between anode and the negative electrode and the x-ray source that X-ray tube itself is formed.One comprises that may can cause by the rectification of capacitor and the continuous source of filtering stage (seeing Fig. 3 B) can not be simply more unreliable with the device of carrying out the present invention at an easy rate and obtain.
Claims (11)
1. be used for the interactional equipment of measuring radiation and material, the assembly that comprises the light intensity of the primary radiation source, measurement and the interactional described radiation of described material that produce described radiation, described assembly comprises that has a photomultiplier cell that is used to make the main window that described radiation enters, be placed on the input photocathode in the described main window zone, it is characterized in that described assembly also comprises: one is suitable for the calibration source of the Radiation Emission of constant intensity to the described photocathode; The device that is used to extinguish the described radiation of primary radiation source generation or is used to block described radiation to be measured; Only be used for extinguish or block described radiation during in start the device of described calibration source.
2. according to the equipment of claim 1, it is characterized in that it also comprises:
Be used to set up the device of the relation between the measurement that the measurement made by the photomultiplier cell that is exposed under the described radiation to be measured and photomultiplier cell under the same conditions make in calibration source starts the cycle in the cycle that described radiation is not only extinguished but also do not blocked.
3. according to the equipment of claim 1 or 2, it is characterized in that described calibration source is a light emitting diode.
4. according to the equipment of claim 3, the wavelength that it is characterized in that the maximum emission intensity of described diode drops within the wavelength coverage of peak response of described photomultiplier cell.
5. according to the equipment of claim 1, it is characterized in that it comprises a flicker element, its is crossed over primary input window and is suitable for radiation to be measured is transformed to the radiation of the wavelength that is fit to described photomultiplier cell sensitivity, and this calibration source is transmitted directly on the described photocathode and does not pass through this flicker element.
6. according to the arbitrary equipment among the claim 1-2, it is characterized in that it comprises described material is placed on device in the radiation path between described primary radiation source and the described measurement assembly.
7. according to the equipment of claim 6, it is characterized in that described primary radiation source is an x-ray source.
8. according to the equipment of claim 7, it is characterized in that described x-ray source be chopping so that described primary radiation source periodically extinguished.
9. equipment according to Claim 8, the x-ray source that it is characterized in that described chopping comprises an X-ray tube, it has a filament, an anode and a negative electrode, and comprises the device that is used for applying a high AC voltage between described anode and described negative electrode.
10. the method for measuring radiation light intensity, the equipment that uses comprises the assembly of the light intensity of the primary radiation source, measurement and the interactional described radiation of described material that produce described radiation, described assembly comprises that has a photomultiplier cell that is used to make the main window that described radiation enters, be placed on the input photocathode in the described main window zone, and one be suitable for the calibration source of the Radiation Emission of constant intensity to the described photocathode, and described assembly also comprises: the device that is used to extinguish the described radiation in primary radiation source or is used to block described radiation to be measured; Only be used for extinguish or block described radiation during in start the device of described calibration source,
Described method comprises:
Measure radiation to be measured, measure the radiation of calibration source, and the measurement of radiation to be measured is associated with measurement from the radiation of calibration source, described method comprises following continuous step: calibration source extinguish or situation about blocking under, use photomultiplier cell to measure the intensity of radiation to be measured; Then radiation to be measured extinguish or situation about blocking under, use to remain on the identical photomultiplier cell that is provided with under the condition and measure intensity from the radiation of calibration source; And the measurement by setting up radiation to be measured and from the relation between the measurement of the radiation of calibration source, calculate the last intensity level of radiation.
11., be used for the thickness of measuring with the material of described radiation interaction to be measured by absorbing according to the method for claim 10.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR99/10833 | 1999-08-26 | ||
| FR9910833A FR2797961B1 (en) | 1999-08-26 | 1999-08-26 | DEVICE AND METHOD FOR MEASURING LIGHT INTENSITY USING A PHOTOMULTIPLIER INCLUDING A CALIBRATION SOURCE |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1376269A CN1376269A (en) | 2002-10-23 |
| CN1187624C true CN1187624C (en) | 2005-02-02 |
Family
ID=9549375
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB00813393XA Expired - Fee Related CN1187624C (en) | 1999-08-26 | 2000-08-25 | Device and method for measuring luminous intensity using a photomultiplier comprising a calibration source |
Country Status (5)
| Country | Link |
|---|---|
| EP (1) | EP1236055A1 (en) |
| CN (1) | CN1187624C (en) |
| AU (1) | AU7016200A (en) |
| FR (1) | FR2797961B1 (en) |
| WO (1) | WO2001014909A1 (en) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7068361B2 (en) * | 1999-06-03 | 2006-06-27 | Baxter International | Apparatus, systems and methods for processing and treating a biological fluid with light |
| US20040003584A1 (en) * | 2002-03-19 | 2004-01-08 | Clay Joseph Michael | Method and apparatus for converting or otherwise utilizing radiation pressure to generate mechanical work |
| EP1987372A1 (en) * | 2006-01-30 | 2008-11-05 | The University of Sydney | Fibre optic dosimeter |
| US7800052B2 (en) * | 2006-11-30 | 2010-09-21 | Schlumberger Technology Corporation | Method and system for stabilizing gain of a photomultipler used with a radiation detector |
| CN105717532B (en) * | 2007-04-12 | 2019-07-26 | 皇家飞利浦电子股份有限公司 | The determination of the spatial gain distribution of scintillator |
| CN103267909B (en) * | 2013-04-22 | 2015-04-15 | 兰州空间技术物理研究所 | Electron multiplier test system generating incident electron source with photoelectric method |
| CN106569250B (en) * | 2016-10-21 | 2019-03-22 | 核工业北京化工冶金研究院 | A kind of online uranium mine leaches ore pulp uranium concentration measuring device and application method |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DK230481A (en) * | 1981-05-26 | 1982-11-27 | Gen Electric Nuclear Medical A | DEVICE BY AN OLD CAMERA FOR AUTOMATIC REINFORCEMENT CONTROL |
| FR2608778B1 (en) * | 1986-07-10 | 1989-06-02 | Electricite De France | DEVICE FOR COUNTING PARTICLES OF IONIZING RADIATION AND ITS USE FOR THE IMPLEMENTATION OF A METHOD OF MEASURING LEAKAGE FLOW BETWEEN THE PRIMARY AND SECONDARY CIRCUITS OF A STEAM GENERATOR |
| JPH02240588A (en) * | 1989-03-14 | 1990-09-25 | Toshiba Corp | Scintillation camera |
| JP3267548B2 (en) * | 1998-01-19 | 2002-03-18 | 株式会社島津製作所 | X-ray equipment |
-
1999
- 1999-08-26 FR FR9910833A patent/FR2797961B1/en not_active Expired - Fee Related
-
2000
- 2000-08-25 CN CNB00813393XA patent/CN1187624C/en not_active Expired - Fee Related
- 2000-08-25 EP EP00958735A patent/EP1236055A1/en not_active Withdrawn
- 2000-08-25 WO PCT/FR2000/002370 patent/WO2001014909A1/en active Search and Examination
- 2000-08-25 AU AU70162/00A patent/AU7016200A/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| FR2797961A1 (en) | 2001-03-02 |
| WO2001014909A1 (en) | 2001-03-01 |
| CN1376269A (en) | 2002-10-23 |
| EP1236055A1 (en) | 2002-09-04 |
| AU7016200A (en) | 2001-03-19 |
| FR2797961B1 (en) | 2001-12-07 |
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