CN118567421A - Calibration device, system and calibration method for chip internal analog voltage - Google Patents
Calibration device, system and calibration method for chip internal analog voltage Download PDFInfo
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Abstract
The application discloses a calibration device, a system and a calibration method for an analog voltage in a chip, and relates to the field of chips. The calibration device comprises a USB (universal serial bus) and is used for being connected with external control equipment, and the external control equipment writes a calibration program into the calibration device through the USB; the GPIO is used for connecting the chip to be tested and carrying out data interaction with the chip to be tested; an internal memory for storing a calibration program and calibration data; the CPU is connected with the USB, the GPIO and the internal memory and used for collecting, calculating and modifying the analog voltage in the chip to be tested; and the power supply is used for supplying power to the calibration device and the chip to be tested. The application is used for detecting the analog voltage in the MCU chip, and when the analog voltage in the MCU chip does not meet the requirement, the analog voltage in the chip is adjusted by modifying the calibration parameters so as to meet the calibration standard, thereby improving the calibration efficiency and the calibration accuracy and reducing the design cost and the manufacturing cost.
Description
Technical Field
The invention relates to the field of chips, in particular to a calibration device, a system and a calibration method for analog voltage in a chip.
Background
The MCU chip is provided with an analog circuit, the analog circuit is very sensitive to voltage, and the internal analog voltage is very necessary to calibrate in the factory test after the chip production because the abnormal function of the chip can be caused by the lower or higher internal analog voltage when the chip leaves the factory.
In the prior art, the analog voltage inside the chip is usually calibrated by a calibration circuit designed by an analog engineer, and the calibration circuit is arranged inside the chip, so that the circuit structure inside the chip is complex, and the circuit design capability of the analog engineer and the process requirements of a chip manufacturer are very high, thereby bringing a series of design cost and manufacturing cost. In addition, because the internal analog voltages of the chips on different wafers have differences, even on the same wafer, the internal analog voltages of the chips at different positions have errors, so the difficulty of the calibration of the internal analog voltages of the chips is further improved.
Disclosure of Invention
The invention provides a calibration device, a system and a calibration method for internal analog voltage of a chip, which are different from the prior art in conception.
In order to achieve the above purpose, the invention discloses the following technical scheme:
the first aspect of the present invention provides a calibration device for an analog voltage inside a chip, comprising:
The USB is connected with external control equipment, and the external control equipment writes a calibration program into the calibration device through the USB;
the GPIO is connected with the chip to be tested and used for carrying out data interaction with the chip to be tested;
An internal memory for storing a calibration program and calibration data;
the CPU is connected with the USB, the GPIO and the internal memory and used for collecting, calculating and modifying the analog voltage in the chip to be tested;
And the power supply is used for supplying power to the calibration device and the chip to be tested.
Further, the calibration device further includes:
the power supply channel is used for connecting the power supply and the chip to be tested, and the power supply supplies power to the chip to be tested through the power supply channel;
And the digital channel is used for connecting the GPIO and the chip to be tested, and the GPIO performs data interaction with the chip to be tested through the digital channel.
The above calibration device, the digital channels are arranged into three groups, wherein:
The first group of digital channels are connected with the SWD port of the chip to be tested and are used for loading a verification program to the chip to be tested;
The second group of digital channels are connected with the BIST port of the chip to be tested and are used for modifying the analog voltage inside the chip to be tested;
And the third group of digital channels are connected with the GPIO ports of the chip to be tested and are used for reading the analog voltage parameters output by the chip to be tested.
Optionally, in the calibration device, the first set of digital channels is 2 channels, the second set of digital channels is 5 channels, and the third set of digital channels is 12 channels.
The calibration device is characterized in that the power supply is also connected with the CPU and the GPIO to supply power for the CPU and the GPIO.
The calibration device comprises a calibration device for calibrating analog voltage inside a chip, wherein the calibration device comprises voltage detection and voltage modification,
The voltage detection includes:
the calibration device loads a voltage detection program and downloads the voltage detection program to the chip to be tested;
The chip to be tested obtains an internal analog voltage and outputs the internal analog voltage to the GPIO port in a binary mode;
And the calibration device reads the level on the GPIO port of the chip to be tested, converts the level into a decimal actual voltage value, detects whether the actual voltage value meets a check standard, and if so, the check is finished.
The voltage modification includes:
If the actual voltage value does not meet the verification standard, the calibration device calculates a difference value between the actual voltage value and a preset standard voltage value, writes the difference value into a voltage modification program, downloads the modified voltage modification program to the chip to be tested, and changes an analog voltage value inside the chip to be tested according to the difference value to meet the calibration standard.
In another aspect, the present invention provides a calibration system for an analog voltage inside a chip, the calibration system comprising an external control device, a chip to be tested, and a calibration apparatus according to the first aspect;
The external control equipment is connected with the calibration device through the USB and writes a calibration program into the calibration device;
The calibration device is connected with the chip to be tested through GPIO and is used for carrying out internal analog voltage calibration on the chip to be tested.
In addition, the invention also provides a calibration method of the chip internal analog voltage, the calibration method is applied to the calibration device, and the calibration method comprises the following steps:
writing a calibration program into the calibration device through an external control device, wherein the calibration program comprises a voltage detection program and a voltage modification program;
loading the voltage detection program and downloading the voltage detection program into the chip to be detected;
the chip to be tested acquires an internal analog voltage and outputs the internal analog voltage to the GP IO port;
reading the level on the GPIO port of the chip to be tested to obtain the actual voltage value of the chip to be tested, detecting whether the actual voltage value meets the check standard,
If the verification standard is met, the verification is finished;
If the verification standard is not met, calculating a difference value between the actual voltage value and a preset standard voltage value, writing the difference value into the voltage modification program, and downloading the modified voltage modification program to the chip to be tested;
and the analog voltage value inside the chip to be tested is changed according to the difference value so as to meet the calibration standard.
The effects provided in the summary of the invention are merely effects of embodiments, not all effects of the invention, and one of the above technical solutions has the following beneficial effects:
The application provides a calibration device for an analog voltage in a chip, which comprises a USB, wherein an external control device writes a calibration program into the calibration device through the USB; GPIO, which is used for carrying out data interaction with the chip to be tested; an internal memory for storing a calibration program and calibration data; and the CPU is connected with the USB, the GPIO and the internal memory and used for collecting, calculating and modifying the analog voltage in the chip to be tested. The calibration device is used for detecting the analog voltage inside the MCU chip, and when the analog voltage inside the MCU chip does not meet the requirements, the analog voltage inside the chip is adjusted by modifying the calibration parameters, so that the calibration device meets the calibration standard, the calibration efficiency and the calibration accuracy are improved, and the design cost and the manufacturing cost are reduced.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the application and together with the description, serve to explain the principles of the application.
FIG. 1 is a schematic diagram of a calibration device for calibrating an analog voltage inside a chip according to an embodiment of the application;
FIG. 2 is a schematic diagram illustrating the connection between the calibration device and the chip under test in FIG. 1;
FIG. 3 is a schematic diagram of the operation of the calibration device of FIG. 1;
FIG. 4 is a flow chart of the calibration device of FIG. 1;
FIG. 5 is a schematic diagram of a calibration system for an analog voltage in a chip according to an embodiment of the application;
FIG. 6 is a flow chart of a calibration method of an analog voltage in a chip according to an embodiment of the application;
Reference numerals:
510-external control equipment, 520-calibration means, 530-chip to be tested.
Detailed Description
The present invention will be described in further detail with reference to the drawings and examples, in order to make the objects, technical solutions and advantages of the present invention more apparent. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the invention.
It should be noted that references in the specification to "one embodiment," "an example embodiment," etc., indicate that the embodiment described may include a particular feature, structure, or characteristic, but every embodiment may not necessarily include the particular feature, structure, or characteristic. Furthermore, such phrases are not intended to refer to the same embodiment. Further, when a particular feature, structure, or characteristic is described in connection with an embodiment, it is submitted that it is within the knowledge of one skilled in the art to effect such feature, structure, or characteristic in connection with other embodiments whether or not explicitly described.
Furthermore, certain terms are used throughout the specification and the claims that follow to refer to particular components or parts, and it will be understood by those of ordinary skill in the art that manufacturers may refer to a component or part by different terms or terminology. The present specification and the following claims do not take the form of an element or component with the difference in name, but rather take the form of an element or component with the difference in function as a criterion for distinguishing. In the following description and in the claims, the terms "include" and "comprise" are used in an open-ended fashion, and thus should be interpreted to mean "include, but not limited to. In addition, the term "coupled" as used herein includes any direct or indirect electrical connection. Indirect electrical connection means include connection via other devices.
As described in the background art, the existing analog voltage inside the MCU chip is usually calibrated by using a calibration circuit, and the calibration circuit is disposed inside the chip, which results in complex circuit structure inside the chip, and very high circuit design capability of the analog engineer and process requirements of the chip manufacturer. Based on the above, the core of the application is to provide an external calibration device, which calibrates the analog voltage inside the MCU chip through the external calibration device, and can also modify the calibration parameters, thereby realizing the function of adjusting the analog voltage inside the chip, improving the calibration efficiency and the calibration accuracy, and reducing the design cost and the manufacturing cost.
Referring to fig. 1, fig. 1 is a schematic diagram illustrating a calibration device for an analog voltage in a chip according to an embodiment of the application. As shown in the figure, the calibration device of the present embodiment includes:
the USB is connected with external control equipment, and the external control equipment writes a calibration program into the calibration device through the USB; GPIO is connected with the chip to be tested and used for carrying out data interaction with the chip to be tested; an internal memory for storing a calibration program and calibration data; the CPU is connected with the USB, the GPIO and the internal memory and used for collecting, calculating and modifying the analog voltage in the chip to be tested; and the power supply is used for supplying power to the calibration device and the chip to be tested.
Specifically, as shown in fig. 1, the power supply is also connected with the CPU and the GPIO to supply power to the CPU and the GP I O.
As shown in the drawing, the calibration device of the present embodiment further includes:
The power supply channel is used for connecting the power supply and the chip to be tested, and the power supply supplies power to the chip to be tested through the power supply channel; and the digital channel is used for connecting the GPIO and the chip to be tested, and the GPIO performs data interaction with the chip to be tested through the digital channel.
Referring specifically to fig. 2, fig. 2 is a schematic diagram illustrating connection between the calibration device and the MCU chip to be tested in fig. 1. In this embodiment, the digital channels of the calibration device are arranged in three groups, wherein:
The first group of digital channels are 2 channels, namely Ch1 and Ch2 channels, and Ch1 and Ch2 are connected with the SWD port of the chip to be tested and used for loading a verification program to the MCU chip to be tested;
The second group of digital channels is 5 paths, namely Ch [7:3] channels, wherein Ch [7:3] is connected with a BIST port of the MCU chip to be tested and is used for writing and modifying analog voltage in the chip to be tested;
The third group of digital channels is 12 channels, namely Ch [19:8] channels, wherein Ch [19:8] is connected with the GP I O port of the MCU chip to be tested and used for reading the analog voltage parameters output by the chip to be tested.
The calibration device for the analog voltage inside the chip of the present embodiment will be described in detail with reference to specific working diagrams and working flowcharts.
Referring to fig. 3, fig. 3 shows a schematic diagram of the operation of the calibration device according to an embodiment of the present application. In the present embodiment, the calibration device is set to two modes, namely, a voltage modification mode (corresponding to the voltage modification program pattern 1) and a voltage detection mode (corresponding to the voltage detection program pattern 2). When the calibration device works, firstly, the pattern2 program is downloaded into the MCU chip, so that the MCU outputs the internal analog voltage to the GPIO, then the calibration device collects the parameters on the GPIO of the MCU chip to obtain the actual voltage in the MCU, and whether the actual voltage meets the verification standard is judged; meanwhile, under the condition that the actual voltage does not meet the standard, the calibration device calculates the actual voltage and the preset standard voltage to obtain a difference value, writes the difference value into the pattern1 program, and then writes the difference value into the MCU through the pattern1 program to achieve the purpose of modifying the analog voltage inside the MCU.
Next, the operation of the calibration device will be described in detail with reference to fig. 3 and 4, and specific calibration steps include:
S410, the external control equipment writes the compiled calibration programs (voltage modification program pattern1 and voltage detection program pattern 2) into the calibration device through USB;
s420, loading a pattern2 program corresponding to the excitation waveform by the calibration device, and downloading the pattern2 program into the MCU through an SWD port of the MCU;
In some embodiments, the output waveform file of the analog voltage inside the MCU chip can be obtained through simulation software, and then the output waveform file is converted into an excitation signal which can be identified by the calibration device.
S430, the MCU to be tested acquires an internal analog voltage and outputs the internal analog voltage to the 12 GP IO ports in a binary mode;
S440, the calibration device reads the level on the GPIO port and converts the level into a decimal actual voltage value VREFINT _act ve, and judges whether the actual voltage value meets the check standard,
S441, if the verification standard is met, the verification is finished;
if the verification criterion is not satisfied, go to step S450;
S450, the calibration device calculates a difference value VDIFF between the actual voltage value VREFINT _act ve and the standard voltage value VREFINT _standard, writes the difference value into the pattern1 program, and downloads the modified pattern1 program into the MCU through a BIST port;
S460, changing the KEY value in the MCU according to the VDIFF to meet the verification standard;
Referring to fig. 3, the KEY value inside the MCU is modified according to the value of VDIFF, that is, tr im_bit is modified according to VDIFF, and the actual analog voltage inside the MCU is changed accordingly and reaches the range of the standard voltage value VREFINT _standard.
As can be seen from the above, the calibration device for the internal analog voltage of the chip of the present embodiment is disposed outside the chip, and detects the internal analog voltage of the MCU chip by using the external calibration device, and adjusts the internal analog voltage of the chip by modifying the calibration parameters when the internal analog voltage of the MCU chip does not meet the requirements, so as to meet the calibration standard, thereby improving the calibration efficiency and the calibration accuracy, and reducing the design cost and the manufacturing cost.
Referring to fig. 5, fig. 5 is a schematic structural diagram of a calibration system for an analog voltage in a chip according to an embodiment of the application, where the calibration system includes an external control device 510, a chip to be tested 530, and a calibration apparatus 520 as described in the above embodiments. As shown, the external control device 510 is connected to the calibration apparatus 520 through a USB, and writes a calibration program into the calibration apparatus; the calibration device 520 is connected with the chip 530 to be tested through a GPIO, and performs internal analog voltage calibration on the chip 530 to be tested. In some embodiments, the external control device 510 may be a PC, a tablet computer, a mobile phone control terminal, or the like, which is not limited to the present application.
Similarly, when in operation, the external control device writes the compiled calibration programs (pattern 1 program and pattern2 program) into the calibration device through USB; the calibration device downloads the pattern2 program into the MCU chip to enable the MCU to output the internal analog voltage to the GPIO, then the calibration device collects parameters on the GPIO of the MCU to obtain the actual voltage in the MCU, and judges whether the actual voltage meets the verification standard or not; meanwhile, under the condition that the actual voltage does not meet the standard, the calibration device calculates the actual voltage and the standard voltage to obtain a difference value, writes the difference value into the pattern1 program, and then writes the difference value into the MCU through the pattern1 program to achieve the purpose of modifying the analog voltage inside the MCU.
For the implementation structure and the working process of the calibration system of the embodiment, which are not described in detail, reference may be made to the description of the relevant parts in the embodiment of the calibration device, which is not described herein.
In addition, the embodiment of the application also provides a calibration method of the analog voltage inside the chip, which is applied to the calibration device and the calibration system in the above embodiment, as shown in fig. 6, and the method comprises the following steps:
s610, writing a calibration program into the calibration device through an external control device, wherein the calibration program comprises a voltage detection program and a voltage modification program;
S620, loading the voltage detection program and downloading the voltage detection program into the chip to be detected;
s630, the chip to be tested acquires the internal analog voltage and outputs the internal analog voltage to the GPIO port;
s640, reading the level on the GPIO port of the chip to be tested to obtain an actual voltage value, detecting whether the actual voltage value meets a check standard,
S641, if the verification standard is met, finishing the verification;
s650, if the verification standard is not met, calculating a difference value between the actual voltage value and a preset standard voltage value, writing the difference value into the voltage modification program, and downloading the difference value to the chip to be tested;
S660, changing the analog voltage value inside the chip to be tested according to the difference value to meet the calibration standard.
For the conversion process of the calibration method of the internal analog voltage of the chip in this embodiment, reference may be made to the relevant parts of the calibration device in the above embodiment, and the description thereof will not be repeated here.
It will be apparent to those skilled in the art that the modules or steps of the application described above may be implemented in a general purpose computing device, they may be concentrated on a single computing device, or distributed across a network of computing devices, or they may alternatively be implemented in program code executable by computing devices, such that they may be stored in a memory device for execution by the computing devices, or they may be separately fabricated into individual integrated circuit modules, or multiple modules or steps within them may be fabricated into a single integrated circuit module. Thus, the present application is not limited to any specific combination of hardware and software.
While the application has been described in detail in the foregoing general description and specific examples, it will be apparent to those skilled in the art that modifications and improvements can be made thereto. Accordingly, such modifications or improvements may be made without departing from the spirit of the application and are intended to be within the scope of the application as claimed.
Claims (10)
1. A calibration device for an analog voltage within a chip, comprising:
The USB is connected with external control equipment, and the external control equipment writes a calibration program into the calibration device through the USB;
the GPIO is connected with the chip to be tested and used for carrying out data interaction with the chip to be tested;
An internal memory for storing a calibration program and calibration data;
the CPU is connected with the USB, the GPIO and the internal memory and used for collecting, calculating and modifying the analog voltage in the chip to be tested;
And the power supply is used for supplying power to the calibration device and the chip to be tested.
2. The calibration device of claim 1, further comprising:
the power supply channel is used for connecting the power supply and the chip to be tested, and the power supply supplies power to the chip to be tested through the power supply channel;
And the digital channel is used for connecting the GPIO and the chip to be tested, and the GPIO performs data interaction with the chip to be tested through the digital channel.
3. The calibration device of claim 2, wherein the digital channels are arranged in three groups, wherein:
the first group of digital channels are connected with the SWD port of the chip to be tested and used for downloading the verification program to the chip to be tested;
The second group of digital channels are connected with the BIST port of the chip to be tested and are used for modifying the analog voltage inside the chip to be tested;
And the third group of digital channels are connected with the GPIO ports of the chip to be tested and are used for reading the analog voltage parameters output by the chip to be tested.
4. A calibration device according to claim 3, wherein the first set of digital channels is 2 channels, the second set of digital channels is 5 channels and the third set of digital channels is 12 channels.
5. The calibration device of claim 1, wherein the power supply is further coupled to the CPU and GPIO for powering the CPU and GPIO.
6. The calibration device of any one of claims 3 to 5, wherein the calibration of the on-chip analog voltage by the calibration device comprises voltage detection and voltage modification.
7. The calibration device of claim 6, wherein the voltage detection comprises:
The calibration device loads a voltage detection program and downloads the voltage detection program to the chip to be tested through the SWD port;
The chip to be tested obtains an internal analog voltage and outputs the internal analog voltage to the GPIO port in a binary mode;
And the calibration device reads the level on the GPIO port of the chip to be tested, converts the level into a decimal actual voltage value, detects whether the actual voltage value meets a check standard, and if so, the check is finished.
8. The calibration device of claim 7, wherein the voltage modification comprises:
If the actual voltage value does not meet the verification standard, the calibration device calculates a difference value between the actual voltage value and a preset standard voltage value, writes the difference value into a voltage modification program, downloads the modified voltage modification program to the chip to be tested, and changes an analog voltage value inside the chip to be tested according to the difference value to meet the calibration standard.
9. A calibration system for an analog voltage inside a chip, comprising an external control device, a chip to be tested and a calibration apparatus according to any one of claims 1 to 8;
The external control equipment is connected with the calibration device through the USB and writes a calibration program into the calibration device;
The calibration device is connected with the chip to be tested through GPIO, and performs internal analog voltage calibration on the chip to be tested.
10. A method of calibrating an analog voltage within a chip, applied to a calibration device according to any one of claims 1 to 8, the method comprising:
writing a calibration program into the calibration device through an external control device, wherein the calibration program comprises a voltage detection program and a voltage modification program;
loading the voltage detection program and downloading the voltage detection program into the chip to be detected;
The chip to be tested acquires an internal analog voltage and outputs the internal analog voltage to the GPIO port;
Reading the level on the GPIO port of the chip to be tested to obtain an actual voltage value, detecting whether the actual voltage value meets a check standard,
If the verification standard is met, the verification is finished;
If the actual voltage value does not meet the verification standard, calculating a difference value between the actual voltage value and a preset standard voltage value, writing the difference value into the voltage modification program, and downloading the difference value to the chip to be tested;
and the analog voltage value inside the chip to be tested is changed according to the difference value so as to meet the calibration standard.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202410547755.7A CN118567421A (en) | 2024-05-06 | 2024-05-06 | Calibration device, system and calibration method for chip internal analog voltage |
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| CN202410547755.7A CN118567421A (en) | 2024-05-06 | 2024-05-06 | Calibration device, system and calibration method for chip internal analog voltage |
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